Test reset circuit, electronic equipment, communication test equipment and communication test system
By introducing a test reset circuit into the electronic device and using a switch module and a level input module to control the communication signal level, the test compatibility problem in the power-off state of the electronic device is solved, and efficient testing and normal communication functions are realized.
Patent Information
- Application Number
- CN202520065888.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-10
- Publication Date
- 2025-12-30
- Estimated Expiration
- 2035-01-10
AI Technical Summary
In the prior art, there is a problem with the compatibility of testing electronic devices. The existing technology cannot effectively solve the compatibility problem between electronic devices and test equipment when they are powered off, resulting in low testing efficiency.
By introducing a test reset circuit into the electronic device and utilizing the structure of the first switch module and the level input module, the high and low levels of the communication signal are controlled respectively in the power-on and power-off states of the electronic device. This ensures that the communication signal is pulled low during testing in the power-off state to avoid voltage backflow, and that the communication signal is input normally in the power-on state.
It enables normal testing when electronic devices are powered off, while ensuring normal communication functions when powered on, thus improving testing efficiency and accuracy and avoiding test failures caused by voltage backflow.
Smart Images
Figure CN223744696U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the technical field of communication testing, and in particular to a test reset circuit, an electronic device, a communication testing device and a communication testing system. BACKGROUND
[0002] With the diversification of electronic product forms and the modularization of product functions, the compatibility of hardware circuit design and testing equipment is particularly important. For example, there may be many compatibility problems between the high-speed signal communication circuit of the electronic device and the testing device.
[0003] In the related art, the communication testing device is usually used to test the electronic device in various states under the shutdown state of the electronic device. However, the applicant has found in the implementation process that the related art at least has the problem of low test efficiency. UTILITY MODEL CONTENT
[0004] Therefore, the present application aims to at least solve one of the above technical defects, and in particular to the technical defect of low test efficiency of the electronic device in the prior art. The present application provides a test reset circuit, an electronic device, a communication testing device and a communication testing system.
[0005] In a first aspect, the present application provides a test reset circuit applied to an electronic device, the electronic device comprising a communication port module having a signal repeater for enhancing the communication signal of the communication port module, the communication port module being used to connect a communication testing device, and the circuit comprising:
[0006] a first switch module, an input end of the first switch module being used to access the communication signal of the electronic device, and an output end of the first switch module being used to ground;
[0007] a level input module connected to the control end of the first switch module;
[0008] In the on state of the electronic device, the level input module inputs a low level to the first switch module to make the first switch module disconnected, and in the off state of the electronic device, the level input module inputs a high level to the first switch module to make the first switch module conductive, so that the communication testing device is used to test the electronic device when the electronic device is off.
[0009] In one embodiment, the level input module comprises a second switch module;
[0010] The input end of the second switch module is used to access a high level, the output end of the second switch module is used to ground, and the control end of the second switch module is used to access a variable level signal.
[0011] The control end of the first switch module is connected to the input end of the second switch module, and is also used for inputting a high level.
[0012] In the electronic device startup state, the variable level signal is a high level, so that the second switch module is turned on, and in the electronic device shutdown state, the variable level signal is a low level, so that the second switch module is turned off.
[0013] In one of the embodiments, the level input module further comprises:
[0014] The first resistor has one end connected to the input end of the second switch module and the other end used for inputting a high level.
[0015] In one of the embodiments, the level input module further comprises:
[0016] The second resistor has one end connected to the control end of the second switch module and the other end used for inputting a variable level signal.
[0017] In one of the embodiments, the level input module further comprises:
[0018] The pull-down resistor has one end respectively connected to the control end of the second switch module and one end of the second resistor and the other end used for grounding.
[0019] In one of the embodiments, the second switch module is a first MOS tube, the control end of the second switch module is the gate of the first MOS tube, the input end of the second switch module is the drain of the first MOS tube, and the output end of the second switch module is the source of the first MOS tube.
[0020] In one of the embodiments, the first switch module is a second MOS tube, the control end of the first switch module is the gate of the second MOS tube, the input end of the first switch module is the drain of the second MOS tube, and the output end of the first switch module is the source of the second MOS tube.
[0021] In a second aspect, the application provides an electronic device, which comprises:
[0022] The communication port module has a signal repeater, and the signal repeater is used for enhancing the communication signal of the communication port module.
[0023] The test reset circuit as described above is connected to the communication port module.
