Board card supporting platform and board card testing device
The multi-level adjustable board support platform solves the problem of the inability to adjust the height of the board test platform, achieving precise alignment and reliable connection between the board and the CPU motherboard, thus improving the test results.
Patent Information
- Application Number
- CN202520280289.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-20
- Publication Date
- 2025-12-26
- Estimated Expiration
- 2035-02-20
AI Technical Summary
The existing board testing platform cannot adjust the height, resulting in misaligned connections between the boards and the CPU motherboard, poor reliability, and poor versatility.
A board support platform is provided, including a base, a first support frame, and a second support frame. The position of the board can be adjusted vertically through multi-level adjustment to ensure effective connection with the CPU motherboard.
It effectively reduces the adverse effects caused by manufacturing errors and component mismatch errors, and improves the connection effect and versatility between the board and the CPU motherboard.
Smart Images

Figure CN223727885U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present disclosure relates to the technical field of board card testing equipment, in particular, to a board card supporting platform and a board card testing device. BACKGROUND
[0002] With the development of integrated circuit boards, their functions are increasingly complex, and their performance directly affects the overall performance of the computer. Therefore, strict performance testing is required during production to ensure product quality. Under normal circumstances, the test board card (such as a graphics card) is placed horizontally and connected to the CPU (Central Processing Unit) mainboard through the PCIE (Peripheral Component Interconnect Express) connector. The test board card will have a dedicated test platform support. If the test board card is placed unevenly, it will often cause the test board card to tip over, and even damage the PCIE connector.
[0003] In related technologies, a board card testing platform is usually used to support the board card to be tested, but it is only suitable for testing a single board card, cannot adjust the height of the testing platform or is difficult to operate, and has poor versatility. UTILITY MODEL CONTENT
[0004] The purpose of the present disclosure is to provide a board card supporting platform and a board card testing device, which can realize multi-stage adjustment of the board card to be tested in the vertical direction and improve the connection effect of the board card to be tested and the CPU mainboard.
[0005] In order to achieve the above-mentioned purpose, according to the first aspect of the present disclosure, a board card supporting platform is provided, comprising:
[0006] a base;
[0007] a first supporting frame connected to the base in a position adjustable manner along a vertical direction; and
[0008] a second supporting frame for supporting the board card to be tested and connected to the first supporting frame in a position adjustable manner along the vertical direction.
[0009] Optionally, the adjustment distance of the first supporting frame relative to the base is greater than the adjustment distance of the second supporting frame relative to the first supporting frame.
[0010] Optionally, the first supporting frame comprises two first supporting plates arranged at intervals along a first direction, and an intermediate supporting plate connected to the two first supporting plates respectively.
[0011] The two first supporting plates are connected to the base in a position adjustable manner respectively.
[0012] Optionally, the first support plate is formed with a first mounting portion;
[0013] The base is formed with a plurality of second mounting portions corresponding to the first mounting portion and arranged in the vertical direction.
[0014] The first mounting portion is connected with the plurality of second mounting portions to adjust the height of the first support frame.
[0015] Optionally, the first mounting portion comprises at least two first mounting holes arranged in the second direction on the first support plate.
[0016] The second mounting portion comprises a plurality of first adjusting holes arranged in the vertical direction on the base and capable of corresponding cooperation with the first mounting hole.
[0017] Optionally, the first mounting hole is a plurality of holes, and two first mounting holes arranged in the vertical direction form a mounting group.
[0018] The mounting group is arranged in the second direction.
[0019] The first adjusting hole is a plurality of holes, and two first adjusting holes arranged in the vertical direction form a cooperation group capable of cooperating with the mounting group.
[0020] The cooperation group is arranged in the second direction, and the positions in the vertical direction are different.
[0021] Optionally, the first support plate is formed with a handle portion.
[0022] Optionally, the second support frame comprises a second support plate, and the second support plate is movably connected to the intermediate support plate through an adjusting assembly, so that the second support plate can move relative to the intermediate support plate in the vertical direction.
[0023] Optionally, the adjusting assembly comprises a screw and two nuts.
[0024] One end of the screw is fixedly connected to the second support plate, the intermediate support plate is provided with an adjusting hole, the screw passes through the adjusting hole, and the two nuts are connected to the screw, one of the nuts is located on the side of the intermediate support plate away from the second support plate and abuts against the intermediate support plate, and the other nut is located on the side of the intermediate support plate close to the second support plate and abuts against the intermediate support plate.
[0025] Optionally, the second support plate and the first support plate are further provided with a guide structure for guiding the movement of the second support plate.
[0026] Optionally, the guide structure includes one of the guide groove and the guide protrusion disposed in the second support plate, and the other of the guide groove and the guide protrusion disposed in the first support plate.
[0027] Optionally, the second support frame includes fixing holes and / or positioning parts.
[0028] Optionally, the second support frame also forms a fan clearance section.
[0029] According to a second aspect of this disclosure, a board testing apparatus is also provided, including a CPU unit, a heat sink, and the aforementioned board support platform.
