Resistance testing device and electronic atomizer detection equipment
By designing a resistance testing device, a contoured pressure plate and a downward pressing telescopic device are used to realize the synchronous resistance detection of multiple workpieces, which solves the problem of low detection efficiency in the existing technology and improves detection efficiency and accuracy.
Patent Information
- Application Number
- CN202423237806.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-26
- Publication Date
- 2025-12-19
- Estimated Expiration
- 2034-12-26
AI Technical Summary
Existing electronic atomizer testing devices are inefficient and inaccurate, and cannot test multiple workpieces simultaneously.
A resistance testing device was designed, including a contoured pressure plate, a test plate, and a pressing telescopic device. The contoured pressure plate presses the workpiece, so that the test probe can be accurately positioned and the resistance of multiple workpieces can be detected simultaneously.
It enables simultaneous inspection of multiple workpieces, improving inspection efficiency and accuracy.
Smart Images
Figure CN223692446U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to electronic atomizer detection technical field especially, relate to a resistance testing device and electronic atomizer detection equipment. BACKGROUND
[0002] Electronic atomizer is a kind of electronic product that imitates cigarette, its efficacy is similar to ordinary cigarette, can refresh, satisfy the craving for tobacco, make smoker produce euphoria and relaxation.
[0003] The device for detecting electronic atomizer, generally detects the resistance of semi-finished workpiece by worker hand-held test probe detection, so that only one workpiece can be detected each time, and the detection efficiency is relatively low, and the detection accuracy is poor.
[0004] Therefore, it is necessary to design a resistance testing device and electronic atomizer detection equipment to improve the detection efficiency of workpiece.
[0005] The above information is given as background information only to assist in understanding the present disclosure, and does not determine or acknowledge whether any of the above content can be used as prior art with respect to the present disclosure. INVENTION CONTENTS
[0006] The utility model provides a kind of resistance testing device and electronic atomizer detection equipment to improve the detection efficiency of semi-finished workpiece.
[0007] To achieve the above purpose, the utility model provides the following technical scheme:
[0008] A kind of resistance testing device, comprising:
[0009] Profiling press plate;
[0010] Test plate, with the profiling press plate fixed connection, and the test plate is installed with several groups of test probes in rectangular array, and the test probe penetrates the test plate;
[0011] Resistance tester, electrically connected the test probe;
[0012] Downward pressure telescopic device, for driving the profiling press plate to compress workpiece, so that the test probe detects the resistance of workpiece.
[0013] Optionally, the bottom surface of the profiling press plate is provided with several avoiding grooves, and the profiling press plate is provided with a compression protrusion for compressing jig disc.
[0014] Optionally, resistance testing device further includes support plate and buffer, the resistance tester, the downward pressure telescopic device and the buffer are all installed on the support plate, and one end of the buffer is connected with the test plate.
[0015] Optionally, the resistance testing device further comprises an elastic member for resetting the profiling presser plate.
[0016] The elastic member is installed on one side of the bottom of the profiling presser plate to push the profiling presser plate towards the support plate, or the elastic member is installed between the support plate and the profiling presser plate to pull the profiling presser plate towards the support plate.
[0017] Optionally, the buffer comprises a buffer cylinder installed on the support plate, a buffer press rod with one end slidingly installed in the buffer cylinder, and a buffer spring installed in the buffer cylinder.
[0018] The buffer spring is located on one side of the top of the buffer press rod, and the bottom end of the buffer press rod is provided with a buffer elastic block.
[0019] Optionally, a sliding guide rod is installed on the support plate, and the sliding guide rod is parallel to the telescopic rod of the downward pressing telescopic device.
[0020] A sliding cylinder is installed on the profiling presser plate, and the sliding cylinder is slidingly installed on the sliding guide rod.
[0021] Optionally, at least two buffers are provided, and all the buffers are arranged in a circular array around the center line of the downward pressing telescopic device.
[0022] Optionally, the profiling presser plate comprises a first horizontal plate part, a first vertical plate part, a second horizontal plate part and a second vertical plate part.
[0023] The first vertical plate part is provided with a first embedding groove, the second vertical plate part is provided with a second embedding groove, and the opposite two side edges of the test plate are embedded in the first embedding groove and the second embedding groove, respectively.
[0024] Optionally, the bottom surface of the test plate is not lower than the avoiding groove.
[0025] An electronic atomizer detection device comprises the resistance testing device according to any one of the above.
