Honeycomb module testing device

Abstract

The utility model relates to a honeycomb module testing device, which comprises an upper computer, a testing bottom plate and a wireless comprehensive tester, and is characterized in that the testing bottom plate is used for fixing a to-be-tested module, the testing bottom plate comprises at least one testing circuit, and each testing circuit is electrically connected with the to-be-tested module; the upper computer is electrically connected with the test bottom plate and is used for issuing a test instruction to the to-be-tested module through the test bottom plate; the upper computer is also electrically connected with the wireless comprehensive tester, and the wireless comprehensive tester is in communication connection with the to-be-tested module. By adopting the method, the test efficiency of the to-be-tested module can be improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of module testing, in particular to a honeycomb module testing device. BACKGROUND

[0002] After the module product is produced on the production line, a corresponding testing fixture and testing system are needed to inspect the product quality. Since a testing system inspects thousands or even tens of thousands of products, the stability and simplicity and efficiency of the testing system are particularly important.

[0003] In the related art, a host computer is usually matched with multiple testing circuits to test the module product. Different testing circuits need to be replaced when different tests are performed, which results in low module testing efficiency. CONTENT OF THE UTILITY MODEL

[0004] Therefore, it is necessary to provide a honeycomb module testing device in view of the above technical problems.

[0005] In a first aspect, the present application provides a honeycomb module testing device, which comprises a host computer, a testing board and a wireless comprehensive tester, wherein:

[0006] The testing board is used to fix a module to be tested, and at least one testing circuit is included on the testing board, and each testing circuit is electrically connected to the module to be tested.

[0007] The host computer is electrically connected to the testing board, and is used to issue a testing instruction to the module to be tested through the testing board.

[0008] The host computer is also electrically connected to the wireless comprehensive tester, and the wireless comprehensive tester is in communication connection with the module to be tested.

[0009] In one of the embodiments, the testing board further comprises a start switch, and the device further comprises a USB relay;

[0010] The host computer is also electrically connected to the start switch through the USB relay, and is used to control the start and stop of the module to be tested through the USB relay.

[0011] In one of the embodiments, the device further comprises a programmable power supply, the host computer is electrically connected to the programmable power supply, and the programmable power supply is electrically connected to the testing board through a power supply interface on the testing board.

[0012] In one of the embodiments, the testing board further comprises an anti-reverse circuit, a slow start circuit and an overvoltage protection circuit, and the anti-reverse circuit, the slow start circuit and the overvoltage protection circuit are arranged between the power supply interface and the module to be tested.

[0013] In one of the embodiments, the test board further comprises a direct current conversion circuit, which is arranged between the power supply interface and the module under test.

[0014] In one of the embodiments, the test circuit comprises a signal loopback circuit.

[0015] In one of the embodiments, the signal loopback circuit comprises a general input and output type signal loopback circuit, a power supply and fixed level type signal loopback circuit, a time service type signal loopback circuit and a clock type signal loopback circuit.

[0016] In one of the embodiments, the power supply and fixed level type signal loopback circuit comprises at least one voltage dividing resistor and an analog-digital converter, the input end of each voltage dividing resistor is connected with the level signal output end of the module under test, the output end of each voltage dividing resistor is connected with the analog-digital converter, and the output end of the analog-digital converter is connected with the level signal input end of the module under test.

[0017] In one of the embodiments, the test board further comprises at least one external device interface, and each external device interface is electrically connected with the module under test.

[0018] In one of the embodiments, the external device interface comprises a USB interface, a SIM card interface and an RF interface.

[0019] The cellular module test device provided in the above embodiment comprises a plurality of test circuits arranged on the test board. When the module under test needs to be tested, the module under test is fixed on the test board, and each test circuit is electrically connected with the module under test. The test instruction is issued to the module under test by the upper computer electrically connected with the test board, so that the module under test can complete the hardware function test through each test circuit. Meanwhile, the wireless comprehensive tester is arranged in the device, the upper computer is electrically connected with the wireless comprehensive tester, and the wireless comprehensive tester is in communication connection with the module under test, so that the upper computer can control the wireless comprehensive tester to complete the communication function test of the module under test. The cellular module test device provided in the embodiment integrates multiple test functions, and the module under test can complete the test without replacing the test circuit, thereby improving the test efficiency of the module under test. BRIEF DESCRIPTION OF DRAWINGS

[0020] Figure 1 FIG. 1 is a schematic diagram of the cellular module test device in one embodiment;

[0021] Figure 2 FIG. 2 is a schematic diagram of the cellular module test device with USB relay in one embodiment;

[0022] Figure 3 FIG. 3 is a schematic diagram of the cellular module test device in another embodiment.

