Sampling probe
By introducing external and internal backflushing air paths and a quick-release design into the sampling probe, the problems of contaminants entering the sample gas pipeline and insufficient self-cleaning ability of the filter element are solved, achieving efficient filter element maintenance and temperature control, and improving the user experience.
Patent Information
- Application Number
- CN202422691971.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-04
- Publication Date
- 2025-10-31
- Estimated Expiration
- 2034-11-04
AI Technical Summary
Existing sampling probes are prone to contaminants entering the sample gas pipeline under high dust, high temperature, and high humidity conditions. The filter element has insufficient self-cleaning ability and it is difficult to balance sealing and quick-release design, resulting in a poor user experience.
The design incorporates external and internal backflushing air paths for the filter element, along with a quick-release locking mechanism. It also features a high-power heating rod and temperature controller. The sample gas pipeline opening is located on the end face of the probe body and is equipped with a locking mechanism and filter components.
It improves filter lifespan, reduces maintenance workload, enables quick replacement and cleaning, ensures sealing, and provides temperature control and low-temperature alarm functions.
Smart Images

Figure CN223500725U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of sampling probe technology, and more specifically, to a sampling probe. Background Technology
[0002] Sampling probes are commonly used for continuous gas sampling in high-dust, high-temperature, and high-humidity environments. Existing probes typically have a hole directly in the side wall of the filter chamber to draw out the sample gas. When maintaining the filter element and cleaning the chamber, contaminants can easily enter the sample gas pipeline, and the filter element's self-cleaning ability is insufficient. Generally, probes only perform backflushing on the outside of the filter element, and contaminants can easily become embedded in the pores of the filter element surface during this process. Furthermore, it is difficult to balance sealing performance with a quick-release design in the filter element assembly. The thermal expansion and contraction during probe heating and the contamination of the seals further increase the difficulty of filter element disassembly, resulting in a poor user experience. Utility Model Content
[0003] To overcome the above shortcomings, this application provides a sampling probe designed to improve upon existing probes that typically draw out sample gas directly through openings in the sidewall of the filter chamber. When maintaining the filter element and cleaning the chamber, contaminants can easily enter the sample gas pipeline, and the filter element's self-cleaning ability is insufficient. Generally, probes only backflush the outside of the filter element, and contaminants can easily become embedded in the pores on the filter element surface during cleaning. Furthermore, it is difficult to balance sealing performance and quick-release design in the filter element assembly. The thermal expansion and contraction during probe heating and the contamination of the seals further increase the difficulty of disassembling the filter element.
[0004] This application is implemented as follows:
[0005] This application provides a sampling probe, including a junction box, a sample gas shut-off valve actuator, a probe fixing bracket, a standard gas shut-off valve, a protective mechanism, a sampling mechanism, a locking mechanism, and a filter assembly, wherein the junction box is installed outside the protective mechanism;
[0006] The probe mounting bracket is installed inside the protective mechanism. The sample gas shut-off valve actuator and the standard gas shut-off valve are both mounted on the sampling mechanism. The locking mechanism is mounted on the sampling mechanism. The filter assembly is inserted into the sampling mechanism and is located between the sampling mechanism and the locking mechanism. The junction box is equipped with a temperature controller.
[0007] The protective mechanism is designed to protect the sampling mechanism;
[0008] The locking mechanism is configured to confine and fix the filter assembly within the probe body;
[0009] The filter assembly features an internal and external backflushing design for the filter element to reduce the amount of maintenance required.
[0010] In one embodiment of this application, the protective mechanism includes a probe housing, a probe bracket, and a buckle. The probe housing is sleeved on the probe bracket, and different parts of the buckle are respectively fixed to the outer walls of the probe housing and the probe bracket.
[0011] In one embodiment of this application, the sampling mechanism includes a probe insulation sleeve, a first temperature controller probe, a second temperature controller probe, a filter element backflush connector, a heating rod, and a probe body. The probe body is fixed on the probe bracket and the probe fixing bracket, and the probe insulation sleeve is fitted onto the probe body.
[0012] The probe body is equipped with a first temperature controller probe and a second temperature controller probe. The sample gas shut-off valve actuator and the standard gas shut-off valve are both located on the probe body. The probe body is equipped with a sample gas inlet, a sample gas outlet, an inner backflush port for the filter element, and an outer backflush port for the filter element. The heating rod is installed on the outer wall of the probe insulation sleeve through the probe heat-conducting block. The outer backflush connector for the filter element is installed on the outer backflush port for the filter element.
[0013] In one embodiment of this application, the locking mechanism includes a filter element end cap, a flat round head screw, a handle, a slider nut, and a locking pressure plate. The filter element end cap is threadedly inserted into the probe insulation sleeve. The locking pressure plate is fixed to the outer wall of the filter element end cap. The slider nut is fixed to the locking pressure plate. The flat round head screw is threaded through the slider nut and the filter element end cap. The handle is fixed to the end of the flat round head screw.
