Conversion device for chip automatic test

Abstract

The utility model discloses a conversion device for automatic testing of chips, which is used for carrying out arrangement conversion between a gravity sorting machine and a strip-shaped sorting machine and comprises an adapter plate, the adapter plate comprises a first end face and a second end face, the first end face is provided with a plurality of first ports, and the second end face is provided with a plurality of second ports. A plurality of first ports are formed in the first end face, a plurality of second ports are formed in the second end face, the second ports are electrically connected with the first ports, the second ports and the first ports are arranged in a staggered mode, first terminals of the gravity sorting machine are matched with the first ports, and second terminals of the belt-shaped sorting machine are matched with the second ports. According to the conversion device for the chip automatic test, through the arrangement of the adapter plate, the conversion between the gravity test base and the strip-shaped test base can be realized, and then a strip-shaped sorting machine can be tested.

Description

Technical Field

[0001] This utility model relates to the field of chip testing technology, and in particular, to a conversion device for automatic chip testing. Background Technology

[0002] Automated Test Equipment (ATE) for chips comprises an automated test bench, test carrier board, test base, and automated sorting machine. The automated test bench is the dedicated equipment for automated chip testing. The test carrier board is the primary support for the automated test bench and the chip under test (DUT). To facilitate DUT connection and protect the test carrier board, the DUT typically does not directly contact the test carrier board; instead, it contacts the test base mounted on the test carrier board. The automated sorting machine automatically picks up the DUT from the production line and places it into the test base on the test carrier board. After testing, it automatically picks up the tested chip and places it back onto the production line. Therefore, the design and layout of the test base must be customized depending on the specific sorting machine used.

[0003] Automated chip testing typically involves two stages. First, a small-batch, low-efficiency preliminary test is conducted to verify whether the chip testing process, procedures, and results meet expectations. If problems are found, they can be corrected or the testing plan redesigned. After the preliminary test, a large-batch, high-efficiency formal test can proceed. Therefore, the preliminary and formal tests have different focuses, resulting in the selection of different types of sorting machines.

[0004] Preliminary testing typically uses gravity sorting machines, while formal testing usually uses strip sorting machines. With the advancement of key technologies in the electronics industry, the chip industry is also undergoing increasingly rapid iteration and updates. Each technological advancement requires the chip used to implement this new technology to have one or more optimizations and improvements in aspects such as computing speed, power consumption, number of functions, size, and integration. The higher the requirements for the chip's various parameters, the more complex the processing flow will be. A more complex processing flow means higher processing difficulty, which will inevitably lead to a decrease in processing yield. A decrease in processing yield will inevitably lead to an increase in processing cost.

[0005] The automated chip testing industry can efficiently test chips for performance defects during chip R&D and mass production, ensuring product quality, shortening time to market, and reducing R&D costs. The test substrates used in automated chip testing are characterized by multiple layers, large board size, complex design, long design cycles, high manufacturing difficulty, and long production cycles. Furthermore, test substrates typically require the assembly of numerous electronic components. All these characteristics contribute to a relatively high overall cost for the test substrates. Since chip testing is divided into preliminary testing and formal testing, different chip sorting machines are required for each stage. Different chip sorting machines require different test base designs, necessitating the design and manufacture of two types of test substrates, thus doubling the R&D cost burden. Utility Model Content

[0006] Therefore, it is necessary to provide a conversion device for automatic chip testing that reduces R&D costs, shortens the R&D cycle, and accelerates chip testing time.

[0007] The technical solution adopted by this utility model to solve its technical problem is: a conversion device for automatic chip testing, used to convert the arrangement between a gravity sorter and a strip sorter. The conversion device for automatic chip testing includes an adapter plate, which includes a first end face and a second end face. The first end face is provided with a plurality of first ports, and the second end face is provided with a plurality of second ports. The second ports are electrically connected to the first ports, and the second ports are staggered from the first ports. The first terminal of the gravity sorter cooperates with the first port, and the second terminal of the strip sorter cooperates with the second port.

[0008] Furthermore, the first terminal of the gravity sorter is plugged into the first port, and the second terminal of the strip sorter is plugged into the second port.

[0009] Furthermore, the gravity sorting machine also includes a flat plate, on which the first terminal is disposed.

[0010] Furthermore, the strip sorting machine also includes a base, and the second terminal is disposed on the base.

[0011] Furthermore, the number of gravity sorters is the same as the number of the first ports, with one first port corresponding to one gravity sorter.

[0012] Furthermore, the number of the second ports is the same as the number of the first ports, with one second port corresponding to one first port.

[0013] Furthermore, the base is a cuboid structure.

[0014] Furthermore, the plate has a cuboid structure.

[0015] Furthermore, the gravity sorting machine has four components.

[0016] The beneficial effects of this utility model are: the automatic chip testing conversion device provided by this utility model can convert the gravity testing base and the strip testing base by setting an adapter plate, thereby enabling the strip sorting machine to be tested. Attached Figure Description

[0017] The present invention will be further described below with reference to the accompanying drawings and embodiments.

[0018] Figure 1 This is a schematic diagram of the conversion device for automatic chip testing according to this utility model.

[0019] The component names and their numbers in the figure are as follows: 1. Gravity sorter; 11. Flat plate; 12. First terminal; 2. Strip sorter; 21. Base; 22. Second terminal; 3. Adapter plate; 31. First end face; 311. First port; 32. Second end face; 321. Second port. Detailed Implementation

[0020] The present invention will now be described in detail with reference to the accompanying drawings. These drawings are simplified schematic diagrams, illustrating only the basic structure of the present invention, and therefore only show the components relevant to the present invention.