[0024] In a third aspect, the application provides a communication test device, which comprises:
[0025] The test reset circuit as described above,
[0026] The test reset circuit is used for connecting a communication port module of an electronic device, and the communication port module has a signal repeater used for enhancing communication signals of the communication port module.
[0027] In a fourth aspect, the present application provides a communication test system, which comprises:
[0028] The communication test device as described above is used for connecting an electronic device and testing the electronic device.
[0029] The test output device is connected to the communication test device and used for outputting a communication test result.
[0030] The power supply is connected to the communication test device.
[0031] From the above technical solutions, the embodiments of the present application have the following advantages:
[0032] The test reset circuit, the electronic device, the communication test device and the communication test system provided by the present application have the following advantages: the first switch module is connected to the communication signal of the electronic device, and the output end of the first switch module is connected to the ground; the level input module is connected to the control end of the first switch module; in the power-on state of the electronic device, the level input module inputs a low level to the first switch module to make the first switch module disconnected; in the power-off state of the electronic device, the level input module inputs a high level to the first switch module to make the first switch module conductive, so that the communication test device can test the electronic device when the electronic device is powered off. Through the above structure, the communication signal of the electronic device can be pulled down when the first switch module is conductive in the power-off state, so that the voltage of the communication test device cannot be backfed to the electronic device through the communication signal, and the signal repeater of the electronic device can ensure the normal test signal, so that the test can be completed normally. At the same time, through the above structure, the first switch module is disconnected in the power-on state of the electronic device, the communication signal is not at a low level, the communication signal is normally input to the signal repeater of the electronic device, and the normal communication function of the electronic device can be used. In this way, the above structure can be used for normal function in the power-on state, and the test influence caused by the backfeed of unnecessary voltage through the communication signal to the electronic device during the test can be avoided, so that the normal test in the power-off state is ensured, and the test efficiency of the electronic device is improved. BRIEF DESCRIPTION OF DRAWINGS
[0033] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings needed to be used in the embodiments or prior art description. Obviously, the drawings described below only illustrate some of the embodiments of the present application, and do not illustrate all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative labor are within the scope of protection of the present application.
[0034] Figure 1 A structural schematic diagram of a communication test system provided by an embodiment of the present application;
[0035] Figure 2 A structural schematic diagram of a test reset circuit provided by an embodiment of the present application Figure One ;
[0036] Figure 3 A structural schematic diagram of a test reset circuit provided by an embodiment of the present application Figure Two ;
[0037] Figure 4 A structural schematic diagram of a test reset circuit provided by an embodiment of the present application Figure Three ;
[0038] Figure 5 A structural schematic diagram of an electronic device provided by an embodiment of the present application.
[0039] Reference signs:
[0040] 10: electronic device; 110: signal repeater;
[0041] 20: communication test device;
[0042] 30: test output device;
[0043] 40: power supply;
[0044] 50: first switch module;
[0045] 60: level input module; 610: second switch module;
[0046] R1: first resistor; R2: second resistor; R3: pull-down resistor; N1: first MOS tube; N2: second MOS tube. DETAILED DESCRIPTION
[0047] The technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only some of the embodiments of the present application, not all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative labor are within the scope of protection of the present application.
[0048] With the diversification of electronic product forms, the modularity of product functions, the compatibility of hardware circuit design and test equipment is particularly important, for example, there may be many compatibility problems between the high-speed signal communication circuit of the electronic device and the test equipment.
[0049] For example, taking the HDMI module as an example, the following is about the problems found by the applicant in practical application:
[0050] During the test of the HDMI high-speed SI, the Voff test item fails, and the applicant finds that the reason is that the electronic device to be tested is in the state of power off, the test equipment EDID has a 3.3V pull-up, and the voltage from the test equipment EDID is back-primed through the HDMI high-speed signal channel to the internal electronic device DUT, which causes the test to fail.
[0051] Usually, different HDMI circuit design schemes are used when designing circuits, and since the SI test fixture EDID is fixed, there is a compatibility problem between the circuit design and the test fixture, which causes various problems during the test, affecting product certification and test efficiency.
[0052] That is, in the related art, the electronic device is tested by the communication test equipment in the power-off state, however, the applicant finds in the implementation process that the related art at least has the problems of low test efficiency and affecting test certification.
[0053] Based on the above problems, the application provides a test reset circuit, an electronic device, a communication test equipment and a communication test system.
