Testing device and testing system

Abstract

The utility model discloses a testing device and a testing system, and relates to the technical field of electrical performance testing devices.The testing device comprises a data processing circuit and a control circuit, and the data processing circuit is used for being in communication connection with an external upper computer and an inverter to be tested; the control circuit is in communication connection with the data processing circuit, the upper computer and the inverter to be tested, and is used for receiving a control test signal transmitted by the upper computer and controlling the connection between the data processing circuit and the inverter to be tested according to the received control test signal. And the controller is also used for acquiring a test signal fed back by the inverter to be tested and transmitting the acquired test signal to the upper computer. The method is used for simplifying the testing process and improving the testing efficiency.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of electrical performance testing devices, in particular to a testing device and a testing system. BACKGROUND

[0002] At present, the prior art does not specially set a testing device for inverter products, especially micro inverter products, and in the production and testing process of inverter products, the inverter cannot be directly tested, there are problems of multiple testing processes, complicated testing actions, inconvenience of testing, and low testing efficiency. CONTENT OF THE INVENTION

[0003] The main purpose of the present application is to provide a testing device and a testing system, which aims to simplify the testing process and improve the testing efficiency.

[0004] To achieve the above purpose, the present application provides a testing device, which comprises:

[0005] A data processing circuit is used for communication connection with an external host computer and a to-be-tested inverter;

[0006] A control circuit is in communication connection with the data processing circuit, the host computer and the to-be-tested inverter, used for receiving a control testing signal transmitted by the host computer, and controlling the connection between the data processing circuit and the to-be-tested inverter to be turned on according to the received control testing signal, and further used for acquiring a testing signal fed back by the to-be-tested inverter and transmitting the acquired testing signal to the host computer.

[0007] In an embodiment, the testing device further comprises a power supply circuit, and the power supply circuit comprises a direct current source circuit used for connection with an external direct current power supply;

[0008] The control testing signal comprises a direct current control signal, and the control circuit is used for controlling the direct current source circuit to output direct current to the to-be-tested inverter after receiving the direct current control signal.

[0009] In an embodiment, the power supply circuit further comprises a power supply conversion circuit used for converting direct current into alternating current;

[0010] The control testing signal comprises an alternating current control signal, and the control circuit is used for controlling the power supply conversion circuit to work and output alternating current to the to-be-tested inverter after receiving the alternating current control signal.

[0011] In an embodiment, the power supply circuit is connected with the host computer and used for supplying power to the host computer.

[0012] In an embodiment, the testing device comprises a plurality of workstations for connecting with the to-be-tested inverters, and the control circuit is configured to control the data processing circuit to connect with the to-be-tested inverters of the corresponding workstations according to the received control test signals.

[0013] In an embodiment, a switch assembly is arranged on a connection channel between the data processing circuit and the to-be-tested inverters of different workstations.

[0014] The control circuit is configured to control the switch assembly to open, so as to control the corresponding connection channel to be connected.

[0015] Alternatively, the control circuit is configured to control the switch assembly to close, so as to control the corresponding connection channel to be disconnected.

[0016] In an embodiment, the testing device is integrated on a housing, and a plurality of first connection terminals are arranged on the housing, the first connection terminals are configured to connect with the to-be-tested inverters, and the plurality of first connection terminals are arranged one-to-one corresponding to the plurality of workstations.

[0017] The application further provides a testing system comprising a host computer and the testing device as described above.

[0018] In an embodiment, the host computer is configured to preset a test parameter range, and output a test completion signal when the test signals do not exceed the preset test parameter range.

[0019] The control circuit is configured to control the data processing circuit to disconnect with the to-be-tested inverters according to the received test completion signals.

[0020] In an embodiment, the testing system further comprises a memory, the host computer is connected with the memory, and the memory is configured to acquire and store the test signals.

