Turnover device capable of being leveled

Abstract

The utility model provides a turnover device capable of leveling, the turnover device is used for turning over a test machine to a probe station, the turnover device comprises a bearing seat, a rotating mechanism, a turnover mechanism and a first adjusting assembly, the rotating mechanism is arranged on the bearing seat along the length direction, the turnover mechanism comprises a first turnover assembly and a second turnover assembly which are arranged at an interval, and the first adjusting assembly is arranged on the first turnover assembly. The first overturning assembly is connected with the rotating mechanism and the testing machine, the second overturning assembly is connected with the rotating mechanism and the testing machine, the first adjusting assembly is arranged on the testing machine, and the first adjusting assembly and the first overturning assembly or the second overturning assembly are sequentially arranged in the length direction. The first adjusting assembly drives the testing machine to move in the length direction relative to the turnover mechanism and adjusts the levelness of the testing machine in the length direction. Therefore, the bottom surface of the testing machine is parallel to the horizontal placement surface, the problem of position deviation such as position deflection of the testing machine is avoided, and the butt joint difficulty of the testing machine and the probe station is reduced.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of wafer detection equipment, in particular to a flip device capable of adjusting the level. BACKGROUND

[0002] When performing wafer detection, the test machine needs to be placed above the probe table and docked with the probe table. However, in the related art, the test machine has a large weight and is prone to position deviation, which makes it difficult to dock the test machine with the probe table. CONTENT OF THE UTILITY MODEL

[0003] The present application aims to provide a flip device capable of adjusting the level, so as to solve the technical problem that the test machine has a large weight and is prone to position deviation in the related art, which makes it difficult to dock the test machine with the probe table.

[0004] In a first aspect, the present application provides a flip device capable of adjusting the level, which is used to flip a test machine onto a probe table, and the flip device comprises:

[0005] a bearing seat;

[0006] a rotating mechanism arranged on the bearing seat along a length direction;

[0007] a flipping mechanism comprising first flipping components and second flipping components arranged at intervals, the first flipping components being connected with the rotating mechanism and the test machine respectively, and the second flipping components being connected with the rotating mechanism and the test machine respectively; and

[0008] a first adjusting component arranged on the test machine, the first adjusting component and the first flipping components or the second flipping components being arranged along the length direction in sequence, the first adjusting component driving the test machine to move relative to the flipping mechanism along the length direction and adjusting the level of the test machine along the length direction.

[0009] In the flip device provided by the present application, the flip device comprises a bearing seat, a rotating mechanism, a flipping mechanism and a first adjusting component. The rotating mechanism is arranged on the bearing seat along a length direction. The flipping mechanism comprises first flipping components and second flipping components arranged at intervals, the first flipping components being connected with the rotating mechanism and the test machine respectively, and the second flipping components being connected with the rotating mechanism and the test machine respectively. The first adjusting component is arranged on the test machine, the first adjusting component and the first flipping components or the second flipping components are arranged along the length direction in sequence, the first adjusting component drives the test machine to move relative to the flipping mechanism along the length direction and adjusts the level of the test machine along the length direction, so that the bottom surface of the test machine is parallel to the horizontal placement surface, the position deviation of the test machine is avoided, and the docking difficulty of the test machine and the probe table is reduced.

[0010] The first adjusting assembly comprises a first adjusting block, a first adjusting member and a second adjusting member. The first adjusting block is fixed to the testing machine and is spaced apart from the first turnover assembly or the second turnover assembly. The first adjusting member penetrates through a through hole on the first adjusting block and is threadedly connected with the first turnover assembly or the second turnover assembly. The second adjusting member penetrates through a threaded hole on the first adjusting block and abuts against the first turnover assembly or the second turnover assembly.

[0011] The first turnover assembly comprises a first turnover side plate and a first connecting member. The first turnover side plate is connected with the rotating mechanism. The first connecting member is arranged on a side of the first turnover side plate away from the rotating mechanism. The first connecting member comprises a first connecting part and a second connecting part which are connected with each other and perpendicular to each other. The first connecting part is connected with the first turnover side plate. The second connecting part is connected with the testing machine.

[0012] The second turnover assembly comprises a second turnover side plate and a second connecting member. The second turnover side plate is connected with the rotating mechanism. The second connecting member is arranged on a side of the second turnover side plate away from the rotating mechanism. The second connecting member comprises a third connecting part and a fourth connecting part which are connected with each other and perpendicular to each other. The third connecting part is connected with the second turnover side plate. The fourth connecting part is connected with the testing machine.

[0013] The turnover device further comprises a second adjusting assembly and a third adjusting assembly. The second adjusting assembly comprises a second adjusting block, a third adjusting member and a fourth adjusting member. The second adjusting block is fixed to the first turnover side plate and is arranged on a side of the second connecting part away from the testing machine. The third adjusting member penetrates through a through hole on the second adjusting block and is threadedly connected with the second connecting part. The fourth adjusting member penetrates through a threaded hole on the second adjusting block and abuts against the second connecting part.

[0014] The third adjusting assembly comprises a third adjusting block, a fifth adjusting member and a sixth adjusting member. The third adjusting block is fixed to the second turnover side plate and is arranged on a side of the fourth connecting part away from the testing machine. The fifth adjusting member penetrates through a through hole on the third adjusting block and is threadedly connected with the fourth connecting part. The sixth adjusting member penetrates through a threaded hole on the third adjusting block and abuts against the fourth connecting part.

[0015] The first turnover assembly further comprises a first spacing member. The second turnover assembly further comprises a second spacing member. The first spacing member is arranged on the first connecting member and is connected with the first connecting part and the second connecting part respectively. The second spacing member is arranged on the second connecting member and is connected with the third connecting part and the fourth connecting part respectively.

[0016] The first adjusting block is fixed on the testing machine and is spaced apart from the first spacer or the second spacer along the length direction, the first adjusting member penetrates through the through hole on the first adjusting block and is screwed with the first spacer or the second spacer, and the second adjusting member penetrates through the threaded hole on the first adjusting block and abuts against the first spacer or the second spacer.

[0017] The second adjusting assembly comprises a second adjusting block, a third adjusting member and a fourth adjusting member, the second adjusting block is fixed on the first overturning side plate and is arranged on the side of the first spacer away from the testing machine, the third adjusting member penetrates through the through hole on the second adjusting block and is screwed with the first spacer, and the fourth adjusting member penetrates through the threaded hole on the second adjusting block and abuts against the first spacer.

[0018] The third adjusting assembly comprises a third adjusting block, a fifth adjusting member and a sixth adjusting member, the third adjusting block is fixed on the second overturning side plate and is arranged on the side of the second spacer away from the testing machine, the fifth adjusting member penetrates through the through hole on the third adjusting block and is screwed with the second spacer, and the sixth adjusting member penetrates through the threaded hole on the third adjusting block and abuts against the second spacer.

[0019] The second connecting portion is provided with a plurality of first waist-shaped holes, when the testing machine is arranged on the probe table, the first waist-shaped holes extend along the height direction, the testing machine is provided with a plurality of first fixing holes, a plurality of first fixing members penetrate through the first waist-shaped holes and are fixed in the first fixing holes, and the testing machine can move along the height direction relative to the first overturning assembly.

[0020] The fourth connecting portion is provided with a plurality of second waist-shaped holes, when the testing machine is arranged on the probe table, the second waist-shaped holes extend along the height direction, the testing machine is provided with a plurality of second fixing holes, a plurality of second fixing members penetrate through the second waist-shaped holes and are fixed in the second fixing holes, and the testing machine can move along the height direction relative to the second overturning assembly.

[0021] The fourth adjusting assembly comprises a fourth adjusting block, a seventh adjusting member and an eighth adjusting member, the fourth adjusting block is fixed on the testing machine and is spaced apart from the first spacer along the height direction, the seventh adjusting member penetrates through the through hole on the fourth adjusting block and is screwed with the first spacer, and the eighth adjusting member penetrates through the threaded hole on the fourth adjusting block and abuts against the first spacer.

