Device for testing temperature stability of optical device
The optical device temperature stability testing device, which combines a water-cooled plate and a TEC temperature control module, solves the problems of cumbersome temperature control and data continuity in traditional optical testing devices, and achieves real-time directional monitoring and improved accuracy.
Patent Information
- Application Number
- CN202423261620.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-27
- Publication Date
- 2025-11-25
- Estimated Expiration
- 2034-12-27
AI Technical Summary
Traditional optical testing devices are cumbersome to operate in terms of temperature control, making it difficult to monitor pointing changes in real time. Furthermore, the test data lacks continuity, making it impossible to monitor the range of pointing changes with temperature during temperature cycling.
The design employs a water-cooled plate and a TEC temperature control module in conjunction with the test platform, combined with Invar steel material and positioning structure, to achieve temperature regulation without moving the platform and to monitor pointing changes in real time via a camera.
It simplifies temperature control operations, enables real-time monitoring of the pointing of optical devices under temperature changes, and improves the continuity and accuracy of test data.
Smart Images
Figure CN223597158U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to optical device test field especially, and it is a kind of optical device temperature stability testing device. BACKGROUND
[0002] Traditional optical testing device when building test light path, at ambient temperature, using the principle of interference measures the relative position of the mirror frame to be measured and reference piece and records, then the test platform is put into high-low temperature chamber after high-low temperature cycle, after temperature cycle, the test platform is taken out and put into the light path built before testing and again obtaining the relative position of the mirror frame to be measured and reference piece, by comparing the relative position of the two times, the pointing reset value of the mirror frame to be measured after temperature cycle is analyzed.The temperature adjustment mode of traditional optical testing device is to move the test platform to high-low temperature chamber for temperature cycle, then take out to measure the result, inconvenient operation, temperature control is difficult, and the operation is tedious, and simultaneously, the data of test pointing has no continuity, it has no way to monitor the pointing change under temperature change, it can only test the reset of pointing after temperature cycle, cannot monitor the interval range of pointing with temperature in this temperature cycle process, therefore, it needs to be improved. SUMMARY
[0003] Therefore, it is necessary to provide an optical device temperature stability testing device to solve the problems of traditional test platform temperature control difficulty, operation tediousness, and the data of test pointing has no continuity, it has no way to monitor the pointing change under temperature change, it can only test the reset of pointing after temperature cycle, cannot monitor the interval range of pointing with temperature in this temperature cycle process.
[0004] The utility model provides a kind of optical device temperature stability testing device, comprising:
[0005] Test platform, surface has reflecting lens, and bottom has recess;
[0006] Water-cooling plate, is installed in the recess, and surface has symmetrical water pipe joint, and inside has water flow passage;
[0007] TEC temperature control module, is installed between the water-cooling plate and test platform;
[0008] Base, at the bottom of water-cooling plate, and be fixed with test platform by bolt.
[0009] In one embodiment, heat-conducting silicone grease is provided between the TEC temperature control module and the water-cooling plate, and between the TEC temperature control module and the test platform.
[0010] In one of the embodiments, the bottom of the test platform is provided with a plurality of first V-shaped grooves, the surface of the base is provided with a plurality of second V-shaped grooves, the second V-shaped grooves correspond to the first V-shaped grooves one by one, and a steel ball is arranged between the second V-shaped grooves and the first V-shaped grooves.
[0011] In one of the embodiments, a compression spring bolt is arranged between the test platform and the base.
[0012] In one of the embodiments, the test platform and the base are made of invar steel.
[0013] In one of the embodiments, when the test frame is installed on the test platform, the light path is directly reflected to the camera through the test frame.
[0014] The test device for the temperature stability of the optical device, by adopting the water-cooled plate, the TEC temperature control module and the test platform, instead of the traditional method of putting the test platform into the high-low temperature box, the temperature of the test platform can be controlled without moving, which is convenient to operate, and by installing the test frame on the test platform, the light path is directly reflected to the camera through the test frame, which is convenient to monitor the pointing change under the temperature change, and the pointing range under the temperature change can be monitored. BRIEF DESCRIPTION OF DRAWINGS
[0015] In order to more clearly illustrate the technical scheme of the present application or the prior art, the following will briefly introduce the drawings needed in the embodiment or the prior art description. Obviously, the drawings in the following description are some embodiments of the present application, and those skilled in the art can obtain other drawings according to these drawings without creative labor.
[0016] Figure 1 It is a schematic diagram of a conventional optical test device structure in one embodiment.
[0017] Figure 2 It is a schematic diagram of a test device for the temperature stability of the optical device in one embodiment.
[0018] Figure 3 It is a schematic diagram of a water-cooled plate structure in one embodiment.
[0019] Figure 4 It is a schematic diagram of a test platform structure in one embodiment.
