True logarithmic amplifier testing device

Abstract

The utility model discloses a true logarithmic amplifier testing device, relates to the technical field of true logarithmic amplifiers, and aims to solve the problem that the connection between the existing true logarithmic amplifier testing device and a testing circuit board is unstable when the existing true logarithmic amplifier testing device is used. The first sliding grooves are formed in the two sides of the inner wall of the clamp base plate, sliding cavities are formed in the first sliding grooves, second sliding grooves are formed in the two sides of the inner wall of each sliding cavity, moving blocks are arranged in the sliding cavities, and first buckle strips are arranged on the two sides of the outer wall of each moving block. And first buckle strips are arranged on the two sides of the second sliding groove, the first buckle strips are fixedly connected with the two ends of the moving block, buckle blocks are arranged on one sides of the interiors of the first buckle strips, the buckle blocks are elastically and telescopically connected with the first buckle strips, and inner buckle grooves are formed in the interiors of the two sides of the inner wall of the second sliding groove.

Description

Technical Field

[0001] This utility model relates to the field of true logarithmic amplifier technology, specifically a true logarithmic amplifier testing device. Background Technology

[0002] True logarithmic amplifiers utilize translinear circuitry in IC design, hence the name translinear logarithmic amplifiers. Translinear circuitry is a major component of current-mode circuits and forms the theoretical foundation for many linear and nonlinear analog integrated circuits. Translinear logarithmic amplifiers are based on the logarithmic characteristics of bipolar junction transistors (BJTs).

[0003] For example, the Chinese authorized patent with announcement number CN203180827U, entitled "(A True Logarithmic Amplifier)," includes: a DC power supply, a switch, a first transistor, a second transistor, a potentiometer, a first capacitor, a second capacitor, a third capacitor, a fourth capacitor, a fifth capacitor, a first resistor, a second resistor, a third resistor, a fourth resistor, a fifth resistor, a sixth resistor, a seventh resistor, an eighth resistor, a ninth resistor, a tenth resistor, and an eleventh resistor. This invention solves the technical problems of high static power consumption, large size, and difficult debugging in traditional large dynamic true logarithmic amplifiers; this invention has the advantages of simple circuit structure, strong anti-interference ability, and long service life.

[0004] However, existing true logarithmic amplifier test devices suffer from unstable connections with the test circuit board during use, thus failing to meet current requirements. Therefore, we propose a new true logarithmic amplifier test device. Utility Model Content

[0005] The purpose of this invention is to provide a true logarithmic amplifier testing device to solve the problem of unstable connection between the existing true logarithmic amplifier testing device and the test circuit board during use, as mentioned in the background art.

[0006] To achieve the above objectives, the present invention provides the following technical solution: a true logarithmic amplifier testing device, comprising: a fixture substrate and a circuit board, wherein a fixture base plate is provided below the fixture substrate, a protrusion is provided on the upper end surface of the fixture base plate, and an embedded cavity is provided at the middle position inside the fixture substrate, wherein the protrusion can be installed inside the embedded cavity.

[0007] Also includes:

[0008] The first slide groove is installed on both sides of the inner wall of the fixture base plate. The first slide groove has a sliding cavity inside. The inner wall of the sliding cavity has a second slide groove on both sides. The sliding cavity has a moving block inside. The outer wall of the moving block has a first latching strip on both sides. The first latching strip is fixedly connected to both ends of the moving block. The first latching strip has a latching block on one side inside. The latching block is elastically telescopically connected to the first latching strip. The inner walls of the second slide groove have inner latching grooves on both sides.

[0009] Preferably, a second latching strip is provided on both sides of the outer wall of the circuit board, and the second latching strip is detachably connected to the circuit board, and a protective sleeve is provided on the upper surface of the circuit board.

[0010] Preferably, a fixing mechanism is provided above the fixture base plate, and a connecting hole is provided at each diagonal of the outer wall of the fixing mechanism, and there are two connecting holes. A copper cylinder is provided below each of the two connecting holes.

[0011] Preferably, a pin is provided on one side of the outer wall of the fixing mechanism, and three pins are provided, which are fixedly connected to the fixing mechanism.

