Probe current resistance testing device

Abstract

The utility model discloses a probe current resistance testing device. According to the scheme, the probe current resistance testing device comprises a testing seat and a force measuring assembly which are arranged on a working plate, and a CCD camera is arranged beside the testing seat; the testing seat and the probe are placed on the positioning mold, the temperature measuring assembly is arranged beside the positioning mold, and the upper adjusting assembly and the lower adjusting assembly drive the first conductive copper column to reciprocate on the working plate; the two ends of the second conductive copper column and the first conductive copper column on the force measuring assembly are connected to the positive electrode and the negative electrode of the power source respectively and make electrical contact with the two sides of the probe to form an access. According to the adjusting assembly provided by the scheme, the problem of slow adjustment in the prior art is solved, the position of the adjusting base can be coarsely adjusted and finely adjusted through the combination of the first adjusting assembly and the second adjusting assembly, and the testing efficiency is improved.

Description

Technical Field

[0001] This solution relates to the field of probe testing technology, and in particular to a probe current withstand testing device. Background Technology

[0002] Semiconductor test probes are primarily used in chip design verification, wafer testing, and finished semiconductor product testing. They play a crucial role in connecting chips / wafers to testing equipment and transmitting signals, making them essential for quality control of semiconductor products. Probes are typically formed by precision instruments through riveting and pre-pressing, and consist of four basic components: the probe tip, the probe tail, the spring, and the outer tube.

[0003] To ensure the electrical performance of the probe, its current withstand value needs to be accurately measured. The current withstand value of a probe is typically assessed when it melts (no longer capable of transmitting electrical signals), i.e., the probe surface shows obvious discoloration or the probe is burned out. However, under strict specifications, before the probe reaches its current withstand value, the probe's own power must also be considered, i.e., whether the heat generated by the probe is within the specified temperature range. When the specified temperature range is reached, the actual current withstand value of the probe is determined by the actual current passing through it.

[0004] In the prior art, Chinese Patent Publication No. CN112986776B, published on August 6, 2021, entitled "A Manual Spring Needle Testing Device and Current Withstand Test Method," discloses a base and a clamping assembly arranged on the base. The base includes: a fixed first testing part, a movable second testing part, and a travel part that receives external force and pushes the second testing part. The first testing part includes a first contact end that is electrically in contact with one end of the probe in the axial direction of the probe. The second testing part includes a second contact end that is electrically in contact with the other end of the probe in the axial direction of the probe. The first and second contact ends are simultaneously connected to a buzzer for circuit continuity alarm. The second testing part is arranged on a guide member. The guide member is linearly displaced along the axial direction of the probe on the clamping assembly. The travel part includes a micrometer head with a spiral micrometer. The micrometer end of the micrometer head abuts against the second testing part and pushes the second testing part to move slightly along the guide member. The second testing part is elastically tensioned with the travel part in the displacement direction by an elastic member. Its drawback is that the thickness of different models of test probes varies greatly, and adjusting the base using only a micrometer is extremely slow, resulting in very low testing efficiency.

[0005] Therefore, a probe current withstand test device is needed, which can quickly adjust the base position before testing probes of different sizes to improve testing efficiency. Summary of the Invention

[0006] To address the aforementioned issues, this solution provides a probe current withstand testing device.

[0007] To achieve the above objectives, the technical solution adopted in this solution is: a probe current withstand test device, including a test seat and a force measuring component on a working plate, with a CCD camera installed next to the test seat;

[0008] The test fixture has a probe placed on a positioning mold, a temperature measuring component set next to the positioning mold, and two upper and lower adjustment components that drive the first conductive copper column to move back and forth on the working plate.

[0009] The two ends of the second conductive copper pillar and the first conductive copper pillar on the force measuring component are respectively connected to the positive and negative terminals of the power supply, forming a circuit with the two sides of the probe.

[0010] Furthermore, a first limiting groove is provided on the top surface of the working plate, a first connecting block is limited in the first limiting hole of the first limiting groove, a first limiting rod at the bottom of the first connecting block is limited in the first limiting hole, and a first slider at the bottom of the test seat is slidably connected above.

[0011] Furthermore, the test seat includes a base, a second limiting hole is provided on the side of the base, and a third limiting hole is included in the second limiting groove in the middle of the upper groove.