[0030] Optionally, the CPU unit includes a CPU mounting bracket and a CPU motherboard disposed on the CPU mounting bracket; and / or
[0031] The heat dissipation component includes a heat sink for mounting on one side of the board under test and for dissipating heat from the board under test; and / or
[0032] The heat sink includes a heat sink backplate disposed on the other side of the board under test and used for heat dissipation of the board under test; and / or
[0033] The heat sink also includes a cooling fan that is positioned on the other side of the board to be tested and is used to dissipate heat from the board to be tested.
[0034] The above-described technical solution, namely the board support platform disclosed herein, includes a base, a first support frame, and a second support frame. The first support frame is adjustablely connected to the base, and the second support frame is adjustablely connected to the first support frame. The second support frame is used to support the board to be tested, thereby enabling multi-level adjustment of the board to be tested in the vertical direction. This can effectively reduce the adverse effects caused by manufacturing errors of the support platform and mismatch errors between the support platform and the board to be tested, and improve the connection effect between the board to be tested and the CPU motherboard.
[0035] Other features and advantages of this disclosure will be described in detail in the following detailed description section. Attached Figure Description
[0036] The accompanying drawings are provided to further illustrate the present disclosure and form part of the specification. They are used together with the following detailed description to explain the present disclosure, but do not constitute a limitation thereof. In the drawings:
[0037] Figure 1 This is a structural diagram of the board support platform provided in some embodiments of this disclosure;
[0038] Figure 2is a structural diagram of a first support plate of a board card support platform provided by some embodiments of the present disclosure;
[0039] Figure 3 is a structural diagram of a first support plate of a board card support platform provided by some embodiments of the present disclosure;
[0040] Figure 4 is a structural diagram of a base of a board card support platform provided by some embodiments of the present disclosure;
[0041] Figure 5 is a structural diagram of another perspective of a board card support platform provided by some embodiments of the present disclosure;
[0042] Figure 6 is a structural diagram of a board card test device provided by some embodiments of the present disclosure;
[0043] Figure 7 is an exploded view of a board card test device provided by some embodiments of the present disclosure;
[0044] Figure 8 is an exploded view of a board card test device provided by some embodiments of the present disclosure;
[0045] Figure 9 is a working mode structural diagram of a board card test device provided by embodiment one of the present disclosure;
[0046] Figure 10 is a working mode structural diagram of a board card test device provided by embodiment two of the present disclosure;
[0047] Figure 11 is a working mode structural diagram of a board card test device provided by embodiment three of the present disclosure;
[0048] Figure 12 is a working mode structural diagram of a board card test device provided by embodiment four of the present disclosure.
[0049] Explanation of reference signs
[0050] 100 - board card support platform; 110 - base; 1101 - first adjusting hole; 111 - bottom plate; 112 - vertical plate; 120 - first support frame; 121 - first support plate; 1211 - first mounting hole; 1212 - guide groove; 1213 - handle part; 122 - intermediate support plate; 130 - second support frame; 131 - second support plate; 1311 - guide protrusion; 1312 - fixing hole; 1313 - positioning part; 1314 - fan avoiding part; 141 - screw; 142 - nut; 150 - locking piece;
[0051] 200 - CPU unit; 210 - CPU mounting bracket; 220 - CPU mainboard; 310 - heat sink; 320 - heat sink backboard; 330 - heat sink fan; 400 - board card. DETAILED DESCRIPTION
[0052] The specific embodiments of the present disclosure are described in detail below with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are intended to explain and illustrate the present disclosure, and are not intended to limit the present disclosure.
[0053] In the present disclosure, the orientation words such as "inner, outer" refer to the inner and outer of the outline of the corresponding components, and "far, near" refer to the corresponding structure or the corresponding component away from or close to another structure or component. X in the drawings represents the first direction; Y represents the second direction; Z represents the vertical direction. In addition, the terms "first", "second" and the like used in the present disclosure are used to distinguish one element from another element, and do not have sequential and important meanings. In addition, in the following description, the same reference numerals in different drawings represent the same or similar elements unless otherwise explained. The above definitions are only used to explain and illustrate the present disclosure, and should not be understood as a limitation of the present disclosure.
[0054] In the related art, a board card test platform is usually used to support the board card to be tested. On the one hand, due to the adverse effects of manufacturing errors of the test platform, assembly matching errors of the test platform and the board card to be tested, and the like, in the actual use process, the board card to be tested cannot be aligned and reliably connected with the CPU mainboard. On the other hand, the test platform is usually used to test a single board card, and it is difficult to adjust the height of the test platform or the operation, and the universality is poor.
[0055] The purpose of the present disclosure is to provide a board card support platform 100 and a board card test device, which can realize multi-stage adjustment of the board card to be tested 400 in the vertical direction Z, can effectively reduce the adverse effects caused by the manufacturing errors of the support platform, the assembly matching errors of the support platform and the board card to be tested 400, and the like, and improve the connection effect of the board card to be tested 400 and the CPU mainboard 220.
