Chip test protection device

By introducing linkage protection components and clamping mechanisms into the chip testing device, and utilizing a motor-driven gear rack structure and sealing strips to prevent dust contamination, the problem of impaired clamping sensitivity is solved, achieving stable clamping and reliable test data.

CN223711774UActive Publication Date: 2025-12-23SHANGHAI XUSHENG HIGH TECH CO LTD
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Patent Information

Application Number
CN202520254205.6
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-02-18
Publication Date
2025-12-23
Estimated Expiration
2035-02-18

AI Technical Summary

Technical Problem

Existing chip test fixtures are prone to dust accumulation when idle, which can impair sensitivity and affect test data.

Method used

A chip testing protection device was designed, comprising a linkage protection component and a clamping mechanism. The device utilizes a gear and rack structure driven by a motor to achieve the separation and closure of the protection guide, and combines a sealing strip to improve airtightness and prevent dust from entering. The clamping mechanism achieves stable clamping through an adjustment component.

Benefits of technology

It effectively prevents dust from contaminating the fixture, maintains testing accuracy, and ensures the accuracy and reliability of test data.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a chip test protection device, belongs to the technical field of chip test, and aims to solve the problem that in the prior art, when the device is idle for a period of time, external dust is easy to adhere to a clamp, so that the sensitivity of the chip is damaged when the chip is clamped, and subsequent test data is affected. Comprising a test main body, protection mechanisms are installed inside and above the test main body, clamping mechanisms are installed in the middle and above the test main body, and each protection mechanism comprises a linkage protection assembly. When the test main body is used, a person can start the first motor in advance to enable the rotating rod and the driving gear arranged on the periphery of the rotating rod to rotate, and at the moment, the guide racks which are respectively arranged on the two sides of the driving gear and meshed with the driving gear are matched with the guide mounting frame to perform synchronous displacement in different directions under the transmission of the driving gear; therefore, the two protection guide frames can be relatively separated by matching with the guide grooves.
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Description

Technical Field

[0001] This utility model belongs to the field of chip testing technology, and specifically relates to a chip testing protection device. Background Technology

[0002] A chip, also known as an integrated circuit, is a miniature electronic circuit that integrates a large number of tiny electronic components, such as transistors, resistors, and capacitors, onto a single semiconductor substrate. Before leaving the factory, chips need to be tested on a test bench.

[0003] For example, patent CN212905012U describes a protective device for a chip testing fixture, which relates to the field of chip testing technology. It includes a testing platform, a motor mounting base fixedly connected to the bottom surface of the testing platform, a motor fixedly connected to the upper surface of the motor mounting base, a rotating shaft fixedly connected to the output end of the motor, two symmetrical threads on the outer surface of the rotating shaft, and a movable nut meshing with the outer surface of each thread. A sliding groove is provided on the upper surface of the testing platform, a slider is fixedly connected to the upper surface of each movable nut, and a fixing plate is fixedly connected to the upper surface of each slider.

[0004] During use, when the aforementioned chip test fixture is idle for a period of time, external dust can easily adhere to the fixture, which can impair the sensitivity of the chip when it is clamped, thus affecting subsequent test data. Utility Model Content

[0005] (1) Technical problems to be solved

[0006] In view of the shortcomings of the prior art, the purpose of this utility model is to provide a chip testing protection device, which aims to solve the problem that when the device is idle for a period of time, external dust easily adheres to the fixture, thereby causing damage to the sensitivity of the chip when it is clamped, and thus affecting the subsequent test data.

[0007] (2) Technical solution

[0008] To solve the above-mentioned technical problems, this utility model provides a chip testing protection device, including a test body, a protection mechanism installed inside and above the test body, and a clamping mechanism installed in the middle and above the test body. The protection mechanism includes a linkage protection component, which is installed inside and above the test body. The linkage protection component includes two protection guides, and a sealing strip is affixed to the inner side of the two protection guides.

[0009] Furthermore, the linkage protection component includes a first motor, which is installed below the test body. A rotating rod is installed at the output end of the first motor, and a drive gear is fixed around the rotating rod. Guide racks mesh on both sides of the drive gear. Guide frames for the movement of the guide racks are provided on both sides inside the test body, and guide grooves are opened on both sides of the upper part of the test body. Protective guide frames are fixed at different ends of the two guide racks.