[0054] The first switch module and the level input module are provided in the structure of the application, so that the communication signal of the electronic device can be pulled down when the electronic device is in the power-off state and tested, so that the voltage of the communication test equipment cannot be back-primed to the electronic device through the communication signal during the test, so that the signal repeater of the electronic device can ensure the normal test signal, so that the test can be completed normally, and the above structure can ensure that the communication signal is normally input to the signal repeater of the electronic device in the power-on state, so that the normal communication function of the electronic device can be used. In this way, the above structure can be used in the power-on state, and unnecessary voltage can be prevented from being back-primed to the electronic device through the communication signal during the test in the power-off state, so as to ensure the normal test in the power-off state and improve the test efficiency of the electronic device.
[0055] Figure 1 The structure diagram of a communication test system provided by the embodiment of the application is shown in the following figure:Figure 1 As shown, the communication test system includes: communication test equipment 20, test output device 30, and power supply 40;
[0056] Communication test equipment 20 is used to connect to the electronic device 10 under test and to perform communication tests on the electronic device 10;
[0057] Test output device 30 is connected to communication test device 20 and is used to output communication test results.
[0058] For example, the test output device 30 can be an oscilloscope.
[0059] The power supply 40 is connected to the communication test equipment 20 and is used to power the communication test equipment 20, for example, to provide DC voltage to the communication test equipment 20. The power supply 40 can also be connected to the test output device 30 and is used to power the test output device 30.
[0060] In some examples, the communication test system may also include electronic device 10.
[0061] In one exemplary embodiment, Figure 2 A schematic diagram of a test reset circuit provided in an embodiment of this application. Figure One ,like Figure 2 As shown, a test reset circuit is provided, which is used in... Figure 1 Taking the communication test system as an example, the test reset circuit can be used to test electronic device 10. Electronic device 10 includes a communication port module, which has a signal repeater 110. The signal repeater 110 is used to enhance the communication signal of the communication port module. The communication port module is used to connect to communication test equipment 20.
[0062] The test reset circuit includes: a first switch module 50 and a level input module 60. Wherein:
[0063] Specifically, the first switch module 50 has an input terminal for receiving communication signals from the electronic device 10, and an output terminal for grounding.
[0064] The first switch module 50 can refer to a switch module with switching function, such as a circuit including transistors, which can be triodes, MOSFETs, etc.
[0065] The signal repeater 110 can include a Redriver chip of an HDMI module. The communication test device 20 can be an EDID (Extended display identification data) tool. The Redriver can communicate with the EDID to realize high-speed signal communication of the HDMI interface.
[0066] For example, the input end of the first switch module 50 can be used to access the communication signal of the electronic device 10, the input end of the first switch module 50 can be used to connect the signal repeater 110 of the electronic device 10, and the output end of the first switch module 50 can be used to ground. In this way, the level of the communication signal of the electronic device 10 can be controlled by the on-off of the first switch module 50, that is, when the first switch module 50 is turned on, the electronic device 10 receives a low-level communication signal; when the first switch module 50 is turned off, the electronic device 10 receives a high-level communication signal to realize normal communication.
[0067] For example, when the first switch module 50 is turned on, the communication signal of the electronic device 10 can be reset to a low level, so that the communication signal of the electronic device 10 is input to the signal repeater 110 of the electronic device 10 as a low level. When the first switch module 50 is turned off, the communication signal of the electronic device 10 can be input to the signal repeater 110 of the electronic device 10 as a high level, so that the electronic device 10 can realize normal communication function.
[0068] Specifically, the level input module 60 is connected to the control end of the first switch module 50.
[0069] In the electronic device boot state, the level input module inputs a low level to the first switch module to turn off the first switch module; in the electronic device shutdown state, the level input module inputs a high level to the first switch module to turn on the first switch module, so that the communication test device can test the electronic device when the electronic device is shut down.
[0070] Optionally, the level input module 60 can be used to input a level signal to control the on-off of the first switch module 50.
[0071] For example, the output end of the level input module 60 can be connected to the control end of the first switch module 50, and different level signals can be input to the first switch module 50.
[0072] For example, when the electronic device 10 is powered on, a low-level signal can be input to the first switch module 50 to make the first switch module 50 off, at this time, the communication signal of the electronic device will not be placed at a low level, so that the electronic device 10 can realize normal communication function. When the electronic device 10 is powered off, a high-level signal can be input to the first switch module 50 to make the first switch module 50 conductive, at this time, the communication signal of the electronic device will be placed at a low level, and the voltage will not flow back to the signal repeater of the electronic device through the communication signal, so that the electronic device 10 can realize normal test function, ensure the compatibility between the electronic device 10 and the communication test equipment 20, avoid the voltage from the communication test equipment 20, through the communication signal channel, back to the inside of the electronic device 10, causing test failure, so as to improve the test efficiency of the electronic device 10.
