Testing device and photovoltaic system

Abstract

The utility model relates to a testing device and a photovoltaic system. The testing device comprises an electric connection assembly and a driving assembly. The electric connection assembly is used for being electrically connected with test equipment; and the driving assembly is in driving connection with the electric connection assembly, and the driving assembly is used for driving the electric connection assembly to move, so that the electric connection assembly is electrically contacted with the outgoing line on the photovoltaic assembly. According to the invention, the photovoltaic module is tested before the secondary laying of the adhesive film, even if the photovoltaic module is abnormal in test, the photovoltaic module can be directly repaired without dismounting the structures such as the secondary adhesive film, and the structures such as the secondary adhesive film do not need to be reassembled and then tested again after being repaired. The steps of dismounting and reassembling can be omitted, then the testing process can be simplified, manual intervention in dismounting and reassembling is reduced, testing automation can be achieved by driving the electric connection assembly to move through the driving assembly, other problems such as displacement, scratching and foreign matter introduction caused by dismounting and reassembling are reduced, and the testing efficiency is improved. And the influence on the production of the photovoltaic module is reduced.

Description

Technical Field

[0001] This application relates to the field of photovoltaic equipment, and in particular to a testing device and a photovoltaic system. Background Technology

[0002] Before lamination, photovoltaic modules need to undergo EL (Electroluminescent) testing. EI testing is used to detect defects such as microcracks, poor soldering, desoldering, and black spots in the cells. If abnormalities are found during testing, the photovoltaic modules need to be reworked. Since two layers of adhesive film and high-temperature pads are already laid on the back of the photovoltaic modules before lamination, these need to be removed to repair the abnormal points in the cells. After repair, the modules are retested until they are in good condition before the lamination process can proceed.

[0003] Currently, abnormal photovoltaic modules need to undergo an initial test, disassembly, repair, reassembly, and retesting process before lamination. The entire process is quite complex. The disassembly, repair, and reassembly process involves multiple manual interventions, which cannot achieve the precision of automated equipment and can easily cause other problems such as displacement, scratches, and foreign object introduction, affecting the production of photovoltaic modules. Utility Model Content

[0004] Therefore, it is necessary to provide a testing device and photovoltaic system to address the current issue that abnormal photovoltaic modules need to undergo an initial test, disassembly, repair, reassembly, and retest process before lamination. The entire process is quite complex. The disassembly, repair, and reassembly process requires multiple manual interventions, which cannot achieve the precision of automated equipment and is prone to causing other problems such as displacement, scratches, and foreign object introduction, thus affecting the production of photovoltaic modules.

[0005] Firstly, a testing apparatus includes:

[0006] An electrical connection assembly for electrical connection with a test device; and

[0007] A driving component is driven and connected to the electrical connection component. The driving component is used to drive the electrical connection component to move so that the electrical connection component makes electrical contact with the leads on the photovoltaic module.

[0008] In one embodiment, the electrical connection assembly includes a clamping structure and an adapter structure connected together, the adapter structure being driven to the drive assembly, and the clamping structure being used for electrical contact with the test equipment and the lead wire.

[0009] In one embodiment, the clamping structure includes two clamping arms disposed on the adapter structure, with an opening formed between the ends of the two clamping arms away from the adapter structure, and the driving component is used to drive the opening on the clamping arms to approach the lead wire, so that the lead wire elastically passes through the opening and is clamped between the two clamping arms.

[0010] In one embodiment, at least one of the clamping arms includes a clamping portion and an elastic portion, the clamping portion being connected to the adapter structure via the elastic portion, and the opening being located at the end of the clamping portion away from the elastic portion.

[0011] In one embodiment, the elastic portion is configured as a spring sheet, and the spring sheet is configured to be arched along the side where the clamping arm is located opposite itself.

[0012] In one embodiment, at least one end of the clamping arm away from the adapter structure includes a guide surface facing the opening, the guide surface being inclined in the insertion direction of the opening, and the end of the guide surface away from the adapter structure being deflected relative to the end of itself close to the adapter structure toward a side away from the opening.

[0013] In one embodiment, at least one of the two clamping surfaces of the two clamping arms facing each other has a slot for holding the lead wire.

[0014] In one embodiment, the testing apparatus further includes a controller and a detector, the controller being electrically connected to the detector and the drive assembly, the controller being configured to control the drive assembly to move the electrical connection assembly to contact the lead wire when the detector detects the position of the lead wire.

