Convenient-to-overturn jig for semiconductor detection

Abstract

The utility model discloses a semiconductor detection jig convenient to turn over, which comprises a detection support, a fixed plate used for supporting, a fixed clamping block used for clamping and a supporting column, the supporting column is rotatably installed at the upper end of the detection support, the front side of the supporting column is fixedly connected with a movable rod, the movable rod is inserted in the front side of the upper end of the detection support, and the fixed clamping block is fixedly connected with the movable rod. And the movable column is fixedly connected to the lower end of the fixing plate, and a rotating structure is formed between the movable column and the supporting column. According to the semiconductor detection jig convenient to overturn, a detected semiconductor can be conveniently and stably clamped, in the clamping process, clamping damage to the semiconductor can be prevented through buffer rubber pads arranged on a fixing plate and a fixing clamping block, in the detection process, a supporting column rotates at the upper end of a detection support, and the semiconductor can be conveniently overturned. And the movable column rotates in the middle of the supporting column, so that the detection angle and the detection position of the semiconductor can be adjusted in multiple directions.

Description

TECHNICAL FIELD

[0001] The utility model relates to the related technical field of semiconductor detection, specifically to a semiconductor detection fixture convenient to overturn. BACKGROUND

[0002] Semiconductor refers to the material that can be in normal temperature under the electric performance between conductor and insulator, and the use of semiconductor is very extensive, for example, in integrated circuit, consumer electronics, communication system, photovoltaic power generation, illumination, high -power power conversion and so on all have the application, after producing and processing the semiconductor, need to carry out relevant detection operation to the semiconductor, when detecting, can use the fixture to fix the semiconductor to be detected,

[0003] For example, the authorized announcement number CN219997231U, the authorized announcement day is November 10, 2023, discloses a semiconductor detection turnover jig convenient to adjust size, including support frame, the upper surface of support frame is fixedly connected with electro hydraulic push rod through bolt, the telescopic end of electro hydraulic push rod is through the top end inner wall of support frame and is rotatably connected with the middle part of the upper surface of push plate through bearing, the bottom side of push plate is provided with first fixed frame, the bottom end of the both sides of first fixed frame is symmetrically installed with first connecting block, the bottom side of first fixed frame is provided with second fixed frame, the top end of the both sides of second fixed frame is symmetrically installed with second connecting block, the top end inner wall of first fixed frame and the bottom end inner wall of second fixed frame are all provided with positioning slot, the bottom side of push plate is provided with pressure sensor, through the above technical scheme, the problem that the clamping force of semiconductor cannot be controlled in the prior art is solved,

[0004] However, the prior art has the problems of complex structure, high use cost, and inconvenient multi-directional adjustment of the detection position and angle of the semiconductor during detection, such as the above-mentioned comparative patent.

[0005] Therefore, we propose a semiconductor detection fixture convenient to overturn to solve the above problems. UTILITY MODEL CONTENTS

[0006] The utility model aims at providing a semiconductor detection fixture convenient to overturn to solve the problem of complex structure, high use cost, and inconvenient multi-directional adjustment of the detection position and angle of the semiconductor during detection in the prior art.

[0007] In order to realize the above-mentioned purpose, the utility model provides the following technical scheme: a convenient to overturn's semiconductor detection is with tool, including detection support, be used for supporting's fixed plate and be used for clamping's fixed clamping piece;

[0008] Among them, the lower end of the fixed clamping piece and the upper end of the fixed plate are provided with buffer rubber pads;

[0009] Further comprising:

[0010] Support column, the support column is rotatably installed at the upper end of the detection support, and the front side of the support column is fixedly connected with a movable rod, the movable rod is inserted into the front side of the upper end of the detection support, and the movable rod is combined with the mounting plate to limit the support column and the detection support;

[0011] Movable column, the movable column is fixedly connected to the lower end of the fixed plate, and a rotating structure is formed between the movable column and the support column, a fixing mechanism is arranged at the lower end of the movable column, and the fixing mechanism is used to limit the movable column and the support column.