[0073] In practical application, under the power-on state of the electronic device 10, the level input module 60 inputs a low level to the first switch module 50 to make the first switch module 50 off, so that the communication signal of the electronic device 10 is input to the signal repeater 110 of the electronic device 10, so that the electronic device 10 can realize normal communication function under the power-on state of the electronic device 10.
[0074] Under the power-off state of the electronic device 10, the level input module 60 inputs a high level to the first switch module 50 to make the first switch module 50 conductive, so that the communication signal is placed at a low level, and the signal repeater 110 of the electronic device 10 inputs the low-level communication signal, avoiding the voltage from flowing back through the communication signal, so that the signal repeater 110 of the electronic device 10 can receive the test signal to complete the test, so that the communication test equipment 20 can successfully complete the test of the electronic device 10 when the electronic device 10 is powered off, avoiding the test failure caused by the voltage flowing back through the communication signal to the signal repeater 110 of the electronic device 10.
[0075] In some examples, the level input module 60 can rely on the existing power-on and power-off state of the electronic device 10 to realize the output of the level signal, for example, a conventional relay on-off setting can be used to output a low level when the electronic device 10 is powered on, and output a high level when the electronic device 10 is powered off.
[0076] In the embodiment, through the above structure, the electronic device 10 can ensure that the communication signal of the electronic device 10 is pulled down when the test is performed in the power-off state, so that the voltage of the communication test device 20 cannot flow back to the electronic device 10 through the communication signal during the test, thereby ensuring that the signal relay 110 of the electronic device 10 can ensure the normal test signal, so that the test can be normally completed. At the same time, through the above structure, the communication signal can be normally input to the signal relay 110 of the electronic device 10 in the power-on state, so that the normal communication function of the electronic device 10 can be used. In this way, through the above structure, the normal function can be used in the power-on state, and the test influence caused by the unnecessary voltage flowing back to the electronic device 10 through the communication signal during the test can be avoided, thereby ensuring the normal test in the power-off state and improving the test efficiency of the electronic device 10.
[0077] In one exemplary embodiment, Figure 3 A structure of a test reset circuit provided in the embodiment Figure Two As Figure 3 shown, based on Figure 2 , the test reset circuit is exemplarily illustrated, and the level input module 60 includes a second switch module 610.
[0078] The input end of the second switch module 610 is used for accessing a high level, the output end of the second switch module 610 is used for grounding, and the control end of the second switch module 610 is used for accessing a variable level signal.
[0079] The control end of the first switch module 50 is connected to the input end of the second switch module 610, and is also used for accessing a high level.
[0080] In the power-on state of the electronic device 10, the variable level signal is a high level, so that the second switch module 610 is turned on, and in the power-off state of the electronic device 10, the variable level signal is a low level, so that the second switch module 610 is turned off.
[0081] The second switch module 610 can be a switch module for controlling the input of a low level or a high level to the first switch module 50.
[0082] Exemplarily, the input end of the second switch module 610 can be directly used for accessing a high level, and the control end of the first switch module 50 connected to the input end of the second switch module 610 is also used for accessing the high level. The output end of the second switch module 610 is used for grounding. In this way, the flow direction of the high level can be controlled through the on-off of the second switch module 610.
[0083] For example, if the second switch module 610 is on, the high level flows to the ground, that is, the control end of the first switch module 50 is placed at a low level, so that the first switch module 50 is off; if the second switch module 610 is off, the high level flows to the control end of the first switch module 50, that is, the control end of the first switch module 50 is placed at a high level, so that the first switch module 50 is on.
[0084] The control end of the second switch module 610 is used to access the variable level signal. In this way, the on-off of the second switch module 610 can be controlled by the variable level signal.
[0085] Specifically, in the power-on state of the electronic device 10, the variable level signal is a high level, so that the control end of the second switch module 610 can be input with a high level, so that the second switch module 610 is on, that is, the control end of the first switch module 50 is placed at a low level, so that the first switch module 50 is off; when the first switch module 50 is off, the communication signal can be input to the signal repeater 110 of the electronic device 10, so that the electronic device 10 can realize normal communication function when the electronic device 10 is powered on.