[0015] In one embodiment, the testing device further includes a support assembly, and the drive assembly includes a drive motor, a lead screw, and a slide table. The lead screw is rotatably connected to the support assembly, connected to the output shaft of the drive motor, and the slide table is drively connected to the lead screw and connected to the electrical connection assembly.

[0016] In a second aspect, a photovoltaic system includes a testing apparatus as described in the first aspect.

[0017] Before the second layer of encapsulant is applied to the photovoltaic (PV) module, the leads are already exposed on the outside of the module. The electrical connection component can be moved to the position of the leads by the drive component, making electrical contact between the electrical connection component and the leads, thus enabling the testing equipment to perform EL (electroluminescence) and other tests on the PV module. If the PV module fails the test, it can be directly repaired and retested until it is in good condition.

[0018] Because the photovoltaic modules are tested before the second layer of encapsulant is applied, and the modules are not covered by the second layer during testing, even if a test fails, the modules can be directly repaired without removing the second layer of encapsulant or other structures. After repair, there's no need to reassemble the second layer of encapsulant and other structures for retesting. This eliminates the need for disassembly and reassembly, simplifying the testing process and reducing manual intervention. Automation of the testing process is achieved by moving the electrically connected components through the drive modules, minimizing displacement, scratches, and foreign object introduction caused by disassembly and reassembly, thus reducing the impact on photovoltaic module production. Attached Figure Description

[0019] To more clearly illustrate the technical solutions in the embodiments of this application or the conventional technology, the drawings used in the description of the embodiments or the conventional technology will be briefly introduced below. Obviously, the drawings described below are only embodiments of this application. For those skilled in the art, other drawings can be obtained based on the disclosed drawings without creative effort.

[0020] Figure 1 This is a perspective view of a testing device provided in an embodiment of this application.

[0021] Figure 2 This is a perspective view of a clamping structure in a testing device provided in an embodiment of this application.

[0022] Figure 3 for Figure 2 Enlarged view of point A in the middle.

[0023] Explanation of reference numerals in the attached drawings: 100, testing device; 10, electrical connection assembly; 1, clamping structure; 11, clamping arm; 111, clamping part; 112, elastic part; 113, guide surface; 114, slot; 115, opening; 12, adapter structure; 121, adapter rod; 122, adapter plate; 20, drive assembly; 21, drive motor; 22, slide table; 23, module base; 24, fixed end bearing seat; 25, support end bearing seat; 30, controller; 40, detector; 50, support assembly; 51, support frame; 511, first support body; 512, second support body; 52, support bracket; 521, first connecting plate; 522, second connecting plate; 523, third connecting plate; 524, fourth connecting plate; 53, fixing component. Detailed Implementation

[0024] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.

[0025] Currently, the main process flow for photovoltaic modules is as follows: first layer of glass laying - first layer of encapsulant film laying - string welding - layout - stacking welding - center hole pad - long pad or four corner pad - second layer of encapsulant film laying - back glass (backsheet) laying - flattening lead wires - EL test and VI test - install corner protectors (laminated frame) - lamination. Before the lamination process, photovoltaic modules need to undergo EL (Electroluminescence) test and VI (Visual Inspection) test to verify whether the photovoltaic modules are in good condition before the lamination process. If they are in good condition, they are moved to the lamination process. If an abnormality is found, rework is required. After the abnormality is repaired, the EL test and VI test are repeated until they are in good condition and then they are moved to the next lamination process.

[0026] Before entering the EL test, single-glass photovoltaic modules have been covered with two layers of encapsulant film, a backsheet, and high-temperature pads on the back, while double-glass modules have been covered with two layers of encapsulant film, strips, high-temperature pads, and corner protectors. If the EL and VI tests are abnormal, all main and auxiliary materials on the back of the photovoltaic modules must be removed for rework, which greatly complicates production operations, affects production cycle and capacity release. Manual rework requires the above-mentioned materials to be added again. Due to multiple manual interventions, the precision of automated equipment cannot be achieved, which easily leads to multiple types of rework such as displacement, scratches, and foreign object introduction, resulting in product quality loss, material and manpower losses.