[0023] Explanation of reference numerals in the attached figures:

[0024] 110 Host Computer

[0025] 120 Test Base Plate

[0026] 121 Start Switch

[0027] 130 Wireless Integrated Tester

[0028] 140 USB Relay

[0029] 150 Programmable Power Supply Detailed Implementation

[0030] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0031] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0032] The serial numbers assigned to components in this document, such as "first" and "second," are used solely to distinguish the described objects and have no sequential or technical meaning. The terms "connection" and "linkage" used in this application, unless otherwise specified, include both direct and indirect connections (linkages). It should be understood that the terms "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," and "counterclockwise," indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings and are used solely for the convenience of describing this application and simplifying the description. They do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.

[0033] In this application, unless otherwise expressly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature is in indirect contact with the second feature through an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0034] In one embodiment, as shown in Figure 1 A cellular module testing device is provided, which includes a host computer 110, a test board 120 and a wireless comprehensive tester 130. The test board 120 is used to fix a module to be tested, and at least one test circuit is included on the test board 120, each test circuit being electrically connected to the module to be tested. The host computer 110 is electrically connected to the test board 120, and the host computer 110 is used to issue a test instruction to the module to be tested through the test board 120. The host computer 110 is also electrically connected to the wireless comprehensive tester 130, and the wireless comprehensive tester 130 is in communication connection with the module to be tested.

[0035] In the embodiments of the present application, the host computer 110 can be any device with data processing and communication capabilities, such as a computer device, a smart phone, etc.

[0036] The test board 120 is provided with a fixing structure for fixing the module to be tested, which can be a card slot, a clamp or a positioning structure, etc. In addition, the test board 120 is also provided with an interface for connection with the module to be tested. In use, the module to be tested can be stably installed on the test board through the fixing structure, and the module to be tested is connected with the interface on the test board 120, so that the module to be tested can be in signal transmission with the test board 120, and the position of the module to be tested is fixed during the test and will not fall off from the test board.

[0037] The test board 120 is provided with a plurality of test circuits, which are used to test the hardware functions of the module to be tested, such as circuits for testing the power supply performance and signal transmission function of the module to be tested, etc. The specific test circuits can be selected by those skilled in the art according to actual needs. Each test circuit is electrically connected to the module to be tested, so that the module to be tested can complete the test through each test circuit.

[0038] The host computer 110 can be connected to the test board 120 through a USB (Universal Serial Bus) interface, a serial port, an Ethernet interface, etc. The host computer 110 issues a test instruction to the module to be tested through the test board 120, which can include a loopback test instruction (indicating that the module to be tested receives the signal sent by itself through the loopback test circuit, and compares whether the sent signal and the received signal are consistent), an external device test instruction (indicating that the module to be tested sends a signal to an external device through an external device test circuit, and tests whether the module to be tested can normally communicate with the external device), etc. After the module to be tested executes the test instruction, the execution result can be sent back to the host computer 110 through the test board, and the host computer 110 can display the execution result on a display device.

[0039] The wireless integrated tester 130 is used to test the communication function of the module under test. The wireless integrated tester 130 can communicate wirelessly with the module under test, or a communication interface can be set on the test base plate 120 and connected to the wireless integrated tester 130 via a cable, so that the wireless integrated tester 130 can communicate with the module under test via wired communication.

[0040] The host computer 110 is electrically connected to the wireless integrated tester 130. When testing the module under test is required, the host computer 110 sends test commands to the wireless integrated tester 130, enabling the wireless integrated tester 130 to perform communication tests with the module under test. For example, it can test the transmit power, receive sensitivity, and frequency stability of the RF signal of the module under test, as well as calibrate the parameters of the RF signal in the module under test. The wireless integrated tester 130 can also send the test results back to the host computer 110, allowing the host computer 110 to display the test results on a display device.

[0041] The cellular module testing device provided in this application embodiment has multiple test circuits set on a test base plate. When testing the module under test is required, the module under test is fixed on the test base plate, and each test circuit is electrically connected to the module under test. A host computer electrically connected to the test base plate sends test commands to the module under test, enabling the module under test to complete hardware function tests through each test circuit. The device also includes a wireless integrated tester, which is electrically connected to the host computer and communicatively connected to the module under test, allowing the host computer to control the wireless integrated tester to complete communication function tests on the module under test. The cellular module testing device provided in this application embodiment integrates multiple testing functions, allowing the module under test to complete testing without replacing the test circuits, thus improving the testing efficiency of the module under test.

