Battery management system AFE acquisition function testing device
By designing a test circuit with an adjustable number of resistors, the problems of high cost and low versatility of AFE acquisition function test devices were solved, enabling flexible testing to adapt to different chip voltage acquisition ports, and reducing test risks and costs.
Patent Information
- Application Number
- CN202422539961.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-21
- Publication Date
- 2025-11-11
- Estimated Expiration
- 2034-10-21
AI Technical Summary
Existing battery management system AFE acquisition function testing devices are costly and have low versatility. They cannot adapt to the differences in the number of voltage acquisition ports of different types of chips, and using battery packs for testing is dangerous. The output channel of the resistor voltage divider is fixed and cannot be adjusted.
A test circuit was designed, which includes a power supply, a resistor module, a voltage acquisition module, and a resistor switching module. The number of voltage acquisition channels can be changed by adjusting the number of series resistors to adapt to the voltage acquisition ports of different types of chips.
It improves the versatility of the testing equipment, enabling it to adapt to more types of chips, reduces testing costs, and avoids the dangers of using battery packs for testing.
Smart Images
Figure CN223538963U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of testing equipment technology, and specifically to a battery management system AFE acquisition function testing device. Background Technology
[0002] In BMS (BATTERY MANAGEMENT SYSTEM), there are many types of voltage acquisition chips that use AFE (Active Front End) rectifier / feedback units. Different types of chips have different numbers of voltage acquisition ports. Currently, the mainstream acquisition chips are 12-series, 14-series, and 16-series, that is, the chips have 12, 14, or 16 voltage acquisition ports.
[0003] When testing the AFE (Automatic Factor Acquisition) function of a battery management system, battery packs, battery simulators, or resistor dividers are typically used. However, these methods are usually costly and have a single output channel. When using battery packs for testing, the voltage consistency of the batteries is poor, maintenance is troublesome, and it is relatively dangerous. If one battery short-circuits and catches fire, the entire module may be destroyed. Currently, AFE acquisition test devices using resistor dividers have a fixed number of output voltage acquisition channels that cannot be adjusted. Therefore, test benches are often left idle due to incompatibility when testing different types of chips. The test devices have low versatility and high testing costs. Summary of the Invention
[0004] To overcome the above-mentioned shortcomings, the purpose of this application is to provide a battery management system AFE acquisition function test device, thereby effectively solving the above-mentioned technical problems.
[0005] To achieve the above objectives, this application adopts the following technical solution:
[0006] This application provides a battery management system AFE acquisition function testing device, the testing device including a test circuit for testing the battery management system AFE acquisition function, the test circuit including:
[0007] power supply,
[0008] A resistor module, wherein the first end of the resistor module is electrically connected to the negative terminal of the power supply, the second end of the resistor module is electrically connected to the positive terminal of the power supply, and the resistor module includes a plurality of resistors, wherein the plurality of resistors are connected in series in the test circuit;
[0009] A voltage acquisition module, comprising a first acquisition channel, a second acquisition channel, and a third acquisition channel, wherein...
[0010] The first terminal of the first acquisition channel is electrically connected to the connection circuit between the negative terminal of the power supply and the first terminal of the resistor module, and the second terminal of the first acquisition channel is electrically connected to the negative terminal of the chip in the battery management system under test.
[0011] The first terminal of the second acquisition channel is electrically connected to the connection circuit between the positive terminal of the power supply and the second terminal of the resistor module, and the second terminal of the second acquisition channel is electrically connected to the positive terminal of the chip in the battery management system under test.
[0012] The first end of the third acquisition channel is electrically connected to the circuit connecting two adjacent resistors in the resistor module, and the second end of the third acquisition channel is electrically connected to the voltage acquisition port of the chip in the battery management system under test. The number of the third acquisition channels is proportional to the number of series resistors connected to the test circuit in the resistor module.
[0013] A resistance switching module is electrically connected to the resistance module. The resistance switching module is configured to adjust the number of series resistors in the test circuit to change the number of voltage acquisition ports of the chip in the battery management system under test connected to the third acquisition channel.
[0014] Furthermore, the resistor module includes N resistors, wherein the first resistor is electrically connected to the negative terminal of the power supply, and the Nth resistor is electrically connected to the positive terminal of the power supply.