[0027] Please see Figure 1Based on the above-mentioned problems, in a first aspect, embodiments of this application provide a testing device 100, including an electrical connection component 10 and a driving component 20. The electrical connection component 10 is used for electrical connection with the testing equipment; the driving component 20 is driven and connected to the electrical connection component 10, and is used to drive the electrical connection component 10 to move so that the electrical connection component 10 makes electrical contact with the leads on the photovoltaic module. Before the photovoltaic module undergoes a second layer of encapsulant film application, the leads of the photovoltaic module are already exposed on the outside of the photovoltaic module. The driving component 20 can drive the electrical connection component 10 to the position of the leads and make the electrical connection component 10 make electrical contact with the leads, thereby enabling the testing equipment to perform EL and VI tests on the photovoltaic module. When the photovoltaic module test is abnormal, the photovoltaic module can be directly repaired, and after repair, a second test can be performed directly until the photovoltaic module is in a good condition. Because the photovoltaic modules are tested before the second layer of encapsulant film, backsheet, high-temperature pads, strips, and corner protectors are laid, even if the photovoltaic modules malfunction during testing, they can be directly repaired without removing the second layer of encapsulant film and other structures. After repair, there is no need to reassemble the second layer of encapsulant film and other structures for retesting. This eliminates the steps of disassembly and reassembly, thereby simplifying the testing process and reducing manual intervention during disassembly and reassembly. By driving the electrical connection component 10 to move through the drive component 20, the testing can be automated, reducing displacement, scratches, foreign object introduction, and other problems caused by manual disassembly and reassembly, and minimizing the impact on photovoltaic module production.

[0028] Furthermore, since photovoltaic modules come in different shapes and sizes, the number of leads on a photovoltaic module can be one, two, three, etc., and the positions of the leads will also vary. The driving component 20 can drive the electrical connection component 10 to a suitable position to make electrical contact with the leads, depending on the size of the photovoltaic module. This improves the versatility of the testing device 100, eliminating the need to design different testing devices 100 specifically for leads of different sizes and positions, thus reducing costs and increasing testing efficiency.

[0029] It should be noted that before laying the second layer of encapsulant film on the photovoltaic module, the leads of the photovoltaic module need to be kept vertical relative to the solar cells. This reduces the space occupied by the leads on the solar cells, thereby reducing interference with the flat laying of the second layer of encapsulant film. Keeping the leads vertical also facilitates electrical contact between the electrical connection component 10 and the leads. In other optional embodiments, the leads can be kept bent or flat relative to the solar cells; this application does not limit the arrangement of the leads.

[0030] The embodiments of this application do not limit the manner in which the driving component 20 drives the electrical connection component 10 to move. For example, the driving component 20 may drive the electrical connection component 10 to rotate so as to electrically connect with the leads on the photovoltaic module. Alternatively, the driving component 20 may drive the electrical connection component 10 to move linearly; the driving component 20 may be a vertical lifting driving component or a horizontal translation driving component. Or, the driving component 20 may drive both lifting and translation.

[0031] In optional embodiments, the drive component 20 may be a linear module, such as a lead screw driven linear module, a synchronous belt driven linear module, or a gear and rack driven linear module, etc. The embodiments of this application do not limit the driving method of the linear module.

[0032] Taking the drive assembly 20 as an example of a lead screw driven linear module, please refer to [link / reference]. Figure 1 In some embodiments, the testing device 100 further includes a support assembly 50, and a drive assembly 20 including a drive motor 21, a lead screw (not shown), and a slide 22. The lead screw is rotatably connected to the support assembly 50, connected to the output shaft of the drive motor 21, and the slide 22 is drive-connected to the lead screw and connected to the electrical connection assembly 10. The output shaft of the drive motor 21 drives the lead screw to rotate, and the lead screw and the slide 22 are connected by a threaded structure, which converts the rotational motion of the drive motor 21 into the linear motion of the slide 22. The lead screw drive ensures the precise positioning of the slide 22 in the horizontal or vertical direction, reducing errors and poor contact. The electrical connection assembly 10 has a certain weight and will be subjected to the reaction force from the lead wire during the electrical connection process. The drive connection between the lead screw and the slide 22 can withstand these loads, ensuring the motion stability of the electrical connection assembly 10 and reducing the shaking, vibration, or offset of the electrical connection assembly 10.

[0033] For further information, see Figure 1 The drive assembly 20 may further include a module base 23, a fixed-end bearing housing 24, a supporting-end bearing housing 25, and a linear guide rail (not shown in the figure). The fixed-end bearing housing 24 and the supporting-end bearing housing 25 are both fixed to the module base 23, and the linear guide rail is fixed to the module base 23. Please refer to... Figure 1 The output shaft of the drive motor 21 passes through the fixed-end bearing seat 24 and is rotatably connected to the inner ring of the fixed-end bearing seat 24. A lead screw is mounted on the module base 23. One end of the lead screw is connected to the output shaft of the drive motor 21 via a coupling (not shown in the figure), and the other end is rotatably connected to the inner ring of the support-end bearing seat 25. The slide table 22 is driven by the lead screw and simultaneously slidably connected to the linear guide rail. The linear guide rail guides the movement of the slide table 22, making its movement more stable.

