Atomic force microscope probe box convenient for taking and placing probe
By introducing a lever structure of sliding stage and rotating plate into the atomic force microscope probe box, the problem of difficult placement and removal of flat probes was solved, and convenient operation of the probe was achieved.
Patent Information
- Application Number
- CN202423295329.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-30
- Publication Date
- 2025-12-30
- Estimated Expiration
- 2034-12-30
AI Technical Summary
Existing atomic force microscope probes are flat and difficult to remove and insert from the probe box, causing inconvenience in operation.
A probe box comprising a sliding stage, a linkage lever, and a rotating plate was designed. The lever principle is used to make one side of the rotating plate rotate downward and the other side tilt upward, forming an unobstructed state for the probe, making it easy to directly pick up the probe.
It enables convenient placement and removal of probes, simplifies the operation process, and improves the ease of use of probes.
Smart Images
Figure CN223742506U_ABST
Abstract
Description
Technical Field
[0001] This utility model belongs to the field of microscope probe box technology, and in particular relates to an atomic force microscope probe box that facilitates probe loading and unloading. Background Technology
[0002] Atomic force microscopy uses tiny probes to "explore" the sample surface to obtain information. When the probe tip approaches the sample, the force acting on the tip causes the cantilever to deflect or change in amplitude. This change in the cantilever is detected by the detection system and converted into an electrical signal, which is then transmitted to the feedback system and the imaging system. By recording a series of probe changes during the scanning process, an image of the sample surface information can be obtained.
[0003] Most existing atomic force microscope probes are flat and have convex tips. To protect the tips, most probe boxes have slots for the probes to be inserted, and soft materials are used to wrap the probes for protection. Since the flat probes are located in the slots, they are difficult to remove, causing inconvenience in handling.
[0004] Therefore, an atomic force microscope probe box that facilitates probe placement and removal is proposed. Utility Model Content
[0005] This invention provides an atomic force microscope probe box that facilitates probe placement and removal, aiming to solve the above-mentioned problems.
[0006] This utility model is implemented as follows: an atomic force microscope probe box for easy probe placement and removal includes: a box body; a groove at the center of the top of the box body; a storage slot at the bottom of the groove; a rotating plate at the center of one inner wall of the storage slot; a support plate fixed to the inner wall of the storage slot near the lower side of the rotating plate; a sliding stage sliding on the inner wall of the storage slot adjacent to the rotating plate; a fixing stage fixed to the inner wall of the storage slot adjacent to the other inner wall of the rotating plate by bolts; protective pads, both fixed to the inner walls of the sliding stage and the fixing stage by adhesive; a linkage pressure rod fixed to the bottom of the sliding stage by screws; a spring fixed to the bottom of the linkage pressure rod; a pressure cap integrally formed on the top of the linkage pressure rod; a limiting hole at the bottom of the groove near the outer side of the linkage pressure rod; an elastic rope embedded and fixed between the sliding stage and the rotating plate; a box cover located above the box body; a silicone pad fixed to the bottom of the box cover by adhesive; and a probe adapter cavity at the bottom of the silicone pad.
[0007] Preferably, both the sliding stage and the fixed stage have an "L" shaped cross-section.
[0008] Preferably, the cross-section of the linkage pressure rod is a "J" shaped structure, and the linkage pressure rod passes through the limiting hole.
[0009] Preferably, a cavity is provided inside the box body near the outer side of the linkage pressure rod and the spring, and the bottom of the cavity is fixedly connected to the bottom end of the spring.
[0010] Preferably, when the rotating plate is horizontal, the bottom of the plate and the bottom of the support plate are on the same horizontal plane.
[0011] Preferably, the top of the sliding platform when it slides to its highest point is on the same horizontal plane as the top of the fixed platform.
[0012] Preferably, the box body and the box lid are fixedly connected by a locking mechanism.
[0013] Compared with the prior art, the embodiments of this application have the following main advantages:
[0014] By utilizing the lever principle, when the linkage pressure rod is pressed down, one end of the rotating plate rotates downward, causing the other end of the rotating plate to tilt upward. This results in the probe on the rotating plate being in a state where one side is lower than the other. In addition, since the rotating plate is shorter than the probe, the upward-facing side of the probe is unobstructed, making it easy to directly pick up the probe. The probe picking operation is convenient. Attached Figure Description
[0015] Figure 1 This is a schematic diagram of the structure of this utility model;
[0016] Figure 2 This is a schematic diagram of the box structure of this utility model;
[0017] Figure 3 This is a schematic diagram of the box lid structure of this utility model;
[0018] Figure 4 This is a schematic diagram of the linkage pressure rod structure of this utility model;
[0019] Figure 5 This is a schematic diagram of the rotating plate structure of this utility model;
[0020] Figure 6 This is a schematic diagram of the fixed platform structure of this utility model.
