Testing device

Abstract

The utility model relates to a testing device, which comprises a base, a limiting assembly and a testing assembly, and is characterized in that the base is provided with a contact substrate; the limiting assembly is slidably arranged on the base and is used for limiting the to-be-tested product in the bearing cavity; the testing assembly is arranged on the base and comprises a first conduction module, a second conduction module and a third conduction module, the first conduction module is used for conducting the first testing part and the contact substrate, the second conduction module is used for conducting the second testing part and the contact substrate, and the third conduction module is arranged on the base in a lifting mode and can be electrically connected with the third testing part. According to the testing device provided by the invention, the plurality of testing parts of the to-be-tested product can be electrically tested through the first conduction module, the second conduction module and the third conduction module, and the position accuracy of the to-be-tested product in the bearing cavity is ensured by the limiting assembly, so that the matching precision of the electrical conduction positions among subsequent parts is improved; therefore, the test efficiency and the test reliability of the to-be-tested product are improved, and the test cost is reduced.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of product testing, in particular to a testing device. BACKGROUND

[0002] With the development of consumer electronics, various electronic products have gradually integrated into people's lives, such as AR\VR, wearable devices, Pad\Watch\Phone, unmanned aerial vehicles, and vehicle-mounted visual devices. In the production process of electronic products, performance testing of electronic products is required.

[0003] For Watch / Phone battery units, the battery unit includes a PCB (Printed Circuit Board), and positive and negative electrode plates, test points, and connectors on the PCB. Currently, there are two common methods for testing battery units. One is to manually connect the battery unit through an auxiliary detection device, which is limited by the uncertainty of manual operation, resulting in low testing efficiency and low testing reliability. The other is to weld the battery unit to the battery core, and then test the battery unit and the battery core as a whole. If the battery unit is defective and scrapped, the battery core will also be scrapped simultaneously, causing resource waste. Utility model content

[0004] Therefore, it is necessary to provide a testing device to solve the problems of low testing efficiency and testing reliability, or high testing cost of the existing Watch / Phone battery unit.

[0005] A testing device for electrical testing of a product under test, the product under test having a first test portion, a second test portion, and a third test portion, the testing device comprising:

[0006] a base having a carrying cavity for carrying the product under test, and provided with a contact substrate;

[0007] a limiting assembly slidingly arranged on the base, the limiting assembly being configured to limit the product under test in the carrying cavity; and

[0008] a testing assembly arranged on the base and comprising a first conduction module, a second conduction module, and a third conduction module, the first conduction module being configured to conduct the first test portion and the contact substrate, the second conduction module being configured to conduct the second test portion and the contact substrate, and the third conduction module being arranged on the base in a liftable manner and being electrically connectable with the third test portion.

[0009] In one of the embodiments, the limiting assembly comprises an abutting block and a wire rail, the wire rail is arranged on the base, and the abutting block is slidingly arranged on the wire rail and can move towards the direction of approaching or moving away from the bearing cavity.

[0010] In one of the embodiments, the abutting block comprises a connecting portion and a limiting portion connected to the connecting portion, and the connecting portion is slidingly arranged on the wire rail.

[0011] When the product to be tested is placed in the bearing cavity, the limiting portion can abut against the surface of the product to be tested.

[0012] In one of the embodiments, the third conduction module comprises a base and a probe group arranged on the base, the base is movably arranged on the base, and in the process of lifting the base relative to the base, the probe group can pass through the base and be electrically connected with the third test portion.

[0013] In one of the embodiments, the third conduction module further comprises a mounting seat, a first elastic member, a push block and a push rod, the mounting seat is arranged on the base, the base is movably arranged on the mounting seat, the base is embedded in the contact substrate and has a movable gap with the contact substrate, the first elastic member is arranged between the mounting seat and the base, and the deformation direction of the first elastic member is consistent with the movement direction of the base, the push block is movably arranged on the base and can abut against the base, the push block and the base have a receiving groove for inserting the push rod, and when the push rod is inserted into the receiving groove, the push rod abuts against the push block to push the base to lift relative to the base.

[0014] In one of the embodiments, the third conduction module further comprises a guide rod, the extension direction of the guide rod is consistent with the movement direction of the base, and the guide rod is used for guiding the movement of the base.

[0015] In one of the embodiments, the third conduction module further comprises a movable block, the receiving groove is formed between the movable block and the push block, the movable block is movably arranged on the base, and a second elastic member is arranged between the movable block and the base.

