Memory bank test fixture
By introducing protective components into the DDR memory module testing fixture, the problem of easily damaged motherboard pins of memory modules was solved, thereby improving the storage safety and stability of memory modules without affecting the test.
Patent Information
- Application Number
- CN202422665419.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-01
- Publication Date
- 2025-11-11
- Estimated Expiration
- 2034-11-01
AI Technical Summary
Existing DDR memory module testing fixtures lack protection for the motherboard pins of the memory modules, making them prone to contact and collision with external objects during daily storage, which affects the stability of the test.
A memory module testing fixture was designed, comprising a protective component consisting of a protective sleeve, a connecting post, and a ball block. A first clamp and a second clamp are fixedly connected by bolts to achieve clamping and fixation. The protective sleeve is fitted onto the outside of the motherboard pins of the memory module. The connecting post passes through the clamp and is fixed to the ball block. An L-shaped limiting slide and an n-shaped storage groove cooperate to realize the horizontal and vertical movement of the protective sleeve, which facilitates the storage and unfolding of the protective sleeve.
It effectively prevents the motherboard pins of the memory module from colliding with external objects, improving storage safety. The protective cover can be quickly flipped over when testing is required, without affecting the testing operation. The structure is simple and convenient.
Smart Images
Figure CN223539339U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of memory module testing fixture technology, specifically a memory module testing fixture. Background Technology
[0002] DDR memory module test fixture, also known as DDR memory chip test fixture, is a tool specifically designed for the rapid verification and testing of DDR memory chips. The DDR memory module test fixture structure adopts an alloy head, alloy limit frame, and conductive adhesive structure in a dotted pattern. Compared with conventional probe fixtures, the conductive adhesive can withstand higher frequencies, has greater current resistance, provides stable testing, and will not burn out during short circuits, eliminating the trouble of burning probes associated with probe clamps.
[0003] In existing DDR memory module testing fixtures, the memory module motherboard is installed inside the fixture, and the pins of the memory module motherboard protrude outside the fixture. Existing DDR memory module testing fixtures do not have a protective structure for the pins of the memory module motherboard, which means that during daily storage, the pins of the memory module motherboard are always exposed to the outside. This makes it easy for the pins of the memory module motherboard to come into contact with and collide with other objects, causing wear and tear, which in turn affects the stability of subsequent testing. Based on this, a memory module testing fixture is provided. Utility Model Content
[0004] The purpose of this utility model is to provide a memory module testing fixture in order to solve the problems mentioned above.
[0005] To achieve the above objectives, this utility model provides the following technical solution: a memory module testing fixture, comprising a first clamp and a second clamp, wherein the first clamp and the second clamp are symmetrically distributed vertically and fixedly connected by bolts, wherein the first clamp and the second clamp clamp and fix the memory module motherboard, and a protective component extending to the outside of the first clamp and the second clamp is provided between the first clamp and the second clamp, wherein the protective component is used to protect the pin parts of the memory module motherboard that protrude outside the first clamp and the second clamp;
[0006] The protective assembly includes a protective sleeve, a connecting post, and a ball block;
[0007] The protective sleeve is fitted onto the outside of the pin area of the memory module motherboard to protect the pin area of the memory module motherboard.
[0008] The connecting posts are symmetrically fixed on both sides of one end of the protective sleeve, and the connecting posts extend through to the middle position of the first clamp and the second clamp, and the ball block is fixed to one end of the connecting posts.
[0009] As a further solution of this utility model: an L-shaped limiting groove is provided at the position where the first clamp and the second clamp are spliced and the connecting column and the ball block are in contact. The horizontal part of the L-shaped limiting groove is used to allow the connecting column and the ball block to move horizontally, thereby realizing the horizontal separation operation between the protective sleeve and the motherboard pin part of the memory module.
[0010] The vertical portion of the L-shaped limiting slide is used to provide vertical movement for the ball block and connecting column, and to realize the vertical separation operation between the protective sleeve and the motherboard pins of the memory module;
[0011] The lower surface of the first clamp is provided with an n-shaped storage groove, which is connected to the vertical part of the L-shaped limiting slide groove. The n-shaped storage groove is used to provide space for the rotation and storage of the protective sleeve and the connecting column.
[0012] As a further embodiment of this utility model: the vertical cross-section of the L-shaped limiting slide is circular, and the cross-sectional diameter of the L-shaped limiting slide matches the diameter of the ball block. The diameter of the ball block is larger than the diameter of the connecting column. The first clamp and the second clamp are formed with straight slots at the end near the protective sleeve for the connecting column to pass through. The straight slots are connected and communicate with the L-shaped limiting slide and the n-shaped storage groove.
