High-temperature clamp
By setting guide structures and scale lines in the high-temperature fixture, the problem of data deviation caused by thermal expansion and contraction of the fixture under high temperature is solved, and the accuracy of the fracture location of the specimen and the convenience of data measurement are achieved under high temperature conditions.
Patent Information
- Application Number
- CN202422770681.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-14
- Publication Date
- 2025-11-07
- Estimated Expiration
- 2034-11-14
AI Technical Summary
Existing high-temperature fixtures are prone to thermal expansion and contraction and deformation under prolonged high temperatures, which can cause longitudinal displacement of the fixture, resulting in the fracture location of the sample deviating from the theoretical value and leading to data deviation.
A circumferentially spaced guide structure is set between the upper and lower molds of the high-temperature fixture, and scale lines are engraved on the guide structure to ensure that the specimen is stretched along the axial direction. The elongation of the specimen is measured through the guide structure and scale lines, eliminating transverse shear force and improving data accuracy.
By designing the guide structure and scale lines, the clamp axis is kept consistent under high temperature conditions, reducing transverse shear force, improving the accuracy and convenience of experimental data, and ensuring the accurate location of specimen fracture.
Smart Images
Figure CN223526124U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model belongs to high temperature fixture technical field especially relates to a high temperature fixture. BACKGROUND
[0002] The fixture is a kind of tool for fixing workpiece or material, to facilitate processing, testing or other operations. In view of the problem that metal material is softened under high temperature condition, the clamping groove type fixture is designed according to the size of clamping groove of fixture to design the shape of both ends of sample in advance, to ensure that sample can be smoothly clamped, and pin / loop clamping fixed type: symmetric pin hole is punched in both ends of sample, and high-temperature-resistant pin is used to prevent slipping.
[0003] Although the above two kinds of fixtures can effectively reduce the slipping of sample under high temperature, but long time high temperature work can lead to fixture thermal expansion and deformation, and then cause fixture longitudinal deviation, produce transverse shearing force to sample, finally make the fracture position deviate from theoretical value, lead to data deviation.
[0004] Therefore, a high temperature fixture is needed to solve the above technical problems. INVENTION CONTENTS
[0005] The utility model aims at providing a kind of high temperature fixture to solve the above problems.
[0006] To achieve the above object, the utility model provides the following scheme:
[0007] A kind of high temperature fixture, including upper die, lower die, the both ends of the same test piece are fixed on the upper die, lower die, at least two circumferential direction equidistantly distributed guide structure is equipped between the upper die, lower die, one end of the guide structure is slidably connected with the upper die, the other end of the guide structure is fixedly connected with the lower die, the guide structure is used to ensure that the test piece is stretched along the axial direction;
[0008] The outer wall of the guide structure is engraved with scale along its axial direction.
[0009] According to an optional mode provided by the utility model, the guide structure is slidably matched with guide groove, the guide groove is opened on the upper die, and the axial direction of the guide groove is parallel to the axial direction of the upper die.
[0010] According to an optional mode provided by the utility model, one end of the guide structure is connected with threaded column, and the threaded column is threadedly connected with the lower die.
[0011] According to an optional mode provided by the utility model, the threaded column is threadedly connected with threaded hole, and the threaded hole is opened on the lower die.
[0012] According to an optional mode of the utility model, the top surface of the upper die and the bottom surface of the lower die are both provided with connecting holes for connecting with a testing machine.
[0013] According to an optional mode of the utility model, the bottom surface of the upper die and the top surface of the lower die are both provided with test piece grooves, and the two ends of the test piece are respectively limitedly matched in the corresponding test piece grooves.