[0026] Compared with the prior art, the resistance testing device has the following beneficial effects:
[0027] The resistance testing device and the electronic atomizer detection device provided by the utility model drive the profiling presser plate to be pressed down through the downward pressing telescopic device, the test plate is accompanied by the profiling presser plate to be pressed down, the profiling presser plate can accurately position the workpiece of the semi-finished product when the profiling presser plate is pressed to the workpiece, and then the test probe on the test plate can just abut against the detection part of the workpiece, so that the resistance tester can judge whether the workpiece is qualified.
[0028] The present application has other characteristics and advantages, which will be apparent from the accompanying drawings and detailed description incorporated herein, or will be set forth in the accompanying drawings and detailed description incorporated herein, which together serve to explain the specific principles of the present application. BRIEF DESCRIPTION OF DRAWINGS
[0029] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the accompanying drawings needed to be used in the embodiments or the prior art description will be briefly introduced as follows. Obviously, the accompanying drawings in the following description only constitute some embodiments of the present application, and for those skilled in the art, other drawings can also be obtained from these drawings without any creative effort.
[0030] Fig. 1 is a schematic diagram of the three-dimensional structure of the resistance testing device provided by the embodiment of the present application;
[0031] Fig. 2 is a schematic diagram of the side view of the silicon wafer detection line provided by the embodiment of the present application.
[0032] Reference signs: 1, profiling press plate; 101, avoiding groove; 102, pressing protrusion; 11, first horizontal plate part; 12, first vertical plate part; 13, second horizontal plate part; 14, second vertical plate part; 2, test plate; 3, resistance tester; 31, test probe; 4, downward pressing telescopic device; 5, support plate; 6, buffer; 61, buffer cylinder; 62, buffer pressing rod; 63, buffer elastic block; 7, sliding guide rod; 8, sliding cylinder. DETAILED DESCRIPTION
[0033] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the accompanying drawings needed to be used in the embodiments or the prior art description will be briefly introduced as follows. Obviously, the accompanying drawings in the following description only constitute some embodiments of the present application, and for those skilled in the art, other drawings can also be obtained from these drawings without any creative effort.
[0034] In this paper, the term "embodiment" means that the specific features, structures or characteristics described in conjunction with the embodiment can be included in at least one embodiment of the present application. The term "embodiment" appearing at various places in the specification does not necessarily refer to the same embodiment, nor does it particularly limit its independence or association with other embodiments. In principle, in this application, as long as there is no technical contradiction or conflict, each technical feature mentioned in each embodiment can be combined in any way to form a corresponding implementable technical solution.
[0035] Unless otherwise defined, the meanings of technical terms used in the present application are the same as commonly understood by one of ordinary skill in the art to which the present application belongs; the use of related terms in the present application is only for the purpose of describing specific embodiments, and is not intended to limit the present application.
[0036] In the description of the present application, the phrase "and / or" is a description of the logical relationship between objects, which means that there can be three relationships, for example, A and / or B, which means that there are three cases: A exists, B exists, and A and B exist at the same time. In addition, the character " / " in this article generally represents that the associated objects before and after are a "or" logical relationship.
[0037] In the present application, the terms such as "first" and "second" are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual quantity, primary and secondary, or order relationship between the entities or operations.
[0038] In the present application, the phrases "include", "contain", "have" or other similar expressions used in the sentence are intended to cover non-exclusive inclusion, and these expressions do not exclude the presence of other elements in the process, method or product including the described elements, so that the process, method or product including a series of elements can not only include those limited elements, but also include other elements not explicitly listed, or also include elements inherent to such process, method or product.
[0039] In the present application, the expressions "greater than", "less than", "exceed" and the like are understood as not including the number itself; the expressions "above", "below", "within" and the like are understood as including the number itself. In addition, in the description of the embodiments of the present application, the meaning of "multiple" is more than two (including two), and similar expressions related to "multiple" are also understood in this way, for example, "multiple groups", "multiple times" and the like, unless otherwise explicitly limited.
[0040] In the description of the embodiments of the present application, the spatial-related expressions used, such as "center", "longitudinal", "transverse", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "vertical", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential", and the like, indicate the orientation or positional relationship based on the orientation or positional relationship shown in the specific embodiments or the drawings, and are only for the convenience of describing the specific embodiments of the present application or for the reader to understand, and are not intended to indicate or imply that the indicated device or component must have a particular position, a particular orientation, or be constructed or operated in a particular orientation, and therefore cannot be understood as a limitation on the embodiments of the present application.
