Photovoltaic cell testing device

Abstract

The utility model provides a photovoltaic cell testing device, relates to the field of photovoltaic technology, and aims to solve the technical problem that the electrical performance of a photovoltaic cell is difficult to test. The photovoltaic cell testing device comprises a substrate, a plurality of first probes, at least one group of second probes and a prompting device, the plurality of first probes are distributed on the substrate in an array manner in a multi-row and multi-column manner, each group of second probes comprises two second probes, and the two second probes in the same group are respectively close to two opposite first sides of the substrate; the orthographic projections of the two second probes in the same group on the surface of the substrate are located on a connecting line of the orthographic projections of one row of first probes in the plurality of rows of first probes on the surface of the substrate; the two second probes in the same group are electrically connected to the two ends of the prompting device respectively; and the two second probes in the same group are used for electrically contacting with the same grid line on the photovoltaic cell. The photovoltaic cell testing device is used for testing the electrical performance of a main-grid-free cell.

Description

TECHNICAL FIELD

[0001] The utility model relates to photovoltaic technology field especially relates to a photovoltaic cell piece testing arrangement. BACKGROUND

[0002] The statements in this section merely provide background information related to the utility model and do not necessarily constitute the prior art.

[0003] With the progress of photovoltaic cell technology, the production cost is also increasing while the photovoltaic cell piece power generation power increases, in order to reduce the cost, gradually appeared no main grid cell technology.

[0004] When no main grid technology is applied to back contact cell, when the electrical performance of no main grid back contact cell is tested, the probe row of testing device is shielded by photovoltaic cell, thereby it is difficult to visually whether the fine grid line of photovoltaic cell is aligned, so that it is difficult to test the electrical performance of the above-mentioned photovoltaic cell piece. UTILITY MODEL CONTENT

[0005] The utility model discloses a photovoltaic cell piece testing arrangement to solve the technical problem that photovoltaic cell piece is difficult to test the electrical performance.

[0006] In order to realize the above-mentioned purpose, the utility model provides the following technical scheme:

[0007] The utility model provides a photovoltaic cell piece testing arrangement, including substrate, a plurality of first probe, at least one group second probe and prompt device;

[0008] The plurality of first probe is arrayed distribution on the substrate in the form of multiple rows and multiple columns, and each group second probe includes two second probe, and the two second probe of the same group are close to the opposite two first edges of the substrate respectively;

[0009] The orthographic projection of the two second probe of the same group on the surface of the substrate is located on the connecting line of the orthographic projection of one row first probe among multiple rows first probe on the surface of the substrate;

[0010] The two second probe of the same group are electrically connected to the two ends of the prompt device respectively;

[0011] The two second probe of the same group are used for electrical contact with the same grid line on the photovoltaic cell piece.

[0012] According to at least one embodiment of the utility model, the number of second probe is multiple groups, and one second probe in each group second probe is electrically connected to one end of the prompt device, and another second probe is electrically connected to the other end of the prompt device.

[0013] According to at least one embodiment of the present application, the substrate has two opposite second edges, and the distribution directions of the two second edges are consistent with the distribution directions of the multiple rows of first probes.

[0014] The number of the prompting devices is two.

[0015] Part of the multiple groups of second probes is close to one of the second edges and is electrically connected with one of the prompting devices, and another part of the multiple groups of second probes is close to the other of the second edges and is electrically connected with the other of the prompting devices.

[0016] According to at least one embodiment of the present application, the prompting device comprises a power supply and a reminding device electrically connected with the power supply.

[0017] When two of the second probes of at least one group of the second probes are in electrical contact with the same grid line, the reminding device is in electrical conduction with the power supply.

[0018] According to at least one embodiment of the present application, the reminding device comprises at least one of a sound-emitting device, a light-emitting device or a display device.

[0019] According to at least one embodiment of the present application, the testing device further comprises a switch, and each group of the second probes is electrically connected with the power supply through the switch.

[0020] According to at least one embodiment of the present application, the testing device further comprises a carrier plate, and the carrier plate has multiple first holes and at least one group of second holes, each of the first probes penetrates through a corresponding first hole, and each of the second probes penetrates through a corresponding second hole.

[0021] The testing device further comprises a positioning structure arranged on the carrier plate, and the positioning structure is located at the periphery of the multiple first holes.

