Electronic detonator chip finished product detection device
By adjusting the position of the clamping component through threaded connection and spring structure, and combining the threaded rod and drive plate, the chip can be accurately fixed and easily replaced. This solves the problems of difficult adjustment of detection parameters and chip damage in existing equipment, and realizes efficient detection of electronic detonator chips.
Patent Information
- Application Number
- CN202422949278.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-02
- Publication Date
- 2025-11-14
- Estimated Expiration
- 2034-12-02
AI Technical Summary
Existing electronic detonator chip testing equipment cannot adjust testing parameters in real time, resulting in the inability to save testing information, easy confusion of chip types, and easy damage to chips of different thicknesses during the fixing process.
An electronic detonator chip finished product testing device was designed. By adjusting the position of the clamping part through threaded connection and spring structure, the device can accurately fix chips of different thicknesses. The threaded rod and drive plate enable convenient chip replacement and testing. Combined with the adjustment of the observation lens and the parameter adjustment of the finished product testing instrument, comprehensive analysis can be achieved.
It achieves protection for chips of different thicknesses, improves detection accuracy and convenience, ensures the preservation and analysis of detection information, and avoids chip damage and confusion.
Smart Images
Figure CN223551008U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of chip finished product testing technology, and more specifically, to a device for testing finished electronic detonator chips. Background Technology
[0002] During the finished and semi-finished product testing of electronic detonator chips, it is necessary to test various parameters of the detonator chip to ensure that all parameters are normal when the electronic detonator chip is powered on. However, when operators test electronic detonator chips, the testing equipment can only see the test error code of the detonator chip, but cannot know the specific test value. The test parameters cannot be adjusted in time, and the test information cannot be saved. This makes it easy for operators to get confused when handling chips, and it also prevents them from performing comprehensive analysis of the chips.
[0003] In the process of testing the parameters of electronic detonator chips, the electronic chip needs to be placed on the surface of the support platform, thereby applying vertical pressure to the electronic detonator chip to firmly fix its position, which is conducive to testing. However, since the chips of electronic detonators may have different thicknesses due to different models, applying the same pressure may crush the thicker electronic detonator chip. Therefore, it is necessary to improve and optimize the finished product testing device for electronic detonator chips. Utility Model Content
[0004] In order to overcome the shortcomings of the existing technology, this utility model provides a finished product testing device for electronic detonator chips, which has the advantage of preventing damage to the electronic detonator chips when they are pressed in place due to uneven thickness.
[0005] To achieve the above objectives, this utility model provides the following technical solution: a testing device for finished electronic detonator chips, comprising a testing platform, an adjustment structure disposed in the middle of the testing platform, a first fixed column fixedly connected to the upper surface of the adjustment structure, a first driving plate movably connected to the curved surface of the first fixed column, a connecting plate fixedly connected to the upper surface of the first driving plate, a first fixed plate fixedly connected to the upper surface of the connecting plate, the first fixed plate and the first fixed column being movably connected, a first spring fixedly connected to the upper surface of the first fixed plate, an iron ring fixedly connected to the upper part of the first spring, the iron ring being movably connected to the first fixed column, a thread disposed on the upper part of the first driving plate, a nut assembly threadedly connected to the thread, a circular groove opened on the curved surface in the middle of the iron ring, the nut assembly being movably connected inside the circular groove, a clamping structure disposed on the lower surface of the first fixed plate, and a support platform fixedly connected to the upper surface of the adjustment structure.
[0006] As a preferred technical solution of this utility model: the adjustment structure includes a straight slide groove formed on the upper surface of the test platform, a slide plate movably connected inside the straight slide groove, the upper surface of the slide plate being fixedly connected to the lower surface of the support platform, a threaded rod being threadedly connected inside the slide plate, and a drive disc being fixedly connected to the front end surface of the threaded rod.
[0007] As a preferred technical solution of this utility model: a limiting block is fixedly connected to the upper surface of the test platform, and the threaded rod is rotatably connected inside the limiting block.
