Circuit board testing equipment
By using a combination of baffles, limit structures and drive modules in the circuit board test equipment, the problem of inconvenient replacement of the lower test module is solved, and convenient detection of the upper and lower sides of the circuit board and flexible replacement of the test structure are achieved.
Patent Information
- Application Number
- CN202422635750.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-30
- Publication Date
- 2025-10-28
- Estimated Expiration
- 2034-10-30
AI Technical Summary
In existing circuit board testing equipment, it is inconvenient to replace the lower test module, and the fixing method using screws makes the operation cumbersome.
A circuit board testing device is designed. It adopts a combination of a baffle, a limiting structure and a driving module. The test structure can be easily replaced through sliding and limiting. The device includes a first test structure and a second test structure. The driving module drives the second test structure close to the first test structure to detect the circuits on the upper and lower sides of the circuit board.
The convenient replacement of the test structure in the circuit board test equipment is realized, the test efficiency and flexibility are improved, and the detection requirements of different circuit boards are adapted.
Smart Images
Figure CN223486116U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of testing equipment technology, and in particular to a circuit board testing device. Background Technology
[0002] After circuit boards are manufactured, they need to be tested. Some circuit boards have circuits on both the top and bottom sides. Related technologies use upper and lower test modules. The circuit board is placed on the lower test module, and the circuits on the bottom side of the circuit board connect to the detection head of the lower test module. A drive module can drive the upper test module to move closer to the circuit board, allowing the detection head of the upper test module to connect to the circuits on the top side of the circuit board, thus automating the testing of the circuits on both sides of the circuit board. However, different circuit boards have different circuits on their bottom sides. Therefore, different lower test modules are needed to test different circuit boards. The fixture used to fix the lower test module is usually connected and fixed to the lower test module by screws, making it inconvenient to replace the lower test module. Utility Model Content
[0003] This application aims to address at least one of the technical problems existing in the prior art. To this end, this application proposes a circuit board testing device that facilitates the disassembly and assembly of the testing module.
[0004] A circuit board testing apparatus according to an embodiment of this application includes:
[0005] Base plate;
[0006] Two baffles are provided on the base plate, and a placement position is formed between the two baffles; the placement position forms a first material outlet and a second material outlet.
[0007] The first test structure can slide into or out of the placement position through the first feed port, and the two baffles can abut against the left and right sides of the first test structure located in the placement position; a first test head is provided at the upper end of the first test structure.
[0008] The first limiting structure is detachably disposed on the baffle. The first limiting structure can open or block the first material inlet and can abut against the front side of the first test structure located in the placement position.
[0009] The second limiting structure is fixedly installed on the baffle. The second limiting structure blocks the second material inlet and can abut against the rear side of the first test structure located at the placement position.
[0010] The second test structure is located above the first test structure, and a second test head is provided at the lower end of the second test structure.
[0011] The driver module is connected to the second test structure and is used to drive the second test structure to move closer to the first test structure.
[0012] The circuit board testing equipment according to the embodiments of this application has at least the following beneficial effects: the first test structure, the second test structure, and the drive module can cooperate to detect the lines on the upper and lower sides of the circuit board. The first test structure is limited within the placement position by a baffle, a first limiting structure, and a second limiting structure. When it is necessary to replace different first test structures to adapt to the testing requirements of different circuit boards, the first limiting structure on the baffle can be removed to open the first feed port, so that the first test structure can slide into or out of the placement position, thereby facilitating the replacement of the first test structure.
[0013] According to some embodiments of this application, at least one of the baffles is provided with a limiting hole, the first limiting structure passes through the limiting hole, and one end of the first limiting structure extends out of the limiting hole and can block the first feed inlet.
[0014] According to some embodiments of this application, both baffles are provided with limiting holes; there are two first limiting structures, and the two first limiting structures correspond to the limiting holes on the two baffles respectively.