[0014] In one embodiment of this application, a nut limiting pin is further included, one end of which is fixed to the outer wall of the slider nut.
[0015] In one embodiment of this application, the filter assembly includes a filter element body, a filter element fixing seat, a filter element gasket, a ceramic filter element, a first O-ring, and a second O-ring. The ceramic filter element is sleeved on the filter element body, and the filter element fixing seat is inserted into the filter element body.
[0016] The filter element gasket is disposed between the ceramic filter element and the filter element fixing seat. One end of the filter element body is inserted into the filter element end cap. The first O-ring and the second O-ring are disposed between the filter element body and the probe body. Both the ceramic filter element and the filter element fixing seat are inserted into the probe body.
[0017] In one embodiment of this application, a probe heat-conducting block is also included, which is fixed on the outer wall of the probe insulation sleeve.
[0018] The beneficial effects of this application are as follows: The sampling probe obtained by the above design has an external backflushing and an internal backflushing air path for the filter element. The filter element backflushing design can improve the service life of the filter element and allow the use of finer filter elements. The internal and external backflushing design reduces the maintenance workload of personnel for the filter element. The quick-release design of the filter element has a lead screw force-increasing structure, and the filter components can be quickly replaced without tools. The sample gas pipeline opening is on the end face of the probe body, which makes it difficult for contaminants to enter during cleaning and does not require stopping sampling. The filter gas chamber can be easily cleaned. The probe uses a high-power heating rod with adjustable heating temperature. The probe junction box is equipped with a temperature controller, which can control the heating temperature and provide a low-temperature alarm signal. Attached Figure Description
[0019] To more clearly illustrate the technical solutions of the embodiments of this application, the drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this application and should not be regarded as a limitation of the scope. For those skilled in the art, other related drawings can be obtained from these drawings without creative effort.
[0020] Figure 1 This is a three-dimensional structural diagram of a sampling probe provided in an embodiment of this application;
[0021] Figure 2 A three-dimensional structural diagram of the locking mechanism provided in the embodiments of this application;
[0022] Figure 3 A schematic diagram of the structure of a sampling probe provided for an embodiment of this application;
[0023] Figure 4 A cross-sectional view of a sampling probe provided for an embodiment of this application;
[0024] Figure 5 A cross-sectional view of the filtering component provided in an embodiment of this application;
[0025] Figure 6 A diagram showing the relationship between the locking mechanism and the filtering assembly provided in the embodiments of this application.
[0026] In the diagram: 110 - Protective mechanism; 111 - Probe housing; 112 - Probe bracket; 113 - Buckle; 120 - Junction box; 130 - Sampling mechanism; 131 - Probe insulation sleeve; 132 - Sample gas inlet; 134 - Sample gas outlet; 135 - Filter element internal backflush port; 136 - First temperature controller probe; 137 - Second temperature controller probe; 138 - Filter element external backflush connector; 139 - Heating rod; 1390 - Filter element external backflush port; 1391 - Probe body; 140 - Sample gas shut-off valve actuator; 150 - Probe... Head fixing bracket; 160 - Standard gas shut-off valve; 170 - Locking mechanism; 171 - Filter element end cap; 172 - Flat round head screw; 173 - Handle; 174 - Sliding nut; 175 - Nut limit pin; 176 - Locking pressure plate; 180 - Filter assembly; 181 - Filter element body; 182 - Filter element fixing seat; 183 - Filter element gasket; 184 - Ceramic filter element; 185 - First O-ring; 186 - Second O-ring; 187 - Countersunk hexagonal socket head cap screw; 190 - Connector insulation sleeve; 191 - Probe heat-conducting block. Detailed Implementation
[0027] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, not all of them. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.
[0028] Example
[0029] Please see Figure 1 - Figure 6 This application provides a technical solution: a sampling probe, including a junction box 120, a sample gas shut-off valve actuator 140, a probe fixing bracket 150, a standard gas shut-off valve 160, a protective mechanism 110, a sampling mechanism 130, a locking mechanism 170, and a filter assembly 180, with the junction box 120 installed outside the protective mechanism 110;
[0030] The probe mounting bracket 150 is installed inside the protective mechanism 110. The sample gas shut-off valve actuator 140 and the standard gas shut-off valve 160 are both installed on the sampling mechanism 130. The locking mechanism 170 is installed on the sampling mechanism 130. The filter assembly 180 is inserted inside the sampling mechanism 130 and is located between the sampling mechanism 130 and the locking mechanism 170. The junction box 120 is equipped with a temperature controller.
