Test probe remover of solar cell classification detection equipment

Abstract

The utility model provides a test probe remover of solar cell classification detection equipment, which belongs to the technical field of solar cell manufacture and comprises a fixing plate, a lifting plate, a lifting screw and two guide rods, the fixing plate is provided with lower clamping grooves, and the positions and the number of the lower clamping grooves are in one-to-one correspondence with those of probe sleeves of a probe row; the lifting plate is provided with upper clamping grooves which are in one-to-one correspondence with the to-be-disassembled probes in position and number. The width of the upper clamping groove in the length direction is smaller than the diameter of a probe head at the top end of the probe, and the width of the upper clamping groove is larger than the diameter of a probe telescopic rod of the probe. The lifting screw rod is screwed on the lifting plate, and the lower end of the lifting screw rod can abut against the fixed plate; the two guide rods are symmetrically arranged on the two sides of the lifting screw. Guide holes in sliding fit with the guide rods are formed in the two ends of the lifting plate. By using the device, all probes on a single probe row can be taken out at the same time through one-time operation, the operation is simple, and the working efficiency is high; and when the probe is pulled out, the probe vertically moves upwards, the direction is fixed, and the probe sleeve is not easy to damage.

Description

TECHNICAL FIELD

[0001] The utility model belongs to solar cell manufacturing technical field, concretely relates to a kind of test probe dismounters of solar cell classification detection equipment. BACKGROUND

[0002] The test probe of solar cell piece classification detection equipment has certain service life, and the probe needs to be replaced after reaching the service life of test, since the probe is pressed into the needle cover by external force, and the probe is pulled out one by one using pliers when disassembling. When disassembling the probe, pointed-nose pliers or other conventional tools are mostly used, which not only slows down the dismounting speed, but also easily causes the deformation of the probe cover, thereby causing the probe row to be scrapped.

[0003] Currently, 60-80 probes are installed on a single probe row, and the number is very large, so the work efficiency is extremely low when pulling out one by one. UTILITY MODEL CONTENT

[0004] The utility model embodiment provides a kind of test probe dismounters of solar cell classification detection equipment, to solve the problem that current probe dismounting is time-consuming and laborious, and easily causes the probe row to be scrapped.

[0005] To achieve the above object, the technical scheme adopted by the utility model is as follows: a kind of test probe dismounters of solar cell classification detection equipment is provided, comprising: a fixed plate, a lifting plate, a lifting screw and two guide rods, a lower clamping groove corresponding to the position and number of the probe cover of the probe row is arranged along the length direction of the fixed plate;The lifting plate is parallel to the fixed plate and located directly above the fixed plate;A upper clamping groove corresponding to the position and number of the probe to be disassembled is arranged on the lifting plate along its length direction;The width of the upper clamping groove along the length direction is less than the diameter of the probe head at the top end of the probe, and the width of the upper clamping groove is also greater than the diameter of the probe telescopic rod;The length direction of the lifting plate is consistent with the length direction of the fixed plate;The lifting screw is screwed on the lifting plate, and its lower end can abut on the fixed plate;Two guide rods are symmetrically arranged on the two sides of the lifting screw;The two ends of the lifting plate are provided with guide holes for sliding cooperation with the guide rods;The lifting screw is rotated to make the lifting plate rise upwards along the guide rods, and drive the probe to be pulled out from the probe cover.

[0006] In an implementable manner, the thickness of the lifting plate in the up-down direction is less than the distance between the probe head and the probe tube on the probe telescopic rod, and the lifting plate is clamped between the probe tube and the probe head.

[0007] In an implementable manner, the thickness of the lifting plate is equal to 1 / 2-2 / 3 of the distance between the probe head and the probe tube.

[0008] In an implementable mode, the upper clamping groove is a U-shaped groove or a rectangular groove.

[0009] In an implementable mode, the slot of the upper clamping groove is a horn-shaped slot, and opposite sides of the horn-shaped slot are provided with a guide inclined surface or a guide arc surface for guiding the probe telescopic rod.

[0010] In an implementable mode, the lower clamping groove is a U-shaped groove or a rectangular groove.

[0011] In an implementable mode, a lower limiting step is arranged on the guide rod, the lifting plate is supported on the lower limiting step, and an upper limiting cap for limiting the lifting plate is arranged on an upper end of the guide rod.

[0012] In an implementable mode, a lower end of the guide rod is screwed on the fixed plate, and first internal thread holes for screwing the guide rod are arranged at two ends of the fixed plate.

[0013] In an implementable mode, a limiting groove is arranged on the fixed plate and corresponds to a position of the lifting screw rod, and a lower end of the lifting screw rod is supported in the limiting groove and is in sliding fit with the limiting groove.

[0014] In an implementable mode, an upper end of the lifting screw rod is provided with a handle.

