Universal testing device

Abstract

The utility model discloses a universal testing device, which comprises a rack, an index plate, a rotary driving piece for driving the index plate to rotate, a plurality of lower testing modules which move up and down on the index plate and bear products, and a feeding and discharging station and at least one testing station which are arranged along the rotating direction of the index plate, a jacking module for driving the test lower module to move up and down is arranged below the test lower module at the test station; an upper test module and a lower pressing module are arranged above the lower test module of the test station, wherein the upper test module and the lower test module are combined to achieve test, and the lower pressing module drives the upper test module to move up and down. And each test station is provided with two mold closing test modes. According to the utility model, each test station has two die assembly test modes, the universality is high, and the test efficiency can be improved.

Description

TECHNICAL FIELD

[0001] The utility model belongs to product testing technical field, especially, relate to a general type testing arrangement. BACKGROUND

[0002] In the production and processing process of electronic products, it is usually necessary to test electronic products to evaluate the performance of electronic products. For example, a test fixture for automatically testing products is disclosed in Chinese patent authorization announcement No. CN218822206U, which comprises a machine table, a test needle plate, a protractor disc arranged on the machine table, and a PCBA carrier plate arranged on the protractor disc in a spaced distribution. The machine table is provided with a lifting mechanism for driving the test needle plate to move up and down. The lifting mechanism is provided with a needle plate mounting plate. In this scheme, the lifting mechanism drives the test needle plate to descend and combine with the PCBA carrier plate after the test, which facilitates the electrical connection test between the test needle plate and the product. This scheme is generally applicable to the PCBA carrier plate connected with some test wiring harness. Moreover, the test wiring harness is not convenient to move up and down. Therefore, the test needle plate and the lifting mechanism for driving the test needle plate to move up and down are arranged above the PCBA carrier plate. However, in actual testing, if some test wiring harness is connected to the test needle plate, the test needle plate is not convenient to move up and down. For this kind of testing method, a test fixture is disclosed in Chinese patent authorization announcement No. CN214750429U. The test wiring harness is fixed to the test upper mold, and the test lower mold is used for testing by ascending and combining with the test upper mold. Therefore, the above two schemes are realized by combining the test upper mold with the lower test lower mold to realize testing, and by combining the test lower mold with the test upper mold to realize testing. If there are two test methods, two test devices need to be prepared for testing, which has low universality, is not conducive to the standardization of equipment, and has high cost.

[0003] Therefore, it is necessary to provide a general type testing arrangement to solve the above technical problems. UTILITY MODEL CONTENTS

[0004] The main purpose of the utility model is to provide a general type testing arrangement, which has two kinds of mold combining test methods on each test station, has high universality, and can improve the test efficiency.

[0005] The utility model discloses a general test device, it includes frame, index plate, the rotation driving part of driving the index plate rotation and the several test lower mould groups of upper and lower activities are on the index plate and bear the product, be provided with the feeding and discharging station and at least one test station along the rotation direction of the index plate, be provided with the jacking mould group of driving the test lower mould group and carry out the up and down motion under the test lower mould group of the test station, be provided with the test upper mould group of with the test lower mould group combination mould realizes the test and the down -pressing mould group of driving the test upper mould group and carry out the up and down motion above the test lower mould group of the test station, every test station has two kinds of combination mould test mode, the first kind of combination mould test mode is the test upper mould group does not move, the jacking mould group drives the test lower mould group and rises with the test upper mould group combination mould and realizes the test, the second kind of combination mould test mode is the test lower mould group does not move, the down -pressing mould group drives the test upper mould group and falls with the test lower mould group combination mould realizes the test.

[0006] Further, the middle of the index plate is provided with a pneumatic slip ring, and the lower edge of the index plate is provided with a plurality of support assemblies, the support assembly comprises a mounting block provided on the frame and a support provided on the mounting block and horizontally extending into the lower surface of the index plate, and the index plate is further provided with wear-resistant sheets for preventing wear of the index plate at the position supported by the support.