[0015] Furthermore, the first end of the first acquisition channel is electrically connected to the circuit where the negative terminal of the power supply is connected to the first resistor, the first end of the second acquisition channel is electrically connected to the circuit where the positive terminal of the power supply is connected to the Nth resistor, and the first end of the third acquisition channel is connected to the circuit where two adjacent resistors are connected among the N resistors.
[0016] Furthermore, the resistor switching module includes several switches, which are disposed on the circuit connecting two adjacent resistors, and the switches are configured to control the on / off state of the circuit between two adjacent resistors.
[0017] Furthermore, the switch includes a triangular switch, which is disposed on the circuit where the first end of the third acquisition channel is connected to the resistor. The first part of the triangular switch is electrically connected to the positive terminal of the power supply, the second part of the triangular switch is electrically connected to the resistor, and the third part of the triangular switch is electrically connected to the third acquisition channel.
[0018] Furthermore, the first part of the triangular switch includes a first conductive contact, the second part of the triangular switch includes a second conductive contact, and the third part of the triangular switch includes a conductive contact piece, wherein...
[0019] The first conductive contact is electrically connected to the positive terminal of the power supply, the second conductive contact is electrically connected to the resistor, the conductive contact piece is electrically connected to the third acquisition channel, and the conductive contact piece is configured to be electrically connected to either the first conductive contact or the second conductive contact.
[0020] Furthermore, the power supply includes an adjustable DC power supply, wherein the adjustable DC power supply adjusts the voltage range to 0-80V.
[0021] Furthermore, the resistor connected in series in the resistor module is 100Ω.
[0022] Beneficial effects
[0023] This application provides a battery management system AFE acquisition function test device, which adjusts the number of series resistors in the input test current through a resistor switching module, thereby changing the number of voltage acquisition channels to correspond with the voltage acquisition ports of the chips in the battery management system, thus improving the versatility of the test device and making it suitable for more types of chips. Attached Figure Description
[0024] The accompanying drawings are provided to illustrate the technical solutions of this disclosure and form part of the specification. They are used together with the embodiments of this disclosure to explain the technical solutions of this disclosure and do not constitute a limitation on the technical solutions of this disclosure. The shapes and sizes of the components in the drawings do not reflect actual proportions and are only intended to illustrate the content of this application.
[0025] Figure 1 This is a schematic diagram of the test circuit for the AFE acquisition function of the battery management system in this application.
[0026] Figure 2 This is a schematic diagram of the test circuit structure for the AFE acquisition function in one embodiment of this application.
[0027] Figure 3 This is a schematic diagram of the voltage acquisition principle in one embodiment of this application.
[0028] Figure 4 This is a schematic diagram of the test circuit structure used for the 12-chip array in another embodiment of this application.
[0029] Figure 5 This is a schematic diagram of the test circuit structure used for the 14-chip array in another embodiment of this application.
[0030] Figure 6 This is a schematic diagram of the test circuit structure used for the 16-chip array in another embodiment of this application.
[0031] Figure 7This is a schematic diagram of the test circuit structure used for the 18-chip array in another embodiment of this application. Detailed Implementation
[0032] The above-described solution will be further illustrated below with reference to specific embodiments. It should be understood that these embodiments are for illustrative purposes only and are not intended to limit the scope of this application. The implementation conditions used in the embodiments may be further adjusted according to the conditions of specific manufacturers, and the implementation conditions not specified are generally those in routine experiments.
[0033] Unless otherwise defined, the technical or scientific terms used in the embodiments of this disclosure shall have the ordinary meaning understood by one of ordinary skill in the art to which this application pertains. The terms "first," "second," and similar terms used in the embodiments of this disclosure do not indicate any order, quantity, or importance, but are merely used to distinguish different components. Terms such as "comprising" or "including" mean that the element or object preceding the word encompasses the element or object listed following the word and its equivalents, without excluding other elements or objects. Terms such as "connected" or "linked" are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. In this document, "electrical connection" includes the situation where constituent elements are connected together by an element having some electrical function. There is no particular limitation on the "electrically functioning element," as long as it enables the transmission and reception of electrical signals between the connected constituent elements. An "electrically functioning element" can be, for example, an electrode or wiring, a switching element such as a transistor, or other functional elements such as a resistor, inductor, or capacitor. "Up," "down," "left," and "right" are only used to indicate relative positional relationships. When the absolute position of the object being described changes, the relative positional relationship may also change accordingly.
