Integrated circuit probe testing device

Abstract

The utility model relates to the technical field of integrated circuit probe testing, and discloses an integrated circuit probe testing device, which comprises a fixed base, an upper surface of which is fixedly provided with a fixed support. The code scanning gun placing racks are symmetrically arranged on the fixed bracket; the angle adjusting structure comprises a fixed shaft, the fixed shaft penetrates through and is fixedly connected to the top end of the fixed support, and the fixed shaft is configured to support the movable support; and the movable support is arranged above the fixed support, and the two sides of the movable support are fixedly connected with connecting plates. According to the utility model, two machines at different positions can be prevented from misoperation to carry out secondary operation or misoperation, engineers do not need to run back and forth to change data in the PM process, so that the time is greatly saved, and data entry tools before production are provided with a placement area to facilitate the operation of operators; in the production process, engineers monitor real-time data, yield and operation are very convenient.

Description

TECHNICAL FIELD

[0001] The utility model relates to integrated circuit probe test technical field especially relates to a kind of integrated circuit probe testing device. BACKGROUND

[0002] The test of integrated circuit probe needs to use two kinds of equipment of test machine and probe station, test machine is composed of electronic system, these systems generate signal, establish appropriate test mode, correctly set in order, then using them to drive chip itself, and capture the output feedback of chip, or record, or compare with the feedback expected in test machine, so as to judge good and bad, the main role of probe station is to support wafer, and let every bond pad of a die in wafer can be connected to the probe of probe card, and after testing, remove the contact before, while moving wafer, replace another die to be connected to the probe of probe card again, and record the test result of each die.

[0003] Test machine and probe station are independent machine, but need to be used in combination during testing process.Due to independent equipment, there is respective monitoring platform during operation process, and machine is placed in position, so that it cannot be operated simultaneously, so some misoperation possibility is caused. UTILITY MODEL CONTENT

[0004] The utility model aims at solving the shortcomings in prior art, and proposes an integrated circuit probe testing device.

[0005] In order to achieve the above-mentioned purpose, the utility model adopts the following technical scheme: an integrated circuit probe testing device, comprising:

[0006] The upper surface of the fixed base is fixedly installed with a fixed support;

[0007] The code scanning gun placing rack is symmetrically arranged on the fixed support;

[0008] The angle adjusting structure comprises:

[0009] The fixed shaft penetrates and is fixedly connected to the top end of the fixed support, and is configured to support the movable support;

[0010] The movable support is arranged above the fixed support, and the two sides of the movable support are fixedly connected with connecting plates; The movable support is configured to drive the angle adjustment of the tester computer.

[0011] An angle adjusting screw is screwed on the fixed shaft, and is configured to limit the angle of the movable support;

[0012] The test result display assembly comprises:

[0013] A detector computer is fixedly connected to the front surface of the fixed support, and is configured to display the detection position and the detection result;

[0014] A tester computer is fixedly connected to the front surface of the movable support, and is configured to display the test data and the test result.

[0015] Further to the above technical solution, the fixed support is of a hollow structure, and a groove structure is formed on the fixed shaft.

[0016] Further to the above technical solution, the angle adjusting screw is arranged inside the groove structure on the fixed shaft.

[0017] Further to the above technical solution, the fixed support further comprises a groove structure formed on the front surface of the fixed support, and the groove structure on the fixed support is configured to place a touch screen pen.

[0018] Further to the above technical solution, the fixed shaft penetrates through a connecting plate, and the connecting plate is rotationally connected to the fixed shaft.

[0019] The utility model has the advantages of:

[0020] 1. In the utility model, the two machines at different positions can be prevented from being operated again or misoperated by personnel, the engineering personnel do not need to run back and forth to change data during the PM process, time is greatly saved, the data input tool before production has a placement area to facilitate the operation of the operator, and the engineering personnel can monitor the real-time data, yield, and operation during the production process.

[0021] 2. In the utility model, the original support of the Prober is removed, and a new tool is replaced, two machines are integrated to form an equipment group, the hollow support can well support and facilitate the storage of the wire harness, the additional operation time is reduced, the computer angle can be adjusted to consider the comfort of different personnel operations, the design plays a good foolproof function, saves time, and is convenient for operation and monitoring. BRIEF DESCRIPTION OF DRAWINGS

[0022] Fig. 1 A perspective view of an integrated circuit probe test device is provided for the utility model;

[0023] Fig. 2Part of the integrated circuit probe testing device explosion map is provided.

[0024] Legend:

[0025] 1, fixed base; 2, fixed support; 3, detector computer; 4, code scanning gun rack; 5, fixed shaft; 6, movable support; 7, connecting plate; 8, angle adjusting screw; 9, tester computer. DETAILED DESCRIPTION

[0026] The technical scheme in the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the present application.