[0015] According to some embodiments of this application, each of the baffles is provided with at least two limiting holes, which are distributed along the front-back direction.
[0016] According to some embodiments of this application, the baffle includes a first connecting portion and a second connecting portion, the first connecting portion and the second connecting portion are fixedly connected, the first connecting portion extends along the height direction, the second connecting portion extends along the horizontal direction, the first limiting structure and the second limiting structure are both connected to the first connecting portion, and the second connecting portion is connected to the bottom plate.
[0017] According to some embodiments of this application, at least one of the first connecting portions of the baffle has a plurality of first connecting holes distributed along the height direction at its rear end, and the second limiting structure has a plurality of second connecting holes distributed along the height direction. The first connecting holes and the second connecting holes correspond one-to-one, and the first connecting holes and the second connecting holes are used to pass through the first fastener.
[0018] According to some embodiments of this application, the first connecting portion of both baffles is provided with the first connecting hole, and two second limiting structures are provided, with the two second limiting structures respectively disposed on the two first connecting portions.
[0019] According to some embodiments of this application, the two second limiting structures are spaced apart to partially block the second feed inlet.
[0020] According to some embodiments of this application, the second connecting portion is provided with a first positioning hole, which extends in the left-right direction, and the base plate is provided with a second positioning hole. The first positioning hole and the second positioning hole are correspondingly arranged, and the first positioning hole and the second positioning hole are used to pass through the second fastener.
[0021] According to some embodiments of this application, the front end of the baffle and the front end of the base plate are at a certain distance, so that the base plate forms a support area in front of the first feed port, and the support area can slide and cooperate with the first test structure.
[0022] Additional aspects and advantages of this application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of this application. Attached Figure Description
[0023] The present application will be further described below with reference to the accompanying drawings and embodiments, wherein:
[0024] Figure 1 This is a schematic diagram of the circuit board testing equipment according to an embodiment of this application;
[0025] Figure 2 This is a schematic diagram of the circuit board testing equipment according to another embodiment of this application;
[0026] Figure 3 for Figure 1 A partial structural diagram of the circuit board testing equipment is shown, in which the first and second test structures are hidden.
[0027] Figure 4 for Figure 3 Exploded view of the circuit board testing equipment in the diagram;
[0028] Figure 5 for Figure 3 An exploded view of the circuit board testing equipment from another perspective.
[0029] Figure label:
[0030] Base plate 100, second positioning hole 101, support area 120;
[0031] Baffle 200, placement position 210, first material inlet 211, second material inlet 212; first connecting part 220, limiting hole 221, first connecting hole 222; second connecting part 230, first positioning hole 231;
[0032] First limiting structure 300;
[0033] Second limiting structure 400, second connecting hole 401;
[0034] First test structure 500, first test head 510;
[0035] Second test structure 600, second test head 610. Detailed Implementation
[0036] The embodiments of this application are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain this application, and should not be construed as limiting this application.
[0037] In the description of this application, it should be understood that the orientation descriptions, such as up, down, front, back, left, right, etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application.
[0038] In the description of this application, "several" means one or more, "multiple" means two or more, "greater than," "less than," and "exceeding" are understood to exclude the stated number, while "above," "below," and "within" are understood to include the stated number. The use of "first" and "second" in the description is merely for distinguishing technical features and should not be construed as indicating or implying relative importance, or implicitly indicating the number of indicated technical features, or implicitly indicating the order of the indicated technical features.
[0039] In the description of this application, unless otherwise expressly defined, terms such as "setup," "installation," and "connection" should be interpreted broadly, and those skilled in the art can reasonably determine the specific meaning of the above terms in this application in conjunction with the specific content of the technical solution.
[0040] In the description of this application, the terms "one embodiment," "some embodiments," "illustrative embodiment," "example," "specific example," or "some examples," etc., refer to specific features, structures, materials, or characteristics described in connection with that embodiment or example, which are included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.