[0021] In the diagram: 1. Box body; 2. Groove; 3. Storage slot; 4. Turning plate; 5. Sliding platform; 6. Fixing platform; 7. Protective pad; 8. Linkage pressure rod; 9. Spring; 10. Pressure cap; 11. Limiting hole; 12. Elastic rope; 13. Box lid; 14. Silicone pad; 15. Probe adapter cavity; 16. Support plate. Detailed Implementation
[0022] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs; the terminology used herein in the specification of the application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application; the terms "comprising" and "having," and any variations thereof, in the specification, claims, and foregoing drawings of this application are intended to cover non-exclusive inclusion. The terms "first," "second," etc., in the specification, claims, or foregoing drawings of this application are used to distinguish different objects, not to describe a particular order.
[0023] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.
[0024] This utility model provides an atomic force microscope probe holder that facilitates probe placement and removal, such as... Figure 1-6 As shown, the box includes a box body 1. A groove 2 is formed at the center of the top of the box body 1. A storage slot 3 is formed at the bottom of the groove 2. A rotating plate 4 is rotatably connected to the inner wall of the storage slot 3. A sliding table 5 is slidably connected to the inner wall of the storage slot 3 adjacent to the rotating plate 4. A fixed table 6 is fixedly connected to the inner wall of the storage slot 3 adjacent to the rotating plate 4 by bolts. Both the sliding table 5 and the fixed table 6 have an "L" shaped cross-section. Protective pads 7 are glued to the inner walls of the sliding table 5 and the fixed table 6 by adhesive. A linkage rod 8 is fixedly connected to the bottom of the sliding table 5 by screws. A spring 9 is fixedly installed at the bottom of the linkage rod 8. The outer part of the box body 1 is located near the linkage rod 8 and the spring 9. A cavity is provided, and the bottom of the cavity is fixedly connected to the bottom of the spring 9. A pressure cap 10 is integrally formed on the end of the linkage pressure rod 8 away from the sliding table 5. The top of the pressure cap 10 does not exceed the top of the box body 1. A limit hole 11 is provided at the bottom of the groove 2 near the outer side of the linkage pressure rod 8. An elastic rope 12 is provided between the sliding table 5 and the rotating plate 4. A support plate 16 is fixedly connected to the inner side wall of the storage slot 3 near the lower side of the rotating plate 4 by screws. A box cover 13 is provided at the top of the box body 1. The box body 1 and the box cover 13 are fixedly connected by a buckle. A silicone pad 14 is fixedly attached to the bottom of the box cover 13 by adhesive. A probe adapter cavity 15 is provided at the bottom of the silicone pad 14.
[0025] It should be noted that since most existing atomic force microscope probes are flat and have convex tips, in order to protect the tips, most probe boxes have grooves for probe embedding, and soft materials are used to wrap the probes for protection. Since the flat probes are located in the grooves, they are difficult to remove, causing inconvenience in picking them up and putting them down. In this embodiment, the lever principle is used so that when the linkage rod 8 is pressed down, one end of the rotating plate 4 rotates downward, causing the other end of the rotating plate 4 to tilt upward. This makes the probe on the rotating plate 4 in a state where one side is lower and the other side is higher. In addition, the rotating plate 4 is shorter than the probe, so the upward side of the probe is unobstructed, making it easy to pick up the probe directly. The probe picking operation is convenient.
[0026] Specifically, in this embodiment, the solution mainly includes a sliding stage 5, a linkage pressure rod 8, and a rotating plate 4. When placing the atomic force microscope probe, the probe is placed in the storage slot 3. The rotating plate 4, the sliding stage 5, and the fixed stage 6 support the probe. At this time, the box cover 13 is closed, and the silicone pad 14 on the box cover 13 is inserted into the storage slot 3. The probe adapter cavity 15 at the bottom of the silicone pad 14 fits over the outside of the probe, thus protecting the probe. When taking out the atomic force microscope probe, after opening the box cover 13, the pressure cap 10 is pressed down with a finger. When the linkage lever 8 is pressed down, it causes the sliding table 5 to move downward. The spring 9 at the bottom of the linkage lever 8 is compressed. During the downward movement of the sliding table 5, one end of the elastic rope 12 is pulled. After the elastic rope 12 is pulled, one side of the rotating plate 4 is rotated downward. Through the lever principle, the other side of the rotating plate 4 tilts upward. The probe on the rotating plate 4 is in a state where one side is lower and the other side is higher. The side of the probe at the higher position is higher than the storage slot 3. Since one side of the probe is unobstructed, the probe can be directly picked up at this time, making the probe picking operation convenient.
[0027] In a further preferred embodiment of this utility model, such as Figure 1 , Figure 2 and Figure 4 As shown, the cross-section of the linkage rod 8 is a "J" shaped structure, and the linkage rod 8 passes through the limiting hole 11.
