Avalanche photodiode test fixture

Abstract

The utility model discloses an avalanche photodiode test fixture, which comprises a main body (1) and clamping piece needles (2), the main body (1) is provided with a plurality of clamping piece needle holes (110) penetrating front and back, the clamping piece needles (2) are clamped in the clamping piece needle holes (110), and the front sections of the clamping piece needles (2) form clamping parts. Compared with the prior art, the test fixture has the advantages that the clamping part of the test fixture adopts the clamping piece type clamping piece needle, the pins of the avalanche photodiode can be tightly locked, welding is not needed before testing, the avalanche photodiode can be directly pulled out after testing is completed, components cannot be damaged, operation is simple, and test efficiency is high.

Description

Technical Field

[0001] This utility model belongs to the field of quantum communication and optical communication testing, and specifically relates to an avalanche photodiode test fixture. Background Technology

[0002] Existing avalanche photodiode testing solutions employ a finished product assembly method for testing, such as... Figure 1 As shown, the avalanche photodiode 10 is soldered onto a flexible PCB board 20, and then the flexible PCB board 20 is soldered onto the main board for power-on testing. The flexible PCB board 20 is fixed to the test housing 30. Because the avalanche photodiode 10 needs to be soldered onto the flexible PCB board 20 during the testing process, it is not convenient to remove it from the flexible PCB board 20 after the test is completed, and the disassembly process after soldering can easily damage the avalanche photodiode 10.

[0003] Specifically, existing technologies employ a finished product assembly method, soldering the avalanche photodiode 10 onto a product (such as a single-photon detector motherboard) for testing. The avalanche photodiode 10 has 12 pins distributed on its bottom. During the soldering process using a soldering iron onto the flexible PCB board 20, prolonged heating can cause pin deformation and pad detachment, thus damaging the performance of the avalanche photodiode 10 and reducing the test yield. Furthermore, it is extremely difficult to disassemble after soldering. While using a hot air gun can heat multiple pins simultaneously, both soldering irons and hot air guns suffer from uneven heating, which can damage the internal components of the avalanche photodiode 10. The hot air gun's airflow cannot be concentrated on the pins of the avalanche photodiode 10, and since the avalanche photodiode 10 integrates core components such as a temperature sensor, cooler, and photosensitive surface, it is highly sensitive to temperature changes. Sudden temperature fluctuations can easily damage these internal components, thus affecting its performance.

[0004] In addition, due to the fluidity of the wind, the hot air emitted during operation will melt the solder of the components around the pads of the flexible PCB board 20. If the avalanche photodiode 10 is accidentally touched while it is being removed, there is a high probability that the pads of these unrelated electronic components will be misaligned or separated from the solder joints on the flexible PCB board 20. Utility Model Content

[0005] The technical problem to be solved by this invention is how to avoid damage and failure of avalanche photodiode devices caused by repeated disassembly during testing.

[0006] The present invention solves the above-mentioned technical problems through the following technical means: an avalanche photodiode test fixture, including a main body (1) and a clamping pin (2), wherein the main body (1) is provided with a plurality of clamping pin holes (110) extending through the front and back, the clamping pin (2) is clamped in the clamping pin holes (110), and the front end of the clamping pin (2) forms a clamping part.

[0007] As an optimized technical solution, the clip needle (2) in each clip needle hole (110) includes two clips (22) and a limiting block (24) that binds the two clips (22).

[0008] Alternatively, the clip needle (2) may be an integrally formed structure.

[0009] As an optimized technical solution, the inside of the clip pin hole (110) includes two through holes from front to back: a first through hole (114) and a second through hole (112). The inner diameter of the first through hole (114) is larger than the inner diameter of the second through hole (112), and a through hole step (116) is formed inside the clip pin hole (110). The front part of the clamping part is an outwardly expanding V-shape, and the front part of the clip pin (2) abuts against the through hole step (116).

[0010] As an optimized technical solution, the second through hole (112) is set as a cylindrical through hole.

[0011] As an optimized technical solution, when the clip needle (2) in each clip needle hole (110) includes two clips (22) and a limiting block (24) that binds the two clips (22), the two clips (22) are arranged opposite to each other in the rear section of the second through hole (112). In the front section of the second through hole (112) near the first through hole (114), the distance between the two clips (22) gradually shrinks inward until they contact each other, and then gradually expands. The front parts of the two clips (22) together form an outwardly expanding V-shape.

[0012] As an optimized technical solution, the inner diameter of the first through hole (114) is greater than the outer dimension of the V-shape, which is greater than the inner diameter of the second through hole (112).

[0013] As an optimized technical solution, the limiting block (24) is made of insulating material.

[0014] As an optimized technical solution, the clamping pin (2) is a copper sheet.