[0022] The positioning structure comprises at least two positioning portions, and the two positioning portions are respectively used for marking the positions of two adjacent edges of the photovoltaic cell.

[0023] According to at least one embodiment of the present application, the two positioning portions are arranged in an L shape at positions close to the corners of the carrier plate.

[0024] According to at least one embodiment of the present application, the substrate is provided with multiple first sleeves and at least one group of second sleeves, each of the first probes is arranged in a telescopic mode in a corresponding first sleeve, and each of the second probes is arranged in a telescopic mode in a corresponding second sleeve.

[0025] According to at least one embodiment of the utility model, each first probe is arranged in the corresponding first sleeve through a first spring, and each second probe is arranged in the corresponding second sleeve through a second spring.

[0026] In one or more of the technical solutions provided in the exemplary embodiments of the utility model, at least one of the following beneficial effects can be achieved.

[0027] The photovoltaic cell testing device in the exemplary embodiments of the utility model comprises a substrate, a plurality of first probes, at least one set of second probes, and a prompt device. The plurality of first probes distributed on the substrate are used to make electrical contact with the grid lines on the photovoltaic cell for electrical performance testing. The at least one set of second probes and the prompt device are used to detect whether the photovoltaic cell and the plurality of first probes are accurately aligned. Specifically, in the same set of second probes, two second probes distributed on the opposite first edges close to the substrate are respectively used to make electrical contact with the same fine grid line (close to the two ends) on the photovoltaic cell. The fine grid line can conduct the two second probes in the same set of second probes, so that the prompt device forms an electrical circuit, and the prompt device can give a prompt to indicate that the same set of second probes is completely aligned with the same fine grid line. In addition, since the same set of second probes and one row of first probes are on a straight line, when the two second probes in the same set are aligned with a fine grid line, the plurality of first probes in the row are also aligned with the fine grid line. Since the first probes are distributed in the form of multiple rows and multiple columns on the substrate, the first probes in other rows are also respectively aligned with other fine grid lines to be tested on the cell, so that the position of the cell on the substrate can be easily determined, and subsequent electrical performance testing of the cell can be easily performed through the probe array formed by the first probes. BRIEF DESCRIPTION OF DRAWINGS

[0028] The accompanying drawings illustrate exemplary embodiments of the utility model and, together with the description, serve to explain the principles of the utility model. These drawings are included to provide further understanding of the utility model and are incorporated in and constitute a part of this specification;

[0029] Figure 1 is a structural schematic view of a photovoltaic cell testing device according to the embodiment of the utility model;

[0030] Figure 2 is a structural schematic view of a carrier plate of a photovoltaic cell testing device according to the embodiment of the utility model;

[0031] Figure 3 is a circuit connection structural schematic view of a photovoltaic cell testing device according to the embodiment of the utility model.

[0032] Reference numerals: 10, first probe; 11, first side; 12, second side; 30, separation line; 50a, first positioning portion; 50b, second positioning portion; 50c, third positioning portion; 60, prompting device; 70, switch. DETAILED DESCRIPTION

[0033] In order to make the technical problems, technical solutions and beneficial effects of the utility model clearer, the utility model will be further described in detail below in combination with the drawings and examples. It should be understood that the specific examples described herein are only used to explain the utility model and not to limit the utility model.

[0034] The electrical performance test of the photovoltaic cell includes electroluminescence testing (EL testing), current-voltage testing (IV), etc., wherein the EL testing generates carrier recombination luminescence inside the photovoltaic cell by applying a forward bias voltage outside the photovoltaic cell, thereby shooting a near-infrared image of the component by using a high-resolution infrared camera to acquire and determine the defects of the photovoltaic cell; and the IV testing evaluates the conversion efficiency, power output and other key parameters of the photovoltaic cell by measuring the current-voltage characteristic curve of the photovoltaic cell under different light and temperature conditions.

