Self-checking laser

Abstract

The utility model provides a self-checking laser. The self-checking laser comprises a shell, and a laser transmitter, a first detector, a second detector, a partition plate, a first detector lens, a second detector lens and a reference gas chamber which are all packaged in the shell, the laser transmitter is used for outputting a laser beam with a specific wavelength; the first detector is arranged at the rear end of the first detector lens in the light path direction and is used for receiving the returned detection main light path light beam so as to detect the gas concentration of the target space; the second detector is arranged at the rear end of the second detector lens in the light path direction and is used for receiving and detecting reflected light before the main light path light beam enters the target space to form a reference light path; the reference gas chamber is a light-transmitting gas chamber in which specific concentration standard detection gas is packaged, and the reference light path passes through the reference gas chamber and then reaches the second detector for calibration. The self-checking laser has the advantages that self-checking and detection are integrated, the size is small, and self-checking calibration is achieved.

Description

Technical Field

[0001] This utility model relates to the field of laser technology, and more specifically, to a self-testable laser. Background Technology

[0002] Tunable diode laser absorption spectroscopy (TDLAS) technology boasts advantages such as high sensitivity, strong anti-interference capabilities, and fast response. TDLAS technology modulates the wavelength of a laser, causing it to scan across the absorption peaks of a target gas. When the laser's output wavelength coincides with the absorption line of the target gas, the gas molecules absorb the laser energy, leading to a decrease in laser intensity. By measuring the intensity change of the laser before and after passing through the gas, the concentration of gas molecules can be calculated based on Beer-Lambert's law.

[0003] However, the wavelength of laser output light is affected by environmental factors such as temperature, humidity, mechanical vibration and changes in external light intensity. In addition, the aging of the laser over time will also cause changes in the wavelength of laser output light.

[0004] Therefore, in order to ensure the accuracy and stability of TDLAS technology, it is necessary to detect and calibrate the wavelength of the laser output light.

[0005] In traditional solutions, the laser needs to be tested and calibrated independently, which is a relatively complex process. How to integrate the self-testing process into the laser is a new problem that urgently needs to be solved.

[0006] In order to solve the above problems, people have been seeking an ideal technological solution. Utility Model Content

[0007] The purpose of this invention is to address the shortcomings of existing technologies by providing a self-testing laser with an integrated design of self-testing and detection, a compact size, and the ability to perform self-testing and calibration.

[0008] To achieve the above objectives, the technical solution adopted by this utility model is: a self-testable laser, including a housing and a laser emitter, a first detector, a second detector, a partition, a laser lens, a first detector lens, a second detector lens, and a reference gas chamber, all encapsulated in the housing;

[0009] The laser emitter is positioned at the front end of the laser lens in the optical path direction to output a laser beam of a specific wavelength, forming the main detection optical path beam;

[0010] The first detector is positioned at the rear end of the first detector lens in the optical path direction to receive the returned detection main optical path beam in order to detect the gas concentration in the target space.

[0011] The first detector and the first detector lens are spatially isolated from the laser emitter and the laser lens by a partition;

[0012] The second detector is positioned at the rear end of the second detector lens in the optical path direction to receive scattered or reflected light before the main optical path beam enters the target space, thus forming a reference optical path.

[0013] The reference gas chamber is a light-transmitting gas chamber containing a standard detection gas of a specific concentration. It is positioned at the front end of the second detector in the optical path direction. The reference optical path passes through the reference gas chamber and reaches the second detector, which is used to calibrate the parameters of the laser beam emitted by the laser emitter.

[0014] Based on the above, the second detector and the second detector lens are spatially isolated from the laser emitter and the laser lens by a partition, and the reference optical path includes the reflected light before the main optical path beam enters the target space.

[0015] Based on the above, there is no isolation between the second detector and the second detector lens and the laser emitter. The second detector lens and the laser lens are the same lens. The reflected light received by the second detector is partly or entirely from the light reflected from the light-emitting interface of the second detector lens and / or the laser lens.

[0016] Based on the above, the laser emitter, the first detector, and the second detector are disposed on the same plane.

[0017] Based on the above, the laser emitter is located between the first detector and the second detector.

[0018] Based on the above, the laser emitter, the second detector, and the first detector are arranged in a left-to-right or right-to-left order.

[0019] Based on the above, the laser emitter, the first detector, and the second detector are all integrated on the chip carrier.

[0020] Based on the above, the chip carrier is mounted on the substrate, and the chip carrier has several pins led out through the substrate.

[0021] Based on the above, the reference gas chamber is integrated into the second detector lens.

[0022] This invention represents a substantial advancement over existing technologies. Specifically, it integrates a second detector, a second detector lens, and a reference gas chamber within the laser. A reference optical path is formed using scattered or reflected light generated during the main optical path's emission process before entering the target space. The parameters of this reference optical path are identical to those of the laser emitted by the laser transmitter. The reference gas chamber is filled with a standard concentration gas that exhibits a clear absorption characteristic for specific wavelengths of light emitted by the laser. The wavelength change of the reference light after passing through this gas sample is captured by the second detector. By comparing the actual measured values ​​with the theoretical values, the system can adjust the laser's output wavelength in real time, achieving high-precision wavelength calibration.