[0008] As a preferred technical solution of this utility model: a vertical sliding groove is provided on the inner surface of the connecting plate, a second driving plate is movably connected inside the vertical sliding groove, the second driving plate is movably connected to the first fixed column, a second fixed column is fixedly connected to the upper surface of the second driving plate, a second fixed plate is fixedly connected to the upper surface of the second fixed column, an observation mirror is fixedly connected to the lower rear surface of the second fixed plate, a second spring is fixedly connected to the lower front surface of the second fixed plate, and the lower part of the second spring is fixedly connected to the upper surface of the first fixed plate.
[0009] As a preferred technical solution of this utility model: the clamping structure includes a circular hole opened on the surface of the first fixing plate, the inner surface of the circular hole is movably connected to the lower outer surface of the observation mirror, and a clamping member is fixedly connected to the lower surface of the first fixing plate at the circular hole.
[0010] As a preferred technical solution of this utility model: the first drive plate is internally connected to a limiting post, and the limiting post is fixedly connected to the upper surface of the slide plate.
[0011] As a preferred technical solution of this utility model: a finished product testing instrument is fixedly connected to the upper rear surface of the test platform, and adjustment knobs are provided on both the left and right sides of the finished product testing instrument.
[0012] Compared with the prior art, the beneficial effects of this utility model are as follows:
[0013] 1. This utility model, by finely adjusting the position of the nut assembly in the thread, ensures that after the first drive plate is lifted, the elastic potential energy of the first spring causes the first spring to push the clamping member fixedly connected to the lower end of the first fixed plate by a displacement that precisely fixes the electronic chip to the upper surface of the support platform. Compared with traditional devices, when lifting the first drive plate, because the iron ring is fixedly connected to the upper end of the first fixed post, the downward displacement of the first fixed plate is always equal. When testing electronic detonator chips of different thicknesses, the chips may be crushed. This device can better protect the electronic detonator chips.
[0014] 2. This utility model uses the rotation of the drive disc to drive the rotation of the threaded rod, thereby moving the slide plate back and forth inside the straight slide groove, which facilitates the replacement and testing of different detonator chips. The continuity of the thread can improve the accuracy of electronic detonator testing. Compared with traditional devices, which move the slide plate by the handle, excessive force by the operator can damage the electronic detonator chip. Attached Figure Description
[0015] Figure 1 This is a schematic diagram of the structure of this utility model;
[0016] Figure 2 This is a schematic diagram of the clamping component structure of this utility model;
[0017] Figure 3 This is a schematic diagram of the threaded rod structure of this utility model;
[0018] Figure 4 This is a schematic cross-sectional view of the nut assembly of this utility model;
[0019] Figure 5 This is an exploded view of the iron ring and nut assembly of this utility model.
[0020] In the diagram: 1. Test platform; 2. First fixed post; 3. First drive plate; 4. Connecting plate; 5. First fixed plate; 6. First spring; 7. Iron ring; 8. Thread; 9. Nut assembly; 10. Circular slide groove; 11. Support platform; 12. Straight slide groove; 13. Slide plate; 14. Threaded rod; 15. Drive disc; 16. Limiting block; 17. Vertical slide groove; 18. Second drive plate; 19. Second fixed post; 20. Second fixed plate; 21. Observation mirror; 22. Second spring; 23. Circular hole; 24. Clamping component; 25. Limiting post; 26. Finished product detector; 27. Adjustment knob. Detailed Implementation
[0021] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.
[0022] like Figures 1 to 5As shown, this utility model provides a finished product testing device for electronic detonator chips, including a test bench 1. An adjustment structure is provided in the middle of the test bench 1. A first fixed post 2 is fixedly connected to the upper surface of the adjustment structure. A first drive plate 3 is movably connected to the curved surface of the first fixed post 2. A connecting plate 4 is fixedly connected to the upper surface of the first drive plate 3. A first fixed plate 5 is fixedly connected to the upper surface of the connecting plate 4. The first fixed plate 5 is movably connected to the first fixed post 2. A first spring 6 is fixedly connected to the upper surface of the first fixed plate 5. An iron ring 7 is fixedly connected to the upper part of the first spring 6. The iron ring 7 is movably connected to the first fixed post 2. A thread 8 is provided on the upper part of the first drive plate 3. A nut assembly 9 is threadedly connected to the thread 8. A circular groove 10 is opened on the curved surface in the middle of the iron ring 7. The nut assembly 9 is movably connected inside the circular groove 10. A clamping structure is provided on the lower surface of the first fixed plate 5. A support platform 11 is fixedly connected to the upper surface of the adjustment structure.
