Detection probe and detection device

Abstract

The utility model provides a detection probe and a detection device. The detection probe comprises an outer shell; the driving coil and the receiving coil are respectively arranged in the outer shell so as to realize nondestructive testing of the switch machine; the fixing structure is used for fixing and / or moving the probe; the operation process is highly simplified, complex disassembly or internal detection possibly involved in traditional detection is avoided, safety risks caused by the fact that an operator makes contact with a moving part and a precise internal structure are reduced to the maximum extent, the detection probe only needs to be directly placed on the point switch to be detected, and the detection efficiency is greatly improved. Detection personnel do not need to have professional detection experience or master specific detection skills, and a single person can efficiently complete comprehensive detection tasks on the switch machine; compared with the prior art, manpower configuration is optimized, the number of field operation personnel is reduced, the problems of personnel redundancy and resource waste possibly existing in a traditional detection mode are more effectively avoided, and the overall efficiency and economical efficiency of detection operation are improved.

Description

Technical Field

[0001] This application belongs to the field of rail transit technology and relates to a detection probe and detection device. Background Technology

[0002] In recent years, railway transport volume has gradually increased. Switch machines are crucial equipment in railway systems, and the operating lever, as a key component, directly affects the normal operation of the switch machine. During manufacturing, issues such as processing techniques may lead to internal forging cracks or deep tool marks on the surface of the component. After being put into use, the interaction between various mechanisms may cause defects such as dents and deformation. Therefore, how to detect damage to switch machines has become one of the urgent technical problems that relevant technicians need to solve.

[0003] Some technical solutions have achieved certain results in damage detection of switch machines, such as being able to penetrate the paint layer and detect cracks up to 4 mm deep. However, this only solves some surface or shallow problems. Damage detection using some technical solutions for switch machines limits the comprehensiveness, effectiveness, and accuracy of the detection work. In severe cases, it may even cause traffic accidents due to hidden equipment problems, and the detection process wastes a lot of manpower and resources.

[0004] Therefore, how to achieve more accurate detection of switch machines, simplify the detection process, and improve the accuracy of switch machine damage detection has become an urgent technical problem to be solved.

[0005] To address at least the aforementioned issues, this application provides a detection probe that enables non-destructive identification of the switch machine during detection, improving the accuracy of determining switch machine damage. A single person can efficiently complete the comprehensive detection task of the switch machine, optimizing manpower allocation and reducing the number of on-site workers. Utility Model Content

[0006] This application provides a detection probe and a detection device for detecting damage to a switch machine.

[0007] In a first aspect, embodiments of this application provide a detection probe, comprising: a housing; a driving coil and a receiving coil, respectively housed within the housing; and a fixing structure for fixing and / or moving the probe.

[0008] In one implementation of the first aspect, a shielding layer is provided on the outer surface of the outer shell.

[0009] In one implementation of the first aspect, the inner end face of the housing is provided with two opposing signal transmission ports.

[0010] In one implementation of the first aspect, at least one communication interface is provided at each end of the outer end face of the outer shell, and the communication interface is used to connect the detection probe and the eddy current meter.

[0011] In one implementation of the first aspect, the eddy current meter includes an excitation circuit electrically connected to the drive coil for driving the drive coil to emit eddy current signals. The excitation circuit includes a signal generator and a power amplifier. The signal generator includes a 12-bit digitally controlled oscillator and an AD9764 analog-to-digital converter.

[0012] In one implementation of the first aspect, the eddy current meter includes a signal conditioning circuit.

[0013] In one implementation of the first aspect, the eddy current meter includes a signal acquisition circuit.

[0014] In one implementation of the first aspect, the fixing structure of the detection probe includes a telescopic crossbar and a clamp, the clamp being fixedly disposed at one end of the telescopic crossbar.

[0015] In one implementation of the first aspect, the receiving coil is a self-inducting coil or a mutual-inducting coil.

[0016] Secondly, embodiments of this application provide a detection device, the device comprising: an eddy current meter for displaying detection results; and a detection probe as described in any of the first aspects, the detection probe being communicatively connected to the eddy current meter.

[0017] The detection probe provided in this application includes: a housing; a drive coil and a receiving coil, respectively built into the housing, to achieve non-destructive testing of the switch machine. The operation process is simple and efficient, avoiding the complex disassembly or internal exploration that may be involved in traditional testing. A fixed structure is used to fix and / or move the probe, thereby minimizing the safety risks caused by operators coming into contact with moving parts and precision internal structures. The testing process is completely non-destructive and does not change the original structure or working state of the switch machine or introduce any external interference factors, ensuring a high degree of consistency between the testing environment and the actual operating environment. The data obtained based on this non-contact, in-situ testing method can more realistically reflect the actual damage condition of the switch machine and achieve precise location of the damage. Attached Figure Description

[0018] Figure 1A The diagram shown is a structural diagram of a detection probe provided in an embodiment of this application.

