Test switching device for probe card

Abstract

The utility model provides a probe card test switching device, the bottom of a probe card is provided with a plurality of plugging ports which are uniformly distributed along the circumference, pins at the bottom of the probe card are distributed at each plugging port according to areas, the probe card test switching device is characterized in that the probe card test switching device comprises a circuit board, a socket and a connector, one end of the circuit board is an extension end, the extension end is provided with the socket, and the connector is connected with the socket. The socket is connected with the plugging port in a plugging mode, the connector is arranged on the circuit board, a plurality of switching needles are arranged on the connector, the switching needles and the pins in the plugging port are arranged in a one-to-one correspondence mode, and the size of the switching needles is larger than that of the pins. The device is simple in structure, is convenient to manufacture, can quickly search and connect test points through the switching device, and greatly improves the detection efficiency.

Description

Technical Field

[0001] This utility model relates to the field of probe card testing technology, and in particular to a probe card testing adapter. Background Technology

[0002] In wafer testing, probe cards serve as the interface between the chip under test and the testing machine. They are used to perform preliminary measurements of the electrical performance of the chip before chip slab packaging, and to screen out defective chips before proceeding with subsequent packaging work. Probe cards are mainly composed of PCB, pins, and functional components. The PCB has wiring points that correspond one-to-one with each pin, and each pin and its corresponding wiring point form a circuit channel.

[0003] To ensure wafer testing quality, probe cards need to undergo electrical testing before wafer testing. During electrical testing, automated testing equipment is used, and after completion, manual inspection is required to identify any non-conforming channels displayed on the automated equipment. Manual inspection necessitates one person crawling under the probe card to locate the pins on the PCB connectors. Since the pins are small and difficult to find, another person needs to locate the corresponding connection points on top. This process is cumbersome, difficult, wastes human resources, and is inefficient. Utility Model Content

[0004] The present invention aims to provide a probe card test adapter to overcome the shortcomings of the prior art.

[0005] To solve the above-mentioned technical problems, the technical solution of this utility model is: a probe card test adapter device, including a circuit board, a socket, and a connector. The bottom of the probe card is provided with multiple circumferentially distributed insertion interfaces. The pins on the bottom of the probe card are distributed in each of the insertion interfaces according to the region. One end of the circuit board is an extension end, and the extension end is provided with a socket. The socket is inserted into the insertion interface. The connector is provided on the circuit board and is provided with multiple adapter pins. The adapter pins are arranged one-to-one with the pins in the insertion interface, and the size of the adapter pin is larger than the size of the pin.

[0006] Furthermore, in the aforementioned probe card test adapter, the adapter pin is a square cylinder with a side length of 0.5-1.2mm.

[0007] Furthermore, in the aforementioned probe card test adapter, multiple adapter pins are evenly arranged with a spacing of 2-4 mm.

[0008] Furthermore, in the aforementioned probe card test adapter, there are two circuit boards, with multiple isolation sleeves between the two circuit boards, and the two circuit boards are fixedly connected by fasteners passing through the isolation sleeves.

[0009] Furthermore, in the aforementioned probe card test adapter, the connector is a ZIF connector, and there are two of them, each located on the outside of a circuit board, and the two sides of the circuit board are marked with identification pins.

[0010] Furthermore, in the aforementioned probe card test adapter, the socket includes a clamp, a partition, and an extension circuit board located at the extension end of the circuit board. The end of the extension circuit board is provided with gold fingers that connect to the pins. A partition is provided between the two extension circuit boards. Two clamps are provided, clamping the outside of the two extension circuit boards. The extension circuit boards, partitions, and clamps are fixedly connected by fasteners to form a socket.

[0011] Furthermore, in the aforementioned probe card test adapter, the partition includes a main body and limiting side plates disposed on both sides of the main body. The upper and lower ends of the limiting side plates protrude from the main body and together with the main body form a placement groove for placing the extended circuit board.

[0012] Furthermore, in the aforementioned probe card test adapter, the limiting side plate is provided with a groove in the middle, the groove is provided with a limiting boss that is higher than the height of the limiting side plate, and the side of the extension circuit board is provided with a limiting groove that cooperates with the limiting boss.

[0013] Furthermore, the aforementioned probe card test adapter also includes an extension cable, one end of which has a plug for connecting to the adapter pins, and the other end has a contact for connecting to a multimeter.