[0010] Furthermore, the drive gear forms a meshing transmission connection with the guide racks on both sides.

[0011] Furthermore, the guide groove and the protective guide frame are connected by a movable guide connection.

[0012] Furthermore, the clamping mechanism includes an adjustment component, which is installed in the middle and above the test body. The adjustment component includes two lead screw sleeves, and a mounting bracket is fixed above the two lead screw sleeves. The clamping component is installed in the middle and above the two mounting brackets.

[0013] Furthermore, the adjustment component includes preset slots, which are symmetrically opened on the upper two sides of the test body. One of the preset slots is equipped with a positive and negative lead screw, and a first bevel gear is fixed around one end of the positive and negative lead screw. A second bevel gear meshes with one side of the first bevel gear, and a transmission rod is fixed in the middle of the second bevel gear. A second motor is installed at one end of the transmission rod, and lead screw sleeves are screwed on both sides of the middle of the positive and negative lead screw. A guide rod is fixed inside the other preset slot.

[0014] Furthermore, the guide rod forms a movable guide connection with the two mounting brackets.

[0015] Furthermore, the clamping assembly includes a screw groove, which is located in the upper center of the mounting frame. A threaded rod is installed in the center of the screw groove, and a rotating shaft is connected to the end of the threaded rod. The other end of the rotating shaft is connected to a clamping guide plate. Guide grooves are provided on both sides of the interior of the mounting frame to guide the clamping guide plate.

[0016] (3) Beneficial effects

[0017] Compared with the prior art, the beneficial effects of this utility model are as follows:

[0018] When using the test body, the operator can pre-start the first motor to rotate the rotating rod and the surrounding drive gear. At this time, the guide racks meshing on both sides of the drive gear will be driven by the gear to perform synchronous displacement in different directions with the guide frame. Since the protective guide frame is fixed at the opposite end of the two guide racks, the two protective guide frames can be separated relative to each other with the guide groove, exposing the clamping mechanism above the test body. The operator can then proceed with the next chip testing operation. After use, the two protective guide frames can be closed again using the above structure. The sealing strip on the inner side of the protective guide frame can improve the airtightness and prevent dust and impurities from affecting the related components of the clamping mechanism and the chip clamped during operation when the test body is not in use.

[0019] This invention allows operators to pre-adjust the spacing between the two mounting brackets based on the chip's length. The adjustment is achieved by starting the second motor, which rotates the transmission rod and the second bevel gear at the end. This meshes with the first bevel gear, causing the lead screw to rotate. The corresponding lead screw sleeve, acting on the lead screw, allows the two mounting brackets to move relative to each other, guided by the guide rod. The operator then places the chip on the clamping position of the two mounting brackets and manually threads the screw rod. Guided by the screw groove and with the cooperation of the rotating shaft and guide groove, the corresponding clamping guide plates press against both ends of the chip, achieving stable and compatible chip clamping and providing convenience for subsequent testing. Attached Figure Description

[0020] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0021] Figure 1 This is a three-dimensional structural diagram of the present invention;

[0022] Figure 2 A top-down view of the internal structure of the test subject;

[0023] Figure 3 This is a top-view structural diagram of the test subject;

[0024] Figure 4 This is a side view of the mounting bracket structure.

[0025] The labels in the attached diagram are as follows: 1. Test body; 2. Protection mechanism; 21. Linkage protection component; 211. First motor; 212. Rotating rod; 213. Drive gear; 214. Guide rack; 215. Guide frame; 216. Protective guide frame; 217. Guide groove; 22. Sealing strip; 3. Clamping mechanism; 31. Adjustment component; 311. Preset groove; 312. Positive and negative lead screws; 313. First bevel gear; 314. Second bevel gear; 315. Transmission rod; 316. Second motor; 317. Lead screw sleeve; 318. Guide rod; 32. Mounting frame; 33. Clamping component; 331. Threaded groove; 332. Threaded rod; 333. Rotating shaft; 334. Clamping guide plate; 335. Guide edge groove. Detailed Implementation

