Chip capacitor capacitance value accurate test clamp

Abstract

The utility model relates to the technical field of capacitor testing devices, in particular to a chip capacitor capacitance value accurate testing clamp. The clamp comprises a shielding box, a test seat assembly and a circuit assembly. The shielding box is formed by combining a plurality of shielding plates and partition plates; the test seat assembly is installed in the shielding box. The test seat assembly comprises a test seat cover plate and a test seat bottom plate, the test seat bottom plate is rotatably connected with the test seat cover plate, and the test seat bottom plate is provided with a lofting groove, an upper electrode and a lower electrode; an upper electrode connecting end, an upper electrode testing end and a conductive connecting piece are arranged on the testing seat cover plate, the upper electrode connecting end is matched with the upper electrode, and the upper electrode testing end is matched with the lower electrode; the circuit assembly comprises a wire joint, a wire and a shielding layer. According to the clamp, the influence of distribution parameters brought by the test lead on test result data can be eliminated, and the test precision of the test clamp is effectively improved.

Description

TECHNICAL FIELD

[0001] The utility model relates to capacitor testing device technical field, specifically related to a chip capacitor capacity accurate test fixture. BACKGROUND

[0002] In the field of capacitor product detection / test, the "temperature-voltage" parameter test of the capacitor is an important index for evaluating the characteristics of the capacitor, which can reflect the characteristics of the capacitance change caused by the temperature change of the capacitor (under the condition of rated voltage). The change of temperature may also affect the performance index of the capacitor insulation parameter, thereby affecting the response ability of the transmission signal. Among them, the insulation resistance of the capacitor is tested under the condition of direct current voltage, and the capacitance of the capacitor is tested under the condition of alternating current voltage; and due to different requirements for test parameters, the structure of the test fixture is different. At the same time, due to the small size and thin thickness of the chip capacitor (upper and lower electrode structure), the electrode has no lead-out, so a special test fixture is needed to accurately test the capacitance.

[0003] Chinese patent publication No. CN 219737570 U discloses a chip capacitor high-temperature insulation resistance test fixture, which comprises a fixture, a plurality of upper surface electrode contact ends, a plurality of lower surface electrode contact ends, a plurality of upper electrode lead-out ends, a plurality of lower electrode lead-out ends, a substrate, an upper electrode common end, a lower electrode test end and a first terminal post. Each upper surface electrode contact end is matched with a corresponding lower surface electrode contact end, each upper electrode lead-out end and lower electrode lead-out end is connected with a corresponding upper surface electrode contact end and lower surface contact end, a plurality of lower electrode test ends are respectively connected with corresponding lower electrode lead-out ends through wires, the upper electrode common end is arranged on the substrate, and a plurality of upper electrode lead-out ends are respectively connected with the upper electrode common end. Through the structure of the test fixture, the technical problems of the existing technology that the operator clamps the product on the heating table for operation, the test results are inaccurate due to unstable temperature, and the operator is scalded or the product is bruised due to careless operation are solved, and the test process is convenient and fast. However, the test fixture does not consider the electric field interference between capacitors, so that when multiple groups of capacitors are tested at the same time, the test results may be inaccurate due to mutual interference between capacitors, affecting the test precision, and being not conducive to large-scale popularization and application. UTILITY MODEL CONTENTS

[0004] The utility model aims at the defect that the existing chip capacitor test fixture does not consider the electromagnetic interference between capacitors, the influence of the lead wire on the capacitance value, i.e. the influence of the distributed parameter, and proposes a chip capacitor capacity accurate test fixture.

[0005] The utility model provides a kind of chip capacitor capacitance accurate test fixture, including shielding box, test seat component and circuit component;The shielding box includes several shielding plates and partition plate;The test seat component is installed in shielding box;The test seat component includes test seat cover plate and test seat bottom plate, the test seat bottom plate and test seat cover plate are rotatably connected, setting has lofting groove, upper electrode and lower electrode on the test seat bottom plate, the upper electrode is set on test seat bottom plate and is penetrated;The lower electrode is set in lofting groove and is penetrated test seat bottom plate;Upper electrode connecting end, upper electrode test end and conductive connecting piece are provided on the test seat cover plate, the upper electrode connecting end and upper electrode test end are connected by conductive connecting piece, the upper electrode connecting end is matched with upper electrode, and the upper electrode test end is matched with lower electrode;The circuit component includes wire connector, wire and shielding layer, one end of the wire is connected with wire connector, one end is connected with upper electrode or lower electrode on test seat bottom plate, and the wire connected with upper electrode and the wire connected with lower electrode are covered in different shielding layers;The partition plate has shielding function, and the partition plate is arranged between upper electrode and lower electrode to isolate upper electrode and lower electrode.