[0014] Compared with the prior art, the advantages of this utility model are: the utility model has a simple structure and is easy to manufacture, and through the adapter, test points can be quickly located and connected, which greatly improves the detection efficiency. Attached Figure Description

[0015] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments recorded in this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0016] Figure 1 This is a schematic diagram of the probe card test adapter of this utility model;

[0017] Figure 2 This is a partial structural schematic diagram of the probe card test adapter of this utility model;

[0018] Figure 3 This is a schematic diagram of the partition structure of the probe card test adapter of this utility model;

[0019] Figure 4 This is a schematic diagram of the extension line structure of the probe card test adapter of this utility model;

[0020] In the diagram: 1. Circuit board; 2. Socket; 21. Clamping plate; 22. Partition; 221. Body; 222. Limiting side plate; 223. Limiting boss; 23. Extension circuit board; 231. Limiting groove; 3. Connector; 31. Adapter pin; 4. Isolation sleeve; 5. Extension line; 51. Plug; 52. Contact. Detailed Implementation

[0021] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0022] Example 1

[0023] like Figure 1-3 As shown, a probe card test adapter includes a circuit board 1, a socket 2, and a connector 3. The bottom of the probe card has multiple circumferentially distributed insertion interfaces, i.e., PCB connector insertion interfaces. The pins on the bottom of the probe card are distributed in areas in each insertion interface. One end of the circuit board 1 is an extension end, and the extension end is provided with a socket 2. The socket 2 is inserted into the insertion interface. The connector 3 is disposed on the circuit board 1 and has multiple adapter pins 31. The adapter pins 31 are arranged one-to-one with the pins in the insertion interface, and the size of the adapter pins 31 is larger than the size of the pins.

[0024] Specifically, such as Figure 1 As shown, the adapter pin 31 is a square prism with a side length of 0.5mm. Multiple adapter pins 31 are evenly arranged with a spacing of 2mm. The adapter transfers the pin connection points at the bottom of the probe card to the adapter itself, and enlarges the test connection points and spacing, facilitating the location and connection of test points and improving testing speed.

[0025] Among them, such as Figure 1 , 2 As shown, there are two circuit boards 1, and multiple isolation sleeves 4 are provided between the two circuit boards 3. The two circuit boards 1 are fixedly connected by fasteners passing through the isolation sleeves 4.

[0026] In addition, connector 3 is a ZIF connector, and there are two of them, one located on the outside of one circuit board 1. The two sides of the circuit board 1 are marked with the identification of the adapter pin 31 (not shown in the figure). The markings are located on both sides of connector 3 and correspond to the pin positions in the probe card interface, which further speeds up the search.

[0027] Example 2

[0028] like Figure 1-3 As shown, a probe card test adapter includes a circuit board 1, a socket 2, and a connector 3. The bottom of the probe card has multiple circumferentially distributed insertion interfaces, i.e., PCB connector insertion interfaces. The pins on the bottom of the probe card are distributed in areas in each insertion interface. One end of the circuit board 1 is an extension end, and the extension end is provided with a socket 2. The socket 2 is inserted into the insertion interface. The connector 3 is disposed on the circuit board 1 and has multiple adapter pins 31. The adapter pins 31 are arranged one-to-one with the pins in the insertion interface, and the size of the adapter pins 31 is larger than the size of the pins.

[0029] Specifically, such as Figure 1 As shown, the adapter pin 31 is a square prism with a side length of 0.8mm. Multiple adapter pins 31 are evenly arranged with a spacing of 2.5mm. The adapter transfers the pin connection points at the bottom of the probe card to the adapter itself, and enlarges the test connection points and spacing, facilitating the location and connection of test points and improving testing speed.

[0030] Among them, such as Figure 1 , 2 As shown, there are two circuit boards 1, and multiple isolation sleeves 4 are provided between the two circuit boards 3. The two circuit boards 1 are fixedly connected by fasteners passing through the isolation sleeves 4.

[0031] In addition, connector 3 is a ZIF connector, and there are two of them, one located on the outside of one circuit board 1. The two sides of the circuit board 1 are marked with the identification of the adapter pin 31 (not shown in the figure). The markings are located on both sides of connector 3 and correspond to the pin positions in the probe card interface, which further speeds up the search.

[0032] Example 3

[0033] Based on the structure of Embodiment 1 or Embodiment 2, such as Figure 3 As shown, the probe card test adapter also includes an extension cable 5. One end of the extension cable 5 has a plug 51 that connects to the adapter pin 31, and the other end has a contact 52 that connects to a multimeter. During testing, the plug 51 is connected to the adapter pin with the test position, and then a multimeter is used to connect to the contact 52, which can further improve the convenience and efficiency of testing.

