Circuit board element testing device

Abstract

The utility model relates to a circuit board element testing device which comprises a rack, a positioning assembly used for positioning an element to be tested is arranged on the rack, a testing unit is arranged on the rack, and the testing unit comprises a probe testing assembly and an interface testing assembly. According to the utility model, through the test unit integrating the probe test assembly and the interface test assembly, circuit board probe test and element interface test can be carried out at the same time, and the comprehensive performance is strong; the device is simple to operate, convenient to use and capable of saving equipment investment cost.

Description

Technical Field

[0001] This utility model relates to the technical field of circuit board processing, and in particular to a circuit board component testing device. Background Technology

[0002] Circuit boards are a crucial component of electronic products, boasting advantages such as high reliability, good consistency, high mechanical strength, light weight, small size, and ease of standardization. They are widely used in electronic watches, calculators, computers, communication equipment, electronic radar systems, and other electronic products. Therefore, in the development of electronic products, one of the most fundamental factors affecting product quality is the design and manufacturing of circuit boards.

[0003] After extensive searching, Chinese Patent Publication No. CN217561547U was found, disclosing a circuit board testing fixture and circuit board testing equipment. The circuit board testing fixture includes a control base, an elastic component, an isolation plate, a limiting component, and a pressing component. The pressing component is connected to the limiting component. An elastic component is provided between the upper end face of the control base and the lower end face of the isolation plate. The control base includes conductive terminals that extend from the upper end face of the control base. The isolation plate is provided with a first through hole corresponding to the conductive terminals. The limiting component can abut against the circuit board to be tested to prevent the circuit board from moving. When the operator operates the pressing component, the pressing component applies pressure to the limiting component. The limiting component squeezes the isolation plate, causing the elastic component to deform. The conductive terminals can pass through the first through hole and match the pins of the circuit board to be tested. This not only fixes the circuit board to be tested, but also allows the circuit board testing fixture to transmit the circuit board information to the testing device, assisting the operator in completing the testing of the circuit board to be tested.

[0004] In summary, existing testing equipment can usually only perform probe testing on circuit boards. However, the components assembled on the circuit board still need to undergo interface testing, which requires another device for testing.

[0005] In view of the above-mentioned shortcomings, the designer has actively researched and innovated in order to create a circuit board component testing device that has greater industrial application value. Utility Model Content

[0006] To solve any of the above-mentioned technical problems, the purpose of this utility model is to provide a circuit board component testing device.

[0007] To achieve the above objectives, the present invention adopts the following technical solution:

[0008] A circuit board component testing device includes a frame, a positioning assembly for positioning the component under test is provided on the frame, and a testing unit is provided on the frame.

[0009] The test unit includes probe testing components and interface testing components;

[0010] The probe testing assembly includes a probe testing linear drive module installed at the bottom of the rack. The drive end of the probe testing linear drive module drives the probe testing lifting base located on the rack to move in the left and right directions through the probe testing linear drive block and the probe testing adapter plate. The probe testing lifting module installed on the probe testing lifting base drives the probe testing lifting frame to move in the vertical direction through the probe testing lifting drive plate. At least one probe is installed on the side of the probe testing lifting frame facing the component under test.

[0011] The interface testing component includes an interface testing linear drive module installed at the bottom of the rack. The drive end of the interface testing linear drive module drives the interface testing linear motion board on the left side to move in the left-right direction through the interface testing linear drive block. Several interface testing plugs are installed on the interface testing linear motion board along the front-back direction.

[0012] As a further improvement of this utility model, a baffle is installed on the rack above the interface testing component.

[0013] As a further improvement of this utility model, the positioning component includes a positioning base and a positioning frame from top to bottom. The positioning base is fixedly installed on the frame, and the positioning frame is installed on the positioning base. A mounting seat for positioning the component to be tested is provided on the inner side of the positioning frame.

[0014] As a further improvement of this utility model, a number of positioning posts are installed on the positioning base on the outside of the positioning frame, and positioning post holes adapted to the above-mentioned positioning posts are provided on the outside of the positioning frame.

[0015] As a further improvement of this utility model, several positioning blocks are installed on the positioning frame on the outside of the mounting base.

[0016] As a further improvement of this utility model, the bottom of the probe test adapter plate is connected to the first end of the probe test tank chain, and the second end of the probe test tank chain is mounted on the frame.

[0017] As a further improvement of this utility model, a probe test vision mechanism is installed on the probe test lifting frame on one side of the probe, and an interface test vision mechanism is installed on the interface test linear motion plate on the side of the interface test plug.

[0018] As a further improvement of this utility model, both the probe testing vision mechanism and the interface testing vision mechanism are CCD cameras.