[0023] During the finished and semi-finished product testing of electronic detonator chips, it is necessary to test various parameters of the detonator chip to ensure that all parameters are normal when the electronic detonator chip is powered on. Before placing the chip on the upper surface of the tray 11, the first drive plate 3 is lifted upward. Since the first drive plate 3, the connecting plate 4, and the first fixing plate 5 are fixedly connected, the first fixing plate 5 will inevitably rise when the first drive plate 3 is lifted. The first spring 6 is fixedly connected to the upper surface of the first fixing plate 5, and the iron ring 7 fixedly connected to the upper part of the first spring 6 is movably connected to the first fixing post 2. The position of the iron ring 7 is controlled by the threaded connection position of the nut assembly 9 and the thread 8. When the nut assembly 9 moves up and down, the lower part of the nut assembly 9 rotates inside the circular slide groove 10, thereby driving the iron ring 7 to move up and down, thereby adjusting the position of the iron ring 7, thereby changing the pressure of the clamping member 24 on the electronic detonator chip. Then, the chip is placed on the upper surface of the tray 11, and no longer the first drive plate 3 is given upward lifting force. Due to the elastic potential energy of the first spring 6, the connecting plate 4 moves downward to fix the electronic chip.
[0024] The adjustment structure includes a straight slide groove 12 on the upper surface of the test platform 1, a slide plate 13 is movably connected inside the straight slide groove 12, the upper surface of the slide plate 13 is fixedly connected to the lower surface of the support platform 11, a threaded rod 14 is threadedly connected inside the slide plate 13, and a drive disc 15 is fixedly connected to the front end surface of the threaded rod 14.
[0025] When the electronic detonator chip is placed on the upper surface of the tray 11 and its position is fixed by the clamping member 24, the drive disk 15 can be rotated. Since the threaded rod 14 fixedly connected to the rear end of the drive disk 15 is threadedly connected to the slide plate 13, the slide plate 13 is driven to move back and forth inside the straight slide groove 12, thereby sending the electronic detonator chip to the test end of the finished product tester 26 for testing. When it is necessary to replace the electronic detonator chip for testing, the slide plate 13 can be moved to the front end by rotating the drive disk 15 in the opposite direction, thereby facilitating the replacement of the electronic detonator chip.
[0026] Among them, the upper surface of the test bench 1 is fixedly connected to the limit block 16, and the threaded rod 14 is rotatably connected inside the limit block 16.
[0027] The position of the threaded rod 14 is fixed by the limiting block 16. The threaded rod 14 rotates inside the limiting block 16 to prevent the position of the threaded rod 14 from changing, thereby causing positional errors in the electronic detonator chip test.
[0028] The connecting plate 4 has a vertical sliding groove 17 on its inner surface. A second drive plate 18 is movably connected inside the vertical sliding groove 17. The second drive plate 18 is movably connected to the first fixed post 2. A second fixed post 19 is fixedly connected to the upper surface of the second drive plate 18. A second fixed plate 20 is fixedly connected to the upper surface of the second fixed post 19. An observation mirror 21 is fixedly connected to the lower rear surface of the second fixed plate 20. A second spring 22 is fixedly connected to the lower front surface of the second fixed plate 20. The lower part of the second spring 22 is fixedly connected to the upper surface of the first fixed plate 5.
[0029] By adjusting the upward movement of the second drive plate 18, since the second fixed post 19 is movably connected inside the first fixed plate 5 and the second spring 22 is fixedly connected to the upper surface of the first fixed plate 5, the elastic potential energy of the second spring 22 drives the second fixed plate 20 to move upward, thereby causing the observation lens 21 to disengage from the inside of the clamping member 24, thus changing the distance of the observation lens 21 from the electronic detonator chip.
