Automatic sorting device for high-temperature chip test

Abstract

The utility model provides an automatic sorting device for high-temperature chip testing, which relates to the technical field of chip testing and comprises a base, an opening is formed in the top of the base in a penetrating manner, a movable seat is slidably mounted in the opening, and a storage plate is fixedly mounted on the inner wall of the opening. According to the utility model, when other chips are tested, a worker starts an electromagnet, an iron positioning frame is attracted to leave a positioning groove, then the worker starts a third motor, the output end of the third motor drives a gear to rotate, the gear moves along a rack and then drives a movable seat to move, and at the moment, the electromagnet is powered off; a positioning frame moves under the elastic action of a second spring, a roller is in contact with the outer wall of a movable seat, and when a placement seat corresponding to a chip moves to a test site, the roller enters a positioning groove beside the placement seat and is in contact with a pressure sensor, the pressure sensor gives an alarm, and a third motor stops moving, so that excessive movement can be prevented, and positioning is facilitated.

Description

TECHNICAL FIELD

[0001] The utility model relates to chip test technical field especially relates to a kind of high-temperature chip test's automated sorting device. BACKGROUND

[0002] At present, the global chip industry presents a highly concentrated trend, the United States, South Korea, Japan and other countries are in leading position in chip design, manufacturing and other fields, with Intel, Qualcomm, Samsung, TSMC and other well-known chip enterprises.In recent years, China's chip industry has also made great progress, and has made breakthroughs in chip design, manufacturing process and other aspects, but there is still a certain gap with international advanced level, especially in the field of high-end chip manufacturing, it still faces some technical bottlenecks and external restrictions.

[0003] In the prior art, when testing the chip, it may be necessary to test the chip at room temperature, high temperature and low temperature, and the chip is placed on the fixing device, and then the temperature control device is in contact with the chip, but the conventional fixing device is provided with a groove corresponding to the shape of the chip, and the chip is placed in the groove to limit the outer wall of the chip, but if other shaped chips are tested, the fixing device with the corresponding shaped groove may need to be replaced to continue testing, which reduces the work efficiency. UTILITY MODEL CONTENT

[0004] The utility model aims at solving the problem that in the prior art, when testing other shaped chips, the fixing device with the corresponding shaped groove may need to be replaced to continue testing, which reduces the work efficiency, and proposes a kind of high-temperature chip test's automated sorting device.

[0005] In order to achieve the above-mentioned purpose, the utility model adopts the following technical scheme: a kind of high-temperature chip test's automated sorting device, including base, the base top is opened in the opening, the opening inside sliding installation has mobile seat, the opening inner wall is fixedly installed with storage plate, the storage plate is inserted with mobile seat and slides and is connected with mobile seat, the mobile seat bottom is opened in storage groove, the storage groove inner wall is fixedly installed with third motor, the output of third motor is fixedly installed with gear, the base bottom is fixedly installed with rack, the gear is engaged with rack and is connected, the mobile seat outer lateral wall is opened in three evenly distributed positioning grooves, the positioning groove inner wall is fixedly installed with pressure sensor, the base top is fixedly installed with fixed plate, the fixed plate outer wall is fixedly installed with electromagnet, the electromagnet outer wall is fixedly installed with second spring, the second spring one end is fixedly installed with positioning frame, the positioning frame inside rotation is installed with gyro wheel, the positioning frame outer wall is fixedly installed with limit rod, the limit rod one end is inserted with electromagnet and slides, the mobile seat top is provided with three evenly distributed placing seats.

[0006] Preferably, the bottom of the placing seat is fixedly provided with an inserting plate, and the outer wall of the inserting plate is provided with a clamping groove.

[0007] Preferably, the top of the moving seat is provided with three uniformly distributed inserting grooves, the inner wall of the inserting groove is provided with a limiting groove, the inner wall of the limiting groove is fixedly provided with a first spring, one end of the first spring is fixedly provided with a clamping block, one end of the clamping block is fixedly provided with a connecting rod, and one end of the connecting rod penetrates through the moving seat and is fixedly provided with a pulling plate.

[0008] Preferably, the outer wall of the base is provided with a first sliding groove, a first threaded rod is rotatably arranged in the first sliding groove, a first sliding block is threadedly connected to the outer wall of the first threaded rod, one end of the base is fixedly provided with a first motor, and the output end of the first motor penetrates through the base and is fixedly connected with the first threaded rod.