[0012] Preferably, the front and rear sides of the upper end of the fixed plate are threadedly connected with fixing bolts for adjustment, and the fixing bolts are rotatably connected with the fixed clamping pieces.

[0013] Preferably, the fixing bolts drive the fixed clamping pieces to form an extension structure in the middle of the fixed plate, and the fixed clamping pieces are snap groove connected with the fixed plate.

[0014] Preferably, the fixing mechanism comprises a protrusion for positioning, a front connecting column fixedly connected to the front side of the lower end of the support column, a rear connecting column fixedly connected to the rear side of the lower end of the support column, a fixing cap for limiting, and a positioning plate sleeved on the outer surface of the front connecting column.

[0015] Preferably, the fixing cap is threadedly connected to the outer surface of the front connecting column, and the fixing cap is arranged on the front side of the lower end of the positioning plate, and the rear end of the positioning plate and the rear connecting column form an up-down sliding structure.

[0016] Preferably, the middle part of the positioning plate is snap connected with the protrusions at the corresponding positions, and the protrusions are arranged at equal angles at the lower end of the movable column.

[0017] Preferably, the front side of the upper end of the detection support is provided with a spring, and the movable end of the spring is fixedly connected with a mounting plate, and the mounting plate is snap groove connected with the detection support.

[0018] Preferably, the mounting plate and the mounting block form an up-down sliding structure, and the mounting block is fixedly connected to the front side of the upper end of the detection support, the upper end of the mounting plate is sleeved on the outer side of the movable rod, and the mounting plate is snap connected in the connecting groove at the corresponding position;

[0019] Wherein, the connecting grooves are opened at equal angles on the outer surface of the movable rod.

[0020] Compared with the prior art, the beneficial effects of the present invention are as follows: the semiconductor detection jig that is easy to flip can stably clamp the semiconductor to be detected by driving the fixed clamping block through the fixing bolt, and during the clamping process, the buffer rubber pads provided on the fixing plate and the fixed clamping block can prevent the semiconductor from being clamped. Moreover, during the detection process, the support column rotates at the upper end of the detection bracket, and the movable column rotates at the middle part of the support column, so that the detection angle and detection position of the semiconductor can be adjusted in multiple directions, which is very convenient to use. After the adjustment is completed, the movable column and the support column, as well as the support column and the detection bracket can be limited by the fixing mechanism and the mounting plate.

[0021] 1. A support column and a movable column are provided. The support column rotates at the upper end of the detection bracket, and the movable column rotates at the middle of the support column, so as to facilitate multi-directional adjustment of the detection position and angle of the semiconductor being detected;

[0022] 2. It is equipped with a fixing bolt and a fixing clamp. The fixing bolt drives the fixing clamp to expand and contract, which is convenient for stably clamping and fixing the semiconductor. The fixing plate and the fixing clamp are both provided with a buffer rubber pad, which can effectively prevent the semiconductor from being pinched during the clamping process.

[0023] 3. A fixing mechanism and a mounting plate are provided. The setting of the fixing mechanism facilitates the limiting of the movable column and the support column, and the setting of the mounting plate facilitates the limiting of the support column and the detection bracket, with high stability. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 This is a schematic diagram of the front view structure of the utility model;

[0025] Figure 2 This is a schematic diagram of the exploded structure of the fixing plate, fixing bolt and fixing clamp of the utility model;

[0026] Figure 3 This is a bottom-up structural diagram of the support column, movable column, fixed plate and positioning plate of the utility model;

[0027] Figure 4 This is a schematic diagram of the exploded structure of the front connecting column, rear connecting column, fixing cap and positioning plate of the utility model;

[0028] Figure 5 This is a schematic diagram of the front view cross-section structure of the detection bracket, support column, movable rod and mounting plate of the utility model;

[0029] Figure 6 For this utility model Figure 5 A in the middle is an enlarged structural diagram;

[0030] Figure 7 It is the exploded structure schematic view of the movable rod, the mounting plate and the mounting block of the utility model;

[0031] Figure 8 It is the structure schematic view of the turnover adjusting state of the utility model.