[0034] In this application, the terms "upper," "lower," "inner," "middle," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. These terms are primarily for the purpose of better describing this application and its embodiments, and are not intended to limit the indicated device, element, or component to having a specific orientation, or to be constructed and operated in a specific orientation.
[0035] As described in the background section, current AFE acquisition and testing devices using resistor voltage dividers have a fixed number of output voltage acquisition channels that cannot be adjusted, resulting in low device versatility.
[0036] To address the above, the inventors designed a test device that can change the voltage acquisition channel to suit the chip's voltage acquisition port. This test device includes a test circuit for testing the AFE (Automatic External Frame) acquisition function of the battery management system, such as... Figure 1As shown, the test circuit includes a power supply 1, a resistor module 2, a resistor module 2, a resistor module 2, a resistor module 2, a resistor module 2, a resistor module 2, and a resistor module 3, which are electrically connected to the negative terminal of the power supply 1 and a resistor module 4, which are electrically connected to the positive terminal of the power supply 1. The resistor module 2 includes several resistors connected in series in the test circuit. A voltage acquisition module is also included, comprising a first acquisition channel 3, a second acquisition channel 4, and a third acquisition channel 5.
[0037] The first terminal of the first acquisition channel 3 is electrically connected to the connection circuit between the negative terminal of the power supply 1 and the first terminal of the resistor module 2, and the second terminal of the first acquisition channel 3 is electrically connected to the negative terminal of the chip 6 in the battery management system under test.
[0038] The first terminal of the second acquisition channel 4 is electrically connected to the connection circuit between the positive terminal of the power supply 1 and the second terminal of the resistor module 2, and the second terminal of the second acquisition channel 4 is electrically connected to the positive terminal of the chip 6 in the battery management system under test.
[0039] The first end of the third acquisition channel 5 is electrically connected to the circuit connecting two adjacent resistors in the resistor module 2, and the second end of the third acquisition channel 5 is electrically connected to the voltage acquisition port of the chip 6 in the battery management system under test. The number of third acquisition channels 5 is proportional to the number of series resistors connected to the test circuit in the resistor module 2.
[0040] It also includes a resistor switching module 7, which is electrically connected to the resistor module 2. The resistor switching module 7 is configured to adjust the number of series resistors in the test circuit to change the number of voltage acquisition ports of the third acquisition channel 5 connected to the chip 6 in the battery management system under test.
[0041] This application adjusts the number of series resistors in the input test current using a resistor switching module, thereby changing the number of voltage acquisition channels to correspond with the voltage acquisition ports of the chips in the battery management system, thus improving the versatility of the test device and making it suitable for more types of chips.
[0042] Next, in conjunction with the appendix Figure 2-7 This application is described by way of example.
[0043] Example
[0044] One embodiment of this application discloses a battery management system AFE acquisition function testing device. This testing device includes a test circuit for testing the AFE acquisition function of the battery management system, such as... Figure 2 As shown, the test circuit includes:
[0045] A DC power supply (V) is an adjustable voltage DC power supply with an adjustable voltage range of 0-80V.
[0046] Twenty resistors are connected in series in the test circuit, forming a resistor module. Each resistor is 100Ω. The twenty resistors are arranged in a straight line in series in the test circuit, as shown below. Figure 2 As shown, from left to right, they are R1, R2, R3...R20, where R1 is electrically connected to the negative terminal of the DC power supply (V), and R20 is electrically connected to the positive terminal of the DC power supply (V).
[0047] A voltage acquisition module consisting of 21 voltage acquisition channels, such as Figure 2 As shown, from left to right, they are T1, T2, T3...T21, where,
[0048] One end of T1 (i.e., the first acquisition channel mentioned above) is connected to the circuit where the negative terminal of the DC power supply (V) is connected to R1, and the other end of T1 is connected to the negative terminal of the chip in the battery management system under test.
[0049] One end of T21 (i.e., the second acquisition channel mentioned above) is connected to the circuit where the positive terminal of the DC power supply (V) is connected to R20, and the other end of T21 is connected to the positive terminal of the chip in the battery management system under test.
[0050] One end of T2, T3...T20 (i.e., the third acquisition channel mentioned above) is connected to a circuit where two adjacent resistors are connected. For example, one end of T2 is connected to the circuit between R1 and R2, one end of T3 is connected to the circuit between R2 and R3, and so on. T20 is connected to the circuit between R19 and R20. The other end of T2, T3...T20 is connected to the voltage acquisition port of the chip in the battery management system under test. A one-to-one correspondence connection structure is adopted, with one acquisition channel corresponding to one voltage acquisition port.