[0013] As a further embodiment of this utility model: the test fixture also includes a conductive adhesive base, a limiting frame, a pressure plate, an elastic fastener, and a fixing fastener;
[0014] The second clamp has a mounting groove formed on its top. The conductive adhesive base is embedded in the mounting groove and extends to the bottom of the second clamp. The bottom end of the conductive adhesive base is attached to the mounting pin of the memory chip on the memory module motherboard.
[0015] The limiting frame is installed inside the mounting groove and above the conductive adhesive base. The limiting frame is used to provide a limiting position for the memory chip.
[0016] One end of the pressure plate is hinged to the top of the second clamp and covers the upper surface of the limiting frame. The elastic fastener is installed on the other end of the pressure plate, and the fixed fastener is installed on one end of the first clamp. The elastic fastener and the fixed fastener are engaged to achieve a pressing operation on the memory chip placed inside the limiting frame.
[0017] As a further embodiment of this utility model: the protective sleeve, connecting column, and ball block are integrally formed by rubber injection molding process, and the ball block and the inner wall of the L-shaped limiting groove and the protective sleeve and the inner wall of the n-shaped storage groove are in an interference fit.
[0018] Compared with the prior art, the beneficial effects of this utility model are:
[0019] By incorporating protective components, the protective sleeve is fitted onto the outside of the motherboard pins of the memory module, effectively protecting these pins from collisions and damage from external objects. This further enhances storage safety. When testing is required, the protective sleeve and connecting post can be flipped and inserted into the n-shaped storage slot, thus folding and storing the protective sleeve without affecting subsequent testing operations. The overall structure is simple and easy to operate. Attached Figure Description
[0020] Figure 1 This is a schematic diagram of the structure of this utility model;
[0021] Figure 2 A schematic diagram showing the state of the protective sleeve of this utility model without protecting the motherboard pins of the memory module;
[0022] Figure 3 This is a schematic diagram showing the protective cover of this utility model in a flipped and stored state.
[0023] Figure 4 This is a schematic diagram of the pressure plate of this utility model in the open state;
[0024] Figure 5 This is a schematic diagram showing the disassembled parts of this utility model;
[0025] Figure 6 This is a schematic diagram of the structure of the upper surface of the first clamp of this utility model;
[0026] Figure 7 This is a schematic diagram of the lower surface structure of the first clamp of this utility model.
[0027] In the diagram: 1. Test fixture; 101. First clamp; 102. Second clamp; 103. Conductive adhesive base; 104. Limiting frame; 105. Pressure plate; 106. Elastic fastener; 107. Fixed fastener; 108. L-shaped limiting slide; 109. N-shaped storage slot; 2. Memory module motherboard; 3. Protective components; 301. Protective sleeve; 302. Connecting post; 303. Ball block. Detailed Implementation
[0028] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.
[0029] Please see Figures 1-7In this embodiment of the present invention, a memory module testing fixture includes a testing fixture 1 composed of a first clamp 101 and a second clamp 102. The first clamp 101 and the second clamp 102 are symmetrically distributed vertically and are fixedly connected by bolts. The first clamp 101 and the second clamp 102 clamp and fix the memory module motherboard 2. A protective component 3 is provided between the first clamp 101 and the second clamp 102, extending to the outside of the first clamp 101 and the second clamp 102. The protective component 3 is used to protect the pin parts of the memory module motherboard 2 that protrude from the outside of the first clamp 101 and the second clamp 102.
[0030] Protective component 3 includes a protective sleeve 301, a connecting post 302, and a ball block 303;
[0031] The protective sleeve 301 is fitted onto the outside of the pin area of the memory module motherboard 2 to protect the pin area of the memory module motherboard 2.
[0032] The connecting post 302 is symmetrically fixed on both sides of one end of the protective sleeve 301, and the connecting post 302 extends through to the middle position of the first clamp 101 and the second clamp 102, and the ball block 303 is fixed to one end of the connecting post 302;
[0033] An L-shaped limiting groove 108 is provided at the splicing position of the first clamp 101 and the second clamp 102 and the contact position of the connecting post 302 and the ball block 303. The horizontal part of the L-shaped limiting groove 108 is used to move the connecting post 302 and the ball block 303 horizontally, thereby realizing the horizontal separation operation between the protective sleeve 301 and the pin part of the memory module motherboard 2.