[0041] Reference Figure 1 , Figure 2 and Figure 3 The circuit board testing apparatus according to an embodiment of this application includes:
[0042] Base plate 100;
[0043] Two baffles 200 are provided on the base plate 100, and a placement position 210 is formed between the two baffles 200; the placement position 210 has a first material outlet 211 and a second material outlet 212.
[0044] The first test structure 500 can slide into or out of the placement position 210 through the first feed port 211, and the two baffles 200 can abut against the left and right sides of the first test structure 500 located in the placement position 210; the first test head 510 is provided at the upper end of the first test structure 500.
[0045] The first limiting structure 300 is detachably mounted on the baffle 200. The first limiting structure 300 can open or block the first material inlet 211 and can abut against the front side of the first test structure 500 located in the placement position 210.
[0046] The second limiting structure 400 is fixedly installed on the baffle 200. The second limiting structure 400 blocks the second feed port 212 and can abut against the rear side of the first test structure 500 located in the placement position 210.
[0047] The second test structure 600 is located above the first test structure 500, and the second test head 610 is provided at the lower end of the second test structure 600.
[0048] The driving module (not shown in the figure) is connected to the second test structure 600 and is used to drive the second test structure 600 closer to the first test structure 500.
[0049] Understandably, the circuit board to be tested is placed on the first test structure 500. The first test head 510 on the first test structure 500 is connected to the circuitry on the lower side of the circuit board to perform testing on the circuitry on the lower side of the circuit board. The drive module can drive the second test structure 600 to rise and fall. During the descent of the second test structure 600, the second test structure 600 approaches the first test structure 500 and the circuit board on the first test structure 500. The second test head 610 at the lower end of the second test structure 600 can connect to the circuitry on the upper side of the circuit board to perform testing on the circuitry on the upper side of the circuit board.
[0050] Understandably, the left and right sides of the first test structure 500 located at the placement position 210 abut against the baffle 200 to limit the first test structure 500 in the left and right directions. Then, the first limiting structure 300 blocks the first feed port 211 and abuts against the front side of the first test structure 500 to prevent the first test structure 500 from sliding out of the first feed port 211. Furthermore, the second limiting structure 400 blocks the second feed port 212 and abuts against the rear side of the first test structure 500 to prevent the first test structure 500 from sliding out of the second feed port 212. Thus, the first limiting structure 300 and the second limiting structure 400 limit the first test structure 500 in the front and back directions. Therefore, the baffle 200, the first limiting structure 300, and the second limiting structure 400 work together to limit the first test structure 500.
[0051] Understandably, when different circuit boards need to be tested, requiring the replacement of different first test structures 500, the first limiting structure 300 can be removed from the baffle 200 to open the first feed port 211. The old first test structure 500 can then move forward, slide out through the first feed port 211, and leave the placement position 210. Then, the new first test structure 500 can be placed opposite the first feed port 211, and moved backward, sliding into the placement position 210 through the first feed port 211. Subsequently, the first limiting structure 300 is reinstalled back onto the baffle 200 so that it abuts against the front of the new first test structure 500, thus completing the replacement of the different first test structures 500.
[0052] In summary, the first test structure 500, the second test structure 600, and the drive module can work together to detect the circuits on the upper and lower sides of the circuit board. The first test structure 500 is positioned within the placement position 210 by the baffle 200, the first limiting structure 300, and the second limiting structure 400. When it is necessary to replace the first test structure 500 with a different one to adapt to the testing requirements of different circuit boards, the first limiting structure 300 on the baffle 200 can be removed to open the first feed port 211, so that the first test structure 500 can slide into or out of the placement position 210, thereby facilitating the replacement of the first test structure 500.
[0053] Reference Figure 3 and Figure 4 According to some embodiments of this application, at least one baffle 200 is provided with a limiting hole 221, a first limiting structure 300 passes through the limiting hole 221, and one end of the first limiting structure 300 extends out of the limiting hole 221 and can block the first feed inlet 211.