[0034] Among them, such as Figure 1-3As shown, the socket 2 includes a clamping plate 21, a partition plate 22, and an extension circuit board 23 located at the extension end of the circuit board 1. The end of the extension circuit board 23 is provided with gold fingers that connect to pins. A partition plate 22 is provided between the two extension circuit boards 23. Two clamping plates 21 are provided, clamping the outer sides of the two extension circuit boards 23. The extension circuit boards 23, partition plates 22, and clamping plates 21 are fixedly connected by fasteners to form the socket. The isolation sleeve 4 and the partition plate 22 are both made of insulating material.

[0035] In the above structure, such as Figure 3 As shown, the partition 22 includes a main body 221 and limiting side plates 222 disposed on both sides of the main body 221. The upper and lower ends of the limiting side plates 222 protrude from the main body 221, forming a placement groove for placing the extension circuit board 23 together with the main body 221. The thickness of the partition body 221 corresponds to the plug interface. Furthermore, a groove is provided in the middle of the limiting side plates, and a limiting boss 223 higher than the height of the limiting side plates 222 is provided in the middle of the groove. The side of the extension circuit board 23 is provided with a limiting groove 231 that cooperates with the limiting boss 223. In this embodiment, the limiting groove 223 is an arc-shaped groove. By setting the limiting side plates 222 and the limiting boss, the assembly position of the extension circuit board is controlled, thereby ensuring a stable and accurate connection between the socket 2 and the plug interface.

[0036] The working principle of this utility model is as follows: Based on the location of the defective channel displayed on the automatic testing equipment, the socket 2 is plugged into the interface of the defective channel. Then, the pin number corresponding to the defective channel is located. Using this number and the markings on the circuit board 1, the corresponding adapter pin 31 on the connector 3 is found. The plug 51 of the extension cable 5 is inserted into this adapter pin 31. Then, one measuring electrode of the multimeter is connected to the contact point, and the other measuring electrode is connected to the wiring point on the probe card to begin testing. In summary, this utility model has a simple structure, is easy to manufacture, and, through the adapter device, can quickly locate and connect test points, greatly improving testing efficiency.

[0037] It will be apparent to those skilled in the art that this invention is not limited to the details of the exemplary embodiments described above, and that it can be implemented in other specific forms without departing from the spirit or essential characteristics of this invention. Therefore, the embodiments should be considered illustrative and non-limiting in all respects, and the scope of this invention is defined by the appended claims rather than the foregoing description. Thus, it is intended that all variations falling within the meaning and scope of equivalents of the claims be included within this invention. No reference numerals in the claims should be construed as limiting the scope of the claims.

[0038] Furthermore, it should be understood that although this specification describes embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.

Claims

1. A probe card test adapter, wherein the probe card has multiple circumferentially distributed connectors on its bottom, and the pins on the bottom of the probe card are distributed regionally in each connector, characterized in that: The device includes a circuit board, a socket, and a connector. One end of the circuit board is an extension end, and the extension end is provided with a socket. The socket is plugged into a connector. The connector is located on the circuit board and is provided with multiple adapter pins. The adapter pins are configured to correspond one-to-one with the pins in the connector, and the size of the adapter pins is larger than the size of the pins.

2. The probe card test adapter according to claim 1, characterized in that: The adapter pin is a square cylinder with a side length of 0.5-1.2mm.

3. The probe card test adapter according to claim 2, characterized in that: The multiple adapter pins are evenly arranged with a spacing of 2-4mm.

4. The probe card test adapter according to claim 1, characterized in that: The circuit board is provided in two parts, with multiple isolation sleeves between the two circuit boards, and the two circuit boards are fixedly connected by fasteners passing through the isolation sleeves.

5. The probe card test adapter according to claim 4, characterized in that: Two connectors are provided, one on the outside of a circuit board, and the two sides of the circuit board are marked with identification pins.

6. The probe card test adapter according to claim 4, characterized in that: The socket includes a clamp, a partition, and an extension circuit board located at the extension end of the circuit board. The end of the extension circuit board is provided with gold fingers that connect to the pins. A partition is provided between the two extension circuit boards. Two clamps are provided, clamping the outside of the two extension circuit boards. The extension circuit boards, partitions, and clamps are fixedly connected by fasteners to form a socket.

7. The probe card test adapter according to claim 6, characterized in that: The partition includes a main body and limiting side plates disposed on both sides of the main body. The upper and lower ends of the limiting side plates protrude from the main body and together with the main body form a placement groove for placing the extension circuit board.

8. The probe card test adapter according to claim 7, characterized in that: The limiting side plate is also provided with a groove in the middle, and a limiting boss higher than the height of the limiting side plate is provided in the middle of the groove. The side of the extension circuit board is provided with a limiting groove that cooperates with the limiting boss.

9. The probe card test adapter according to claim 1, characterized in that: It also includes an extension wire, one end of which has a plug that connects to the adapter pin, and the other end has a contact that connects to a multimeter.

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