[0019] Figure 1B The diagram shown is another structural diagram of a detection probe provided in one embodiment of this application.

[0020] Figure 1C The diagram shown is another structural diagram of a detection probe provided in one embodiment of this application.

[0021] Figure 2A The diagram shown is another structural diagram of a detection probe provided in one embodiment of this application.

[0022] Figure 2B The diagram shown is another structural diagram of a detection probe provided in one embodiment of this application.

[0023] Figure 3 The diagram shown is another structural diagram of a detection probe provided in one embodiment of this application.

[0024] Figure 4 The diagram shown is another structural diagram of a detection probe provided in one embodiment of this application.

[0025] Figure 5A The diagram shown is a hardware structure diagram of an eddy current meter provided in an embodiment of this application.

[0026] Figure 5B The diagram shown is a circuit diagram of a 12-bit digitally controlled oscillator generating digital signals according to an embodiment of this application.

[0027] Figure 5C The diagram shown corresponds to the AD9764 analog-to-digital converter provided in one embodiment of this application.

[0028] Figure 5D The diagram shown is an amplifier circuit diagram corresponding to a power amplifier provided in one embodiment of this application.

[0029] Figure 6A The diagram shown is a schematic diagram of the fixing structure of a detection probe provided in an embodiment of this application.

[0030] Figure 6B The diagram shown is a schematic diagram of the fixing structure of another detection probe provided in one embodiment of this application.

[0031] Figure 7 The diagram shown is a schematic diagram of a receiving coil provided in an embodiment of this application.

[0032] Figure 8 The diagram shown is a structural diagram of a detection device provided in an embodiment of this application.

[0033] Component designation explanation

[0034] 100 detection probe 110 outer shell 1101 outer end face of the outer shell 1102 Inner end face of the outer shell 120 drive coil 130 receiving coil 140 Shielding layer 150 signal transmission port 160 signal transmission port 170 Communication interface 200 Eddy current meter 210 Excitation circuit 211 signal generator 212 Power amplifier 220 Signal conditioning circuit 221 Preamplifier 222 Phase-sensitive detector 223 Adjustable gain amplifier 230 Signal acquisition circuit 231 Analog-to-digital converter 300 Fixed structure 310 Telescopic crossbar 311 elastic components 312 handle 313 Button 320 clamps 321 clamp pliers 322 bolt 400 Detection device 500 switch machine Detailed Implementation

[0035] The following specific examples illustrate the implementation of this application. Those skilled in the art can easily understand other advantages and effects of this application from the content disclosed in this specification. This application can also be implemented or applied through other different specific embodiments, and various details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of this application. It should be noted that, unless otherwise specified, the following embodiments and features in the embodiments can be combined with each other.

[0036] It should be noted that the illustrations provided in the following embodiments are only schematic representations of the basic concept of this application. Therefore, the drawings only show the components related to this application and are not drawn according to the actual number, shape and size of the components in the actual implementation. In the actual implementation, the shape, quantity and proportion of each component can be arbitrarily changed, and the layout of the components may also be more complex.

[0037] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "linking," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.

[0038] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this application, "at least one" or "more than one" means two or more, unless otherwise explicitly specified.

[0039] The technical solutions in the embodiments of this application will be described in detail below with reference to the accompanying drawings.

[0040] Figure 1A The diagram shown is a structural diagram of a detection probe provided in an embodiment of this application. Figure 1A As shown, the detection probe 100 provided in this application embodiment includes: a housing 110; a driving coil 120 and a receiving coil 130, respectively built into the housing 110; and a fixing structure 300 for fixing and / or moving the probe 100.

[0041] For example, the outer casing 110 may be in the shape of a ring, a semi-ring, or a U-shape.

[0042] For example, if the outer casing 110 is circular, the switch machine to be tested can be directly placed into the circular ring of the probe for testing. At this time, there is no need to move the outer casing 110. Only the switch machine needs to be moved or rotated to complete the accurate testing of the switch machine. The circular probe is suitable for testing small switch machines.