[0034] The vertical part of the L-shaped limiting slide 108 is used to provide vertical movement for the ball block 303 and the connecting column 302, so as to realize the vertical separation operation between the protective sleeve 301 and the pin part of the memory module motherboard 2.
[0035] The lower surface of the first clamp 101 is provided with an n-shaped storage groove 109, which is connected to the vertical part of the L-shaped limiting slide groove 108. The n-shaped storage groove 109 is used to provide space for the rotation and storage of the protective sleeve 301 and the connecting column 302.
[0036] The vertical cross-section of the L-shaped limiting slide 108 is circular, and the cross-sectional diameter of the L-shaped limiting slide 108 matches the diameter of the ball block 303. The diameter of the ball block 303 is larger than the diameter of the connecting column 302. The first clamp 101 and the second clamp 102 are formed with straight slots at the ends near the protective sleeve 301 for the connecting column 302 to pass through. The straight slots are connected and communicate with the L-shaped limiting slide 108 and the n-shaped storage groove 109.
[0037] In this embodiment: When the memory module test fixture is in its normal storage state, the protective sleeve 301 is fitted onto the outside of the pin 2 part of the memory module motherboard, thereby protecting the pin 2 part of the memory module motherboard and effectively preventing the pin 2 part of the memory module motherboard from being damaged by collision with external objects, further improving storage safety.
[0038] When testing is required, simply pull the protective sleeve 301 horizontally away from the pins of the memory module motherboard 2. This will remove the obstruction to the pins of the memory module motherboard 2. During this process, the protective sleeve 301 moves the ball block 303 along the horizontal part of the L-shaped limiting slide groove 108 via the connecting post 302. When the ball block 303 moves to one end of the horizontal part of the L-shaped limiting slide groove 108, rotate the protective sleeve 301 around the ball block 303 and apply a certain pulling force to move the ball block 303 to the bottom of the vertical part of the L-shaped limiting slide groove 108. Continue to rotate and flip the protective sleeve 301. This will allow the protective sleeve 301 and the connecting post 302 to flip and fit into the n-shaped storage slot 109, thus achieving the folding and storage of the protective sleeve 301 so as not to affect subsequent testing operations.
[0039] Please refer to this carefully. Figures 1-7 The test fixture 1 also includes a conductive adhesive base 103, a limiting frame 104, a pressure plate 105, an elastic fastener 106, and a fixing fastener 107.
[0040] The top of the second clamp 102 is formed with an installation groove. The conductive adhesive base 103 is embedded in the installation groove and extends to the bottom of the second clamp 102. The bottom end of the conductive adhesive base 103 is attached to the memory chip mounting pin on the memory module motherboard 2.
[0041] The limiting frame 104 is installed inside the mounting groove and above the conductive adhesive base 103. The limiting frame 104 is used to provide a limiting position for the memory chip.
[0042] One end of the pressure plate 105 is hinged to the top of the second clamp 102 and covers the upper surface of the limiting frame 104. The elastic fastener 106 is installed on the other end of the pressure plate 105. The fixed fastener 107 is installed on one end of the first clamp 101, and the elastic fastener 106 and the fixed fastener 107 are engaged to achieve a pressing operation on the memory chip placed inside the limiting frame 104.
[0043] In this embodiment: when testing the memory chip, it is only necessary to move the elastic fastener 106 to deform it and release it from the snap-fit state with the fixed fastener 107. Then, apply a flipping force to make the pressure plate 105 and the elastic fastener 106 flip open as a whole. Then, the memory chip to be tested can be placed inside the limiting frame 104, with the PIN corner of the memory chip attached to the upper end of the conductive adhesive base 103. Then, the pressure plate 105 can be closed on the upper end of the limiting frame 104, and its elastic fastener 106 snaps into the fixed fastener 107, thereby realizing the limiting installation of the memory chip. (It should be noted that the conductive adhesive base 103, limiting frame 104, pressure plate 105, elastic fastener 106, and fixed fastener 107 are all conventional structures of existing test fixtures, so their structural shapes are not described in detail.) Afterwards, the inner strip main board 2 can be connected to the test equipment for testing.
[0044] Please refer to this carefully. Figures 1-7 The protective sleeve 301, connecting column 302, and ball block 303 are integrally formed by rubber injection molding process. The ball block 303 and the inner wall of the L-shaped limiting slide groove 108 and the protective sleeve 301 and the inner wall of the n-shaped storage groove 109 are in an interference fit.