[0056] In order to achieve the above purpose, as shown in the accompanying drawings, Figures 1 to 12As shown, according to the first aspect of the present disclosure, a board card supporting platform 100 is provided for supporting a board card 400 to be tested, such as a display card. Wherein, the board card 400 to be tested is usually placed horizontally and connected to a CPU mainboard 220 fixed on a CPU mounting bracket 210 through a PCIE connector, and the board card supporting platform 100 can support the board card 400 to be tested in the vertical direction Z to avoid uneven force or tilting of the board card 400 to be tested. The board card supporting platform 100 comprises a base 110, a first supporting frame 120 and a second supporting frame 130. Wherein, the first supporting frame 120 is adjustably connected to the base 110 in the vertical direction Z; the second supporting frame 130 is used for supporting the board card 400 to be tested and is adjustably connected to the first supporting frame 120 in the vertical direction Z.
[0057] Through the above technical solution, i.e. the board card supporting platform 100 of the present disclosure, comprising a base 110, a first supporting frame 120 and a second supporting frame 130, wherein the first supporting frame 120 is adjustably connected to the base 110, and the second supporting frame 130 is adjustably connected to the first supporting frame 120, and the second supporting frame 130 is used for supporting the board card 400 to be tested, so as to realize multi-stage adjustment of the board card 400 to be tested in the vertical direction Z, which can effectively reduce the adverse effects caused by manufacturing errors of the supporting platform, assembly errors of the supporting platform and the board card 400 to be tested, etc., improve the connection effect of the board card 400 to be tested and the CPU mainboard 220, and has better versatility.
[0058] It should be noted that the board card supporting platform 100 of the present disclosure can realize two-stage adjustment through the position adjustment of the first supporting frame 120 relative to the base 110 in the vertical direction Z, and the adjustment of the second supporting frame 130 relative to the first supporting frame 120 in the vertical direction Z, which improves the adjustment accuracy of the board card 400 to be tested supported on the second supporting frame 130, and is used to compensate for the manufacturing errors of the board card supporting platform 100 or the assembly errors between components, so as to better connect to the CPU mainboard 220. It can be understood that in addition to the above first supporting frame 120 and second supporting frame 130, other supporting frames that can adjust the position in the vertical direction Z relative to the two can be arranged between the base 110 and the first supporting frame 120, and the first supporting frame 120 and the second supporting frame 130, to realize more stages of adjustment of the board card supporting platform 100. The specific number can be designed according to actual needs, which will not be described here.
[0059] In some embodiments, the adjustment distance of the first support frame 120 relative to the base 110 is greater than the adjustment distance of the second support frame 130 relative to the first support frame 120. In this way, the first support frame 120 is adjusted in the vertical direction Z relative to the base 110 to enable the first support frame 120 to achieve coarse adjustment of the entire board card support platform 100 in the vertical direction Z, and the second support frame 130 is adjusted in the vertical direction Z relative to the first support frame 120 to enable the second support frame 130 to achieve fine adjustment of the entire board card support platform 100 in the vertical direction Z. Through the two position adjustments, both adjustment efficiency and adjustment accuracy are satisfied.
[0060] The first support frame 120 and the second support frame 130 can be constructed in any suitable structure, such as Figure 1 As shown in the drawings, in some embodiments of the present disclosure, the first support frame 120 includes two first support plates 121 spaced apart along the first direction X, and an intermediate support plate 122 connected to the two first support plates 121, respectively. The two first support plates 121 are respectively connected to the base 110 in a position-adjustable manner.
[0061] The base 110 can also be constructed in any suitable structure, and in some embodiments, the base 110 can include a bottom plate 111 and two vertical plates 112 connected to the bottom plate 111, respectively, and the two vertical plates 112 are spaced apart along the first direction X. The two first support plates 121 are respectively connected to the two vertical plates 112 in a position-adjustable manner, thereby achieving the position adjustment of the first support frame 120 relative to the base 110 in the vertical direction Z.
[0062] The position adjustment mode between the first support plate 121 and the base 110 can be any suitable mode, such as Figures 2 to 4 As shown in the drawings, in some embodiments, the first support plate 121 is formed with a first mounting portion; the base 110 is formed with a plurality of second mounting portions capable of corresponding to the first mounting portion and spaced apart in the vertical direction Z; the first mounting portion is connected by cooperating with different second mounting portions in the plurality of second mounting portions to adjust the height of the first support frame 120.
[0063] The first mounting part can be a mounting hole, slot, or buckle provided in the first support plate 121. The second mounting part can be multiple mounting holes, buckles, or slots provided in the vertical plate 112 of the base 110. For example, when the first mounting part is a slot, the second mounting part can be multiple buckles arranged at intervals. By installing the buckles in different buckles, the height of the first support frame 120 in the vertical direction Z can be adjusted.
