Electrical testing device

Abstract

The utility model relates to an electrical property testing device. The electrical property testing device comprises a clamping mechanism and a controller, the clamping mechanism comprises a plurality of anode conducting rods and at least one cathode conducting rod, the plurality of anode conducting rods are arranged on the clamping mechanism in a manner of being distributed on the side part of the to-be-tested product, and the at least one cathode conducting rod is arranged on the clamping mechanism in a manner of being located on the upper part of the to-be-tested product; at least one cathode conducting rod is in contact with a to-be-tested product; and the controller is electrically connected with the clamping mechanism and is used for controlling the clamping mechanism to perform clamping action so as to enable the plurality of anode conducting rods to be in contact with the to-be-tested product when the clamping mechanism is located at the test station, controlling the plurality of anode conducting rods to apply electric energy to the to-be-tested product, and obtaining electrical parameters of the to-be-tested product through the at least one cathode conducting rod. According to the invention, the problems of test data errors and low test efficiency caused by inclination, loss or non-in-place installation of the probe can be reduced.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of automation equipment, in particular to an electrical testing device. BACKGROUND

[0002] Metal oxide film outer packaging shell is more and more applied in personal electronic equipment as outer packaging shell due to its strong texture, not easy to fade, wear and tear resistance and heat insulation and other advantages, such as metal or alloy oxide film shell used in equipment such as mobile phones or notebook computers. There are many ways to manufacture metal or alloy oxide film shell, and anodic oxidation process is more typical. Anodic oxidation process refers to generating oxide film structure on the surface of metal or alloy by conducting electricity.

[0003] In order to verify whether the metal or alloy oxide film shell is qualified, various performance tests are usually required, including anodic conduction test. Anodic conduction test is to measure the impedance of metal or alloy oxide film shell by conducting electricity to judge the electrical insulation of metal or alloy oxide film shell. The traditional anodic conduction test device generally adopts single-point test method, that is, a voltage is applied to the surface of the metal or alloy oxide film shell by an anode probe and a cathode probe, and the impedance of the metal or alloy oxide film shell is obtained. The probe is easy to tilt, lose or not installed in place, which leads to test data error and low test efficiency. CONTENT OF THE UTILITY MODEL

[0004] In view of the above, it is necessary to provide an electrical testing device which can reduce the problems of test data error and low test efficiency caused by probe tilt, loss or not installed in place.

[0005] The present application provides an electrical testing device, comprising: a clamping mechanism and a controller; the clamping mechanism comprises a plurality of anode conduction rods and at least one cathode conduction rod, the plurality of anode conduction rods are arranged on the clamping mechanism in a manner distributed on the side of the product to be tested, and the at least one cathode conduction rod is arranged on the clamping mechanism in a manner located on the upper part of the product to be tested, and the at least one cathode conduction rod is in contact with the product to be tested when the clamping mechanism is located in the test station; the controller is electrically connected with the clamping mechanism, and is used for: controlling the clamping mechanism to perform clamping action to make the plurality of anode conduction rods contact the product to be tested when the clamping mechanism is located in the test station, and controlling the plurality of anode conduction rods to apply electric energy to the product to be tested, and acquiring the electrical parameter of the product to be tested through the at least one cathode conduction rod.

[0006] In the present application, when the product under test is located at the test station, the clamping mechanism forms a clamping jaw by using the plurality of anode conductive rods distributed at the side of the product under test and the at least one conductive rod located at the upper part of the product under test to clamp the product under test and perform multi-point electrical testing, thereby reducing the problems of test data errors and low test efficiency caused by probe tilting, loss or not being installed in place in the conventional single-point testing device.

[0007] In some embodiments, the plurality of anode conductive rods are provided with elastic conductive components at the end in contact with the product under test.

[0008] In some embodiments, the plurality of anode conductive rods and / or the at least one cathode conductive rod are provided with elastic buffer components.

[0009] In some embodiments, the electrical testing device further comprises a first lifting mechanism for setting the clamping mechanism and for lifting and lowering the clamping mechanism, and the controller is further configured to control the first lifting mechanism to lower the clamping mechanism to the test station.