[0012] Furthermore, the adjusting rod that slides within the adjusting seat is limited within the second limiting hole.

[0013] Furthermore, the second limiting rod at the bottom of the second connecting block is limited in the third limiting hole, the second slider is slidably connected above the second connecting block, and the first limiting seat is fixed by the connecting plate at the top of the second slider.

[0014] Furthermore, a first conductive copper post is positioned within the first limiting seat, and one end of the first conductive copper post is connected to a first micrometer positioned within the second limiting seat.

[0015] Furthermore, the positioning mold includes a positioning seat fixed on the base, and a probe positioning fixture is fixed on the top of the positioning seat.

[0016] Furthermore, the probe positioning fixture includes a probe bracket on a chassis, and the top of the probe bracket has gradually increasing recesses evenly distributed.

[0017] Furthermore, in the temperature measuring assembly, the temperature measuring base limits the second micrometer to be fixed on the top of the side of the base, and the temperature measuring wire is wound on the adjusting screw of the second micrometer, and the temperature measuring wire contacts the probe.

[0018] In summary, this solution has the following advantages:

[0019] The adjustment components provided in this solution overcome the problem of slow adjustment in the prior art. By combining the first adjustment component and the second adjustment component, the position of the adjustment base can be coarsely and finely adjusted, thereby improving testing efficiency. Attached Figure Description

[0020] Figure 1 This is a schematic diagram of the probe withstand current testing device;

[0021] Figure 2 This is a schematic diagram of the work board;

[0022] Figure 3 This is a schematic diagram of the test socket;

[0023] Figure 4 This is a schematic diagram of the base;

[0024] Figure 5 This is a schematic diagram of the adjustment components;

[0025] Figure 6 This is a schematic diagram of the positioning mold.

[0026] in:

[0027] 100. Working plate; 110. First limiting groove; 111. First limiting hole; 120. First connecting block; 121. First limiting rod;

[0028] 200. Test socket;

[0029] 210. Base; 211. Second limiting hole; 212. Second limiting groove; 2121. Third limiting hole; 213. First slider;

[0030] 220. Adjustment assembly; 221. Adjustment seat; 2211. Adjustment hole; 222. Adjustment rod; 223. Second connecting block; 2231. Second limiting rod; 224. Second slider; 2241. Connecting plate; 225. First conductive copper pillar; 2251. First limiting seat; 226. First micrometer; 2261. Second limiting seat;

[0031] 230. Positioning mold; 231. Positioning seat; 232. Probe positioning fixture; 2321. Probe bracket; 2322. Recess;

[0032] 240. Temperature measuring assembly; 241. Temperature measuring base; 242. Second micrometer; 2421. Adjusting screw; 243. Temperature measuring circuit;

[0033] 300. Force measuring component; 310. Force measuring device; 320. Second conductive copper column. Detailed Implementation

[0034] The present solution will be further described below with reference to the accompanying drawings and embodiments:

[0035] Example 1:

[0036] A probe withstand current testing device, such as Figure 1-6 As shown, the device includes a test stand 200 and a force measuring component 300 on a work plate 100, with a CCD camera positioned next to the test stand 200.

[0037] like Figure 1 and Figure 2 As shown, the top surface of the working plate 100 is provided with a first limiting groove 110, the first limiting hole 111 of the first limiting groove 110 limits the first connecting block 120, the first limiting rod 121 at the bottom of the first connecting block 120 is limited in the first limiting hole 111, and the first slider 213 at the bottom of the test seat 200 is slidably connected above.

[0038] like Figure 1 and Figure 3-6 As shown, the test stand 200 includes an adjustment component 220, a positioning mold 230, and a temperature measuring component 240 on a base 210.

[0039] In this solution, the adjustment component 220 overcomes the problem of slow adjustment in the prior art. By combining the first adjustment component and the second adjustment component, the position of the adjustment base can be coarsely and finely adjusted, thereby improving testing efficiency.

[0040] like Figure 3 As shown, the base 210 has an "H" shaped structure, with a second limiting hole 211 on the side for limiting the first adjustment component, and a third limiting hole 212 in the second limiting groove 212 in the middle of the upper groove for limiting the second adjustment component.

