Battery testing device
By designing a battery testing device with a detachable test base and an adjustable probe holder, the compatibility problem of different back-contact battery processes was solved, and the testing accuracy was improved.
Patent Information
- Application Number
- CN202422670368.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-31
- Publication Date
- 2025-11-11
- Estimated Expiration
- 2034-10-31
AI Technical Summary
Existing IV testing systems are difficult to be compatible with different types of back contact battery processes, such as IBC, Topcon and OBB processes, resulting in poor test compatibility.
Design a battery testing device, including a detachable test base, probe slots, and an adjustable probe holder. By adjusting the number and position of the probe slots, different IBC patterns and electrode positions can be matched to improve the testing accuracy.
It enables flexible matching of different IBC patterns and electrode positions, improving test accuracy.
Smart Images

Figure CN223538966U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of photovoltaic cell testing, and specifically to a cell testing device. Background Technology
[0002] IBC (Interdigitated Back Contact) is a battery with interdigitated back contact. This type of battery designs all the positive and negative electrodes, as well as related grid lines and electrodes, on the back of the cell, resulting in a more aesthetically pleasing front side and higher conversion efficiency by utilizing the light-blocking area lost due to grid lines. Currently, research on IV testing systems based on back contact batteries focuses on BC battery processes with the same pattern, which has poor compatibility with different BC battery printing patterns and other mainstream technologies in the industry such as Topcon and OBB processes. Utility Model Content
[0003] The purpose of this invention is to provide a battery testing device to solve at least one technical problem in the prior art.
[0004] To solve the above-mentioned technical problems, the technical solution adopted by this utility model is: a battery testing device, comprising: at least one testing base;
[0005] The test base includes a support frame and several probe slots disposed on the support frame;
[0006] A conductive strip is provided inside the probe groove;
[0007] An adjustable probe holder is provided on the outer side of the conductive strip, and a probe is fixedly installed on the adjustable probe holder. A metal protrusion is provided in the middle of the probe.
[0008] In some embodiments, the conductive strip is provided with conductive contacts.
[0009] In some embodiments, the probe groove is a rectangular structure, and the conductive strip is embedded in the inner wall of the probe groove.
[0010] In some embodiments, a first fixing hole is provided at both ends of the probe groove.
[0011] In some embodiments, a fixing strip is also included, and when there are two or more test bases, two adjacent support frames are fixedly connected by the fixing strip.
[0012] In some embodiments, the fixing strip is provided with second fixing holes at both ends.
[0013] In some embodiments, the fixing strip is made of insulating material.
[0014] In some embodiments, a plurality of the probe slots are fixed at intervals on a support frame, and the spacing between adjacent probe slots may be the same or different.
[0015] Due to the application of the above technical solution, the beneficial effects of this application compared with the prior art are as follows:
[0016] This application features a detachable test base. For half-cell testing, the middle fixing plate can be removed to form probe bases for testing two halves of the cell. Furthermore, for different IBC patterns, such as changes or additions / reductions in the main grid position, the number and position of the probe slots can be adjusted to match the corresponding number and position of the main grid. If the number and position of the electrodes change, the corresponding electrode points can be matched by adding or removing probes and moving the probe positions, thereby improving testing accuracy. Attached Figure Description
[0017] To more clearly illustrate the specific embodiments of this utility model or the technical solutions in the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this utility model. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.
[0018] Figure 1 This is a schematic diagram of the battery testing device described in the embodiments of this application;
[0019] Figure 2 This is a schematic diagram of the probe slot structure of the battery testing device described in the embodiments of this application;
[0020] Figure 3 This is a schematic diagram of the fixing strip structure of the battery testing device described in the embodiments of this application;
[0021] Figure 4 This is a schematic diagram showing the connection between the conductive strip and the adjustable probe holder of the battery testing device described in this application embodiment.
[0022] Explanation of reference numerals in the attached drawings: 1. Support frame, 2. First fixing hole, 3. Probe groove, 4. Second fixing hole, 5. Fixing strip, 6. Conductive strip, 7. Adjustable probe holder, 8. Conductive contact. Detailed Implementation
[0023] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present application, and not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort should fall within the scope of protection of the present application.
[0024] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate for the embodiments of this application described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.
[0025] In this application, the terms "upper," "lower," "left," "right," "front," "rear," "top," "bottom," "inner," "outer," "middle," "vertical," "horizontal," "lateral," and "longitudinal" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. These terms are primarily for the purpose of better describing this application and its embodiments, and are not intended to limit the indicated device, element, or component to having a specific orientation, or to be constructed and operated in a specific orientation.