[0026] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0027] This specific embodiment is a chip testing and protection device, and its structural schematic diagram is shown below. Figures 1 to 4As shown, the test body includes a test body 1. A protective mechanism 2 is installed inside and above the test body 1, and a clamping mechanism 3 is installed in the middle and above the test body 1. The protective mechanism 2 includes a linkage protection component 21, which is installed inside and above the test body 1. The linkage protection component 21 includes a first motor 211, which is installed below the test body 1. A rotating rod 212 is installed at the output end of the first motor 211, and a drive gear 213 is fixed around the rotating rod 212. Guide racks 214 mesh with both sides of the drive gear 213, and the drive gear 213 forms a meshing transmission connection with the guide racks 214 on both sides. Guide frames 215 for the guide racks 214 to move are provided on both sides inside the test body 1, and guide grooves 217 are opened on both sides of the top of the test body 1. Protective guide frames 216 are fixed at different ends of the two guide racks 214. The guide grooves 217 and the protective guide frames 216 are connected. The frames 216 are connected by a movable guide, and the inner sides of the two protective guide frames 216 are fitted with sealing strips 22. When the test body 1 is used, the personnel can start the first motor 211 in advance to make the rotating rod 212 and the drive gear 213 around it rotate. At this time, the guide racks 214 meshing on both sides of the drive gear 213 will be driven by it to cooperate with the guide frame 215 to make synchronous displacement in different directions. Since the protective guide frames 216 are fixed at the opposite ends of the two guide racks 214, the two protective guide frames 216 can be separated relative to each other by the guide groove 217, exposing the clamping mechanism 3 above the test body 1. The personnel can then carry out the next chip testing operation. After use, the two protective guide frames 216 can be closed again using the above structure. The sealing strips 22 on the inner side of the protective guide frames 216 can improve the airtightness and prevent dust and impurities from affecting the related components of the clamping mechanism 3 and the chip clamped during operation when the test body 1 is not in use.

[0028] The clamping mechanism 3 includes an adjustment component 31, which is installed in the middle and above the test body 1. The adjustment component 31 includes a preset groove 311, which is symmetrically opened on both sides of the upper part of the test body 1. A forward and reverse lead screw 312 is installed inside one of the preset grooves 311. A first bevel gear 313 is fixed around one end of the forward and reverse lead screw 312. A second bevel gear 314 meshes with one side of the first bevel gear 313. A transmission rod is fixed in the middle of the second bevel gear 314. 315. A second motor 316 is installed at one end of the transmission rod 315. Screw sleeves 317 are screwed onto both sides of the middle of the positive and negative lead screws 312. A guide rod 318 is fixed inside another preset groove 311. The guide rod 318 forms a movable guide connection with the two mounting brackets 32. A mounting bracket 32 ​​is fixed above the two lead screw sleeves 317. A clamping assembly 33 is installed in the middle and above the two mounting brackets 32. The clamping assembly 33 includes a screw groove 331, and the screw groove 331 is opened above the mounting bracket 32. In the middle, a threaded rod 332 is installed in the middle of the screw mounting groove 331, and a rotating shaft 333 is connected to the end of the threaded rod 332. The other end of the rotating shaft 333 is connected to a clamping guide plate 334. The inner sides of the mounting bracket 32 ​​are provided with guide grooves 335 for guiding the clamping guide plate 334 to move. The operator can adjust the distance between the two mounting brackets 32 in advance according to the length of the chip. The adjustment method is that the operator starts the second motor 316 to make the transmission rod 315 and the end second bevel gear 314 rotate. At this time, the first bevel gear meshing with it... The gear 313 drives the forward and reverse lead screws 312 to rotate, thereby causing the relative lead screw sleeve 317, which interacts with the lead screw, to move relative to the two mounting brackets 32 in coordination with the guide rod 318. Then, the operator places the chip on the clamping position of the two mounting brackets 32 and manually threads the rod 332 in sequence. Under the guidance of the screw groove 331 and with the cooperation of the rotating shaft 333 and the guide groove 335, the corresponding clamping guide plate 334 can press against both ends of the chip, thereby achieving a stable and compatible clamping of the chip and providing convenience for subsequent testing.