[0023] Furthermore, the laser, first detector, second detector, and necessary lens system are integrated into a single package. By designing the optical path using a single device, gas detection can be performed simultaneously with monitoring of laser-related parameters. This not only reduces the overall size but also improves the system's anti-interference capability and environmental adaptability.

[0024] Furthermore, the second detector, combined with the reference optical path, can continuously monitor and adjust the output wavelength of the laser. Even if changes in the external environment or laser aging cause wavelength drift, it can quickly lock the wavelength at the preset value, ensuring the stability and consistency of the output wavelength. Attached Figure Description

[0025] Figure 1 This is a schematic diagram of the self-testable laser in Embodiment 1 of this utility model.

[0026] Figure 2 This is a schematic diagram illustrating the operating principle of the self-testable laser in Embodiment 1 of this utility model.

[0027] Figure 3 This is a schematic diagram of the self-testable laser in Embodiment 2 of this utility model.

[0028] Figure 4 This is a schematic diagram illustrating the operating principle of the self-testable laser in Embodiment 2 of this utility model.

[0029] In the diagram: 1. Outer shell; 2. Laser emitter; 3. First detector; 4. Second detector; 5. Laser lens; 6. First detector lens; 7. Second detector lens; 8. Reference gas chamber; 9. Separator; 10. Chip carrier; 11. Substrate; 12. Pin; 13. Laser; 14. Incident lens; 15. Reflecting lens; 16. Cavity; 17. Detection main optical path beam; 18. Reflected light. Detailed Implementation

[0030] The technical solution of this utility model will be further described in detail below through specific embodiments.

[0031] like Figure 1 As shown, a self-testable laser includes a housing 1 and a laser emitter 2, a first detector 3, a second detector 4, a partition 9, a laser lens 5, a first detector lens 6, a second detector lens 7, and a reference gas chamber 8, all encapsulated in the housing 1.

[0032] The outer casing is used to encapsulate the chip and chip carrier, protecting the precision components inside the device from the influence of the external environment.

[0033] The laser emitter 2 is positioned at the front end of the laser lens 5 in the optical path direction to output a laser beam of a specific wavelength, forming the main optical path beam for detection.

[0034] The first detector 3 is positioned at the rear end of the first detector lens 6 in the optical path direction to receive the returned detection main optical path beam to detect the gas concentration in the target space. In this embodiment, the target space is a gas chamber set in the gas sensor. The gas chamber includes two lenses arranged opposite each other and a space for introducing gas. The detection main optical path beam enters the gas chamber from one of the lenses and undergoes multiple reflections with the cooperation of the two lenses, eventually returning from the exit window of the incident lens to the position where the self-testing laser is installed.

[0035] The first detector 3 and the first detector lens 6 are spatially isolated from the laser emitter 2 and the laser lens 5 by the partition 9. The main purpose of this is to prevent the emitted laser beam from interfering with the detection accuracy of the first detector 3.

[0036] The second detector 4 is positioned at the rear end of the second detector lens 7 in the optical path direction to receive the reflected light before the main optical path beam enters the target space, thus forming a reference optical path.

[0037] In this embodiment, as Figure 1 As shown, the second detector 4 and the second detector lens 7 are spatially isolated from the laser emitter 2 and the laser lens 5 by a partition 9, and the laser emitter 2 is located between the first detector 3 and the second detector 4.

[0038] The reference optical path includes detecting the reflected light before the main optical path beam enters the target space; specifically, in conjunction with... Figure 3 It is known that the main optical path beam will generate reflected light at the incident end lens, and this part of the reflected light is used for the calibration of the laser emitter 2 in this embodiment.

[0039] The reference gas chamber 8 is a light-transmitting gas chamber containing a standard detection gas of a specific concentration. The reference gas chamber 8 is integrated into the lens 6 of the second detector and is positioned at the front end of the second detector 4 in the optical path direction. The reference optical path passes through the reference gas chamber and reaches the second detector, which is used to calibrate the parameters of the laser beam emitted by the laser emitter.

[0040] To improve the integration of the package, the laser emitter 2, the first detector 3 and the second detector 4 are disposed on the same plane. The laser emitter 2, the first detector 3 and the second detector 4 are all integrated on the chip carrier 10. The chip carrier 10 is mounted on the substrate 11, and several pins 12 are led out from the chip carrier 10 through the substrate 11.

[0041] Working principle explanation:

[0042] First, the principle and structure of the gas sensor are introduced, which can be simplified to include a laser 13 and an optical cavity. The optical cavity includes an incident lens 14, a reflecting lens 15, and a cavity 16 located between the two. The gas to be detected enters the cavity 16. The detection main optical beam 17 emitted by the laser 13 enters the cavity 16 from the incident end of the incident lens 14, and is reflected multiple times in the optical cavity constructed by the incident lens 14 and the reflecting lens 15. Finally, the detection main optical beam 17 returns to the area where the laser 13 is located from the window of the incident lens 14.