[0034] In some implementations, please refer to Figure 1 The support assembly 50 includes a support frame 51 and a support bracket 52 connected to each other. The support frame 51 includes a first support body 511 and a second support body 512 that are bent and connected. One end of the support bracket 52 along its own length is connected to the second support body 512, and the other end extends in a direction away from the second support body 512. Please refer to [link / reference]. Figure 1 The main body of the drive motor 21 is connected to the bottom surface of the first support 511. The top of the module base 23 of the drive assembly 20 is connected to the first support 511 via a fastener 53, and the middle of the module base 23 is connected to the support frame 52. By setting the support frame 51 and the support frame 52, the support stability of the drive assembly 20 can be improved.

[0035] In an optional embodiment, the first support 511 is positioned horizontally (e.g., ...). Figure 1 Extending in the XX direction (as shown), the second support 512 extends in the vertical direction (as shown). Figure 1 Extending in the YY direction as shown, so that the support frame 51 is L-shaped as a whole.

[0036] Please see Figure 1 In an optional embodiment, the support frame 52 includes a first connecting plate 521, a second connecting plate 522, a third connecting plate 523, and a fourth connecting plate 524 connected together. The first connecting plate 521 is vertically arranged. The second connecting plate 522 is horizontally arranged, and its two sides are respectively connected to the first connecting plate 521 and the second support body 512. One side of the third connecting plate 523 is connected to the junction of the first connecting plate 521 and the second connecting plate 522, and the other side of the third connecting plate 523 is horizontally arranged relative to the second connecting plate 522 (e.g., ...). Figure 1 The third connecting plate 523 is inclined towards the first connecting plate 521 in the direction shown (XX direction). The other side of the third connecting plate 523 is simultaneously connected to the second support 512. One side of the fourth connecting plate 524 is connected to the junction of the second connecting plate 522 and the second support 512. The other side of the fourth connecting plate 524 is horizontally aligned with the second connecting plate 522 (e.g., in the direction shown). Figure 1 The fourth connecting plate 524 (in the direction shown in XX) is inclined towards the second support 512, and its other side is simultaneously connected to the first connecting plate 521. The third connecting plate 523 and the fourth connecting plate 524 are arranged crosswise. By assembling the support frame 52 with the first connecting plate 521, the second connecting plate 522, the third connecting plate 523, and the fourth connecting plate 524, the support stability of the support frame 52 can be improved to better support the drive assembly 20.

[0037] In an optional embodiment, the third connecting plate 523 and the fourth connecting plate 524 are located on the side of the second connecting plate 522 that is close to the first support 511. Alternatively, the third connecting plate 523 and the fourth connecting plate 524 are located on the side of the second connecting plate 522 that is away from the first support 511.

[0038] Please see Figure 1 In some embodiments, the testing apparatus 100 further includes a controller 30 and a detector 40. The controller 30 is electrically connected to the detector 40 and the drive assembly 20. The controller 30 is used to control the drive assembly 20 to move the electrical connection assembly 10 to contact the lead wire when the detector 40 detects the position of the lead wire. By setting the detector 40, it is convenient to detect the position of the lead wire, enabling the drive assembly 20 to automatically align the lead wire.

[0039] In optional embodiments, the detector 40 may be a detection camera, a laser rangefinder, an infrared sensor, etc. Taking a detection camera as an example, the detection camera emits light of a specific wavelength, which is reflected when it shines on the lead wire. The detection camera determines the position of the lead wire by receiving the reflected light and transmits the position signal of the lead wire to the controller 30. After receiving the signal, the controller 30 controls the drive component 20 to move to the position of the lead wire.

[0040] Please see Figure 1 The specific structure of the electrical connection assembly 10 will be described below. In some embodiments, the electrical connection assembly 10 includes a clamping structure 1 and a connecting structure 12 connected together. The connecting structure 12 is driven to connect with the driving assembly 20, and the clamping structure 1 is used for electrical contact with the test equipment and the lead wire. The clamping structure 1 achieves electrical contact with the lead wire by clamping, which provides a more stable electrical connection compared to touching. For example, during the test, there may be vibration or slight movement. The clamping structure 1 can clamp the lead wire to prevent loosening of the contact, thereby avoiding problems such as poor contact.