[0035] The front surface and the back surface of the main-grid-free photovoltaic cell are both free of main grid lines, the structure of the photovoltaic cell reduces the use of noble metals, thereby reducing the cost of the photovoltaic cell, and the shading area of the front surface of the photovoltaic cell is reduced due to the absence of the main grid, which can also improve the current of the photovoltaic cell, and there is a large optimization space at the component end, the main-grid-free photovoltaic cell is free of main grids on the front surface and the back surface to collect the current on the fine grid lines. Since the fine grid lines of the back-contact photovoltaic cell are all on the back surface, the probe array needs to be aligned with the fine grid lines of the photovoltaic cell to form electrical contact for EL or IV testing, and since the front surface of the main-grid-free back-contact photovoltaic cell is shielded, it is difficult to confirm whether the probe array of the testing device is aligned with the fine grid lines, thereby affecting the output efficiency and the yield of the photovoltaic cell.

[0036] In view of the above problems, the photovoltaic cell testing device provided in the example embodiments of the utility model is used for electrical contact with the same fine grid line of the photovoltaic cell by using one row of first probes, two second probes are arranged at the positions close to the two ends of the fine grid line of the row of first probes (on the same straight line with the first probes of the row), the two second probes are electrically connected with the external prompting device, when the two second probes are electrically contacted with the same fine grid line, the circuit of the prompting device will be turned on, and the operator can determine that the fine grid line on the photovoltaic cell is aligned with the first probes of the probe array through the prompting, thereby meeting the subsequent EL or IV electrical performance test.

[0037] Figure 1 is a structural schematic diagram of a photovoltaic cell testing device according to an embodiment of the present application; Figure 3 is a circuit connection structural schematic diagram of a photovoltaic cell testing device according to an embodiment of the present application. As shown in Figure 1 and Figure 3 shown, the photovoltaic cell testing device of the exemplary embodiment of the present application comprises a substrate, a plurality of first probes 10, at least one set of second probes, and a prompting device; the plurality of first probes 10 are arrayed in the form of multiple rows and multiple columns on the substrate, each set of second probes comprises two second probes, and the two second probes of the same set of second probes are respectively close to the two opposite first edges 11 of the substrate; the orthographic projection of the two second probes of the same set of second probes on the surface of the substrate is on the connecting line of the orthographic projection of one row of first probes 10 on the surface of the substrate; the two second probes of the same set of second probes are respectively electrically connected to the two ends of the prompting device; and the two second probes of the same set of second probes are used to electrically contact the same grid line on the photovoltaic cell.

[0038] In actual application, the plurality of first probes 10 are arrayed on the substrate in the form of multiple rows and multiple columns, which are one row along the X direction and one column along the Y direction, and each row of first probes 10 corresponds to one fine grid line of the photovoltaic cell, that is, each fine grid line of the photovoltaic cell is arranged along the Y direction. When EL or IV testing is performed, each row of first probes 10 forms electrical contact with the corresponding same fine grid line. The two second probes of the same set of second probes are respectively arranged at positions close to the two first edges 11 of the substrate along the X direction and are located in the interval region of one row of first probes 10, for example, in the middle of the second and third columns of first probes 10 and in the middle of the penultimate and antepenultimate columns of first probes 10, and the two second probes of the same set of second probes have a long enough distance therebetween through such arrangement to ensure that the first probes 10 located on the straight line (connecting line of the two second probes) are all aligned to the same fine grid line.

[0039] When the fine grid line of the photovoltaic cell extends along the X direction and when the two second probes of the same set form electrical contact with the same fine grid line, the originally open circuit system of the prompting device forms a path, so that the prompting device can issue a prompt to enable the tester to determine that the photovoltaic cell is completely aligned with the probe array formed by the first probes 10, and thus subsequent EL or IV testing can be performed, thereby avoiding the problem that it is difficult to determine whether alignment is achieved due to the front surface of the main grid back contact photovoltaic cell being blocked. It can be understood that when the prompting device does not issue a prompt, it means that the circuit system thereof is still in an open circuit state, that is, the probe array is not aligned with the fine grid line of the photovoltaic cell.

[0040] continue as shown in Figure 1As shown, the number of the second probes is multiple groups, one second probe in each group of the second probes is electrically connected to one end of the prompting device, and another second probe is electrically connected to the other end of the prompting device.

[0041] Exemplarily, the multiple groups of the second probes are arranged side by side along the Y direction, that is, each group of the second probes corresponds to one fine grid line, and each group of the second probes corresponds to a plurality of adjacent and side-by-side fine grid lines. The purpose of using multiple groups of the second probes is to prevent the prompting device from not being able to normally prompt due to the broken grid or the false printing of the photovoltaic cell during printing. That is, one group of the second probes has been in electrical contact with the same fine grid line, but due to the failure of the fine grid line to conduct electricity, the prompting device cannot normally work.