[0030] The clamping structure includes a circular hole 23 on the surface of the first fixing plate 5. The inner surface of the circular hole 23 is movably connected to the lower outer surface of the observation mirror 21. A clamping member 24 is fixedly connected to the lower surface of the first fixing plate 5 at the circular hole 23.
[0031] The observation lens 21 can be inserted into the clamping member 24 through the circular hole 23, and the lower part of the clamping member 24 can press the electronic detonator chip placed on the upper surface of the support 11.
[0032] The first drive plate 3 has a movable connection to a limiting post 25, which is fixedly connected to the upper surface of the slide plate 13.
[0033] The position of the first drive plate 3 is limited by the limiting post 25. Since the first drive plate 3 is movably connected to the first fixed post 2, if the first drive plate 3 is not present, the first drive plate 3 will rotate along the outside of the first fixed post 2, thereby affecting the accuracy of the clamping member 24 in clamping the electronic detonator chip.
[0034] Among them, the upper rear surface of the test bench 1 is fixedly connected to the finished product tester 26, and the left and right sides of the finished product tester 26 are equipped with adjustment knobs 27.
[0035] The output voltage and current parameters of the finished product tester 26 can be adjusted by adjusting knob 27. The finished product tester 26 performs parameter detection on the electronic detonator chip to determine whether the electronic detonator is a finished product.
[0036] Working principle and usage process of this utility model:
[0037] During the finished and semi-finished product testing of electronic detonator chips, it is necessary to test various parameters of the detonator chip to ensure that all parameters are normal when the electronic detonator chip is powered on. Before placing the chip on the upper surface of the tray 11, the first drive plate 3 is lifted upward. Since the first drive plate 3, the connecting plate 4, and the first fixing plate 5 are fixedly connected, the first fixing plate 5 will inevitably rise when the first drive plate 3 is lifted. The first spring 6 is fixedly connected to the upper surface of the first fixing plate 5, and the iron ring 7 fixedly connected to the upper part of the first spring 6 is movably connected to the first fixing post 2. The position of the iron ring 7 is controlled by the threaded connection position of the nut assembly 9 and the thread 8. When the nut assembly 9 moves up and down, the lower part of the nut assembly 9 rotates inside the circular slide groove 10, thereby driving the iron ring 7 to move up and down, thereby adjusting the position of the iron ring 7, thereby changing the pressure of the clamping member 24 on the electronic detonator chip. Then, the chip is placed on the upper surface of the tray 11, and no longer the first drive plate 3 is given upward lifting force. Due to the elastic potential energy of the first spring 6, the connecting plate 4 moves downward to fix the electronic chip.
[0038] When the electronic detonator chip is placed on the upper surface of the tray 11 and its position is fixed by the clamping member 24, the drive disk 15 can be rotated. Since the threaded rod 14 fixedly connected to the rear end of the drive disk 15 is threadedly connected to the slide plate 13, the slide plate 13 is driven to move back and forth inside the straight slide groove 12, thereby sending the electronic detonator chip to the test end of the finished product tester 26 for testing. When it is necessary to replace the electronic detonator chip for testing, the slide plate 13 can be moved to the front end by rotating the drive disk 15 in the opposite direction, thereby facilitating the replacement of the electronic detonator chip.
[0039] The position of the threaded rod 14 is fixed by the limiting block 16. The threaded rod 14 rotates inside the limiting block 16 to prevent the position of the threaded rod 14 from changing, thereby causing positional errors in the electronic detonator chip test.
[0040] By adjusting the upward movement of the second drive plate 18, since the second fixed post 19 is movably connected inside the first fixed plate 5 and the second spring 22 is fixedly connected to the upper surface of the first fixed plate 5, the elastic potential energy of the second spring 22 drives the second fixed plate 20 to move upward, thereby causing the observation lens 21 to disengage from the inside of the clamping member 24, thus changing the distance of the observation lens 21 from the electronic detonator chip.