[0041] Unless otherwise clearly indicated or implied to the contrary by context, the word "comprise", "comprising", and "comprises" and the like are to be construed in an inclusive sense, as opposed to an exclusive or exhaustive sense; that is to say, in the sense of "including, but not limited to". As used herein, the terms "coupled" and "connected" and the like are intended to be interpreted broadly to encompass a connection or coupling between or among two or more elements, which can be direct or indirect, physical or logical, and which can or can not be marked by a physical or logical interface between elements. As used herein, the term "exemplary" is used expansively to mean merely "serving as an example, instance, or illustration." Any implementation having one or more of its
[0042] Embodiment one
[0043] In view of the defects of the existing resistance testing methods, the applicant, based on rich practical experience and professional knowledge in designing and manufacturing such products for many years, actively researches and innovates, and uses theories to create a resistance testing device that can solve the defects in the prior art, so that the resistance testing device is practical. After continuous research, design, and repeated trial and improvement of samples, the present utility model is finally created.
[0044] Please refer to Figs. 1-2 The embodiment of the present utility model provides a resistance testing device which comprises a profiling presser plate 1, a testing plate 2, a resistance tester 3 and a downward telescopic device 4.
[0045] The shape of the profiling presser plate 1 is set according to the shape of the workpiece, so as to better press the workpiece. The testing plate 2 is fixedly connected with the profiling presser plate 1, and a plurality of groups of testing probes 31 are installed on the testing plate 2 in a rectangular array, and the testing probes 31 penetrate through the testing plate 2; the resistance tester 3 is electrically connected with the testing probes 31, so that when the testing probes 31 accurately contact the set area of the workpiece, it can be determined whether the workpiece is qualified; the downward telescopic device 4 is used to drive the profiling presser plate 1 to press the workpiece, so that the testing probes 31 can detect the resistance of the workpiece.
[0046] The resistance testing device in the embodiment drives the profiling presser plate 1 to press down through the downward telescopic device 4, and the testing plate 2 is pressed down with the profiling presser plate 1. The profiling presser plate 1 can accurately position the workpiece of the semi-finished product when it is pressed, and then the testing probes 31 on the testing plate 2 can exactly contact the detection part of the workpiece, so that the resistance tester 3 can determine whether the workpiece is qualified. In the embodiment, the testing plate 2 can drive a plurality of groups of testing probes 31 to descend synchronously, so that a plurality of workpieces can be detected at one time, and the detection efficiency can be effectively improved.
[0047] Optionally, the bottom surface of the profiling pressing plate 1 is provided with a plurality of avoiding grooves 101, and the profiling pressing plate 1 is provided with a pressing protrusion 102 for pressing the jig disc. The avoiding grooves 101 are designed to avoid the head of the workpiece from being pressed to cause the workpiece to be warped. The jig disc is used for supporting the workpiece. Generally, the jig disc is provided with a plurality of positioning and placing grooves, and each positioning and placing groove is provided with a workpiece. In addition, it should be noted that if the bottom of the workpiece is an arc surface, the profiling pressing plate 1 needs to be correspondingly provided with a matching arc surface, so that the profiling pressing plate 1 can better press and fix the workpiece.
[0048] Optionally, the resistance testing device further comprises a support plate 5 and a buffer 6, the resistance tester 3, the downward pressing telescopic device 4 and the buffer 6 are all installed on the support plate 5, and one end of the buffer 6 is connected to the testing plate 2. The buffer 6 is provided to avoid the situation that the testing plate 2 moves upward at a high speed after testing the resistance and collides. Generally, the above-mentioned collision can be the collision between the profiling pressing plate 1 and the support plate 5, or the collision between the support plate 5 and the testing plate 2.
[0049] Optionally, the resistance testing device further comprises an elastic member for resetting the profiling pressing plate 1; the elastic member is installed on one side of the bottom of the profiling pressing plate 1 to push the profiling pressing plate 1 to the support plate 5; or the elastic member is installed between the support plate 5 and the profiling pressing plate 1 to pull the profiling pressing plate 1 to the support plate 5.
[0050] Specifically, the provision of the elastic member can effectively improve the upward moving speed of the profiling pressing plate 1, and the downward pressing telescopic device 4 does not need to be put into action during the upward moving process of the profiling pressing plate 1. The faster the upward resetting speed of the profiling pressing plate 1 is, the less the process time is, and finally the detection efficiency of the resistance of the workpiece is improved.
[0051] Optionally, the buffer 6 comprises a buffer cylinder 61 installed on the support plate 5, a buffer pressing rod 62 slidably installed in the buffer cylinder 61 and a buffer spring installed in the buffer cylinder 61; the buffer spring is located on one side of the top of the buffer pressing rod 62, and the bottom end of the buffer pressing rod 62 is provided with a buffer elastic block 63. In the embodiment, through the double buffering of the buffer elastic block 63 and the buffer spring, the collision accident can be effectively avoided.