[0006] The utility model discloses a kind of chip capacitor capacitance accurate test fixture, including shielding box, test seat component and circuit component;The shielding box includes several shielding plates and partition plate;The test seat component is installed in shielding box;The test seat component includes test seat cover plate and test seat bottom plate, the test seat bottom plate and test seat cover plate are rotatably connected, setting has lofting groove, upper electrode and lower electrode on the test seat bottom plate, the upper electrode is set on test seat bottom plate and is penetrated;The lower electrode is set in lofting groove and is penetrated test seat bottom plate;Upper electrode connecting end, upper electrode test end and conductive connecting piece are provided on the test seat cover plate, the upper electrode connecting end and upper electrode test end are connected by conductive connecting piece, the upper electrode connecting end is matched with upper electrode, and the upper electrode test end is matched with lower electrode;The circuit component includes wire connector, wire and shielding layer, one end of the wire is connected with wire connector, one end is connected with upper electrode or lower electrode on test seat bottom plate, and the wire connected with upper electrode and the wire connected with lower electrode are covered in different shielding layers;The partition plate has shielding function, and the partition plate is arranged between upper electrode and lower electrode to isolate upper electrode and lower electrode.

[0007] Preferably, at least two test seat components are arranged in parallel in the shielding box;More preferably, at least three test seat components are arranged in parallel in the shielding box;Multiple test seat components arranged in parallel can place multiple capacitors to be tested in the test fixture at one time, and any one of them can be selected for testing, thereby reducing the time for repeatedly installing capacitors to be tested and greatly improving the testing efficiency.

[0008] Preferably, at least two lofting grooves are arranged in parallel on the test seat bottom plate;More preferably, at least three lofting grooves are arranged in parallel on the test seat bottom plate of the test seat component;Multiple lofting grooves arranged in parallel can place multiple capacitors to be tested in the test fixture at one time, and any one of them can be selected for testing, thereby reducing the time for repeatedly installing capacitors to be tested, greatly improving the testing efficiency, saving space and reducing the manufacturing cost of the fixture.

[0009] Preferably, the test seat bottom plate is further provided with a fixing groove;The test seat bottom plate can be better fixed in the shielding box.

[0010] Preferably, the contact surface of the lower electrode and upper electrode test end is smaller than the test surface of the chip capacitor; the distributed capacitance between the two poles can be eliminated, and the test precision is higher.

[0011] Preferably, the upper electrode connecting end and the upper electrode test end are respectively provided with elastic reset members; by setting the elastic reset members, the upper electrode connecting end and the upper electrode test end become pressure contact electrodes, which can ensure excellent contact without damaging the chip capacitor; more preferably, the elastic reset members are springs.

[0012] Preferably, the test seat assembly is further provided with a locking device; the test seat cover plate and the test seat bottom plate can be closed by the locking device, so that the two poles of the capacitor and the upper and lower electrodes are in continuous contact and communication; more preferably, the locking device comprises a buckle and a matching clamping groove, the buckle is arranged on the test seat cover plate, and the clamping groove is arranged on the test seat bottom plate.

[0013] Preferably, the wire connector is an aviation plug.

[0014] Preferably, the shielding plate and / or the partition plate are plate materials with shielding function and high and low temperature resistance; the high and low temperature range is at least -70℃ to +250℃; more preferably, the shielding plate and / or the partition plate are metal plates.

[0015] Preferably, the conductive connecting piece is a structural piece with conductive function; more preferably, the conductive connecting piece is a wire or a metal sheet; more preferably, the wire is a gold-plated copper wire; and the metal sheet is a gold-plated copper sheet.