[0027] Reference Figs. 1-2 , the present application provides an embodiment: an integrated circuit probe testing device, comprising:

[0028] The fixed base 1 is fixedly installed with the fixed support 2 on the upper surface, the two sides of the fixed support 2 can be designed with handles, which is convenient for carrying and adjusting position, the fixed base 1 is divided into upper surface and lower surface, the upper surface of the fixed base 1 can be used to place the keyboard of the detector computer 3 and the tester computer 9, the fixed base 1 can adopt a material which is firm and durable, such as aluminum alloy or high-strength plastic, to ensure stability, the lower surface of the fixed base 1 can be designed with anti-skid pads to increase stability, the fixed base 1 can be designed with adjustable foot pads to adapt to the height of different workbench surfaces, or not be provided;

[0029] The code scanning gun rack 4 is symmetrically arranged on the fixed support 2 and used for placing the equipment matched with the detector computer 3 for use;

[0030] The angle adjusting structure comprises:

[0031] The fixed shaft 5 penetrates and is fixedly connected to the top end of the fixed support 2, and the fixed shaft 5 is configured to support the movable support 6;

[0032] The movable support 6 is arranged above the fixed support 2, and the two sides of the movable support 6 are fixedly connected with the connecting plates 7, the angle of the movable support 6 is limited by the friction force between the connecting plates 7 and the inner surface of the end head of the angle adjusting screw 8, and the movable support 6 is configured to drive the tester computer to adjust the angle;

[0033] An angle adjusting screw 8 is threadedly connected to the fixed shaft 5, and is configured to limit the angle of the movable bracket 6.

[0034] The test result shows that the assembly comprises:

[0035] A detector computer 3 is fixedly connected to the front surface of the fixed bracket 2, and is configured to display the detection position and the detection result.

[0036] A tester computer 9 is fixedly connected to the front surface of the movable bracket 6, and is configured to display the test data and the test result.

[0037] The detector computer 3 and the tester computer 9 can be designed as touch screens, and can be used with a touch screen pen. The fixed bracket 2 has a hollow structure, so that the lines connecting the detector computer 3 and the tester computer 9 can pass through the inside of the fixed bracket 2. The fixed shaft 5 is provided with a slot structure.

[0038] The angle adjusting screw 8 is arranged in the slot structure on the fixed shaft 5. The angle adjusting screw 8 adjusts its position by rotating, so as to limit the angle of the movable bracket 6 or release the limitation of the angle of the movable bracket 6.

[0039] The fixed bracket 2 further comprises a slot structure arranged on the front surface of the fixed bracket 2, and the slot structure on the fixed bracket 2 is configured to place the touch screen pen. The slot structure arranged on the front surface of the fixed bracket 2 can be designed to have magnetism, so as to ensure that the touch screen pen will not be accidentally dropped.

[0040] The fixed shaft 2 penetrates the connecting plate 7, and the connecting plate 7 is rotatably connected to the fixed shaft 2.

[0041] When the movable bracket 6 can be adjusted in angle, the inner surface of the end position of the angle adjusting screw 8 is separated from the outer surface of the connecting plate 7. After the angle of the movable bracket 6 is fixed, the inner surface of the end position of the angle adjusting screw 8 is in contact with the outer surface of the connecting plate 7.

[0042] Working principle: the control detector computer 3 and the keyboard of tester computer 9 are placed on the upper surface of the fixed base 1 for use, the circuit required for the normal operation of the detector computer 3 and the tester computer 9 is connected through the hollow structure of the fixed support 2 and the detector computer 3 and the tester computer 9, then, the detector computer 3 and the tester computer 9 are started for use, when the angle of the tester computer 9 needs to be adjusted, the worker can manually rotate the angle adjusting screw 8, so that the inner surface at the end of the angle adjusting screw 8 is separated from the outer surface of the connecting plate 7, at this time, the movable support 6 can normally rotate, the worker manually adjusts the angle of the movable support 6, so as to realize the angle adjustment of the tester computer 9, after the adjustment is completed, the worker manually reverses the angle adjusting screw 8, so that the angle adjusting screw 8 is reset and the angle of the tester computer 9 is fixed again, the above is the working process of the device.

[0043] Finally, it should be noted that: the above only for the preferred embodiments of the present application, and not for limiting the present application, although the present application has been described in detail with reference to the foregoing embodiments, for those skilled in the art, it still can be modified to the technical solutions recorded in the foregoing embodiments, or equivalent replacement for part of the technical features, any modification, equivalent replacement, improvement, etc. made within the spirit and principles of the present application, should be included in the protection scope of the present application.

Claims

1. An integrated circuit probe testing apparatus, characterized by comprising: Including: The upper surface of the fixed base (1) is fixedly installed with a fixed support (2); The code scanning gun placing rack (4) is symmetrically arranged on the fixed support (2); The angle adjusting structure comprises: The fixed shaft (5) penetrates and is fixedly connected to the top end of the fixed support (2), and is configured to support the movable support (6); The movable support (6) is arranged above the fixed support (2), and both sides of the movable support (6) are fixedly connected with the connecting plates (7), and the movable support (6) is configured to drive the tester computer to adjust the angle; The angle adjusting screw (8) is threadedly connected on the fixed shaft (5), and is configured to limit the angle of the movable support (6); The test result display assembly comprises: The detector computer (3) is fixedly connected to the front surface of the fixed support (2), and is configured to display the detection position and the detection result; The tester computer (9) is fixedly connected to the front surface of the movable support (6), and is configured to display the test data and the test result.

2. The integrated circuit probe testing apparatus of claim 1, wherein: The fixed support (2) is a hollow structure, and a groove structure is formed on the fixed shaft (5).

3. The integrated circuit probe testing apparatus of claim 1, wherein: The angle adjusting screw (8) is arranged in the groove structure on the fixed shaft (5).

4. The integrated circuit probe testing apparatus of claim 1, wherein: The fixed support (2) further comprises a groove structure formed in the front surface of the fixed support (2), and the groove structure on the fixed support (2) is configured to place a touch pen.

5. The integrated circuit probe testing apparatus of claim 1, wherein: The fixed shaft (2) penetrates the connecting plate (7), and the connecting plate (7) is rotatably connected with the fixed shaft (2).

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