[0010] In some embodiments, the clamping mechanism comprises a driving component, a first connecting component and a second connecting component, the first connecting component is arranged on the first lifting mechanism and is configured to connect the driving component with the first lifting mechanism, the at least one cathode conductive rod is arranged on the first connecting component, the second connecting component is arranged on the driving component and is configured to connect the driving component with the plurality of anode conductive rods, and the driving component is configured to perform clamping action and drive the second connecting component to act to make the plurality of anode conductive rods contact the product under test.

[0011] In some embodiments, the second connecting component has an oblong hole, and the second connecting component is arranged on the driving component through the oblong hole.

[0012] In some embodiments, the electrical testing device further comprises a carrying mechanism for carrying the product under test, and the controller is further configured to control the carrying mechanism to move the product under test to the test station.

[0013] In some embodiments, the electrical testing device further comprises a second lifting mechanism connected with the carrying mechanism and configured to lift and lower the carrying mechanism, and the controller is further configured to control the second lifting mechanism to lift the carrying mechanism to move the product under test to the test station.

[0014] In some embodiments, the electrical testing device further comprises a conveying mechanism connected with the carrying mechanism and configured to translate the carrying mechanism, and the controller is further configured to control the conveying mechanism to translate the carrying mechanism to move the product under test to the test station.

[0015] In some embodiments, the electrical testing device further comprises at least one sensor arranged on the clamping mechanism and / or the bearing mechanism, the sensor being configured to detect whether the product to be tested is located at the testing station. BRIEF DESCRIPTION OF DRAWINGS

[0016] Figure 1 is a structural block diagram of an embodiment of the electrical testing device according to the present application.

[0017] Figure 2 is a structural diagram of one view of the clamping mechanism according to the present application.

[0018] Figure 3 is a structural diagram of the anode conductive rod according to the present application.

[0019] Figure 4 is a structural diagram of the cathode conductive rod according to the present application.

[0020] Figure 5 is a structural diagram of another view of the clamping mechanism according to the present application.

[0021] Figure 6 is a structural diagram of the second connecting component according to the present application.

[0022] Figure 7 is a structural diagram of another embodiment of the electrical testing device according to the present application.

[0023] Figure 8 is a structural diagram of another state of the electrical testing device according to the present application. Figure 7

[0024] MAIN ELEMENT SYMBOL EXPLANATION

[0025] 1, electrical testing device; 11, clamping mechanism; 12, controller; 2, product to be tested; 13, first lifting mechanism; 14, bearing mechanism; 15, sensor; 111, anode conductive rod; 112, cathode conductive rod; 113, first connecting component; 114, driving component; 115, second connecting component; 1111, conductive component; 1112, first anode end; 1113, second anode end; 1121, first cathode end; 1122, second cathode end; 115a, first sub connecting part; 115b, second sub connecting part; 1151, long round hole; 141, upper cover; 142, lower cover.

[0026] The following detailed description will further illustrate the present application in conjunction with the above-mentioned drawings. DETAILED DESCRIPTION

[0027] ​In the description of the embodiments in this application, the words "exemplary," "or," and "for example" are used to indicate examples, illustrations, or descriptions. Any embodiment or design scheme described as "exemplary" or "for example" in the embodiments of this application should not be construed as being more preferred or advantageous than other embodiments or design schemes. Specifically, the use of the words "exemplary," "or," and "for example" is intended to present the relevant concepts in a specific manner.

[0028] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains. The terminology used in this application's specification is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. It should be understood that, unless otherwise stated, " / " in this application means "or". For example, A / B can mean A or B. "And / or" in this application is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A alone, A and B simultaneously, and B alone. "At least one" refers to one or more. "More than one" refers to two or more. For example, at least one of a, b, or c can represent: a, b, c, a and b, a and c, b and c, and a, b, and c (seven cases).

[0029] It should also be noted that the terms "first" and "second" in the specification, claims and drawings of this application are used to distinguish similar objects, rather than to describe a specific order or sequence.

[0030] Metal oxide film outer casings are increasingly used in personal electronic devices as outer casings due to their advantages such as high texture, resistance to fading, abrasion resistance, and heat insulation. Examples include the metal or alloy oxide film shells used in mobile phones and laptops. There are various manufacturing methods for metal or alloy oxide film shells, with anodizing being a typical process. Anodizing refers to the process of forming an oxide film structure on the surface of a metal or alloy by making the metal or alloy electrically conductive.

