Single board test tool for testing IGBT drive circuit

By introducing a temperature control mechanism into the test fixture and using a cooling chamber and heating elements to simulate temperature changes, the problem that existing test fixtures cannot simulate the actual temperature of IGBT modules is solved. This enables performance evaluation of IGBT modules at different temperatures and improves the accuracy and reliability of the test.

CN223597712UActive Publication Date: 2025-11-25SHENZHEN FEIZHAO TECH CO LTD
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Patent Information

Application Number
CN202422698997.4
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-11-06
Publication Date
2025-11-25
Estimated Expiration
2034-11-06

AI Technical Summary

Technical Problem

Existing test fixtures lack temperature simulation capabilities, making it impossible to effectively simulate temperature changes of IGBT modules in actual working environments, thus affecting performance evaluation.

Method used

A test fixture including a temperature control mechanism was designed, comprising a cooling chamber, cooling pipes, heating elements, and a temperature sensor. The test environment temperature is controlled by heating or refrigerant circulation to simulate the performance of IGBT modules under different temperature conditions.

Benefits of technology

This technology enables performance evaluation of IGBT modules at different temperatures, ensuring their normal operation in real-world environments and improving the accuracy and reliability of testing.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a single board test tool for testing an IGBT drive circuit, which comprises a case and is characterized by further comprising a test platform, the test platform is arranged at the bottom end in the case, an air cylinder is arranged at the top end in the case, and a lifting plate is fixed at the output end of the air cylinder through a telescopic rod; the test single board is arranged at the bottom of the lifting board; the temperature control mechanism is arranged on the case, the temperature control mechanism comprises a cooling cavity and a cooling pipeline, the cooling cavity is arranged on the outer side of the case, and the cooling pipeline is spirally arranged in the cooling cavity; the temperature control mechanism further comprises electric heating elements and a temperature sensor, and the electric heating elements are arranged on the two sides of the interior of the machine box. According to the utility model, through installing the cabinet, the test platform, the test single board and the temperature control mechanism, during a test process, temperature control is carried out on the IGBT module, and temperature change in an actual working environment is simulated so as to evaluate performance of the IGBT module at different temperatures.
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Description

TECHNICAL FIELD

[0001] The utility model relates to test frock technical field, concretely is a kind of single board test frock of test IGBT drive circuit. BACKGROUND

[0002] IGBT module is the modular semiconductor product that IGBT (insulated gate bipolar transistor chip) and FWD (freewheeling diode chip) are bridged encapsulation by specific circuit, IGBT module after encapsulation is directly applied to frequency converter, UPS uninterruptible power supply and other equipment, and the single board test frock of IGBT drive circuit is a kind of test equipment specially used for detecting the performance of IGBT (insulated gate bipolar transistor) drive circuit, to ensure that IGBT can work normally during manufacturing, installation or maintenance, and meet predetermined performance standards.

[0003] General test frock includes test platform and test single board, test platform is used to place the IGBT module to be measured, and test single board is responsible for connection and communication with the IGBT drive circuit to be measured, realizes the input and output of test signal, but generally, test frock does not have temperature simulation function, is not convenient for temperature control to IGBT module, is not conducive to simulating temperature change in actual working environment. UTILITY MODEL CONTENT

[0004] The utility model aims at providing a kind of single board test frock of test IGBT drive circuit, to solve the problems presented in the above background.

[0005] To achieve the above object, the utility model provides the following technical scheme: a kind of single board test frock of test IGBT drive circuit, comprising: cabinet, characterized in that, still include

[0006] test platform, the test platform is set to the bottom end in the inside of cabinet, the top of the inside of cabinet is provided with pneumatic cylinder, and the output end of the pneumatic cylinder is fixed with lifting plate by telescopic link;

[0007] test single board, the test single board is set to the bottom of lifting plate, and the both sides of the bottom of lifting plate are equipped with supporting piece;

[0008] temperature control mechanism, the temperature control mechanism is set on cabinet, and the temperature control mechanism includes cooling cavity and cooling pipeline, the cooling cavity is set to the outside of cabinet, and the cooling cavity is spirally provided with cooling pipeline;

[0009] the temperature control mechanism also includes electric heating element and temperature sensor, and the electric heating element is set to the both sides in the inside of cabinet, and the temperature sensor is set to the top in the inside of cabinet.

[0010] Preferably, the four sides of the inside of the cabinet are provided with support rods, the support rods are sleeved with sleeves, and one end of the sleeves is connected with the lifting plate.

[0011] Preferably, a groove is formed at the bottom end of the inside of the cabinet, a lead screw is arranged in the groove, a driving block is sleeved on the lead screw, and the top end of the driving block is connected with the test platform.

[0012] Preferably, guide rods are arranged on the two sides of the inside of the groove, guide sleeves are sleeved on the guide rods, and the top ends of the guide sleeves are connected with the test platform.

[0013] Preferably, the two sides of the test single board are provided with mounting parts, and the mounting parts are arranged on the supporting pieces.

[0014] Preferably, a driving motor is fixed on one side of the cabinet, and the output end of the driving motor is connected with the lead screw.