[0012] Preferably, the front end face of the movable block is provided with a protrusion, and the protrusion is fixedly connected to the movable block.

[0013] Preferably, the circuit board is installed inside the first slide groove by a second latching strip and is slidably connected, and the moving block can slide in the second slide groove.

[0014] Compared with the prior art, the beneficial effects of the present invention are:

[0015] 1. This utility model, through the sliding cavity, moving block, protrusion, first locking strip, locking block, second sliding groove, and inner locking groove provided in the first sliding groove of the fixture substrate, allows the second locking strip 302 on the circuit board 300 to slide into the first sliding groove 101 during testing. After entering the test position, the moving block 104 slides down along the second sliding groove 105, thereby limiting and fixing the position of the circuit board 300. When the locking block 10403 is not moving during the limiting operation, it extends and retracts in the inner locking groove 10501, effectively avoiding the problem of unstable connection between the existing true logarithmic amplifier test device and the test circuit board during use. Attached Figure Description

[0016] Figure 1 It is a schematic diagram of the overall structure of the utility model;

[0017] Figure 2 This is a schematic diagram of the connection structure between the fixture base plate and the fixture bottom plate of this utility model;

[0018] Figure 3 This is a schematic diagram of the overall assembly structure of this utility model;

[0019] Figure 4 This is an enlarged structural diagram of point A in this utility model;

[0020] Figure 5 This is a partial structural diagram of the movable block of this utility model;

[0021] Figure 6 This is a partial internal structure diagram of the buckle block of this utility model;

[0022] In the figure: 100, fixture base plate; 101, first slide groove; 103, sliding cavity; 104, moving block; 10401, protrusion; 10402, first latching strip; 10403, latching block; 105, second slide groove; 10501, inner latching groove; 106, embedded cavity; 200, fixture base plate; 201, protrusion; 300, circuit board; 301, protective sleeve; 302, second latching strip; 400, fixing mechanism; 401, pin; 402, connecting hole; 500, copper cylinder. Detailed Implementation

[0023] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments.

[0024] Example 1

[0025] Please see Figure 1-6 An embodiment of this utility model is provided: a true logarithmic amplifier testing device, comprising: a fixture substrate 100 and a circuit board 300, a fixture base plate 200 is provided below the fixture substrate 100, a protrusion 201 is provided on the upper end surface of the fixture base plate 200, and an embedded cavity 106 is provided at the middle position inside the fixture substrate 100, and the protrusion 201 can be installed inside the embedded cavity 106.

[0026] Also includes:

[0027] The first slide groove 101 is installed on both sides of the inner wall of the fixture base plate 100. The first slide groove 101 is provided with a sliding cavity 103. The inner walls of the sliding cavity 103 are provided with second slide grooves 105 on both sides. The sliding cavity 103 is provided with a moving block 104. The outer walls of the moving block 104 are provided with first latching strips 10402 on both sides. The first latching strips 10402 are fixedly connected to both ends of the moving block 104. A latching block 10403 is provided on one side inside the first latching strip 10402. The latching block 10403 is elastically telescopically connected to the first latching strip 10402. The end face of the latching block 10403 is curved. The inner walls of the second slide groove 105 are provided with inner latching grooves 10501 on both sides.

[0028] During testing, the second latching strip 302 on the circuit board 300 is slid into the first slide groove 101. After entering the test position, the moving block 104 is slid down along the second slide groove 105 to limit and fix the position of the circuit board 300.

[0029] Example 2

[0030] Please see Figure 1 The circuit board 300 has a second latching strip 302 on both sides of its outer wall, and the second latching strip 302 is detachably connected to the circuit board 300. The upper end face of the circuit board 300 is provided with a protective sleeve 301. A fixing mechanism 400 is provided above the clamping base plate 100. The fixing mechanism 400 has two connecting holes 402 on each diagonal of its outer wall. A copper cylinder 500 is provided below each of the two connecting holes 402.

[0031] The copper cylinder 500 is designed to support the product during assembly, while an independent copper cylinder is used on the opposite diagonal side to minimize damage to the product casing during disassembly and assembly.