[0009] Preferably, the outer wall of the base is provided with a second sliding groove away from the first sliding groove, a limiting column is fixedly arranged on the inner wall of the second sliding groove, a second sliding block is slidably arranged on the outer wall of the limiting column, and the top of the first sliding block and the second sliding block is fixedly provided with a U-shaped frame.

[0010] Preferably, the inner wall of the U-shaped frame is provided with an adjusting groove, a second threaded rod is rotatably arranged in the adjusting groove, a second motor is fixedly arranged on the outer wall of the U-shaped frame, the output end of the second motor penetrates through the U-shaped frame and is fixedly connected with the second threaded rod, a sliding plate is threadedly connected to the outer wall of the second threaded rod, a pneumatic cylinder is fixedly arranged on the bottom of the sliding plate, the output end of the pneumatic cylinder is fixedly provided with a placing plate, and the bottom of the placing plate is provided with a suction nozzle.

[0011] Preferably, the top of the base is fixedly provided with an L-shaped plate, the top of the L-shaped plate is fixedly provided with a hydraulic cylinder, and the output end of the hydraulic cylinder penetrates through the L-shaped plate and is provided with a high-low temperature control head.

[0012] Preferably, the top of the base is provided with three conveying belts, and the bottom of the base is fixedly provided with a supporting frame at four corners.

[0013] Compared with the prior art, the utility model has the advantages and positive effects that,

[0014] 1、in the utility model, when other chips are tested, the staff starts the electromagnet, the iron positioning frame is attracted to leave the positioning groove, then the staff starts the third motor, the output end of the third motor drives the gear to rotate, the gear moves along the rack and further drives the moving seat to move, at this time the electromagnet is powered off, the positioning frame moves under the elastic force of the second spring, the roller contacts with the outer wall of the moving seat, when the placing seat corresponding to the chip moves to the test site, at this time the roller enters the positioning groove beside the placing seat and contacts with the pressure sensor, the pressure sensor alarms, the third motor stops moving, so it can prevent over-movement and facilitate positioning.

[0015] 2、The utility model discloses a replace the seat of placing, and staff pulls the pull plate, and the pull plate is driven the clamping block to move through the connecting rod, and the clamping block leaves the card slot, and the first spring compression, at this moment can take out the plug -in board, and replace the seat of placing, then put the plug -in board into the slot, and loosen the pull plate, and the elastic force of first spring promotes the clamping block to enter the card slot, and the plug -in board is fixed, and the replacement efficiency is improved. BRIEF DESCRIPTION OF DRAWINGS

[0016] Figure 1 The utility model proposes a kind of overall perspective view of the automatic sorting device of high-temperature chip test;

[0017] Figure 2 The utility model proposes a kind of another perspective view of the automatic sorting device of high-temperature chip test whole;

[0018] Figure 3 The utility model proposes a kind of mobile seat sectional view of the automatic sorting device of high-temperature chip test;

[0019] Figure 4 The utility model proposes a kind of positioning frame perspective view of the automatic sorting device of high-temperature chip test.

[0020] Legend: 1, base; 2, support frame; 3, conveying belt; 4, U-shaped frame; 5, first sliding slot; 6, first threaded rod; 7, first sliding block; 8, first motor; 9, L-shaped plate; 10, hydraulic cylinder; 11, opening; 12, mobile seat; 13, fixed plate; 14, high-low temperature control head; 15, limiting column; 16, second sliding block; 17, adjusting groove; 18, second threaded rod; 19, second motor; 20, sliding plate; 21, air cylinder; 22, placing plate; 23, suction nozzle; 24, second sliding slot; 25, storage plate; 26, rack; 27, positioning groove; 28, pressure sensor; 29, storage slot; 30, third motor; 31, gear; 32, slot; 33, plug-in board; 34, card slot; 35, limiting slot; 36, first spring; 37, clamping block; 38, connecting rod; 39, pull plate; 40, placing seat; 41, electromagnet; 42, second spring; 43, positioning frame; 44, roller; 45, limiting rod. DETAILED DESCRIPTION

[0021] In order to more clearly understand the above-mentioned purposes, features and advantages of the utility model, the utility model is further explained below in connection with drawings and examples.It should be noted that the examples and features in the examples of the present application can be combined with each other without conflict.