[0032] In the drawing: 1, detection support; 2, support column; 3, movable column; 4, fixed plate; 5, fixed bolt; 6, fixed clamping block; 7, fixed mechanism; 8, lug; 9, front connecting column; 10, rear connecting column; 11, fixed cap; 12, positioning plate; 13, movable rod; 14, spring; 15, mounting plate; 16, mounting block; 17, connecting groove. DETAILED DESCRIPTION

[0033] The technical scheme in the embodiments of the utility model will be clearly and completely described below with reference to the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by those skilled in the art without creative labor belong to the scope of protection of the utility model.

[0034] Please refer to Figures 1-8 The utility model provides a kind of technical scheme: a kind of semiconductor detection tool for overturning easily, including detection support 1, support column 2, movable column 3, fixed plate 4, fixed bolt 5, fixed clamping block 6, fixed mechanism 7, lug 8, front connecting column 9, rear connecting column 10, fixed cap 11, positioning plate 12, movable rod 13, spring 14, mounting plate 15, mounting block 16 and connecting groove 17.

[0035] When using the semiconductor detection tool for overturning easily, as shown in Figure 1 And Figure 2 First, fixed cap 11 is placed on corresponding detection platform, and the upper end of detection support 1 is rotatably installed with support column 2, the middle part of support column 2 is rotatably connected with movable column 3, and the upper end of movable column 3 is fixedly connected with fixed plate 4, then the semiconductor to be detected is placed in the middle part of fixed plate 4, then the fixed bolt 5 rotatably connected with the upper end of fixed plate 4 is rotated, and the lower end of fixed bolt 5 is rotatably connected with fixed clamping block 6, fixed bolt 5 drives fixed clamping block 6 to stretch and contract in the middle part of fixed plate 4, so as to conveniently and stably clamp and fix the semiconductor to be detected, and the upper end of fixed plate 4 and the lower end of fixed clamping block 6 are both provided with buffer rubber pad, which can prevent the semiconductor from being clamped and damaged during clamping and fixing.

[0036] After clamping, during the measurement of semiconductor, as shown in Figure 3 ,Figure 4 、 Figure 5 、 Figure 6 、 Figure 7 and Figure 8 As shown in the figure, the lower end of the movable column 3 is provided with a fixing mechanism 7, and the fixing mechanism 7 comprises a protrusion 8 for positioning, a front connecting column 9 fixedly connected to the front side of the lower end of the support column 2, a rear connecting column 10 fixedly connected to the rear side of the lower end of the support column 2, a fixing cap 11 for limiting, and a positioning plate 12 sleeved on the outer surface of the front connecting column 9, the fixing cap 11 is screwed on the outer surface of the front connecting column 9, the fixing cap 11 is moved downward to loosen the limiting of the positioning plate 12, then the positioning plate 12 is pulled downward, the positioning plate 12 slides with the front connecting column 9 and the rear connecting column 10 respectively, at this time, the middle part of the positioning plate 12 is separated from the protrusion 8, thereby loosening the movable column 3 and the support column 2, then the movable column 3 is rotated, the movable column 3 and the support column 2 slide, the fixing plate 4 drives the angle of the semiconductor to be adjusted through the movable column 3, when the detection position and the angle are adjusted to be appropriate, the fixing cap 11 is reversely rotated, the fixing cap 11 pushes the positioning plate 12 to move upward, so that the positioning plate 12 is clamped with the protrusion 8 at the corresponding position, thereby facilitating the limiting of the movable column 3 and the support column 2;