[0021] Compared with the prior art, the application has the following beneficial effects:

[0022] The technical scheme of the application is characterized in that the data processing circuit is in communication connection with an external host computer and the to-be-tested inverter, and is used to ensure the transmission of signals among the testing device, the to-be-tested inverter and the host computer; the control circuit receives the control test signal transmitted by the host computer, and controls the connection between the data processing circuit and the to-be-tested inverter to be connected according to the received control test signal; during the testing process, the control assembly is further used to acquire the test signal fed back by the to-be-tested inverter, and transmit the acquired test signal to the host computer; by receiving the control test signal of the host computer, the testing process is controlled, and by receiving the test signal fed back by the to-be-tested inverter through the control circuit, automatic testing is realized, which can effectively reduce the testing process and testing procedure, and facilitate testing; through automatic testing, the accuracy of testing is improved, and human testing errors can be reduced, and the testing efficiency and reliability are improved;

[0023] By controlling the on-off of the connection through the control circuit, the testing process is controlled, the testing process and testing strategy can be optimized, various testing tasks of the product can be accurately and efficiently completed, and the testing efficiency is effectively improved; through the modular design of the control circuit and the data processing circuit of the testing device, modular installation and use are realized, and the production efficiency can be improved, and the production capacity can be quickly improved. BRIEF DESCRIPTION OF DRAWINGS

[0024] In order to more clearly illustrate the technical scheme in the embodiments of the application or the prior art, the drawings needed to be used in the embodiments or the prior art description will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the application, and other drawings can be obtained according to the structures shown in the drawings without creative labor for those skilled in the art.

[0025] Fig. 1 A module schematic diagram of an embodiment of the testing device provided by the application;

[0026] Fig. 2 A partial electrical control principle diagram of an embodiment of the testing device provided by the application;

[0027] Fig. 3 Other partial electrical control principle diagrams of an embodiment of the testing device provided by the application.

[0028] EXPLANATION OF DRAWINGS:

[0029] 100, data processing circuit;

[0030] 200, control circuit;

[0031] 300, power supply circuit;

[0032] 400, host computer;

[0033] 500、to-be-tested inverter;

[0034] 600、memory.

[0035] The implementation, functional features and advantages of the present application will be further described with reference to the embodiments in combination with the accompanying drawings. DETAILED DESCRIPTION

[0036] The technical solutions in the embodiments of the present application will be clearly and completely described in combination with the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work fall within the scope of protection of the present application.

[0037] It should be noted that if the embodiments of the present application involve directional indications (such as up, down, left, right, front, back, etc.), the directional indications are only used to explain the relative position relationship, movement condition, etc. between components in a certain posture, and if the certain posture changes, the directional indications also change accordingly.

[0038] In addition, if the embodiments of the present application involve descriptions such as "first", "second", etc., the descriptions of "first", "second", etc. are only for description purposes, and cannot be understood as indicating or implying the relative importance of the indicated technical features or implicitly indicating the number of the indicated technical features. Therefore, the features limited by "first" and "second" can explicitly or implicitly include at least one of the features. In addition, "and / or" or "and / or" appearing throughout the text means that the three parallel solutions are included, for example, "A and / or B" includes A solution, or B solution, or A and B solution. In addition, the technical solutions of each embodiment can be combined with each other, but it must be based on the fact that a person skilled in the art can realize it, and when the combination of technical solutions appears contradictory or unachievable, it should be considered that the combination of technical solutions does not exist and is not within the scope of protection claimed by the present application.

[0039] At present, there is no testing device for inverter products, especially micro inverter products. Although the related technology can read the internal information of the product through a mobile phone APP before the to-be-tested inverter is put into use, because it cannot realize wireless communication testing of the micro inverter, it can only judge the performance of the to-be-tested inverter through the internal information of the to-be-tested inverter read by the mobile phone APP operated by a person, and there are problems of more testing procedures and complicated testing actions, and it is not conducive to realizing online testing of a large number of products, and the testing efficiency is low.

[0040] In view of the testing problem of the inverter, especially the micro inverter product, with reference to Figs. 1 to 3The application provides a testing device and a testing system, which realize the function test of different types of to-be-tested inverters by providing a testing device and a testing system with high automation degree and high test quality.