[0051] 4 triangular switches, such as Figure 2 As shown, from left to right, they are P1, P2, P3, and P4.
[0052] P1 is positioned in the circuit connecting R13 and R14, P2 is positioned in the circuit connecting R15 and R16, P3 is positioned in the circuit connecting R17 and R18, and P4 is positioned in the circuit connecting R19 and R20. Each of P1, P2, P3, and P4 includes one conductive contact (c1) and two conductive contacts (d1 and d2), namely the first and second conductive contacts mentioned above. Figure 2 As shown in the enlarged view, taking P1 as an example, P1 is located on the circuit connected between R12 and R13. T14 is connected between R12 and R13. The conductive contact (c1) in P1 is electrically connected to T13. One conductive contact (d1) is electrically connected to the positive terminal of the DC power supply (V), and the other conductive contact (d2) is electrically connected to R13.
[0053] Based on the test circuit structure provided in the above embodiments, the specific operating principle is as follows:
[0054] like Figure 3 As shown, three resistors Ra, Rb, and Rc are connected in series. When the three resistors have the same resistance value, the voltage across Rb is calculated using the following formula:
[0055]
[0056] In the formula: Vout(Rb) is the voltage across resistor Rb, Ra, Rb, and Rc are the resistance values of the three resistors, and VBAT is the power supply voltage. Therefore, in the test circuit provided in the above embodiment, under the premise that the resistances of R1, R2, R3...R20 are the same, the voltage across each resistor is equal. By adjusting the DC power supply output voltage, the sampling voltage of each voltage sampling port can be changed. For example, "when the DC voltage input is 64V, the sampling voltage of each voltage sampling port is 3.2V; when the DC voltage input is 72V, the sampling voltage of each voltage sampling port is 3.6V." The voltage input should be adjusted according to the actual needs.
[0057] Since the mainstream data acquisition chips currently available have 12, 14, 16, and 18 strings, meaning the chips have 12, 14, 16, or 18 voltage acquisition ports, the specific operating principle of the test circuit provided in this application for these four mainstream chips is as follows:
[0058] When it is necessary to test 12 strings of chips, such as Figure 4 As shown, when the conductive contact (c1) of P1 is switched to be connected to the conductive contact d1, the resistors R1, R2, R3...R13 in the test circuit are connected to the test circuit, and the acquisition channels T1, T2, T3...T14 are connected to the test circuit. T1 is connected to the negative terminal of the 12-cell chip, T14 is connected to the positive terminal of the 12-cell chip, and T2, T3...T13 are connected to the 12 voltage acquisition ports of the 12-cell chip.
[0059] When it is necessary to test 14 strings of chips, such as Figure 5 As shown, switch the conductive contact (c1) of P1 to be connected to the conductive contact d2, and switch the conductive contact (c1) of P2 to be connected to the conductive contact d1. At this time, resistors R1, R2, R3...R15 are connected to the test circuit, and acquisition channels T1, T2, T3...T16 are connected to the test circuit. T1 is connected to the negative terminal of the 14-cell chip, T16 is connected to the positive terminal of the 14-cell chip, and T2, T3...T15 are connected to the 14 voltage acquisition ports of the 14-cell chip.
[0060] When it is necessary to test 16 strings of chips, such as Figure 6As shown, the conductive contact (c1) of P1 is switched to be connected to the conductive contact d2, the conductive contact (c1) of P2 is switched to be connected to the conductive contact d2, and the conductive contact (c1) of P3 is switched to be connected to the conductive contact d1. At this time, resistors R1, R2, R3...R17 are connected to the test circuit, and acquisition channels T1, T2, T3...T18 are connected to the test circuit. T1 is connected to the negative terminal of the 16-cell chip, T18 is connected to the positive terminal of the 16-cell chip, and T2, T3...T17 are connected to the 16 voltage acquisition ports of the 16-cell chip.
