High-speed low-cost wobble plate device for aging test of chip electrolytic capacitor

Abstract

The utility model discloses a high-speed low-cost wobble plate device for aging test of a chip electrolytic capacitor, which comprises at least two circular vibration plates and a straight vibration track matched with each circular vibration plate, and one ends, far away from the circular vibration plates, of the straight vibration tracks are arranged side by side at intervals; the device further comprises a multi-station rotating tower, each suction head arm on the rotating tower is provided with a suction head set, the number of suction heads on the suction head sets is consistent with the number of the circular vibration discs, and the positions of the suction heads of each suction head set are matched with the positions, away from the ends of the circular vibration discs, of the straight vibration rails and are also matched with the positions, where capacitors need to be placed at a time, in the capacitor carrying box. A visual inspection station, a polarity correction station and a material placing station are arranged on the rotating tower; a capacitor carrying box is arranged at the material placing station, and a capacitor positioning groove is formed in the capacitor carrying box and used for receiving capacitors placed from the material placing station. According to the utility model, the application requirements of large-batch aging, testing and packaging of electrolytic capacitors with specific sizes can be met.

Description

TECHNICAL FIELD

[0001] The utility model relates to a kind of high-speed low-cost swing tray device required for sheet electrolytic capacitor aging test. BACKGROUND

[0002] In the aging, testing, banding operation of electrolytic capacitor, especially sheet electrolytic capacitor, multiple capacitors are placed in capacitor carrier tray for positioning. For sheet electrolytic capacitor with polar electrode, the polar orientation of the capacitors needs to be adjusted uniformly during the operation of spreading the loose capacitors. In order to facilitate the testing and the power-on operation of the electrode, the orientation of the electrode surface of the components also needs to be adjusted uniformly. This adversely affects the speed of spreading the capacitors. After the capacitors are loaded into the carrier tray, they can be sent to a testing device or an aging device. The speed of loading the capacitors into the carrier tray should be higher than 4 per second, and the final speed should be higher than 8 per second. The cost should be as low as possible.

[0003] There are two existing technologies. One is to use a conventional circular vibration tray and a linear vibration track mechanism. The components are sorted and arranged in the circular vibration tray according to the spiral ascending vibration track. The orientation of the electrode surface of the capacitors that do not meet the requirements is adjusted. The capacitors are then sent to the linear vibration track. A turret device is used to take out one capacitor from the discharge port of the linear vibration track. The polarity of the capacitor is checked at one work station of the turret. The capacitors with incorrect polarity are corrected at another work station. Then, the capacitors are placed in a long box one by one in a linear arrangement in the equally spaced positioning slots. The long box is then placed in a testing device to test the capacitors. Since the number of capacitors loaded in each long box is limited, the maximum testing speed is also limited, which is generally not higher than 4 per second. In addition, since the number of capacitors loaded in the long box is small, if the testing and aging processes are connected, the efficiency and cost of the aging equipment are not ideal, and it is not suitable for aging. Therefore, the long box mode is not suitable for high-speed production lines.

[0004] The other existing technology uses a flexible vibration tray. The loose capacitors are placed in the flexible vibration tray. Then, multiple linear motion suction heads are used to suck up the capacitors with the correct electrode surface orientation from the flexible vibration tray. The polarity of the capacitors is identified by vision. The suction heads adjust the polarity as needed. Then, the capacitors are placed in the capacitor carrier tray. This flexible spreading method is relatively slow. To achieve high-speed spreading, multiple spreading units need to work in parallel. However, this method is relatively expensive, and it is only suitable for applications that are not sensitive to speed or cost, or applications that have special requirements for multi-size compatibility. It is not suitable for applications that require high speed and low cost.

[0005] Currently, there is a need for a capacitor carrier tray loading device with low cost and high speed to meet the application requirements of large-scale aging, testing, and packaging of electrolytic capacitors of specific sizes. Utility model content

[0006] The utility model discloses to overcome the defects in the prior art, provide a kind of required high-speed low-cost tray device for chip electrolytic capacitor aging test, and the capacitor tray device of low cost, high speed can meet the application requirement of the aging, test, packaging of electrolytic capacitor of specific size in large quantities.

[0007] To achieve the above object, the technical scheme of the utility model is to design a kind of required high-speed low-cost tray device for chip electrolytic capacitor aging test, including at least two circular vibration trays and with each circular vibration tray is equipped with a straight vibration track, the end of each straight vibration track away from the circular vibration tray is arranged side by side and is equipped with spacing between each other;Further including a multi-station turret, each suction head arm on the turret is provided with suction head group, the number of suction head on suction head group is consistent with the number of circular vibration tray, the position of the suction head of each suction head group is matched with the end position of each straight vibration track away from the circular vibration tray, also matched with the position of the capacitor carrier box required to place capacitor once;Visual inspection station, polarity correction station and material placing station are provided on the turret;Capacitor carrier box is provided at material placing station, and capacitor carrier box is provided with capacitor positioning groove for receiving capacitor placed from material placing station.