[0020] Reference signs:
[0021] 11, reference sheet; 12, platform; 13, frame; 14, bolt; 100, test platform; 110, groove; 120, reflecting sheet; 130, first V groove; 200, water cooling plate; 210, water pipe joint; 220, water flow channel; 300, TEC temperature control module; 400, base; 410, second V groove; 420, steel ball; 430, compression spring bolt. DETAILED DESCRIPTION
[0022] In order to make the purpose, technical scheme and advantages of the embodiments of the present application clearer, the technical scheme of the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only some of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work fall within the scope of protection of the present application.
[0023] It should be noted that when a component is referred to as being "fixed to" or "set on" another component, it can be directly on the other component or there can be a middle component. When a component is referred to as being "connected to" another component, it can be directly connected to the other component or there can be a middle component. The terms "vertical", "horizontal", "upper", "lower", "left", "right", and similar expressions used in the description of the present application are for the purpose of illustration only and do not indicate the only implementation.
[0024] In addition, the terms "first" and "second" are only for the purpose of description and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" can explicitly or implicitly include at least one of the features. In the description of the present application, the meaning of "multiple" is at least two, such as two, three, etc., unless otherwise explicitly specified.
[0025] In the present application, unless otherwise explicitly specified and limited, the "on", "under", "above" and "over" of the first feature to the second feature can be that the first feature is in direct contact with the second feature, or the first feature is indirectly in contact with the second feature through an intermediate medium. Moreover, the "on", "above" and "over" of the first feature to the second feature can be that the first feature is directly above or obliquely above the second feature, or only indicates that the horizontal height of the first feature is higher than that of the second feature. The "under", "below" and "under" of the first feature to the second feature can be that the first feature is directly below or obliquely below the second feature, or only indicates that the horizontal height of the first feature is less than that of the second feature.
[0026] Unless otherwise defined, all technical and scientific terms used in the present disclosure have the same meaning as commonly understood by one of ordinary skill in the art to which this present disclosure belongs. The terminology used in the present disclosure is for the purpose of describing particular embodiments only and is not intended to be limiting of the present disclosure. The use of the terms "and / or" includes a combination of one or more of the associated listed items.
[0027] Referring to Figure 1 , the conventional optical testing device is designed with an aluminum alloy base, and a mirror piece is bonded on the platform 12 as a reference piece 11. A mirror frame 13 is installed in the opposite position using a bolt 14. Then, a test light path is built, the relative position of the mirror frame 13 and the reference piece 11 is measured and recorded at ambient temperature using the principle of interference, and then the platform 12 is placed in a high-low temperature chamber for high-low temperature cycling. After temperature cycling, the platform 12 is taken out and placed in the previously built light path for testing and the relative position of the mirror frame 13 and the reference piece 11 is obtained again. By comparing the relative positions before and after, the pointing reset value of the mirror frame 13 after temperature cycling is analyzed.
[0028] Problems of the conventional optical testing device are as follows:
[0029] 1. The platform 12 uses aluminum alloy material, which is affected by temperature fluctuations. The aluminum alloy platform 12 itself is unstable, although the reference piece 11 is used for measurement, but there is still a part of the influence that cannot be eliminated, and multiple variables are superimposed together, so that the pointing problem of the mirror frame 13 cannot be accurately judged.
[0030] 2. Temperature control is difficult and the operation is complicated. The temperature adjustment method is to move the platform 12 to the high-low temperature chamber for temperature cycling, and then take it out for result measurement, which is not convenient to operate.
[0031] 3. The test pointing data has no continuity. It cannot monitor the pointing change under temperature change in real time, it can only test the pointing reset after temperature cycling, and cannot monitor the pointing range of temperature in the temperature cycling process.
[0032] Therefore, the optical device temperature stability testing device of the present disclosure will be described below. Figures 2-4
[0033] As shown in Figure 2 and Figure 3 , in one embodiment, an optical device temperature stability testing device includes a test platform 100, a water-cooled plate 200, a TEC temperature control module 300, and a base 400.
[0034] The surface of the test platform 100 is provided with a reflecting lens 120, and the bottom of the test platform 100 is provided with a groove 110.
[0035] The water-cooled plate 200 is installed in the groove 110, and the surface of the water-cooled plate 200 is provided with symmetrical water pipe joints 210, and the inside of the water-cooled plate 200 is provided with a water flow channel 220.
[0036] The TEC temperature control module 300 is installed between the water-cooled plate 200 and the test platform 100.
[0037] The base 400 is located at the bottom of the water-cooled plate 200, and the base 400 is fixed to the test platform 100 by bolts.
[0038] The optical device temperature stability testing device, by adopting the cooperation mode of the water-cooled plate 200, the TEC temperature control module 300 and the test platform 100, instead of the traditional mode of putting the test platform 100 into the high-low temperature box as a whole, the test platform 100 can be temperature controlled without moving, which is convenient to operate, at the same time, by installing the test lens holder on the test platform 100, the light path is directly reflected to the camera through the test lens holder, which is convenient for real-time monitoring of the pointing change under the temperature change, and at the same time, the pointing range of the temperature change in the temperature cycle process can be monitored.