[0019] As a further improvement of this utility model, an interface testing limiting mechanism is installed on the interface testing linear motion plate. The interface testing limiting mechanism includes a limiting stop post installed on the interface testing linear motion plate and a limiting stop seat installed on the frame.

[0020] By means of the above solution, this utility model has at least the following advantages:

[0021] This utility model, through a test unit that integrates probe testing components and interface testing components, can simultaneously perform circuit board probe testing and component interface testing, resulting in strong overall performance.

[0022] This invention is simple to operate, convenient to use, and can save on equipment investment costs.

[0023] The above description is only an overview of the technical solution of this utility model. In order to better understand the technical means of this utility model and to implement it in accordance with the contents of the specification, the following are the preferred embodiments of this utility model and are described in detail with reference to the accompanying drawings. Attached Figure Description

[0024] To more clearly illustrate the technical solutions of the embodiments of this utility model, the drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this utility model and should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0025] Figure 1 This is a schematic diagram of the structure of a circuit board component testing device according to the present invention;

[0026] Figure 2 yes Figure 1 A schematic diagram of the structure after removing the component under test;

[0027] Figure 3 yes Figure 1 A schematic diagram of the structure of the probe testing component;

[0028] Figure 4 yes Figure 1 A schematic diagram of the interface testing component.

[0029] The meanings of the labels in the figures are as follows.

[0030] 1. Frame; 2. Positioning assembly; 3. Component under test; 4. Probe testing assembly; 5. Interface testing assembly; 6. Baffle; 7. Positioning base; 8. Positioning column; 9. Positioning frame; 10. Positioning column hole; 11. Positioning block; 12. Mounting base; 13. Probe testing linear drive module; 14. Probe testing linear drive block; 15. Probe testing tank chain; 16. Probe testing adapter plate; 17. Probe testing lifting base; 18. Probe testing lifting module; 19. Probe testing lifting drive plate; 20. Probe; 21. Probe testing vision mechanism; 22. Interface testing linear drive module; 23. Interface testing linear drive block; 24. Interface testing linear motion plate; 25. Interface testing plug; 26. Interface testing vision mechanism; 27. Interface testing limit mechanism; 28. Detailed Implementation

[0031] The specific embodiments of this utility model will be described in further detail below with reference to the accompanying drawings and examples. The following examples are used to illustrate this utility model, but are not intended to limit its scope.

[0032] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of them. The components of the embodiments of the present invention described and shown in the accompanying drawings can generally be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the present invention. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without inventive effort are within the scope of protection of the present invention.

[0033] Example

[0034] like Figures 1-4 As shown,

[0035] A circuit board component testing device includes a frame 1, a positioning assembly 2 for positioning a component 3 under test 3 is disposed on the frame 1, and a testing unit is disposed on the frame 1. The testing unit includes a probe testing assembly 4 and an interface testing assembly 5. A baffle 6 is mounted on the frame 1 above the interface testing assembly 5.

[0036] 1. The probe test assembly 4 includes a probe test linear drive module 13 installed at the bottom of the frame 1. The drive end of the probe test linear drive module 13 drives the probe test lifting base 17 located on the frame 1 to move in the left and right direction through the probe test linear drive block 14 and the probe test adapter plate 16. The probe test lifting module 18 installed on the probe test lifting base 17 drives the probe test lifting frame 20 to move in the vertical direction through the probe test lifting drive plate 19. At least one probe 21 is installed on the side of the probe test lifting frame 20 facing the component under test 3.

[0037] The bottom of the probe test adapter plate 16 is connected to the first end of the probe test tank chain 15, and the second end of the probe test tank chain 15 is mounted on the frame 1.

[0038] When a test fixture or component (sample) with a circuit board is assembled is placed on the positioning component 2, the circuit board can be probe tested by multiple probes 21.

[0039] 2. The interface test component 5 includes an interface test linear drive module 23 installed at the bottom of the rack 1. The drive end of the interface test linear drive module 23 drives the interface test linear motion board 25 on the left side to move in the left and right direction through the interface test linear drive block 24. Several interface test plugs 26 are installed on the interface test linear motion board 25 along the front and back direction.

[0040] An interface testing limit mechanism 28 is installed on the interface testing linear motion plate 25. The interface testing limit mechanism 28 includes a limit stop post installed on the interface testing linear motion plate 25 and a limit stop seat installed on the frame 1.

[0041] In addition, a probe test vision mechanism 22 is installed on the probe test lifting frame 20 on one side of the probe 21, and an interface test vision mechanism 27 is installed on the interface test linear motion plate 25 on one side of the interface test plug 26.