[0054] Understandably, the first limiting structure 300 passes through the limiting hole 221 to be fixed to the baffle 200, and one end of the first limiting structure 300 can extend out of the limiting hole 221 so that one end of the first limiting structure 300 can block the first material inlet 211, thereby limiting the first test structure 500. For example, the first limiting structure 300 is threaded or snapped into the limiting hole 221 so that the first limiting structure 300 is detachably connected to the baffle 200 through the limiting hole 221, so as to facilitate the assembly and disassembly of the first limiting structure 300.
[0055] Reference Figure 4 and Figure 5 In this embodiment, both baffles 200 are provided with limiting holes 221; there are two first limiting structures 300, and the two first limiting structures 300 correspond to the limiting holes 221 on the two baffles 200 respectively.
[0056] It is understandable that each first limiting structure 300 passes through a limiting hole 221 on a baffle 200, meaning that each baffle 200 is provided with a corresponding first limiting structure 300. The two first limiting structures 300 limit the first test structure 500, improving the limiting effect. Specifically, the limiting holes 221 on the two baffles 200 are arranged opposite each other, allowing both first limiting structures 300 to abut against the front of the first test structure 500. Furthermore, the two first limiting structures 300 are spaced apart, with each first limiting structure 300 partially blocking the first feed opening 211. This ensures that the first limiting structure 300 abuts against the first test structure 500 while reducing the contact area between them, preventing the first limiting structure 300 from scratching the first test structure 500, and preventing the first limiting structure 300 from protruding too much through the limiting hole 221, thereby reducing the assembly and disassembly time of the first limiting structure 300.
[0057] In other embodiments, only one baffle 200 may have a limiting hole 221, and only one first limiting structure 300 may be provided, thereby limiting the first test structure 500. Alternatively, both baffles 200 may have limiting holes 221, but only one first limiting structure 300 may be provided, and the first limiting structure 300 may be made longer, with the first limiting structure 300 passing through the limiting holes 221 on both baffles 200.
[0058] Reference Figure 4 and Figure 5 According to some embodiments of this application, each baffle 200 has at least two limiting holes 221 formed on it, and the limiting holes 221 are distributed along the front-back direction.
[0059] Understandably, in some cases, the front and rear dimensions of the first test structure 500 are different. The first limiting structure 300 can be selected to be inserted and matched with different limiting holes 221 to adjust the distance between the first limiting structure 300 and the second limiting structure 400, thereby adapting to the first test structure 500 with different front and rear dimensions.
[0060] Reference Figure 4 and Figure 5 According to some embodiments of this application, the baffle 200 includes a first connecting portion 220 and a second connecting portion 230, the first connecting portion 220 and the second connecting portion 230 are fixedly connected, the first connecting portion 220 extends in the height direction, the second connecting portion 230 extends in the horizontal direction, the first limiting structure 300 and the second limiting structure 400 are both connected to the first connecting portion 220, and the second connecting portion 230 is connected to the base plate 100.
[0061] Understandably, the first connecting portion 220 is used to abut against the first test structure 500 located within the placement position 210. The first connecting portion 220 extends along the height direction, increasing the contact area between the first connecting portion 220 and the first test structure 500, thereby improving the limiting effect on the first test structure 500. The second connecting portion 230 is used to connect to the base plate 100. The second connecting portion 230 extends along the horizontal direction, increasing the contact area between the second connecting portion 230 and the base plate 100, thereby improving the connection stability between the second connecting portion 230 and the base plate 100.
[0062] It is understandable that the first connecting part 220 has a limiting hole 221, which can be connected to the first limiting structure 300, and the second limiting structure 400 is disposed at the rear end of the first connecting part 220.
[0063] Specifically, the first connecting part 220 and the second connecting part 230 are integrally formed, so that the vertical cross section of the baffle 200 is L-shaped.