[0022] The turnover device further comprises a fifth adjusting assembly, the fifth adjusting assembly comprises a fifth adjusting block, a ninth adjusting piece and a tenth adjusting piece, the fifth adjusting block is fixed on the testing machine and is spaced apart from the second spacer along the height direction, the ninth adjusting piece penetrates through the through hole on the fifth adjusting block and is threadedly connected with the second spacer, and the tenth adjusting piece penetrates through the threaded hole on the fifth adjusting block and abuts against the second spacer.

[0023] The first turnover side plate is provided with a plurality of third waist-shaped holes, the third waist-shaped holes extend along the height direction when the testing machine is arranged on the probe table, the rotating mechanism is provided with a plurality of third fixing holes, a plurality of third fixing pieces penetrate through the third waist-shaped holes and are fixed in the third fixing holes, and the first turnover side plate can move along the height direction relative to the rotating mechanism;

[0024] The second turnover side plate is provided with a plurality of fourth waist-shaped holes, the fourth waist-shaped holes extend along the height direction when the testing machine is arranged on the probe table, the rotating mechanism is provided with a plurality of fourth fixing holes, a plurality of fourth fixing pieces penetrate through the fourth waist-shaped holes and are fixed in the fourth fixing holes, and the second turnover side plate can move along the height direction relative to the rotating mechanism.

[0025] The first turnover assembly further comprises a first leveling piece and a second leveling piece, the first leveling piece penetrates through the through hole on the first turnover side plate and is threadedly connected with the rotating mechanism, the second leveling piece penetrates through the threaded hole on the first turnover side plate and abuts against the rotating mechanism, the first leveling piece is used to provide a first acting force to the rotating mechanism, the second leveling piece is used to provide a second acting force to the rotating mechanism, and the directions of the first acting force and the second acting force are opposite.

[0026] The second turnover assembly further comprises a third leveling piece and a fourth leveling piece, the third leveling piece penetrates through the through hole on the second turnover side plate and is threadedly connected with the rotating mechanism, the fourth leveling piece penetrates through the threaded hole on the second turnover side plate and abuts against the rotating mechanism, the third leveling piece is used to provide a third acting force to the rotating mechanism, the fourth leveling piece is used to provide a fourth acting force to the rotating mechanism, and the directions of the third acting force and the fourth acting force are opposite. BRIEF DESCRIPTION OF DRAWINGS

[0027] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings needed in the embodiments will be briefly introduced as follows. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can also be obtained by those skilled in the art without creative labor.

[0028] Figure 1 is a schematic view of a cooperation structure of a turnover device, a test machine and a probe station provided by an embodiment of the present application;

[0029] Figure 2 is a schematic view of a structure of a turnover device and a test machine provided by an embodiment of the present application;

[0030] Figure 3 is a schematic view of a partial structure of a turnover device provided by an embodiment of the present application;

[0031] Figure 4 is a schematic view of a structure of a first connecting member and a second connecting member provided by an embodiment of the present application;

[0032] Figure 5 is a schematic view of a structure of a first adjusting assembly, a second adjusting assembly and a third adjusting assembly provided by an embodiment of the present application;

[0033] Figure 6 is a schematic view of a structure of a turnover device including a first spacer and a second spacer provided by an embodiment of the present application;

[0034] Figure 7 is a schematic view of a structure of a first turnover assembly and a test machine connecting part provided by an embodiment of the present application;

[0035] Figure 8 is a schematic view of a structure of a second turnover assembly and a test machine connecting part provided by an embodiment of the present application;

[0036] Figure 9 is a schematic view of a structure of a turnover device including a fourth adjusting assembly and a fifth adjusting assembly provided by an embodiment of the present application;

[0037] Figure 10 is a schematic view of a bottom of a turnover device and a test machine provided by an embodiment of the present application;

[0038] Figure 11 is a schematic view of a structure of a turnover mechanism and a rotating mechanism connecting part provided by an embodiment of the present application.

[0039] Label Explanation:

[0040] Flipping device 100, supporting base 10, flipping mechanism 20, first flipping assembly 21, first flipping side plate 211, first connecting member 212, first connecting portion 212a, second connecting portion 212b, first spacer 213, first leveling member 214, second leveling member 215, second flipping assembly 22, second flipping side plate 221, second connecting member 222, third connecting portion 222a, fourth connecting portion 222b, second spacer 223, rotating mechanism 30, first adjustment group Part 40, first adjusting block 41, first adjusting part 42, second adjusting part 43, second adjusting assembly 50, second adjusting block 51, third adjusting part 52, fourth adjusting part 53, third adjusting assembly 60, third adjusting block 61, fifth adjusting part 62, sixth adjusting part 63, fourth adjusting assembly 70, fifth adjusting assembly 80, first waist-shaped hole 91, second waist-shaped hole 92, third waist-shaped hole 93, fifth waist-shaped hole 95, sixth waist-shaped hole 96, testing machine 200, probe station 300. DETAILED DESCRIPTION

[0041] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0042] It should be noted that the terms "first," "second," and so on in the specification, claims, and drawings of this application are used to distinguish different objects, rather than to describe a specific order. Furthermore, the terms "including," "having," and any variations thereof are intended to cover non-exclusive inclusions.

[0043] In this specification, for convenience, words and phrases indicating orientation or positional relationships, such as "middle," "upper," "lower," "front," "back," "vertical," "horizontal," "top," "bottom," "inside," and "outside," are used to illustrate the positional relationships of constituent elements with reference to the accompanying drawings. This is merely for the purpose of facilitating the description of this specification and simplifying the description, and is not intended to indicate or imply that the device or element referred to must have a specific orientation, be constructed, or operate in a specific orientation. Therefore, they should not be construed as limitations on the present disclosure. The positional relationships of constituent elements may be appropriately changed depending on the orientation of the constituent elements being described. Therefore, the present disclosure is not limited to the words and phrases described in the specification and may be appropriately replaced depending on the circumstances.

[0044] In this specification, unless otherwise expressly specified and limited, the terms "install", "connect", "connect", should be understood in a broad sense. For example, it can be fixedly connected, or detachably connected, or integrally connected; it can be mechanically connected, or electrically connected; it can be directly connected, or indirectly connected through an intermediate piece, or communication between two elements. For those skilled in the art, the meaning of the above terms in this disclosure can be understood according to the circumstances.

[0045] When performing wafer detection, the test machine needs to be placed above the probe table and docked with the probe table. However, in the related art, the test machine has a large weight and is prone to positional deviation such as deflection, which makes it difficult to dock the test machine with the probe table.

[0046] Please refer to Figure 1 and Figure 2 The present application provides a kind of adjustable flip device 100, the flip device 100 is used to flip test machine 200 to probe table 300.Therein, the flip device 100 includes bearing seat 10, rotating mechanism 30, flip mechanism 20 and first adjusting assembly 40.The rotating mechanism 30 is along length direction L on the bearing seat 10.The flip mechanism 20 includes first flip assembly 21 and second flip assembly 22 spaced apart, first flip assembly 21 respectively connect rotating mechanism 30 and test machine 200, second flip assembly 22 respectively connect rotating mechanism 30 and test machine 200.The first adjusting assembly 40 is arranged on test machine 200, first adjusting assembly 40 and first flip assembly 21 or second flip assembly 22 are sequentially arranged along length direction L, first adjusting assembly 40 drives test machine 200 relative to flip mechanism 20 along length direction L moves, and adjusts the levelness of test machine 200 along length direction L.

[0047] The flip mechanism 20 includes the first flip assembly 21 and the second flip assembly 22 spaced apart, and the first flip assembly 21 and the second flip assembly 22 are used for connecting the rotating mechanism 30 and the test machine 200, respectively, and the first flip assembly 21 and the second flip assembly 22 are arranged at both ends of the rotating mechanism 30 and the test machine 200, respectively, to improve the connection stability of the rotating mechanism 30 and the test machine 200.