[0042] In actual application, in the same group of the second probes, the second probe 21a and the second probe 21b are respectively located at positions close to the corner of the probe row formed by the first probe 10. At one corner position of the probe row, the number of the second probe 21a is four, and at the other corner position, the number of the corresponding second probe 21b is also four. The four second probes 21a are electrically connected to one end of the prompting device in parallel, and the four second probes 21b are electrically connected to the other end of the prompting device in parallel. When at least one group of the second probes in the four groups of the second probes is in electrical contact with the fine grid line, the circuit system of the prompting device will be conducted to further issue a prompt, indicating that the fine grid line of the photovoltaic cell is aligned with the probe row formed by the first probe 10.

[0043] It is considered that the photovoltaic cell is usually composed of two photovoltaic cell halves, and the two photovoltaic cell halves are in an electrically isolated state. The entire photovoltaic cell is physically cut to form two photovoltaic cell halves in subsequent production processes. In order to align and distinguish both of the two photovoltaic cell halves on the entire photovoltaic cell during testing, one or more groups of the second probes and the corresponding prompting devices are arranged at positions corresponding to the two photovoltaic cell halves.

[0044] Exemplarily, the substrate has two opposite second edges 12, the distribution direction of the two second edges 12 is consistent with the distribution direction of the multiple rows of the first probes 10; the number of the prompting devices is two; a part of the multiple groups of the second probes is close to one second edge 12 and is electrically connected to one prompting device; and another part of the multiple groups of the second probes is close to the other second edge 12 and is electrically connected to the other prompting device. It can be understood that the substrate has a rectangular structure and has two opposite first edges 11 and two opposite second edges 12.

[0045] As Figure 1As shown, the separation line 30 divides the probe row formed by the second probes into two parts, wherein the upper half corresponds to one photovoltaic cell half, and the lower half corresponds to another photovoltaic cell half. At least one set of second probes including the second probe 21a and the second probe 21b is arranged at the positions close to the two corner portions of the probe row in the upper half. The second probe 21a and the second probe 21b in each set of second probes form an open circuit in the circuit system of one of the two prompting devices. Similarly, at least one set of second probes including the second probe 22a and the second probe 22b is arranged at the positions close to the two corner portions of the probe row in the lower half. The second probe 22a and the second probe 22b in each set of second probes form an open circuit in the circuit system of the other of the two prompting devices.

[0046] When the corresponding fine grid lines on the photovoltaic cell half are in electrical contact with the second probe 21a and the second probe 21b, the circuit system of one of the two prompting devices forms a closed circuit, and when the corresponding fine grid lines on the other photovoltaic cell half are in electrical contact with the second probe 22a and the second probe 22b, the circuit system of the other of the two prompting devices forms a closed circuit. When both of the two prompting devices emit a prompt signal, it indicates that the fine grid lines of the two photovoltaic cell halves on the photovoltaic cell sheet are aligned with the probe row, and thus subsequent EL or IV tests can be performed.

[0047] When the prompting device includes a power supply and a prompting device 60 electrically connected to the power supply, the prompting device 60 is electrically connected to the power supply when at least one set of second probes is in electrical contact with the same grid line. For the circuit systems of the two prompting devices, the circuit formed by the second probe 21a, the second probe 21b, the corresponding fine grid lines, and one prompting device 60, and the circuit formed by the second probe 22a, the second probe 22b, the corresponding fine grid lines, and the other prompting device 60 are connected in parallel in the entire circuit system. For example, the second probe 21a and the second probe 22a are both connected to the positive electrode of the power supply, and the second probe 21b and the second probe 22b are both connected to the negative electrode of the power supply through the corresponding prompting device 60.

[0048] Exemplarily, the power supply can be a 9V direct current power supply, or the power supply can be adjusted according to the voltage and current requirements of the actual prompting device 60, which is not limited herein.

[0049] It can be understood that the power supply can also be two, one power supply, the second probe 21a, the second probe 21b, the corresponding fine grid lines, and one prompting device 60 form a loop; and the other power supply, the second probe 22a, the second probe 22b, the corresponding fine grid lines, and the other prompting device 60 form another loop.