[0022] Many specific details are set forth in the following description in order to provide a full understanding of the present invention. However, the present invention may also be implemented in other ways different from those described herein. Therefore, the present invention is not limited to the specific embodiments disclosed in the following specification.

[0023] Example 1, as Figures 1-4 As shown, this utility model provides an automated sorting device for high-temperature chip testing, including a base 1. An opening 11 is formed at the top of the base 1, and a movable seat 12 is slidably installed inside the opening 11. A storage plate 25 is fixedly installed on the inner wall of the opening 11, passing through the movable seat 12 and slidably inserted into it. A storage slot 29 is formed at the bottom of the movable seat 12, and a third motor 30 is fixedly installed on the inner wall of the storage slot 29. A gear 31 is fixedly installed at the output end of the third motor 30. A rack 26 is fixedly installed at the bottom of the base 1, and the gear 31 meshes with the rack 26. The outer side wall of the movable seat 12 has three evenly distributed positioning slots 27. A pressure sensor 28 is fixedly installed on the inner wall of the positioning slot 27. A fixing plate 13 is fixedly installed on the top of the base 1. An electromagnet 41 is fixedly installed on the outer wall of the fixing plate 13. A second spring 42 is fixedly installed on the outer wall of the electromagnet 41. A positioning frame 43 is fixedly installed at one end of the second spring 42. A roller 44 is rotatably installed inside the positioning frame 43. A limit rod 45 is fixedly installed on the outer wall of the positioning frame 43. One end of the limit rod 45 is slidably inserted into the electromagnet 41. The top of the movable seat 12 is provided with three evenly distributed placement seats 40.

[0024] The effect achieved by the entire embodiment 1 is as follows: when testing other chips, the operator activates the electromagnet 41, and the iron positioning frame 43 is attracted away from the positioning groove 27. Then, the operator activates the third motor 30. The output end of the third motor 30 drives the gear 31 to rotate. The gear 31 moves along the rack 26 and thus drives the moving seat 12 to move. At this time, the electromagnet 41 is de-energized, and the positioning frame 43 moves under the elastic force of the second spring 42. The roller 44 contacts the outer wall of the moving seat 12. When the placement seat 40 corresponding to the chip moves to the test location, the roller 44 enters the positioning groove 27 next to the placement seat 40 and contacts the pressure sensor 28. The pressure sensor 28 alarms, and the third motor 30 stops moving. This can prevent excessive movement and facilitate positioning.

[0025] Example 2, as Figures 1-4 As shown, further, a plate 33 is fixedly installed at the bottom of the placement base 40, and a slot 34 is provided on the outer wall of the plate 33.

[0026] Further, the top of the moving seat 12 is provided with three evenly distributed insertion slots 32, the inner wall of the insertion slot 32 is provided with a limiting groove 35, the inner wall of the limiting groove 35 is fixedly installed with a first spring 36, one end of the first spring 36 is fixedly installed with a clamping block 37, one end of the clamping block 37 is fixedly installed with a connecting rod 38, one end of the connecting rod 38 penetrates through the moving seat 12 and is fixedly installed with a pull plate 39.

[0027] Further, the outer wall of the base 1 is provided with a first sliding groove 5, the first sliding groove 5 is rotatably installed with a first threaded rod 6, the outer wall of the first threaded rod 6 is threadedly connected with a first sliding block 7, one end of the base 1 is fixedly installed with a first motor 8, the output end of the first motor 8 penetrates through the base 1 and is fixedly connected with the first threaded rod 6.

[0028] Further, the outer wall of the base 1 is provided with a first sliding groove 5, the first sliding groove 5 is rotatably installed with a first threaded rod 6, the outer wall of the first threaded rod 6 is threadedly connected with a first sliding block 7, one end of the base 1 is fixedly installed with a first motor 8, the output end of the first motor 8 penetrates through the base 1 and is fixedly connected with the first threaded rod 6.