[0031] The protective mechanism 110 is provided to protect the sampling mechanism 130. The protective mechanism 110 includes a probe housing 111, a probe bracket 112, and a buckle 113. The probe housing 111 is sleeved on the probe bracket 112. Different parts of the buckle 113 are respectively fixed to the outer walls of the probe housing 111 and the probe bracket 112. The buckle 113 is provided to assemble and disassemble the probe housing 111.
[0032] The sampling mechanism 130 includes a probe insulation sleeve 131, a first temperature controller probe 136, a second temperature controller probe 137, a filter element backflush connector 138, a heating rod 139, and a probe body 1391. The probe body 1391 is fixed on the probe bracket 112 and the probe fixing bracket 150. The probe insulation sleeve 131 is fitted onto the probe body 1391. The first temperature controller probe 136 and the second temperature controller probe 137 are mounted on the probe body 1391. A sample gas shut-off valve actuator 140 and... The standard gas shut-off valve 160 is installed on the probe body 1391. The probe body 1391 is provided with a sample gas inlet 132, a sample gas outlet 134, an inner backflush port 135 and an outer backflush port 1390. The heating rod 139 is installed on the outer wall of the probe insulation sleeve 131 through the probe heat-conducting block 191. The outer backflush connector 138 is installed on the outer backflush port 1390. The probe heat-conducting block 191 is also included and is fixed on the outer wall of the probe insulation sleeve 131.
[0033] The locking mechanism 170 is used to restrict and fix the filter assembly 180 within the probe body 1391. The locking mechanism 170 includes a filter end cap 171, a flat round head screw 172, a handle 173, a slider nut 174, and a locking plate 176. The filter end cap 171 is threaded into the probe insulation sleeve 131. The locking plate 176 is fixed to the outer wall of the filter end cap 171. The slider nut 174 is fixed to the locking plate 176. The flat round head screw 172 is threaded through the slider nut 174 and the filter end cap 171. The handle 173 is fixed to the end of the flat round head screw 172. The mechanism also includes a nut limiting pin 175. One end of the nut limiting pin 175 is fixed to the outer wall of the slider nut 174. The nut limiting pin 175 is used to limit the slider nut 174.
[0034] The filter element backflushing design of the filter assembly 180 is used to reduce the maintenance workload of the filter element. The filter assembly 180 includes a filter element body 181, a filter element fixing seat 182, a filter element gasket 183, a ceramic filter element 184, a first O-ring 185, and a second O-ring 186. The ceramic filter element 184 is sleeved on the filter element body 181, the filter element fixing seat 182 is inserted into the filter element body 181, the filter element gasket 183 is disposed between the ceramic filter element 184 and the filter element fixing seat 182, one end of the filter element body 181 is inserted into the filter element end cap 171, the first O-ring 185 and the second O-ring 186 are disposed between the filter element body 181 and the probe body 1391, and both the ceramic filter element 184 and the filter element fixing seat 182 are inserted into the probe body 1391.
[0035] Specifically, the working principle of this sampling probe is as follows: During use, the filter element body 181, ceramic filter element 184, and filter element fixing seat 182 are inserted into the probe body 1391. Then, the filter element end cap 171 is screwed onto the probe insulation sleeve 131. Next, the handle 173 is rotated, causing the end of the flat-head screw 172 to press against the filter element body 181, thus fixing the filter element body 181 within the probe body 1391. This facilitates the installation and removal of the filter assembly 180. The sample gas inlet 13 of the probe body 1391... Two connecting pipes are installed at two locations and extend into the measuring point. The flange of the probe body 1391 is connected to the flange of the measuring point. Then, the junction box 120 is opened to connect the wiring to provide power to the probe body 1391. At the same time, the probe heating temperature and low temperature alarm temperature are set through the temperature controller. The filter element external backflush connector 138, filter element internal backflush port 135, sample gas shut-off valve actuator 140 interface, sample gas inlet 132, and standard gas shut-off valve 160 interface are respectively connected to the backflush device and the subsequent pretreatment device. The filter element body 181 is inserted into the probe body 1391 and secured by the locking mechanism 170. After the sample gas is filtered by the filter element, it is delivered to the standard gas shut-off valve 160. The standard gas shut-off valve 160 can cut off the sampling gas path, preventing the compressed gas during filter element backflushing from affecting the subsequent pretreatment device and instruments. This sampling probe is designed with external and internal filter element backflushing gas paths. The filter element backflushing design can improve the service life of the filter element and allow the use of finer filter elements. The internal and external filter element backflushing design reduces the maintenance workload of personnel. The quick-release design of the filter element has a screw force-increasing structure, and the filter element 180 can be quickly replaced without tools. The sample gas pipeline opening is on the end face of the probe body 1391, which makes it difficult for contaminants to enter during cleaning and does not require stopping sampling. The filter chamber can be easily cleaned. The probe uses a high-power heating rod 139 with adjustable heating temperature. The probe junction box 120 is equipped with a temperature controller, which can control the heating temperature and provide a low temperature alarm signal.