[0031] To verify the quality of a metal or alloy oxide film casing, various performance tests are typically required, including anodic conductivity testing. Anodic conductivity testing, also known as oxide film electrical insulation testing, measures the impedance of the metal or alloy oxide film casing through conductivity to determine its electrical insulation properties. Traditional anodic conductivity testing equipment generally uses a single-point testing method, applying voltage to the surface of the metal or alloy oxide film casing through an anode probe and a cathode probe, and then acquiring the impedance of the casing. Traditional anodic conductivity testing equipment suffers from problems such as probe tilting, loss, or improper installation leading to erroneous test data and low testing efficiency.

[0032] In addition, the conductive probes of the conventional anode conductive testing device are usually vertically arranged, so that only the upper surface of the metal or alloy oxide film shell can be tested, and the distance between the probes of the anode and the cathode is short, so that the electrical property test of the metal or alloy oxide film shell is not comprehensive and accurate enough.

[0033] In addition, some conventional anode conductive testing devices are arranged as multiple anodes and multiple cathodes, but in order to avoid interference between the probes, the next test point needs to be tested after the test at one test point is completed, that is, the single-point testing mode is still adopted, and the testing efficiency is low.

[0034] In addition, the conductive probes of the conventional anode conductive testing device are directly and rigidly contacted with the product, and there is no buffering process, so that irreversible wear of the metal or alloy oxide film shell is caused, and the quality is affected.

[0035] In addition, some conventional anode conductive testing devices still adopt manual feeding and discharging and manual inspection of whether the conductive probes are inclined, lost or not installed in place, and the degree of automation is low, and the testing efficiency is low.

[0036] Therefore, the electrical property testing device provided in the embodiments of the present application can reduce the problems of test data error and low testing efficiency caused by the inclination, loss or non-installation of the probes. In addition, the electrical property testing device provided in the embodiments of the present application has a more comprehensive and accurate testing effect compared with the prior art. In addition, the probes are flexibly contacted with the product to be tested during the test, so that the wear of the product to be tested is reduced, and the quality of the product to be tested is improved. In addition, manual feeding and discharging and manual inspection are cancelled, so that the degree of automation of the electrical property testing device is improved, and thus the testing efficiency is improved. It should be noted that the test in the embodiments of the present application refers to the application of electric energy to the product to be tested to obtain the electrical property data of the product to be tested, so as to judge the electrical insulation of the product to be tested, that is, the electrical insulation test, which is also called electrical property test. In addition, the test station refers to the position of the product to be tested which can be clamped by the clamping mechanism of the electrical property testing device.

[0037] Some embodiments will be described below with reference to the accompanying drawings. In the case of no conflict, the embodiments described below and the features in the embodiments can be combined with each other.

[0038] Figure 1 is a structural block diagram of one embodiment of the electrical property testing device 1 of the present application.

[0039] Please refer to Figure 1 As shown in the figure, the electrical property testing device 1 can include a clamping mechanism 11 and a controller 12. The clamping mechanism 11 can be used to clamp the product to be tested 2, and to apply electric energy to the product to be tested 2 (for example, a voltage or a current) to obtain the electrical property data of the product to be tested 2. Figure 1In some embodiments, the controller 12 can be a control center in the electrical testing device 1, such as an industrial computer, a central processing unit, a control terminal, or the like.

[0040] In some embodiments, the controller 12 can be a control center in the electrical testing device 1, such as an industrial computer, a central processing unit, a control terminal, or the like.

[0041] Figure 2 is a structural schematic view of a perspective view of the clamping mechanism 11 of an embodiment of the present application.

[0042] Referring to Figure 2 As shown, the clamping mechanism 11 can include an anode conductive rod 111 and a cathode conductive rod 112. The anode conductive rod 111 can be used to apply electrical energy to the surface of the product under test 2, and the cathode can be used to receive the electrical signal fed back by the product under test 2 after being applied with electrical energy, i.e., the anode conductive rod 111 can be an output end of the electrical signal, and the cathode conductive rod 112 can be a receiving end of the electrical signal.