[0039] In the embodiment, the TEC temperature control module 300 and the water-cooled plate 200, and the TEC temperature control module 300 and the test platform 100 are both provided with heat-conducting silicone grease.
[0040] By smearing heat-conducting silicone grease on both sides of the TEC temperature control module 300, the small air gap between the water-cooled plate 200, the test platform 100 and the TEC temperature control module 300 can be filled.
[0041] In the embodiment, referring to Figure 2 and Figure 4 , the bottom of the test platform 100 is provided with a plurality of first V grooves 130, the surface of the base 400 is provided with a plurality of second V grooves 410, the second V grooves 410 correspond to the first V grooves 130 one by one, and the second V grooves 410 and the first V grooves 130 are provided with steel balls 420.
[0042] According to the stability of the triangle, the bottom of the test platform 100 is provided with three first V grooves 130, the surface of the base 400 is provided with three second V grooves 410, one first V groove 130 and one corresponding second V groove 410 form a group of V grooves, and one steel ball 420 is placed in each of the three groups of V grooves. The positioning of the test platform 100 and the base 400 is realized through the structure of the V groove and the steel ball 420. At the same time, the steel ball 420 is a point contact, and the heat conduction between the base 400 and the test platform 100 can be reduced as much as possible through this positioning mode, thereby isolating the thermal influence of the base 400 on the test platform 100.
[0043] In this embodiment, a compression spring bolt 430 is installed between the test platform 100 and the base 400.
[0044] The fixing between the test platform 100 and the base 400 is fixed by three compression spring bolts 430 and three bolts. The connection force of the test platform 100 and the base 400 can be controlled by adjusting the compression amount of the compression spring, and the compression spring can also eliminate the machining tolerance between the test platform 100 and the base 400.
[0045] In this embodiment, the test platform 100 and the base 400 are both made of invar steel material.
[0046] Since the test platform 100 and the base 400 are made of invar steel material, the thermal expansion coefficient of the material itself is extremely low, and the deformation of the test platform 100 is very small within the working temperature range of the mirror frame, thereby improving the accuracy of judging the pointing problem of the test mirror frame.
[0047] In this embodiment, when the test mirror frame is installed on the test platform 100, the light path is directly reflected to the camera through the test mirror frame.
[0048] Since the deformation of the test platform 100 with temperature within the temperature range of the test can be ignored, the pointing change of the light path is monitored in real time through the camera, and the pointing change monitored by the camera can be considered to be caused by the pointing change of the mirror frame with temperature. The camera can record the continuous fluctuation value in this temperature change process, which is convenient and fast.
[0049] The stability test of the test device itself: the design purpose is to test the pointing of the test mirror frame, and a stability evaluation of the test device itself is needed before testing. Before testing the mirror frame, the reflector 120 is placed flat on the invar steel test platform 100 for pointing test. The temperature control interval is set between 22-32 degrees Celsius. The mirror pointing data is recorded through the camera. During the temperature rise of 10 degrees Celsius, the pointing deviation caused by the test platform 100 is 0.48 microns, which is extremely small and can be ignored.
[0050] Any combination of the technical features in the above-described embodiments can be made, and for the sake of brevity, not all possible combinations are described, however, as long as the combination of the technical features does not exist in contradiction, it shall be considered as within the scope of the present disclosure.
[0051] The above-described embodiments only express several implementation manners of the present application, the description is relatively specific and detailed, but it shall not be understood as the limitation of the scope of the present application. It should be pointed out that, for the ordinary skilled in the art, under the premise of not departing from the concept of the present application, a number of modifications and improvements can be made, which all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the appended claims.
Claims
1. A device for testing the temperature stability of an optical device, characterized in that The utility model relates to a test platform for testing optical lens, comprising: a test platform with a mirror lens on the surface and a groove at the bottom; a water cooling plate installed in the groove and having symmetrical water pipe joints on the surface and water flow channels inside; a TEC temperature control module installed between the water cooling plate and the test platform; a base at the bottom of the water cooling plate and fixed to the test platform by bolts.
2. The apparatus for testing temperature stability of optical devices according to claim 1, wherein, Thermal conductive silicone grease is provided between the TEC temperature control module and the water cooling plate and between the TEC temperature control module and the test platform.
3. The apparatus of claim 2, wherein the optical device is a lens. A plurality of first V-shaped grooves are formed at the bottom of the test platform, and a plurality of second V-shaped grooves are formed on the surface of the base, with one-to-one correspondence between the second V-shaped grooves and the first V-shaped grooves, and steel balls provided between the second V-shaped grooves and the first V-shaped grooves.
4. The apparatus of claim 3, wherein the optical device is a lens. Compression spring bolts are installed between the test platform and the base.
5. The apparatus of any one of claims 1 to 4, wherein the apparatus is configured to: The test platform and the base are both made of invar steel.
6. The apparatus of claim 5, wherein the optical device is a lens. When the test lens holder is installed on the test platform, the light path is directly reflected to the camera through the test lens holder.