[0042] When the components (samples) assembled on the circuit board are placed on the positioning component 2, the sockets of the components can be tested through multiple interface test blocks 26.

[0043] Among them, the probe test vision mechanism 22 and the interface test vision mechanism 27 mentioned above are both CCD cameras.

[0044] 3. The positioning component 2 includes a positioning base 7 and a positioning frame 9 from top to bottom. The positioning base 7 is fixedly installed on the frame 1, and the positioning frame 9 is installed on the positioning base 7. A mounting seat 12 for positioning the component 3 to be tested is provided on the inner side of the positioning frame 9.

[0045] Several positioning posts 8 are installed on the positioning base 7 outside the positioning frame 9, and positioning post holes 10 adapted to the positioning posts 8 are provided on the outside of the positioning frame 9. Several positioning blocks 11 are installed on the positioning frame 9 outside the mounting base 12.

[0046] The positioning element 2 can be used to position a test fixture or a component (sample) equipped with a circuit board. Both have the same external structure.

[0047] In the description of this utility model, it should be understood that the terms "center," "longitudinal," "lateral," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," and "outer," etc., indicating orientation or positional relationships, are based on the orientation or positional relationships shown in the accompanying drawings and are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model. Furthermore, the terms "first," "second," etc., are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implying the number of indicated technical features. Thus, features defined with "first," "second," etc., may explicitly or implicitly include one or more of that feature. In the description of this utility model, unless otherwise stated, "a plurality of" means two or more.

[0048] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.

[0049] The above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. It should be noted that for those skilled in the art, several improvements and modifications can be made without departing from the technical principles of the present utility model, and these improvements and modifications should also be considered within the protection scope of the present utility model.

Claims

1. A circuit board component testing device, comprising a frame (1), a positioning component (2) for positioning a component (3) under test is provided on the frame (1), and a testing unit is provided on the frame (1); Its features are: The test unit includes a probe test component (4) and an interface test component (5); The probe test assembly (4) includes a probe test linear drive module (13) installed at the bottom of the frame (1). The drive end of the probe test linear drive module (13) drives the probe test lifting base (17) located on the frame (1) to move in the left and right direction through the probe test linear drive block (14) and the probe test adapter plate (16). The probe test lifting module (18) installed on the probe test lifting base (17) drives the probe test lifting frame (20) to move in the vertical direction through the probe test lifting drive plate (19). At least one probe (21) is installed on the side of the probe test lifting frame (20) facing the component under test (3). The interface testing component (5) includes an interface testing linear drive module (23) installed at the bottom of the rack (1). The drive end of the interface testing linear drive module (23) drives the interface testing linear motion plate (25) on the left side to move in the left and right directions through the interface testing linear drive block (24). Several interface testing plugs (26) are installed on the interface testing linear motion plate (25) along the front and back directions.

2. The circuit board component testing device as described in claim 1, characterized in that, A baffle (6) is installed on the rack (1) above the interface test assembly (5).

3. The circuit board component testing device as described in claim 1, characterized in that, The positioning component (2) includes a positioning base (7) and a positioning frame (9) from top to bottom. The positioning base (7) is fixedly installed on the frame (1), and the positioning frame (9) is installed on the positioning base (7). A mounting seat (12) for positioning the component to be tested (3) is provided on the inner side of the positioning frame (9).

4. The circuit board component testing device as described in claim 3, characterized in that, A plurality of positioning posts (8) are installed on the positioning base (7) on the outside of the positioning frame (9), and positioning post holes (10) adapted to the positioning posts (8) are provided on the outside of the positioning frame (9).

5. The circuit board component testing device as described in claim 3, characterized in that, Several positioning blocks (11) are installed on the positioning frame (9) outside the mounting base (12).

6. The circuit board component testing device as described in claim 1, characterized in that, The bottom of the probe test adapter plate (16) is connected to the first end of the probe test tank chain (15), and the second end of the probe test tank chain (15) is mounted on the frame (1).

7. The circuit board component testing device as described in claim 1, characterized in that, A probe test vision mechanism (22) is installed on the probe test lifting frame (20) on one side of the probe (21), and an interface test vision mechanism (27) is installed on the interface test linear motion plate (25) on one side of the interface test plug (26).

8. The circuit board component testing device as described in claim 7, characterized in that, Both the probe test vision mechanism (22) and the interface test vision mechanism (27) are CCD cameras.

9. The circuit board component testing device as described in claim 1, characterized in that, An interface test limiting mechanism (28) is installed on the interface test linear motion plate (25). The interface test limiting mechanism (28) includes a limiting stop post installed on the interface test linear motion plate (25) and a limiting stop seat installed on the frame (1).

Images