Multifunctional test board for testing integrated circuit
By designing an integrated circuit test bench with rotating and pushing components, the problem of batch testing that cannot be achieved in existing technologies has been solved, enabling efficient testing of circuit boards.
Patent Information
- Application Number
- CN202422327131.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-24
- Publication Date
- 2025-11-11
- Estimated Expiration
- 2034-09-24
AI Technical Summary
Existing integrated circuit test benches cannot perform batch testing, resulting in low testing efficiency.
A multifunctional test bench including a base plate, a support plate, and a testing device was designed. The batch flipping and testing of circuit boards is realized through the rotation component and the push component. The fixing and flipping of multiple circuit boards are realized by the cooperation of the rotating rod, the limiting plate and the threaded rod.
This enabled batch testing of circuit boards, improving testing efficiency.
Smart Images
Figure CN223538950U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of integrated circuit testing technology, and in particular to a multifunctional test bench for integrated circuit testing. Background Technology
[0002] Integrated circuits are usually mounted on integrated circuit boards. When testing integrated circuits, it is necessary to check the firmness of the electrical components soldered to the integrated circuit board.
[0003] Existing patent CN217305241U3 describes a multi-functional test bench for integrated circuit testing. By installing vibration motors on all four sides of the mounting plate, the vibration motors test the stability of electrical components when the integrated circuit board is placed upside down, improving the uniformity of vibration on all four sides of the mounting plate. The first drive mechanism drives the rotating ring to rotate 90 degrees so that the integrated circuit board is perpendicular to the table panel, which facilitates testing the shock resistance of electrical components when the integrated circuit board is placed vertically. The second drive mechanism is activated to rotate the mounting plate and the integrated circuit board, which facilitates testing the shock resistance of electrical components on the integrated circuit board when different sides face the table panel.
[0004] However, when using a multi-functional test bench for integrated circuit testing, which is currently in patented form, the device can only test one circuit board at a time and cannot perform batch testing, resulting in low testing efficiency for integrated circuit boards. Utility Model Content
[0005] The purpose of this invention is to provide a multifunctional test bench for integrated circuit testing, which solves the problem that the aforementioned device can only test one circuit board at a time when testing integrated circuit boards, and cannot perform batch testing, resulting in low testing efficiency of integrated circuit boards.
[0006] To achieve the above objectives, this utility model provides a multifunctional test bench for integrated circuit testing, including a base plate and a support plate. The support plate is fixedly mounted on the base plate. The test bench also includes a detection device, comprising a base, a slide rod, a limiting plate, a top seat, a rotating rod, a pushing assembly, and a rotating assembly. The rotating rod is rotatably mounted on the support plate via the rotating assembly. The base is fixedly mounted on the rotating rod and has a threaded hole. The top seat is rotatably mounted on the base and has a buffer pad inside. A locking bolt is also provided on one side of the top seat. The slide rod is fixedly mounted inside the base, the limiting plate is slidably mounted on the slide rod, and the pushing assembly is mounted on the base.
[0007] The rotating assembly includes a first gear and a driving component. The first gear is fixedly mounted on the rotating rod, and the driving component drives the first gear to rotate.
[0008] The driving component includes a second gear and a motor, with the motor fixedly mounted on the support plate; the second gear is fixedly mounted on the output shaft of the motor and meshes with the first gear.
[0009] The pushing assembly includes a threaded rod and a rotating cap, wherein the threaded rod is threaded through the base; and the rotating cap is fixedly mounted on the threaded rod.
[0010] The detection device further includes a support assembly, which includes a support ring and a connecting rod. The connecting rod is fixedly mounted on the support plate. The support ring is fixedly mounted on the connecting rod and is rotatably connected to the rotating rod.
[0011] This utility model discloses a multifunctional test bench for integrated circuit testing. In use, multiple circuit boards to be tested are placed inside the base, with each circuit board positioned between two sets of limiting plates. The rotating cap is then rotated, causing the threaded rod to rotate. The threaded rod moves along the interior of the base through its threaded engagement with the base. This movement of the threaded rod pushes the limiting plates to move, causing them to slide along the sliding rod. Under the clamping of the multiple limiting plates, the multiple circuit boards are fixed inside the base. The top seat is then closed, bringing the buffer pad inside the top seat into contact with the top of the circuit boards. The top seat is then fixed to the base using locking bolts. The motor is then started, driving the second gear to rotate. The second gear meshes with the first gear, which in turn drives the base and the circuit boards inside the base to rotate rapidly around the axis of the rotating rod. This process detects the soldering stability of electrical components, enabling batch testing of circuit boards and improving testing efficiency. Attached Figure Description
[0012] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the accompanying drawings used in the description of the embodiments or the prior art will be briefly introduced below.