[0064] The first and second mounting sections can be constructed using any suitable structure, such as... Figure 2 , Figure 3 and Figure 4 As shown, in some optional embodiments, the first mounting portion includes at least two first mounting holes 1211 spaced apart along the second direction Y on the first support plate 121; the second mounting portion includes a plurality of first adjustment holes 1101 spaced apart along the vertical direction Z on the base 110 and capable of correspondingly engaging with the first mounting holes 1211. The first mounting portion may include at least two first mounting holes 1211, and the second mounting portion may include a plurality of first adjustment holes 1101. The plurality of first adjustment holes 1101 are spaced apart in the vertical direction Z, and by engaging with the first mounting holes 1211 at different first adjustment holes 1101, the position of the first support frame 120 relative to the base 110 in the vertical direction Z can be adjusted to meet the requirements of the test board 400 with different height requirements.
[0065] Understandably, the first support frame 120 (first support plate 121) can be connected to the base 110 (vertical plate 112 of base 110) by sequentially passing the locking element 150 (e.g., screw or bolt assembly) through the first mounting hole 1211 and the first adjustment hole 1101. The first mounting hole 1211 and the first adjustment hole 1101 can be through holes, or one of them can be set as a screw hole.
[0066] It should be noted that there may be multiple first mounting holes 1211 and first adjustment holes 1101, and at least some of the first mounting holes 1211 may correspond to at least some of the first adjustment holes 1101 at different positions in the vertical direction Z, and be connected and fixed by locking member 150, thereby realizing the height adjustment of the first support frame 120 and the base 110.
[0067] In some embodiments, the base 110 and the first support frame 120 may be made of wood, such as bakelite. Therefore, a metal anti-wear layer may be provided in the first mounting hole 1211 and the first adjustment hole 1101. For example, riveting may be used to arrange rivets with through holes in the first mounting hole 1211 and the first adjustment hole 1101 to improve the strength of the first mounting hole 1211 and the first adjustment hole 1101 and avoid damage to the hole structure during disassembly and assembly.
[0068] The first mounting holes 1211 are multiple, and two first mounting holes 1211 spaced apart in the vertical direction Z form an installation group; the installation groups are arranged in multiple in the second direction Y; the first adjustment holes 1101 are multiple, and two first adjustment holes 1101 spaced apart in the vertical direction Z form a matching group capable of being matched and connected with the installation group; the matching groups are arranged in multiple in the second direction Y and are different in position in the vertical direction Z. As shown in Figure 2 and Figure 3 In some embodiments, each first support plate 121 can be provided with two rows of first mounting holes 1211 spaced apart in the vertical direction Z near the base 110, and two first mounting holes 1211 corresponding in the vertical direction Z form an installation group; wherein a part of the installation groups are located on one side of the first support plate 121 center line in the second direction Y, and another part of the installation groups are located on the other side of the first support plate 121 center line in the second direction Y; at the same time, as shown in Figure 4 The vertical plate 112 of the base 110 is formed with multiple first adjustment holes 1101 arranged in the vertical direction Z, wherein two first adjustment holes 1101 corresponding in the vertical direction Z form a matching group, a part of the matching groups are located on one side of the vertical plate 112 center line in the second direction Y for matched and connected with the corresponding installation group, and another part of the matching groups are located on the other side of the vertical plate 112 center line in the second direction Y for matched and connected with the corresponding installation group.
[0069] Specifically, as shown in Figure 2 and Figure 4As shown, eight mounting groups are formed on the first support plate 121, four of which are located on the left side and arranged in sequence from the left edge to the center line direction, and four of which are located on the right side and arranged in sequence from the right edge to the center line direction; and eight matching groups are formed on the vertical plate 112 of the base 110, four of which are located on the left side and arranged in sequence from the left edge to the center line direction and gradually to the direction of the second support frame 130 in the vertical direction Z, and four of which are located on the right side and arranged in sequence from the right edge to the center line direction and also gradually to the direction of the second support frame 130 in the vertical direction Z. The outermost two mounting groups on the first support plate 121 can be connected to the outermost two matching groups on the vertical plate 112 to achieve support at the lowest height position; the two mounting groups (second mounting groups on the left and right sides) close to the outside on the first support plate 121 can be connected to the two matching groups (second matching groups on the left and right sides) close to the outside on the vertical plate 112 of the base 110 to achieve support at the second height position; the two mounting groups (third mounting groups on the left and right sides) close to the inside on the first support plate 121 can be connected to the two matching groups (third matching groups on the left and right sides) close to the inside on the vertical plate 112 of the base 110 to achieve support at the third height position; and the innermost two mounting groups (fourth mounting groups on the left and right sides) on the first support plate 121 can be connected to the innermost two matching groups (fourth matching groups on the left and right sides) on the vertical plate 112 of the base 110 to achieve support at the highest height position.
[0070] It should be noted that while the first support plate 121 on one side is adjusted to correspond to the position of the vertical plate 112, the position of the first support plate 121 on the other side is also adjusted to correspond.