[0028] In this embodiment, the two ends of the "J"-shaped linkage rod 8 are in the same direction, so that when one end of the linkage rod 8 is pressed downward, the other end of the linkage rod 8 moves downward synchronously, thereby causing the sliding table 5 to move downward.
[0029] In a further preferred embodiment of this utility model, such as Figure 1-2 As shown, when the rotating plate 4 is horizontal, the bottom of the support plate 16 is on the same horizontal plane, and when the sliding table 5 slides to its highest point, the top of the fixed table 6 is on the same horizontal plane.
[0030] In this embodiment, the probe can be horizontally supported to ensure that the probe is placed horizontally.
[0031] It should be noted that, for the sake of simplicity, the foregoing embodiments are all described as a series of actions. However, those skilled in the art should understand that the present invention is not limited to the described order of actions, as some steps may be performed in other orders or simultaneously according to the present invention. Furthermore, those skilled in the art should also understand that the embodiments described in the specification are preferred embodiments, and the actions and modules involved are not necessarily essential to the present invention.
[0032] It should be understood that the disclosed apparatus can be implemented in other ways, given the several embodiments provided in this application. For example, the apparatus embodiments described above are merely illustrative. For instance, the division of units described above may be implemented in other ways in practice. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or communication connections shown or discussed may be through some interfaces; indirect coupling or communication connections between devices or units may be telecommunications or other forms.
[0033] The units described above as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.
[0034] The above embodiments are only used to illustrate the technical solutions of this utility model, and are not intended to limit the scope of protection of this utility model. Obviously, the described embodiments are only some embodiments of this utility model, not all embodiments. Based on these embodiments, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model. Although this utility model has been described in detail with reference to the above embodiments, those skilled in the art can still combine, add, delete, or otherwise adjust the features of the various embodiments of this utility model according to the circumstances without conflict or creative effort, thereby obtaining different technical solutions that do not fundamentally depart from the concept of this utility model. These technical solutions are also within the scope of protection of this utility model.
Claims
1. An atomic force microscope probe holder that facilitates probe placement and removal, characterized in that, It includes: The box body (1); The groove (2) is opened at the top of the central position of the box body (1); The receiving groove (3) is opened at the bottom of the inside of the groove (2); The rotating plate (4) is rotated at the central position of the inside wall of one side of the receiving groove (3); and The support plate (16) is fixed to the inside wall of the receiving groove (3) near the lower side of the rotating plate (4); The sliding table (5) is slid on the inside wall of the receiving groove (3) adjacent to the rotating plate (4); and The fixed table (6) is fixed by bolts on the inside wall of the receiving groove (3) adjacent to the other side of the rotating plate (4); The protective pad (7) is fixed by adhesive on the inside wall of the sliding table (5) and the fixed table (6); The linkage pressure rod (8) is fixed by screws at the bottom of the sliding table (5); The spring (9) is fixed at the bottom of the linkage pressure rod (8); and The pressure cap (10) is integrally formed at the top end of the linkage pressure rod (8); The limiting hole (11) is opened at the bottom of the inside of the groove (2) near the outside of the linkage pressure rod (8); The elastic rope (12) is embedded and fixed between the sliding table (5) and the rotating plate (4); The box cover (13) is provided at the upper position of the box body (1); The silica gel pad (14) is fixed by adhesive at the bottom of the box cover (13); The probe fitting cavity (15) is opened at the bottom of the silica gel pad (14).
2. An atomic force microscope probe cartridge for facilitating probe pick-and-place as recited in claim 1, wherein, The cross section of the sliding table (5) and the fixed table (6) is "L" shaped structure.
3. An atomic force microscope probe cartridge for facilitating probe pick-and-place as recited in claim 1, wherein, The cross section of the linkage pressure rod (8) is "J" shaped structure, and the linkage pressure rod (8) penetrates through the limiting hole (11).
4. An atomic force microscope probe cartridge for facilitating probe pick-and-place as recited in claim 1, wherein, The inside of the box body (1) near the outside of the linkage pressure rod (8) and the spring (9) is provided with a cavity, and the inside bottom of the cavity is fixedly connected with the bottom end of the spring (9).
5. An atomic force microscope probe cartridge for facilitating probe pick-and-place as recited in claim 1, wherein, The bottom of the rotating plate (4) when the rotating plate (4) is horizontal is on the same horizontal plane with the bottom of the support plate (16).
6. An atomic force microscope probe cartridge for facilitating probe pick-and-place as recited in claim 1, wherein, The top of the sliding table (5) when the sliding table (5) slides to the highest position is on the same horizontal plane with the top of the fixed table (6).
7. An atomic force microscope probe cartridge for facilitating probe pick-and-place as recited in claim 1, wherein, The box body (1) and the box cover (13) are fixedly connected by the lock buckle.