[0014] Compared with the prior art, the utility model has the following advantages and technical effects:
[0015] The utility model discloses a kind of guiding structures of at least two circumferential equal-interval distribution between upper die and lower die, can guarantee the axis of upper and lower high-temperature clamp before and after stretching on the same straight line, eliminate the transverse shear force that clamp brings to test piece, improve the precision of experimental data.Guide structure is engraved with scale, in the stretching process, the elongation of test piece in high-temperature stretching process can be directly measured and calculated according to the scale value before and after stretching on guiding structure, further improve the convenience and accuracy of data measurement. BRIEF DESCRIPTION OF DRAWINGS
[0016] In order to more clearly illustrate the technical scheme in the embodiments of the utility model or prior art, the drawings needed to be used in the embodiments will be simply introduced below, and obviously, the drawings in the following description are only some embodiments of the utility model, and for those skilled in the art, other drawings can be obtained without creative labor under the premise of these drawings:
[0017] Figure 1 It is the structural schematic diagram of the utility model;
[0018] Figure 2 It is Figure 1 the explosion map;
[0019] Figure 3 It is the structural schematic diagram of lower die;
[0020] Among them, 1, upper die; 2, lower die; 3, guiding structure; 4, guiding groove; 5, threaded hole; 6, threaded column; 7, connecting hole; 8, test piece groove. DETAILED DESCRIPTION
[0021] The technical scheme in the embodiments of the utility model will be clearly and completely described below in conjunction with the drawings in the embodiments of the utility model, and obviously, the described embodiments are only part of the embodiments of the utility model, not all the embodiments.Based on the embodiments in the utility model, all other embodiments obtained by those skilled in the art without creative labor belong to the scope of protection of the utility model.
[0022] In order to make the above objects, features and advantages of the present application more obvious and easy to understand, the present application will be further described in detail below with reference to the drawings and specific embodiments.
[0023] Embodiment 1:
[0024] With reference to Figures 1 to 3 The embodiment discloses a high-temperature clamp, which comprises an upper die 1 and a lower die 2, two ends of a same test piece are fixed on the upper die 1 and the lower die 2, at least two circumferential guide structures 3 are arranged between the upper die 1 and the lower die 2, one end of the guide structure 3 is in sliding connection with the upper die 1, the other end of the guide structure 3 is in fixed connection with the lower die 2, and the guide structure 3 is used for ensuring that the test piece is stretched along an axial direction.
[0025] A scale line is arranged on an outer wall of the guide structure 3 along an axial direction of the guide structure 3.
[0026] The guide structure 3 of the present application can be a cylinder, a cube or other special-shaped structures, and the present application does not make any limitation in this regard. In the embodiment, the number of the guide structures 3 is two, and the guide structure 3 is a cylinder.
[0027] The present application can ensure that the axial lines of the upper and lower high-temperature clamps are on the same straight line before and after stretching, eliminate the lateral shearing force of the clamp on the test piece and improve the accuracy of experimental data by arranging at least two circumferential guide structures 3 between the upper die 1 and the lower die 2. The guide structure 3 is provided with a scale, and in the stretching process, the guide structure 3 can slide in the inner side of the guide groove 4 of the upper die 1, the elongation rate of the test piece in the high-temperature stretching process can be directly measured and calculated according to the scale values before and after stretching of the guide structure 3, and the convenience and accuracy of data measurement are further improved.
[0028] The length of the guide structure 3 is greater than the distance between the upper die 1 and the lower die 2 after the high-temperature stretched sample is broken, so as to avoid the separation of the guide structure 3 from the upper die 1 in the stretching process. The diameter of the guide structure 3 should be ensured to maintain the original shape in the stretching process (at room temperature and high temperature). The material of the guide structure 3 is a high-temperature-resistant and high-strength material, so that even if the test piece deforms in size and appearance under long-term high-temperature ring, the axial lines of the upper die 1 and the lower die 2 can be ensured to be on the same straight line, the lateral shearing force of the clamp on the test piece can be greatly reduced or even eliminated, the additional influence of the clamp on the test piece is reduced, the test piece breaking point is located within the gauge length, and the accuracy of experimental data is improved.
[0029] According to an optional embodiment of the present application, the guide structure 3 is slidably connected with a guide groove 4, the guide groove 4 is arranged on the upper die 1, and the axial direction of the guide groove 4 is parallel to the axial direction of the upper die 1.
[0030] According to an optional embodiment of the utility model provides, one end of guiding structure 3 is connected with threaded column 6, threaded column 6 is connected with lower mould 2 with screw thread.
[0031] According to an optional embodiment of the utility model provides, threaded column 6 is connected with threaded hole 5 with screw thread, and threaded hole 5 is set up on lower mould 2.