[0015] Preferably, the bottom of the supporting piece is uniformly penetrated by a mounting piece, and the bottom of the mounting part is uniformly provided with a mounting hole which is threadedly connected with the mounting piece.

[0016] Compared with the prior art, the beneficial effects of the utility model are that: the single board test tool for testing IGBT drive circuit is provided with a cabinet, a test platform, a test single board, a temperature control mechanism, a cooling cavity, a cooling pipeline, a heating resistor and a temperature sensor, the IGBT module to be tested is placed on the test platform, then the test single board is connected and communicated with the drive circuit of the tested IGBT module, the input and output of test signals are realized, heat is generated through the electric heating element during the test process, the temperature in the cabinet is increased, the cooling pipeline into which the refrigerant is introduced into the cooling cavity, the heat in the cabinet is taken away through the circulation of the refrigerant and discharged to the external environment, the temperature in the cabinet is reduced, the temperature control of the IGBT module during the test process is realized, the temperature change in the actual working environment is simulated, the performance of the IGBT module under different temperatures is evaluated, at the same time, the temperature sensor monitors the temperature in the cabinet in real time, and the temperature data is fed back to the control system, the control system adjusts the working state of the heating or refrigeration system according to the feedback signal of the temperature sensor, so that the temperature in the cabinet is kept constant and accurate. BRIEF DESCRIPTION OF DRAWINGS

[0017] Figure 1 It is a front view of the sectional structure of the utility model;

[0018] Figure 2 It is a top view of the test platform of the utility model;

[0019] Figure 3 It is a Figure 1 enlarged structure diagram of A in the middle

[0020] Figure 4 The utility model discloses a lifting plate planar structure schematic diagram.

[0021] In the figure: 1, case; 2, temperature control mechanism; 201, cooling cavity; 202, cooling pipeline; 203, temperature sensor; 204, electric heating element; 3, test platform; 4, driving block; 5, recess; 6, air cylinder; 7, support rod; 8, test single board; 9, guide sleeve; 10, driving motor; 11, screw rod; 12, guide rod; 13, mounting portion; 14, mounting hole; 15, supporting piece; 16, mounting piece; 17, lifting plate; 18, sleeve. DETAILED DESCRIPTION

[0022] The technical solutions in the embodiments of the utility model will be clearly and completely described below with reference to the drawings in the embodiments of the utility model. Based on the embodiments in the utility model, all other embodiments obtained by the person skilled in the art without making creative efforts fall within the protection scope of the utility model.

[0023] Please refer to Figures 1-4 The utility model provides an embodiment: a single board test tool for testing IGBT drive circuit, include: case 1 still include

[0024] Test platform 3, test platform 3 sets up in the bottom end in case 1 inside, and the top end in case 1 inside is provided with air cylinder 6, and the output end of air cylinder 6 is fixed with lifting plate 17 through telescopic link,

[0025] Test single board 8, test single board 8 sets up in the bottom of lifting plate 17, places the IGBT module needing testing on test platform 3, then through air cylinder 6 drive lifting plate 17 to descend, test single board 8 is equipped with test module, connects and communicates with the drive circuit of the IGBT module to be tested on test single board 8, realizes the input and output of test signal,

[0026] The periphery in case 1 inside is provided with support rod 7, and sleeve 18 is all set on support rod 7, and one end of sleeve 18 is all connected with lifting plate 17, so that lifting plate 17 is more stable when lifting,

[0027] The both sides of the bottom of lifting plate 17 are all equipped with supporting piece 15, and the both sides of test single board 8 are all provided with mounting portion 13, and mounting portion 13 is all set up on supporting piece 15, and the bottom of supporting piece 15 is evenly passed through mounting piece 16,

[0028] The bottom of mounting portion 13 is evenly provided with mounting hole 14 for being screw-connected with mounting piece 16, so as to facilitate the installation and dismounting between test single board 8 and lifting plate 17, and the test single board 8 is conveniently replaced or overhauled,

[0029] The bottom end of the case 1 is provided with a groove 5, and the inside of the groove 5 is provided with a lead screw 11, the lead screw 11 is sleeved with a driving block 4, and the top end of the driving block 4 is connected with the test platform 3;

[0030] The case 1 on one side of the lead screw 11 is fixed with a driving motor 10, and the output end of the driving motor 10 is connected with the lead screw 11;

[0031] The driving motor 10 drives the lead screw 11 to rotate, so that the driving block 4 moves along the lead screw 11, which is beneficial to automatically send the test platform 3 into the case 1 or move out of the case 1, and facilitates the placement of IGBT module and wiring;

[0032] Both sides of the groove 5 are provided with guide rods 12, and the guide rods 12 are sleeved with guide sleeves 9, and the top ends of the guide sleeves 9 are connected with the test platform 3 for guiding and limiting the test platform 3;

[0033] The temperature control mechanism 2 is arranged on the case 1, and the temperature control mechanism 2 comprises a cooling cavity 201 and a cooling pipeline 202, the cooling cavity 201 is arranged on the outside of the case 1, and the cooling cavity 201 is spirally provided with the cooling pipeline 202;