[0016] In one of the embodiments, the push rod has a first arc surface, the movable block has a second arc surface, and when the push rod is inserted into the receiving groove, the first arc surface is matched with the second arc surface.

[0017] In one of the embodiments, the second test portion is electrically connected with the contact substrate through an electrode adapter block.

[0018] The first conductive module includes a first rotating shaft seat and a first cover plate rotatably disposed on the first rotating shaft seat. The first cover plate is provided with a first elastic pressure bar. When the first cover plate rotates relative to the first rotating shaft seat, the first cover plate can cover the product to be tested, and the first elastic pressure bar abuts against the first test part to press the first test part onto the contact substrate.

[0019] Therefore, the second conductive module includes a second rotating shaft seat and a second cover plate rotatably disposed on the second rotating shaft seat. The second cover plate is provided with a second elastic pressure bar. When the second cover plate rotates relative to the second rotating shaft seat, the second cover plate can cover the product to be tested, and the second elastic pressure bar abuts against the second test part to press the second test part onto the electrode adapter block.

[0020] In one embodiment, the base is provided with a plurality of clamping slots, which are spaced apart along the circumferential direction of the base.

[0021] The aforementioned testing apparatus places the product under test (DUT) in a carrier cavity, and a limiting component confines the DUT within the carrier cavity to ensure the accuracy of its position within the cavity. A first conductive module connects the first test section to the contact substrate, a second conductive module connects the second test section to the contact substrate, and a third conductive module connects the third test section, thereby performing electrical tests on multiple test sections of the DUT. The testing apparatus provided in this application, through the first, second, and third conductive modules, can perform electrical tests on multiple test sections of the DUT, and the limiting component ensures the accuracy of the DUT's position within the carrier cavity, improving the precision of electrical conduction positioning between subsequent components, thereby increasing the testing efficiency and reliability of the DUT and reducing testing costs. Attached Figure Description

[0022] Figure 1 This is a schematic diagram of the test device provided in some embodiments from one perspective.

[0023] Figure 2 This is a structural schematic diagram of the testing device provided in some embodiments from another perspective.

[0024] Figure 3 This is a schematic diagram of the structure of the product under test provided in some embodiments.

[0025] Figure 4 This is a bottom view of the test apparatus provided in some embodiments.

[0026] Figure 5 for Figure 4 Sectional view along line AA.

[0027] Figure 6 for Figure 5A local enlarged view of the middle B region.

[0028] Figure 7 A structural schematic view of the first conduction module provided in some embodiments.

[0029] Figure 8 A structural schematic view of the second conduction module provided in some embodiments.

[0030] Reference signs:

[0031] 100, test device;

[0032] 110, base; 111, bearing cavity; 112, clamping groove; 120, contact substrate; 130, limiting assembly; 131, abutting block; 1311, connecting part; 1312, limiting part; 133, wire rail; 134, magnetic attraction piece; 140, test assembly; 141, first conduction module; 1411, first rotating shaft seat; 1412, first cover plate; 1413, first elastic pressing rod; 1414, first clamping hook; 142, second conduction module; 1421, second rotating shaft seat; 1422, second cover plate; 1423, second elastic pressing rod; 1424, third elastic pressing rod; 1425, fourth elastic pressing rod; 1426, second clamping hook; 143, third conduction module; 1431, base; 1432, probe group; 1433, mounting seat; 1434, first elastic piece; 1435, push block; 1436, push rod; 1437, accommodating groove; 1438, guide rod; 1439, movable block; 14391, second elastic piece; 14392, first arc surface; 14393, second arc surface; 150, electrode adapter block; 151, first electrode adapter block; 152, second electrode adapter block;

[0033] 200, product to be tested;

[0034] 210, first test part; 220, second test part; 221, positive electrode sheet; 222, negative electrode sheet; 230, third test part. DETAILED DESCRIPTION

[0035] In order to make the above objectives, features and advantages of the present application more apparent, specific embodiments of the present application are described in detail below with reference to the accompanying drawings. In the following description, a large number of specific details are set forth in order to provide a sufficient understanding of the present application. However, the present application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without departing from the spirit of the present application, so the present application is not limited to the specific embodiments disclosed below.

[0036] In the description of the application, it should be understood that, if there are these terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like, these terms indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for the purpose of facilitating the description of the application and simplifying the description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as a limitation on the application.

[0037] In addition, if there are these terms "first", "second", these terms are only for the purpose of description, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, the features defined as "first", "second" can explicitly or implicitly include at least one of the features. In the description of the application, if the term "multiple" appears, the meaning of "multiple" is at least two, such as two, three, etc., unless otherwise explicitly specified and limited.