[0043] Specifically, in conjunction with the scheme disclosed in this utility model, the returned detection main optical path beam 17 enters the first detector lens 6 and reaches the first detector 3, and the first detector 3 completes the detection of the concentration of the gas to be detected in the optical cavity.

[0044] In the calibration design, before entering the incident lens 14, the main detection beam 17 generates reflected light at the incident interface of the incident lens 14. This reflected light directly enters the second detector lens 7 and reaches the second detector 4, passing through the reference gas chamber 8. The reference gas chamber 8 contains a target detection gas sample of a specific concentration, which has a clear absorption characteristic for light of a specific wavelength emitted by the laser. After the laser light passes through this gas sample, the wavelength change is captured by the second detector 4. By comparing the actual measured value with the theoretical value, the system can adjust the output wavelength of the laser in real time, achieving high-precision wavelength calibration.

[0045] The calibration process can be performed continuously and dynamically, thus avoiding the cumbersome operation of traditional lasers that require separate disassembly or calibration with special equipment.

[0046] Example 2

[0047] The significant difference between this embodiment and Embodiment 1 is that, as Figure 2As shown, there is no isolation between the second detector 4 and the second detector lens 7 and the laser emitter 2. The second detector lens 7 and the laser lens 5 are the same lens. The reference optical path includes the reflected light before the main optical path beam enters the target space.

[0048] Specifically, such as Figure 4 As shown, since there is no partition, the detection main beam will generate reflected light when it leaves the exit interface of the lens that is integrated with the second detector lens 7 and the laser lens 5. This reflected light is used for the calibration of the laser emitter 2 in this embodiment.

[0049] Specifically, in terms of distribution, the laser emitter 2, the second detector 3, and the first detector 4 are arranged in a left-to-right or right-to-left order.

[0050] This self-testing laser employs integrated packaging technology, improving the system's anti-interference capability and environmental adaptability while reducing its overall size, facilitating its use in miniaturized applications. Furthermore, by using a specific concentration of gas sample encapsulated in a reference chamber, dynamic calibration of the laser's output wavelength is achieved, ensuring the stability and accuracy of the output wavelength even under conditions of external environmental changes or laser aging leading to wavelength drift. This integrated, self-testing infrared laser has broad application prospects in the field of gas detection, significantly improving the accuracy and reliability of gas detection.

[0051] Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of this utility model and not to limit it; although the utility model has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications can still be made to the specific implementation of this utility model or equivalent substitutions can be made to some technical features without departing from the spirit of the technical solution of this utility model, and all such modifications and substitutions should be covered within the scope of the technical solution claimed by this utility model.

Claims

1. A self-testing laser, characterized in that: It includes a housing and a laser emitter, a first detector, a second detector, a partition, a laser lens, a first detector lens, a second detector lens, and a reference gas chamber, all encapsulated within the housing; The laser emitter is positioned at the front end of the laser lens in the optical path direction to output a laser beam of a specific wavelength, forming the main detection optical path beam; The first detector is positioned at the rear end of the first detector lens in the optical path direction to receive the returned detection main optical path beam in order to detect the gas concentration in the target space. The first detector and the first detector lens are spatially isolated from the laser emitter and the laser lens by a partition; The second detector is positioned at the rear end of the second detector lens in the optical path direction to receive the reflected light before the main optical path beam enters the target space, thus forming a reference optical path; The reference gas chamber is a light-transmitting gas chamber containing a standard detection gas of a specific concentration. It is positioned at the front end of the second detector in the optical path direction. The reference optical path passes through the reference gas chamber and reaches the second detector, which is used to calibrate the parameters of the laser beam emitted by the laser emitter.

2. The self-testable laser according to claim 1, characterized in that: The second detector and the second detector lens are spatially isolated from the laser emitter and the laser lens by a partition.

3. The self-testable laser according to claim 1, characterized in that: There is no isolation between the second detector and the second detector lens and the laser emitter. The second detector lens and the laser lens are the same lens. The reflected light received by the second detector is partly or entirely reflected from the light output interface of the second detector lens and / or the laser lens.

4. The self-testable laser according to claim 2 or 3, characterized in that: The laser emitter, the first detector, and the second detector are arranged on the same plane.

5. The self-testable laser according to claim 4, characterized in that: The laser emitter is located between the first detector and the second detector.

6. The self-testable laser according to claim 4, characterized in that: The laser emitter, the second detector, and the first detector are arranged in a left-to-right or right-to-left order.

7. The self-testable laser according to claim 5 or 6, characterized in that: The laser emitter, the first detector, and the second detector are all integrated on the chip carrier.

8. The self-testable laser according to claim 7, characterized in that: The chip carrier is mounted on the substrate, and several pins are led out from the substrate through the chip carrier.

9. The self-testable laser according to any one of claims 1-3, characterized in that: The reference gas chamber is integrated into the second detector lens.

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