[0048] It should be noted that the fixed connection between the turnover mechanism 20 and the testing machine 200 can reserve a locking allowance, in other words, the testing machine 200 and the turnover mechanism 20 can be movably connected, and the testing machine 200 can move relative to the turnover mechanism 20 to fine-tune the position of the testing machine 200. Moreover, in the subsequent operation of moving and leveling the testing machine 200, the fixed connection between the turnover mechanism 20 and the testing machine 200 reserves a locking allowance, and the testing machine 200 can be finely moved relative to the turnover mechanism 20 until the testing machine 200 is leveled, and then the connection between the turnover mechanism 20 and the testing machine 200 is locked and fixed.

[0049] The first adjusting assembly 40 and the first turnover assembly 21 or the second turnover assembly 22 are sequentially arranged along the length direction L, and the first adjusting assembly 40 is connected to the first turnover assembly 21 or the second turnover assembly 22. Optionally, in the embodiment, the first adjusting assembly 40 is exemplified by connecting the first turnover assembly 21, and in other embodiments, the first adjusting assembly 40 can also be connected to the second turnover assembly 22, which is not limited in the application.

[0050] The first adjusting assembly 40 drives the testing machine 200 to move relative to the turnover mechanism 20 along the length direction L. Specifically, in the embodiment, one end of the first adjusting assembly 40 is fixedly connected to the testing machine 200, and the other end is connected to the first turnover assembly 21. The first adjusting assembly 40 can be used to move relative to the first turnover assembly 21 along the length direction L and drive the testing machine 200 to move relative to the first turnover assembly 21 along the length direction L, thereby adjusting the levelness of the testing machine 200 along the length direction L and avoiding the position of the testing machine 200 from being deflected and the like. It should be noted that in the embodiment, the levelness of the testing machine 200 along the length direction L is adjusted, in other words, the angle between the bottom surface of the testing machine 200 and the horizontal placement surface along the length direction L is adjusted to make the bottom surface of the testing machine 200 parallel to the horizontal placement surface, avoid the position of the testing machine 200 from being deflected and the like, and reduce the difficulty of docking the testing machine 200 and the probe table 300.

[0051] Optionally, the movable connection between the first adjusting assembly 40 and the first turnover assembly 21 includes but is not limited to threaded connection or other connection modes, which is not limited in the application.

[0052] The turnover device 100 comprises a bearing seat 10, a rotating mechanism 30, a turnover mechanism 20 and a first adjusting assembly 40. The rotating mechanism 30 is arranged on the bearing seat 10 along a length direction L. The turnover mechanism 20 comprises a first turnover assembly 21 and a second turnover assembly 22 arranged at intervals, the first turnover assembly 21 is connected with the rotating mechanism 30 and the testing machine 200 respectively, and the second turnover assembly 22 is connected with the rotating mechanism 30 and the testing machine 200 respectively. The first adjusting assembly 40 is arranged on the testing machine 200, the first adjusting assembly 40 and the first turnover assembly 21 or the second turnover assembly 22 are arranged along the length direction L in sequence, the first adjusting assembly 40 drives the testing machine 200 to move relative to the turnover mechanism 20 along the length direction L, and adjusts the horizontal degree of the testing machine 200 along the length direction L, so that the bottom surface of the testing machine 200 is parallel to the horizontal placement surface, avoids the position of the testing machine 200 from being deflected or other position offset problems, and reduces the docking difficulty of the testing machine 200 and the probe table 300.

[0053] Please refer to Figure 2 and Figure 3 In an embodiment, the first adjusting assembly 40 comprises a first adjusting block 41, a first adjusting piece 42 and a second adjusting piece 43. The first adjusting block 41 is fixed on the testing machine 200 and arranged at intervals with the first turnover assembly 21 or the second turnover assembly 22. The first adjusting piece 42 penetrates through the through hole on the first adjusting block 41 and is threadedly connected with the first turnover assembly 21 or the second turnover assembly 22. The second adjusting piece 43 penetrates through the threaded hole on the first adjusting block 41 and abuts against the first turnover assembly 21 or the second turnover assembly 22.

[0054] In the embodiment, the first adjusting member 42 is taken as an example of connecting the first adjusting block 41 to the first turnover assembly 21, and should not be understood as a limitation to the present application. Specifically, the first adjusting member 42 penetrates the through hole on the first adjusting block 41 and is screwed with the first turnover assembly 21. In the embodiment, the first adjusting member 42 is a locking screw, the screw head of the first adjusting member 42 abuts against the first adjusting block 41, the screw rod of the first adjusting member 42 is screwed with the first turnover assembly 21, and the first adjusting member 42 can be rotated relative to the first turnover assembly 21 to drive the first adjusting block 41 to move in a direction close to the first turnover assembly 21, thereby driving the testing machine 200 to move along the length direction L. Alternatively, in the embodiment, the number of the first adjusting member 42 is two, and the two first adjusting members 42 are arranged at intervals. In other embodiments, the number of the first adjusting member 42 can also be one, or three, or four, or more, which is not limited in the present application.

[0055] The second adjusting member 43 penetrates the threaded hole on the first adjusting block 41 and abuts against the first turnover assembly 21. In the embodiment, the second adjusting member 43 is a top screw structure, the screw head of the second adjusting member 43 is spaced apart from the first adjusting block 41, the outer periphery of the screw rod of the second adjusting member 43 is screwed with the first adjusting block 41, and the screw rod of the second adjusting member 43 abuts against the first turnover assembly 21. The second adjusting member 43 can be rotated relative to the first turnover assembly 21 to drive the first adjusting block 41 to move in a direction away from the first turnover assembly 21, thereby driving the testing machine 200 to move along the length direction L. The moving direction of the testing machine 200 driven by the second adjusting member 43 is opposite to the moving direction of the testing machine 200 driven by the first adjusting member 42, so as to realize the adjustment of the movement of the testing machine 200 in two opposite directions along the length direction L, thereby adjusting the levelness of the testing machine 200 along the length direction L.

[0056] It should be noted that in other embodiments, the number of the first adjusting assembly 40 can also be two, one of the first adjusting assemblies 40 is connected to the first turnover assembly 21, and the other first adjusting assembly 40 is connected to the second turnover assembly 22, which is not limited in the present application.

[0057] Please refer to Figure 2 , Figure 3 and Figure 4In one embodiment, the first overturning assembly 21 comprises a first overturning side plate 211 and a first connecting member 212, the first overturning side plate 211 is connected to the rotating mechanism 30, the first connecting member 212 is arranged on the side of the first overturning side plate 211 away from the rotating mechanism 30, the first connecting member 212 comprises a first connecting part 212a and a second connecting part 212b connected to each other and perpendicular to each other, the first connecting part 212a is connected to the first overturning side plate 211, and the second connecting part 212b is connected to the testing machine 200.

[0058] The first overturning assembly 21 comprises the first overturning side plate 211 and the first connecting member 212, the first overturning side plate 211 comprises an aluminum alloy machined part, the first connecting member 212 comprises an aluminum alloy machined part, and the first overturning assembly 21 is composed of aluminum alloy machined parts, so that the structural stability of the first overturning assembly 21 can be improved.

[0059] The second overturning assembly 22 comprises a second overturning side plate 221 and a second connecting member 222, the second overturning side plate 221 is connected to the rotating mechanism 30, the second connecting member 222 is arranged on the side of the second overturning side plate 221 away from the rotating mechanism 30, the second connecting member 222 comprises a third connecting part 222a and a fourth connecting part 222b connected to each other and perpendicular to each other, the third connecting part 222a is connected to the second overturning side plate 221, and the fourth connecting part 222b is connected to the testing machine 200.

[0060] The second overturning assembly 22 comprises the second overturning side plate 221 and the second connecting member 222, the second overturning side plate 221 comprises an aluminum alloy machined part, the second connecting member 222 comprises an aluminum alloy machined part, and the second overturning assembly 22 is composed of aluminum alloy machined parts, so that the structural stability of the second overturning assembly 22 can be improved.