[0016] Preferably, the test seat bottom plate and / or the test seat cover plate are insulating plate materials with high and low temperature resistance; the high and low temperature range is at least -70℃ to +250℃; more preferably, the test seat bottom plate and / or the test seat cover plate are PEI (polyethylene imine) material plates and / or PPS (polyphenylene sulfide) material plates.

[0017] Preferably, the shielding layer is a metal woven mesh; it has shielding function and high and low temperature resistance, and good flexibility.

[0018] Preferably, the capacitor test fixture further comprises an open circuit test seat and a short circuit test seat, the open circuit test seat and the short circuit test seat are installed in parallel with the test seat assembly in the shielding box; by setting the open circuit test seat and the short circuit test seat, open circuit and short circuit calibration during testing can be facilitated, and the test accuracy can be improved; the open circuit test seat comprises an upper electrode and a lower electrode, and the upper electrode and the lower electrode are always in an open circuit state; the short circuit test seat comprises an upper electrode and a lower electrode, and the upper electrode and the lower electrode are always in a communication state.

[0019] Compared with the prior art, the utility model has the advantages of:

[0020] 1. The chip capacitor capacitance accurate test fixture installs the test seat assembly in the shielding box with shielding function, and the upper electrode and the lower electrode and the corresponding wires are shielded and isolated by setting the partition and the shielding layer, so that the isolation effect of the shielding box and the shielding layer is utilized, the mutual interference of the capacitor electrode end is reduced, and the test precision of the test fixture is effectively improved.

[0021] 2. The chip capacitor capacitance accurate test fixture can parallel multiple test seat assemblies and / or lofting grooves, and multiple capacitors to be tested can be placed in the test fixture at a time, and one of them can be selected for testing during testing, thereby reducing the time of repeatedly installing the capacitors to be tested, and greatly improving the test efficiency.

[0022] 3. The chip capacitor capacitance accurate test fixture adopts high and low temperature resistant material, and is suitable for capacitor performance test in different temperature environments.

[0023] 4. The chip capacitor capacitance accurate test fixture sets the contact surface of the lower electrode and the upper electrode test end to be smaller than the test surface of the chip capacitor, so as to eliminate the distributed capacitance between the two poles, and the test precision is higher.

[0024] 5. The chip capacitor capacitance accurate test fixture has the advantages of simple structure, high test precision, wide application range and high test efficiency, and is suitable for large-scale application in chip capacitor performance test. BRIEF DESCRIPTION OF DRAWINGS

[0025] Figure 1 It is the structural layout drawing of the chip capacitor capacitance accurate test fixture in the embodiment 1 of the utility model;

[0026] Figure 2 It is the structural schematic view of the test seat bottom plate in the embodiment 1 of the utility model (the left drawing is the top view, and the right drawing is the sectional view);

[0027] Figure 3 It is the structural schematic view of the test seat cover plate in the embodiment 1 of the utility model (the left drawing is the bottom view, and the right drawing is the sectional view);

[0028] Figure 4 It is the three-dimensional schematic view of the test seat in the embodiment 1 of the utility model;

[0029] Figure 5 It is the position schematic view of the test seat bottom plate and the shielding box in the embodiment 1 of the utility model (the left drawing is the top view, and the right drawing is the sectional view).

[0030] Fig. 1 is a shielding box, 101 is a partition, 102 is a shielding plate, 2 is a test seat assembly, 201 is a lower electrode, 202 is an upper electrode, 203 is a lofting groove, 204 is a fixing groove, 205 is a test seat bottom plate, 206 is a test seat cover plate, 207 is an upper electrode connecting end, 208 is an upper electrode test end, 209 is a conductive connecting piece, 210 is an elastic reset piece, 211 is a clamping groove, 212 is a buckle, 3 is a line assembly, 301 is a wire joint, 302 is a wire, 303 is a shielding layer, 4 is an open circuit test seat, 5 is a short circuit test seat. DETAILED DESCRIPTION

[0031] The utility model will be described in further detail below in combination with specific embodiments. However, this should not be understood as the scope of the above-mentioned subject matter of the utility model being limited to the following embodiments only, and any technology realized based on the content of the utility model falls within the scope of the utility model.

