High-frequency test power supply capacitor aging protection circuit

Abstract

The utility model discloses an aging protection circuit for a high-frequency test power supply capacitor, which belongs to the technical field of aging protection circuits for capacitors, a load capacitor is formed by connecting a plurality of groups of capacitors in series, and each group of capacitors is formed by connecting cathodes of two electrolytic capacitors and leading out two anodes. The test equipment capacitor aging protection circuit comprises a plurality of relays A and inductors. The head end and the tail end of a normally open contact of each relay are connected with each group of capacitors in an end-to-end manner. The cathode of each group of capacitors is connected in series with a current sampling resistor to detect the DC leakage current value of each group of capacitors. The positive electrode of each group of capacitors is connected with the positive electrode of a direct-current power supply through an inductor, and the negative electrode of the direct-current power supply is connected with one end of the negative electrode of each group of capacitors through a leakage current sampling resistor. The device of the utility model can realize continuous and adjustable frequency of 1kHz-2MHz, can realize alternating current output power of dozens of watts to hundreds of kilowatts, and can work stably for a long time.

Description

TECHNICAL FIELD

[0001] The utility model relates to a capacitor aging protection circuit, in particular to a high frequency test power supply capacitor aging protection circuit belongs to capacitor aging protection circuit technical field. BACKGROUND

[0002] China is the world's first capacitor production country, capacitor in circuit main function is filter and the effect such as direct current isolation, just its physical meaning is repeatedly to capacitor charging and discharging, the more the speed and times of such charging and discharging, the greater capacitor's internal heat also, the accumulation of such heat will make capacitor internal temperature too high and affect capacitor internal material's electric property, when certain capacitor is aged open circuit in test, lead to other series capacitor no current, thereby cannot continue aging test, lead to test forcedly stop, for this design a kind of high frequency test power supply capacitor aging protection circuit to solve the above problems. UTILITY MODEL CONTENTS

[0003] The utility model discloses a high frequency test power supply capacitor aging protection circuit, load capacitor is connected by several groups of capacitors in series, and each group of capacitors is connected by two negative poles of electrolytic capacitor and negative pole, and two positive poles are led out.Capacitor aging protection circuit of test equipment includes several relays A and inductance, and the first and last ends of the common open contact of each relay are connected with the first and last ends of each group of capacitors.The negative pole of each group of capacitors is connected with a current sampling resistance in series, and the direct current leakage current value of each group of capacitors is detected.The positive pole of each group of capacitors is connected with the positive pole of a direct current power supply through an inductance, and the negative pole of the direct current power supply is connected with one end of the negative pole of each group of capacitors through a leakage current sampling resistance.The equipment of the patent can realize 1kHz-2MHz frequency continuous adjustable, realize dozens of watts to hundreds of kilowatt ac output power, and can work stably for a long time.

[0004] The utility model discloses a high frequency test power supply capacitor aging protection circuit, including customer measured capacitor, adjustable ac power supply and adjustable direct current power supply;

[0005] A high frequency test power supply capacitor aging protection circuit, including customer measured capacitor, adjustable ac power supply and adjustable direct current power supply;

[0006] Customer measured capacitor coupling inductance group, resistance group and relay group;

[0007] Customer measured capacitor is connected with adjustable ac power supply directly, and customer measured capacitor is connected with adjustable direct current power supply through inductance group and resistance group.

[0008] Preferably, customer measured capacitor includes multiple capacitor groups, and each capacitor group is composed of two polar capacitors in series, one cathode of polar capacitor is connected with another cathode of polar capacitor, anodes of different capacitor groups are connected with each other, and cathodes of the same capacitor group are connected with resistance group.

[0009] Preferably, the resistor group consists of resistors R1 to Rn, with one end of each resistor connected to the other and electrically connected to the negative terminal of the adjustable DC power supply.

[0010] The other ends of resistors R1 to Rn are connected to the negative terminals of each capacitor bank in the customer's tested capacitor bank, respectively.

[0011] Preferably, the relay group includes relays J1E to JnE;

[0012] The anode of each capacitor bank is connected to relays J1E to JnE respectively.

[0013] Preferably, the inductor group includes inductors L1 to Ln;

[0014] The anode of each capacitor bank is connected to each inductor L1 to inductor Ln;

[0015] The other ends of inductors L1 to Ln are electrically connected to the anode of an adjustable DC power supply.