[0013] Figure 1 This is a schematic diagram of the overall structure of a multifunctional test bench for integrated circuit testing according to the first embodiment of this utility model.
[0014] Figure 2 This is a schematic diagram showing the connection between the top seat and the buffer pad in the first embodiment of this utility model.
[0015] Figure 3 This is a schematic diagram of the overall structure of a multifunctional test bench for integrated circuit testing according to the second embodiment of this utility model.
[0016] In the diagram: 101-base plate, 102-support plate, 103-base, 104-slide rod, 105-limiting plate, 106-top seat, 107-rotating rod, 108-threaded hole, 109-locking bolt, 110-first gear, 111-second gear, 112-motor, 113-threaded rod, 114-rotating cap, 115-buffer pad, 201-support ring, 202-connecting rod. Detailed Implementation
[0017] The embodiments of the present invention are described in detail below. Examples of the embodiments are shown in the accompanying drawings. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain the present invention, but should not be construed as limiting the present invention.
[0018] The first embodiment of this application is as follows:
[0019] Please see Figure 1 and Figure 2 , Figure 1 This is a schematic diagram of the overall structure of a multifunctional test bench for integrated circuit testing according to the first embodiment of this utility model. Figure 2 This is a schematic diagram showing the connection between the top seat and the buffer pad in the first embodiment of this utility model.
[0020] This utility model provides a multifunctional test bench for integrated circuit testing: it includes a base plate 101 and a support plate 102, and also includes a testing device. The testing device includes a base 103, a sliding rod 104, a limiting plate 105, a top seat 106, a rotating rod 107, a pushing component, and a rotating component. The rotating component includes a first gear 110 and a driving component, the driving component includes a second gear 111 and a motor 112, and the pushing component includes a threaded rod 113 and a rotating cap 114. The aforementioned solution solves the problem that when testing integrated circuit boards, the device can only test one circuit board at a time, and cannot perform batch testing, which makes the testing efficiency of integrated circuit boards relatively low. The aforementioned solution can be used in the scenario of testing the soldering stability of electrical components on integrated circuit boards, and can also be used to solve the problem of supporting the rotating rod.
[0021] In this embodiment, the rotating component drives the rotating rod 107 to rotate the circuit board inside the base 103, thereby detecting the welding stability of electrical components and realizing batch testing of circuit boards, thus improving the testing efficiency of circuit boards.
[0022] The rotating rod 107 is rotatably mounted on the support plate 102 via the rotating assembly. The base 103 is fixedly mounted on the rotating rod 107 and has a threaded hole 108. The top seat 106 is rotatably mounted on the base 103 and has a buffer pad 115 inside. A locking bolt 109 is also provided on one side of the top seat 106. The sliding rod 104 is fixedly mounted inside the base 103, and the limiting plate 105 is slidably mounted on the sliding rod 104. The pushing assembly is mounted on the base 103. The rotating rod 107 is rotatably engaged with the support plate 102 via a bearing. Both the base 103 and the top seat 106 are square box structures. The top seat 106 is connected to the base 102 via a hinge. The system features a rotating mechanism. Two sets of sliding rods 104 are symmetrically distributed inside the base 103. Six sets of limiting plates 105 are spaced apart on the sliding rods 104. The pushing component can drive the limiting plates 105 to move, and the rotating component can drive the rotating rod 107 to rotate. In use, multiple circuit boards are placed between the limiting plates 105 inside the base 103. Driven by the pushing component, the multiple sets of limiting plates 105 clamp and fix the multiple circuit boards. Driven by the rotating component, the rotating rod 107 causes the base 103 and the circuit boards to rotate, thereby detecting the welding stability of electrical components. This achieves batch testing of circuit boards and improves the testing efficiency.
[0023] Secondly, the first gear 110 is fixedly mounted on the rotating rod 107; the driving component drives the first gear 110 to rotate, and the first gear 110 is keyed to the rotating rod 107. By driving the first gear 110 to rotate, the driving component causes the first gear 110 to drive the rotating rod 107 to rotate, thereby realizing the rotation drive of the rotating rod 107.
[0024] Furthermore, the motor 112 is fixedly mounted on the support plate 102; the second gear 111 is fixedly mounted on the output shaft of the motor 112 and meshes with the first gear 110. The motor 112 is fixed to the support plate 102 by screws. The second gear 111 is located below the first gear 110. The motor 112 drives the second gear 111 to rotate, so that the second gear 111 drives the first gear 110 to rotate through meshing, thereby achieving the effect of rotating the first gear 110.