[0042] In one embodiment, such as Figure 2 As shown, the test base plate 120 also includes a start switch 121, and the device also includes a USB relay 140; the host computer 110 is also electrically connected to the start switch via the USB relay 140, and is used to control the start and stop of the module under test via the USB relay 140.

[0043] In this embodiment of the application, a start switch 121 is provided on the test base plate 120. The host computer 110 can control the opening and closing of the start switch 121 through the USB relay 140. The start switch 121 can then control the power-on and power-off of the module under test through the interface between the test base plate 120 and the module under test.

[0044] The starting switch 121 can be arranged on a line through which the test board 120 supplies power to the to-be-tested module. The host computer 110 can indirectly control the starting switch 121 by controlling the USB relay 140. When the starting switch 121 is closed, the test board 120 supplies power to the to-be-tested module, the to-be-tested module is powered on, and the host computer 110 can read the start-up current of the to-be-tested module, thereby testing the start-up power consumption of the to-be-tested module; when the starting switch 121 is opened, the test board 120 stops supplying power to the to-be-tested module, the to-be-tested module is powered off, and the host computer 110 can read the shutdown current of the to-be-tested module, thereby determining whether the shutdown current meets the design requirements of the to-be-tested module.

[0045] In an embodiment, the device further comprises a programmable power supply 150, the host computer 110 is electrically connected with the programmable power supply 150, and the programmable power supply 150 is electrically connected with the test board 120 through a power supply interface on the test board 120.

[0046] In the embodiment, the programmable power supply 150 can supply power to the test board 120, so that the programmable power supply 150 can read data such as the start-up power consumption, standby power consumption and shutdown power consumption of the to-be-tested module. The programmable power supply 150 can be electrically connected with the host computer 110, so that the host computer 110 can control whether the programmable power supply 150 supplies power to the test board 120, and so that the programmable power supply 150 can transmit the read data to the host computer 110 after reading the power consumption of the to-be-tested module.

[0047] When testing the to-be-tested module, the host computer 110 can first control the programmable power supply 150 to be turned on and control the USB relay 140 to make the starting switch 121 in an open state. That is, at this time, the programmable power supply 150 supplies power to the test board 120, and the to-be-tested module is powered off. The host computer 110 can then issue a shutdown power consumption reading instruction to the programmable power supply 150, so that the programmable power supply 150 detects the shutdown power consumption of the to-be-tested module and transmits the shutdown power consumption to the host computer 110. The host computer 110 can then control the USB relay 140 to make the starting switch 121 in a closed state, so that the to-be-tested module is powered on. The host computer 110 can then issue a start-up power consumption reading instruction to the programmable power supply 150, so that the programmable power supply 150 detects the start-up power consumption of the to-be-tested module and transmits the start-up power consumption to the host computer 110. In addition, the host computer 110 can also make the programmable power supply read the power consumption when the to-be-tested module executes a test instruction, so as to obtain the power consumption of the to-be-tested module in operation for analysis. The embodiment is not limited in this regard.

[0048] In an embodiment, the test board further comprises an anti-reverse circuit, a slow-start circuit and an overvoltage protection circuit, which are arranged between the power supply interface and the to-be-tested module.

[0049] In the embodiments of the present application, to protect the DUT during testing, a reverse prevention circuit, a soft start circuit and an overvoltage protection circuit can be arranged between the power interface and the DUT.

[0050] The reverse prevention circuit is used to prevent damage to the DUT when the power polarity is reversed. The reverse prevention circuit can be composed of a diode. When the power polarity is correct, the diode is in a conducting state, allowing the current to pass normally, and the program-controlled power supply 150 can supply power to the DUT through the test board 120; when the power polarity is reversed, the diode is cut off, preventing reverse current from passing through, to prevent the DUT from being damaged.

[0051] The soft start circuit is used to control the rising rate of the supply voltage of the DUT. The soft start circuit can be composed of a MOSFET (Metal-Oxide-Semiconductor Field-Effect Transistor), a capacitor and a resistor, wherein the drain of the MOSFET can be connected to the power input, and the source is connected to the power input end of the DUT. A resistor can be connected between the gate and the source of the MOSFET, and the gate is connected to the positive pole of the power input through the capacitor. When the power is turned on, the capacitor begins to charge, causing the gate voltage to gradually rise, causing the on-resistance of the MOSFET to gradually decrease, and the power voltage is slowly loaded onto the DUT through the MOSFET, thereby controlling the rising rate of the supply voltage of the DUT.