[0071] In order to facilitate movement and adjustment of the first support frame 120, as shown in Figure 2 and Figure 3 As shown, in some embodiments, a handle portion 1213 is formed on the first support plate 121. Among them, one handle portion 1213 is formed on each of the two upper first support plates 121, wherein the handle portion 1213 can be constructed in any suitable structure, for example, the handle portion 1213 can be a waist-shaped hole formed at the upper position of the first support plate 121, and the user can move the entire board card support platform 100 by inserting his hand into the waist-shaped hole, or can adjust the first support plate 121 upward or downward by inserting his hand into the waist-shaped hole. In addition, the handle portion 1213 can also be a handle mounted on the first support plate 121, which can also achieve the above-mentioned movement or adjustment function.
[0072] In some embodiments, the second support frame 130 comprises a second support plate 131, which is movably connected to the middle support plate 122 through an adjusting assembly, so that the second support plate 131 can move relative to the middle support plate 122 in the vertical direction Z. The second support plate 131 is used to support the board card 400 to be tested, and a corresponding structure for cooperating with the board card 400 to be tested can be arranged thereon. The adjusting assembly is used to connect the second support plate 131 and the middle support plate 122 of the first support frame 120, so as to realize distance adjustment between the second support plate 131 and the middle support plate 122, i.e. distance adjustment in the vertical direction Z.
[0073] The adjusting assembly can be constructed in any suitable structure, such as Figure 5 As shown in some embodiments, the adjusting assembly comprises a screw 141 and two nuts 142; one end of the screw 141 is fixedly connected to the second support plate 131, the middle support plate 122 is provided with an adjusting hole (not shown in the figure), the screw 141 is arranged in the adjusting hole, and the two nuts 142 are connected to the screw 141, one nut 142 is located on the side of the middle support plate 122 away from the second support plate 131 and abuts against the middle support plate 122, and the other nut 142 is located on the side of the middle support plate 122 close to the second support plate 131 and abuts against the middle support plate 122.
[0074] The screw 141 can pass through the second support plate 131 through the through hole arranged on the second support plate 131, and the screw 141 is fixedly connected with the second support plate 131 through the nut 142 arranged on the other side. Of course, the screw 141 can also be fixedly connected with the second support plate 131 in other ways. The adjusting hole for the screw 141 to pass through is formed on the middle support plate 122, and one nut 142 connected with the screw 141 is arranged on each side of the middle support plate 122, and the two nuts 142 respectively abut against the middle support plate 122, so as to realize position fixing after position adjustment of the second support plate 131. When the position needs to be adjusted, the two nuts 142 can be turned, then the extension length of the screw 141 is changed, and after the adjustment is completed, the two nuts 142 are locked.
[0075] In the above embodiments, the second support plate 131 can be slightly lifted through the up and down adjustment of the two nuts 142, and the cooperation of the two nuts 142 can also realize self-locking of the second support plate 131, so as to avoid the up and down shaking of the second support plate 131 during the test.
[0076] It should be noted that a plurality of adjusting assemblies can be arranged between the second support plate 131 and the middle support plate 122, and the overall movement of the second support plate 131 relative to the middle support plate 122 can be realized by adjusting the plurality of adjusting assemblies respectively.
[0077] To stabilize the position adjustment between the second support plate 131 and the intermediate support plate 122, in some embodiments, the joint between the second support plate 131 and the first support plate 121 is further provided with a guide structure for guiding the movement of the second support plate 131. By providing the guide structure between the second support plate 131 and the first support plate 121, the smooth movement of the second support plate 131 in the vertical direction Z can be ensured when adjusting the movement of the second support plate 131.
[0078] It should be noted that the guide structure can be constructed in any suitable structure, for example, as shown in Figure 1 and Figure 2 In some embodiments, the guide structure can include one of the guide groove 1212 and the guide protrusion 1311 provided on the second support plate 131, and the other one of the guide groove 1212 and the guide protrusion 1311 provided on the first support plate 121. The guide structure can include the specific forms of the guide groove 1212 and the guide protrusion 1311. For example, the second support plate 131 can be provided with the guide protrusion 1311, and the first support plate 121 of the first support frame 120 can be provided with the guide groove 1212 matched with the guide protrusion 1311. When the second support plate 131 moves relative to the first support frame 120 (the intermediate support plate 122), the guide protrusion 1311 and the guide groove 1212 can play a guiding role, improving the movement stability of the second support frame 130.
[0079] In other embodiments, the second support plate 131 can be provided with the guide groove 1212, and the first support plate 121 of the first support frame 120 can be provided with the guide protrusion 1311 matched with the guide groove 1212. When the second support plate 131 moves relative to the first support frame 120 (the intermediate support plate 122), the guide protrusion 1311 and the guide groove 1212 can also play a guiding role, improving the movement stability of the second support frame 130.
[0080] It should be noted that the guide protrusion 1311 and the guide groove 1212 can be multiple and one-to-one correspondence, further improving the guiding effect.
[0081] It can be understood that the above-mentioned guide structure is exemplary, and the guide structure can also adopt the structure form of a sliding rail and a sliding block, or can also adopt the structure form of a guide column and a guide sleeve, which will not be described here.