[0041] The testing device comprises a data processing circuit 100 and a control circuit 200.

[0042] The data processing circuit 100 is connected with an external host computer 400 and a to-be-tested inverter 500. The control circuit 200 is connected with the data processing circuit 100, the host computer 400 and the to-be-tested inverter 500, and is used for receiving a control test signal transmitted by the host computer 400 and controlling the connection between the data processing circuit 100 and the to-be-tested inverter 500 according to the received test signal; and the control circuit 200 is also used for acquiring a test signal fed back by the to-be-tested inverter 500 and transmitting the acquired test signal to the host computer 400.

[0043] It can be understood that the data processing circuit is connected with the external host computer 400 (such as a control center or a computer system) and the to-be-tested inverter 500 (an inverter needing to be tested) respectively, and is used for realizing the reception, processing and transmission of data and ensuring the transmission of signals between the testing device, the to-be-tested inverter 500 and the host computer 400.

[0044] In the application, the host computer 400 refers to a computer system used for monitoring, controlling and data processing in an automatic control system or an industrial control system. The host computer 400 allows a user to input a control test signal or adjust parameters through an input component (such as an input button or a keyboard), receives and processes signals of a lower computer (such as the control circuit 200 or a sensor), analyzes the signals and monitors the state of the system.

[0045] Optionally, the control circuit 200 can include but is not limited to a micro control unit (MCU), other types of controllers or other control devices, and the control circuit 200 includes but is not limited to detection circuits, signal processing circuits, comparison circuits, calculation circuits, communication interfaces, etc. Among them, the communication interface is used to realize the communication connection of the control circuit 200 with the host computer 400, the data processing circuit, the to-be-tested inverter 500, etc. Specifically, it can be but is not limited to various communication protocols and interface standards, such as RS-232, RS-485, Ethernet, wireless communication, etc. The detection circuit includes voltage detection circuit, current detection circuit, signal detection circuit, etc. The voltage detection circuit and the current detection circuit are used to detect the output voltage, current and other parameters. The signal detection circuit is used to detect whether the data processing circuit 100 is connected with the circuit breaker of the corresponding work station, or the signal detection circuit is used to detect the on-off state of the switch assembly on the connection channel of the data processing circuit 100 and the corresponding work station. The signal processing circuit is used to process the detection signals transmitted by the detection circuit or other sensor detection components outside the control circuit 200. The comparison circuit is used to compare the signal levels and output the comparison signal representing the relative size of the compared signal levels, to set the threshold value and / or generate the control logic. The calculation circuit is used to perform data calculation, to determine whether to control the data processing circuit to be connected with (or turned off) the to-be-tested inverter 500 of the corresponding work station according to the comparison signal fed back by the signal processing circuit, the control test signal transmitted by the host computer 400, etc.

[0046] The control circuit 200 is mainly used to receive the control test signals transmitted by the host computer 400, which include but are not limited to test instructions, test data, test conditions, etc. The control circuit 200 controls whether the connection between the data processing circuit 100 and the to-be-tested inverter 500 is connected according to the received control test signals, and is specifically used to decide whether to start the test and whether to stop the test according to the test requirements. During the test process, the control circuit 200 is also used to acquire the test signals fed back by the to-be-tested inverter 500, which include but are not limited to the working parameters and performance parameters of the to-be-tested inverter 500, and the control circuit 200 is used to transmit the acquired test signals to the host computer 400 for further analysis, processing, storage, etc.

[0047] The data processing circuit 100 includes but is not limited to a communication circuit, through which the data processing circuit 100 can realize the communication connection between the external host computer 400 and the to-be-tested inverter 500. In the embodiment of the present application, the data processing circuit 100 is configured to receive the control test signals transmitted by the host computer 400 and transmit the control test signals to the to-be-tested inverter 500, and is further configured to transmit the test signals fed back by the to-be-tested inverter 500 to the host computer 400. Specifically, the data processing circuit 100 includes a wireless communication circuit, and wireless and product communication can reduce the physical jacks designed for the to-be-tested inverter and the host computer in the test device, so that the test device is more concise and facilitates modular design and construction, effectively simplifies the hardware structure of the test device, and realizes integrated design.