[0061] Specifically, the testing machine 200 has a connecting surface for connecting the overturning mechanism 20, the first overturning side plate 211 is perpendicular to the connecting surface, and the second overturning side plate 221 is perpendicular to the connecting surface, so that the probability of bending of the first overturning side plate 211 and the second overturning side plate 221 when the testing machine 200 is overturned can be reduced, and the load-bearing performance of the overturning mechanism 20 during overturning can be improved.

[0062] Please refer to Figure 2 , Figure 3In an embodiment, the turnover device 100 further comprises a second adjusting assembly 50 and a third adjusting assembly 60, the second adjusting assembly 50 and the third adjusting assembly 60 are arranged along the width direction W of the test machine 200, and the second adjusting assembly 50 and the third adjusting assembly 60 are used to adjust the levelness of the test machine 200 along the width direction W.

[0063] Please refer to Figure 2 to Figure 5 In an embodiment, the second adjusting assembly 50 is arranged on the side of the second connecting part 212b away from the test machine 200, and the second adjusting assembly 50 is used to drive the second connecting part 212b to move along the width direction W, and drive the test machine 200 to move along the width direction W relative to the first turnover side plate 211, so as to adjust the levelness of the test machine 200 along the width direction W, and avoid the position of the test machine 200 from being deflected or the like. It should be noted that in this embodiment, the levelness of the test machine 200 along the width direction W is adjusted, in other words, the angle between the bottom surface of the test machine 200 and the horizontal placement surface along the width direction W is adjusted, so that the bottom surface of the test machine 200 is parallel to the horizontal placement surface, and the position of the test machine 200 is avoided from being deflected or the like, and the difficulty of the abutment between the test machine 200 and the probe table 300 is reduced.

[0064] Optionally, the movable connection mode of the first adjusting assembly 40 and the second connecting part 212b includes but is not limited to threaded connection or other connection modes, which is not limited in the present application.

[0065] Specifically, the second adjusting assembly 50 comprises a second adjusting block 51, a third adjusting piece 52, and a fourth adjusting piece 53, the second adjusting block 51 is fixed to the first turnover side plate 211 and arranged on the side of the second connecting part 212b away from the test machine 200, the third adjusting piece 52 penetrates through the through hole on the second adjusting block 51 and is threadedly connected with the second connecting part 212b, and the fourth adjusting piece 53 penetrates through the threaded hole on the second adjusting block 51 and abuts against the second connecting part 212b.

[0066] Further, specifically, the third adjusting member 52 penetrates through the through hole on the second adjusting block 51 and is threadedly connected with the second connecting portion 212b. In this embodiment, the third adjusting member 52 is a locking screw, the screw head of the third adjusting member 52 abuts against the second adjusting block 51, the screw rod of the third adjusting member 52 is threadedly connected with the second connecting portion 212b, and the third adjusting member 52 can be rotated relative to the second connecting portion 212b to drive the second connecting portion 212b to move in a direction close to the second adjusting block 51, thereby driving the testing machine 200 to move along the width direction W. Alternatively, in this embodiment, the number of the third adjusting member 52 is two, and the two third adjusting members 52 are arranged at intervals. In other embodiments, the number of the third adjusting member 52 can also be one, or three, or four, or more than four, which is not limited in the present application.

[0067] The fourth adjusting member 53 penetrates through the threaded hole on the second adjusting block 51 and abuts against the second connecting portion 212b. In this embodiment, the fourth adjusting member 53 is a top screw structure, the screw head of the fourth adjusting member 53 is spaced apart from the second adjusting block 51, the outer periphery of the screw rod of the fourth adjusting member 53 is threadedly connected with the second adjusting block 51, and the screw rod of the fourth adjusting member 53 abuts against the second connecting portion 212b. The fourth adjusting member 53 can be rotated relative to the second connecting portion 212b to drive the second connecting portion 212b to move in a direction away from the second adjusting block 51, thereby driving the testing machine 200 to move along the width direction W. The moving direction of the testing machine 200 driven by the fourth adjusting member 53 is opposite to the moving direction of the testing machine 200 driven by the third adjusting member 52, so as to realize the adjustment of the movement of the testing machine 200 in two opposite directions along the width direction W, thereby adjusting the levelness of the testing machine 200 along the width direction W.

[0068] In an embodiment, the third adjusting assembly 60 is arranged on the side of the fourth connecting portion 222b away from the testing machine 200. The third adjusting assembly 60 is used to drive the fourth connecting portion 222b to move along the width direction W, and drive the testing machine 200 to move relative to the second overturning side plate 221 along the width direction W, thereby adjusting the levelness of the testing machine 200 along the width direction W, avoiding the position of the testing machine 200 from being deflected or the like. Moreover, the third adjusting assembly 60 and the second adjusting assembly 50 are respectively arranged at two ends of the testing machine 200, and can be respectively used to drive the two ends of the testing machine 200 to move along the width direction W for leveling, so as to improve the leveling effect of the testing machine 200.

[0069] Optionally, the active connection mode of the third adjusting assembly 60 and the fourth connecting part 222b includes but is not limited to threaded connection or other connection mode, which is not limited in the present application.

[0070] The third adjusting assembly 60 includes a third adjusting block 61, a fifth adjusting part 62 and a sixth adjusting part 63. The third adjusting block 61 is fixed on the second overturning side plate 221 and arranged on the side of the fourth connecting part 222b away from the testing machine 200. The fifth adjusting part 62 penetrates the through hole on the third adjusting block 61 and is in threaded connection with the fourth connecting part 222b. The sixth adjusting part 63 penetrates the threaded hole on the third adjusting block 61 and abuts against the fourth connecting part 222b.

[0071] Further, specifically, the fifth adjusting part 62 penetrates the through hole on the third adjusting block 61 and is in threaded connection with the fourth connecting part 222b. In the present embodiment, the fifth adjusting part 62 is a locking screw. The screw head of the fifth adjusting part 62 abuts against the third adjusting block 61. The screw rod of the fifth adjusting part 62 is in threaded connection with the fourth connecting part 222b. The fifth adjusting part 62 can rotate relative to the fourth connecting part 222b to drive the fourth connecting part 222b to move in the direction of approaching the third adjusting block 61, thereby driving the testing machine 200 to move in the width direction W. Optionally, in the present embodiment, the number of the fifth adjusting part 62 is 2, and the two fifth adjusting parts 62 are arranged at intervals. In other embodiments, the number of the fifth adjusting part 62 can also be 1, or 3, or 4, or more than 4, which is not limited in the present application.

[0072] The sixth adjusting part 63 penetrates the threaded hole on the third adjusting block 61 and abuts against the fourth connecting part 222b. In the present embodiment, the sixth adjusting part 63 is a jackscrew structure. The screw head of the sixth adjusting part 63 is spaced apart from the third adjusting block 61. The outer periphery of the screw rod of the sixth adjusting part 63 is in threaded connection with the third adjusting block 61, and the screw rod of the sixth adjusting part 63 abuts against the fourth connecting part 222b. The sixth adjusting part 63 can rotate relative to the fourth connecting part 222b to drive the fourth connecting part 222b to move in the direction of moving away from the third adjusting block 61, thereby driving the testing machine 200 to move in the width direction W. The moving direction of the testing machine 200 driven by the sixth adjusting part 63 is opposite to the moving direction of the testing machine 200 driven by the fifth adjusting part 62, so as to realize the moving adjustment of the testing machine 200 in two opposite directions in the width direction W, thereby adjusting the levelness of the testing machine 200 in the width direction W.

[0073] Please refer toFigure 2 to Figure 6 In an embodiment, the first turnover assembly 21 further comprises a first spacer 213, and the second turnover assembly 22 further comprises a second spacer 223, the first spacer 213 is arranged on the first connecting member 212 and connects the first connecting portion 212a and the second connecting portion 212b respectively, and the second spacer 223 is arranged on the second connecting member 222 and connects the third connecting portion 222a and the fourth connecting portion 222b respectively.