[0007] Further, the mounting block is fixed on the frame by screws, one end of the support is installed on the mounting block by a nut, and the other end is provided as a roller, the roller can rotate around a horizontal shaft and can extend into the lower surface of the index plate.

[0008] Further, the several test lower mould groups are equally angularly arranged on the index plate, the test lower mould group comprises a carrier provided on the upper surface of the index plate, a plurality of first guide columns fixed on the carrier at the upper end and movably arranged on the index plate, and a plurality of elastic members for resetting the carrier downward, the lower end of the first guide column is provided with a connecting plate, and the upper end of the elastic member abuts against the lower surface of the index plate and the lower end abuts against the upper surface of the connecting plate.

[0009] Further, a plurality of accommodation grooves are provided on the carrier and are shaped according to the product, an avoidance groove for placing a test probe and a first avoidance opening for passing a test wire harness are provided on the carrier.

[0010] Further, the index plate is provided with a first through hole for the first guide column to move up and down, a first linear bearing is arranged in the first through hole, and the first guide column is movably arranged in the first through hole through the first linear bearing; the elastic member is sleeved on the middle column, the upper end of the middle column is arranged in the index plate, and the lower end is connected to the connecting plate; the index plate is provided with a second through hole for the middle column to move up and down.

[0011] Further, the jacking module comprises a first driving member and a jacking block driven by the first driving member to move up and down.

[0012] Further, the jacking module comprises a first driving member and a jacking block driven by the first driving member to move up and down.

[0013] Further, the jacking module comprises a first driving member and a jacking block driven by the first driving member to move up and down.

[0014] Further, the jacking module comprises a first driving member and a jacking block driven by the first driving member to move up and down.

[0015] Compared with the prior art, the universal testing device has the beneficial effects that:

[0016] (1) Each test station has two mold closing test modes, the first mold closing test mode is that the test upper die set does not move, the jacking module drives the test lower die set to rise and the test upper die set to close and realize testing, the second mold closing test mode is that the test lower die set does not move, the pressing module drives the test upper die set to descend and the test lower die set to close and realize testing, one test station integrates two mold closing test modes, if the test wire harness on the test upper die set cannot move, the first mold closing test mode is selected, if the test wire harness on the test lower die set cannot move, the second mold closing test mode is selected, and appropriate mold closing test mode can be selected according to actual conditions, so that the mold closing test mode is high in universality and good in flexibility.

[0017] (2) The carrier is provided with a plurality of accommodation grooves shaped according to products, the plurality of accommodation grooves are provided in different structures, the plurality of accommodation grooves are provided according to a plurality of different products, the plurality of different products can be tested, the versatility is high, and the flexibility is good; the plurality of accommodation grooves are provided in the same structure, and the plurality of accommodation grooves can also be provided according to the same product, a plurality of products can be tested at the same time, and the testing efficiency is improved;

[0018] (3) When the lower pressing module drives the test upper die to descend and combines with the test lower die, the supporting assembly can support the index plate, the phenomenon that the index plate is subjected to unbalanced circumferential force for a long time is solved, the wear-resistant sheet can avoid the wear of the index plate and affect the rotation precision, therefore, the supporting assembly can ensure the rotation precision of the index plate, and the positioning precision during product testing is improved. BRIEF DESCRIPTION OF DRAWINGS

[0019] Figure 1 It is a three-dimensional structure schematic view of a universal testing device according to an embodiment of the present application;

[0020] Figure 2 It is a three-dimensional structure schematic view of a supporting assembly at the bottom of an index plate according to an embodiment of the present application;

[0021] Figure 3 It is a three-dimensional structure schematic view of a test lower die according to an embodiment of the present application;

[0022] Figure 4 It is a three-dimensional structure schematic view of a test upper die according to an embodiment of the present application;

[0023] Figure 5 It is a three-dimensional structure schematic view of a test upper die according to an embodiment of the present application;

[0024] Figures in the drawing represent:

[0025] 100 - universal testing device;