[0038] In this application, unless otherwise explicitly specified and limited, if there are terms such as "mounting", "connecting", "connecting", "fixing" and the like, these terms should be broadly understood. For example, it can be fixedly connected, or it can be detachably connected, or it can be integrated; it can be mechanically connected, or it can be electrically connected; it can be directly connected, or it can be indirectly connected through an intermediate medium; it can be the internal communication of two elements or the interaction relationship between two elements, unless otherwise explicitly limited. For those skilled in the art, the specific meaning of the above terms in this application can be understood according to the specific circumstances.

[0039] In this application, unless otherwise explicitly specified and limited, if there are similar descriptions such as "first feature on or under second feature", the meaning can be that the first and second features are in direct contact, or the first and second features are indirectly in contact through an intermediate medium. Moreover, the first feature "above", "above" and "above" of the second feature can be that the first feature is directly above or obliquely above the second feature, or only indicates that the horizontal height of the first feature is higher than that of the second feature. The first feature "below", "below" and "below" of the second feature can be that the first feature is directly below or obliquely below the second feature, or only indicates that the horizontal height of the first feature is less than that of the second feature.

[0040] It is to be noted that when an element is referred to as being "fixed" or "set" on another element, it can be directly on the other element or there can be an intervening element. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or there can be an intervening element. The terms "vertical", "horizontal", "upper", "lower", "left", "right", and similar expressions, if used, are used for explanation only and not to limit the embodiments.

[0041] The technical solutions provided by the embodiments of the present application are described below with reference to the accompanying drawings.

[0042] Referring to Figures 1-4 As shown in the drawings, the present application provides a testing device 100, the testing device 100 comprises a base 110, a limiting assembly 130 and a testing assembly 140. The testing device 100 is used for electrical testing of a product to be tested 200, the product to be tested 200 has a first testing part 210, a second testing part 220 and a third testing part 230. In this embodiment, the product to be tested 200 can be a Watch / Phone battery unit, the testing device 100 serves as a conduction medium between the external detection equipment and the Watch / Phone battery unit to detect whether the product to be tested 200 is qualified or not, the first testing part 210 can be a connector, the second testing part 220 can be an integration of a positive electrode sheet 221 and a negative electrode sheet 222, and the third testing part 230 can be an integration of multiple test points for probe connection.

[0043] The base 110 has a bearing cavity 111 for bearing the product to be tested 200. The base 110 is provided with a contact substrate 120, for example, the edge side of the contact substrate 120 is fixed to the base 110 by a bushing, a screw or other connecting member in a pressing or locking manner to achieve fixed connection between the contact substrate 120 and the base 110, and the connecting member is preferably a plurality of connecting members, which are arranged at intervals along the circumferential direction of the contact substrate 120 to improve the connection reliability between the contact substrate 120 and the base 110.

[0044] The limiting assembly 130 is slidingly arranged on the base 110, and is used to limit the product 200 in the bearing cavity 111. During feeding of the product 200 to the bearing cavity 111, the product 200 may be deformed due to external force, or after the product 200 is placed in the bearing cavity 111, the product 200 may deviate from the preset position, which will cause the contact position between the product 200 and the testing assembly 140 to deviate, and affect the testing reliability of the product 200. In the present application, after the product 200 is placed in the bearing cavity 111, the limiting assembly 130 acts on the surface of the product 200 in a pressing manner to regularize and position the product 200, so as to ensure the position accuracy of the product 200 in the bearing cavity 111, improve the contact position accuracy between the product 200 and the testing assembly 140, and further improve the testing reliability of the product 200.

[0045] The testing assembly 140 is arranged on the base 110, and includes a first contact module 141, a second contact module 142 and a third contact module 143. The first contact module 141 is used to contact the first testing part 210 and the contact substrate 120 to realize signal contact between the first testing part 210 and the contact substrate 120, and complete electrical testing of the first testing part 210. The second contact module 142 is used to contact the second testing part 220 and the contact substrate 120 to realize signal contact between the second testing part 220 and the contact substrate 120, and complete electrical testing of the second testing part 220. The third contact module 143 is arranged on the base 110 in a lifting manner and can be electrically connected with the third testing part 230. For example, when the third contact module 143 moves vertically relative to the base 110 along the paper surface, there is a position at which the third contact module 143 is electrically connected with the third testing part 230 to realize signal contact between the third contact module 143 and the third testing part 230, and complete electrical testing of the third testing part 230. Figure 4

[0046] The testing device 100 can electrically test multiple testing parts of the product 200 through the first contact module 141, the second contact module 142 and the third contact module 143, and the limiting assembly 130 ensures the position accuracy of the product 200 in the bearing cavity 111, improves the electrical contact position matching accuracy between the subsequent components, and thus improves the testing efficiency and testing reliability of the product 200. Moreover, since the testing device 100 independently tests the electrical properties of the product 200, the testing cost can be reduced.