[0048] The test device is used to test the to-be-tested inverter. Specifically, the data processing circuit 100 establishes communication with the to-be-tested inverter and the host computer 400, receives the control test signals of the host computer 400, controls the test process, and receives the test signals fed back by the to-be-tested inverter through the control circuit 200 to realize automatic testing. In this way, the test process and test procedure can be effectively reduced, and testing is facilitated. The accuracy of the test is improved through automatic testing, and human testing errors are reduced, thereby improving the test efficiency and reliability.

[0049] Optionally, the test device further includes a power supply circuit 300. The control circuit 200 is configured to control the power supply circuit 300 to work according to the received control test signals, and supply power to the to-be-tested inverter 500 through the direct current source circuit and the alternating current source circuit of the power supply circuit 300.

[0050] In an embodiment, the power supply circuit 300 includes a direct current source circuit, which is configured to be connected with an external direct current power supply.

[0051] The control test signals include direct current control signals. The control circuit 200 is configured to control the direct current source circuit to output direct current to the to-be-tested inverter 500 after receiving the direct current control signals.

[0052] The direct current source circuit is part of the power supply circuit 300 and is configured to be connected with an external direct current power supply. The control circuit 200 is configured to control the direct current source circuit to output direct current to the to-be-tested inverter 500 according to the received direct current control signals, and is configured to control the direct current source circuit to output stable direct current to the to-be-tested inverter 500, so as to control the voltage and current parameters of the output direct current according to actual test requirements, to adapt to different test scenarios and meet the test requirements of different types of to-be-tested inverters 500.

[0053] The output DC power to the to-be-tested inverter 500 can be used to simulate the working state of the to-be-tested inverter 500 in a solar photovoltaic system, a battery energy storage system or other DC power supply systems; test the conversion efficiency, power output, thermal management and other key performance indicators of the to-be-tested inverter 500 under different DC input conditions; test the safety of the to-be-tested inverter 500 under different DC input conditions and ensure that the to-be-tested inverter 500 can operate safely under abnormal conditions; simulate and identify possible failure modes of the to-be-tested inverter 500; simulate the compatibility of the to-be-tested inverter 500 with different types and specifications of DC power supplies; simulate different environmental conditions by changing the parameters (such as voltage, current, etc.) of the DC power, and test the performance of the to-be-tested inverter 500. The specific settings can be made according to the actual situation, which are not limited here.

[0054] In an embodiment, the power supply circuit 300 further comprises a power conversion circuit for converting DC power into AC power.

[0055] The control test signal comprises an AC control signal, and the control circuit 200 is configured to control the power conversion circuit to work after receiving the AC control signal, and control the power conversion circuit to output AC power to the to-be-tested inverter 500.

[0056] The power conversion circuit is configured to convert DC power (DC) into AC power (AC). Optionally, the power conversion circuit is connected with the DC source circuit, and is configured to obtain DC power through the DC source circuit and convert the DC power (DC) into AC power (AC). Alternatively, the power conversion circuit is configured to be directly connected with an external DC power supply, and is configured to obtain DC power directly from the external DC power supply and convert the DC power (DC) into AC power (AC). The control circuit 200 is configured to control the power conversion circuit to output AC power to the to-be-tested inverter 500 according to the received AC control signal, control the power conversion circuit to output stable AC power to the to-be-tested inverter 500, and control the frequency, voltage, current and other parameters of the output AC power according to the actual test requirements to adapt to different test scenarios and meet the test requirements of different models of to-be-tested inverters 500.