[0052] Optionally, the support plate 5 is provided with a sliding guide rod 7 parallel to the telescopic rod of the downward pressing telescopic device 4, and the profiling pressing plate 1 is provided with a sliding cylinder 8 slidably installed on the sliding guide rod 7. The sliding cylinder 8 is provided with a sliding hole, and the sliding guide rod 7 is arranged in the sliding hole.
[0053] Optionally, the buffer 6 is provided with at least two, and all the buffers 6 are arranged around the center line of the lower pressing telescopic device 4. The plurality of buffers 6 around the lower pressing telescopic device 4 can balance the stress of the profiling presser plate 1 or the test plate 2, and reduce the possibility of deformation and rupture of the profiling presser plate 1 or the test plate 2.
[0054] Optionally, the profiling presser plate 1 comprises a first horizontal plate part 11, a first vertical plate part 12, a second horizontal plate part 13 and a second vertical plate part 14; the first vertical plate part 12 is provided with a first embedding groove, and the second vertical plate part 14 is provided with a second embedding groove, and the opposite two side edges of the test plate 2 are embedded in the first embedding groove and the second embedding groove respectively. The first horizontal plate part 11 can be fixedly connected with the second horizontal plate part 13, such as through a separate connecting plate, or only through other components.
[0055] Optionally, the bottom surface of the test plate 2 is not lower than the avoiding groove 101, so that the profiling presser plate 1 can press the workpiece first.
[0056] Embodiment two
[0057] The embodiment discloses an electronic atomizer detection device, which comprises the resistance testing device as described in the embodiment one.
[0058] Finally, it should be noted that, although the above-mentioned embodiments have been described in the specification and drawings of the present application, but it cannot limit the patent protection scope of the present application. Any equivalent structure or equivalent flow replacement or modification based on the essential concept of the present application, using the content described in the specification and drawings, the technical solutions directly or indirectly implemented in other related technical fields, etc., are all included in the patent protection scope of the present application.
Claims
1. An electrical resistance testing device, characterized by, The utility model relates to a resistance testing device, which comprises: a profiling press plate; a test plate fixedly connected with the profiling press plate, wherein a plurality of groups of test probes are arranged in a rectangular array on the test plate, and the test probes penetrate through the test plate; a resistance tester electrically connected with the test probes; a downward pressing telescopic device for driving the profiling press plate to press a workpiece so that the test probes detect the resistance of the workpiece.
2. The resistance testing device of claim 1, wherein, A plurality of avoiding grooves are arranged at intervals on the bottom surface of the profiling press plate, and the profiling press plate is provided with a pressing protrusion for pressing a jig disc used for supporting a workpiece.
3. The resistance testing device of claim 1, wherein, The resistance tester, the downward pressing telescopic device and the buffer are all mounted on a support plate, and one end of the buffer is connected with the test plate.
4. The resistance testing device of claim 3, wherein, The device further comprises an elastic member for resetting the profiling press plate. The elastic member is mounted on one side of the bottom of the profiling press plate to push the profiling press plate towards the support plate, or the elastic member is mounted between the support plate and the profiling press plate to pull the profiling press plate towards the support plate.
5. The resistance testing device of claim 3, wherein, The buffer comprises a buffer cylinder mounted on the support plate, a buffer pressing rod slidingly mounted in the buffer cylinder and a buffer spring mounted in the buffer cylinder. The buffer spring is located on one side of the top of the buffer pressing rod, and a buffer elastic block is mounted on the bottom end of the buffer pressing rod.
6. The resistance testing device of claim 3, wherein, A sliding guide rod is mounted on the support plate, and the sliding guide rod is parallel to the telescopic rod of the downward pressing telescopic device. A sliding cylinder is mounted on the profiling press plate, and the sliding cylinder is slidingly mounted on the sliding guide rod.
7. The resistance testing device of claim 3, wherein, The buffer is provided with at least two buffers, and all the buffers are arranged in a circular array around the center line of the downward pressing telescopic device.
8. The resistance testing device of claim 2, wherein, The profiling press plate comprises a first horizontal plate part, a first vertical plate part, a second horizontal plate part and a second vertical plate part. A first embedding groove is arranged on the first vertical plate part, and a second embedding groove is arranged on the second vertical plate part, and the opposite two side edges of the test plate are embedded in the first embedding groove and the second embedding groove, respectively.
9. The resistance testing device of claim 2, wherein, The bottom surface of the test plate is not lower than the avoiding grooves.
10. An electronic atomizer detection device, comprising: The device further comprises the resistance testing device according to any one of claims 1 to 9.