[0043] For example, if the outer casing 110 is semi-circular in shape, the switch machine can be inspected by moving the probe. The semi-circular probe is moved to the switch machine to be tested, and the inspection of the switch machine can be achieved by moving the semi-circular probe to its position. The semi-circular probe is suitable for inspecting large-volume switch machines.

[0044] For example, the outer casing 110 can also be U-shaped to enable accurate detection of switch machines of other shapes.

[0045] It should be noted that the probes of the different shapes of the outer shell 110 listed above can accurately detect various types of switch machines. In practical applications, relevant testing personnel can select probes of different shapes of outer shells to test the switch machine according to specific testing needs. This application does not impose any restrictions on this.

[0046] For example, the specific positions of the drive coil 120 and the receiving coil 130 in the detection probe can be determined based on the excitation frequency selection, the spacing between the drive coil 120 and the receiving coil 130, the coil layout and scanning method, and the coil structure parameters.

[0047] For example, based on phase transition characteristics: analysis of phase characteristic curves shows that the higher the frequency (e.g., 1 kHz), the shorter the distance from the phase transition point to the center of the excitation coil (only 9 mm), resulting in a significant attenuation of the signal amplitude in the far-field region. While low frequencies (e.g., 100 Hz) have deep penetration, the phase transition distance is too long (18 mm), failing to meet the requirements of a compact space. Therefore, a suitable excitation frequency can be selected by comprehensively considering both frequency and phase transition distance. For example, an excitation frequency of 500 Hz can be chosen, where the phase transition distance is moderate, the far-field region is located 30 mm from the center of the excitation coil, and the signal amplitude attenuation is controllable (approximately 40% higher than 1 kHz).

[0048] For example, at 500 Hz, the phase change is gradual at a distance of 30 mm from the center of the drive coil 120, which is consistent with the characteristics of the far-field region (the magnetic field passes through the wall twice, mainly through indirect coupling). The drive coil 120 and the receiving coil 130 are symmetrically placed at both ends of the probe 120 (each 15 mm from the center of the probe 120), with a total spacing of 30 mm, which satisfies the requirements of the far-field region and adapts to the actual space constraints.

[0049] For example, the drive coil 120 and the receiving coil 130 inside the probe can surround the switch machine at a 180° angle, ensuring that the strongest signal can be captured when either coil is rotated directly above the defect (at a 90° or 270° position) during scanning.

[0050] For example, the coil structure parameters of the drive coil 120 and the receiving coil 130 within the probe can be reasonably set according to specific detection or penetration requirements. For instance, for the drive coil 120: the current is set to 100 mA, the wire diameter is 0.1–0.8 mm, and the number of turns is 100–800. The receiving coil 130: adopts a differential dual-coil structure, with a wire diameter of 0.01–0.3 mm and 20–200 turns, which can improve the sensitivity to micro-cracks.

[0051] It should be noted that the data listed in the above examples are for illustrative purposes only. In actual applications, any other suitable data can be selected according to specific application requirements, and this application does not impose any restrictions on this.

[0052] Please see Figure 1B and Figure 1C , Figure 1B and Figure 1C This is another structural diagram of a detection probe provided in one embodiment of this application. Its specific structure has been described above. Figure 1A The details are explained in the previous section, and will not be repeated here.

[0053] Please see Figure 2A , Figure 2A This is another structural diagram of a detection probe provided in one embodiment of this application. Figure 2A It is known that a shielding layer 140 is provided on the outer surface of the outer casing 110. The shielding layer 140 can effectively isolate the interference of external electromagnetic fields on the internal signals of the drive coil 120 and the receiving coil 130, thereby improving the accuracy of the detection probe in detecting the switch machine. At the same time, it prevents the electromagnetic fields generated by the drive coil 120 and the receiving coil 130 themselves from radiating outward and affecting the normal operation of other equipment or lines.

[0054] Please see Figure 2B , Figure 2B This diagram shows another structural diagram of the detection probe provided in one embodiment of this application. Its specific structure and function have been described above. Figure 1A and Figure 2A The details are explained in the previous section, and will not be repeated here.

[0055] Please see Figure 3 , Figure 3 This is another structural diagram of a detection probe provided in one embodiment of this application. Figure 3It is known that the inner end face 1102 of the outer shell is provided with two opposing signal transmission ports, namely signal transmission port 150 and signal transmission port 160, for signal transmission between the driving coil 120 and the receiving coil 130.

[0056] Signal transmission ports 150 and 160 are not within the shielding area of ​​the shielding layer. Signal transmission ports 150 and 160 are located at gaps in the shielding layer.