[0008] Further technical scheme is that capacitor carrier box is arranged in carrier box fixing table, carrier box fixing table is installed on a horizontal two-axis motion mechanism, the movement range of capacitor carrier box includes capacitor loading required capacitor feeding range and carrier box moves out capacitor feeding range disc loading mechanism carrier exchange station, a carrier loading and unloading mechanism is arranged in disc loading mechanism carrier exchange station to move the carrier box loaded with capacitor out of carrier box fixing table, and an empty carrier box is placed into carrier box fixing table, and disc loading operation of new carrier box is started.

[0009] Further technical scheme is that the carrier box loaded with capacitor moves out of carrier box fixing table, and the carrier box loaded with capacitor is moved to the carrier taking inlet of aging device or the carrier loading and unloading station of testing device.

[0010] Further technical scheme is that carrier loading and unloading mechanism is equipped with two carrier suction heads or grab heads, one of which is used for carrying carrier box loaded with capacitor, and the other is used for carrying empty carrier box;Carrier box loaded with capacitor is carried between disc loading mechanism carrier exchange station and the carrier taking inlet of aging device or the carrier loading and unloading station of testing device;Empty carrier box is carried between disc loading mechanism carrier exchange station and empty carrier box stock bin or the carrier loading and unloading station of testing device.

[0011] Further technical scheme is that two carrier suction heads or grab heads are integrated linkage, and simultaneously move up and down or respectively move up and down;Two carrier suction heads or grab heads are installed on a motion mechanism, and the movement range includes the movement range required for carrier exchange.

[0012] Further technical solutions are that the tray placing device is connected with the testing device to form a bulk capacitor testing machine; and the loading and unloading mechanism of the box is connected with the loading and unloading station of the testing device.

[0013] Further technical solutions are that the tray placing device is connected with the aging device and the testing device to form an aging and testing integrated device for bulk capacitors; and the loading and unloading mechanism of the box is connected with the loading and unloading station of the aging device and the testing device.

[0014] Further technical solutions are that the tray placing device, the aging device and the testing device are sequentially arranged; and a short-circuit capacitor testing station and a short-circuit capacitor removing station are further arranged on the turret to ensure that the capacitors loaded into the box are not short-circuited.

[0015] Further technical solutions are that the tray placing device is further provided with a qualified capacitor collecting station; if a single capacitor of the suction head group is removed due to short-circuit, the suction head group will not be placed when moving to the placing station, and the qualified capacitors left on the suction head group will be placed into the collecting box when moving to the qualified capacitor collecting station, and these capacitors will be re-placed into the vibrating tray for subsequent tray placing operation.

[0016] Further technical solutions are that one circular vibrating tray is arranged, and each suction head device on the turret adopts one suction head.

[0017] Further technical solutions are that a box conveying device is arranged at the loading and unloading station, and two sides corresponding to one included angle of the box are used as fixed sides in the mechanism for fixing the box on the box conveying device, and two sides corresponding to another included angle on the diagonal line of the one included angle are used as movable sides.

[0018] The capacitor tray loading device has the advantages of low cost and high speed, and can meet the application requirements of large-batch aging, testing and packaging of electrolytic capacitors of specific sizes. BRIEF DESCRIPTION OF DRAWINGS

[0019] Figure 1 is a schematic view of a high-speed and low-cost tray placing device for aging and testing of sheet electrolytic capacitors.

[0020] In the figure, 1 is a circular vibrating tray, 2 is a straight vibrating track, 3 is a turret, 4 is a capacitor box, 5 is a visual inspection station, 6 is a polarity correction station, 7 is a placing station, 8 is a box fixing table, 9 is a short-circuit capacitor testing station, 10 is a short-circuit capacitor removing station, and 11 is a vacuum suction disc. DETAILED DESCRIPTION

[0021] The specific embodiments of this utility model will be further described below with reference to the accompanying drawings and examples. The following examples are only used to more clearly illustrate the technical solution of this utility model and should not be construed as limiting the scope of protection of this utility model.