[0082] In order to fix the board card 400 to be tested or the heat dissipation back plate 320 of the board card 400, as shown in Figure 1As shown, in some embodiments, the second support frame 130 includes a fixing hole 1312 and / or a positioning part 1313. For example, the second support frame 130 may be provided with a fixing hole 1312, which can fix the board 400 to be tested, improving the reliability of its connection with the CPU motherboard 220. The second support frame 130 may also be provided with a positioning part 1313 for positioning the board 400 to be tested before fixing, improving assembly efficiency. It is understood that there can be multiple fixing holes 1312, the number of which can be determined by referring to the number of corresponding structures on the board 400 or the heat sink backplate 320. In addition, the positioning part 1313 may be a stepped blind hole corresponding to the fixing hole 1312, which can cooperate with a small protrusion on the heat sink backplate 320 connected to the board 400 to achieve pre-positioning before fixing.
[0083] The 400 board under test sometimes uses a 330 cooling fan for cooling, such as... Figure 1 As shown, in some embodiments, the second support frame 130 also forms a fan avoidance portion 1314, which can be configured as a notch provided on the second support plate 131 to avoid the cooling fan 330 installed on the back of the board 400 to be tested.
[0084] like Figures 6 to 8 As shown, according to a second aspect of this disclosure, a board testing apparatus is also provided, including a CPU unit 200, a heat sink, and the aforementioned board support platform 100. Therefore, this board testing apparatus also possesses all the advantages of the aforementioned board support platform 100, and can improve the connection reliability between the board 400 and the CPU unit 200.
[0085] like Figure 7 As shown, in some embodiments, the CPU unit 200 includes a CPU mounting bracket 210 and a CPU motherboard 220 disposed on the CPU mounting bracket 210; wherein, the CPU motherboard 220 can be fixed on the CPU mounting bracket 210 in any suitable manner to support the CPU motherboard 220, and the board 400 to be tested is supported by the board support platform 100. The board 400 is connected to the CPU motherboard 220 through PCIe, and the heat sink is used to dissipate heat from the board 400 to simulate the actual working conditions of the board 400.
[0086] Heat sinks can be constructed using any suitable structure, such as Figure 7 As shown, in some embodiments, the heat sink includes a heat sink 310 for being disposed on one side (e.g., the front) of the board 400 to be tested and for heat dissipation of the board 400 to be tested; wherein, the heat sink 310 may be an air-cooled heat sink 310, a water-cooled heat sink 310 or a heat pipe, etc., to meet the heat dissipation requirements of that side of the board 400.
[0087] As shown in Figure 7 and Figure 8 shown, in some embodiments, the heat dissipation member includes a heat dissipation back plate 320 which can also be used to set on the other side (for example, the back) of the board card 400 to be tested and for the heat dissipation of the board card 400 to be tested; the heat dissipation back plate 320 can be arranged on the back of the board card 400, which can be a metal member, for example, an aluminum plate. The heat dissipation back plate 320 can be directly connected to the back of the board card 400 for the heat dissipation requirement of this side, and fixed on the board card support platform 100 through the fixing hole 1312 described above.
[0088] As shown in Figure 7 shown, in some embodiments, the heat dissipation member further includes a heat dissipation fan 330 which can be used to set on the other side (for example, the back) of the board card 400 to be tested and for the heat dissipation of the board card 400 to be tested. The heat dissipation fan 330 can be used for heat dissipation on the other side of the board card 400, which can be connected to the board card 400 to be tested, or connected to the heat dissipation back plate 320.
[0089] The board card support platform 100 and the board card testing device of the present disclosure, which can realize multi-stage adjustment of the height of the board card 400 to be tested, the two first support plates 121 of the first support frame 120 are provided with first mounting holes 1211, and the base 110 is provided with first adjustment holes 1101, and the whole board card support platform 100 can be adjusted in large-scale height position through screw fixing, and the adjustment assembly (screw 141, nut 142 and adjustment hole) of the second support plate 131 and the intermediate support plate 122 can adjust the whole board card support platform 100 in small-scale height position, which can effectively reduce the adverse effects caused by the manufacturing errors of the support platform, the assembly cooperation errors of the support platform and the board card 400 to be tested, thereby improving the connection effect of the board card 400 to be tested and the CPU mainboard 220. And it can also lock the height of the board card support platform 100, which can effectively control the problem of platform shaking during testing. In particular, for the board card 400 to be tested with high power dissipation requirement, the present disclosure can also use forced air cooling and increase the thickness and volume of the metal back plate of the test board card 400 to effectively solve the problem of overheating on the back of the board card 400 to be tested.
[0090] The working modes of the board card testing device of the present disclosure are explained in detail in some specific embodiments as follows.