[0034] The temperature control mechanism 2 further comprises an electric heating element 204 and a temperature sensor 203, and the electric heating element 204 is arranged on both sides of the inside of the case 1, and the temperature sensor 203 is arranged on the top end of the inside of the case 1;

[0035] During the test process, heat can be generated by the electric heating element 204 to increase the temperature in the case 1, and at the same time, the cooling pipeline 202 into which the refrigerant is introduced into the cooling cavity 201 can be circulated to take away the heat in the case 1 and discharge it to the external environment, so as to reduce the temperature in the case 1;

[0036] So that during the test process, the temperature of the IGBT module can be controlled, the temperature change in the actual working environment is simulated to evaluate its performance at different temperatures;

[0037] At the same time, the temperature sensor 203 monitors the temperature in the case 1 in real time, and feeds back the temperature data to the control system, and the control system adjusts the working state of the heating or refrigeration system according to the feedback signal of the temperature sensor 203, so as to keep the temperature in the case 1 constant and accurate;

[0038] The specific model and specification of the temperature sensor 203 and the driving motor 10 need to be determined according to the specification parameters of the device, and the selection calculation method is the prior art, so it will not be described in detail.

[0039] Working principle: in use, the IGBT module to be tested is placed on the test platform 3, then the test single board 8 is connected and communicated with the drive circuit of the IGBT module to be tested, the input and output of the test signal are realized, then the driving motor 10 drives the screw rod 11 to rotate, the driving block 4 moves along the screw rod 11, the test platform 3 is sent into the cabinet 1, in the test process, the heat generated by the electric heating element 204 can improve the temperature in the cabinet 1, at the same time, the refrigerant introduced into the cooling cavity 201 can be circulated in the cooling pipeline 202, the heat in the cabinet 1 is taken away and discharged to the external environment, so as to reduce the temperature in the cabinet 1, so that the temperature of the IGBT module can be controlled in the test process, the temperature change in the actual working environment is simulated to evaluate the performance of the IGBT module at different temperatures, at the same time, the temperature sensor 203 monitors the temperature in the cabinet 1 in real time, and feeds back the temperature data to the control system, the control system adjusts the working state of the heating or refrigeration system according to the feedback signal of the temperature sensor 203, so as to keep the temperature in the cabinet 1 constant and accurate.

[0040] Obviously, the above-described embodiments are only a part of the embodiments of the present application, not all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor should belong to the protection scope of the present application.

[0041] It should be noted that the terms used herein are only intended to describe specific embodiments, and are not intended to limit the exemplary embodiments according to the present application. As used herein, the singular form is intended to include the plural form unless the context clearly indicates otherwise, and it should be understood that when the terms "comprise" and / or "include" are used in the specification, there is a feature, step, work, device, component and / or combination thereof.

[0042] It should be noted that the terms "first", "second" and the like in the specification and claims of the present application and the above-described drawings are used to distinguish similar objects, and do not necessarily indicate a specific order or sequence. It should be understood that the data used in this way can be interchanged under appropriate circumstances, so that the embodiments of the present application described herein can be implemented in an order other than those illustrated or described herein.

[0043] The above is only the preferred embodiment of the present application, and is not intended to limit the present application. For those skilled in the art, the present application can have various changes and modifications. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A single board test fixture for testing an IGBT drive circuit, comprising: The utility model provides a test platform, which belongs to the technical field of test platform. The utility model discloses a test platform, which belongs to the technical field of test platform. The utility model discloses a test platform, which belongs to the technical field of test platform. The utility model discloses a test platform, which belongs to the technical field of test platform. The utility model discloses a test platform, which belongs to the technical field of test platform.

2. The single board test fixture for testing an IGBT driver circuit according to claim 1, wherein: The utility model discloses a test platform, which belongs to the technical field of test platform.

3. The single board test fixture for testing an IGBT driver circuit of claim 1, wherein: The utility model discloses a test platform, which belongs to the technical field of test platform.

4. The single board test fixture for testing an IGBT driver circuit of claim 3, wherein: The utility model discloses a test platform, which belongs to the technical field of test platform.

5. The single board test fixture for testing an IGBT driver circuit of claim 1, wherein: The utility model discloses a test platform, which belongs to the technical field of test platform.

6. The single board test fixture for testing an IGBT driver circuit of claim 3, wherein: The utility model discloses a test platform, which belongs to the technical field of test platform.

7. The single board test fixture for testing an IGBT driver circuit of claim 5, wherein: The utility model discloses a test platform, which belongs to the technical field of test platform. The utility model discloses a test platform, which belongs to the technical field of test platform. The utility model discloses a test platform, which belongs to the technical field of test platform. The utility model discloses a test platform, which belongs to the technical field of test platform. The utility model discloses a test platform, which belongs to the technical field of test platform. The utility model discloses a test platform, which belongs to the technical field of test platform. The utility model discloses a test platform, which belongs to the technical field of test platform. The utility model discloses a test platform, which belongs to the technical field of test platform. The utility model discloses a test platform, which belongs to the technical field of test platform. 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