[0043] In an embodiment of the present application, the number of anode conductive rods 111 can be multiple, such as 2, 4, 6, or more. The multiple anode conductive rods 111 are arranged on the clamping mechanism 11 in a manner distributed on the side of the product under test 2. The multiple anode conductive rods 111 can be symmetrically and uniformly distributed on the side of the product under test 2, for example, referring to Figure 2 As shown, the two symmetrical sides in one product under test 2 can each be distributed with 3 anode conductive rods 111, and the 3 anode conductive rods 111 on the same side are uniformly arranged. In this case, the multiple anode conductive rods 111 can form a clamping jaw and simultaneously contact the product under test 2, which can not only stabilize the product, but also facilitate the cathode conductive rod 112 to simultaneously perform multi-point testing on the product under test 2, thereby improving the testing efficiency.

[0044] In addition, compared with the conventional conductive testing device, the multiple anode conductive rods 111 in an embodiment of the present application are arranged on the clamping mechanism 11 in a manner distributed on the side of the product under test 2, the distance between the anode conductive rod 111 and the cathode conductive rod 112 is farther, and the surface area of the product under test 2 that can be tested is larger, so that the electrical testing of the product under test 2 is more comprehensive and accurate.

[0045] In some embodiments, the number of anode conductive rods 111 can be an even multiple of the number of products 2 to be tested. For example, when there is 1 product 2 to be tested, the number of anode conductive rods 111 can be 2, 4, 6...2n. Alternatively, when there are 2 products 2 to be tested, the number of anode conductive rods 111 can be 4, 8, 12...4n, where n is a positive integer.

[0046] Figure 3 This is a schematic diagram of the structure of the anode conductive rod 111 in an embodiment of this application.

[0047] In some embodiments, please refer to Figure 3 As shown, one end of each of the multiple anode conductive rods 111 that contacts the product under test 2 is provided with a flexible conductive component 1111. The conductive component 1111 may include at least one of conductive cotton, conductive silicone, or other flexible conductive materials. In this case, when the clamping mechanism 11 performs a clamping action to bring the anode conductive rod 111 into contact with the product under test 2, the elasticity of the conductive component 1111 can be used for buffering, thereby reducing the problem of surface wear of the product under test 2 caused by rigid contact between the anode conductive rod 111 and the product under test 2. In addition, after the anode conductive rod 111 contacts the product under test 2, since the conductive component 1111 itself has conductive properties, electrical energy can be applied to the product under test 2 through the conductive component 1111 to perform electrical testing on the product under test 2.

[0048] In some embodiments, the anode conductive rod 111 may be provided with a resilient buffer component (not shown). Specifically, the anode conductive rod 111 may include a first anode end 1112 close to the product under test 2 and a second anode end 1113 away from the product under test 2. The first anode end 1112 is in contact with the product under test 2 through the conductive component 1111, and the first anode end 1112 and the second anode end 1113 are connected through the buffer component. The first anode end 1112 and the second anode end 1113 may be nested together. For example, the first anode end 1112 may be a large column with a countersunk hole or a hollow hole, and the second anode end 1113 may be a small column with at least a portion of its shape and size adapted to the countersunk hole or hollow hole of the first anode end 1112. After the buffer component is provided in the countersunk hole or hollow hole of the first anode end 1112, the second anode end 1113 is then embedded into the countersunk hole or hollow hole of the first anode end 1112 for connection. In this case, when the clamping mechanism 11 performs a clamping action to make the anode conductive rod 111 contact the product under test 2, the elasticity of the buffer component can also be used for buffering, thereby reducing the problem of surface wear of the product under test 2 caused by rigid contact between the anode conductive rod 111 and the product under test 2.

[0049] In some embodiments, the cushioning component can be at least one of a spring, a sponge, a silica gel pad, or other elastic object.

[0050] In some embodiments, the second anode end 1113 of the anode conductive rod 111 can be electrically connected with the controller 12.

[0051] In the embodiments of the present application, the controller 12 can be electrically connected with the clamping mechanism 11, and the controller 12 can be used to control the clamping mechanism 11 to perform clamping action to make the plurality of anode conductive rods 111 contact the product 2 to be tested when the clamping mechanism 11 is located at the test station. Thus, the product 2 to be tested is clamped and stabilized by the anode conductive rods 111 in the form of “claw”.