[0091] Embodiment one
[0092] Reference Figure 9As shown, the board card testing device provided by the present disclosure can realize multi-stage adjustment of the height of the board card 400 to be tested, and can also self-lock the height of the board card support platform 100, so as to effectively control the problem of violent shaking of the platform during the test process. In particular, for the test board card 400 with high power dissipation and heat dissipation requirements, the present disclosure can also effectively solve the problem of overheating on the back of the board card 400 by using forced air cooling.
[0093] To achieve the above-mentioned purpose, the board card testing device provided by the embodiments of the present disclosure can include a CPU mainboard 220, a CPU mounting bracket 210, a board card 400, a heat sink 310, a metal backboard (i.e. a heat dissipation backboard 320), a heat dissipation fan 330, and a board card support platform 100 with multi-stage lifting adjustment, wherein the board card support platform 100 mainly includes a base 110, two first support plates 121, a middle support plate 122, and a second support plate 131.
[0094] Specifically, first, the CPU mainboard 220 is fixed on the CPU mounting bracket 210 by screws, and the distance from the PCIE connector on the CPU mainboard 220 to the CPU side plate end of the mainboard is confirmed to be 160 mm, which is the general standard distance of 160 mm or 180 mm. Then, the silk screen label hole position of 160 mm+Fan on the two first support plates 121 is selected, and a total of eight screws are inserted into the two first support plates 121 to fix the two first support plates 121 on the base 110 by screws. The height of the CPU mainboard 220 connector with the heat dissipation fan 330 is 160 mm, and the board card testing device is as shown in Figure 9 As shown, the test board card 400 with the metal backboard and the heat dissipation fan 330 is placed on the second support plate 131 of the board card support platform 100 with multi-stage lifting adjustment, and the height of the board card support platform 100 is adjusted by adjusting the screw 141 fixed on the second support plate 131 until the PCIE connector on the test board card 400 is consistent with the PCIE connector on the CPU mainboard 220 in height. Then, the screw 141 on the second support plate 131 is locked, and the test board card 400 is inserted into the PCIE connector on the CPU mainboard 220.
[0095] Embodiment Two
[0096] Reference Figure 10As shown, the relevant structure is the same as that of the above-mentioned embodiment one, specifically, first fix the CPU mainboard 220 on the CPU mounting bracket 210 through screws, confirm the distance between the PCIE connector on the CPU mainboard 220 and the CPU side plate end of the mainboard is 180mm, the general standard distance is 160mm or 180mm, then select the position of the silk-screen label hole on the first support plate 121 on both sides as 180mm+Fan, insert a total of eight screws on the first support plate 121 on both sides, fix the first support plate 121 on both sides on the base 110 through the screws, the connector height of the CPU mainboard 220 with the heat dissipation fan 330 is 180mm, and the board card testing device is as shown in Figure 10 As shown, place the to-be-tested board card 400 with the metal back plate and the heat dissipation fan 330 on the second support plate 131 of the multi-stage lifting adjustable board card support platform 100, adjust the height of the to-be-tested board card 400 by adjusting the screw 141 fixed on the second support plate 131 to adjust the height of the to-be-tested board card 400, until the PCIE connector on the test board card 400 is consistent with the PCIE connector on the CPU mainboard 220 in height, lock the screw 141 on the second support plate 131, and then insert the test board card 400 into the PCIE connector on the CPU mainboard 220.
[0097] Embodiment three
[0098] Reference Figure 11 As shown, the relevant structure is the same as that of the above-mentioned embodiment one, specifically, first fix the CPU mainboard 220 on the CPU mounting bracket 210 through screws, confirm the distance between the PCIE connector on the CPU mainboard 220 and the CPU side plate end of the mainboard is 160mm, the general standard distance is 160mm or 180mm, then select the position of the silk-screen label hole on the first support plate 121 on both sides as 160mm+Fanless, insert a total of eight screws on the first support plate 121 on both sides, fix the first support plate 121 on both sides on the base 110 through the screws, the connector height of the CPU mainboard 220 without the heat dissipation fan 330 is 160mm, and the board card testing device is as shown in Figure 11 As shown, place the to-be-tested board card 400 with the metal back plate and the heat dissipation fan 330 on the second support plate 131 of the multi-stage lifting adjustable board card support platform 100, adjust the height of the to-be-tested board card 400 by adjusting the screw 141 fixed on the second support plate 131 to adjust the height of the to-be-tested board card 400, until the PCIE connector on the test board card 400 is consistent with the PCIE connector on the CPU mainboard 220 in height, lock the screw 141 on the second support plate 131, and then insert the test board card 400 into the PCIE connector on the CPU mainboard 220.