[0086] In the power-off state of the electronic device 10, the variable level signal is a low level, so that the control end of the second switch module 610 can be output with a low level, so that the second switch module 610 is off, that is, the control end of the first switch module 50 is placed at a high level, so that the first switch module 50 is on; in this way, the communication signal can be placed at a low level when the electronic device 10 is powered off, that is, the unwanted voltage is prevented from being back-irrigated to the electronic device 10 through the communication signal, so that the electronic device 10 can be tested smoothly, thereby ensuring the correctness of the test and improving the efficiency.
[0087] In practical applications, the variable level signal can be determined by the power-on and power-off states of the electronic device 10, for example, a high level can be output to the second switch module 610 when the electronic device 10 is powered on, and a low level can be output to the second switch module 610 when the electronic device 10 is powered off. The above-mentioned different level signals output by the electronic device 10 in different power-on and power-off states can be realized by the existing circuit structure design.
[0088] In the embodiment, the input end of the second switch module 610 is connected to a high level, the control end of the first switch module 50 is connected to the input end of the second switch module 610 and is also connected to a high level, the output end of the second switch module 610 is connected to the ground, and the control end of the second switch module 610 is connected to a variable level signal. In this way, the second switch module 610 can be controlled to be turned on or turned off through the variable level signal, and the first switch can be controlled to be turned on or turned off. In this way, the normal communication function of the electronic device 10 can be ensured when the electronic device 10 is turned on, and the normal test of the electronic device 10 can be ensured when the electronic device 10 is turned off, so that the test efficiency of the electronic device 10 can be improved while ensuring the normal communication function of the electronic device 10.
[0089] In one example embodiment, Figure 4 A structure of a test reset circuit provided in the embodiment Figure Three As Figure 4 shown, based on Figure 2 and Figure 3 , the test reset circuit is exemplarily described, wherein the HPDsingle is a communication signal, and the level input module 60 further includes:
[0090] The first resistor R1 has one end connected to the input end of the second switch module 610 and the other end connected to a high level.
[0091] Exemplarily, the first resistor R1 is connected between the input end of the second switch module 610 and the high level. One end of the first resistor R1 is connected to the input end of the second switch module 610, and the other end of the first resistor R1 is connected to the high level, that is, the input end of the second switch module 610 is connected to the high level through the first resistor R1. In this way, the input end of the second switch module 610 can be divided by the first resistor R1, so that the normal use of the second switch module 610 can be protected.
[0092] In the embodiment, one end of the first resistor R1 is connected to the input end of the second switch module 610, and the other end of the first resistor R1 is connected to a high level, so that the second switch module 610 can be protected by voltage division, and the normal use of the test reset circuit can be ensured.
[0093] In one example embodiment, as Figure 4 shown, the level input module 60 further includes:
[0094] The second resistor R2 has one end connected to the control end of the second switch module 610 and the other end connected to a variable level signal.
[0095] Exemplarily, one end of the second resistor R2 is connected to the control end of the second switch module 610, and the other end of the second resistor R2 is used to connect the output end of the variable level signal, that is, the control end of the second switch module 610 can be connected to the high level through the second resistor R2. In this way, the control end of the second switch module 610 can be divided by the second resistor R2, so as to protect the normal use of the second switch module 610.
[0096] In the embodiment, one end of the second resistor R2 is connected to the control end of the second switch module 610, and the other end of the second resistor R2 is used to connect the variable level signal. When the variable level signal is high, the control end of the second switch module 610 can be protected by voltage division, so as to ensure the normal use of the test reset circuit.
[0097] In an exemplary embodiment, as shown in Figure 4 The level input module 60 further comprises:
[0098] The pull-down resistor R3 has one end connected to the control end of the second switch module 610 and one end of the second resistor R2, and the other end is used to be grounded.
[0099] Exemplarily, one end of the pull-down resistor R3 is connected to the control end of the second switch module 610 and one end of the second resistor R2, and the other end of the pull-down resistor R3 is used to be grounded. That is, the control end of the second switch module 610 is also grounded through the pull-down resistor R3. In this way, when the variable level signal is low, the control end of the second switch module 610 can be maintained in a low level state, the state of the control end of the second switch module 610 is stabilized, and the stability of the test reset circuit can be enhanced.