[0052] In the embodiments of the present application, the number of the cathode conductive rod 112 can be at least one, and corresponds to the number of the product 2 to be tested. For example, when the product 2 to be tested is one, the number of the cathode conductive rod 112 is also one, and when the product 2 to be tested is n, the number of the cathode conductive rod 112 is also n, where n is a positive integer. That is, the electrical testing device 1 of the embodiments of the present application can test a plurality of products 2 to be tested at a time, and each product 2 to be tested corresponds to one cathode conductive rod 112. In this case, one cathode conductive rod 112 can cooperate with a plurality of anode conductive rods 111 to perform multi-point electrical testing on the product 2 to be tested. During testing, an electrical signal can be applied to the anode conductive rods 111 in sequence and the electrical signal fed back from the surface of the product 2 to be tested can be received from the cathode in sequence, or the electrical signal can be applied to the anode conductive rods 111 at the same time and the electrical signal fed back from the surface of the product 2 to be tested can be received from the cathode at the same time.

[0053] In some embodiments, the cathode conductive rod 112 can be arranged on the clamping mechanism 11 in a manner of being located at the upper part of the product 2 to be tested, and the cathode conductive rod 112 can contact the product 2 to be tested when the clamping mechanism 11 is located at the test station. In this case, the cathode conductive rod 112 located at the upper part of the product 2 to be tested can cooperate with a plurality of anode conductive rods 111 to clamp the product 2 to be tested more comprehensively, thereby improving the stability of clamping.

[0054] Figure 4 is a structural schematic view of the cathode conductive rod 112 of the embodiments of the present application.

[0055] In some embodiments, please refer to Figure 4As shown, the cathode conductive rod 112 is provided with a buffer component with elasticity. Specifically, the cathode conductive rod 112 can include a first cathode end 1121 close to the product 2 to be tested and a second cathode end 1122 away from the product 2 to be tested, the first cathode end 1121 is in contact with the product 2 to be tested, the first cathode end 1121 is connected with the second cathode end 1122 through the buffer component, and the first cathode end 1121 and the second cathode end 1122 can be arranged in a nested manner, for example, the first cathode end 1121 can be a column with a larger volume and a counterbore or a hollow hole, and the second cathode end 1122 can be a column with a smaller volume and at least a part of the shape size is adapted to the counterbore or the hollow hole of the first cathode end 1121. The buffer component can be arranged in the counterbore or the hollow hole of the first cathode end 1121, and then the second cathode end 1122 can be embedded in the counterbore or the hollow hole of the first cathode end 1121 for connection. In this case, when the cathode conductive rod 112 contacts the product 2 to be tested, the elasticity of the buffer component can also be used for buffering, thereby reducing the problem of surface wear of the product 2 to be tested caused by rigid contact between the cathode conductive rod 112 and the product 2 to be tested.

[0056] In some embodiments, the buffer component can be at least one of a spring, a sponge, a silica gel pad, or other objects with elasticity.

[0057] In some embodiments, the second cathode end 1122 of the cathode conductive rod 112 can be electrically connected with the controller 12.

[0058] In the embodiments of the present application, the controller 12 can also be used to control the plurality of anode conductive rods 111 to apply electric energy to the product 2 to be tested, and obtain the electrical parameter of the product 2 to be tested through at least one cathode conductive rod 112, that is, the controller 12 can be electrically connected with the plurality of anode conductive rods 111 and at least one cathode conductive rod 112. Since there is only one cathode, there is no problem of mutual interference when multiple cathode conductive rods 112 receive electric signals. That is, the electrical testing device 1 of the embodiments of the present application can reduce the problem of mutual interference of multiple anodes and multiple cathodes in the traditional anode conductive device, which may affect the testing accuracy.

[0059] Figure 5 FIG. 11 is another perspective view of the clamping mechanism 11 according to the embodiments of the present application. Figure 6 FIG. 12 is a structural schematic view of the second connecting component 115 according to the embodiments of the present application.

[0060] In some embodiments, referring to FIG. 11, Figure 5 As shown, the clamping mechanism 11 can further include a driving component 114, a first connecting component 113, and a second connecting component 115, the first connecting component 113 is connected with the driving component 114, and the driving component 114 is connected with the second connecting component 115.