[0052] The overvoltage protection circuit is used to monitor the power voltage. The overvoltage protection circuit can include a voltage dividing resistor, a voltage reference and a voltage comparator, the input end of the voltage dividing resistor is connected to the power input to sample the voltage of the power input, and the output end is connected to the same input end of the voltage comparator, and the opposite input end of the voltage comparator is connected to the voltage reference to provide a reference voltage. When the sampling voltage is less than or equal to the reference voltage, the voltage comparator outputs a low level. When the sampling voltage is greater than the reference voltage, the voltage comparator outputs a high level. The voltage comparator can be further connected to the protection execution part of the overvoltage protection circuit, so that the protection execution part performs a circuit protection action when a high level is received. The specific structure of the protection execution part is not limited in the embodiments of the present application, and any structure capable of cutting off the power supply to the DUT is applicable to the embodiments of the present application.

[0053] In one embodiment, the test board further includes a DC conversion circuit arranged between the power interface and the DUT. In the embodiments of the present application, the DC conversion circuit arranged between the power interface and the DUT can convert the voltage value input by the power interface into multiple voltage values, to adapt to the power supply requirements of different modules in the DUT.

[0054] In one embodiment, the test circuit comprises a signal loopback circuit. An input end of the signal loopback circuit is connected to a signal output end of the module under test, and an output end of the signal loopback circuit is connected to a signal input end of the module under test. The module under test can perform self-checking on the signal sent by the module under test through the signal loopback circuit, to determine whether the signal sending function of the module under test meets the requirements.

[0055] In one embodiment, the signal loopback circuit comprises a general input and output type signal loopback circuit, a fixed level type signal loopback circuit, a time service type signal loopback circuit, and a clock type signal loopback circuit.

[0056] The general input and output type signal loopback circuit is used to test the general input and output pins of the module under test. A loopback circuit can be provided for each pair of general input and output pins to be tested, and a switch is provided. When the switch is switched to a state in which a certain loopback circuit is turned on, the general input and output pins corresponding to the loopback circuit can be tested. For example, the output pin corresponding to the loopback circuit outputs a high level, and it is detected whether the input pin corresponding to the loopback circuit can detect the high level, to determine whether the function of the general input and output pin is normal.

[0057] The fixed level type signal loopback circuit is used to test the accuracy of the fixed level signal of the module under test. The fixed level type signal loopback circuit can comprise at least one voltage dividing resistor and an analog-digital converter. The input end of each voltage dividing resistor is connected to the level signal output end of the module under test, the output end of each voltage dividing resistor is connected to the analog-digital converter, and the output end of the analog-digital converter is connected to the level signal input end of the module under test. The voltage dividing resistor is used to divide the level signal output by the module under test, to convert it into a voltage range that can be sampled by the analog-digital converter. The analog-digital converter can further input the sampled level signal back to the module under test, to enable the module under test to analyze the output level signal and the received level signal, and test the accuracy of the level signal of the module under test.

[0058] The time service type signal loopback circuit also comprises at least one voltage dividing resistor and an analog-digital converter. The voltage dividing resistor divides the time service type signal, the analog-digital converter samples the time service type signal, and the sampled time service type signal is input back to the module under test, to determine the quality of the time service signal in the module under test.

[0059] The clock type signal loopback circuit comprises an RC rectifier circuit (i.e. a rectifier circuit comprising a resistor and a capacitor) and an analog-digital converter. The RC rectifier circuit processes the clock signal, the analog-digital converter samples the processed clock signal, and the sampled clock signal is input back to the module under test, to determine whether the frequency, amplitude, etc. of the clock signal meet the requirements.

[0060] In one embodiment, the test baseboard further comprises at least one external device interface, and each external device interface is electrically connected to the module under test. In the embodiment of the application, the test baseboard can further comprise an external device interface, and the module under test can communicate with the external device through each external device interface to test whether the interaction between the module under test and the external device is normal. The external device interface can include a USB interface, a SIM card (Subscriber Identity Module) interface, an RF (Radio Frequency) interface, and the like. When testing is needed, the external device is connected to the corresponding external device interface, and then the test instruction is issued to the module under test by the host computer 110 to make the module under test interact with each external device.

[0061] In one embodiment, as shown in FIG. 1, a cellular module testing device is provided. In use, the module under test can be tested according to the following specific process: Figure 3

[0062] Step 1: The host computer 110 scans the product unique code of the module under test. If the product unique code of the module under test matches the production sequence of the product of the current test batch, the testing process is continued, otherwise the host computer 110 reports an error and terminates the testing process.