[0061] When it is necessary to test 18 strings of chips, such as Figure 7 As shown, the conductive contact (c1) of P1 is switched to be connected to the conductive contact d2, the conductive contact (c1) of P2 is switched to be connected to the conductive contact d2, the conductive contact (c1) of P3 is switched to be connected to the conductive contact d2, and the conductive contact (c1) of P4 is switched to be connected to the conductive contact d1. At this time, resistors R1, R2, R3...R19 are connected to the test circuit, and acquisition channels T1, T2, T3...T20 are connected to the test circuit. T1 is connected to the negative terminal of the 18-chip series, T20 is connected to the positive terminal of the 18-chip series, and T2, T3...T17 are connected to the 18 voltage acquisition ports of the 18-chip series.
[0062] The above embodiments are only for illustrating the technical concept and features of this application, and are intended to enable those skilled in the art to understand the content of this application and implement it accordingly. They should not be used to limit the scope of protection of this application. All equivalent changes or modifications made in accordance with the spirit and essence of this application should be included within the scope of protection of this application.
Claims
1. A battery management system AFE acquisition function testing device, characterized in that: The testing apparatus includes a test circuit for testing the AFE (Automatic External Frame) acquisition function of the battery management system. The test circuit includes: power supply, A resistor module, wherein the first end of the resistor module is electrically connected to the negative terminal of the power supply, the second end of the resistor module is electrically connected to the positive terminal of the power supply, and the resistor module includes a plurality of resistors, wherein the plurality of resistors are connected in series in the test circuit; A voltage acquisition module, comprising a first acquisition channel, a second acquisition channel, and a third acquisition channel, wherein... The first terminal of the first acquisition channel is electrically connected to the connection circuit between the negative terminal of the power supply and the first terminal of the resistor module, and the second terminal of the first acquisition channel is electrically connected to the negative terminal of the chip in the battery management system under test. The first terminal of the second acquisition channel is electrically connected to the connection circuit between the positive terminal of the power supply and the second terminal of the resistor module, and the second terminal of the second acquisition channel is electrically connected to the positive terminal of the chip in the battery management system under test. The first end of the third acquisition channel is electrically connected to the circuit connecting two adjacent resistors in the resistor module, and the second end of the third acquisition channel is electrically connected to the voltage acquisition port of the chip in the battery management system under test. The number of the third acquisition channels is proportional to the number of series resistors connected to the test circuit in the resistor module. A resistance switching module is electrically connected to the resistance module. The resistance switching module is configured to adjust the number of series resistors in the test circuit to change the number of voltage acquisition ports of the chip in the battery management system under test connected to the third acquisition channel.
2. The battery management system AFE acquisition function test device as described in claim 1, characterized in that: The resistor module includes N resistors. Among the N resistors, the first resistor is electrically connected to the negative terminal of the power supply, and the Nth resistor is electrically connected to the positive terminal of the power supply.
3. The battery management system AFE acquisition function test device as described in claim 2, characterized in that: The first end of the first acquisition channel is electrically connected to the circuit where the negative terminal of the power supply is connected to the first resistor; the first end of the second acquisition channel is electrically connected to the circuit where the positive terminal of the power supply is connected to the Nth resistor; and the first end of the third acquisition channel is connected to the circuit where two adjacent resistors are connected among the N resistors.
4. The battery management system AFE acquisition function test device as described in claim 1, characterized in that: The resistor switching module includes several switches, which are disposed on the circuit connecting two adjacent resistors and configured to control the on / off state of the circuit between two adjacent resistors.
5. The battery management system AFE acquisition function test device as described in claim 4, characterized in that: The switch includes a triangular switch, which is disposed on the circuit where the first end of the third acquisition channel is connected to the resistor. The first part of the triangular switch is electrically connected to the positive terminal of the power supply, the second part of the triangular switch is electrically connected to the resistor, and the third part of the triangular switch is electrically connected to the third acquisition channel.
6. The battery management system AFE acquisition function test device as described in claim 5, characterized in that: The first part of the triangular switch includes a first conductive contact, the second part of the triangular switch includes a second conductive contact, and the third part of the triangular switch includes a conductive contact piece, wherein... The first conductive contact is electrically connected to the positive terminal of the power supply, the second conductive contact is electrically connected to the resistor, the conductive contact piece is electrically connected to the third acquisition channel, and the conductive contact piece is configured to be electrically connected to either the first conductive contact or the second conductive contact.
7. The battery management system AFE acquisition function test device as described in claim 1, characterized in that: The power supply includes an adjustable DC power supply, the adjustable DC power supply having a voltage adjustment range of 0-80V.
8. The battery management system AFE acquisition function test device as described in claim 1, characterized in that: The resistor connected in series in the resistor module is 100Ω.