[0026] 1 - index plate, 11 - pneumatic sliding ring, 12 - supporting assembly, 121 - mounting block, 122 - supporting piece, 1221 - nut, 1222 - roller, 123 - wear-resistant sheet, 124 - screw; 2 - rotation driving piece;

[0027] 3 - test lower die, 31 - carrier, 311 - accommodation groove, 312 - avoiding groove, 313 - first avoiding opening, 314 - positioning hole, 32 - first guide column, 33 - elastic piece, 34 - connecting plate, 35 - first linear bearing, 36 - middle column;

[0028] 4 - feeding and discharging station; 5 - testing station; 6 - jacking module, 61 - first driving piece, 62 - jacking block;

[0029] 7-test upper die set, 71-test plate, 711-positioning pin, 712-second avoiding opening;

[0030] 8-lower pressing die set, 81-second driving member, 82-lifting frame, 821-lifting connecting plate, 822-second guide column, 823-second linear bearing, 83-supporting plate, 84-supporting column; 9-rack. DETAILED DESCRIPTION

[0031] Please refer to Figures 1-5 The embodiment is a universal testing device 100, which comprises a rack 9, an index plate 1, a rotary driving member 2 for driving the rotation of the index plate 1, a plurality of test lower die sets 3 movably arranged on the index plate 1 and carrying products, an upper and lower material loading and unloading station 4 and at least one test station 5 arranged in the rotation direction of the index plate 1, a jacking die set 6 arranged below the test lower die set 3 of the test station 5 for driving the test lower die set 3 to move up and down, a test upper die set 7 arranged above the test lower die set 3 of the test station 5 for combining with the test lower die set 3 to realize testing, and a lower pressing die set 8 for driving the test upper die set 7 to move up and down; each test station 5 has two combined testing modes, the first combined testing mode is that the test upper die set 7 does not move, the jacking die set 6 drives the test lower die set 3 to rise and combine with the test upper die set 7 to realize testing, and the second combined testing mode is that the test lower die set 3 does not move, the lower pressing die set 8 drives the test upper die set 7 to descend and combine with the test lower die set 3 to realize testing.

[0032] The middle of the index plate 1 is also provided with a pneumatic slip ring 11, which rotates with the index plate 1, and the pneumatic slip ring 1 is used for 360° rotation of electric conduction or signal transmission. When the second mold closing test mode is used, the test lower mold set 3 does not move, the lower pressing mold set 8 drives the test upper mold set 7 to descend and close with the test lower mold set 3, and the index plate 1 will be subjected to a great pressure when the lower pressing mold set 8 is pressed downward. When the index plate 1 is subjected to a great pressure for a long time, the phenomenon of circumferential unbalanced force will occur, thereby affecting the rotation accuracy of the index plate 1. In order to ensure the force balance of the index plate 1, a plurality of supporting assemblies 12 are arranged at the lower edge of the index plate 1, the supporting assembly 12 comprises a mounting block 121 arranged on the rack 9 and a supporting piece 122 arranged on the mounting block 121 and horizontally extending into the lower surface of the index plate 1, and the mounting block 121 is fixed on the rack 9 through screws 124. Preferably, the supporting piece 122 is a cam bearing follower, one end of the supporting piece 122 is installed on the mounting block 121 through a nut 1221, and the other end is arranged as a roller 1222, which can rotate around a horizontal shaft and can extend into the lower surface of the index plate 1. When the test lower mold set 3 rotates to the test station 5 on the index plate 1, the test upper mold set 7 is driven by the lower pressing mold set 8 to descend and close with the test lower mold set 3, at this time, the supporting piece 122 supports the lower surface of the index plate 1. In order to prevent the wear of the lower surface of the index plate 1, a wear-resistant piece 123 is arranged at the position supported by the supporting piece 122, which can avoid the wear of the index plate 1 and affect the rotation accuracy, thereby improving the positioning accuracy during product testing.