[0041] Please see Figure 1 In an optional embodiment, the adapter structure 12 includes an adapter rod 121 and an adapter plate 122. The adapter rod 121 is connected to the slide 22 of the drive assembly 20, and the adapter plate 122 is connected to the end of the adapter rod 121. A clamping structure 1 is provided on the bottom surface of the adapter plate 122 opposite to the adapter rod 121.

[0042] It should be noted that the clamping structure 1 can be electrically connected to both the testing equipment and the lead wires simultaneously, meaning that the clamping structure 1 is conductive. In optional embodiments, the clamping structure 1 can be a probe clip, a conductive clip, or a spring clip.

[0043] Please see Figure 1In an optional embodiment, the clamping structure 1 can be one, two, three, or four, etc. It can clamp one, two, three, or four, etc., of the lead wires. When there are multiple clamping structures 1, they can be arranged in an array and fixed on the adapter plate 122 at intervals.

[0044] Please see Figure 2 In some embodiments, the clamping structure 1 includes two clamping arms 11 evenly disposed on the adapter structure 12. An opening 115 is formed between the ends of the two clamping arms 11 away from the adapter structure 12. The driving component 20 is used to drive the opening 115 on the clamping arms 11 to approach the lead wire, so that the lead wire elastically passes through the opening 115 and is clamped between the two clamping arms 11. With this configuration, the lead wire can automatically and elastically push into the two clamping arms 11 of the clamping structure 1, realizing automatic connection between the lead wire and the clamping structure 1. Compared with manually adjusting the clamp to hold the lead wire, the connection time between the lead wire and the clamping structure 1 can be shortened, and the testing efficiency can be improved.

[0045] In an optional embodiment, the two clamping arms 11 can be elastically connected by providing elastic components such as springs or torsion springs.

[0046] Please see Figure 2 In some embodiments, at least one clamping arm 11 includes a clamping portion 111 and an elastic portion 112. The clamping portion 111 is connected to the adapter structure 12 via the elastic portion 112, and the opening 115 is located at the end of the clamping portion 111 away from the elastic portion 112. When the elastic portion 112 is provided on the clamping arm 11 itself, the elastic force of the elastic portion 112 can be better transmitted to the clamping portion 111, making the force on the clamping portion 111 more uniform. At the same time, it can also make the entire clamping structure 1 more compact, without the need for additional external space to accommodate the elastic portion 112, and can be applied to space-limited application scenarios.

[0047] In an optional embodiment, the clamping part 111 is conductive and may be made of a material with low resistance, such as copper, brass, or silver.

[0048] In an optional embodiment, the elastic part 112 may be a hyperelastic or shape memory material (shape memory titanium alloy or shape memory polymer). When the lead wire is inserted into the opening 115 formed by the clamping arm 11, the elastic part 112 is deformed by external force and applies force to the clamping part 111 during the recovery process to clamp the lead wire.

[0049] In other alternative embodiments, in some examples, the elastic portion 112 is configured as a spring sheet, and the spring sheet is configured to arch along the side of the clamping arm 11 opposite to itself. This arching configuration allows the spring sheet to store more elastic potential energy when compressed. When the lead wire is inserted into the opening 115 of the clamping arm 11, the arched spring sheet is further compressed and bent, possessing greater elastic potential energy to clamp the lead wire. Furthermore, the arched spring sheet provides a greater restoring force to recover its deformation after the lead wire is disengaged. In addition, the spring sheet can utilize the space along the length of the clamping arm 11, which is beneficial for the miniaturization design of the clamping structure 1.

[0050] Please see Figure 3 In some embodiments, at least one clamping arm 11 has a guide surface 113 facing the opening 115 at one end away from the adapter structure 12. The guide surface 113 is inclined in the insertion direction of the opening 115, and the end of the guide surface 113 away from the adapter structure 12 is biased relative to the end of itself close to the adapter structure 12 on the side opposite to the opening 115. Thus, by providing the guide surface 113 on the clamping arm 11, the lead wire can be easily inserted into the opening 115 formed by the clamping arm 11 under the guidance of the guide surface 113. In some embodiments, the guide surface 113 is provided on the clamping portion 111 of the clamping arm 11.

[0051] Please see Figure 3 In some embodiments, at least one of the two clamping surfaces of the two clamping arms 11 facing each other is provided with a slot 114 for holding the lead wire. The slot 114 can limit the lead wire after it is inserted into the clamping arm 11, thereby improving the fixing effect of the clamping arm 11 on the lead wire.

