Probe fixing device of portable testing device

Abstract

The utility model discloses a portable testing device probe fixing device, which relates to the technical field of testing equipment auxiliary devices and comprises a spring pressure device used for fixing a probe and a plurality of fixing support legs distributed along the circumferential direction of the spring pressure device so that the probe is kept in a vertical state above a circuit board. And the end part of one fixing support leg is connected with a circuit board fixing plate clamp. The probe is fixed through the spring pressure device, the probe is kept in an upright state through the fixing supporting legs, so that the probe is not prone to sliding at a testing point, the probe is locked through the spring pressure device, the probe cannot move, and the position fixing and anti-sliding effects are achieved.

Description

Technical Field

[0001] This utility model relates to the technical field of auxiliary devices for testing equipment, specifically to a probe fixing device for a portable testing device. Background Technology

[0002] Many existing testing devices, such as oscilloscopes, typically use a Y-shaped mounting bracket for their probes, consisting of a clamp and two legs. In use, the middle of the channel probe is placed on the clamp of the bracket, with the two legs serving as one support point and the probe's apex as the other stable support point for point measurements. This creates a mutually supporting structure between the bracket and the probe. However, this mounting method has the following disadvantages:

[0003] 1. Since the middle part of the probe serves as the support point for the upper part, the probe and the bracket are attached together, which makes it easy for the probe to slip out of the clamp, causing a short circuit and damaging the circuit board.

[0004] 2. The two legs of the bracket are of fixed length, which means that it is more reliable when used on a relatively flat circuit board. However, in reality, there are chips, connectors, heat sinks, etc. on the circuit board, which will make the circuit board of the device not flat. Under such circumstances, using two legs poses a risk of tipping over and being unstable.

[0005] 3. In traditional fixed brackets, the probe and the fixed bracket support each other, and the probe is tilted. This requires that there should be no high protrusions in the space near the probe where the tilt angle is small. Utility Model Content

[0006] The purpose of this utility model is to provide a portable testing device probe fixing device. The probe is fixed by a spring pressure device and kept upright by a fixed support foot, so that the probe is not easy to slide at the test point. The spring pressure device locks the probe so that it cannot move, thus playing the role of fixing the position and preventing slippage.

[0007] To solve the above-mentioned technical problems, the present invention adopts the following solution:

[0008] A portable test device probe fixing device includes a spring pressure device for fixing the probe and several fixing feet. The fixing feet are distributed circumferentially along the spring pressure device to keep the probe upright above the circuit board. A circuit board fixing clamp is connected to the end of one of the fixing feet.

[0009] In some specific solutions, the spring pressure device includes a fixed base, a first fixed spring member and a second fixed spring member. A through hole for the probe to pass through is opened at the center of the fixed base. The first fixed spring member and the second fixed spring member are fixed on the fixed base and symmetrically arranged on both sides of the probe to clamp the probe.

[0010] In some specific solutions, both the first and second fixed spring components include a telescopic column and a fixing block. A positioning spring is fixed inside the telescopic column, with one end of the positioning spring fixed to the fixing seat and the other end fixed to the inner bottom of the telescopic column. The fixing block is fixed to the bottom of the telescopic column, and the top of the telescopic column is fixed to the fixing seat.

[0011] In some specific designs, the mounting base is equipped with a locking device to secure the probe.

[0012] In some specific solutions, the mounting base is provided with a fixing groove for installing the locking component. The locking component includes a first half locking sleeve and a second half locking sleeve. The first half locking sleeve and the second half locking sleeve are spliced ​​together to form the locking sleeve of the probe. The first half locking sleeve and the second half locking sleeve are fixed by bolts to lock the probe.

[0013] In some specific designs, a baffle is provided above the edge of the fixing seat, and the locking components include a symmetrical first abutment and a second abutment. One end of the first abutment and the second abutment are fixed on the baffle, and the other end is pressed against the outer wall of the probe.

[0014] In some specific solutions, both the first and second abutting components include a telescopic rod and an arc-shaped abutting block. One end of the telescopic rod is fixed to the baffle, and the other end is fixed to the arc-shaped abutting block. A tension spring is provided inside the telescopic rod. One end of the tension spring is fixed to the baffle, and the other end is fixed to the arc-shaped abutting block. The arc-shaped abutting blocks of the first and second abutting components are pressed against both sides of the probe under the action of the tension spring.