[0021] Please see Figure 1 This utility model provides a conversion device for automatic chip testing, used to convert the arrangement between a gravity sorter 1 and a strip sorter 2. The conversion device includes an adapter plate 3, which has a first end face 31 and a second end face 32. The first end face 31 cooperates with the gravity sorter 1, and the second end face 32 cooperates with the strip sorter 2. During installation, both the gravity sorter 1 and the strip sorter 2 can be plugged into the connector of the adapter plate 3.

[0022] The gravity sorting machine 1 includes a flat plate 11 and a first terminal 12. The flat plate 11 has a cuboid structure, and the first terminal 12 is disposed on the flat plate 11, engaging with the first end face 31 of the adapter plate 3. Furthermore, multiple gravity sorting machines 1 are included, each connected to the first end face 31. In this embodiment, four gravity sorting machines 1 are included. Furthermore, the gravity sorting machine 1 operates by using gravity to grasp and move chips. It features a simple structure, flexible operation, and is suitable for small-batch production, situations requiring manual intervention, and interruption testing for troubleshooting. The gravity test base corresponding to the gravity sorting machine 1 is a discrete design. The gravity test base has a first socket, which is plugged into the gravity sorting machine 1 to perform tests. At the same time, the volume of one gravity test base is relatively large, and the spatial distribution between two adjacent gravity test bases also needs to be relatively far apart to ensure that the gravity sorting machine 1 has enough operating space when automatically placing or removing chips.

[0023] The strip sorting machine 2 includes a base 21 and second terminals 22. The second terminals 22 are disposed on the base 21 and mate with the second end face 32 of the adapter plate 3. The base 21 has a cuboid structure, and there are multiple second terminals 22, which are evenly spaced on the base 21. In this embodiment, there are four second terminals 22.

[0024] Furthermore, the strip sorter 2 is used to process arrayed or strip-shaped chips with high density. Formal testing typically no longer requires manual intervention, achieving essentially fully automated testing. The strip sorter 2 can pick up and remove one or more rows of chips under test at once, greatly improving testing efficiency and meeting the needs of large-scale chip testing. The strip test base corresponding to the strip sorter 2 is an integrated design, with multiple second connectors. These second connectors are plugged into the strip sorter 2 to perform testing. Simultaneously, the spatial distribution of different chip test interfaces within a single strip test base is relatively close, ensuring that the strip sorter 2 can automatically place or remove multiple chips simultaneously.

[0025] Furthermore, the first end face 31 and the second end face 32 are disposed opposite to each other. The first end face 31 is provided with a plurality of first ports 311, the arrangement of which corresponds to the second socket on the strip-shaped test base. The first ports 311 are plugged into the first terminals 11. The second end face 32 is provided with a plurality of second ports 321, which are electrically connected to the first ports 311. The second ports 321 are staggered from the first ports 311, and their arrangement corresponds to the first socket on the gravity test base.

[0026] Furthermore, the number of gravity sorters 1 is the same as the number of first ports 311, with one first port 311 corresponding to one gravity sorter 1. In use, one gravity sorter 1 is plugged into one first port 311. The number of second ports 321 is the same as the number of first ports 311, with one second port 321 corresponding to one first port 311. This allows all signals to be grouped when the strip sorter 2 switches between the gravity sorter 1 and the gravity sorter 2.

[0027] Furthermore, the adapter board 3 can be made small in size and with a small number of layers, and its design difficulty and design cycle can be greatly shortened compared with traditional test carrier boards.

[0028] The automatic chip testing conversion device provided by this utility model can convert the gravity testing base to the strip testing base by setting the adapter plate 3, thereby enabling the strip sorting machine 2 to be tested.

[0029] Based on the above-described preferred embodiments of this utility model, and through the foregoing description, those skilled in the art can make various changes and modifications without departing from the scope of this utility model. The technical scope of this utility model is not limited to the contents of the specification, but must be determined according to the scope of the claims.

Claims

1. A conversion device for automatic chip testing, used to convert the layout of a gravity sorter and a strip sorter, characterized in that: The automatic chip testing conversion device includes an adapter board, which includes a first end face and a second end face. The first end face is provided with a plurality of first ports, and the second end face is provided with a plurality of second ports. The second ports are electrically connected to the first ports, and the second ports are staggered from the first ports. The first terminal of the gravity sorting machine cooperates with the first port, and the second terminal of the strip sorting machine cooperates with the second port.

2. The conversion device for automatic chip testing as described in claim 1, characterized in that: The first terminal of the gravity sorter is plugged into the first port, and the second terminal of the strip sorter is plugged into the second port.

3. The conversion device for automatic chip testing as described in claim 2, characterized in that: The gravity sorting machine also includes a flat plate, and the first terminal is disposed on the flat plate.

4. The conversion device for automatic chip testing as described in claim 2, characterized in that: The strip sorting machine also includes a base, and the second terminal is disposed on the base.

5. The conversion device for automatic chip testing as described in claim 3, characterized in that: The number of gravity sorters is the same as the number of the first ports, with one first port corresponding to one gravity sorter.

6. The conversion device for automatic chip testing as described in claim 1, characterized in that: The number of the second ports is the same as the number of the first ports, with one second port corresponding to one first port.

7. The conversion device for automatic chip testing as described in claim 4, characterized in that: The base is a cuboid structure.

8. The conversion device for automatic chip testing as described in claim 3, characterized in that: The flat plate has a cuboid structure.

9. The conversion device for automatic chip testing as described in claim 1, characterized in that: The gravity sorting machine has four units.

Images