[0015] As an optimized technical solution, the two ends of the rear back plate of the main body (1) are recessed downward to form a mounting platform, and a fixing through hole (102) is provided on the mounting platform.

[0016] As an optimized technical solution, the main body (1) is fixed on the test housing (30), and an insertion hole is provided on the test housing (30) in the area corresponding to the clip pin hole (110). The exposed part of the rear section of the clip pin (2) is connected to the detector main board by welding with a cable.

[0017] The advantages of this utility model are: the clamping part of the test fixture of this utility model adopts a clip-type clip pin, which can tightly lock the pin of the avalanche photodiode. No soldering is required before testing, and the avalanche photodiode can be directly pulled out after testing without damaging the component itself. It is also simple to operate and has high testing efficiency. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the existing avalanche photodiode testing scheme, which uses finished product assembly for testing.

[0019] Figure 2 This is a perspective view of the avalanche photodiode test fixture according to an embodiment of the present invention, wherein the clamping pins in the three clamping pin holes on the right side are omitted;

[0020] Figure 3 This is a cross-sectional view of the avalanche photodiode test fixture according to an embodiment of the present invention, wherein the clamping pins in the two clamping pin holes on the right side are omitted;

[0021] Figure 4 This is a cross-sectional enlarged view of the avalanche photodiode test fixture according to an embodiment of the present invention;

[0022] Figure 5 This is another perspective view of the avalanche photodiode test fixture according to an embodiment of the present invention;

[0023] Figure 6 This is a schematic diagram of a test performed using the avalanche photodiode test fixture according to an embodiment of this utility model. Detailed Implementation

[0024] It should be noted that, unless otherwise specified, the following embodiments and features can be combined with each other. Furthermore, the illustrations provided in the following embodiments are merely schematic representations of the basic concept of this utility model. The illustrations only show components relevant to this utility model and are not drawn according to the actual number, shape, and size of the components in implementation. In actual implementation, the form, quantity, and proportion of each component can be arbitrarily changed, and the component layout may also be more complex.

[0025] It should be noted that the directional terms mentioned in the embodiments, such as "up," "down," "front," "back," "left," and "right," are only for reference to the directions in the accompanying drawings and are not intended to limit the scope of protection of this disclosure. Throughout the drawings, the same elements are represented by the same or similar reference numerals. Conventional structures or constructions will be omitted where they may cause confusion in understanding this disclosure.

[0026] This invention provides an avalanche photodiode test fixture, enabling performance testing of avalanche photodiodes without the need for soldering.

[0027] like Figures 2 to 6 As shown, the test fixture 100 proposed in this utility model includes a main body 1 and a clamping pin 2.

[0028] The rear back panel of the main body 1 is recessed at both ends to form a mounting platform. The mounting platform is provided with a fixing through hole 102. The front panel of the main body 1 is placed against the test housing 30. Screws are screwed into the test housing 30 through the fixing through hole 102 from the rear back panel of the main body 1, thereby fixing the main body 1 to the test housing 30.

[0029] The main body 1 has a through-hole 110 in the center of the protrusion relative to the mounting platform. An insertion hole is provided on the test housing 30 in the area corresponding to the through-hole 110, allowing the pins of the avalanche photodiode 10 to be inserted into the test fixture 100. The number and layout of the through-holes 110 are determined according to the pin positions of the avalanche photodiode 10. The inside of each through-hole 110 includes two through-holes from the front panel to the rear back panel: a first through-hole 114 and a second through-hole 112. The second through-hole 112 is a cylindrical through-hole. The total length of the through-hole 110 is greater than the length of the second through-hole 112, and the inner diameter of the first through-hole 114 is greater than the inner diameter of the second through-hole 112. Therefore, a through-hole step 116 is formed within the through-hole 110.

[0030] Clip pin 2 is made of copper sheet material, please refer to the following. Figure 3 and Figure 4As an example, each clip pin 2 within the clip pin hole 110 includes two clips 22 and a limiting block 24 for fixing the two clips 22. The limiting block 24 is made of an insulating material, such as plastic or rubber. A positioning hole is formed on the limiting block 24, extending through the front and rear, just accommodating the clips 22. The two clips 22 pass through the positioning hole, thereby fixing their positions. The two clips 22 are positioned opposite each other at the rear end of the second through hole 112. At the front end of the second through hole 112 near the first through hole 114, the distance between the two clips 22 gradually narrows inward until they contact each other, and then gradually widens, that is, the front end of the clips 22 forms a bend, and the last bend is stuck on the through hole step 116. At this time, the front parts of the two clips 22 together form an outwardly expanding V-shape. The inner diameter of the first through hole 114 is greater than the outer dimension of the V-shape at the front of the clip pin 2, which is greater than the inner diameter of the second through hole 112. When the clip pin 2 is inserted into the clip pin hole 110 from the front panel of the test fixture 100, the front section of the clip pin 2 can be limited by the through hole step 116, accurately defining the installation position of the clip pin 2 in each clip pin hole 110. The pins of the avalanche photodiode 10 are inserted from the top of the front panel of the test fixture 100 between the two clips 22 in the clip pin hole 110 and locked by the two clips 22. The exposed part of the rear section of the clip pin 2 is wired to the single-photon detector motherboard for electrical performance testing.