[0061] In some embodiments, the driving component 114 can include one of a pneumatic cylinder or an electric motor.

[0062] In some embodiments, the cathode conductive rod 112 can be arranged on the first connecting component 113. Specifically, one end of the cathode conductive rod 112 can be arranged on the first connecting component 113, and the other end of the cathode conductive rod 112 can contact the product when the product 2 is located at the test station. For example, the cathode conductive rod 112 can include a first cathode end 1121 close to the product 2 and a second cathode end 1122 away from the product 2, the first cathode end 1121 can contact the product 2 when the product 2 is located at the test station, and the second cathode end 1122 is arranged on the first connecting component 113.

[0063] In some embodiments, the first connecting component 113 can be arranged with multiple cathode conductive rods 112, and the number of cathode conductive rods 112 can correspond to the number of test stations or products 2 to be tested. For example, when the number of test stations or products 2 to be tested is two, the first connecting component 113 can be arranged with two cathode conductive rods 112. In this way, multiple products 2 to be tested can be tested at one time, improving the testing efficiency.

[0064] In some embodiments, the cathode conductive rod 112 can be arranged vertically on the first connecting component 113. In this way, the stability of the cathode conductive rod 112 when contacting the product 2 to be tested can be improved, and the problem of inaccurate test results caused by the inclination of the cathode conductive rod 112 can be reduced.

[0065] In some embodiments, the second connecting component 115 can be arranged on the driving component 114 and used to connect the driving component 114 and the multiple anode conductive rods 111. The driving component 114 is used to perform a clamping action and drive the second connecting component 115 to move so that the multiple anode conductive rods 111 contact the product 2 to be tested. Specifically, referring to FIG. 1, the second connecting component 115 can include a first sub-connection component 115a and a second sub-connection component 115b, the first sub-connection component 115a and the second sub-connection component 115b are similar in shape and arranged symmetrically, and the first sub-connection component 115a and the second sub-connection component 115b can have a similar "hoe" shape. The head of the "hoe" shape can be arranged with the anode conductive rod 111, and the handle of the "hoe" shape can be used to connect the driving component 114. When the driving component 114 performs a clamping action, the first sub-connection component 115a and the second sub-connection component 115b will move towards each other to make the anode conductive rods 111 on the first sub-connection component 115a and the second sub-connection component 115b in a state of clamping the product 2 to be tested. Figure 6

[0066] ​In some embodiments, the second connecting component 115 has long round holes 1151 (also referred to as "waist-shaped holes"), and the second connecting component 115 is arranged on the driving component 114 through the long round holes 1151. Specifically, the second connecting component 115 can include a first sub-connecting component 115a and a second sub-connecting component 115b, the first sub-connecting component 115a and the second sub-connecting component 115b are similar in shape and symmetrically arranged, and the first sub-connecting component 115a and the second sub-connecting component 115b can be similar to a "hoe" shaped structure, the handle of the "hoe" shaped structure has a plurality of long round holes 1151, and the first sub-connecting component 115a and the second sub-connecting component 115b can be connected with the driving component 114 through the long round holes 1151 and a fixing member (such as a nut). In this case, when the second connecting component 115 is arranged on the driving component 114 through the long round holes 1151, because the long round holes 1151 have adjustable long sides, when the driving component 114 performs a clamping action to drive the first sub-connecting component 115a and the second sub-connecting component 115b to move towards each other so that the anode conductive rods 111 on the first sub-connecting component 115a and the second sub-connecting component 115b are in a state of clamping the product 2 to be tested, the clamping degree between the first sub-connecting component 115a and the second sub-connecting component 115b can be adjusted by adjusting the fixed positions of the driving component 114 and the first sub-connecting component 115a or the second sub-connecting component 115b in the long round holes 1151, so as to reduce the situation that the product 2 to be tested is damaged due to excessive clamping, for example, by adjusting the fixed positions of the driving component 114 and the first sub-connecting component 115a or the second sub-connecting component 115b in the long round holes 1151, and making the compression amount of the conductive component 1111 on the anode conductive rod 111 exactly one half.

[0067] The number of long round holes 1151 of the first sub-connecting component 115a or the second sub-connecting component 115b can not be limited, for example, the long round holes 1151 can be one or two.