[0032] In the description of the embodiments of the present application, the orientation or positional relationship terms such as "upper", "lower", "left", "right", "center", "inner", "outer", etc. are expressed based on the orientation or positional relationship shown in the drawings, or the orientation or positional relationship when the product / device / apparatus is normally used. These orientation or positional relationship terms are only used to facilitate the description of the present application or simplify the description in the embodiments, so as to enable the skilled person to quickly understand the scheme, and therefore cannot be understood as indicating or implying that a specific device / component / element must have a specific orientation or be constructed and operated in a specific positional relationship, and thus cannot be understood as limiting the present application.

[0033] In addition, if the terms "horizontal", "vertical", "overhanging", "parallel", etc. appear, it does not mean that the corresponding device / component / element must be absolutely horizontal or vertical or overhanging or parallel, but can be slightly inclined or have a deviation. For example, "horizontal" only means that its direction is more horizontal relative to "vertical", and does not mean that the structure must be completely horizontal, but can be slightly inclined. Alternatively, it can be simply understood that the corresponding device / component / element is arranged in the "horizontal", "vertical", "overhanging", "parallel" direction, and can have an error / deviation of ±10% with respect to the corresponding direction, more preferably an error / deviation of ±8% or less, more preferably an error / deviation of ±6% or less, more preferably an error / deviation of ±5% or less, and more preferably an error / deviation of ±4% or less. As long as the corresponding device / component / element is within the error / deviation range, it can still achieve its role in the present application scheme.

[0034] In addition, the terms "first", "second", "third", etc. appearing in the terms are only used to distinguish the description of the same or similar components, and should not be understood as emphasizing or implying the relative importance of a specific component.

[0035] In addition, in the description of the embodiments of the application, "several", "a plurality of", "several" represent at least 2. It can be 2, 3, 4, 5, 6, 7, 8, 9, etc. Any case, it can even be more than 9 cases.

[0036] In addition, in the description of the technical solutions of the application, unless otherwise specified / limited / limited, the terms "set", "install", "connect", "connect", "set", "lay", "arrange" should be understood broadly, for example, it can be fixedly connected, or it can be detachably connected, or integrally connected, which can be welding, riveting, bolting, screwing, etc. The connection means commonly used in the art. Such connection can be mechanical connection, electrical connection or communication connection; it can be directly connected, or indirectly connected through an intermediate medium, or the communication between two elements.

[0037] Embodiment 1

[0038] A chip capacitor capacity accurate test fixture (see Figure 1 , Figure 2 , Figure 3 , Figure 4 , Figure 5), which is composed of a shielding box 1, an open circuit test seat 4, a short circuit test seat 5, 10 test seat assemblies 2 and a circuit assembly 3; wherein the shielding box 1 is composed of multiple shielding plates 102 (magnesium-aluminum alloy plates) and a partition plate 101 (magnesium-aluminum alloy plate); the open circuit test seat 4 and the short circuit test seat 5 are installed in parallel with the test seat assemblies 2 in the shielding box 1; the open circuit test seat comprises an upper electrode and a lower electrode, and the upper electrode and the lower electrode are disconnected; the short circuit test seat comprises an upper electrode and a lower electrode, and the upper electrode and the lower electrode are connected; the test seat assembly 2 is installed in the shielding box 1; the test seat assembly 2 is composed of a test seat cover plate 206 (PEI material plate) and a test seat bottom plate 205 (PEI material plate), the test seat bottom plate 205 and the test seat cover plate 206 are rotationally connected, the test seat bottom plate 205 is provided with 2 lofting grooves 203 (the size of the lofting groove 203 is 10% larger than the size of the chip capacitor), 2 upper electrodes 202 and 2 lower electrodes 201, the 2 upper electrodes 202 are respectively provided through the test seat bottom plate 205, the 2 lower electrodes 201 are respectively provided through the test seat bottom plate 205 in the 2 lofting grooves 203 (the bottom surface of the lofting groove 203 is 0.1mm lower than the upper surface of the lower electrode 201); the test seat cover plate 206 is provided with 2 upper electrode connecting end heads 207, 2 upper electrode test end heads 208 and 2 conductive connecting pieces 209, each upper electrode connecting end head 207 and upper electrode test end head 208 are connected through one conductive connecting piece 209 (wire), the upper electrode connecting end head 207 is matched with the upper electrode 202, and the upper electrode test end head 208 is matched with the lower electrode 201; the circuit assembly 3 is composed of a wire joint 301 (aviation joint), a wire 302 and a shielding layer 303 (tinned copper braided mesh); each upper electrode 202 in each test seat assembly 2 is connected with one wire 302, and the other end of the wire 302 is connected with a multi-core aviation joint; each lower electrode 201 in each test seat assembly 2 is connected with one wire 302, and the other end of the wire 302 is connected with another multi-core aviation joint; all the wires 302 connected with the upper electrode 202 are covered in the same shielding layer 303, and all the wires 302 connected with the lower electrode 201 are covered in another shielding layer 303; the partition plate 101 is arranged between the upper electrode 202 and the lower electrode 201; the test seat bottom plate 205 is further provided with a fixing groove 204; the contact surfaces of the lower electrode 201 and the upper electrode test end head 208 are arranged to be smaller than the test surface of the chip capacitor; springs are respectively arranged on the upper electrode connecting end head 207 and the upper electrode test end head 208, so that they become crimping electrodes; the test seat assembly 2 is further provided with a locking device, which is composed of a buckle 212 and a matched clamping groove 211, the buckle 212 is arranged on the test seat cover plate 206, and the clamping groove 211 is arranged on the test seat bottom plate 205.