[0045] In this embodiment: the interference fit between the ball block 303 and the inner wall of the L-shaped limiting slide groove 108, and between the protective sleeve 301 and the inner wall of the n-shaped storage groove 109, provides a certain frictional force between the ball block 303 and the inner wall of the L-shaped limiting slide groove 108, and between the protective sleeve 301 and the inner wall of the n-shaped storage groove 109, thereby ensuring the stability of the protective sleeve 301 in both the protective and storage states.
[0046] The above description is only a preferred embodiment of the present utility model, but the protection scope of the present utility model is not limited thereto. Any equivalent substitutions or changes made by those skilled in the art within the technical scope disclosed in the present utility model, based on the technical solution and the inventive concept of the present utility model, should be included within the protection scope of the present utility model.
Claims
1. A memory module testing fixture, comprising a testing fixture (1) consisting of a first clamp (101) and a second clamp (102), wherein the first clamp (101) and the second clamp (102) are symmetrically distributed vertically and fixedly connected by bolts, wherein the first clamp (101) and the second clamp (102) clamp and fix the memory module motherboard (2), characterized in that, A protective component (3) extending to the outside of the first clamp (101) and the second clamp (102) is provided between the first clamp (101) and the second clamp (102). The protective component (3) is used to protect the pin parts of the memory module motherboard (2) that protrude from the outside of the first clamp (101) and the second clamp (102). The protective component (3) includes a protective sleeve (301), a connecting post (302), and a ball block (303); The protective sleeve (301) is fitted onto the outside of the pin portion of the memory module motherboard (2) to achieve protection of the pin portion of the memory module motherboard (2); The connecting post (302) is symmetrically fixed on both sides of one end of the protective sleeve (301), and the connecting post (302) extends through to the middle position of the first clamp (101) and the second clamp (102), and the ball block (303) is fixed to one end of the connecting post (302).
2. The memory module testing fixture according to claim 1, characterized in that, An L-shaped limiting groove (108) is provided at the position where the first clamp (101) and the second clamp (102) are spliced and contact the connecting post (302) and the ball block (303). The horizontal part of the L-shaped limiting groove (108) is used to move the connecting post (302) and the ball block (303) horizontally, thereby realizing the horizontal separation operation between the protective sleeve (301) and the pin part of the memory module motherboard (2). The vertical part of the L-shaped limiting slide (108) is used to provide vertical movement for the ball block (303) and the connecting column (302), and to realize the vertical separation operation between the protective sleeve (301) and the pin part of the memory module motherboard (2); The lower surface of the first clamp (101) is provided with an n-shaped storage groove (109), which is connected to the vertical part of the L-shaped limiting slide groove (108). The n-shaped storage groove (109) is used to provide space for the rotation and storage of the protective sleeve (301) and the connecting column (302).
3. A memory module testing fixture according to claim 2, characterized in that, The vertical cross-section of the L-shaped limiting slide (108) is circular, and the diameter of the L-shaped limiting slide (108) is matched with the diameter of the ball block (303). The diameter of the ball block (303) is larger than the diameter of the connecting column (302). The first clamp (101) and the second clamp (102) have straight slots formed at the ends near the protective sleeve (301) for the connecting column (302) to pass through. The straight slots are connected and communicate with the L-shaped limiting slide (108) and the n-shaped storage groove (109).
4. A memory module testing fixture according to claim 1, characterized in that, The test fixture (1) also includes a conductive adhesive base (103), a limiting frame (104), a pressure plate (105), an elastic fastener (106), and a fixing fastener (107); The second clamp (102) has an installation groove formed on its top. The conductive adhesive base (103) is embedded in the installation groove and extends to the bottom of the second clamp (102). The bottom end of the conductive adhesive base (103) is attached to the memory chip mounting pin on the memory module motherboard (2). The limiting frame (104) is installed inside the mounting groove and above the conductive adhesive base (103). The limiting frame (104) is used to provide limiting placement for the memory chip. One end of the pressure plate (105) is hinged to the top of the second clamp (102) and covers the upper surface of the limiting frame (104). The elastic fastener (106) is installed on the other end of the pressure plate (105). The fixed buckle (107) is installed on one end of the first clamp (101), and the elastic fastener (106) and the fixed buckle (107) are engaged to achieve a pressing operation on the memory chip placed inside the limiting frame (104).
5. A memory module testing fixture according to claim 2, characterized in that, The protective sleeve (301), connecting column (302), and ball block (303) are integrally formed by rubber injection molding process. The ball block (303) and the inner wall of the L-shaped limiting groove (108) and the protective sleeve (301) and the inner wall of the n-shaped storage groove (109) are in an interference fit.