[0047] In an embodiment, referring to Figures 1-3 ​As shown, the limiting assembly 130 comprises an abutting block 131 and a wire rail 133. The wire rail 133 is arranged on the base 110, for example, the wire rail 133 is arranged on the base 110 by screwing, welding or the like, the abutting block 131 is slidingly arranged on the wire rail 133, and the abutting block 131 can move towards the direction close to or away from the bearing cavity 111. For example, after the product to be tested 200 is placed in the bearing cavity 111, the abutting block 131 slides along the extension direction of the wire rail 133, and there is a position where the abutting block 131 abuts against the surface of the product to be tested 200, so as to regularize and position the product to be tested 200, thereby ensuring the position accuracy of the product to be tested 200 in the bearing cavity 111, improving the alignment accuracy of the on position of the product to be tested 200 and the test assembly 140, and further improving the test reliability of the product to be tested 200.

[0048] Specifically, referring to Figures 1-3 As shown, the abutting block 131 comprises a connecting portion 1311 and a limiting portion 1312, the limiting portion 1312 is connected to the connecting portion 1311, preferably, the connecting portion 1311 and the limiting portion 1312 are integrally formed by injection molding, extrusion or the like, so as to simplify the forming process of the abutting block 131 and improve the structural strength of the abutting block 131. The connecting portion 1311 is slidingly arranged on the wire rail 133, and when the product to be tested 200 is placed in the bearing cavity 111, the limiting portion 1312 can abut against the surface of the product to be tested 200. For example, in one embodiment, when the connecting portion 1311 drives the limiting portion 1312 to slide along the extension direction of the wire rail 133, the limiting portion 1312 can abut against the side surface of the product to be tested 200, and push the product to be tested 200 to make a slight adjustment movement, so that the product to be tested 200 is placed in the preset position in the bearing cavity 111. The outer circular surface of the limiting portion 1312 is provided with a chamfer, so as to fit the outer circular surface of the product to be tested 200, and avoid causing damage, scratching and other adverse phenomena to the product to be tested 200. For example, in another embodiment, when the connecting portion 1311 drives the limiting portion 1312 to slide along the extension direction of the wire rail 133, the limiting portion 1312 can be pressed on the upper surface of the product to be tested 200, and push the product to be tested 200 to enter the preset position in the bearing cavity 111. For example, the limiting portion 1312 is provided with a notch, so as to fit the upper surface of the product to be tested 200, and improve the stability of the product to be tested 200 in the bearing cavity 111.

[0049] The above test device 100, when the connecting portion 1311 drives the limiting portion 1312 to slide along the extension direction of the wire rail 133, the limiting portion 1312 can act on the surface of the product to be tested 200 in the form of abutting or pressing, so as to regularize and position the product to be tested 200, thereby ensuring the position accuracy of the product to be tested 200 in the bearing cavity 111, improving the alignment accuracy of the on position of the product to be tested 200 and the test assembly 140, and further improving the test reliability of the product to be tested 200.

[0050] Further, referring toFigures 1-3 As shown, the limiting assembly 130 further comprises two magnetic attraction members 134, which are arranged at intervals along the extension direction of the track 133, and are used for magnetically limiting the abutting block 131. For example, when the abutting block 131 slides to a position for abutting the surface of the product 200 along the extension direction of the track 133, one of the magnetic attraction members 134 magnetically limits the abutting block 131 at this position, so as to keep the abutting block 131 at the position for abutting the surface of the product 200, and to perform the compression test on the product 200. When the abutting block 131 slides to a position for separating from the product 200 along the extension direction of the track 133, the other magnetic attraction member 134 magnetically limits the abutting block 131 at this position, so as to facilitate the replacement of the product 200.

[0051] In an embodiment, continuing to refer to Figures 4-6 As shown, the third conduction module 143 comprises a base 1431 and a probe set 1432, and the probe set 1432 is arranged on the base 1431. For example, the probe set 1432 is an integrated array of a plurality of probes, and the specific number of the probe set 1432 can be adaptively arranged according to the number of test points in the third test unit 230. The base 1431 is movably arranged on the base 110, and during the lifting of the base 1431 relative to the base 110, the probe set 1432 can pass through the base 110 and be electrically connected with the third test unit 230, so as to realize the signal conduction between the third conduction module 143 and the third test unit 230, and complete the electrical test of the third test unit 230.