[0057] Please see Figure 4 , Figure 4 This is another structural diagram of a detection probe provided in one embodiment of this application. Figure 4 It is known that at least one communication interface 170 is provided at each end of the outer end face 1101 of the outer shell, and the communication interface 170 is used to connect the detection probe and the eddy current meter 200.

[0058] For example, the detection probe and the eddy current meter 200 are connected through the communication interface 170, so that the detection probe sends the detection signal of the switch machine to the eddy current meter 200, so that the eddy current meter 200 can process the detection signal and display the damage status of the switch machine.

[0059] It should be noted that among the multiple communication interfaces 170, only one communication interface 170 is required as the working interface; the other communication interfaces 170 can be used as backup interfaces. When the working communication interface 170 fails, the other backup communication interfaces 170 can be used to connect the detection probe and the eddy current meter 200 in a timely manner, so as to ensure the normal operation of the detection probe and improve the working efficiency of the detection probe.

[0060] It should be noted that in actual operation, any one of the two communication interfaces 170 on the outer end face of the outer casing can be used as the working interface, and the other communication interfaces 170 can be used as alternative interfaces. This application does not impose any restrictions on this.

[0061] Please see Figure 5A , Figure 5A The diagram shown illustrates the hardware structure of an eddy current meter according to an embodiment of this application. Figure 5A It is known that the eddy current meter 200 includes an excitation circuit 210, which is electrically connected to the drive coil 120 and is used to drive the drive coil 120 to emit eddy current signals. The excitation circuit 210 includes a signal generator 211 and a power amplifier 212. The signal generator 211 includes a 12-bit digital controlled oscillator and an AD9764 analog-to-digital converter.

[0062] Please see Figure 5B , Figure 5BThe diagram shown is a circuit diagram of a 12-bit digitally controlled oscillator generating digital signals according to an embodiment of this application.

[0063] Please see Figure 5C , Figure 5C The diagram shown corresponds to the AD9764 analog-to-digital converter provided in one embodiment of this application.

[0064] Specifically, the signal generator 211 is used to output an electrical signal, and the power amplifier 212 is used to amplify the electrical signal to obtain the amplified excitation current, so as to drive the drive coil 120 to emit an eddy current signal.

[0065] Please see Figure 5D , Figure 5D The diagram shown is an amplifier circuit diagram corresponding to a power amplifier provided in one embodiment of this application.

[0066] In some embodiments, the eddy current meter 200 includes a signal conditioning circuit 220. The signal conditioning circuit 220 includes a preamplifier 221, a phase-sensitive detector 222, and an adjustable gain amplifier 223. The preamplifier 221, phase-sensitive detector 222, and adjustable gain amplifier 223 in the signal conditioning circuit 220 work together to process the damage signal of the switch machine detected by the detection probe, removing additional noise and obtaining a more accurate detection signal.

[0067] In some embodiments, the eddy current meter 200 includes a signal acquisition circuit 230. The signal acquisition circuit 230 includes an analog-to-digital converter 231 for converting the noise-removed detection signal into a digital signal and displaying it on the display screen of the eddy current meter 200.

[0068] Please see Figure 6A , Figure 6A The diagram shown illustrates the fixing structure of a detection probe according to an embodiment of this application. Figure 6A It can be seen that the fixing structure 300 of the detection probe includes a telescopic crossbar 310 and a clamp 320, and the clamp 320 is fixedly disposed at one end of the telescopic crossbar 310.

[0069] Specifically, the telescopic crossbar 310 has an elastic component 311 inside its body. The elastic component 311 is used to stretch or retract the telescopic crossbar 310. A button 313 is provided at the handle 312 of the telescopic crossbar 310. The button 313 is connected to the elastic component 311. When the user presses the button 313 for the first time, the elastic component 311 is in a stretched state, and the corresponding telescopic crossbar 310 is stretched, causing the telescopic crossbar 310 to become longer. When the user presses the button 313 again, the elastic component 311 is in a retracted state, causing the telescopic crossbar 310 to become shorter, making the telescopic crossbar 310 suitable for various application scenarios.

[0070] Specifically, the clamp 320 includes a clamp 321 and a bolt 322, the bolt 322 being used to change the clamping angle of the clamp 321.

[0071] Please see Figure 6B , Figure 6B The diagram shown is a schematic diagram of the fixing structure of another detection probe provided in one embodiment of this application. Figure 6B The structure of the detection probe in Figure 6A The structure is similar to that in the previous application, and will not be described in detail here.