[0057] The output AC power to the to-be-tested inverter 500 can be, but is not limited to, used for simulating the conversion process of the to-be-tested inverter 500 from DC power to AC power and outputting the AC power in actual application; testing the conversion efficiency, power output, waveform quality, etc. of the to-be-tested inverter 500 under various AC output conditions; testing the conversion efficiency, power output, thermal management, etc. of the inverter under different AC output conditions; testing the safety of the to-be-tested inverter 500 under different AC input conditions and ensuring that the to-be-tested inverter 500 can operate safely under abnormal conditions; simulating and identifying possible failure modes of the to-be-tested inverter 500; simulating the compatibility of the to-be-tested inverter 500 with different types and specifications of AC loads; simulating different power grid conditions by changing the parameters (such as voltage, frequency, current, etc.) of the AC power and testing the performance of the to-be-tested inverter 500. The specific settings are not limited here.

[0058] In an embodiment, the power supply circuit 300 is connected with the host computer 400 and is used to supply power to the host computer 400. The power supply circuit 300 provides the required power for the host computer 400 to ensure that the host computer 400 can work normally.

[0059] In an embodiment, the testing device includes a plurality of workstations for connecting with the to-be-tested inverters 500, and the control circuit 200 is used to control the data processing circuit 100 to connect with the to-be-tested inverters 500 in the corresponding workstations according to the received control test signal.

[0060] Through the setting of the plurality of workstations, the plurality of to-be-tested inverters 500 can be tested simultaneously or respectively, realizing flexible testing of the plurality of to-be-tested inverters 500 and improving the testing efficiency. The control circuit 200 is used to control the data processing circuit 100 to connect with the to-be-tested inverters 500 in the corresponding one or more workstations according to the received control test signal, so as to realize the testing of at least one to-be-tested inverter 500.

[0061] In addition, in some alternative embodiments of the present application, the host computer 400 is used to output a test completion signal when the test signal does not exceed the preset test parameter range and / or output the test completion signal after determining that the testing is completed, and the control circuit 200 is used to control the connection between the data processing circuit 100 and the to-be-tested inverters 500 in the corresponding workstations to be disconnected according to the received test completion signal.

[0062] In some optional embodiments of the present application, when the plurality of to-be-tested inverters 500 are turned on, for controlling at least two of the plurality of stations to be turned on / off simultaneously according to different actual requirements, the same control test signal is outputted to the to-be-tested inverters connected to the corresponding stations, and the test signals fed back by the to-be-tested inverters of the corresponding stations are acquired, so as to simultaneously or sequentially realize the same performance test on at least two of the plurality of to-be-tested inverters 500; and / or, for separately controlling at least two stations to be turned on / off according to different actual requirements, different control test signals are outputted to the to-be-tested inverters connected to the corresponding stations, so as to acquire the test signals of the to-be-tested inverters of the corresponding stations, and realize different performance tests on at least two of the plurality of to-be-tested inverters 500 respectively; the specific implementation can be set according to actual requirements, which is not limited herein.

[0063] It should be noted that, in some other alternative embodiments of the present application, in addition to controlling the data processing circuit 100 to be connected to the to-be-tested inverters 500 of the corresponding stations according to the control test signals sent by the host computer 400 received by the control circuit 200, position sensors, detection circuits, etc. can also be arranged in at least part of the plurality of stations, for outputting detection signals when it is detected that the to-be-tested inverters 500 are connected to the corresponding stations (and / or it is detected that the to-be-tested inverters 500 are not connected), and the control circuit 200 is used for controlling the data processing circuit 100 to be connected to (or disconnected from) the to-be-tested inverters 500 of the corresponding stations according to the received detection signals.