[0029] Further, the inner wall of the U-shaped frame 4 is provided with an adjusting groove 17, the adjusting groove 17 is rotatably installed with a second threaded rod 18, the outer wall of the U-shaped frame 4 is fixedly installed with a second motor 19, the output end of the second motor 19 penetrates through the U-shaped frame 4 and is fixedly connected with the second threaded rod 18, the outer wall of the second threaded rod 18 is threadedly connected with a sliding plate 20, the bottom of the sliding plate 20 is fixedly installed with an air cylinder 21, the output end of the air cylinder 21 is fixedly installed with a placing plate 22, and the bottom of the placing plate 22 is provided with a suction nozzle 23.

[0030] Further, the top of the base 1 is fixedly installed with an L-shaped plate 9, the top of the L-shaped plate 9 is fixedly installed with a hydraulic cylinder 10, the output end of the hydraulic cylinder 10 penetrates through the L-shaped plate 9 and is provided with a high and low temperature control head 14.

[0031] Further, the top of the base 1 is provided with three conveying belts 3, which are respectively used for feeding, transporting qualified chips and transporting unqualified chips, and the bottom of the base 1 is fixedly installed with a supporting frame 2 at four corners.

[0032] The effect of the whole embodiment 2 is that when the placing seat 40 is replaced, the worker pulls the pull plate 39, the pull plate 39 drives the clamping block 37 to move through the connecting rod 38, the clamping block 37 moves away from the clamping groove 34, and the first spring 36 is compressed, at this time, the plug-in plate 33 can be taken out, a new placing seat 40 is replaced, then the plug-in plate 33 is placed into the insertion slot 32, the pull plate 39 is loosened, the elastic force of the first spring 36 pushes the clamping block 37 into the clamping groove 34, and the plug-in plate 33 is fixed, thereby improving the replacement efficiency.

[0033] Working principle: when testing, one of the conveyors 3 transports the chip to be tested to the testing position, the worker starts the first motor 8 according to the position of the chip, the first threaded rod 6 rotates to drive the first sliding block 7 to move, thereby driving the suction nozzle 23 to move, then the second motor 19 is started, the second threaded rod 18 rotates to drive the sliding plate 20, so that the horizontal position of the suction nozzle 23 can be adjusted, when the suction nozzle 23 moves above the chip, the worker starts the air cylinder 21, the suction nozzle 23 is lowered to adsorb the chip on the suction nozzle 23, then the suction nozzle 23 moves to place the chip in the groove of the placing seat 40, finally the worker starts the hydraulic cylinder 10, the high-low temperature control head 14 is lowered to the surface of the chip, the performance of the chip is detected and the temperature of the chip is raised, then the suction nozzle 23 is controlled according to the test result, and the chip is placed on the corresponding conveyor 3. When other chips are tested, the worker starts the electromagnet 41, the iron positioning frame 43 is attracted away from the positioning groove 27, then the worker starts the third motor 30, the output end of the third motor 30 drives the gear 31 to rotate, the gear 31 moves along the rack 26 to drive the moving seat 12 to move, at this time the electromagnet 41 is powered off, the positioning frame 43 moves under the elastic force of the second spring 42, the roller 44 contacts the outer wall of the moving seat 12, when the placing seat 40 corresponding to the chip moves to the testing position, at this time the roller 44 enters the positioning groove 27 beside the placing seat 40 and contacts the pressure sensor 28, the pressure sensor 28 alarms, the third motor 30 stops moving, so that the movement is prevented from being excessive, and positioning is facilitated. When the placing seat 40 is replaced, the worker pulls the pull plate 39, the pull plate 39 drives the clamping block 37 to move through the connecting rod 38, the clamping block 37 moves away from the clamping groove 34, and the first spring 36 is compressed, at this time the plug plate 33 can be taken out, a new placing seat 40 is replaced, then the plug plate 33 is placed in the plug groove 32, the pull plate 39 is loosened, the elastic force of the first spring 36 drives the clamping block 37 to enter the clamping groove 34, and the plug plate 33 is fixed, so that the replacement efficiency is improved.

[0034] The above is only a preferred embodiment of the present application, and does not limit the present application in other forms. Any skilled person in the art can modify or change the above disclosed technical content to apply to other fields, but any simple modification, equivalent change and modification made according to the technical essence of the present application to the above embodiments still belongs to the protection scope of the present application.