[0039] The chip capacitor capacity accurate test fixture in the embodiment 1 installs 10 test seat assemblies 2 in the shielding box 1, sets the magnesium-aluminum alloy plate partition 101, and also isolates the connecting wire 302 with copper tinned braid, which reduces the mutual interference of capacitor electrode ends in many aspects and improves the test accuracy; 10 test seat assemblies 2 and 2 layout slots 203 are connected in parallel, 20 chip electrode products can be installed in the fixture box at the same time, and one of them can be selected for testing during the test, which greatly improves the test efficiency; the fixture is composed of high and low temperature resistant materials, and can test the capacitor performance in different temperature environments; the contact surface of the lower electrode 201 and the upper electrode test end 208 in the fixture is set to be smaller than the test surface of the chip capacitor, which eliminates the distributed capacitance between the two poles, and the test accuracy is higher; the chip capacitor capacity accurate test fixture has simple structure, high test accuracy, wide application range, high test efficiency, and is suitable for large-scale application in the performance test of chip capacitors.

[0040] Embodiment 2

[0041] The chip capacitor capacity accurate test fixture is composed of a shielding box 1, two test seat components 2 and a circuit component 3; wherein the shielding box 1 is composed of multiple shielding plates 102 (magnesium-aluminum alloy plates) and a partition plate 101 (magnesium-aluminum alloy plate); the test seat component 2 is installed in the shielding box 1; the test seat component 2 is composed of a test seat cover plate 206 (PEI material plate) and a test seat bottom plate 205 (PEI material plate), the test seat bottom plate 205 and the test seat cover plate 206 are rotationally connected, the test seat bottom plate 205 is provided with one lofting groove 203 (the size of the lofting groove 203 is 10% larger than the size of the chip capacitor), one upper electrode 202 and one lower electrode 201, the upper electrode 202 is provided on the test seat bottom plate 205 in a penetrating manner, the lower electrode 201 is provided in the lofting groove 203 in a penetrating manner through the test seat bottom plate 205 (the bottom surface of the lofting groove 203 is 0.2mm lower than the upper surface of the lower electrode 201); the test seat cover plate 206 is provided with one upper electrode connecting end 207, one upper electrode test end 208 and one conductive connecting piece 209, each upper electrode connecting end 207 and upper electrode test end 208 are connected through one conductive connecting piece 209 (wire), the upper electrode connecting end 207 cooperates with the upper electrode 202, and the upper electrode test end 208 cooperates with the lower electrode 201; the circuit component 3 is composed of a wire joint 301 (aviation joint) and a wire 302; each upper electrode 202 in each test seat component 2 is connected with two wires 302, the other end of the wire 302 is connected with a multi-core aviation joint; each lower electrode 201 in each test seat component 2 is connected with two wires 302, the other end of the wire 302 is connected with another multi-core aviation joint; the test seat bottom plate 205 is further provided with a fixing groove 204; the contact surface of the lower electrode 201 and the upper electrode test end 208 is set to be smaller than the test surface of the chip capacitor; the upper electrode connecting end 207 and the upper electrode test end 208 are respectively provided with springs, so as to become pressure contact electrodes; the partition plate 101 is arranged between the upper electrode 202 and the lower electrode 201; the test seat component 2 is further provided with a locking device, the locking device is composed of a buckle 212 and a matched clamping groove 211, the buckle 212 is arranged on the test seat cover plate 206, and the clamping groove 211 is arranged on the test seat bottom plate 205.