[0052] Specifically, referring to Figure 1 , Figure 3 , Figure 4 and Figure 6As shown, the third conduction module 143 further includes a mounting base 1433, a first elastic member 1434, a push block 1435 and a push rod 1436. The mounting base 1433 is arranged on the base 1431, for example, the mounting base 1433 is arranged on the base 1431 by welding, screwing or other methods. The base 1431 is movably arranged on the mounting base 1433. The base 1431 is embedded in the contact substrate 120. There is a movement gap between the base 1431 and the contact substrate 120, which avoids interference of the movement of the base 1431 by the contact substrate 120. The first elastic member 1434 is arranged between the mounting base 1433 and the base 1431. For example, one end of the first elastic member 1434 abuts against the mounting base 1433, and the other end of the first elastic member 1434 abuts against the base 1431. The deformation direction of the first elastic member 1434 is consistent with the movement direction of the base 1431. The first elastic member 1434 is used for resetting the base 1431. The push block 1435 is movably arranged on the base 110, and the push block 1435 can abut against the base 1431. There is a receiving groove 1437 between the push block 1435 and the base 110, which is used for inserting the push rod 1436. When the push rod 1436 is inserted into the receiving groove 1437, the push rod 1436 abuts against the push block 1435. The push rod 1436 is used for lifting or lowering the base 1431 relative to the base 110.

[0053] For example, when the electrical conduction operation between the third conduction module 143 and the third test part 230 needs to be performed, the push rod 1436 is inserted into the receiving groove 1437. The push rod 1436 abuts against the push block 1435. The push rod 1436 applies an abutting force to the push block 1435. The push block 1435 pushes the base 1431 to move upward along the vertical direction of the base 110. At the same time, the first elastic member 1434 is compressed. The probe group 1432 penetrates through the base 110 and is electrically connected with the third test part 230. The electrical conduction between the probe group 1432 and the third test part 230 is realized. The electrical test on the third test part 230 is performed. Figure 6 Conversely, when the electrical test on the product 200 to be tested is completed, the push rod 1436 is withdrawn from the receiving groove 1437. The first elastic member 1434 is elastically reset to push the base 1431 to move downward along the vertical direction of the base 110 to the initial position. The probe group 1432 is retracted into the base 110 and is separated from the third test part 230. The replacement operation of the product 200 to be tested is facilitated. Figure 6

[0054] In this embodiment, the first elastic member 1434 is a reset spring. Through the extension and retraction operation of the first elastic member 1434, the interference of the movement of the base 1431 is avoided, and the resetting of the base 1431 is facilitated. Of course, in other feasible embodiments, the first elastic member 1434 can also be an elastic sheet or other elements capable of extension and retraction. The specific type of the first elastic member 1434 is not limited in the present application. ​

[0055] Further, continuing to refer to Figure 6 As shown, the third conduction module 143 further comprises a guide rod 1438. The extension direction of the guide rod 1438 is consistent with the movement direction of the base 1431, for example, the extension direction of the guide rod 1438 is the vertical direction as shown, and the guide rod 1438 is used for movement guidance of the base 1431. Figure 6 As shown, the extension direction of the guide rod 1438 is the vertical direction as shown, and the guide rod 1438 is used for movement guidance of the base 1431. For example, one end of the guide rod 1438 is inserted into the mounting seat 1433, the other end of the guide rod 1438 is inserted into the base 1431, and there is a clearance between the guide rod 1438 and the mounting seat 1433 and the base 1431, which can not only avoid the interference of the guide rod 1438 on the movement of the base 1431, but also guide the movement of the base 1431, improve the alignment accuracy between the probe group 1432 and the third test part 230, and further improve the electrical test reliability of the third test part 230.