[0074] The first adjusting block 41 is fixed on the testing machine 200 and is spaced apart from the first spacer 213 or the second spacer 223 along the length direction L, the first adjusting member 42 penetrates the through hole on the first adjusting block 41 and is screwed with the first spacer 213 or the second spacer 223, and the second adjusting member 43 penetrates the threaded hole on the first adjusting block 41 and abuts against the first spacer 213 or the second spacer 223.

[0075] It should be noted that, in the embodiment, the first adjusting assembly 40 is used to connect the first turnover assembly 21, which should not be understood as a limitation to the present application.

[0076] Specifically, in the embodiment, the first adjusting member 42 is a locking screw, the screw head of the first adjusting member 42 abuts against the first adjusting block 41, the screw rod of the first adjusting member 42 is screwed with the first spacer 213, and the first adjusting member 42 can be rotated relative to the first spacer 213 to drive the first adjusting block 41 to move along the direction of approaching the first spacer 213, thereby driving the testing machine 200 to move along the length direction L. Alternatively, in the embodiment, the number of the first adjusting member 42 is 2, and the two first adjusting members 42 are spaced apart, and in other embodiments, the number of the first adjusting member 42 can also be 1, or 3, or 4, or more than 4, which is not limited in the present application.

[0077] Specifically, in the embodiment, the second adjusting member 43 is a top screw structure, the screw head of the second adjusting member 43 is spaced from the first adjusting block 41, the screw rod of the second adjusting member 43 is threadedly connected with the first adjusting block 41, and the screw rod of the second adjusting member 43 abuts against the first spacer 213. The second adjusting member 43 can be rotated relative to the first spacer 213 to drive the first adjusting block 41 to move away from the first spacer 213, thereby driving the test machine 200 to move along the length direction L. The movement direction of the test machine 200 driven by the second adjusting member 43 is opposite to the movement direction of the test machine 200 driven by the first adjusting member 42, so as to realize the movement adjustment of the test machine 200 along two opposite directions along the length direction L, thereby adjusting the levelness of the test machine 200 along the length direction L.

[0078] Similarly, in the embodiment, the turnover device 100 also comprises the second adjusting assembly 50 and the third adjusting assembly 60. The second adjusting assembly 50 comprises the second adjusting block 51, the third adjusting member 52, and the fourth adjusting member 53. The second adjusting block 51 is fixed to the first turnover side plate 211 and is arranged on the side of the first spacer 213 away from the test machine 200. The third adjusting member 52 penetrates through the through hole on the second adjusting block 51 and is threadedly connected with the first spacer 213. The fourth adjusting member 53 penetrates through the threaded hole on the second adjusting block 51 and abuts against the first spacer 213.

[0079] Further, specifically, the third adjusting member 52 penetrates through the through hole on the second adjusting block 51 and is threadedly connected with the first spacer 213. In the embodiment, the third adjusting member 52 is a locking screw. The screw head of the third adjusting member 52 abuts against the second adjusting block 51. The screw rod of the third adjusting member 52 is threadedly connected with the first spacer 213. The third adjusting member 52 can be rotated relative to the first spacer 213 to drive the first spacer 213 and the second connecting portion 212b to move along the direction close to the second adjusting block 51, thereby driving the test machine 200 to move along the width direction W. Alternatively, in the embodiment, the number of the third adjusting member 52 is two, and the two third adjusting members 52 are arranged in a spaced manner. In other embodiments, the number of the third adjusting member 52 can be one, or three, or four, or more than four, which is not limited in the application.

[0080] The fourth adjusting member 53 penetrates the threaded hole on the second adjusting block 51 and abuts against the first spacer 213. In this embodiment, the fourth adjusting member 53 is a top screw structure. The screw head of the fourth adjusting member 53 is spaced from the second adjusting block 51. The screw rod of the fourth adjusting member 53 is threadedly connected with the second adjusting block 51. The screw rod of the fourth adjusting member 53 abuts against the first spacer 213. The fourth adjusting member 53 can be rotated relative to the first spacer 213 to drive the first spacer 213 and the second connecting portion 212b to move away from the second adjusting block 51, thereby driving the test machine 200 to move along the width direction W. The movement direction of the test machine 200 driven by the fourth adjusting member 53 is opposite to the movement direction of the test machine 200 driven by the third adjusting member 52. Thus, the movement of the test machine 200 along the width direction W in two opposite directions can be adjusted, thereby adjusting the levelness of the test machine 200 along the width direction W.

[0081] The third adjusting assembly 60 also includes the third adjusting block 61, the fifth adjusting member 62, and the sixth adjusting member 63. The third adjusting block 61 is fixed to the second turnover side plate 221 and is arranged on the side of the second spacer 223 away from the test machine 200. The fifth adjusting member 62 penetrates the through hole on the third adjusting block 61 and is threadedly connected with the second spacer 223. The sixth adjusting member 63 penetrates the threaded hole on the third adjusting block 61 and abuts against the second spacer 223.

[0082] Further, specifically, the fifth adjusting member 62 penetrates the through hole on the third adjusting block 61 and is threadedly connected with the second spacer 223. In this embodiment, the fifth adjusting member 62 is a locking screw. The screw head of the fifth adjusting member 62 abuts against the third adjusting block 61. The screw rod of the fifth adjusting member 62 is threadedly connected with the second spacer 223. The fifth adjusting member 62 can be rotated relative to the second spacer 223 to drive the second spacer 223 and the fourth connecting portion 222b to move toward the third adjusting block 61, thereby driving the test machine 200 to move along the width direction W. Alternatively, in this embodiment, the number of the fifth adjusting member 62 is two. The two fifth adjusting members 62 are arranged in a spaced manner. In other embodiments, the number of the fifth adjusting member 62 can be one, or three, or four, or more than four. The present application does not limit this.

[0083] The sixth adjusting member 63 penetrates the threaded hole on the third adjusting block 61 and abuts against the second spacer 223. In this embodiment, the sixth adjusting member 63 is a top screw structure. The screw head of the sixth adjusting member 63 is spaced from the third adjusting block 61. The outer periphery of the screw rod of the sixth adjusting member 63 is threadedly connected with the third adjusting block 61. The screw rod of the sixth adjusting member 63 abuts against the second spacer 223. The sixth adjusting member 63 can be rotated relative to the second spacer 223 to drive the second spacer 223 and the fourth connecting portion 222b to move away from the third adjusting block 61, thereby driving the test machine 200 to move along the width direction W. The movement direction of the test machine 200 driven by the sixth adjusting member 63 is opposite to the movement direction of the test machine 200 driven by the fifth adjusting member 62. Thus, the movement of the test machine 200 along the width direction W in two opposite directions can be adjusted, thereby adjusting the levelness of the test machine 200 along the width direction W.

[0084] The first turnover assembly 21 further comprises the first spacer 213. The first spacer 213 has relatively large dimensions along the length direction L and the width direction W. Threaded holes are provided on the first spacer 213 for threadedly connecting the first adjusting member 42 and the third adjusting member 52. Thus, relatively long threaded holes do not need to be provided on the first connecting portion 212a and the second connecting portion 212b.

[0085] The second turnover assembly 22 further comprises the second spacer 223. The first spacer 213 has relatively large dimensions along the length direction L and the width direction W. Threaded holes are provided on the first spacer 213 for threadedly connecting the fifth adjusting member 62. Thus, relatively long threaded holes do not need to be provided on the fourth connecting portion 222b.

[0086] Please refer to Figure 1 , Figure 2 , Figure 7 and Figure 8 In one embodiment, a plurality of first waist-shaped holes 91 are provided on the second connecting portion 212b. When the test machine 200 is arranged on the probe station 300, the first waist-shaped holes 91 extend along the height direction H. A plurality of first fixing holes are provided on the test machine 200. A plurality of first fixing members penetrate the first waist-shaped holes 91 and are fixed in the first fixing holes. The test machine 200 can move relative to the first turnover assembly 21 along the height direction H.