[0042] The chip capacitor capacity accurate test fixture in the embodiment 2 installs two test seat assemblies 2 in the shielding box 1, reduces the mutual interference of the capacitor electrode ends, and improves the test accuracy; the two test seat assemblies 2 are connected in parallel, two chip electrode products can be installed in the fixture box at the same time, and one of them can be selected for testing during the test, and the test efficiency is improved; the fixture is composed of high and low temperature resistant materials, and can test the capacitor performance in different temperature environments; the contact surface of the lower electrode 201 and the upper electrode test end 208 in the fixture is set to be smaller than the test surface of the chip capacitor, the distributed capacitance between the two electrodes is eliminated, and the test accuracy is higher; the chip capacitor capacity accurate test fixture has simple structure, high test accuracy, wide application range, high test efficiency, and is suitable for large-scale application in the performance test of chip capacitors.

[0043] Embodiment 3

[0044] The utility model provides a chip electric capacity accurate test fixture, by shielding box 1, 1 test seat subassembly 2 and circuit subassembly 3 are constituteed, wherein, shielding box 1 is combined by multiple shielding plate 102 (magnesium aluminum alloy plate) and baffle 101 (magnesium aluminum alloy plate), test seat subassembly 2 is installed in shielding box 1, test seat subassembly 2 is constituted by test seat cover plate 206 (PEI material plate) and test seat bottom plate 205 (PEI material plate), test seat bottom plate 205 and test seat cover plate 206 are rotationally connected, test seat bottom plate 205 is provided with 4 lofting groove 203 (the size of lofting groove 203 is 10% more than the size of chip electric capacity), 4 upper electrode 202 and 4 lower electrode 201, 4 upper electrode 202 are respectively set on test seat bottom plate 205, 4 lower electrode 201 are set in 4 lofting groove 203 (the bottom surface of lofting groove 203 is 0.15mm lower than the upper surface of lower electrode 201) through test seat bottom plate 205, test seat cover plate 206 is provided with 4 upper electrode connecting end 207, 4 upper electrode test end 208 and 4 conductive connecting piece 209, and every upper electrode connecting end 207 and upper electrode test end 208 are connected through a conductive connecting piece 209 (wire), and upper electrode connecting end 207 is matched with upper electrode 202, and upper electrode test end 208 is matched with lower electrode 201, circuit subassembly 3 is constituted by wire joint 301 (aviation joint), wire 302 and shielding layer 303 (purple copper tinning braided net), and every upper electrode 202 in every test seat subassembly 2 is connected with a wire 302, and the other end of wire 302 is connected with multiple core aviation joint, every lower electrode 201 in every test seat subassembly 2 is connected with a wire 302, and the other end of wire 302 is connected with another multiple core aviation joint, all the wires 302 connected with upper electrode 202 are covered in the same shielding layer 303, and all the wires 302 connected with lower electrode 201 are covered in another shielding layer 303, baffle 101 is arranged between upper electrode 202 and lower electrode 201, and the contact surface of lower electrode 201 and upper electrode test end 208 is set to be less than the test surface of chip electric capacity.