[0072] The receiving coil 130 is either a self-inducting coil or a mutually inducting coil. Please refer to [link / reference]. Figure 7 , Figure 7 The diagram shown is a schematic diagram of a receiving coil provided in an embodiment of this application.

[0073] Figure 8 The diagram shown is a structural diagram of a detection device provided in an embodiment of this application. Figure 8 As shown, the detection device 400 includes an eddy current meter 200 and a detection probe 100. The eddy current meter 200 is used to display the detection results; the detection probe 100 is electrically connected to the eddy current meter 200 through a communication interface 170 on the outer end face 1101 of the housing, and is used to send the detection signal received by the detection probe 100 to the eddy current meter 200.

[0074] For example, the detection device also includes a switch machine 500 to be detected.

[0075] Specifically, the eddy current meter 200 is electrically connected to the detection probe 100. The detection probe 100 is placed directly on the switch machine under test. The far-field eddy current excited by the drive coil 120 in the detection probe under the electric drive of the eddy current meter 200 penetrates the switch machine under test, realizing non-destructive testing of the switch machine. The detection signal received in the receiving coil 130 is transmitted to the eddy current meter 200. After signal processing by the eddy current meter 200, the detection result is displayed intuitively on the display screen of the eddy current meter 200. When the display screen of the eddy current meter 200 emits an abnormal signal, the position of the detection probe on the switch machine at the same moment is the damaged location of the switch machine; conversely, if the display screen of the eddy current meter 200 emits a normal signal, the position of the detection probe on the switch machine at the same moment is the undamaged location of the switch machine. The location of the switch machine damage can be intuitively and accurately located, reducing the possibility of human interpretation error and the inconsistency of results caused by differences in personal experience or understanding, thus ensuring the consistency of detection quality and improving the work efficiency of relevant testing personnel.

[0076] In summary, the detection probe and detection device provided in this application embodiment allow the detection probe to be directly placed on the switch machine to be tested. The operation process is highly simplified, requiring no professional testing experience or specific testing skills from the testing personnel. The testing procedure can be initiated simply by placing the probe directly on the surface of the switch machine. This design significantly lowers the operational threshold, enabling a single person to efficiently complete a comprehensive inspection of the switch machine. This solution not only optimizes manpower allocation and reduces the number of on-site personnel, but also effectively avoids the potential redundancy and resource waste that may exist in traditional testing methods, improving the overall efficiency and economy of the testing operation and achieving accurate, non-destructive identification of the switch machine.

[0077] The above embodiments are merely illustrative of the principles and effects of this application and are not intended to limit this application. Any person skilled in the art can modify or alter the above embodiments without departing from the spirit and scope of this application. Therefore, all equivalent modifications or alterations made by those skilled in the art without departing from the spirit and technical concept disclosed in this application should still be covered by the claims of this application.

Claims

1. A detection probe, characterized in that, The probe is used for damage detection of a switch machine. The probe includes: a housing; a drive coil and a receiving coil, which are respectively built into the housing to achieve non-destructive testing of the switch machine; and a fixing structure for fixing and / or moving the probe.

2. The detection probe according to claim 1, characterized in that, The outer surface of the outer casing is provided with a shielding layer.

3. The detection probe according to claim 1, characterized in that, The inner end face of the outer casing is provided with two opposing signal transmission ports.

4. The detection probe according to claim 1, characterized in that, At least one communication interface is provided at each end of the outer end face of the outer shell, and the communication interface is used to connect the detection probe and the eddy current meter.

5. The detection probe according to claim 4, characterized in that, The eddy current meter includes an excitation circuit electrically connected to the drive coil for driving the drive coil to emit eddy current signals. The excitation circuit includes a signal generator and a power amplifier. The signal generator includes a 12-bit digitally controlled oscillator and an AD9764 analog-to-digital converter.

6. The detection probe according to claim 4, characterized in that, The eddy current meter includes a signal conditioning circuit.

7. The detection probe according to claim 4, characterized in that, The eddy current meter includes a signal acquisition circuit.

8. The detection probe according to claim 1, characterized in that, The fixing structure of the detection probe includes a telescopic crossbar and a clamp, with the clamp fixedly mounted on one end of the telescopic crossbar.

9. The detection probe according to claim 1, characterized in that, The receiving coil is either a self-inductance coil or a mutual inductance coil.

10. A detection device, characterized in that, The device includes: an eddy current meter for displaying detection results; and a detection probe according to any one of claims 1 to 9, wherein the detection probe is communicatively connected to the eddy current meter.

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