[0056] In an embodiment, referring to Figure 1 , Figure 3 , Figure 4 and Figure 6 As shown, the third conduction module 143 further comprises a movable block 1439. The movable block 1439 and the push block 1435 form a receiving groove 1437 therebetween, for example, the movable block 1439 and the push block 1435 are spaced apart, and the receiving groove 1437 is formed at the gap between the movable block 1439 and the push block 1435. The movable block 1439 is movably arranged on the base 110, and a second elastic member 14391 is arranged between the movable block 1439 and the base 110, for example, one end of the second elastic member 14391 abuts against the movable block 1439, and the other end of the second elastic member 14391 abuts against the base 110, and the second elastic member 14391 is used for resetting the movable block 1439. For example, when the push rod 1436 is inserted into the receiving groove 1437, the push rod 1436 abuts against the push block 1435 and the movable block 1439 on the opposite sides, respectively, the first elastic member 1434 and the second elastic member 14391 are compressed, the push block 1435 and the movable block 1439 move away from each other, avoiding interference with the insertion action of the push rod 1436, and when the push rod 1436 exits the receiving groove 1437, the first elastic member 1434 and the second elastic member 14391 are elastically reset, the push block 1435 and the movable block 1439 move towards each other, and when the movable block 1439 abuts against the push block 1435, the base 1431 is prevented from being excessively reset, so as to keep the base 1431 at a preset initial position.

[0057] In this embodiment, the second elastic element 14391 is a return spring. The extension and retraction of the second elastic element 14391 avoids interference with the movement of the base 1431 and keeps the base 1431 in a preset initial position. Of course, in other feasible embodiments, the second elastic element 14391 can also be an elastic sheet or other extendable element. This application does not limit the specific type of the second elastic element 14391. It should be noted that the elastic force of the second elastic element 14391 is less than or equal to the elastic force of the first elastic element 1434, to prevent the movable block 1439 from lifting the push block 1435 when the movable block 1439 abuts against it.

[0058] Further, see Figure 6 As shown, the push rod 1436 has a first arc-shaped surface 14392, and the movable block 1439 has a second arc-shaped surface 14393. When the push rod 1436 is inserted into the receiving groove 1437, the first arc-shaped surface 14392 cooperates with the second arc-shaped surface 14393, making the insertion of the push rod 1436 into the receiving groove 1437 smoother, and the operator only needs to apply a small force to complete the insertion of the push rod 1436, thus improving the convenience of lifting and lowering the base 1431.

[0059] In one embodiment, see Figures 1-3 As shown, the second test unit 220 is electrically connected to the contact substrate 120 via the electrode adapter block 150. When the second test unit 220 includes a positive electrode 221 and a negative electrode 222, the electrode adapter block 150 includes a first electrode adapter block 151 and a second electrode adapter block 152. The positive electrode 221 is electrically connected to the contact substrate 120 via the first electrode adapter block 151, and the negative electrode 222 is electrically connected to the contact substrate 120 via the second electrode adapter block 152. For example, the contact points between the contact substrate 120 and the first electrode adapter block 151 and the second electrode adapter block 152 can be solder pads. The first electrode adapter block 151 and the second electrode adapter block 152 are secured to the contact substrate 120 by screws to ensure stable signal conduction.

[0060] Continue reading Figure 7As shown, the first conduction module 141 includes a first pivot base 1411 and a first cover plate 1412, and the first cover plate 1412 is rotationally arranged on the first pivot base 1411. For example, the first cover plate 1412 is rotationally connected to the first pivot base 1411 by a hinged manner, and a torsion spring is arranged between the first cover plate 1412 and the first pivot base 1411, so as to facilitate the first cover plate 1412 to be separated from the first pivot base 1411 and automatically opened upward. The first cover plate 1412 is provided with a first elastic pressing rod 1413, when the first cover plate 1412 rotates relative to the first pivot base 1411, the first cover plate 1412 can cover the product to be tested 200, and the first elastic pressing rod 1413 abuts against the first test part 210, and the first elastic pressing rod 1413 is used to press the first test part 210 against the contact substrate 120, for example, the first elastic pressing rod 1413 can press the first test part 210 into the contact substrate 120, so that a stable electrical conduction is formed between the first test part 210 and the contact substrate 120, and the electrical test of the first test part 210 is realized. Since the first elastic pressing rod 1413 has elasticity, the abutting force applied by the first conduction module 141 to the first test part 210 can be buffered, so as to avoid that the instantaneous abutting force applied to the first test part 210 is too large to cause the product to be tested 200 to be worn, scratched and other adverse phenomena. In this embodiment, the first pivot base 1411 is provided with a first clamping hook 1414, when the first cover plate 1412 covers the product to be tested 200, the first clamping hook 1414 is hooked on the first cover plate 1412, so as to keep the first cover plate 1412 in the covering state to test the electrical property of the product to be tested 200.