[0033] A plurality of test lower mold sets 3 are arranged on the index plate 1 at equal angles, and the test lower mold set 3 comprises a carrier 31 arranged on the upper surface of the index plate 1, a plurality of first guide columns 32 fixed on the carrier 31 and movably arranged on the index plate 1, and a plurality of elastic members 33 for resetting the carrier 31 downward. The lower end of the first guide column 32 is provided with a connecting plate 34, and the upper end of the elastic member 33 abuts against the lower surface of the index plate 1, and the lower end abuts against the upper surface of the connecting plate 34. When the test lower mold set 3 is rotated to the test station 5 by the feeding and discharging station 4, the connecting plate 34 is lifted by the jacking mold set 6, so that the carrier 31 is lifted upward, at this time, the elastic member 33 is compressed. After testing, the jacking mold set 6 is reset, and the compressed elastic member 33 is stretched to reset the carrier 31 downward and on the index plate 1.

[0034] The carrier 31 is provided with a plurality of accommodation grooves 311 shaped according to products, the plurality of accommodation grooves 311 are provided in different structures, the plurality of accommodation grooves 311 are provided according to different product shapes, different products can be tested, and the versatility is high; the plurality of accommodation grooves 311 are provided in the same structure, the plurality of accommodation grooves 311 can also be provided according to the same product shape, a plurality of products can be tested at the same time, the efficiency of the test is improved, and the specific mode is determined according to the actual situation, which is not limited here. The carrier 31 is provided with a avoiding groove 312 for placing a test probe and a first avoiding opening 313 for passing a test harness. If the second mold closing test mode is adopted, the lower mold set 3 does not move, the pressing mold set 8 drives the test upper mold set 7 to descend and close with the test lower mold set 3 to realize the test, the test probe needs to be installed into the avoiding groove 312 first, the test harness is connected to the test probe or the carrier 31 from the first avoiding opening 313, the product is placed into the accommodation groove 311, then the test probe or the test harness is connected to the product, the test upper mold set 7 is driven to descend by the pressing mold set 8 and closes with the test lower mold set 3 to realize the test, the test probe and the test harness are connected to the carrier 31 and do not move, which can avoid the test probe and the test harness from moving randomly to affect the test effect, and ensures the service life of the test probe and the test harness.

[0035] The upper end of the first guide column 32 is fixed on the carrier 31 by a screw, and the lower end is fixed on the connecting plate 34 by a screw, the first through hole for the first guide column 32 to move up and down is arranged on the index disc 1, in order to facilitate the stable up and down movement of the first guide column 32, the first linear bearing 35 is arranged in the first through hole, and the first guide column 32 is movably arranged in the first through hole through the first linear bearing 35. The elastic member 33 is a spring, in order to ensure the stability of the up and down movement of the elastic member 33, the elastic member 33 is sleeved on the middle column 36, the upper end of the middle column 36 is arranged on the index disc 1, and the lower end is connected to the connecting plate 34, and the second through hole for the middle column 36 to move up and down is arranged on the index disc 1.

[0036] The jacking mold set 6 includes a first driving member 61 and a jacking block 62 driven by the first driving member 61 to move up and down, and the first driving member 61 is a gas cylinder or a servo motor.

[0037] The pressing mold set 8 includes a second driving member 81 and a lifting frame 82 driven by the second driving member 81 to move up and down, and the second driving member 81 is a gas cylinder or a servo motor.

[0038] The lifting frame 82 comprises a lifting connecting plate 821 and a plurality of second guide columns 822 arranged on the lifting connecting plate 821. In order to ensure the stability of the up-down movement of the second guide columns 822, a second linear bearing 823 is arranged on the outer periphery of the second guide column 822, the second linear bearing 823 is mounted on the support plate 83, and the second guide column 822 is movably arranged on the support plate 83 through the second linear bearing 823, and the support plate 83 is fixed on the upper end of the rack 9 through a plurality of support columns 84.