[0015] Compared with the prior art, the test probe dismounting device of the solar cell classification detection equipment has the beneficial effects that: when the probe on the probe row is dismounted by using the device, the position of the lifting plate is first adjusted, and the lifting plate is located between the probe head and the probe tube, the lower clamping grooves of the fixed plate are aligned with the probe sleeves one by one, the upper clamping grooves of the lifting plate are aligned with the probe telescopic rods one by one, the fixed plate is pushed along the surface of the probe fixed row to make the probe telescopic rods and the probe sleeves simultaneously inserted into the lifting plate and the fixed plate, the lifting screw rod is rotated to make the bottom of the lifting screw rod abut against the fixed plate, and then the lifting screw rod is rotated to drive the lifting plate to move upward, the upper surface of the lifting plate abuts against the lower surface of the probe head, the lifting screw rod is continuously rotated to drive the lifting plate to move upward, and the probe can be pulled out of the probe sleeve through the probe head, so that the task of dismounting the probe is achieved.

[0016] By using the device, all the probes on a single probe row can be taken out at one time, the operation is simple, and the working efficiency is high; and when the probe is pulled out, the probe vertically moves upward, the direction is fixed, and the probe sleeve is not easy to be damaged. BRIEF DESCRIPTION OF DRAWINGS

[0017] Figure 1 The structure diagram of the test probe dismounting device of the solar cell classification detection equipment is provided for the embodiments of the utility model.

[0018] Figure 2 The top view structure schematic diagram of the lifting plate provided by the embodiment of the utility model;

[0019] Figure 3 The top view structure schematic diagram of the fixed plate provided by the embodiment of the utility model;

[0020] Figure 4 The use state structure schematic diagram of the test probe remover of the solar cell classification detection equipment provided by the embodiment of the utility model;

[0021] Figure 5 The structure schematic diagram of the probe disassembled by the embodiment of the utility model;

[0022] Mark explanation:

[0023] 1, lifting screw; 101, handle; 2, guide rod; 201, upper limit cap; 202, lower limit step; 3, lifting plate; 301, upper clamping groove; 302, guide hole; 303, second internal thread hole; 4, fixed plate; 401, lower clamping groove; 402, first internal thread hole; 5, probe row; 501, probe fixed row; 502, probe sleeve; 6, probe; 601, probe head; 602, probe telescopic rod; 603, probe tube. Specific implementation

[0024] In order to make the technical problem, technical scheme and beneficial effect to be solved by the utility model more clear and obvious, the utility model is further described in detail below by combining with the drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the utility model, and are not used to limit the utility model.

[0025] Please see Figures 1 to 5The utility model provides a solar cell classification detection equipment's test probe dismounting device, and the beneficial effect lies in: when the probe 6 on the probe row 5 is dismounted by the device, the position of the lifting plate 3 is adjusted first, and the lifting plate 3 is between the probe head 601 and the probe tube 603, the lower clamping groove 401 of the fixed plate 4 is aligned with the probe sleeve 502 one by one, the upper clamping groove 301 of the lifting plate 3 is aligned with the probe telescopic rod 602 one by one, the fixed plate 4 is pushed along the upper surface of the probe fixed row 501, the probe telescopic rod 602 and the probe sleeve 502 are inserted into the lifting plate 3 and the fixed plate 4 simultaneously, the lifting screw 1 is rotated, the bottom of the lifting screw 1 is abutted on the fixed plate 4, and then force is rotated, the rotation of the lifting screw 1 can be converted into the linear motion of the lifting plate 3, the lifting plate 3 is moved upwards, the upper surface of the lifting plate 3 is abutted on the lower surface of the probe head 601, the lifting screw 1 is continuously rotated, the lifting plate 3 is moved upwards, and the probe 6 can be pulled out from the probe sleeve 502 through the probe head 601, so that the probe 6 is dismounted.

[0026] The utility model provides a solar cell classification detection equipment's test probe 6 dismounting device, and the beneficial effect lies in: when the probe 6 on the probe row 5 is dismounted by the device, the position of the lifting plate 3 is adjusted first, and the lifting plate 3 is between the probe head 601 and the probe tube 603, the lower clamping groove 401 of the fixed plate 4 is aligned with the probe sleeve 502 one by one, the upper clamping groove 301 of the lifting plate 3 is aligned with the probe telescopic rod 602 one by one, the fixed plate 4 is pushed along the upper surface of the probe fixed row 501, the probe telescopic rod 602 and the probe sleeve 502 are inserted into the lifting plate 3 and the fixed plate 4 simultaneously, the lifting screw 1 is rotated, the bottom of the lifting screw 1 is abutted on the fixed plate 4, and then force is rotated, the rotation of the lifting screw 1 can be converted into the linear motion of the lifting plate 3, the lifting plate 3 is moved upwards, the upper surface of the lifting plate 3 is abutted on the lower surface of the probe head 601, the lifting screw 1 is continuously rotated, the lifting plate 3 is moved upwards, and the probe 6 can be pulled out from the probe sleeve 502 through the probe head 601, so that the probe 6 is dismounted.