[0050] In some embodiments, the alert device 60 comprises at least one of a sound-emitting device, a light-emitting device or a display device. For example, one or more of a buzzer, a light-emitting LED or a display screen.

[0051] Exemplarily, the testing device further comprises a switch 70, each group of the second probes is electrically connected with the power supply through the switch 70. When the photovoltaic cell is aligned with the probe array, the switch 70 is turned off to cut off the loop between the power supply and the corresponding second probe, so that the alert device 60 no longer gives an alert.

[0052] Figure 2 is a structural schematic view of a carrier plate of the photovoltaic cell testing device according to the embodiments of the present application. As shown in Figure 2 The photovoltaic cell testing device of the exemplary embodiments of the present application further comprises a carrier plate, the carrier plate has a plurality of first holes and at least one group of second holes, each first probe 10 penetrates through a corresponding first hole, and each second probe penetrates through a corresponding second hole; the testing device further comprises a positioning structure arranged on the carrier plate, the positioning structure is located at the periphery of the plurality of first holes; the positioning structure comprises at least two positioning portions, and the two positioning portions are respectively used for marking the positions of two adjacent edges of the photovoltaic cell.

[0053] In actual application, the carrier plate is arranged on the side of the substrate with the probe array, and the side of the carrier plate away from the substrate is used for placing the photovoltaic cell, i.e. the substrate can be placed on a table top, the carrier plate is located above the substrate, and the photovoltaic cell is placed on the top surface of the carrier plate. At this time, the first probes 10 on the substrate pass through the first holes, the second probes pass through the second holes and extend from the top surface of the carrier plate, and form electrical contact with the fine grid lines on the back surface of the photovoltaic cell placed on the carrier plate.

[0054] Since the position of the fine grid lines cannot be observed due to the front surface of the photovoltaic cell, the carrier plate of the photovoltaic cell testing device of the exemplary embodiments of the present application is provided with a positioning structure to achieve coarse positioning of the photovoltaic cell on the carrier plate.

[0055] As Figure 2As shown, the positioning structure can include three positioning portions, i.e., a first positioning portion 50a, a second positioning portion 50b and a third positioning portion 50c, wherein the first positioning portion 50a and the second positioning portion 50b are arranged on the carrier plate with a spacing therebetween and correspond to positions close to the first edge 11 of the substrate and located at the periphery of the first hole array; the third positioning portion 50c is arranged on the carrier plate and corresponds to a position close to the second edge 12 of the substrate and located at the periphery of the first hole array. The first positioning portion 50a, the second positioning portion 50b and the third positioning portion 50c are arranged in a substantially L shape. When the corner position of the photovoltaic cell piece is placed at the corner position of the L shape, the first positioning portion 50a and the second positioning portion 50b are attached to one edge of the photovoltaic cell piece, and the third positioning portion 50c is attached to the adjacent other edge of the photovoltaic cell piece, so as to achieve the coarse positioning of the photovoltaic cell piece on the carrier plate, and then the fine position of the photovoltaic cell piece is adjusted until the reminding device 60 sends a reminding signal, so as to confirm that the photovoltaic cell piece has been completely aligned with the probe array.

[0056] In another optional embodiment, an L-shaped scale with a scale display is arranged at the corner position of the probe array. One part (positioning portion) of the scale extends along the X direction, and the other part (another positioning portion) extends along the Y direction. When one corner of the photovoltaic cell piece is fixed on the scale, the scale represents the degree of coarse positioning.

[0057] In another optional embodiment, the L-shaped scale can also be replaced by two mutually perpendicular stickers.

[0058] In some embodiments, the substrate is provided with a plurality of first sleeves and at least one set of second sleeves. Each first probe 10 is telescopically arranged in a corresponding first sleeve, and each second probe is telescopically arranged in a corresponding second sleeve.

[0059] For example, each first probe 10 is arranged in a corresponding first sleeve by a first spring; and each second probe is arranged in a corresponding second sleeve by a second spring.

[0060] Exemplarily, the first sleeve and the second sleeve are arranged between the substrate and the carrier plate. The first spring is located in the first sleeve. When the first probe 10 is not tested, the first spring is compressed, and the first probe 10 is retracted into the first sleeve. When the first probe 10 needs to be tested, the first spring can be released by a corresponding adjusting device to push the first probe 10 to extend out of the first hole of the carrier plate. The connection relationship between the second probe, the second spring and the second sleeve is the same as that of the first probe 10, which will not be described again here.