[0015] In some specific designs, three fixed legs are included. The three fixed legs are distributed circumferentially along the outer side of the fixed base, and one end of the fixed leg is rotatably connected to the fixed base. All fixed legs are telescopic rods.

[0016] In some specific designs, the circuit board fixing clamp and the fixing feet are connected by a knob-type screw.

[0017] The beneficial effects of this utility model are:

[0018] This utility model discloses a portable testing device probe fixing device. In order to adapt to uneven circuit boards, the fixing legs are designed to be telescopic. This allows the support legs to be individually adjusted according to the actual height of the circuit board, so that the probe is in an upright position and the test point is not easy to slide. The device also includes a spring pressure device for fixing the probe.

[0019] A spring pressure device is set up so that when the probe test position is selected, in order to prevent it from slipping and causing short circuit damage to the circuit board, the spring applies a downward force to prevent the probe from moving, thus fixing the position and preventing slipping. There is a locking part on the upper part of the spring pressure device to lock the probe and prevent the probe from wobbling from side to side.

[0020] A circuit board fixing clamp is set up to fix the circuit board in position by clamping it at the edge of the circuit board. With the help of the retractable support feet, the entire board can be tested. One end of one of the fixed support feet is connected to the clamp. The angle between the clamp and the fixed support foot can be adjusted by using a small knob screw between the fixed support foot and the clamp. Attached Figure Description

[0021] Figure 1 A schematic diagram of a probe fixing device for a portable testing apparatus provided in an embodiment of this utility model;

[0022] Figure 2 A schematic diagram of the spring pressure device provided in the embodiment of this utility model;

[0023] Figure 3 A schematic diagram of a locking member provided in one embodiment of the present utility model;

[0024] Figure 4 A schematic diagram of a locking member provided in another embodiment of the present invention;

[0025] Figure 5 A schematic diagram of the circuit board fixing clamp provided in an embodiment of this utility model.

[0026] Explanation of reference numerals in the attached figures:

[0027] 1-Spring pressure device, 11-Fixed seat, 110-Baffle, 12-First fixed spring component, 13-Second fixed spring component, 14-Telescopic column, 15-Fixed block, 16-Positioning spring, 2-Fixed support leg, 3-Locking component, 31-First half locking sleeve, 32-Second half locking sleeve, 33-Bolt, 34-Telescopic rod, 35-Arc-shaped abutment block, 36-Tension spring, 4-Circuit board fixing clamp, 5-Probe. Detailed Implementation

[0028] The present invention will be further described in detail below with reference to the embodiments and accompanying drawings, but the implementation of the present invention is not limited thereto.

[0029] In the description of this utility model, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "longitudinal", "lateral", "horizontal", "inner", "outer", "front", "rear", "top", "bottom", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship commonly used when the utility model product is in use. They are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model.

[0030] In the description of this utility model, it should also be noted that, unless otherwise explicitly specified and limited, the terms "set up," "have," "install," "connect," and "connect" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.

[0031] The present invention will now be described in detail with reference to the accompanying drawings and embodiments:

[0032] Example 1:

[0033] like Figures 1 to 2 As shown, this embodiment provides a portable testing device probe 5 fixing device, including a spring pressure device 1 for fixing the probe 5 and several fixing legs 2. The fixing legs 2 are distributed circumferentially along the spring pressure device 1 to keep the probe 5 upright above the circuit board. A circuit board fixing clamp 4 is connected to the end of one of the fixing legs 2. Three fixing legs 2 are distributed circumferentially along the outer side of the fixing base 11, forming a triangle to maintain the stability of the fixing device. One end of each fixing leg 2 is rotatably connected to the fixing base 11, and each fixing leg 2 is a telescopic rod 34. The telescopic legs can easily adjust the height position on the circuit board to keep the probe 5 upright.