[0027] The device has simple structure, easy manufacturing and low manufacturing cost, and the device can be used to operate once, take out all the probes 6 on the single probe row 5, has simple operation and high working efficiency, and the probe 6 runs vertically upward when being pulled out, so the direction is fixed and the probe sleeve 502 is not easy to be damaged.

[0028] It should be noted that the fixed plate 4 and the lifting plate 3 are rectangular plates, and due to the adaptation of the probes 6 on the probe array 5, the probes 6 have a certain length and the width does not have to be too large, so they have a large length-width ratio; the length direction referred to herein is the length direction of the fixed plate 4 or the lifting plate 3, and other directions are defined with respect to the length direction of the fixed plate 4 or the lifting plate 3; the thickness of the lifting plate 3 is the up-down direction, and the up-down direction is consistent with the up-down direction of the detection equipment machine.

[0029] Referring to Figure 5 , the structure of the probe 6, the probe 6 is composed of a probe head 601, a probe telescopic rod 602, and a probe tube 603, the probe head 601 is cylindrical, the probe telescopic rod 602 is a circular long rod, and the probe tube 603 is a hollow circular column and contains a spring inside. The probe head 601 is fixedly connected with the probe telescopic rod 602, and the probe telescopic rod 602 is slidably connected with the probe tube 603. The axes of the probe head 601, the probe telescopic rod 602, and the probe tube 603 are consistent. Referring to Figure 1 and Figure 5 , the probe array 5 is composed of a probe sleeve 502 and a probe fixed array 501; the probe 6 is inserted into the probe sleeve 502 to form an electrical connection.

[0030] In some embodiments, referring to Figure 1 , the thickness of the lifting plate 3 in the up-down direction is less than the distance L between the probe head 601 and the probe tube 603, and the lifting plate 3 is clamped between the probe tube 603 and the probe head 601.

[0031] In some embodiments, referring to Figure 1 and Figure 5 , the thickness of the lifting plate 3 is equal to 1 / 2-2 / 3 of the distance L between the probe head 601 and the probe tube 603. The lifting plate 3 needs a certain thickness to ensure a certain rigidity and strength to pull out the probe 6.

[0032] Generally, the thickness of the lifting plate 3 is equal to 1 / 2 of the distance between the probe head 601 and the probe tube 603.

[0033] In some embodiments, referring to Figure 2 , the upper clamping groove 301 is a U-shaped groove or a rectangular groove, which can be inserted into the probe telescopic rod 602.

[0034] In some embodiments, referring to Figure 2 , the slot of the upper clamping groove 301 is a horn slot, and opposite sides thereof are provided with a guide inclined surface or a guide arc surface for guiding the probe telescopic rod 602, so as to facilitate the insertion of the probe telescopic rod 602 into the upper clamping groove 301 without hard collision with the probe telescopic rod 602, thereby avoiding damage when the probe telescopic rod 602 is not aligned in place.

[0035] In some embodiments, referring toFigure 3 As shown, the lower slot 401 is a U-shaped slot or a rectangular slot, which can be used to insert the probe cover 502.

[0036] In some embodiments, see Figure 1 and Figure 4 As shown, the guide rod 2 is provided with a lower limit step 202, on which the lifting plate 3 is supported. An upper limit cap 201 is provided at the upper end of the guide rod 2 to limit the lifting plate 3. The lower limit step 202 on the guide rod 2 supports the lifting plate 3, maintaining a certain distance between the lifting plate 3 and the fixed plate 4 and preventing the lifting plate 3 from interfering with the probe cover 502. The upper limit cap 201 at the upper end of the guide rod 2 limits the lifting plate 3's maximum upward position.

[0037] In this application, the upper limit cap 201 can be a nut screwed onto the upper end of the guide rod 2; the lower limit step 202 can also be a nut screwed onto the guide rod 2. In this way, a section of the guide rod 2 between the upper limit cap 201 and the lower limit step 202 is an optical axis to ensure the smooth lifting and lowering of the lifting plate 3.

[0038] In some embodiments, see Figure 1 、 Figure 3 and Figure 4 As shown, the lower end of the guide rod 2 is screwed to the fixed plate 4; the two ends of the fixed plate 4 are provided with first internal threaded holes 402 for screwing to the guide rod 2. The guide rod 2 is screwed to the fixed plate 4, and the installation is simple and convenient.