[0022] Example 1: As Figure 1 As shown, this utility model is a high-speed, low-cost tray-mounting device for aging testing of chip electrolytic capacitors. It employs more than one circular vibrating plate 1, each equipped with a linear vibrating track 2. The ends of these tracks are arranged side-by-side with a specific distance between them. A multi-station turret 3 is used, with each suction arm on the turret equipped with a suction head assembly containing more than one suction head. The arrangement of the suction heads in each assembly corresponds to the arrangement of the ends of the multiple linear vibrating tracks and also to the spacing of the capacitors to be placed in the capacitor carrier 4 at one time. The suction head assemblies on the turret can pick up multiple capacitors at a time from the ends of the linear vibrating tracks 2, then move to the visual inspection station 5 to check the polarity, then to the polarity correction station 6 to correct the polarity of capacitors requiring correction, and finally to the placement station 7 to simultaneously place the capacitors into the capacitor positioning slots of the capacitor carrier 4.

[0023] The tray placement device has a tray holder at its placement station located in a tray holder fixing platform 8 mounted on a horizontal two-axis motion mechanism (a vacuum suction cup 11 is installed on the tray holder fixing platform to fix the tray placed therein). The movement range of the tray includes the capacitor loading range required for capacitor loading, and also includes a tray exchange station for removing the tray from the capacitor loading range. At this station, a tray loading / unloading mechanism is provided to remove a tray already loaded with capacitors from the tray holder fixing platform 8 and place an empty tray into the tray holder fixing platform to begin the tray loading operation for a new tray. The trays loaded with capacitors are then moved to the tray inlet of the aging device or the tray loading / unloading station of the testing device.

[0024] The carrier loading and unloading mechanism has two carrier suction heads or grippers: one for handling carriers containing capacitors, and the other for handling empty carriers. Carriers containing capacitors are handled between the carrier exchange station of the tray loading mechanism and the carrier inlet of the aging device, or the carrier loading and unloading station of the testing device. Empty carriers are handled between the carrier exchange station of the tray loading mechanism and the empty carrier hopper, or the carrier loading and unloading station of the testing device.

[0025] The tray loading and unloading mechanism includes two integrated tray suction heads or grippers mounted on a moving mechanism. The range of motion covers the movement required for tray exchange. The two tray suction heads or grippers can move up and down together or separately.

[0026] The tray loading device is connected with the aging device and the testing device to form an integrated device for aging and testing of bulk capacitors, the tray loading and unloading mechanism is connected with the tray loading and unloading station of the aging device and the testing device, the empty tray is transported between the tray exchange station of the tray loading device and the tray loading and unloading station of the testing device, the tray loaded with capacitors is transported between the tray exchange station of the tray loading device and the tray loading and unloading station of the aging device, and the tray to be aged is sent to the aging device for aging.

[0027] The tray loading device is connected with the aging device and the testing device to form an integrated device for aging and testing of bulk capacitors, the tray loading and unloading mechanism is connected with the tray loading and unloading station of the aging device and the testing device, the empty tray is transported between the tray exchange station of the tray loading device and the tray loading and unloading station of the testing device, the tray loaded with capacitors is transported between the tray exchange station of the tray loading device and the tray loading and unloading station of the aging device, and the tray to be aged is sent to the aging device for aging.

[0028] The tray loading device is connected with the aging device and the testing device to form an integrated device for aging and testing of bulk capacitors, the tray loading and unloading mechanism is connected with the tray loading and unloading station of the aging device and the testing device, the empty tray is transported between the tray exchange station of the tray loading device and the tray loading and unloading station of the testing device, the tray loaded with capacitors is transported between the tray exchange station of the tray loading device and the tray loading and unloading station of the aging device, and the tray to be aged is sent to the aging device for aging.

[0029] The tray loading device is connected with the aging device and the testing device to form an integrated device for aging and testing of bulk capacitors, the tray loading and unloading mechanism is connected with the tray loading and unloading station of the aging device and the testing device, the empty tray is transported between the tray exchange station of the tray loading device and the tray loading and unloading station of the testing device, the tray loaded with capacitors is transported between the tray exchange station of the tray loading device and the tray loading and unloading station of the aging device, and the tray to be aged is sent to the aging device for aging.

[0030] The tray loading device is connected with the aging device and the testing device to form an integrated device for aging and testing of bulk capacitors, the tray loading and unloading mechanism is connected with the tray loading and unloading station of the aging device and the testing device, the empty tray is transported between the tray exchange station of the tray loading device and the tray loading and unloading station of the testing device, the tray loaded with capacitors is transported between the tray exchange station of the tray loading device and the tray loading and unloading station of the aging device, and the tray to be aged is sent to the aging device for aging.

[0031] The above only describes preferred embodiments of the present application, and it should be noted that, for those skilled in the art, without departing from the technical principles of the present application, a number of improvements and refinements can be made, and these improvements and refinements should also be considered within the protection scope of the present application.