[0064] In addition, in some optional embodiments of the present application, the product signals of the turned-on inverter under test 500, such as the product serial number SN, the power generation, and the model, can be directly obtained after the data processing circuit 100 establishes the connection with the corresponding inverter under test 500, and the obtained product signals are directly uploaded to the upper computer 400 or uploaded to the upper computer 400 through the control circuit 200; or the control circuit 200 controls the data processing circuit 100 to connect with the inverter under test 500 in different stations, and obtains the product signals of the inverters in different stations, such as the product serial number SN, the power generation, and the model, for obtaining the target product signals of the product serial number SN, the power generation, and the model set by the upper computer 400 according to the control test signal after receiving the control test signal, determining that the inverter with the product information corresponding to the target product signal in all turned-on inverters is the inverter under test 500, and controlling the data processing circuit 100 to keep connected with the inverter under test 500 in the corresponding station and disconnected with the inverters in other stations; or the control circuit 200 determines the station to be turned on according to the received control test signal, for controlling the data processing circuit 100 to connect with the corresponding station, and obtaining the test signals fed back by the inverter under test 500 after the data processing circuit 100 connects with the inverter under test 500 in the corresponding station, wherein the test signals fed back include the product signals such as the product serial number SN, the power generation, and the model; and the specific setting can be made according to the actual situation, which is not limited here.

[0065] In an embodiment, a switch assembly is arranged on each connection channel between the data processing circuit 100 and the inverter under test 500 in different stations.

[0066] The control circuit 200 is configured to control the switch assembly to be opened to control the corresponding connection channel to be turned on.

[0067] Alternatively, the control circuit 200 is configured to control the switch assembly to be closed to control the corresponding connection channel to be turned off.

[0068] The switch assembly can be, but is not limited to, a relay or other switching device. The data processing circuit 100 has multiple connection channels between multiple stations, and the switch assembly has multiple switch assemblies. The multiple switch assemblies are arranged one by one on the multiple connection channels, for controlling the corresponding connection channel to be turned on (or turned off) to allow the connection (or disconnection) of signals and power, so that the data processing circuit 100 is connected with (or stopped to be connected with) the inverter under test 500 in the corresponding station.

[0069] The control circuit 200 controls the connection of the data processing circuit 100 and the to-be-tested inverter 500 in the corresponding work station according to the received control test signal through the switch assembly such as a relay.

[0070] The switch assembly can also be used to switch different work stations to help the control circuit 200 control the connection of the data processing circuit 100 and the to-be-tested inverter 500 in the corresponding work station according to the received control test signal.

[0071] It should be noted that in the embodiments of the present application, the control signal can be, but is not limited to, a direct current control signal, an alternating current control signal, and other control test signals corresponding to the set test items.

[0072] Optionally, the test device further comprises an input device such as an input button, a keyboard, a mouse, a touch screen, an operating switch, etc., which is connected to the host computer 400 and is used to input the control test signal to control the execution of the corresponding test item; or, the test sequence of a plurality of test items is preset, and the input device is used to input the test control signal when triggered to control the execution of the corresponding plurality of test items according to the preset test sequence. Alternatively, the host computer 400 can preset a plurality of control test signals corresponding to a plurality of test items, and output the corresponding control test signal according to the actual needs when the to-be-tested inverter 500 is connected to control the execution of the corresponding test item; or, the host computer 400 can preset the test sequence of a plurality of test items, and output the test control signal and control the execution of the corresponding plurality of test items according to the preset test sequence when the to-be-tested inverter 500 is connected. When the control test signal is preset, the test items of different types and models of to-be-tested inverters, the sequence of each test item, etc. can be the same or different, which can be set according to the actual needs and is not limited herein.

[0073] In order to realize integrated design and reduce the overall space occupied, in an embodiment, the test device is integrated on a shell. The shell is provided with a plurality of first connection terminals for connecting with the to-be-tested inverter 500, and the plurality of first connection terminals are one-to-one corresponding to the plurality of work stations. The number of first connection terminals is 3 to 6 or other numbers, which is not limited herein.