[0036] It should be noted that the specific models and specifications of the junction box 120, the first temperature controller probe 136, the second temperature controller probe 137, the heating rod 139, the probe body 1391, the sample gas shut-off valve actuator 140, the standard gas shut-off valve 160, and the filter body 181 need to be selected and determined according to the actual specifications of the device. The specific selection calculation method adopts the existing technology in this field, so it will not be described in detail.
[0037] The power supply and operating principle of the junction box 120, the first temperature controller probe 136, the second temperature controller probe 137, the heating rod 139, the probe body 1391, the sample gas shut-off valve actuator 140, the standard gas shut-off valve 160, and the filter element body 181 are clear to those skilled in the art and will not be described in detail here.
[0038] The above are merely embodiments of this application and are not intended to limit the scope of protection of this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the scope of protection of this application. It should be noted that similar reference numerals and letters in the following figures indicate similar items; therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.
Claims
1. A sampling probe, characterized in that, It includes a junction box (120), a sample gas shut-off valve actuator (140), a probe mounting bracket (150), a standard gas shut-off valve (160), a protective mechanism (110), a sampling mechanism (130), a locking mechanism (170), and a filter assembly (180), wherein the junction box (120) is installed outside the protective mechanism (110); The probe mounting bracket (150) is installed inside the protective mechanism (110). The sample gas shut-off valve actuator (140) and the standard gas shut-off valve (160) are both located on the sampling mechanism (130). The locking mechanism (170) is installed on the sampling mechanism (130). The filter assembly (180) is inserted into the sampling mechanism (130). The filter assembly (180) is located between the sampling mechanism (130) and the locking mechanism (170). The junction box (120) is equipped with a temperature controller. The protective mechanism (110) is provided to protect the sampling mechanism (130); The locking mechanism (170) is configured to secure the filter assembly (180) within the probe body (1391); The filter element of the filter assembly (180) features an internal and external backflushing design to reduce the amount of maintenance required for the filter element.
2. A sampling probe according to claim 1, characterized in that, The protective mechanism (110) includes a probe housing (111), a probe bracket (112), and a buckle (113). The probe housing (111) is fitted onto the probe bracket (112), and different parts of the buckle (113) are respectively fixed to the outer walls of the probe housing (111) and the probe bracket (112).
3. A sampling probe according to claim 2, characterized in that, The sampling mechanism (130) includes a probe insulation sleeve (131), a first temperature controller probe (136), a second temperature controller probe (137), a filter element external backflush connector (138), a heating rod (139), and a probe body (1391). The probe body (1391) is fixed on the probe bracket (112) and the probe fixing bracket (150), and the probe insulation sleeve (131) is sleeved on the probe body (1391). The probe body (1391) is provided with a first temperature controller probe (136) and a second temperature controller probe (137). The sample gas shut-off valve actuator (140) and the standard gas shut-off valve (160) are both provided on the probe body (1391). The probe body (1391) is provided with a sample gas inlet (132), a sample gas outlet (134), an inner backflush port (135) and an outer backflush port (1390). The heating rod (139) is installed on the outer wall of the probe insulation sleeve (131) through the probe heat-conducting block (191). The outer backflush connector (138) is installed on the outer backflush port (1390).
4. A sampling probe according to claim 3, characterized in that, The locking mechanism (170) includes a filter element end cap (171), a flat round head screw (172), a handle (173), a slider nut (174), and a locking pressure plate (176). The filter element end cap (171) is threaded into the probe insulation sleeve (131). The locking pressure plate (176) is fixed on the outer wall of the filter element end cap (171). The slider nut (174) is fixed on the locking pressure plate (176). The flat round head screw (172) is threaded through the slider nut (174) and the filter element end cap (171). The handle (173) is fixed to the end of the flat round head screw (172).
5. A sampling probe according to claim 4, characterized in that, It also includes a nut limiting pin (175), one end of which is fixed to the outer wall of the slider nut (174).
6. A sampling probe according to claim 4, characterized in that, The filter assembly (180) includes a filter element body (181), a filter element fixing seat (182), a filter element gasket (183), a ceramic filter element (184), a first O-ring (185), and a second O-ring (186). The ceramic filter element (184) is sleeved on the filter element body (181), and the filter element fixing seat (182) is inserted into the filter element body (181). The filter element gasket (183) is disposed between the ceramic filter element (184) and the filter element fixing seat (182). One end of the filter element body (181) is inserted into the filter element end cap (171). The first O-ring (185) and the second O-ring (186) are disposed between the filter element body (181) and the probe body (1391). Both the ceramic filter element (184) and the filter element fixing seat (182) are inserted into the probe body (1391).
7. A sampling probe according to claim 3, characterized in that, It also includes a probe heat-conducting block (191), which is fixed on the outer wall of the probe insulation sleeve (131).