[0039] The test upper mold set 7 comprises a test plate 71 arranged at the lower end of the second guide column 822, and a plurality of positioning pins 711 are arranged on the lower surface of the test plate 71 and inserted into the carrier 31 to realize mold positioning. Correspondingly, a plurality of positioning holes 314 are arranged on the carrier 31 for the positioning pins 711 to be inserted into. In order to realize more accurate positioning, the test plate 71 and the carrier 31 are both provided with positioning grooves and positioning protrusions that match and are profiled, and the specific structure is set according to the actual situation and is not limited here. A plurality of second avoiding openings 712 are arranged on the test plate 71 to avoid the test probes and the wire harness. If the first mold closing test mode is adopted, the test upper mold set 7 does not move, the jacking mold set 6 drives the test lower mold set 3 to rise and close with the test upper mold set 7 to realize test. The test probes and the test wire harness need to be installed on the test plate 71 through the second avoiding openings 712. After the product is placed into the accommodation groove 311, the jacking mold set 6 drives the test lower mold set 3 to rise and close with the test upper mold set 7 to realize electrical connection and test. The test probes and the test wire harness are connected to the test plate 71 and do not move, which can avoid the test probes and the test wire harness from being moved randomly to affect the test effect and ensure the service life of the test probes and the test wire harness.

[0040] In this embodiment, one feeding and discharging station 4, two test stations 5 are arranged, and the two test stations 5 test different test items respectively. Therefore, three test lower mold sets 3 are arranged correspondingly. The feeding and discharging station 4 is used to complete feeding first. The carrier 31 is rotated and moved to the first test station 5 by the indexing disc 1 to complete the first test, and then is rotated and moved to the second test station to complete the second test. After the second test is completed, the carrier is rotated to the feeding and discharging station 4 to perform discharging operation. In other embodiments, the number of test stations 5 is set according to the actual situation and is not limited here. Since the structure of the present scheme is simple and small, in order to ensure the stability of the up-down movement of the lifting frames 82 on the two stations, the support plates 83 on the two lifting frames 82 are integrated into one, and one support plate 83 can be located above the two test upper mold sets 7 to ensure the stability of the up-down movement of the lifting frames 82.

[0041] Since there are two kinds of mold closing test modes on each test station 5, when two test stations 5 are provided, there are four kinds of mold closing test modes in total, and the mold closing test mode can be selected according to the actual test condition.

[0042] The first kind: the test upper die set 7 on the first test station 5 does not move, the test lower die set 3 is driven to ascend by the jacking set 6 to close the mold with the test upper die set 7 and realize the test; the test upper die set 7 on the second test station 5 does not move, the test lower die set 3 is driven to ascend by the jacking set 6 to close the mold with the test upper die set 7 and realize the test.

[0043] The second kind: the test lower die set 3 on the first test station 5 does not move, the test upper die set 7 is driven to descend by the pressing set 8 to close the mold with the test lower die set 3 and realize the test; the test lower die set 3 on the second test station 5 does not move, the test upper die set 7 is driven to descend by the pressing set 8 to close the mold with the test lower die set 3 and realize the test.

[0044] The third kind: the test upper die set 7 on the first test station 5 does not move, the test lower die set 3 is driven to ascend by the jacking set 6 to close the mold with the test upper die set 7 and realize the test; the test lower die set 3 on the second test station 5 does not move, the test upper die set 7 is driven to descend by the pressing set 8 to close the mold with the test lower die set 3 and realize the test.

[0045] The fourth kind: the test lower die set 3 on the first test station 5 does not move, the test upper die set 7 is driven to descend by the pressing set 8 to close the mold with the test lower die set 3 and realize the test; the test upper die set 7 on the second test station 5 does not move, the test lower die set 3 is driven to ascend by the jacking set 6 to close the mold with the test upper die set 7 and realize the test.

[0046] By analogy, since there are two kinds of mold closing test modes on each test station 5, when n test stations 5 are provided, there are n kinds of mold closing test modes in total, which can improve the versatility of the test device.

[0047] The above only describes some embodiments of the present application. For those skilled in the art, without departing from the creative concept of the present application, a number of modifications and improvements can be made, which are all within the protection scope of the present application.