Claims

1. An automated handler for high temperature chip testing, comprising a base (1), characterized in that: The opening (11) is arranged on the top of the base (1), the moving seat (12) is slidably arranged in the opening (11), the storage plate (25) is fixedly arranged on the inner wall of the opening (11), the storage plate (25) penetrates the moving seat (12) and is slidably connected with the moving seat (12), the storage groove (29) is arranged on the bottom of the moving seat (12), the third motor (30) is fixedly arranged on the inner wall of the storage groove (29), the output end of the third motor (30) is fixedly connected with the gear (31), the gear (31) is meshedly connected with the rack (26), the three positioning grooves (27) are arranged on the outer wall of the moving seat (12), the pressure sensor (28) is fixedly arranged on the inner wall of the positioning groove (27), the fixed plate (13) is fixedly arranged on the top of the base (1), the electromagnet (41) is fixedly arranged on the outer wall of the fixed plate (13), the second spring (42) is fixedly arranged on the outer wall of the electromagnet (41), the positioning frame (43) is fixedly arranged on one end of the second spring (42), the roller (44) is rotatably arranged in the positioning frame (43), the limiting rod (45) is fixedly arranged on the outer wall of the positioning frame (43), one end of the limiting rod (45) is slidably connected with the electromagnet (41), and the three placing seats (40) are arranged on the top of the moving seat (12).

2. The automated handler for high temperature chip testing of claim 1, wherein: The plug-in plate (33) is fixedly arranged on the bottom of the placing seat (40), and the clamping groove (34) is arranged on the outer wall of the plug-in plate (33).

3. The automated handler for high temperature chip testing of claim 1, wherein: The three insertion grooves (32) are arranged on the top of the moving seat (12), the limiting groove (35) is arranged on the inner wall of the insertion groove (32), the first spring (36) is fixedly arranged on the inner wall of the limiting groove (35), the clamping block (37) is fixedly arranged on one end of the first spring (36), the connecting rod (38) is fixedly arranged on one end of the clamping block (37), and the pull plate (39) is fixedly arranged on one end of the connecting rod (38) and penetrates the moving seat (12).

4. The automated handler for high temperature chip testing of claim 1, wherein: The first sliding groove (5) is arranged on the outer wall of the base (1), the first threaded rod (6) is rotatably arranged in the first sliding groove (5), the first sliding block (7) is threadedly connected with the outer wall of the first threaded rod (6), the first motor (8) is fixedly arranged on one end of the base (1), and the output end of the first motor (8) penetrates the base (1) and is fixedly connected with the first threaded rod (6).

5. The automated handler for high temperature chip testing of claim 4, wherein: The second sliding groove (24) is arranged on the outer wall of the base (1) and away from the first sliding groove (5), the limiting column (15) is fixedly arranged on the inner wall of the second sliding groove (24), the second sliding block (16) is slidably arranged on the outer wall of the limiting column (15), and the U-shaped frame (4) is fixedly arranged on the top of the first sliding block (7) and the second sliding block (16).

6. The automated handler for high temperature chip testing of claim 5, wherein: The U-shaped frame (4) is provided with an adjusting groove (17) in the inner wall, a second threaded rod (18) is rotatably installed in the adjusting groove (17), a second motor (19) is fixedly installed on the outer wall of the U-shaped frame (4), the output end of the second motor (19) penetrates the U-shaped frame (4) and is fixedly connected with the second threaded rod (18), a sliding plate (20) is threadedly connected with the outer wall of the second threaded rod (18), a pneumatic cylinder (21) is fixedly installed at the bottom of the sliding plate (20), a placing plate (22) is fixedly installed at the output end of the pneumatic cylinder (21), and a suction nozzle (23) is arranged at the bottom of the placing plate (22).

7. The automated handler for high temperature chip testing of claim 1, wherein: The base (1) is fixedly provided with an L-shaped plate (9) at the top, the L-shaped plate (9) is fixedly provided with a hydraulic cylinder (10) at the top, and the output end of the hydraulic cylinder (10) penetrates the L-shaped plate (9) and is provided with a high-low temperature control head (14).

8. The automated handler for high temperature chip testing of claim 1, wherein: The base (1) is provided with three conveying belts (3) at the top, and a supporting frame (2) is fixedly installed at each of the four corners of the base (1).

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