[0032] According to an optional embodiment of the utility model provides, the top surface of upper mould 1 and the bottom surface of lower mould 2 are both provided with connecting hole 7 for connecting with testing machine.
[0033] According to an optional embodiment of the utility model provides, the bottom surface of upper mould 1 and the top surface of lower mould 2 are both provided with test piece groove 8, and the two ends of the test piece are respectively limitedly matched in the corresponding test piece groove 8.
[0034] In use, the test piece is placed in the test piece groove 8, the upper mould 1 and the lower mould 2 are connected with the tensile testing machine through the connecting hole 7, and then the tensile testing machine is started, at this time, the upper mould 1, the lower mould 2 and the test piece are on the same axis due to the action of the guiding structure 3, the guiding structure 3 is fixedly connected with the lower mould 2 and slidingly connected with the upper mould 1, and the guiding structure 3 is engraved with scales, in the stretching process, the guiding structure 3 can slide in the inner side of the guide groove 4 of the upper mould 1, the elongation rate of the test piece in the high-temperature stretching process can be directly measured and calculated according to the scale values before and after stretching on the guiding structure 3, and the convenience and accuracy of data measurement are improved. After the experiment is finished, the upper mould 1 and the lower mould 2 can be combined into a whole and placed together, which can avoid the loss of single clamp and facilitate the later use.
[0035] Embodiment 2:
[0036] The difference between this embodiment and embodiment 1 is only that this embodiment does not have threaded hole 5 and threaded column 6.
[0037] The guiding structure 3 of this embodiment is a column, the lower mould 2 is provided with a through hole matched with the guiding structure 3, the bottom surface of the guiding structure 3 is fixedly connected with a cylinder, the outer wall of the cylinder is fixedly connected with a ball, an arc-shaped groove is formed in the inner wall of the through hole, the ball is clamped in the arc-shaped groove, so that the ball cannot slide out of the arc-shaped groove, when the ball is located at the side of the arc-shaped groove close to the upper mould 1, the test piece can be stretched, and when the stretching test is finished, the guiding structure 3 can be pressed downward to retract into the inner side of the through hole, which is convenient for storage.
[0038] In the description of the utility model, need understanding is, the term "longitudinal", "transverse", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer" and so on indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawing, just for the convenience of describing the utility model, and not indicate or imply that the indicated device or element must have a particular orientation, construct and operate in a particular orientation, therefore can not be understood as limiting the utility model.
[0039] The above-described embodiments are only descriptions of the preferred modes of the utility model, and do not limit the scope of the utility model, and various modifications and improvements to the technical solutions of the utility model made by those skilled in the art without departing from the design spirit of the utility model should fall within the protection scope defined by the claims of the utility model.
Claims
1. A high temperature fixture comprising an upper die (1) and a lower die (2) to which the two ends of the same test piece are fixed, characterized in that: The upper die (1) and the lower die (2) are provided with at least two circumferentially equidistantly distributed guide structures (3), one end of the guide structure (3) is in sliding connection with the upper die (1), the other end of the guide structure (3) is in fixed connection with the lower die (2), and the guide structure (3) is used for ensuring that the test piece is stretched in the axial direction. The outer wall of the guide structure (3) is provided with a scale line in the axial direction thereof.
2. A high temperature clamp as claimed in claim 1, wherein: The guide structure (3) is in sliding fit with a guide groove (4), the guide groove (4) is formed in the upper die (1), and the axial direction of the guide groove (4) is parallel to the axial direction of the upper die (1).
3. A high temperature clamp as claimed in claim 2, wherein: One end of the guide structure (3) is in shaft connection with a threaded column (6), and the threaded column (6) is in threaded connection with the lower die (2).
4. A high temperature clamp as claimed in claim 3, wherein: The threaded column (6) is in threaded connection with a threaded hole (5), and the threaded hole (5) is formed in the lower die (2).
5. The high temperature clamp of claim 1, wherein: The top surface of the upper die (1) and the bottom surface of the lower die (2) are both provided with a connecting hole (7) for connecting with a testing machine.
6. A high temperature clamp as defined in claim 1, wherein: The bottom surface of the upper die (1) and the top surface of the lower die (2) are both provided with a test piece groove (8), and the two ends of the test piece are respectively limited and fitted in the corresponding test piece grooves (8).