[0061] Continuing to refer to Figure 8As shown, the second conduction module 142 includes a second pivot base 1421 and a second cover plate 1422, and the second cover plate 1422 is rotationally arranged on the second pivot base 1421. For example, the second cover plate 1422 is rotationally connected to the second pivot base 1421 by a hinged manner, and a torsion spring is arranged between the second cover plate 1422 and the second pivot base 1421, so as to facilitate the second cover plate 1422 to be separated from the second pivot base 1421 and automatically opened upward. The second cover plate 1422 is provided with a second elastic pressing rod 1423, when the second cover plate 1422 rotates relative to the second pivot base 1421, the second cover plate 1422 can cover the product to be tested 200, and the second elastic pressing rod 1423 abuts against the second test part 220, and the second elastic pressing rod 1423 is used to press the second test part 220 to the electrode adapter block 150. For example, the second elastic pressing rod 1423 includes a third elastic pressing rod 1424 and a fourth elastic pressing rod 1425, the third elastic pressing rod 1424 can press the positive electrode sheet 221 to the first electrode adapter block 151, so that the positive electrode sheet 221 and the first electrode adapter block 151 form a stable electrical conduction with the contact substrate 120, and the electrical property of the positive electrode sheet 221 is tested, and the fourth elastic pressing rod 1425 can press the negative electrode sheet 222 to the second electrode adapter block 152, so that the negative electrode sheet 222 and the second electrode adapter block 152 form a stable electrical conduction with the contact substrate 120, and the electrical property of the negative electrode sheet 222 is tested. Since the second elastic pressing rod 1423 has elasticity, it can buffer the abutting force applied by the second conduction module 142 to the second test part 220, so as to avoid that the instantaneous abutting force applied to the second test part 220 is too large to cause abrasion, scratches and other adverse phenomena on the product to be tested 200. In this embodiment, the second pivot base 1421 is provided with a second clamping hook 1426, when the second cover plate 1422 covers the product to be tested 200, the second clamping hook 1426 is hooked on the second cover plate 1422, so as to keep the second cover plate 1422 in the covering state to test the electrical property of the product to be tested 200.

[0062] It should be noted that, by covering the product to be tested 200 with the first cover plate 1412 and the second cover plate 1422, the first cover plate 1412 and the second cover plate 1422 stably press the product to be tested 200 in the bearing cavity, so as to ensure that the product to be tested 200 will not be lifted up when the third conduction module 143 moves upward and contacts the third test part 230.

[0063] In an embodiment, referring to Figure 1 As shown, the base 110 is provided with a plurality of clamping grooves 112. The plurality of clamping grooves 112 are arranged at intervals along the circumferential direction of the base 110, and the clamping grooves 112 are used for clamping the test device 100 by a gripper in an automatic line equipment, so as to carry the test device 100 from one station to another station, and realize the circulation of the test device 100 between stations.

[0064] The number of clamping grooves 112 can be six, eight, ten, twelve, etc. The specific number of clamping grooves 112 is not limited in the application and can be adaptively set according to the number of claws in the automatic line equipment.

[0065] The following will be described in detail Figures 1-8 The test action of the test device 100 in the application will be described in detail.

[0066] Step S110: Place the product to be tested 200 on the bearing cavity 111 of the base 110.

[0067] Step S120: The limiting assembly 130 slides relative to the base 110, and the limiting assembly 130 acts on the surface of the product to be tested 200 in a manner of abutting or pressing, so as to regularize and position the product to be tested 200.

[0068] Step S130: Close the first conduction module 141, and the first elastic pressing rod 1413 presses the first test part 210 into contact with the substrate 120, so that stable electrical conduction is formed between the first test part 210 and the substrate 120.

[0069] Step S140: Close the second conduction module 142, and the second elastic pressing rod 1423 presses the second test part 220 to the electrode adapter block 150, such as the third elastic pressing rod 1424 pressing the positive electrode sheet 221 to the first electrode adapter block 151, so that stable electrical conduction is formed between the positive electrode sheet 221 and the first electrode adapter block 151 and the substrate 120, and the fourth elastic pressing rod 1425 presses the negative electrode sheet 222 to the second electrode adapter block 152, so that stable electrical conduction is formed between the negative electrode sheet 222 and the second electrode adapter block 152 and the substrate 120.

[0070] Step S150: The third conduction module 143 is lifted relative to the base 110 and is electrically connected with the third test part 230, realizing signal conduction between the third conduction module 143 and the third test part 230. At this point, the product to be tested 200 is loaded with the test device 100 provided by the application, and the product to be tested 200 and the test device 100 are placed on the external detection equipment as a whole to be tested.