[0041] The observation lens 21 can be inserted into the clamping member 24 through the circular hole 23, and the lower part of the clamping member 24 can press the electronic detonator chip placed on the upper surface of the support 11.
[0042] The position of the first drive plate 3 is limited by the limiting post 25. Since the first drive plate 3 is movably connected to the first fixed post 2, if the first drive plate 3 is not present, the first drive plate 3 will rotate along the outside of the first fixed post 2, thereby affecting the accuracy of the clamping member 24 in clamping the electronic detonator chip.
[0043] The output voltage and current parameters of the finished product tester 26 can be adjusted by adjusting knob 27. The finished product tester 26 performs parameter detection on the electronic detonator chip to determine whether the electronic detonator is a finished product.
[0044] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus.
[0045] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.
Claims
1. A testing device for finished electronic detonator chips, comprising a testing platform (1), characterized in that: An adjustment structure is provided in the middle of the test platform (1). A first fixed column (2) is fixedly connected to the upper surface of the adjustment structure. A first drive plate (3) is movably connected to the curved surface of the first fixed column (2). A connecting plate (4) is fixedly connected to the upper surface of the first drive plate (3). A first fixed plate (5) is fixedly connected to the upper surface of the connecting plate (4). The first fixed plate (5) is movably connected to the first fixed column (2). A first spring (6) is fixedly connected to the upper surface of the first fixed plate (5). An iron ring (7) is fixedly connected to the upper part of the first spring (6), and the iron ring (7) is movably connected to the first fixed post (2). The upper part of the first drive plate (3) is provided with a thread (8), and a nut assembly (9) is threadedly connected in the thread (8). A circular groove (10) is opened on the curved surface of the middle part of the iron ring (7), and the nut assembly (9) is movably connected inside the circular groove (10). A clamping structure is provided on the lower surface of the first fixed plate (5), and a support platform (11) is fixedly connected to the upper surface of the adjustment structure.
2. The electronic detonator chip finished product testing device according to claim 1, characterized in that: The adjustment structure includes a straight slide groove (12) opened on the upper surface of the test platform (1), a slide plate (13) is movably connected inside the straight slide groove (12), the upper surface of the slide plate (13) is fixedly connected to the lower surface of the support platform (11), a threaded rod (14) is threadedly connected inside the slide plate (13), and a drive disk (15) is fixedly connected to the front end surface of the threaded rod (14).
3. The electronic detonator chip finished product testing device according to claim 1, characterized in that: A limiting block (16) is fixedly connected to the upper surface of the test bench (1), and a threaded rod (14) is rotatably connected inside the limiting block (16).
4. The electronic detonator chip finished product testing device according to claim 1, characterized in that: The inner surface of the connecting plate (4) is provided with a vertical sliding groove (17). The second driving plate (18) is movably connected inside the vertical sliding groove (17). The second driving plate (18) is movably connected to the first fixed column (2). The upper surface of the second driving plate (18) is fixedly connected to the second fixed column (19). The upper surface of the second fixed column (19) is fixedly connected to the second fixed plate (20). The lower rear surface of the second fixed plate (20) is fixedly connected to the observation mirror (21). The lower front surface of the second fixed plate (20) is fixedly connected to the second spring (22). The lower part of the second spring (22) is fixedly connected to the upper surface of the first fixed plate (5).
5. The electronic detonator chip finished product testing device according to claim 1, characterized in that: The clamping structure includes a circular hole (23) on the surface of the first fixing plate (5). The inner surface of the circular hole (23) is movably connected to the lower outer surface of the observation mirror (21). A clamping member (24) is fixedly connected to the lower surface of the first fixing plate (5) at the circular hole (23).
6. The electronic detonator chip finished product testing device according to claim 1, characterized in that: The first drive plate (3) has a movable connection to a limiting post (25), which is fixedly connected to the upper surface of the slide plate (13).
7. The electronic detonator chip finished product testing device according to claim 1, characterized in that: The test bench (1) is fixedly connected to the upper rear surface of the test bench (1), and the test bench (26) is provided with adjustment knobs (27) on both the left and right sides.