[0074] Optionally, the shell is provided with at least one second connection terminal, and the second connection terminal is used for connecting with a direct current power supply. In some alternative embodiments of the present application, the direct current source circuit is connected with an external direct current power supply, and is used for outputting direct current from the direct current power supply to the to-be-tested inverters of the plurality of workstations, and one second connection terminal is specifically arranged in correspondence; or the direct current source circuit is connected with a plurality of external direct current power supplies, and is used for outputting direct current from the plurality of direct current power supplies to the to-be-tested inverters of the plurality of workstations one by one, and the number of the second connection terminals is arranged in correspondence with the number of the workstations; when the power conversion circuit is not directly connected with the direct current source circuit, a plurality of power conversion circuits can also be arranged, the plurality of power conversion circuits are connected with at least one external direct current power supply, and the number of the second connection terminals can be arranged in correspondence with the number of the power conversion circuits; the number of the second connection terminals can be specifically arranged according to actual conditions, which is not limited herein.

[0075] In some other alternative embodiments of the present application, the host computer 400 reads the internal information of the product according to the acquired test signals, and outputs a test completion signal after completing the test. When a display or other output device is arranged, the output device is also used for displaying the test result according to the received test completion signal. The displayed test result can be displayed and presented through a list, a report, a document, etc., which is not limited herein.

[0076] In the present application, the process is controlled by controlling the on-off of the connection through the control circuit 200, the test flow and the test strategy can be optimized, and various test tasks of the product can be accurately and efficiently completed, thereby effectively improving the test efficiency. Through the modular design of the power circuit 300, the control circuit 200 and the data processing circuit 100 of the test device, the modular installation and use can also improve the production efficiency and rapidly improve the production capacity.

[0077] In some specific embodiments of the present application:

[0078] The control circuit 200 comprises Fig. 1 a controller PLC (Programmable Logic Controller, programmable logic controller), which is connected with a direct current power supply through Fig. 2 terminal blocks (DB1, DB2, DB3, DB4, DB5, DB6), and controls the on-off of the connection channel through contactors (-KM1, -KM2, -KM3, -KM4, -KM5, -KM6), and is used for controlling the on or off of the corresponding connection channel according to the received control test signal; and controls the on-off of the direct current source circuit through direct current contactors (DC1, DC2, DC3, DC4, DC5, DC6); and realizes circuit protection through fuses or circuit breakers (F1, F2, F3, F4, F5, F6).

[0079] With reference to Fig. 2 The output terminals (Y1, Y2, Y3, Y4, Y5, Y6) of the controller PLC control the on-off of the alternating current contactors (-KM1, -KM2, -KM3, -KM4, -KM5, -KM6) through the relay coils (-KA1, -KA2, -KA3, -KA4, -KA5, -KA6), so as to control the input power or the output load of the to-be-tested inverter, so as to further control the progress of the related test. The control circuit 200 or the low-power device is powered by the independent power supply V5, and the display screen and other external devices or the detection components such as sensors are connected through (-X22, -X23, -X24, -X25); the actual setting can be made specifically, and is not limited here.

[0080] The application also provides a test system, which comprises the host computer 400 and the test device. The specific structure of the test device is referred to the above embodiments. Since the test system adopts all the technical solutions of the above embodiments, it at least has all the beneficial effects brought by the technical solutions of the above embodiments, and will not be described here.

[0081] In an embodiment, the host computer 400 presets a test parameter range, and the host computer 400 is configured to output a test completion signal when the test signal does not exceed the preset test parameter range.

[0082] It can be understood that the preset test parameter range includes but is not limited to the maximum and minimum values of the parameters such as voltage, current, power, and frequency allowed in the test process. The preset test parameter range can be determined according to the inverter model, daily operation parameters, etc., to ensure the accuracy and safety of the test. The preset test parameter range can be pre-stored in the storage device of the host computer 400, or downloaded from the cloud database, networked device, etc. by the host computer 400 after starting. The test signal fed back by the to-be-tested inverter 500 is used to simulate the actual operation condition of the to-be-tested inverter 500 by controlling the test signal.