Claims

1. A high speed low cost swing plate apparatus required for chip electrolytic capacitor aging test, characterized in that, The device comprises at least two circular vibration trays and one straight vibration track matched with each circular vibration tray, the ends of the straight vibration tracks away from the circular vibration trays are arranged side by side and have a spacing between each other; the device further comprises a multi-station turret, each suction head arm on the turret is provided with a suction head group, the number of suction heads on the suction head group is consistent with the number of the circular vibration trays, the position of each suction head group matches the position of the ends of the straight vibration tracks away from the circular vibration trays, and also matches the position of the capacitors to be placed in the capacitor carrier at one time; the turret is provided with a visual inspection station, a polarity correction station and a material placing station; the capacitor carrier is arranged at the material placing station, and the capacitor carrier is provided with a capacitor positioning groove for receiving the capacitors placed from the material placing station.

2. A high speed low cost tray for the required aging test of chip electrolytic capacitor as claimed in claim 1 wherein, The capacitor carrier is arranged in a carrier fixing table, the carrier fixing table is installed on a horizontal two-axis movement mechanism, the movement range of the capacitor carrier includes a capacitor loading range and a tray loading mechanism carrier exchange station where the carrier moves out of the capacitor loading range, and a carrier loading and unloading mechanism is arranged at the tray loading mechanism carrier exchange station to move the carrier loaded with capacitors out of the carrier fixing table, place an empty carrier into the carrier fixing table, and start a new tray loading operation.

3. A high speed low cost tray for chip electrolytic capacitor aging test as claimed in claim 2 wherein, The carrier loaded with capacitors is moved out of the carrier fixing table to a carrier taking inlet of an aging device or a carrier loading and unloading station of a testing device.

4. A high speed low cost tumbler device for chip electrolytic capacitor aging test as claimed in claim 2 or 3 wherein, The carrier loading and unloading mechanism is provided with two carrier suction heads or grabbing heads, one of which is used for carrying the carrier loaded with capacitors, and the other of which is used for carrying the empty carrier; the carrier loaded with capacitors is carried between the tray loading mechanism carrier exchange station and the carrier taking inlet of the aging device or the carrier loading and unloading station of the testing device; The empty carrier is carried between the tray loading mechanism carrier exchange station and an empty carrier warehouse or the carrier loading and unloading station of the testing device.

5. A high speed low cost tray for chip electrolytic capacitor aging test as claimed in claim 4 wherein, The two carrier suction heads or grabbing heads are integrally linked and move up and down simultaneously or separately; the two carrier suction heads or grabbing heads are installed on a movement mechanism, and the movement range includes a movement range required for carrier exchange.

6. A high speed low cost tray for chip electrolytic capacitor aging test as claimed in claim 5 wherein, The tray placing device is connected with the testing device to form a bulk capacitor testing machine. The carrier loading and unloading mechanism is connected with the carrier loading and unloading station of the testing device.

7. A high speed low cost tray for chip electrolytic capacitor aging test as claimed in claim 6 wherein, The tray placing device is connected with the aging device and the testing device to form an aging and testing integrated device for bulk capacitors. The carrier loading and unloading mechanism is connected with the carrier loading and unloading station of the aging device and the testing device.

8. A high speed low cost tray for chip electrolytic capacitor aging test as claimed in claim 7 wherein, The tray placing device, the aging device and the testing device are arranged in sequence; the turret is further provided with a short-circuit capacitor testing station and a short-circuit capacitor exclusion station to ensure that the capacitors loaded into the carrier are non-short-circuit capacitors.

9. A high speed low cost tray for chip electrolytic capacitor aging test as claimed in claim 8 wherein, The tray placing device is further provided with a qualified capacitor collection station, if a single capacitor of the suction head group is excluded due to short circuit, the suction head group will not be placed when moving to the material placing station, and the qualified capacitors left on the suction head group will be placed into a collection box when the suction head group moves to the qualified capacitor collection station, and these capacitors will be placed into the vibration tray for subsequent tray placing operation.

10. A high speed low cost tray for chip electrolytic capacitor aging test as claimed in claim 9 wherein, The circular vibration tray is provided with one, and each suction head device on the turret adopts one suction head.

11. A high speed low cost tray for chip electrolytic capacitor aging test as claimed in claim 6 wherein, The loading and unloading station is provided with a carrier box conveying device, and in the mechanism for fixing the carrier box on the carrier box conveying device, two side edges corresponding to one included angle of the carrier box are used as fixed edges, and two side edges corresponding to another included angle on the diagonal line of the included angle are used as movable side edges.

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