[0039] In some embodiments, a limiting slot (not shown) is provided on the fixed plate 4 at a position corresponding to the position of the lifting screw 1. The lower end of the lifting screw 1 is supported in the limiting slot and slides with the limiting slot. When the lower end of the lifting screw 1 is inserted into the limiting slot, the second internally threaded hole 303 on the lifting plate 3 and the limiting slot on the fixed plate 4 form a two-point linear limit for the lifting screw 1, thereby ensuring that the lifting screw 1 is lifted vertically, and further ensuring that the probe 6 can be pulled vertically out of the probe cover 502 to avoid damage to the probe cover 502. Among them, the lifting plate 3 is provided with a second internally threaded hole 303 that threadably cooperates with the lifting screw 1.

[0040] In some embodiments, see Figure 1 and Figure 4 As shown, the upper end of the lifting screw 1 is provided with a handle 101. When removing the probe 6, the handle 101 can be rotated by hand, making the operation simple and convenient. The handle 101 can be a horizontal bar provided on the upper end of the lifting screw 1 or a hand wheel.

[0041] In the above embodiments, the description of each embodiment has its own focus. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant description of other embodiments.

[0042] The above merely describes preferred embodiments of the present application and is not intended to limit the present application, and any modification, equivalent replacement, and improvement within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A test probe dismounting device for a solar cell sorting inspection apparatus, characterized by, The utility model relates to a probe dismounting device, which comprises: a fixed plate (4) provided with lower clamping grooves (401) corresponding to the positions and number of probe sleeves (502) of a probe row (5) along the length direction of the fixed plate (4); a lifting plate (3) parallel to the fixed plate (4) and located directly above the fixed plate (4); the lifting plate (3) is provided with upper clamping grooves (301) corresponding to the positions and number of probes (6) to be dismounted along the length direction of the lifting plate (3); the width of the upper clamping grooves (301) along the length direction is smaller than the diameter of probe heads (601) at the top end of the probes (6), and the width of the upper clamping grooves (301) is greater than the diameter of probe telescopic rods (602) of the probes (6); the length direction of the lifting plate (3) is consistent with the length direction of the fixed plate (4); a lifting screw (1) screwed on the lifting plate (3) and having a lower end capable of abutting against the fixed plate (4); and two guide rods (2) symmetrically arranged on both sides of the lifting screw (1); both ends of the lifting plate (3) are provided with guide holes (302) in sliding fit with the guide rods (2); the lifting screw (1) is rotated to make the lifting plate (3) rise along the guide rods (2) and drive the probes (6) to be pulled out of the probe sleeves (502).

2. The test probe dismounting device for solar cell sorting inspection apparatus according to claim 1, wherein The thickness of the lifting plate (3) in the up-down direction is smaller than the distance between the probe heads (601) and probe tubes (603) on the probe telescopic rods (602), and the lifting plate (3) is clamped between the probe tubes (603) and the probe heads (601).

3. The test probe dismounting device for solar cell sorting inspection apparatus according to claim 2, wherein The thickness of the lifting plate (3) is equal to 1 / 2-2 / 3 of the distance between the probe heads (601) and the probe tubes (603).

4. The test probe dismounting device for solar cell sorting inspection apparatus according to claim 1, wherein The upper clamping grooves (301) are U-shaped grooves or rectangular grooves.

5. The test probe dismounting device for solar cell sorting inspection apparatus according to claim 4, wherein The slot opening of the upper clamping grooves (301) is a horn opening, and opposite sides of the slot opening are provided with guide inclined surfaces or guide arc surfaces for guiding the probe telescopic rods (602).

6. The test probe dismounting device for solar cell sorting inspection apparatus according to claim 1, wherein The lower clamping grooves (401) are U-shaped grooves or rectangular grooves.

7. The test probe dismounting device for solar cell sorting inspection apparatus according to claim 1, wherein The guide rods (2) are provided with lower limiting steps (202), the lifting plate (3) is supported on the lower limiting steps (202), and upper limiting caps (201) for limiting the lifting plate (3) are arranged at the upper end of the guide rods (2).

8. The test probe dismounting device for solar cell sorting inspection apparatus according to claim 1, wherein The lower end of the guide rod (2) is screwed on the fixed plate (4); both ends of the fixed plate (4) are provided with first internal thread holes (402) for threadedly connecting the guide rods (2).

9. The test probe dismounting device for solar cell sorting inspection apparatus according to claim 1, wherein The fixed plate (4) is provided with a limiting groove corresponding to the position of the lifting screw (1), the lower end of the lifting screw (1) is supported in the limiting groove and is in sliding fit with the limiting groove.

10. The test probe dismounting device for solar cell sorting inspection apparatus according to claim 1, wherein The upper end of the lifting screw (1) is provided with a handle (101).

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