[0068] Figure 7 is a structural schematic diagram of another embodiment of the electrical testing device 1 of the present application. Figure 8 is a structural schematic diagram of another embodiment of the electrical testing device 1 of the present application. Figure 7 is a structural schematic diagram of another embodiment of the electrical testing device 1 of the present application.

[0069] In some embodiments, please refer to Figure 7 or Figure 8As shown, the electrical testing device 1 can further include a first lifting mechanism 13 for setting the clamping mechanism 11 and for lifting and lowering the clamping mechanism 11. The controller 12 of the present embodiment can be further configured to control the first lifting mechanism 13 to lower the clamping mechanism 11 to the testing station. In this case, when the product 2 to be tested is located at the testing station, the controller 12 can control the first lifting mechanism 13 to lower the clamping mechanism 11 to the testing station and control the clamping mechanism 11 to clamp and apply electrical energy to the product 2 to be tested, and after the electrical testing of clamping and applying electrical energy is completed, the controller 12 can control the first lifting mechanism 13 to reset the clamping mechanism 11, thereby facilitating the product 2 to be tested to be placed at or removed from the testing station, and improving the automation level of the electrical testing device 1.

[0070] In some embodiments, the first connecting component 113 can be arranged on the first lifting mechanism 13 and configured to connect the driving component 114 with the first lifting mechanism 13.

[0071] In some embodiments, as shown in Figure 7 or Figure 8 As shown, the electrical testing device 1 can further include a bearing mechanism 14 for bearing the product 2 to be tested. The controller 12 of the present embodiment can be further configured to control the bearing mechanism 14 to move the product 2 to be tested to the testing station. In this case, the controller 12 controls the bearing mechanism 14 to move the product 2 to be tested to the testing station or remove the product 2 to be tested from the testing station, reducing manual operation and further improving the automation level of the electrical testing device 1. When the product 2 to be tested is located at the testing station, the anode conductive rod 111, the cathode conductive rod 112 and the bearing mechanism 14 can more comprehensively clamp and stabilize the product 2 to be tested, so as to facilitate testing.

[0072] In some embodiments, as shown in Figure 8 As shown, the bearing mechanism 14 can include an upper cover 141 and a lower cover 142, which can cooperate to stabilize the product 2 to be tested. The upper cover 141 can have a positioning hole, and the lower cover 142 can have a positioning column adapted to the positioning hole of the upper cover 141. In this way, the stability of the product 2 to be tested placed on the bearing mechanism 14 can be improved.

[0073] In some embodiments, the electrical testing device 1 can further include a second lifting mechanism (not shown in the figure), which is connected with the bearing mechanism 14 and configured to lift and lower the bearing mechanism 14. The controller 12 of the present embodiment can be further configured to control the second lifting mechanism to lift the bearing mechanism 14 to move the product 2 to be tested to the testing station. In this case, manual operation can be reduced, and the automation level of the electrical testing device 1 can be further improved.

[0074] In some embodiments, the electrical testing device 1 can further comprise a conveying mechanism (not shown in the figure) connected with the carrier mechanism 14 and used to move the carrier mechanism 14 in translation. The controller 12 of the embodiments of the present application can be further used to control the conveying mechanism to move the carrier mechanism 14 in translation to move the product 2 to be tested to the testing station. In this case, the electrical testing device 1 can automatically move the product 2 to be tested to the testing station or remove the product 2 to be tested from the testing station, and form a pipeline operation through the conveying mechanism, thereby further reducing manual operation and further improving the automation degree of the electrical testing device 1.

[0075] In some embodiments, as shown in Figure 7 or Figure 8 In some embodiments, the electrical testing device 1 can further comprise at least one sensor 15 arranged on the clamping mechanism 11 and / or the carrier mechanism 14, and the sensor 15 is used to detect whether the product 2 to be tested is located at the testing station. In this way, the intelligent degree of the electrical testing device 1 can be improved.

[0076] In some embodiments, the electrical testing device 1 can further comprise a human-computer interaction interface, such as a display, which is electrically connected with the controller 12. In this way, the test data of the product 2 to be tested can be visualized through the human-computer interaction interface, which is convenient for the tester to operate.