[0061] Optionally, the first probe 10 and the second probe are respectively extended to the side of the carrier plate on which the photovoltaic cell is placed by the first spring and the second spring, whether in the testing state or the non-testing state. When the photovoltaic cell is placed on the carrier plate, the first spring and the second spring also have a certain buffering effect to prevent the photovoltaic cell from damaging the first probe 10 and the second probe. Meanwhile, when the first probe 10 and the second probe contact the fine grid lines of the photovoltaic cell, the first probe 10 and the second probe also have a certain pre-tightening force, so that they form good electrical contact, and the alignment of the photovoltaic cell and the accuracy of the EL or IV test can be ensured.

[0062] As can be seen from the above, the photovoltaic cell testing device of the exemplary embodiments of the present application can well meet the requirements of the photovoltaic industry for testing the main-grid-free photovoltaic cell, especially the main-grid-free back-contact photovoltaic cell, and the testing system is simple and efficient.

[0063] Those skilled in the art should understand that the above embodiments are only for clearly illustrating the present application, and are not intended to limit the scope of the present application. Based on the above disclosure, other changes or modifications can be made by those skilled in the art, and these changes or modifications are still within the scope of the present application.

Claims

1. A photovoltaic cell testing device, characterized in that, It includes a substrate, multiple first probes, at least one set of second probes, and a prompting device; The plurality of first probes are arrayed on the substrate in a multi-row, multi-column manner, and each group of second probes includes two second probes, with the two second probes in the same group respectively close to two opposite first sides of the substrate; The orthographic projections of two second probes in the same group onto the surface of the substrate lie on the line connecting the orthographic projections of one row of the first probes onto the surface of the substrate. The two second probes in the same group are electrically connected to the two ends of the prompting device, respectively. The two second probes in the same group are used to make electrical contact with the same grid line on the photovoltaic cell.

2. The testing apparatus according to claim 1, characterized in that, The number of the second probes is multiple groups, and one of the second probes in each group is electrically connected to one end of the prompting device, and the other second probe is electrically connected to the other end of the prompting device.

3. The testing apparatus according to claim 2, characterized in that, The substrate has two opposing second sides, and the distribution direction of the two second sides is consistent with the distribution direction of the multiple rows of first probes; The number of the prompting devices is two; A portion of the multiple sets of the second probes are located close to one of the second sides and are electrically connected to one of the prompting devices; Another portion of the multiple sets of the second probes is located near another second side and is electrically connected to another of the prompting devices.

4. The testing apparatus according to claim 1, characterized in that, The notification device includes a power source and a reminder device electrically connected to the power source; When at least two probes of a set of second probes make electrical contact with the same grid line, the alerting device is electrically connected to the power supply.

5. The testing apparatus according to claim 4, characterized in that, The reminder device includes at least one of a sound-emitting device, a light-emitting device, or a display device.

6. The testing apparatus according to claim 4, characterized in that, The testing device also includes a switch, through which each group of second probes is electrically connected to the power supply.

7. The testing apparatus according to any one of claims 1-6, characterized in that, The testing device further includes a carrier plate having a plurality of first holes and at least one set of second holes, wherein each first probe passes through a corresponding first hole and each second probe passes through a corresponding second hole; The testing device also includes a positioning structure disposed on the carrier plate, the positioning structure being located around the plurality of first holes; The positioning structure includes at least two positioning parts, which are used to mark the positions of two adjacent sides of the photovoltaic cell.

8. The testing apparatus according to claim 7, characterized in that, The two positioning parts are arranged in an L-shape near the corner of the carrier plate.

9. The testing apparatus according to any one of claims 1-6, characterized in that, The substrate is provided with a plurality of first sleeves and at least one set of second sleeves, each of the first probes being retractably disposed in the corresponding first sleeve, and each of the second probes being retractably disposed in the corresponding second sleeve.

10. The testing apparatus according to claim 9, characterized in that, Each of the first probes is disposed within the corresponding first sleeve by a first spring; each of the second probes is disposed within the corresponding second sleeve by a second spring.

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