[0016] The beneficial technical effects of this utility model are as follows:

[0017] This invention provides a high-frequency test power supply capacitor aging protection circuit. The load capacitor consists of several groups of capacitors connected in series. Each group of capacitors is formed by connecting the negative terminals of two electrolytic capacitors together, with the two positive terminals leading out. The capacitor aging protection circuit of the test equipment includes several relays A and an inductor. The normally open contacts of each relay are connected to the beginning and end of each group of capacitors. A current sampling resistor is connected in series with the negative terminal of each group of capacitors to detect the DC leakage current value of each group of capacitors. The positive terminal of each group of capacitors is connected to the positive terminal of a DC power supply through an inductor. The negative terminal of the DC power supply is connected to one end of the negative terminal of each group of capacitors through a leakage current sampling resistor. This patented equipment can achieve continuously adjustable frequency from 1kHz to 2MHz, realize AC output power from tens of watts to hundreds of kilowatts, and can operate stably for a long time. Attached Figure Description

[0018] Figure 1 This is a circuit diagram of a preferred embodiment of a high-frequency test power supply capacitor aging protection circuit according to the present invention. Detailed Implementation

[0019] To enable those skilled in the art to understand the technical solution of this utility model more clearly, the present utility model will be further described in detail below with reference to the embodiments and accompanying drawings, but the implementation of this utility model is not limited thereto.

[0020] like Figure 1 As shown in the figure, this embodiment provides a high-frequency test power supply capacitor aging protection circuit, including a customer's tested capacitor, an adjustable AC power supply, and an adjustable DC power supply.

[0021] The customer to be measured capacitor is connected with the adjustable AC power supply directly through the capacitor group, and is connected with the adjustable DC power supply through the inductor group and the resistor group.

[0022] The customer to be measured capacitor is connected with the adjustable AC power supply directly through the capacitor group, and is connected with the adjustable DC power supply through the inductor group and the resistor group.

[0023] The other end of the resistor R1 to Rn is connected with the negative pole of each capacitor group in the customer to be measured capacitor respectively, and the relay group includes the relay J1E to the relay JnE.

[0024] The positive pole of each capacitor group is connected with the relay J1E to the relay JnE respectively, and the inductor group includes the inductor L1 to the inductor Ln.

[0025] The positive pole of each capacitor group is also connected with each inductor L1 to the inductor Ln.

[0026] The other end of the inductor L1 to the inductor Ln is connected with the positive pole of the adjustable DC power supply.

[0027] The working principle of the AC loop is as follows:

[0028] The negative poles of the electrolytic capacitors C1 and C2 are connected to form the first capacitor group, the negative poles of the electrolytic capacitors C3 and C4 are connected to form the second capacitor group, and the negative poles of the electrolytic capacitors Cn and Cn+1 are connected to form the Nth capacitor group.

[0029] The customer applies an AC current to the capacitors for a long time to simulate the service life of the electrolytic capacitors, and the normal aging time is 1000-5000 hours.

[0030] A normally open relay contact is connected in parallel across each set of capacitors, when an open circuit occurs in one of the electrolytic capacitors in a set, the detection circuit detects that an open circuit occurs in the set of capacitors, and the single-chip microcomputer sends a command to close the relay contact connected in parallel across the set of capacitors, so that the entire capacitor string loop forms a closed loop again, and the other sets of normal capacitors continue to flow through the set AC current and continue to age.

[0031] The above is only further embodiments of the present application, but the protection scope of the present application is not limited thereto, any person skilled in the art within the scope disclosed by the present application, according to the technical scheme and concept of the present application, equivalent replacement or change, all belong to the protection scope of the present application.

Claims

1. A high-frequency test power supply capacitor aging protection circuit, characterized in that: The customer measured capacitor, the adjustable AC power supply and the adjustable DC power supply are included; The customer measured capacitor is coupled with the inductance group, the resistance group and the relay group; The customer measured capacitor is directly connected with the adjustable AC power supply, and the customer measured capacitor is connected with the adjustable DC power supply through the inductance group and the resistance group.

2. The high-frequency test power supply capacitor aging protection circuit according to claim 1, characterized in that: The customer measured capacitor includes multiple capacitor groups, each capacitor group is composed of two polarized capacitors connected in series, the cathode of one polarized capacitor is connected with the cathode of another polarized capacitor, the anodes of different capacitor groups are connected with each other, and the cathodes of the same capacitor group are connected with the resistance group.

3. The high-frequency test power supply capacitor aging protection circuit according to claim 2, characterized in that: The resistance group is composed of resistors R1 to Rn, one end of the resistors R1 to Rn is connected with each other and connected with the negative electrode of the adjustable DC power supply; The other end of the resistors R1 to Rn is connected with the negative electrode of each capacitor group in the customer measured capacitor.

4. The high-frequency test power supply capacitor aging protection circuit according to claim 3, characterized in that: The relay group includes relays J1E to JnE; The anode of each capacitor group is connected with the relays J1E to JnE.

5. The high-frequency test power supply capacitor aging protection circuit according to claim 4, characterized in that: The inductance group includes inductors L1 to Ln; The anode of each capacitor group is also connected with each inductor L1 to Ln; The other end of the inductors L1 to Ln is connected with the positive electrode of the adjustable DC power supply.

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