[0077] In summary, in the present application, when the product 2 to be tested is located at the testing station, the clamping mechanism 11 forms a clamping jaw by using the plurality of anode conductive rods 111 distributed on the side of the product 2 to be tested and the at least one conductive rod located on the upper part of the product 2 to be tested, so as to clamp the product 2 to be tested and perform multi-point electrical testing. In this way, the problem of test data error and low test efficiency caused by probe tilt, loss or not installed in place of the traditional single-point testing device can be reduced. In addition, the electrical testing device 1 of the embodiments of the present application has a more comprehensive and accurate test effect compared with the prior art. In addition, in the present application, the probe (i.e. the anode conductive rod 111 and the cathode conductive rod 112) and the product 2 to be tested are in flexible contact during testing, which can reduce the wear of the product 2 to be tested and improve the quality of the product 2 to be tested. In addition, the present application can improve the automation degree of the electrical testing device 1 by canceling manual feeding and manual inspection, thereby improving the test efficiency.

[0078] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application but not limit the present application. Although the present application has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solutions of the present application can be modified or replaced equivalently without departing from the spirit and scope of the technical solutions of the present application.

Claims

1. An electrical testing device, comprising: The electric property testing device comprises a clamping mechanism and a controller; the clamping mechanism comprises a plurality of anode conductive rods and at least one cathode conductive rod, the plurality of anode conductive rods are arranged on the clamping mechanism in a manner of being distributed on the side of a product to be tested, the at least one cathode conductive rod is arranged on the clamping mechanism in a manner of being located on the upper part of the product to be tested, and the at least one cathode conductive rod is in contact with the product to be tested when the clamping mechanism is located at a test station; the controller is electrically connected with the clamping mechanism, and is used for: controlling the clamping mechanism to perform a clamping action to make the plurality of anode conductive rods contact the product to be tested, and controlling the plurality of anode conductive rods to apply electric energy to the product to be tested, and acquiring an electric property parameter of the product to be tested through the at least one cathode conductive rod when the clamping mechanism is located at the test station. An end of the plurality of anode conductive rods in contact with the product to be tested is provided with an elastic conductive part.

2. The electrical testing device of claim 1, wherein, The plurality of anode conductive rods and / or the at least one cathode conductive rod are provided with an elastic buffer part.

3. The electrical testing device of claim 1, wherein, The electric property testing device further comprises a first lifting mechanism, the first lifting mechanism is used for arranging the clamping mechanism and making the clamping mechanism lift; and the controller is further used for: controlling the first lifting mechanism to lower the clamping mechanism to the test station.

4. The electrical testing device of claim 1, wherein, The clamping mechanism comprises a driving part, a first connecting part and a second connecting part, the first connecting part is arranged on the first lifting mechanism and is used for connecting the driving part with the first lifting mechanism, the at least one cathode conductive rod is arranged on the first connecting part, the second connecting part is arranged on the driving part and is used for connecting the driving part with the plurality of anode conductive rods, and the driving part is used for performing the clamping action and driving the second connecting part to make the plurality of anode conductive rods contact the product to be tested.

5. The electrical testing device of claim 4, wherein, The second connecting part has an oblong hole, and the second connecting part is arranged on the driving part through the oblong hole.

6. The electrical testing device of claim 5, wherein, The electric property testing device further comprises a bearing mechanism, the bearing mechanism is used for bearing the product to be tested; and the controller is further used for: controlling the bearing mechanism to move the product to be tested to the test station.

7. The electrical testing device of claim 1, wherein, The electric property testing device further comprises a second lifting mechanism, the second lifting mechanism is connected with the bearing mechanism and is used for making the bearing mechanism lift; and the controller is further used for: controlling the second lifting mechanism to make the bearing mechanism lift to move the product to be tested to the test station.

8. The electrical testing device of claim 7, wherein, The electric property testing device further comprises a conveying mechanism, the conveying mechanism is connected with the bearing mechanism and is used for making the bearing mechanism translate; and the controller is further used for: controlling the conveying mechanism to make the bearing mechanism translate to move the product to be tested to the test station.

9. The electrical testing device of claim 7, wherein, The electric property testing device further comprises at least one sensor, the sensor is arranged on the clamping mechanism and / or the bearing mechanism, and the sensor is used for detecting whether the product to be tested is located at the test station.

10. The electrical testing device of claim 7, wherein, ​

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