[0087] The test machine 200 can move along the height direction H relative to the first flipping assembly 21, and the first fixing member can also move within the first waist-shaped hole 91 and be fixedly connected with the first fixing hole, so that the user can adjust the height of the end of the test machine 200 close to the first flipping assembly 21, to improve the overall levelness of the test machine 200.

[0088] In the length direction L, the size of the first waist-shaped hole 91 is greater than the size of the first fixing hole, so that the first fixing member can move along the length direction L within the first waist-shaped hole 91, and the test machine 200 can also be moved by a certain fine adjustment in the length direction L, to cooperate with the leveling of the test machine 200 by the first adjusting assembly 40.

[0089] The fourth connecting portion 222b is provided with a plurality of second waist-shaped holes 92, which extend along the height direction H when the test machine 200 is arranged on the probe table 300. The test machine 200 is provided with a plurality of second fixing holes, a plurality of second fixing members pass through the second waist-shaped holes 92 and are fixed in the second fixing holes, and the test machine 200 can move along the height direction H relative to the second flipping assembly 22.

[0090] The test machine 200 can move along the height direction H relative to the second flipping assembly 22, and the second fixing member can also move within the second waist-shaped hole 92 and be fixedly connected with the second fixing hole, so that the user can adjust the height of the end of the test machine 200 close to the second flipping assembly 22, to improve the overall levelness of the test machine 200.

[0091] In the length direction L, the size of the second waist-shaped hole 92 is greater than the size of the second fixing hole, so that the second fixing member can move along the length direction L within the second waist-shaped hole 92, and the test machine 200 can also be moved by a certain fine adjustment in the length direction L, to cooperate with the leveling of the test machine 200 by the first adjusting assembly 40.

[0092] Optionally, in the length direction L, the movable distance range of the test machine 200 is 0mm-2mm, for example, the movable distance of the test machine 200 can be 0.1mm, or 0.3mm, or 0.5mm, or 0.6mm, or 0.9mm, or 1.0mm, or 1.2mm, or 1.4mm, or 1.7mm, or 1.8mm, or 2.0mm, or other values within 0mm-2mm, which are not limited in the present application.

[0093] In one embodiment, the first connecting portion 212a is provided with a plurality of fifth waist-shaped holes 95, which extend along the height direction H when the testing machine 200 is arranged on the probe station 300. The first turning side plate 211 is provided with a plurality of fifth fixing holes. A plurality of fifth fixing members are arranged through the fifth waist-shaped holes 95 and fixed in the fifth fixing holes. The testing machine 200 can move along the height direction H relative to the first turning side plate 211.

[0094] The testing machine 200 can move along the height direction H relative to the first turning side plate 211. The fifth fixing members can also move in the fifth waist-shaped holes 95 and be fixedly connected with the fifth fixing holes, so that the user can adjust the height of the end of the testing machine 200 close to the first turning assembly 21 to improve the overall levelness of the testing machine 200.

[0095] In the width direction W, the size of the fifth waist-shaped holes 95 is greater than the size of the fifth fixing holes, so that the fifth fixing members can move in the fifth waist-shaped holes 95 along the width direction W. The testing machine 200 can also be slightly adjusted in the width direction W to cooperate with the second adjusting assembly 50 and the third adjusting assembly 60 to level the testing machine 200.

[0096] The second connecting portion 212b is provided with a plurality of sixth waist-shaped holes 96, which extend along the height direction H when the testing machine 200 is arranged on the probe station 300. The second turning side plate 221 is provided with a plurality of sixth fixing holes. A plurality of sixth fixing members are arranged through the sixth waist-shaped holes 96 and fixed in the sixth fixing holes. The testing machine 200 can move along the height direction H relative to the second turning side plate 221.

[0097] The testing machine 200 can move along the height direction H relative to the second turning side plate 221. The sixth fixing members can also move in the sixth waist-shaped holes 96 and be fixedly connected with the sixth fixing holes, so that the user can adjust the height of the end of the testing machine 200 close to the second turning assembly 22 to improve the overall levelness of the testing machine 200.

[0098] In the width direction W, the size of the sixth waist-shaped holes 96 is greater than the size of the sixth fixing holes, so that the sixth fixing members can move in the sixth waist-shaped holes 96 along the width direction W. The testing machine 200 can also be slightly adjusted in the width direction W to cooperate with the second adjusting assembly 50 and the third adjusting assembly 60 to level the testing machine 200.

[0099] Optionally, in the embodiment, the movable distance range of the testing machine 200 in the width direction W is 0mm-2mm, for example, the movable distance of the testing machine 200 can be 0.1mm, or 0.3mm, or 0.5mm, or 0.6mm, or 0.9mm, or 1.0mm, or 1.2mm, or 1.4mm, or 1.7mm, or 1.8mm, or 2.0mm, or other values within the range of 0mm-2mm, which are not limited in the present application.

[0100] Please refer to Figure 1 , Figure 2 and Figure 9 , in an embodiment, the turnover device 100 further comprises a fourth adjusting assembly 70 and a fifth adjusting assembly 80, both of which are arranged along the height direction H with the turnover mechanism 20, and are used to adjust the levelness of the testing machine 200 along the length direction L.

[0101] Specifically, the fourth adjusting assembly 70 comprises a fourth adjusting block, a seventh adjusting piece and an eighth adjusting piece. The fourth adjusting block is fixed to the testing machine 200 and is arranged in the height direction H with the first spacer 213. The seventh adjusting piece penetrates the through hole on the fourth adjusting block and is threadedly connected with the first spacer 213. The seventh adjusting piece can rotate relative to the first spacer 213 to drive the fourth adjusting block to move in the direction of approaching the first spacer 213, thereby driving one end of the testing machine 200 to move downward along the height direction H. The eighth adjusting piece penetrates the threaded hole on the fourth adjusting block and abuts against the first spacer 213. The eighth adjusting piece can rotate relative to the first spacer 213 to drive the fourth adjusting block to move in the direction of moving away from the first spacer 213, thereby driving one end of the testing machine 200 to move upward along the height direction H. The moving direction of the testing machine 200 driven by the seventh adjusting piece is opposite to that driven by the eighth adjusting piece, so as to realize the adjustment of the movement of the testing machine 200 in two opposite directions along the height direction H, thereby adjusting the levelness of the testing machine 200 along the length direction L.

[0102] The flipping device 100 also includes a fifth adjustment assembly 80, which includes a fifth adjustment block, a ninth adjustment member, and a tenth adjustment member. The fifth adjustment block is fixed to the test machine 200 and is spaced apart from the second spacer 223 along the height direction H. The ninth adjustment member passes through the through hole on the fifth adjustment block and is threadedly connected to the second spacer 223. The ninth adjustment member can rotate relative to the second spacer 223 to drive the fifth adjustment block to move in a direction close to the second spacer 223, thereby driving one end of the test machine 200 to move downward along the height direction H. The tenth adjustment member passes through the threaded hole on the fifth adjustment block and abuts the second spacer 223. The tenth adjustment member can rotate relative to the second spacer 223 to drive the sixth adjustment block to move in a direction away from the second spacer 223, thereby driving one end of the test machine 200 to move upward along the height direction H. Among them, the moving direction of the testing machine 200 driven by the ninth adjusting member is opposite to the moving direction of the testing machine 200 driven by the tenth adjusting member, so as to realize the movement adjustment of the testing machine 200 in two opposite directions along the height direction H, and then adjust the horizontality of the testing machine 200 along the length direction L.

[0103] The fourth adjustment component 70 and the fifth adjustment component 80 respectively adjust the heights of both ends of the testing machine 200 , which can further improve the efficiency of adjusting the horizontality of the testing machine 200 along the length direction L.

[0104] Please refer to Figure 1 、 Figure 2 、 Figure 10 and Figure 11 In one embodiment, a plurality of third waist-shaped holes 93 are provided on the first flip side plate 211. When the test machine 200 is placed on the probe station 300, the third waist-shaped holes 93 extend along the height direction H. A plurality of third fixing holes are provided on the rotating mechanism 30. A plurality of third fixing members pass through the third waist-shaped holes 93 and are fixed in the third fixing holes. The first flip side plate 211 can move along the height direction H relative to the rotating mechanism 30.