[0026] Furthermore, in addition to indicating location or positional relationship, some of the aforementioned terms may also have other meanings. For example, the term "above" may also be used in some cases to indicate a certain dependency or connection relationship. Those skilled in the art can understand the specific meaning of these terms in this application based on the specific circumstances.
[0027] Furthermore, the terms "installation," "setup," "equipped with," "connection," "linking," and "socketing" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral structure; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium, or an internal connection between two devices, components, or parts. Those skilled in the art can understand the specific meaning of these terms in this application based on the specific circumstances.
[0028] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. This application will now be described in detail with reference to the accompanying drawings and embodiments.
[0029] Please see Figures 1-4 As shown, one embodiment of this application provides a battery testing apparatus to solve at least one technical problem in the prior art.
[0030] To solve the above-mentioned technical problems, the technical solution adopted by this utility model is: a battery testing device, comprising: at least one testing base;
[0031] The test base includes a support frame 1 and several probe slots 3 disposed on the support frame 1;
[0032] A conductive strip 6 is installed inside the probe groove 3;
[0033] An adjustable probe holder 7 is provided on the outer side of the conductive strip 6. A probe is fixedly installed on the adjustable probe holder 7, and a metal protrusion is provided in the middle of the probe.
[0034] Specifically, the probe has a metal protrusion in the middle, which makes good contact with the probe groove 3 and can be fixed by adjusting the position of the adjustable probe seat 7.
[0035] According to an embodiment of the present invention, conductive strip 6 is provided with conductive contacts 8.
[0036] According to an embodiment of the present invention, the probe groove 3 has a rectangular structure, and the conductive strip 6 is embedded in the inner wall of the probe groove 3.
[0037] In other words, the probe groove 3 is rectangular in shape, with a conductive strip 6 embedded inside. The inner wall of the probe groove 3 is engraved with a contact area for the probe to contact. The conductive strip 6 is set on both sides of the probe groove 3, and the double-sided conductive strip 6 can enhance the probe contact.
[0038] Furthermore, both ends of the probe groove 3 are provided with first fixing holes 2.
[0039] According to the embodiment of this utility model, it also includes a fixing strip 5. When there are two or more test bases, two adjacent bearing frames 1 are fixedly connected by the fixing strip 5.
[0040] Specifically, the carrier frame 1 is used to fix the probe slot 3 after its position is adjusted. The two carrier frames 1 are connected and fixed by a fixing strip 5. If half of the test piece is required, the other carrier frame 1 can be removed.
[0041] Specifically, the fixing strip 5 has second fixing holes 4 at both ends. The second fixing holes 4 are screw holes, and the fixing strip 5 is connected and fixed to the bearing frame 1 by screws.
[0042] Furthermore, the fixing strip 5 is made of insulating material.
[0043] According to an embodiment of the present invention, a plurality of probe slots 3 are fixed at intervals on the support frame 1, and the spacing between adjacent probe slots 3 may be the same or different.
[0044] In summary, this application, by setting a detachable test base, allows for the separation of the middle fixing plate to form probe bases for testing two halves of a battery. Furthermore, for different IBC patterns, such as changes or additions / reductions in the main grid position, the number and position of the probe slots 3 can be adjusted to match the corresponding number and position of the main grid. If the number and position of the electrodes change, the corresponding electrode points can be matched by adding or removing probes and moving the probe positions, thereby improving test accuracy.
[0045] Finally, it should be noted that the above are merely preferred embodiments of this application and are not intended to limit this application. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.
Claims
1. A battery testing device, comprising: At least one test base; characterized in that, The test base includes a support frame and several probe slots disposed on the support frame; A conductive strip is provided inside the probe groove; An adjustable probe holder is provided on the outside of the conductive strip, and a probe is fixedly installed on the adjustable probe holder. A metal protrusion is provided in the middle of the probe.
2. The battery testing apparatus as described in claim 1, characterized in that, The conductive strip is provided with conductive contacts.
3. The battery testing apparatus as described in claim 2, characterized in that, The probe groove has a rectangular structure, and the conductive strip is embedded in the inner wall of the probe groove.
4. The battery testing apparatus as described in claim 2, characterized in that, The probe groove has a first fixing hole at both ends.
5. The battery testing apparatus as described in claim 1, characterized in that, It also includes fixing strips. When there are two or more test bases, two adjacent load-bearing frames are fixedly connected by fixing strips.
6. The battery testing apparatus as described in claim 5, characterized in that, The fixing strip has a second fixing hole at both ends.
7. The battery testing apparatus as described in claim 5 or 6, characterized in that, The fixing strip is made of insulating material.
8. The battery testing apparatus as described in claim 1, characterized in that, Several probe slots are fixed to the support frame at intervals, and the spacing between adjacent probe slots may be the same or different.