[0025] Finally, the threaded rod 113 is threaded through the base 103; the rotating cap 114 is fixedly installed on the threaded rod 113, the threaded rod 113 is parallel to the axis of the slide rod 104, the rotating cap 114 is welded to the end of the threaded rod 113, and by rotating the rotating cap 114, the threaded rod 113 is driven to rotate, so that the threaded rod 113 can move into the base 103 through the threaded engagement with the base 103, so that the threaded rod 113 pushes the limiting plate 105, thereby achieving the pushing effect on the limiting plate 105.
[0026] In this embodiment, during use, multiple circuit boards to be tested are placed inside the base 103, with each circuit board positioned between every two sets of limiting plates 105. Then, rotating the rotating cap 114 causes the threaded rod 113 to rotate, allowing it to move inside the base 103 through threaded engagement with the base 103. This movement of the threaded rod 113 pushes the limiting plates 105 to move, causing them to slide along the slide rod 104. Under the clamping of the various limiting plates 105, multiple circuit boards are fixed inside the base 103. Finally, the top seat 106 is closed. The buffer pad 115 inside the top seat 106 contacts the top of the circuit board, and the top seat 106 is fixed to the base 103 by the locking bolt 109. Then, the motor 112 is started to drive the second gear 111 to rotate. The second gear 111 drives the first gear 110 to rotate through meshing. The first gear 110 then drives the base 103 and the circuit board inside the base 103 to rotate rapidly around the axis of the rotating rod 107 through the rotating rod 107. This is to detect the soldering stability of electrical components, thereby realizing batch inspection of circuit boards and improving the inspection efficiency of circuit boards.
[0027] The second embodiment of this application is as follows:
[0028] Please see Figure 3 ,in Figure 3 This is a schematic diagram of the overall structure of a multifunctional test bench for integrated circuit testing according to the second embodiment of the present invention. Based on the first embodiment, the multifunctional test bench for integrated circuit testing in this embodiment further includes a support component, which includes a support ring 201 and a connecting rod 202.
[0029] In this embodiment, the cooperation between the connecting rod 202 and the support ring 201 achieves the supporting effect on the rotating rod 107, thereby enhancing the rotational stability of the rotating rod 107.
[0030] The connecting rod 202 is fixedly installed on the support plate 102; the support ring 201 is fixedly installed on the connecting rod 202 and rotatably connected to the rotating rod 107. The connecting rod 202 is inclinedly disposed at the bottom of the rotating rod 107, and the support ring 201 is sleeved on the outside of the rotating rod 107. At the same time, the support ring 201 is rotatably engaged with the rotating rod 107 through a bearing. Through the cooperation of the connecting rod 202 and the support ring 201, the supporting effect of the rotating rod 107 is achieved, thereby enhancing the rotational stability of the rotating rod 107.
[0031] The above-disclosed embodiments are merely one or more preferred embodiments of this application and should not be construed as limiting the scope of this application. Those skilled in the art can understand that all or part of the processes for implementing the above embodiments and equivalent changes made in accordance with the claims of this application still fall within the scope of this application.
Claims
1. A multifunctional test bench for integrated circuit testing, comprising a base plate and a support plate, wherein the support plate is fixedly mounted on the base plate, characterized in that, It also includes detection devices; The detection device includes a base, a slide rod, a limiting plate, a top seat, a rotating rod, a pushing assembly, and a rotating assembly. The rotating rod is rotatably mounted on the support plate via the rotating assembly. The base is fixedly mounted on the rotating rod and has a threaded hole. The top seat is rotatably mounted on the base and has a buffer pad inside. A locking bolt is also provided on one side of the top seat. The slide rod is fixedly mounted inside the base. The limiting plate is slidably mounted on the slide rod. The pushing assembly is mounted on the base.
2. The multifunctional test bench for integrated circuit testing as described in claim 1, characterized in that, The rotating assembly includes a first gear and a driving component. The first gear is fixedly mounted on the rotating rod; the driving component drives the first gear to rotate.
3. The multifunctional test bench for integrated circuit testing as described in claim 2, characterized in that, The driving component includes a second gear and a motor, with the motor fixedly mounted on the support plate; the second gear is fixedly mounted on the output shaft of the motor and meshes with the first gear.
4. The multifunctional test bench for integrated circuit testing as described in claim 1, characterized in that, The actuating assembly includes a threaded rod and a rotating cap, wherein the threaded rod is threaded through the base; and the rotating cap is fixedly mounted on the threaded rod.
5. The multifunctional test bench for integrated circuit testing as described in claim 4, characterized in that, The detection device further includes a support assembly, which includes a support ring and a connecting rod. The connecting rod is fixedly mounted on the support plate. The support ring is fixedly mounted on the connecting rod and is rotatably connected to the rotating rod.