[0052] The shape of the slot 114 is not limited in this application embodiment. In optional embodiments, the slot 114 may be a circular slot or a square slot, etc. The shape of the slot 114 that matches the shape of the lead wire is within the protection scope of this application embodiment.

[0053] Secondly, embodiments of this application also provide a photovoltaic system, which includes the testing apparatus 100 as described in the first aspect. The photovoltaic system further includes an EL testing device and a VI testing device. The EL testing device and the VI testing device are electrically connected to the electrical connection assembly 10 of the testing apparatus 100 to perform EL testing and VI testing. In some embodiments, the EL testing device and the VI testing device are electrically connected to the clamping portion 111 of the clamping structure 1 in the electrical connection assembly 10.

[0054] In the description of this application, it should be understood that if terms such as "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" appear, these terms indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.

[0055] Furthermore, where the terms "first" and "second" appear, these terms are for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined with "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, where the term "multiple" appears, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0056] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0057] In this application, unless otherwise expressly specified and limited, the use of descriptions such as "above" or "below" the second feature indicates that the first and second features are in direct contact or indirect contact via an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. Similarly, "below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0058] It should be noted that if an element is referred to as being "fixed to" or "set on" another element, it can be directly on the other element or there may be an intervening element. If an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intervening element. If so, the terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used in this application are for illustrative purposes only and do not represent the only possible implementation.

[0059] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0060] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. A testing device (100), characterized in that, include: Electrical connection assembly (10) for electrical connection with test equipment; as well as A drive assembly (20) is driven to be connected to the electrical connection assembly (10). The drive assembly (20) is used to drive the electrical connection assembly (10) to move so that the electrical connection assembly (10) makes electrical contact with the lead wires on the photovoltaic module.

2. The testing apparatus (100) according to claim 1, characterized in that, The electrical connection assembly (10) includes a clamping structure (1) and a transition structure (12) connected to each other. The transition structure (12) is driven to be connected to the drive assembly (20). The clamping structure (1) is used to make electrical contact with the test equipment and the lead wire.

3. The testing apparatus (100) according to claim 2, characterized in that, The clamping structure (1) includes two clamping arms (11) evenly disposed on the adapter structure (12). An opening (115) is formed between the ends of the two clamping arms (11) away from the adapter structure (12). The driving assembly (20) is used to drive the opening (115) on the clamping arm (11) to approach the lead wire so that the lead wire elastically passes through the opening (115) and is clamped between the two clamping arms (11).

4. The testing apparatus (100) according to claim 3, characterized in that, At least one of the clamping arms (11) includes a clamping part (111) and an elastic part (112), the clamping part (111) being connected to the adapter structure (12) via the elastic part (112), and the opening (115) being located at one end of the clamping part (111) away from the elastic part (112).

5. The testing apparatus (100) according to claim 4, characterized in that, The elastic part (112) is configured as a spring sheet, and the spring sheet is configured to be arched along the side where the clamping arm (11) is located opposite to itself.

6. The testing apparatus (100) according to claim 3, characterized in that, At least one of the clamping arms (11) has a guide surface (113) at one end away from the adapter structure (12) facing the opening (115), the guide surface (113) being inclined in the insertion direction of the opening (115), and the end of the guide surface (113) away from the adapter structure (12) being skewed toward the side away from the opening (115) relative to the end of itself close to the adapter structure (12).

7. The testing apparatus (100) according to claim 3, characterized in that, At least one of the two clamping surfaces of the two clamping arms (11) facing each other is provided with a slot (114) for holding the lead wire.

8. The testing apparatus (100) according to any one of claims 1 to 7, characterized in that, The test device (100) further includes a controller (30) and a detector (40). The controller (30) is electrically connected to the detector (40) and the drive assembly (20). The controller (30) is used to control the drive assembly (20) to move the electrical connection assembly (10) to contact the lead wire when the detector (40) detects the position of the lead wire.

9. The testing apparatus (100) according to any one of claims 1 to 7, characterized in that, The testing device (100) further includes a support assembly (50), and the drive assembly (20) includes a drive motor (21), a lead screw, and a slide (22). The lead screw is rotatably connected to the support assembly (50), the lead screw is connected to the output shaft of the drive motor (21), the slide (22) is drively connected to the lead screw, and the slide (22) is connected to the electrical connection assembly (10).

10. A photovoltaic system, characterized in that, The photovoltaic system includes the test apparatus (100) as described in any one of claims 1 to 9.

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