Claims

1. A general purpose test device, characterized by: It includes a rack, a dividing disc, a rotary drive member for driving the rotation of the dividing disc, and a plurality of test lower die sets movably arranged on the dividing disc and carrying products, an upper and lower material loading station and at least one test station are arranged in the rotation direction of the dividing disc, a lifting die set for driving the test lower die set to move up and down is arranged below the test lower die set of the test station, a test upper die set for combining with the test lower die set to realize testing is arranged above the test lower die set of the test station, and a pressing die set for driving the test upper die set to move up and down is arranged above the test upper die set; there are two kinds of die combination testing modes on each test station, the first die combination testing mode is that the test upper die set does not move, the lifting die set drives the test lower die set to rise and combine with the test upper die set to realize testing, and the second die combination testing mode is that the test lower die set does not move, the pressing die set drives the test upper die set to descend and combine with the test lower die set to realize testing.

2. A universal testing device as claimed in claim 1, characterized in that: A pneumatic sliding ring is arranged in the middle of the dividing disc, and a plurality of support assemblies are arranged on the lower edge of the dividing disc, each support assembly comprising a mounting block arranged on the rack and a support member arranged on the mounting block and horizontally extending into the lower surface of the dividing disc, and the dividing disc is further provided with wear-resistant plates arranged at the position supported by the support member to prevent wear of the dividing disc.

3. A universal testing device as claimed in claim 2, characterized in that: The mounting block is fixed on the rack by screws, one end of the support member is mounted on the mounting block by a nut, and the other end is provided as a roller, which can rotate around a horizontal shaft and extend into the lower surface of the dividing disc.

4. The universal testing device of claim 1, wherein: A plurality of test lower die sets are arranged on the dividing disc at equal angles, each test lower die set comprising a carrier arranged on the upper surface of the dividing disc, a plurality of first guide columns movably arranged on the dividing disc and fixed on the carrier at the upper end, and a plurality of elastic members for resetting the carrier downward, the lower end of the first guide column is provided with a connecting plate, and the upper end of the elastic member abuts against the lower surface of the dividing disc and the lower end abuts against the upper surface of the connecting plate.

5. A universal testing device as claimed in claim 4, characterized in that: A plurality of accommodation grooves are arranged on the carrier to profile the product, and an avoidance groove for placing a test probe and a first avoidance opening for passing a test wire harness are arranged on the carrier.

6. A universal testing device as claimed in claim 5, characterized in that: A first through hole is arranged on the dividing disc for the up-and-down movement of the first guide column, a first linear bearing is arranged in the first through hole, and the first guide column is movably arranged in the first through hole through the first linear bearing; the elastic member is sleeved on an intermediate column, the upper end of the intermediate column is arranged on the dividing disc, and the lower end is connected to the connecting plate, and a second through hole is arranged on the dividing disc for the up-and-down movement of the intermediate column.

7. The universal testing device of claim 1, wherein: The lifting die set comprises a first drive member and a lifting block driven by the first drive member to move up and down.

8. A universal testing device as claimed in claim 4, characterized in that: The pressing die set comprises a second drive member and a lifting frame driven by the second drive member to move up and down.

9. A universal testing device as claimed in claim 8, characterized in that: The lifting frame comprises a lifting connecting plate and a plurality of second guide columns arranged on the lifting connecting plate, a second linear bearing is arranged on the outer periphery of the second guide column, the second linear bearing is mounted on a support plate, the second guide column is movably arranged on the support plate through the second linear bearing, and the support plate is fixed on the upper end of the rack through a plurality of support columns.

10. A universal testing device as claimed in claim 9, characterized in that: The test upper die set comprises a test plate arranged at the lower end of the second guide column, a plurality of positioning pins are arranged on the lower surface of the test plate and inserted into the carrier to achieve mold positioning, a plurality of positioning holes are arranged on the carrier for the positioning pins to be inserted, and a plurality of second avoiding openings are arranged on the test plate to avoid the test probe and wire harness.

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