[0105] The first flip side panel 211 can move along the height direction H relative to the rotating mechanism 30, thereby driving the testing machine 200 to move along the height direction H at one end close to the second flip side panel 221, and the third fixing member can also move in the third waist-shaped hole 93 and be fixedly connected to the third fixing hole, so that the user can adjust the height of the end of the testing machine 200 close to the first flip side panel 211 to improve the overall levelness of the testing machine 200.

[0106] The second flip side plate 221 is provided with a plurality of fourth waist-shaped holes. When the testing machine 200 is placed on the probe station 300, the fourth waist-shaped holes extend along the height direction H. The rotating mechanism 30 is provided with a plurality of fourth fixing holes. A plurality of fourth fixing members pass through the fourth waist-shaped holes and are fixed in the fourth fixing holes. The second flip side plate 221 can move along the height direction H relative to the rotating mechanism 30.

[0107] The second flip side panel 221 can move along the height direction H relative to the rotating mechanism 30, thereby driving the end of the testing machine 200 close to the second flip side panel 221 to move along the height direction H, and the fourth fixing member can also move in the fourth waist-shaped hole and be fixedly connected to the fourth fixing hole, so that the user can adjust the height of the end of the testing machine 200 close to the second flip side panel 221 to improve the overall levelness of the testing machine 200.

[0108] It should be noted that the fixed connection between the flip mechanism 20 and the rotating mechanism 30 can retain a locking margin. In other words, the flip mechanism 20 and the rotating mechanism 30 can be movably connected, and the flip mechanism 20 can move relative to the rotating mechanism 30 to fine-tune the position of the testing machine 200. Moreover, when the testing machine 200 is subsequently moved and leveled, the fixed connection between the flip mechanism 20 and the rotating mechanism 30 retains a locking margin. The testing machine 200 and the flip mechanism 20 can be slightly moved relative to the rotating mechanism 30 until the testing machine 200 is leveled, and then the connection between the flip mechanism 20 and the rotating mechanism 30 is locked and fixed.

[0109] In one embodiment, the first flip assembly 21 further includes a first leveling member 214 and a second leveling member 215. The first leveling member 214 passes through a through hole on the first flip side plate 211 and is threadedly connected to the rotating mechanism 30. The second leveling member 215 passes through a threaded hole on the first flip side plate 211 and abuts against the rotating mechanism 30. The first leveling member 214 is used to provide a first force to the rotating mechanism 30. The second leveling member 215 is used to provide a second force to the rotating mechanism 30. The directions of the first force and the second force are opposite.

[0110] The first leveling member 214 penetrates through the through hole on the first turnover side plate 211 and is threadedly connected with the rotating mechanism 30. In this embodiment, the first leveling member 214 is a locking screw, the screw head of the first leveling member 214 abuts against the first turnover side plate 211, the screw rod of the first leveling member 214 is threadedly connected with the rotating mechanism 30, and the first leveling member 214 can rotate relative to the rotating mechanism 30 to drive the first turnover assembly 21 to move upward along the height direction H, thereby driving the test machine 200 to move upward along the height direction H. Alternatively, in this embodiment, the number of the first leveling members 214 is two, and the two first leveling members 214 are arranged at intervals. In other embodiments, the number of the first leveling members 214 can also be one, or three, or four, or more than four, which is not limited in the present application.

[0111] The second leveling member 215 penetrates through the threaded hole on the first turnover side plate 211 and abuts against the rotating mechanism 30. In this embodiment, the second leveling member 215 is a top screw structure, the screw head of the second leveling member 215 is spaced apart from the first turnover side plate 211, the outer periphery of the screw rod of the second leveling member 215 is threadedly connected with the first turnover side plate 211, and the screw rod of the second leveling member 215 abuts against the rotating mechanism 30. The second leveling member 215 can rotate relative to the rotating mechanism 30 to drive the first turnover assembly 21 to move downward along the height direction H, thereby driving the test machine 200 to move upward along the height direction H. The moving direction of the test machine 200 driven by the second leveling member 215 is opposite to the moving direction of the test machine 200 driven by the first adjusting member 42, so as to realize the adjustment of the movement of the test machine 200 along the two directions of up and down along the height direction H, thereby adjusting the levelness of the test machine 200 along the length direction L. Alternatively, in this embodiment, the number of the second leveling members 215 is two, and the two second leveling members 215 are arranged at intervals. In other embodiments, the number of the second leveling members 215 can also be one, or three, or four, or more than four, which is not limited in the present application.

[0112] The second turnover assembly 22 further comprises a third leveling member and a fourth leveling member. The third leveling member penetrates through the through hole on the second turnover side plate 221 and is threadedly connected with the rotating mechanism 30. The fourth leveling member penetrates through the threaded hole on the second turnover side plate 221 and abuts against the rotating mechanism 30. The third leveling member is used to provide a third acting force to the rotating mechanism 30, and the fourth leveling member is used to provide a fourth acting force to the rotating mechanism 30. The directions of the third acting force and the fourth acting force are opposite.

[0113] The third leveling member penetrates through the through hole on the second turnover side plate 221 and is threadedly connected with the rotating mechanism 30. In this embodiment, the third leveling member is a locking screw, the screw head of the third leveling member abuts against the second turnover side plate 221, the screw rod of the third leveling member is threadedly connected with the rotating mechanism 30, and the third leveling member can rotate relative to the rotating mechanism 30 to drive the second turnover assembly 22 to move upward along the height direction H, thereby driving the testing machine 200 to move upward along the height direction H. Alternatively, in this embodiment, the number of the third leveling members is 2, and the two third leveling members are arranged at intervals. In other embodiments, the number of the third leveling members can also be 1, or 3, or 4, or more than 4, which is not limited in the present application.

[0114] The fourth leveling member penetrates through the threaded hole on the second turnover side plate 221 and abuts against the rotating mechanism 30. In this embodiment, the fourth leveling member is a jack structure, the screw head of the fourth leveling member is spaced apart from the second turnover side plate 221, the outer periphery of the screw rod of the fourth leveling member is threadedly connected with the second turnover side plate 221, and the screw rod of the fourth leveling member abuts against the rotating mechanism 30. The fourth leveling member can rotate relative to the rotating mechanism 30 to drive the second turnover assembly 22 to move downward along the height direction H, thereby driving the testing machine 200 to move upward along the height direction H. The moving direction of the testing machine 200 driven by the fourth leveling member is opposite to the moving direction of the testing machine 200 driven by the first adjusting member 42, so as to realize the adjustment of the movement of the testing machine 200 in the upward and downward directions along the height direction H, thereby adjusting the levelness of the testing machine 200 along the length direction L. Alternatively, in this embodiment, the number of the fourth leveling members is 2, and the two fourth leveling members are arranged at intervals. In other embodiments, the number of the fourth leveling members can also be 1, or 3, or 4, or more than 4, which is not limited in the present application.

[0115] The first leveling member 214, the second leveling member 215, the third leveling member, and the fourth leveling member respectively adjust the heights of the two ends of the testing machine 200, which can further improve the adjustment efficiency of the levelness of the testing machine 200 along the length direction L.

[0116] The phrase "in an embodiment" or "in embodiments" means that a particular feature, structure, or characteristic described in connection with the embodiment is included in at least one embodiment of the application. The appearances of the phrase "in an embodiment" or "in embodiments" in various places in the specification are not necessarily all referring to the same embodiment, nor are they necessarily mutually exclusive of one another. It is explicitly contemplated that embodiments described in the specification can be combined with other embodiments in any way. Furthermore, it should be understood that features, structures, or characteristics described in connection with one or more embodiments are not necessarily included in every implementation of the application. In addition, it should be understood that features, structures, or characteristics described in connection with one or more embodiments can be used in

[0117] The above description is considered that part of the embodiments of the present application, it should be pointed out that, for those skilled in the art, without departing from the principles of the present application, can make a number of improvements and refinements, these improvements and refinements are also considered the scope of protection of the present application.