[0071] After the testing of the product 200 is completed, the third opening module 143 is lifted relative to the base 110 and separated from the third testing portion 230, the second opening module 142 and the first opening module 141 are opened in sequence, the second opening module 142 is separated from the second testing portion 220, and the first opening module 141 is separated from the first testing portion 210, the limiting assembly 130 is slid relative to the base 110 to be separated from the product 200, thus the product 200 is released from the limitation, and the product 200 can be taken out to complete the process of taking the product 200 out of the testing device 100.

[0072] The technical features of the above-mentioned embodiments can be combined in any manner. In order to make the description simple, all possible combinations of the technical features in the above-mentioned embodiments are not described, but as long as the combinations of the technical features do not contradict, they should be considered as the scope of the present disclosure.

[0073] The above-mentioned embodiments only express several implementation manners of the present application, and the description is relatively specific and detailed, but it should not be understood as a limitation on the patent scope of the present application. It should be pointed out that for ordinary skilled persons in the art, some modifications and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the patent protection scope of the present application should be subject to the appended claims.

Claims

1. A testing apparatus for performing electrical tests on a product under test, the product under test having a first testing section, a second testing section, and a third testing section, characterized in that, The testing device comprises: a base having a carrying cavity for carrying the product to be tested, and provided with a contact substrate; a limiting assembly slidingly arranged on the base, for limiting the product to be tested in the carrying cavity; and a testing assembly arranged on the base, and comprising a first conduction module, a second conduction module and a third conduction module, the first conduction module being used for conducting the first testing part and the contact substrate, the second conduction module being used for conducting the second testing part and the contact substrate, and the third conduction module being arranged on the base in a liftable manner and capable of being electrically connected with the third testing part.

2. The test device of claim 1, wherein, The limiting assembly comprises an abutting block and a linear rail, the linear rail being arranged on the base, and the abutting block being slidingly arranged on the linear rail and movable towards the carrying cavity or away from the carrying cavity.

3. The test device of claim 2, wherein, The abutting block comprises a connecting portion and a limiting portion connected with the connecting portion, the connecting portion being slidingly arranged on the linear rail; when the product to be tested is placed in the carrying cavity, the limiting portion can abut against the surface of the product to be tested.

4. The test device of claim 1, wherein, The third conduction module comprises a base and a probe group arranged on the base, the base being movably arranged on the base, and in the process of lifting the base relative to the base, the probe group can pass through the base and be electrically connected with the third testing part.

5. The test device of claim 4, wherein, The third conduction module further comprises a mounting seat, a first elastic member, a push block and a push rod, the mounting seat being arranged on the base, the base being movably arranged on the mounting seat, the base being embedded in the contact substrate and having a movable gap with the contact substrate, the first elastic member being arranged between the mounting seat and the base and having a deformation direction consistent with the movement direction of the base, the push block being movably arranged on the base and capable of abutting against the base, the push block and the base having a receiving groove for inserting the push rod therebetween, and when the push rod is inserted into the receiving groove, the push rod abuts against the push block for pushing the base to lift relative to the base.

6. The test device of claim 5, wherein, The third conduction module further comprises a guide rod, the extension direction of the guide rod being consistent with the movement direction of the base for guiding the movement of the base.

7. The test device of claim 5, wherein, The third conduction module further comprises a movable block, the receiving groove being formed between the push block and the movable block, the movable block being movably arranged on the base and provided with a second elastic member with the base.

8. The test device of claim 7, wherein, The push rod has a first arc-shaped surface, the movable block has a second arc-shaped surface, and when the push rod is inserted into the receiving groove, the first arc-shaped surface is fitted in the second arc-shaped surface.

9. The test device of claim 1, wherein, The second testing part is electrically connected with the contact substrate through an electrode adapter block; The first conduction module comprises a first pivot seat and a first cover plate rotatably arranged on the first pivot seat, the first cover plate being provided with a first elastic pressing rod, when the first cover plate rotates relative to the first pivot seat, the first cover plate can cover the product to be tested, and the first elastic pressing rod abuts against the first testing part for pressing the first testing part against the contact substrate; Therefore, the second conduction module comprises a second rotating shaft base and a second cover plate rotatably arranged on the second rotating shaft base, the second cover plate is provided with a second elastic pressing rod, when the second cover plate rotates relative to the second rotating shaft base, the second cover plate can cover the product to be tested, and the second elastic pressing rod abuts against the second test part, so as to press the second test part against the electrode adapter block.

10. The test device of claim 1, wherein, The base is provided with a plurality of clamping grooves, and the plurality of clamping grooves are arranged at intervals along the circumferential direction of the base.

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