[0045] The chip capacitor capacity accurate test fixture in the embodiment 3 installs one test seat assembly 2 in the shielding box 1, and meanwhile, the connecting wire 302 is isolated by copper tinned braid, which reduces the mutual interference of capacitor electrode ends in many aspects and improves the test accuracy; four lofting grooves 203 are connected in parallel, four chip electrode products can be installed in the fixture box at the same time, one of them can be selected for testing during the test, which greatly improves the test efficiency; the fixture is composed of high and low temperature resistant materials, which can test the capacitor performance in different temperature environments; the contact surface of the lower electrode 201 and the upper electrode test end 208 in the fixture is set to be smaller than the test surface of the chip capacitor, which eliminates the distributed capacitance between the two electrodes, and the test accuracy is higher; the chip capacitor capacity accurate test fixture has simple structure, high test accuracy, wide application range and high test efficiency, and is suitable for large-scale application in the performance test of chip capacitors.

[0046] The above merely describes the preferred embodiments of the present application and is not intended to limit the present application, and any modification, equivalent replacement and improvement made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A chip capacitor capacitance accurate test fixture, characterized in that, The capacitor testing fixture comprises a shielding box (1), a testing seat assembly (2) and a circuit assembly (3). The shielding box (1) comprises a plurality of shielding plates (102) and partitions (101). The testing seat assembly (2) is installed in the shielding box (1). The testing seat assembly (2) comprises a testing seat cover plate (206) and a testing seat bottom plate (205). The testing seat bottom plate (205) and the testing seat cover plate (206) are rotationally connected. The testing seat bottom plate (205) is provided with a lofting groove (203), an upper electrode (202) and a lower electrode (201). The upper electrode (202) is provided through the testing seat bottom plate (205). The lower electrode (201) is provided through the testing seat bottom plate (205) in the lofting groove (203). The testing seat cover plate (206) is provided with an upper electrode connecting end (207), an upper electrode testing end (208) and a conductive connecting piece (209). The upper electrode connecting end (207) and the upper electrode testing end (208) are connected through the conductive connecting piece (209). The upper electrode connecting end (207) is matched with the upper electrode (202). The upper electrode testing end (208) is matched with the lower electrode (201). The partition (101) is arranged between the upper electrode (202) and the lower electrode (201). The circuit assembly (3) comprises a wire connector (301), a wire (302) and a shielding layer (303). One end of the wire (302) is connected with the wire connector (301). One end of the wire (302) is connected with the upper electrode (202) or the lower electrode (201) on the testing seat bottom plate (205). The wire (302) connected with the upper electrode (202) and the wire (302) connected with the lower electrode (201) are covered in different shielding layers (303). The partition (101) has a shielding function. The partition (101) is arranged between the upper electrode (202) and the lower electrode (201) to isolate the upper electrode (202) and the lower electrode (201).

2. The chip capacitor capacitance value accurate test fixture according to claim 1, wherein, At least two testing seat assemblies (2) are arranged in parallel in the shielding box (1).

3. The chip capacitor capacitance value accurate test fixture of claim 1, wherein, At least two lofting grooves (203) are arranged in parallel on the testing seat bottom plate (205).

4. The chip capacitor capacitance value accurate test fixture of claim 1, wherein, The contact surface of the lower electrode (201) and the upper electrode testing end (208) is smaller than the test surface of the chip capacitor.

5. The chip capacitor capacitance value accurate test fixture of claim 1, wherein, Elastic reset members (210) are arranged on the upper electrode connecting end (207) and the upper electrode testing end (208) respectively.

6. The chip capacitor capacitance value accurate test fixture of claim 1, wherein, The testing seat assembly (2) is further provided with a locking device.

7. The chip capacitor capacitance value accurate test fixture according to claim 6, characterized in that, The locking device comprises a buckle (212) and a matched clamping groove (211). The buckle (212) is arranged on the testing seat cover plate (206). The clamping groove (211) is arranged on the testing seat bottom plate (205).

8. The chip capacitor capacitance value accurate test fixture of claim 1, wherein, The shielding plate (102) and / or the partition (101) is a metal plate.

9. The chip capacitor capacitance value accurate test fixture of claim 1, wherein, The shielding layer (303) is a metal woven mesh.

10. The chip capacitor capacitance value precision test fixture according to any one of claims 1-9, characterized in that, The capacitor testing fixture further comprises an open circuit testing seat (4) and a short circuit testing seat (5). The open circuit testing seat (4) and the short circuit testing seat (5) are installed in parallel with the testing seat assembly (2) in the shielding box (1).

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