[0064] Reference Figure 5 According to some embodiments of this application, at least one baffle 200 has a plurality of first connecting holes 222 distributed along the height direction at the rear end of the first connecting portion 220, and the second limiting structure 400 has a plurality of second connecting holes 401 distributed along the height direction. The first connecting holes 222 and the second connecting holes 401 correspond one-to-one, and the first connecting holes 222 and the second connecting holes 401 are used to pass through the first fastener.
[0065] Understandably, the first fastener passes through the first connecting hole 222 and the second connecting hole 401 to fix the second limiting structure 400 to the rear end of the first connecting part 220. Multiple first connecting holes 222 are provided along the height direction, and the second connecting holes 401 correspond one-to-one with the first connecting holes 222. Each set of first connecting holes 222 and second connecting blocks is fitted with a first fastener, thereby improving the connection stability of the first connecting part 220 and the second limiting structure 400.
[0066] Reference Figure 2 , Figure 3 and Figure 5 In this embodiment, the first connecting portion 220 of the two baffles 200 is provided with a first connecting hole 222, and two second limiting structures 400 are provided, which are respectively provided on the two first connecting portions 220.
[0067] It is understandable that the first connecting part 220 of both baffles 200 is provided with a first connecting hole 222, and two second limiting structures 400 are provided. Each second limiting structure 400 is connected to the first connecting part 220 of a baffle 200, thereby limiting the first test structure 500 through the two second limiting structures 400 and improving the limiting effect.
[0068] In other embodiments, only one first connecting portion 220 may have a first connecting hole 222, and only one second limiting structure 400 may be provided, thereby limiting the first test structure 500. Alternatively, both first connecting portions 220 may have first connecting holes 222, but only one second limiting structure 400 may be provided. The second limiting structure 400 may be made longer, and second connecting holes 401 may be formed on both the left and right sides of the second limiting structure 400. The second limiting structure 400 may connect to both first connecting portions 220.
[0069] Reference Figure 2 , Figure 3 and Figure 5 According to some embodiments of this application, two second limiting structures 400 are spaced apart to partially block the second feed inlet 212.
[0070] It is understandable that the two second limiting structures 400 are spaced apart, and the second limiting structure 400 partially blocks the second feed port 212. This ensures that the second limiting structure 400 abuts against the first test structure 500 while reducing the contact area between the second limiting structure 400 and the first test structure 500, thereby preventing the second limiting structure 400 from scratching the first test structure 500 and preventing the second limiting structure 400 from affecting the heat dissipation of the first test structure 500.
[0071] Reference Figure 5According to some embodiments of this application, the second connecting part 230 is provided with a first positioning hole 231, which extends in the left and right direction, and the bottom plate 100 is provided with a second positioning hole 101. The first positioning hole 231 and the second positioning hole 101 are correspondingly arranged, and the first positioning hole 231 and the second positioning hole 101 are used to pass through the second fastener.
[0072] Understandably, the second fastener passes through the first positioning hole 231 and the second positioning hole 101 to fix the second connecting part 230 to the base plate 100. In some cases, the left and right dimensions of different first test structures 500 are different. The first positioning hole 231 extends in the left and right direction, and the second positioning hole 101 can be positioned differently from the first positioning hole 231 to adjust the distance between the two second connecting parts 230, thereby adapting to first test structures 500 with different left and right dimensions.
[0073] Specifically, the second connecting part 230 has a plurality of first positioning holes 231 along the front-back direction, and the base plate 100 has a plurality of second positioning holes 101 along the front-back direction. The first positioning holes 231 and the second positioning holes 101 correspond one-to-one. Each set of first positioning holes 231 and second positioning holes 101 can be fitted with a second fastener, thereby improving the connection stability between the second connecting part 230 and the base plate 100.