[0034] Specifically, such as Figure 2 As shown, the spring pressure device 1 includes a fixed base 11, a first fixed spring member 12 and a second fixed spring member 13. A through hole for the probe 5 to pass through is provided at the center of the fixed base 11. The first fixed spring member 12 and the second fixed spring member 13 are fixed on the fixed base 11 and symmetrically arranged on both sides of the probe 5 to clamp the probe 5.

[0035] During point testing, to prevent slippage and short circuit damage to the circuit board, a positioning spring 16 can be installed. The positioning spring 16 applies a downward force to prevent movement, thus fixing the position and preventing slippage. Specifically, both the first fixing spring component 12 and the second fixing spring component 13 include a telescopic column 14 and a fixing block 15. The positioning spring 16 is fixed inside the telescopic column 14. One end of the positioning spring 16 is fixed to the fixing base 11, and the other end is fixed to the inner bottom of the telescopic column 14. The fixing block 15 is fixed to the bottom of the telescopic column 14, and the top of the telescopic column 14 is fixed to the fixing base 11.

[0036] To prevent the probe 5 from wobbling during testing, a locking element 3 is installed on the mounting base 11 to lock the probe 5 in place.

[0037] In one embodiment, to secure the locking member 3, a fixing groove for mounting the locking member 3 can be provided on the fixing base 11, and the fixing groove is located next to the through hole of the probe 5. This allows the locking member 3 to be stably placed on the fixing base 11, thus positioning the locking member 3. Figure 3 As shown, the locking component 3 includes a first half-locking sleeve 31 and a second half-locking sleeve 32. The first half-locking sleeve 31 and the second half-locking sleeve 32 are joined together to form the locking sleeve of the probe 5. The first half-locking sleeve 31 and the second half-locking sleeve 32 are fixed by bolts 33 to lock the probe 5. In use, the probe 5 is first passed through the through hole on the fixing base 11, and then the first half-locking sleeve 31 and the second half-locking sleeve 32 are placed in the groove to form a complete locking sleeve. Then, the first half-locking sleeve 31 and the second half-locking sleeve 32 are locked by bolts 33 to lock the probe 5.

[0038] Alternatively, in another embodiment, a baffle 110 is provided above the edge of the fixing base 11, such as... Figure 4 As shown, the locking member 3 includes a symmetrical first abutment and a second abutment. One end of the first abutment and the second abutment are both fixed on the baffle 110, and the other end is pressed against the outer wall of the probe 5.

[0039] Both the first and second clamping components include a telescopic rod 34 and an arc-shaped clamping block 35. One end of the telescopic rod 34 is fixed to the baffle 110, and the other end is fixed to the arc-shaped clamping block 35. A tension spring 36 is provided inside the telescopic rod 34. One end of the tension spring 36 is fixed to the baffle 110, and the other end is fixed to the arc-shaped clamping block 35. The arc-shaped clamping blocks 35 of the first and second clamping components are pressed against both sides of the probe 5 under the action of the tension spring 36. In use, when the fixing device is sleeved on the probe 5, the tension spring 36 is first pulled to open up the installation position of the probe 5. When the probe 5 passes through the through hole on the fixing seat 11, the tension spring 36 is released, and the arc-shaped clamping block 35 moves towards the probe 5 under the action of the spring and presses against the outer wall of the probe 5.

[0040] To facilitate adjustment of the angle between the fixing clamp and the support leg, the circuit board fixing clamp 4 and the fixing support leg 2 are connected by a small knob-type screw. Figure 5 As shown, the circuit board fixing clamp 4 adopts a relatively common clamp form, including an upper clamp and a lower clamp. The upper clamp and the lower clamp are hinged together. Buffer pads are provided on the opposite surfaces of the upper clamp and the lower clamp to avoid direct contact with the circuit board and damage to the circuit board.

[0041] The usage process of this embodiment is as follows:

[0042] In this embodiment, the testing device is not only used for oscilloscope probe 5, but also for signal testing devices such as multimeter probe and voltmeter. When in use, the circuit board fixing position clamp is fixed to the edge of the circuit board to fix the position of the circuit board. Then, the angle between the clamp and the fixing foot 2 is adjusted by adjusting the small knob screw to complete the relative fixation between the fixing device and the circuit board.