[0041] The first adjustment component has an adjustment seat 221 fixed next to the first limiting groove 110, and an adjustment rod 222 inserted into the adjustment hole 2211 of the adjustment seat 221 and limited within the second limiting hole 211. The adjustment rod 222 can slide within the adjustment seat 221.

[0042] Specifically, the sliding adjustment rod 222 drives the base 210 to slide on the first connecting block 120.

[0043] The second adjustment component has a second limiting rod 2231 at the bottom of the second connecting block 223 that is limited within the third limiting hole 2121. The second slider 224 is slidably connected above the second connecting block 223. The first limiting seat 2251 is fixed by the top connecting plate 2241 of the second slider 224. The first conductive copper column 225 is limited within the first limiting seat 2251.

[0044] One end of the first conductive copper pillar 225 is connected to the screw of the first micrometer 224, and the other end is in electrical contact with one end of the probe.

[0045] The first micrometer 226 is limited within the second limiting seat 2261, and the bottom of the second limiting seat 2261 is fixed to the top of the base 210.

[0046] Specifically, when the screw of the first micrometer 226 is adjusted forward, it pushes the first conductive copper column 225 to slide on the second connecting block 223 in conjunction with the second slider 224 below the first limit seat 2251. During this process, the first conductive copper column 225 can move forward smoothly until it reaches the designated position.

[0047] The positioning mold 230 and the positioning seat 231 are fixed in the groove above the base 210. The top of the positioning seat 231 is fixed with a probe positioning fixture 232. The probe positioning fixture 232 includes a probe bracket 2321 on the chassis. The top of the probe bracket 2321 has gradually increasing recesses 2322 evenly distributed. The recesses 2322 can limit probes of different models.

[0048] A temperature measuring component 240 is provided on the side of the positioning base 231. The temperature measuring base 241 limits the second micrometer 242 to be fixed on the top of the side of the base 210. A temperature measuring wire 243 is wound on the adjusting screw 2421 of the second micrometer 242. The temperature measuring wire 243 contacts the probe and is used to test the temperature of the probe.

[0049] Specifically, one end of the temperature measuring line 243 is connected to the temperature control sensor, and the other end is wrapped around the second micrometer 242. By adjusting the second micrometer 242, the length of the temperature measuring line 243 can be adjusted to adapt to different probe models.

[0050] The force measuring component 300 is fixed on the working plate 100, and a second conductive copper pillar 320 is fixed on one side of the force measuring device 310. The second conductive copper pillar 320 is in electrical contact with the other end of the probe.

[0051] The first conductive copper pillar 225 and the second conductive copper pillar 320 are respectively connected to positive and negative electrodes. When they come into contact with the probe at the same time, a circuit is formed. During the test, the current range of qualified products is about 3 to 4A.

[0052] The force measuring device 310 in this embodiment is a force measuring instrument, and its working principle is a common technology in the field, which will not be described in detail.

[0053] When testing a 20g probe, its usage mechanism is further explained:

[0054] S1, Adjust the probe

[0055] Select a recess 2322 of suitable size and place the probe inside the recess 2322. One end of the probe contacts the second conductive copper pillar 320, while the force measuring device 310 is zeroed.

[0056] S2, Adjust the test seat

[0057] The sliding adjustment rod 222 drives the base 210 to slide on the first connecting block 120 to make a coarse adjustment to the distance from the first conductive copper column 225 to the probe. When the first conductive copper column 225 is close to the probe, the first micrometer 226 is adjusted. The screw of the first micrometer 226 moves forward and pushes the first conductive copper column 225 to slide on the second connecting block 223 in conjunction with the second slider 224 below the first limit seat 2251 to make a fine adjustment to the distance from the first conductive copper column 225 to the probe. The forward movement stops when the probe between the first conductive copper column 225 and the second conductive copper column 320 receives a force of 20g.

[0058] S3, Power-on temperature measurement

[0059] The length of the temperature measuring line 243 is controlled by adjusting the second micrometer 242. The temperature measuring line 243 is placed on the probe to test the temperature of the probe.

[0060] The first conductive copper post 225 and the second conductive copper post 320 are connected to the positive and negative terminals of the power supply, and a circuit is formed after the first conductive copper post 225 stops contacting the probe.