[0074] Reference Figure 1 and Figure 3 According to some embodiments of this application, the front end of the baffle 200 and the front end of the base plate 100 are at a certain distance, so that the base plate 100 forms a support area 120 in front of the first feed port 211, and the support area 120 can slide with the first test structure 500.
[0075] Understandably, the support area 120 serves to pre-support the first test structure 500. For example, when the first test structure 500 needs to be pushed into the placement position 210, it is first placed in the support area 120, pre-supported by the support area 120 of the base plate 100. Then, the first test structure 500 is pushed backward, sliding along the support area 120 and entering the placement position 210. Similarly, when the first test structure 500 needs to be removed from the placement position 210, it is pulled out to the support area 120, and then removed manually or by a robotic arm.
[0076] The embodiments of this application have been described in detail above with reference to the accompanying drawings. However, this application is not limited to the above embodiments. Within the scope of knowledge possessed by those skilled in the art, various changes can be made without departing from the spirit of this application. Furthermore, unless otherwise specified, the embodiments and features described in the embodiments of this application can be combined with each other.
Claims
1. A circuit board testing device, characterized in that, include: Base plate; A baffle is provided on the base plate, and two baffles are provided, with a placement position formed between the two baffles; The placement position has a first material inlet and a second material inlet; The first test structure can slide into or out of the placement position through the first feed port, and the two baffles can abut against the left and right sides of the first test structure located in the placement position; a first test head is provided at the upper end of the first test structure. The first limiting structure is detachably disposed on the baffle. The first limiting structure can open or block the first material inlet and can abut against the front side of the first test structure located in the placement position. The second limiting structure is fixedly installed on the baffle. The second limiting structure blocks the second material inlet and can abut against the rear side of the first test structure located at the placement position. The second test structure is located above the first test structure, and a second test head is provided at the lower end of the second test structure. The driver module is connected to the second test structure and is used to drive the second test structure to move closer to the first test structure.
2. The circuit board testing equipment according to claim 1, characterized in that, At least one of the baffles has a limiting hole, the first limiting structure passes through the limiting hole, and one end of the first limiting structure extends out of the limiting hole and can block the first material inlet.
3. The circuit board testing equipment according to claim 2, characterized in that, Both baffles are provided with limiting holes; there are two first limiting structures, and the two first limiting structures correspond to the limiting holes on the two baffles respectively.
4. The circuit board testing equipment according to claim 3, characterized in that, Each of the baffles has at least two limiting holes, which are distributed along the front-back direction.
5. The circuit board testing equipment according to claim 1, characterized in that, The baffle includes a first connecting part and a second connecting part, which are fixedly connected. The first connecting part extends along the height direction, and the second connecting part extends along the horizontal direction. The first limiting structure and the second limiting structure are both connected to the first connecting part, and the second connecting part is connected to the bottom plate.
6. The circuit board testing equipment according to claim 5, characterized in that, At least one of the baffles has a plurality of first connecting holes distributed along the height direction at the rear end of the first connecting portion, and the second limiting structure has a plurality of second connecting holes distributed along the height direction. The first connecting holes and the second connecting holes correspond one-to-one, and the first connecting holes and the second connecting holes are used to pass through the first fastener.
7. The circuit board testing equipment according to claim 6, characterized in that, The first connecting portion of both baffles is provided with the first connecting hole, and two second limiting structures are provided, with the two second limiting structures respectively provided on the two first connecting portions.
8. The circuit board testing equipment according to claim 7, characterized in that, The two second limiting structures are spaced apart to partially block the second feed inlet.
9. The circuit board testing equipment according to claim 8, characterized in that, The second connecting part has a first positioning hole that extends in the left-right direction. The bottom plate has a second positioning hole. The first positioning hole and the second positioning hole are correspondingly arranged and are used to insert a second fastener.
10. The circuit board testing equipment according to claim 1, characterized in that, The front end of the baffle is spaced apart from the front end of the base plate so that the base plate forms a support area in front of the first feed port, and the support area can slide with the first test structure.