[0043] Next, insert probe 5 through the through hole on the mounting base 11. Since the through hole is slightly larger than the diameter of probe 5, probe 5 can be slightly fixed here. Then, observe the layout of the circuit board at the test position of probe 5 and adjust the telescopic fixing feet 2. Adjust each fixing foot 2 individually according to the actual height of the circuit board position until probe 5 is in an upright position. This prevents probe 5 from sliding above the test point. To prevent probe 5 from shaking during the test, adjust the locking part 3 to fix probe 5 above the test point. When performing point testing, the positioning spring 16 applies a downward force to probe 5, preventing probe 5 from moving. This fixes the position and prevents slippage, thus preventing probe 5 from slipping and causing short circuit damage to the circuit board.

[0044] It is understood that the above embodiments are merely exemplary implementations used to illustrate the principles of this utility model, and the utility model is not limited thereto. For those skilled in the art, various modifications and improvements can be made without departing from the spirit and essence of this utility model, and these modifications and improvements are also considered to be within the protection scope of this utility model.

Claims

1. A probe fixing device for a portable testing apparatus, characterized in that, It includes a spring pressure device (1) for fixing the probe (5) and several fixing feet (2). The fixing feet (2) are distributed circumferentially along the spring pressure device (1) to keep the probe (5) upright above the circuit board. A circuit board fixing clamp (4) is connected to the end of one of the fixing feet (2).

2. The portable testing device probe fixing device according to claim 1, characterized in that, The spring pressure device (1) includes a fixed base (11), a first fixed spring (12) and a second fixed spring (13). The fixed base (11) has a through hole at the center for the probe (5) to pass through. The first fixed spring (12) and the second fixed spring (13) are fixed on the fixed base (11) and symmetrically arranged on both sides of the probe (5) to clamp the probe (5).

3. The portable testing device probe fixing device according to claim 2, characterized in that, The first fixed spring component (12) and the second fixed spring component (13) both include a telescopic column (14) and a fixing block (15). A positioning spring (16) is fixed inside the telescopic column (14). One end of the positioning spring (16) is fixed on the fixing seat (11) and the other end is fixed on the inner bottom of the telescopic column (14). The fixing block (15) is fixed on the bottom of the telescopic column (14) and the top of the telescopic column (14) is fixed on the fixing seat (11).

4. The portable testing device probe fixing device according to claim 2, characterized in that, A locking element (3) for locking the probe (5) is installed on the mounting base (11).

5. The portable testing device probe fixing device according to claim 4, characterized in that, The fixed base (11) is provided with a fixing groove for installing the locking component (3). The locking component (3) includes a first half locking sleeve (31) and a second half locking sleeve (32). The first half locking sleeve (31) and the second half locking sleeve (32) are spliced ​​together to form the locking sleeve of the probe (5). The first half locking sleeve (31) and the second half locking sleeve (32) are fixed by bolts (33) to lock the probe (5).

6. The portable testing device probe fixing device according to claim 4, characterized in that, A baffle (110) is provided above the edge of the fixed base (11). The locking member (3) includes a first abutment and a second abutment that are symmetrical. One end of the first abutment and the second abutment are fixed on the baffle (110), and the other end is pressed against the outer wall of the probe (5).

7. The portable testing device probe fixing device according to claim 6, characterized in that, Both the first and second abutting components include a telescopic rod (34) and an arc-shaped abutting block (35). One end of the telescopic rod (34) is fixed to the baffle (110), and the other end is fixed to the arc-shaped abutting block (35). A tension spring (36) is provided inside the telescopic rod (34). One end of the tension spring (36) is fixed to the baffle (110), and the other end is fixed to the arc-shaped abutting block (35). The arc-shaped abutting blocks (35) of the first and second abutting components are pressed against both sides of the probe (5) under the action of the tension spring (36).

8. The portable testing device probe fixing device according to claim 2, characterized in that, It includes three fixed legs (2), which are distributed circumferentially along the outside of the fixed seat (11). One end of the fixed leg (2) is rotatably connected to the fixed seat (11), and each fixed leg (2) is a telescopic rod (34).

9. A portable testing device probe fixing device according to claim 2, characterized in that, The circuit board fixing clamp (4) and the fixing foot (2) are connected by a knob-type screw.

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