[0031] Those skilled in the art should understand that the clip pin 2 in the clip pin hole 110 can also be made of one piece without the need for two clips 22. It is only necessary to form a clamping part at the front of the clip pin 2 so as to clamp the pin of the avalanche photodiode 10.

[0032] The clamping part of the test fixture 100 of this utility model adopts a clamping pin 2, which can tightly lock the pins of the avalanche photodiode 10, so as not to damage the components during the test process, and the operation is simple and the test efficiency is high.

[0033] This invention allows for electrical performance and connectivity testing of avalanche photodiodes without the need for soldering. The avalanche photodiode test is conducted according to the following steps:

[0034] 1. Insert the corresponding clamping pin 2 into the clamping pin hole 110 on the front panel of the test fixture 100. The front section of the clamping pin 2 is limited by the through hole step 116. Use screws to lock the test fixture 100 onto the test housing 30. Use a cable to solder the rear section of the clamping pin 2 to the detector motherboard.

[0035] 2. Insert the device under test (i.e., avalanche photodiode 10) between the two clips 22 of the clip pin 2 from the front panel of the test fixture 100. The two clips 22 are connected to the pins of the avalanche photodiode 10 and the pins of the avalanche photodiode 10 are locked, thereby connecting the avalanche photodiode 10 to the detector motherboard.

[0036] 3. The optical pulse signal is connected to the avalanche photodiode 10 to convert the optical pulse signal into an electrical pulse signal. Because the exposed part of the clamping pin 2 at the back plate of the test fixture 100 is soldered to the detector motherboard through a cable, the electrical pulse signal is processed by the avalanche signal extraction circuit to output the detection pulse signal, which is finally displayed on the host computer to test the detector efficiency and other key parameters such as the back pulse.

[0037] 4. After the test is completed, the avalanche photodiode 10 can be directly pulled out without damaging the component itself.

[0038] The above embodiments are only used to illustrate the technical solutions of this utility model, and are not intended to limit it. Although this utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this utility model.

Claims

1. A test fixture for avalanche photodiodes, characterized in that, It includes a main body (1) and a clamping pin (2). The main body (1) is provided with a plurality of clamping pin holes (110) that extend through the front and back. The clamping pin (2) is inserted into the clamping pin holes (110), and the front part of the clamping pin (2) forms a clamping part.

2. The avalanche photodiode test fixture as described in claim 1, characterized in that, Each clip pin (2) in the clip pin hole (110) includes two clips (22) and a limiting block (24) that binds the two clips (22).

3. The avalanche photodiode test fixture as described in claim 1, characterized in that, The clip pin (2) is an integrally molded structure.

4. The avalanche photodiode test fixture as described in claim 1, characterized in that, The clamping pin hole (110) includes two through holes from front to back: a first through hole (114) and a second through hole (112). The inner diameter of the first through hole (114) is larger than the inner diameter of the second through hole (112), forming a through hole step (116) inside the clamping pin hole (110). The front part of the clamping part is an outwardly expanding V-shape, and the front part of the clamping pin (2) abuts against the through hole step (116).

5. The avalanche photodiode test fixture as described in claim 4, characterized in that, The second through hole (112) is configured as a cylindrical through hole.

6. The avalanche photodiode test fixture as described in claim 4, characterized in that, Each clip pin (2) in the clip pin hole (110) includes two clips (22) and a limiting block (24) for fixing the two clips (22). The two clips (22) are arranged opposite each other at the rear section of the second through hole (112). At the front section of the second through hole (112) near the first through hole (114), the distance between the two clips (22) gradually shrinks inward until they contact each other, and then gradually expands. The front parts of the two clips (22) together form an outwardly expanding V-shape.

7. An avalanche photodiode test fixture as described in claim 2 or 6, characterized in that, The limiting block (24) is made of insulating material.

8. The avalanche photodiode test fixture as described in claim 1, characterized in that, The clamping pin (2) is a copper sheet.

9. The avalanche photodiode test fixture as described in claim 1, characterized in that, The rear back plate of the main body (1) is recessed at both ends to form a mounting platform, and a fixing through hole (102) is provided on the mounting platform.

10. The avalanche photodiode test fixture as described in claim 1, characterized in that, The main body (1) is fixed on the test housing (30). An insertion hole is provided on the test housing (30) in the area corresponding to the clip pin hole (110). The exposed part of the rear section of the clip pin (2) is connected to the detector main board by welding a cable.

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