[0099] Embodiment four
[0100] ReferenceFigure 12 As shown, the relevant structure is the same as the above-mentioned embodiment, and specifically, the CPU mainboard 220 is first fixed on the CPU mounting bracket 210 through screws, the distance from the PCIE connector on the CPU mainboard 220 to the CPU side plate end of the mainboard is confirmed to be 180 mm, the general standard distance is 160 mm or 180 mm, then the silk-screen label hole position of 180 mm + Fanless on the first support plate 121 on both sides is selected, and a total of eight screws on the first support plate 121 on both sides are inserted to fix the first support plate 121 on both sides on the base 110 through the screws, and the connector height of the CPU mainboard 220 without the cooling fan 330 is 180 mm. The board card testing device is as shown in Figure 12 As shown, the test board card 400 with the metal back plate and the cooling fan 330 is placed on the second support plate 131 of the board card testing device which can be adjusted in multiple stages, the height of the test board card 400 is adjusted through the screws fixed on the second support plate 131, until the PCIE connector on the test board card 400 is consistent with the PCIE connector on the CPU mainboard 220 in height, the screws on the second support plate 131 are locked, and then the test board card 400 is inserted into the PCIE connector on the CPU mainboard 220.
[0101] The preferred embodiments of the present disclosure are described in detail above in combination with the drawings, but the present disclosure is not limited to the specific details in the above-mentioned embodiments, and various simple modifications can be made to the technical solutions of the present disclosure within the technical concept range of the present disclosure, and these simple modifications all belong to the protection range of the present disclosure.
[0102] In addition, it should be noted that each specific technical feature described in the above-mentioned specific embodiments can be combined in any appropriate manner without contradiction, and in order to avoid unnecessary repetition, the present disclosure will not further describe various possible combination manners.
[0103] In addition, various different embodiments of the present disclosure can also be combined in any manner, as long as it does not deviate from the idea of the present disclosure, and it should be considered as the disclosed content of the present disclosure.
Claims
1. A board support platform, characterized by, The base; The first support frame is connected to the base in a position adjustable manner along a vertical direction; And The second support frame is used for supporting a board to be tested and is connected to the first support frame in a position adjustable manner along the vertical direction. The adjustment distance of the first support frame relative to the base is greater than the adjustment distance of the second support frame relative to the first support frame.
2. The board support platform of claim 1, wherein, The first support frame comprises two first support plates arranged in a first direction and an intermediate support plate connected to the two first support plates respectively; 3. The board support platform of claim 1, wherein, The two first support plates are connected to the base in a position adjustable manner respectively. The first support plate is formed with a first mounting portion; 4. The board card support platform of claim 3, wherein, The base is formed with a plurality of second mounting portions arranged in the vertical direction and corresponding to the first mounting portion; The first mounting portion is connected to the plurality of second mounting portions to adjust the height of the first support frame. The first mounting portion comprises at least two first mounting holes arranged in the first support plate in a second direction; 5. The board card support platform of claim 4, wherein, The second mounting portion comprises a plurality of first adjustment holes arranged in the base in the vertical direction and capable of corresponding to the first mounting hole. The first mounting hole is a plurality of holes, and two first mounting holes arranged in the vertical direction form a mounting group; 6. The board support platform of claim 5, wherein, The mounting group is arranged in the second direction and has a plurality of groups; The first adjustment hole is a plurality of holes, and two first adjustment holes arranged in the vertical direction form a corresponding group capable of corresponding to the mounting group; The corresponding group is arranged in the second direction and has different positions in the vertical direction. The first support plate is formed with a handle portion.
7. The board card support platform of claim 3, wherein, The second support frame comprises a second support plate, and the second support plate is movably connected to the intermediate support plate through an adjustment assembly, so that the second support plate can move relative to the intermediate support plate in the vertical direction.
8. The board support platform of any of claims 3-7, wherein, The adjustment assembly comprises a screw and two nuts; 9. The board card support platform of claim 8, wherein, One end of the screw is fixedly connected to the second support plate, the intermediate support plate is provided with an adjustment hole, the screw passes through the adjustment hole, and the two nuts are connected to the screw, one of the nuts is located on the side of the intermediate support plate away from the second support plate and abuts against the intermediate support plate, and the other nut is located on the side of the intermediate support plate close to the second support plate and abuts against the intermediate support plate. The second support plate and the first support plate are further provided with a guide structure for guiding the movement of the second support plate.
10. The board card support platform of claim 9, wherein, The guide structure comprises one of a guide groove and a guide protrusion arranged on the second support plate and the other of a guide groove and a guide protrusion arranged on the first support plate.
11. The board card support platform of claim 10, wherein, The second support frame comprises a fixing hole and / or a positioning portion.
12. The board support platform of claim 1, wherein, The second support frame is further formed with a fan avoiding portion.
13. The board card support platform of claim 12, wherein, The base; 14. A board testing apparatus, characterized by comprising: The CPU unit comprises a CPU mounting bracket and a CPU mainboard arranged on the CPU mounting bracket; and / or 15. The board card test apparatus of claim 14, wherein, The base The heat dissipation member comprises a heat sink arranged on one side of the board card to be tested and used for dissipating heat of the board card to be tested; and / or The heat dissipation member comprises a heat dissipation back plate arranged on the other side of the board card to be tested and used for dissipating heat of the board card to be tested; and / or The heat dissipation member further comprises a heat dissipation fan arranged on the other side of the board card to be tested and used for dissipating heat of the board card to be tested.