[0037] In addition, the mounting plate 15 can also be pulled upward, the mounting plate 15 and the mounting block 16 slide, at this time, the mounting plate 15 extrudes the spring 14, so that the spring 14 is elastically deformed, the mounting plate 15 moves upward and is separated from the connecting groove 17, and the connecting groove 17 is arranged at equal angles on the outer side of the movable rod 13, at this time, the mounting plate 15 loosens the limiting of the movable rod 13 and the detection support 1, then the support column 2 is rotated, the support column 2 rotates at the upper end of the detection support 1, the movable rod 13 is fixedly connected to the front side of the support column 2, the support column 2 drives the movable rod 13 and the detection support 1 to rotate, thereby facilitating the multi-directional adjustment of the semiconductor, after the adjustment is completed, the mounting plate 15 is directly loosened, at this time, the spring 14 restores the elastic deformation, pushes the mounting plate 15 to slide downward, so that the upper end of the mounting plate 15 is clamped with the connecting groove 17 at the corresponding position, thereby facilitating the limiting of the support column 2 and the detection support 1, and the detection angle and position of the semiconductor can be multi-directionally adjusted without disassembling the semiconductor.

[0038] Although the embodiments of the present application have been shown and described, it should be understood by those skilled in the art that various changes, modifications, substitutions and variations can be made to these embodiments without departing from the principles and spirit of the present application, and the scope of the present application is defined by the appended claims and their equivalents.

Claims

1. A semiconductor detection jig convenient for turnover, comprising a detection support (1), a fixing plate (4) for support and a fixing clamp block (6) for clamping; wherein The lower end of the fixing clamp block (6) and the upper end of the fixing plate (4) are provided with buffer rubber pads; It is characterized in that it further comprises: A support column (2) is rotatably installed at the upper end of the detection support (1), and the front side of the support column (2) is fixedly connected with a movable rod (13) which is inserted into the front side of the upper end of the detection support (1), and the movable rod (13) is combined with a mounting plate (15) for limiting between the support column (2) and the detection support (1); An activity column (3) is fixedly connected at the lower end of the fixing plate (4), and a rotating structure is formed between the activity column (3) and the support column (2), and a fixing mechanism (7) is provided at the lower end of the activity column (3) for limiting between the activity column (3) and the support column (2).

2. The semiconductor inspection fixture according to claim 1, wherein: The front and rear sides of the upper end of the fixing plate (4) are threadedly connected with fixing bolts (5) for adjustment, and the fixing bolts (5) are rotatably connected with the fixing clamp block (6).

3. The semiconductor inspection fixture of claim 2, wherein: The fixing clamp block (6) is connected with the fixing plate (4) through the fixing bolts (5) to form an extension structure in the middle of the fixing plate (4).

4. The semiconductor testing fixture according to claim 1, wherein: The fixing mechanism (7) comprises a protrusion (8) for positioning, a front connecting column (9) fixedly connected to the front side of the lower end of the support column (2), a rear connecting column (10) fixedly connected to the rear side of the lower end of the support column (2), a fixing cap (11) for limiting, and a positioning plate (12) sleeved on the outer surface of the front connecting column (9).

5. The semiconductor inspection fixture of claim 4, wherein: The fixing cap (11) is threadedly connected to the outer surface of the front connecting column (9), and is arranged on the front side of the lower end of the positioning plate (12), and the rear end of the positioning plate (12) is connected with the rear connecting column (10) to form an up-down sliding structure.

6. The semiconductor testing jig according to claim 5, wherein: The middle part of the positioning plate (12) is connected with the protrusion (8) at the corresponding position, and the protrusion (8) is arranged at equal angles at the lower end of the activity column (3).

7. The semiconductor testing fixture of claim 1, wherein: A spring (14) is arranged on the front side of the upper end of the detection support (1), and the movable end of the spring (14) is fixedly connected with a mounting plate (15) which is connected with the detection support (1) through a clamping groove.

8. The semiconductor testing fixture according to claim 7, wherein: An installation block (16) is fixedly connected to the front side of the upper end of the detection support (1), the upper end of the mounting plate (15) is sleeved on the outer side of the movable rod (13), and the mounting plate (15) is connected in the connecting groove (17) at the corresponding position; The connecting groove (17) is arranged at equal angles on the outer surface of the movable rod (13).

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