[0032] Please see Figure 1 and Figure 3 The fixing mechanism 400 has three pins 401 on one side of its outer wall, and the three pins 401 are fixedly connected to the fixing mechanism 400.

[0033] Please see Figure 4 and Figure 5 The front end face of the movable block 104 is provided with a protrusion 10401, and the protrusion 10401 is fixedly connected to the movable block 104. The circuit board 300 is installed inside the first slide groove 101 through the second buckle 302 and is slidably connected. The movable block 104 can slide in the second slide groove 105.

[0034] The sliding connection facilitates the installation and removal of objects during testing.

[0035] Working principle: The fixture base plate 200 is installed under the fixture base plate 100 by bolts, and the protrusion is installed in the embedded cavity 106. The copper cylinder 500 is installed in the connection hole 402 below the outer wall of the fixing mechanism 400 and fixed with bolts. During testing, the second latching strip 302 on the circuit board 300 is slid into the first slide groove 101. After entering the test position, the moving block 104 is slid down along the second slide groove 105. The moving block 104 limits and fixes the position of the circuit board 300. When the latching block 10403 is not moving, it extends and retracts in the inner latching groove 10501. At the same time, the protective sleeve 301 can protect and wrap the pins 401.

[0036] It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above and that the present invention can be implemented in other specific forms without departing from the spirit or essential characteristics of the present invention. Therefore, the embodiments should be considered in all respects as illustrative and non-restrictive, and the scope of the present invention is defined by the appended claims, not the foregoing description, and all variations within the meaning and range of equivalents of the claims are intended to be encompassed within the present invention. Any reference sign in a claim should not be construed as limiting the claim to which it relates.

Claims

1. A true logarithmic amplifier testing device, comprising a fixture substrate (100) and a circuit board (300), wherein a fixture base plate (200) is disposed below the fixture substrate (100), a protrusion (201) is disposed on the upper end surface of the fixture base plate (200), and an embedded cavity (106) is disposed at the middle position inside the fixture substrate (100), wherein the protrusion (201) can be installed inside the embedded cavity (106); Its characteristics are: Also includes: A first slide groove (101) is installed on both sides of the inner wall of the fixture base plate (100). A sliding cavity (103) is provided inside the first slide groove (101). A second slide groove (105) is provided on both sides of the inner wall of the sliding cavity (103). A moving block (104) is provided inside the sliding cavity (103). A first latching strip (10402) is provided on both sides of the outer wall of the moving block (104). The first latching strip (10402) is fixedly connected to both ends of the moving block (104). A latching block (10403) is provided on one side inside the first latching strip (10402). The latching block (10403) is elastically telescopically connected to the first latching strip (10402). An inner latching groove (10501) is provided on both sides of the inner wall of the second slide groove (105).

2. The true logarithmic amplifier testing device according to claim 1, characterized in that: The circuit board (300) has a second latch strip (302) on both sides of its outer wall, and the second latch strip (302) is detachably connected to the circuit board (300). The circuit board (300) has a protective sleeve (301) on its upper surface.

3. The true logarithmic amplifier testing device according to claim 1, characterized in that: A fixing mechanism (400) is provided above the fixture base plate (100). A connecting hole (402) is provided at each diagonal of the outer wall of the fixing mechanism (400), and there are two connecting holes (402). A copper cylinder (500) is provided below each of the two connecting holes (402).

4. The true logarithmic amplifier testing device according to claim 1, characterized in that: The fixing mechanism (400) has three pins (401) on one side of its outer wall, and the three pins (401) are fixedly connected to the fixing mechanism (400).

5. The true logarithmic amplifier testing device according to claim 1, characterized in that: The front end face of the movable block (104) is provided with a protrusion (10401), and the protrusion (10401) is fixedly connected to the movable block (104).

6. The true logarithmic amplifier testing device according to claim 1, characterized in that: The circuit board (300) is installed inside the first slide groove (101) by the second snap-fit ​​strip (302) and is slidably connected, and the moving block (104) can slide in the second slide groove (105).

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