[0029] Working principle: When using the test body 1, the operator can pre-start the first motor 211 to rotate the rotating rod 212 and the surrounding drive gear 213. At this time, the guide racks 214 meshing on both sides of the drive gear 213 will be driven by it to synchronously displace in different directions with the guide frame 215. Since the protective guide frame 216 is fixed at the opposite end of the two guide racks 214, the two protective guide frames 216 can be separated relative to each other with the guide groove 217, exposing the clamping mechanism 3 above the test body 1. The operator can then proceed with the next chip testing operation. After use, the two protective guide frames 216 can be closed again using the above structure. The sealing strip 22 on the inner side of the protective guide frame 216 can improve the airtightness and prevent dust and impurities from entering the clamping mechanism 3 and related components when the test body 1 is not in use. The chip held in the middle is affected. Secondly, the staff can adjust the distance between the two mounting brackets 32 in advance according to the length of the chip. The adjustment method is as follows: the staff starts the second motor 316 to make the transmission rod 315 and the end second bevel gear 314 rotate. At this time, the first bevel gear 313 meshing with it will drive the positive and negative screw 312 to rotate. Thus, the relative screw sleeve 317 acting with the screw can carry the two mounting brackets 32 to relative displacement with the guide rod 318. Then, the staff puts the chip on the clamping position of the two mounting brackets 32, and manually threads the screw rod 332 in sequence. Under the guidance of the screw groove 331 and the cooperation of the rotating shaft 333 and the guide groove 335, the corresponding clamping guide plate 334 can press against the two ends of the chip respectively, thereby achieving a stable clamping fit for the chip and providing portability for subsequent testing.

[0030] All technical features in this embodiment can be freely combined according to actual needs.

[0031] Finally, it should be noted that the above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Although the present utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. A chip testing and protection device, comprising a testing body (1), characterized in that, The test body (1) is equipped with a protective mechanism (2) inside and above, and a clamping mechanism (3) is installed in the middle and above of the test body (1). The protective mechanism (2) includes a linkage protection component (21), and the linkage protection component (21) is installed inside and above the test body (1). The linkage protection component (21) includes two protective guides (216), and a sealing strip (22) is attached to the inner side of the two protective guides (216).

2. The chip testing and protection device according to claim 1, characterized in that, The linkage protection component (21) includes a first motor (211), which is installed below the test body (1). A rotating rod (212) is installed at the output end of the first motor (211), and a drive gear (213) is fixed around the rotating rod (212). Guide racks (214) mesh on both sides of the drive gear (213). Guide frames (215) for the guide racks (214) to move are provided on both sides inside the test body (1), and guide grooves (217) are opened on both sides above the test body (1). Protective guide frames (216) are fixed at different ends of the two guide racks (214).

3. The chip testing and protection device according to claim 2, characterized in that, The drive gear (213) forms a meshing transmission connection with the guide racks (214) on both sides respectively.

4. The chip testing and protection device according to claim 2, characterized in that, The guide groove (217) and the protective guide frame (216) are connected by a movable guide.

5. The chip testing and protection device according to claim 1, characterized in that, The clamping mechanism (3) includes an adjustment component (31), and the adjustment component (31) is installed in the middle and above of the test body (1). The adjustment component (31) includes two lead screw sleeves (317), and a mounting bracket (32) is fixed above the two lead screw sleeves (317). The clamping component (33) is installed in the middle and above of the two mounting brackets (32).

6. The chip testing and protection device according to claim 5, characterized in that, The adjustment component (31) includes a preset slot (311), and the preset slots (311) are symmetrically opened on both sides above the test body (1). One of the preset slots (311) is equipped with a positive and negative lead screw (312), and a first bevel gear (313) is fixed around one end of the positive and negative lead screw (312). A second bevel gear (314) is meshed on one side of the first bevel gear (313), and a transmission rod (315) is fixed in the middle of the second bevel gear (314). A second motor (316) is installed at one end of the transmission rod (315). Lead screw sleeves (317) are screwed on both sides of the middle of the positive and negative lead screw (312). A guide rod (318) is fixed in the other preset slot (311).

7. A chip testing and protection device according to claim 6, characterized in that, The guide rod (318) forms a movable guide connection with the two mounting brackets (32).

8. A chip testing and protection device according to claim 5, characterized in that, The clamping assembly (33) includes a threaded groove (331), which is located in the upper middle part of the mounting frame (32). A threaded rod (332) is installed in the middle of the threaded groove (331), and a rotating shaft (333) is connected to the end of the threaded rod (332). The other end of the rotating shaft (333) is connected to a clamping guide plate (334). Guide grooves (335) are provided on both sides of the interior of the mounting frame (32) for guiding the clamping guide plate (334) to move.