[0083] The control circuit 200 is configured to control the disconnection between the data processing circuit 100 and the to-be-tested inverter 500 according to the received test completion signal. The test parameters fed back by the to-be-tested inverter 500 include the above-mentioned parameters. When the fed back parameters do not exceed the preset test parameter range, it is determined that the to-be-tested inverter 500 is a good product, and a test completion signal is output to control the end of the test.

[0084] When the fed back parameters exceed the preset test parameter range, a test completion signal can be directly output to control the end of the test, and the to-be-tested inverter is prevented from continuing to run in the case of exceeding the safe parameter range; or a detection signal is output to avoid test errors caused by connection errors, etc. The actual setting can be made specifically, and is not limited here.

[0085] In an embodiment, the test system further comprises a memory 600 connected to the host computer 400, and the memory 600 is configured to acquire and store the test signals.

[0086] During the test, the host computer 400 receives the test signals containing the test parameters fed back by the inverter to be tested, and transmits the received test signals to the memory 600 in real time; or, the host computer 400 receives the test signals containing the test parameters fed back during the test, and transmits the test parameters to the memory 600 after completing the test.

[0087] Through the setting of the memory 600, the test records of each inverter can be traced back. Optionally, the memory 600 can include, but is not limited to, an electrical connection with one or more conductive wires, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above.

[0088] The above merely describes exemplary embodiments of the present application, and does not limit the patent scope of the present application. Any equivalent structural transformation made by using the content of the present application specification and drawings, or direct / indirect application in other related technical fields is included in the patent protection scope of the present application.

Claims

1. A testing device, characterized in that, include: Data processing circuitry, used for communication connection with external host computer and inverter under test; A control circuit is communicatively connected to the data processing circuit, the host computer, and the inverter under test. The control circuit is used to receive control test signals transmitted by the host computer, and to control the connection between the data processing circuit and the inverter under test according to the received control test signals. The control circuit is also used to acquire test signals fed back by the inverter under test and to transmit the acquired test signals to the host computer.

2. The testing apparatus as described in claim 1, characterized in that, The testing device also includes a power supply circuit, which includes a DC source circuit for connecting to an external DC power supply. The control test signal includes a DC control signal. The control circuit is used to control the DC source circuit to output DC power to the inverter under test after receiving the DC control signal.

3. The testing apparatus as described in claim 2, characterized in that, The power supply circuit also includes a power conversion circuit, which is used to convert direct current into alternating current. The control test signal includes an AC control signal. The control circuit is used to control the power conversion circuit to work after receiving the AC control signal, and to control the power conversion circuit to output AC power to the inverter under test.

4. The testing apparatus as described in claim 2, characterized in that, The power supply circuit is connected to the host computer and is used to supply power to the host computer.

5. The testing apparatus as described in any one of claims 1-4, characterized in that, The testing device includes multiple workstations for connecting to the inverter under test, and the control circuit is used to control the data processing circuit to connect to the inverter under test at the corresponding workstation according to the received control test signal.

6. The testing apparatus as described in claim 5, characterized in that, The data processing circuit is equipped with switching components on the connection channels between the inverters under test at different workstations. The control circuit is used to control the switch assembly to open, so as to control the corresponding connection channel to be connected; Alternatively, the control circuit can be used to control the switching assembly to turn off, thereby controlling the corresponding connection channel to shut down.

7. The testing apparatus as described in claim 5, characterized in that, The testing device is integrated on a housing, which is provided with multiple first connection terminals. The first connection terminals are used to connect to the inverter under test, and the multiple first connection terminals correspond one-to-one with multiple workstations.

8. A testing system, characterized in that, It includes a host computer and a testing device as described in any one of claims 1-7.

9. The testing system as described in claim 8, characterized in that, The host computer presets a test parameter range, and the host computer is used to output a test completion signal when the test signal does not exceed the preset test parameter range. The control circuit is used to control the connection between the data processing circuit and the inverter under test to be disconnected according to the received test completion signal.

10. The testing system as described in claim 8 or 9, characterized in that, The testing system also includes a memory, and the host computer is connected to the memory. The memory is used to acquire and store the test signals.

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