Claims

1. A leveling turning device, characterized in that: Used to flip the test machine onto the probe table, the flipping device includes: bearing seat; A rotating mechanism, the rotating mechanism being arranged on the supporting seat along the length direction; A flip mechanism, the flip mechanism comprising a first flip assembly and a second flip assembly spaced apart, the first flip assembly being connected to the rotating mechanism and the testing machine, respectively, and the second flip assembly being connected to the rotating mechanism and the testing machine, respectively; and The first adjustment component is arranged on the testing machine, and the first adjustment component and the first flipping component or the second flipping component are arranged in sequence along the length direction. The first adjustment component drives the testing machine to move relative to the flipping mechanism along the length direction and adjusts the horizontality of the testing machine along the length direction.

2. The turning device according to claim 1, characterized in that: The first adjustment assembly includes a first adjustment block, a first adjustment member, and a second adjustment member. The first adjustment block is fixed on the testing machine and is spaced apart from the first flip assembly or the second flip assembly. The first adjustment member passes through the through hole on the first adjustment block and is threadedly connected to the first flip assembly or the second flip assembly. The second adjustment member passes through the threaded hole on the first adjustment block and abuts against the first flip assembly or the second flip assembly.

3. The turning device according to claim 2, characterized in that: The first flip assembly includes a first flip side plate and a first connecting member, the first flip side plate is connected to the rotating mechanism, the first connecting member is provided on a side of the first flip side plate away from the rotating mechanism, the first connecting member includes a first connecting portion and a second connecting portion that are connected and perpendicular to each other, the first connecting portion is connected to the first flip side plate, and the second connecting portion is connected to the testing machine; The second flip assembly includes a second flip side plate and a second connecting member, the second flip side plate is connected to the rotating mechanism, the second connecting member is arranged on the side of the second flip side plate away from the rotating mechanism, the second connecting member includes a third connecting portion and a fourth connecting portion that are connected and perpendicular to each other, the third connecting portion is connected to the second flip side plate, and the fourth connecting portion is connected to the testing machine.

4. The turning device according to claim 3, characterized in that: The flip device further includes a second adjustment assembly and a third adjustment assembly, the second adjustment assembly including a second adjustment block, a third adjustment member, and a fourth adjustment member, the second adjustment block being fixed to the first flip side plate and being disposed on a side of the second connection portion facing away from the testing machine, the third adjustment member passing through a through hole on the second adjustment block and being threadedly connected to the second connection portion, and the fourth adjustment member passing through a threaded hole on the second adjustment block and abutting against the second connection portion; The third adjustment assembly includes a third adjustment block, a fifth adjustment member, and a sixth adjustment member. The third adjustment block is fixed to the second flip side plate and is arranged on the side of the fourth connecting part away from the testing machine. The fifth adjustment member passes through the through hole on the third adjustment block and is threadedly connected to the fourth connecting part. The sixth adjustment member passes through the threaded hole on the third adjustment block and abuts the fourth connecting part.

5. The turning device according to claim 3, characterized in that: The first flip assembly further includes a first spacer, and the second flip assembly further includes a second spacer, the first spacer being provided on the first connecting member and respectively connecting the first connecting portion and the second connecting portion, the second spacer being provided on the second connecting member and respectively connecting the third connecting portion and the fourth connecting portion; The first adjusting block is fixed on the testing machine and is spaced apart from the first spacer or the second spacer along the length direction. The first adjusting member passes through the through hole on the first adjusting block and is threadedly connected to the first spacer or the second spacer. The second adjusting member passes through the threaded hole on the first adjusting block and abuts against the first spacer or the second spacer.

6. The turning device according to claim 5, characterized in that: The flip device further includes a second adjustment assembly and a third adjustment assembly, the second adjustment assembly including a second adjustment block, a third adjustment member, and a fourth adjustment member, the second adjustment block being fixed to the first flip side plate and being disposed on a side of the first spacer facing away from the testing machine, the third adjustment member passing through a through hole on the second adjustment block and being threadedly connected to the first spacer, and the fourth adjustment member passing through a threaded hole on the second adjustment block and abutting against the first spacer; The third adjustment assembly includes a third adjustment block, a fifth adjustment member, and a sixth adjustment member. The third adjustment block is fixed to the second flip side plate and is arranged on the side of the second spacer away from the testing machine. The fifth adjustment member passes through the through hole on the third adjustment block and is threadedly connected to the second spacer. The sixth adjustment member passes through the threaded hole on the third adjustment block and abuts the second spacer.

7. The turning device according to claim 3, characterized in that: The second connecting portion is provided with a plurality of first waist-shaped holes. When the tester is placed on the probe table, the first waist-shaped holes extend in the height direction. The tester is provided with a plurality of first fixing holes. A plurality of first fixing members pass through the first waist-shaped holes and are fixed in the first fixing holes. The tester can move in the height direction relative to the first flip assembly. The fourth connecting part is provided with a plurality of second waist-shaped holes. When the testing machine is placed on the probe table, the second waist-shaped holes extend along the height direction. The testing machine is provided with a plurality of second fixing holes. A plurality of second fixing members pass through the second waist-shaped holes and are fixed in the second fixing holes. The testing machine can move along the height direction relative to the second flip assembly.

8. The turning device according to claim 5, characterized in that: The flipping device further includes a fourth adjustment assembly, the fourth adjustment assembly including a fourth adjustment block, a seventh adjustment member, and an eighth adjustment member, the fourth adjustment block being fixed to the testing machine and spaced apart from the first spacer in the height direction, the seventh adjustment member passing through a through hole on the fourth adjustment block and being threadedly connected to the first spacer, and the eighth adjustment member passing through a threaded hole on the fourth adjustment block and abutting against the first spacer; The flipping device also includes a fifth adjusting component, which includes a fifth adjusting block, a ninth adjusting member, and a tenth adjusting member. The fifth adjusting block is fixed to the testing machine and is spaced apart from the second spacer along the height direction. The ninth adjusting member passes through the through hole on the fifth adjusting block and is threadedly connected to the second spacer. The tenth adjusting member passes through the threaded hole on the fifth adjusting block and abuts against the second spacer.

9. The turning device according to any one of claims 3 to 8, characterized in that: The first flip side plate is provided with a plurality of third waist-shaped holes. When the tester is placed on the probe table, the third waist-shaped holes extend in the height direction. The rotating mechanism is provided with a plurality of third fixing holes. A plurality of third fixing members pass through the third waist-shaped holes and are fixed in the third fixing holes. The first flip side plate can move in the height direction relative to the rotating mechanism. The second flip side plate is provided with a plurality of fourth waist-shaped holes. When the test machine is placed on the probe table, the fourth waist-shaped holes extend along the height direction. The rotating mechanism is provided with a plurality of fourth fixing holes. A plurality of fourth fixing members pass through the fourth waist-shaped holes and are fixed in the fourth fixing holes. The second flip side plate can move along the height direction relative to the rotating mechanism.

10. The turning device according to claim 9, characterized in that: The first flip assembly further includes a first leveling member and a second leveling member, the first leveling member passing through a through hole on the first flip side plate and being threadedly connected to the rotating mechanism, the second leveling member passing through a threaded hole on the first flip side plate and abutting against the rotating mechanism, the first leveling member being used to provide a first force to the rotating mechanism, the second leveling member being used to provide a second force to the rotating mechanism, the first force and the second force being in opposite directions; The second flip assembly also includes a third leveling member and a fourth leveling member. The third leveling member passes through the through hole on the second flip side plate and is threadedly connected to the rotating mechanism. The fourth leveling member passes through the threaded hole on the second flip side plate and abuts against the rotating mechanism. The third leveling member is used to provide a third force to the rotating mechanism, and the fourth leveling member is used to provide a fourth force to the rotating mechanism. The directions of the third force and the fourth force are opposite.

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