[0063] Step 2: The start switch of the test baseboard 120 is set to the off state, the module under test is buckled to the test baseboard 120, and the closing state of the module under test is detected. If the closing state of the module under test is normal, the host computer 110 controls the program-controlled power supply 150 to be turned on to supply power to the test baseboard 120.

[0064] Step 3: The host computer 110 reads the current value of the program-controlled power supply 150, and takes the current value as the shutdown current of the module under test. The host computer 110 further judges whether the shutdown current is within the normal current range.

[0065] Step 4: The host computer 110 controls the USB relay 140 to be turned on to make the module under test in the start state, and reads the current value of the program-controlled power supply 150, which is taken as the start-up current of the module under test. The host computer 110 further judges whether the start-up current is within the normal current range.

[0066] Step 5: The host computer 110 issues an external device testing instruction to make the module under test interact with the external device through each external device interface. The module under test reads the interaction result and returns the interaction result to the host computer 110, and the host computer 110 judges whether the interaction result is normal.

[0067] ​Step 6: The host computer 110 issues a loopback test instruction to make the module under test perform loopback test through each signal loopback circuit. The module under test returns the test result to the host computer 110, and the host computer 110 judges whether the test result is normal.

[0068] Step 7: The host computer 110 issues a standby instruction to make the module under test in standby state, and reads the current value of the program-controlled power supply 150, taking the current value as the standby current of the module under test. The host computer 110 further judges whether the standby current is within the normal current range.

[0069] Step 8: The host computer 110 controls the wireless comprehensive tester to communicate with the module under test, and issues a communication test instruction to the module under test to make the module under test calibrate and comprehensively test the radio frequency module inside the module.

[0070] Step 9: The host computer 110 controls the program-controlled power supply 150 to power off.

[0071] The technical features of the above embodiments can be combined in any manner. To make the description concise, not all possible combinations of the technical features in the above embodiments are described, but as long as the combinations of the technical features do not exist contradictions, they should be considered as the scope of the present application.

[0072] The above embodiments only express several implementation manners of the present application, and the description is specific and detailed, but it should not be understood as a limitation on the scope of the patent of the present application. It should be pointed out that for ordinary skilled in the art, without departing from the concept of the present application, a number of modifications and improvements can be made, which are all within the scope of the present application. Therefore, the protection scope of the present application should be subject to the appended claims.

Claims

1. A cellular module test apparatus characterized by comprising: The device comprises a host computer, a test board and a wireless comprehensive tester, wherein: The test board is used for fixing a module to be tested, and at least one test circuit is arranged on the test board and electrically connected with the module to be tested; The host computer is electrically connected with the test board, and is used for issuing a test instruction to the module to be tested through the test board; The host computer is also electrically connected with the wireless comprehensive tester, and the wireless comprehensive tester is in communication connection with the module to be tested.

2. The apparatus of claim 1, wherein, The test board further comprises a start switch, and the device further comprises a USB relay; The host computer is also electrically connected with the start switch through the USB relay, and is used for controlling the start and stop of the module to be tested through the USB relay.

3. The apparatus of claim 1, wherein, The device further comprises a programmable power supply, the host computer is electrically connected with the programmable power supply, and the programmable power supply is electrically connected with the test board through a power supply interface on the test board.

4. The apparatus of claim 3, wherein, The test board further comprises an anti-reverse circuit, a slow start circuit and an overvoltage protection circuit, and the anti-reverse circuit, the slow start circuit and the overvoltage protection circuit are arranged between the power supply interface and the module to be tested.

5. The apparatus of claim 3, wherein, The test board further comprises a direct current conversion circuit, and the direct current conversion circuit is arranged between the power supply interface and the module to be tested.

6. The apparatus of claim 1, wherein, The test circuit comprises a signal loopback circuit.

7. The apparatus of claim 6, wherein, The signal loopback circuit comprises a general-purpose input-output type signal loopback circuit, a power supply and fixed level type signal loopback circuit, a time service type signal loopback circuit and a clock type signal loopback circuit.

8. The apparatus of claim 7, wherein, The power supply and fixed level type signal loopback circuit comprises at least one voltage dividing resistor and an analog-digital converter, the input end of each voltage dividing resistor is connected with a level signal output end of the module to be tested, the output end of each voltage dividing resistor is connected with the analog-digital converter, and the output end of the analog-digital converter is connected with a level signal input end of the module to be tested.

9. The apparatus of claim 5, wherein, The test board further comprises at least one external device interface, and each external device interface is electrically connected with the module to be tested.

10. The apparatus of claim 9, wherein, The external device interface comprises a USB interface, a SIM card interface and an RF interface.

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