[0061] S4. Observation Record

[0062] If the probe temperature is <100℃ and the probe does not change color when observed with a CCD camera, then the test is qualified.

[0063] Slide the adjusting rod 222 away, move the first conductive copper post 225 away, and remove the probe.

[0064] In summary, the adjustment component provided in this application overcomes the problem of slow adjustment in the prior art. By combining the first adjustment component and the second adjustment component, the position of the adjustment base can be coarsely and finely adjusted, thereby improving testing efficiency.

[0065] The above embodiments are only for illustrating the technical concept and features of this solution, and are intended to enable those skilled in the art to understand the content of this solution and implement it accordingly. They should not be used to limit the scope of protection of this solution. All equivalent transformations or modifications made in accordance with the spirit and essence of this solution should be included within the scope of protection of this solution.

[0066] In the description of this solution, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation", "connection" and "connection" should be interpreted broadly. For example, they can be fixed connections, detachable connections, or integral connections; they can be mechanical connections or electrical connections; they can be direct connections or indirect connections through an intermediate medium; and they can be internal connections between two components.

[0067] Those skilled in the art can understand the specific meaning of the above terms in this solution based on the specific circumstances.

[0068] It should be understood that the above-described embodiments are merely exemplary and not restrictive. Any obvious or equivalent modifications or substitutions made by those skilled in the art regarding the above details without departing from the basic principles of this solution will be included within the scope of protection of this solution.

Claims

1. A probe withstand current testing device, characterized in that: Includes a test stand (200) and a force measuring assembly (300) on a work plate (100), with a CCD camera disposed next to the test stand (200); The test stand (200) has a probe placed on a positioning mold (230), a temperature measuring component (240) set next to the positioning mold (230), and two upper and lower adjustment components (220) drive the first conductive copper column (225) to move back and forth on the working plate (100). The two ends of the second conductive copper pillar (320) and the first conductive copper pillar (225) on the force measuring component (300) are respectively connected to the positive and negative terminals of the power supply, forming a circuit with the two sides of the probe.

2. The probe withstand current testing device according to claim 1, characterized in that: The top surface of the working plate (100) is provided with a first limiting groove (110), the first limiting hole (111) of the first limiting groove (110) limits the first connecting block (120), the first limiting rod (121) at the bottom of the first connecting block (120) is limited in the first limiting hole (111), and the first slider (213) at the bottom of the test seat (200) is slidably connected above.

3. The probe withstand current testing device according to claim 2, characterized in that: The test stand (200) includes a base (210), a second limiting hole (211) is provided on the side of the base (210), and a third limiting hole (2121) is provided in the second limiting groove (212) in the middle of the upper groove.

4. The probe withstand current testing device according to claim 3, characterized in that: The adjusting rod (222) that slides within the adjusting seat (221) is limited in the second limiting hole (211).

5. The probe withstand current testing device according to claim 3, characterized in that: The second limiting rod (2231) at the bottom of the second connecting block (223) is limited in the third limiting hole (2121), and the second slider (224) is slidably connected above the second connecting block (223). The first limiting seat (2251) is fixed by the top connecting plate (2241) of the second slider (224).

6. The probe withstand current testing device according to claim 5, characterized in that: The first limiting seat (2251) limits the first conductive copper post (225), and one end of the first conductive copper post (225) is connected to the first micrometer (226) limited inside the second limiting seat (2261).

7. The probe withstand current testing device according to claim 1, characterized in that: The positioning mold (230) includes a positioning seat (231) fixed on the base (210), and a probe positioning fixture (232) is fixed on the top of the positioning seat.

8. The probe withstand current testing device according to claim 7, characterized in that: The probe positioning fixture (232) includes a probe bracket (2321) on a chassis, and the top of the probe bracket (2321) has gradually increasing recesses (2322) evenly distributed.

9. The probe withstand current testing device according to claim 1, characterized in that: The temperature measuring component (240) has a temperature measuring base (241) that limits the second micrometer (242) to be fixed on the top of the side of the base (210). The temperature measuring wire (243) is wound on the adjusting screw (2421) of the second micrometer (242) and the temperature measuring wire (243) contacts the probe.

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