[0100] In an exemplary embodiment, as shown in Figure 4 The second switch module 610 is a first MOS tube N1, the control end of the second switch module 610 is the gate of the first MOS tube N1, the input end of the second switch module 610 is the drain of the first MOS tube N1, and the output end of the second switch module 610 is the source of the first MOS tube N1.
[0101] The first MOS tube N1 can be an NMOS tube.
[0102] The gate of the first MOS transistor N1 is connected to the variable level signal through the second resistor R2, and is also connected to the ground through the pull-down resistor R3. The drain of the first MOS transistor N1 is connected to the high level through the first resistor R1, and the source of the first MOS transistor N1 is connected to the ground. In this way, the level signal input control of the control end of the first switch module 50 can be realized through the above structure. In this way, the normal communication function of the electronic device 10 when starting can be ensured, and the normal test of the electronic device 10 when shutting down can be ensured, so that the test efficiency of the electronic device 10 can be improved while ensuring the normal communication function of the electronic device 10.
[0103] In one exemplary embodiment, as shown in Figure 4 the first switch module 50 is a second MOS transistor N2, the control end of the first switch module 50 is the gate of the second MOS transistor N2, the input end of the first switch module 50 is the drain of the second MOS transistor N2, and the output end of the first switch module 50 is the source of the second MOS transistor N2.
[0104] The second MOS transistor N2 can be an NMOS transistor.
[0105] The gate of the second MOS transistor N2 is connected to the drain of the first MOS transistor N1 and is also connected to the high level, the drain of the second MOS transistor N2 is connected to the communication signal and can also be connected to the signal repeater 110 of the electronic device 10, and the source of the second MOS transistor N2 is connected to the ground. In this way, the above structure can be realized to control the flow direction of the communication signal.
[0106] By using the structure of the second MOS transistor N2 in the test reset circuit, the communication signal of the electronic device 10 can be pulled down when the electronic device 10 is in the shutdown state and is being tested, so that the voltage of the communication test equipment 20 cannot be fed back to the electronic device 10 through the communication signal during the test, so that the signal repeater 110 of the electronic device 10 can ensure the normal test signal, so that the test can be completed normally. At the same time, through the above structure, the communication signal can be normally input to the signal repeater 110 of the electronic device 10 when the electronic device 10 is in the startup state, so that the normal communication function of the electronic device 10 can be realized. In this way, the normal function in the startup state can be realized through the above structure, and the test influence caused by the unnecessary voltage fed back to the electronic device 10 through the communication signal during the test can be avoided, so that the normal test in the shutdown state can be ensured, and the test efficiency of the electronic device 10 can be improved.
[0107] In some embodiments, the electronic device 10 comprises an HDMI module chip, and a two-stage MOS control can be added to the HDMI module chip, and the HPD signal is pulled low after the electronic device 10 is powered off, so as to ensure the test of the electronic device 10. The two-stage MOS control can be realized by the first MOS N1 and the second MOS N2 in the above embodiments.
[0108] In an exemplary embodiment, Figure 5 A structural schematic diagram of an electronic device 10 provided in the embodiments of the present application is shown in FIG. 1. Figure 5 As shown in FIG. 1, the electronic device 10 comprises:
[0109] A communication port module 101 having a signal repeater 110 for enhancing the communication signal of the communication port module.
[0110] The test reset circuit as described above is connected to the communication port module.
[0111] Exemplarily, the electronic device 10 can be provided with the test reset circuit as described above, and the test reset circuit is connected to the communication port module of the electronic device 10.
[0112] Specifically, the test reset circuit is realized by the above embodiments, and the specific structure can refer to the above embodiments, which will not be described here.
[0113] In the embodiments, by setting the test reset circuit in the electronic device 10, the circuit setting of the electronic device 10 can be adjusted so that the electronic device 10 can be adapted to any communication test device 20, that is, by setting the test reset circuit as described above, the test failure caused by the voltage of the communication test device 20 backflowing into the electronic device 10 through the communication signal can be avoided, so that the electronic device 10 can successfully complete the test, thereby ensuring the test correctness and improving the efficiency.
[0114] In an exemplary embodiment, the present application provides a communication test device 20, which comprises:
[0115] The test reset circuit as described above,
[0116] The test reset circuit is used to connect the communication port module of the electronic device 10, and the communication port module has a signal repeater 110 for enhancing the communication signal of the communication port module.
[0117] The communication test device 20 can be an extended display identification data (EDID, Extended display identification data).
[0118] Exemplarily, the communication test device 20 can be provided with the test reset circuit as described above, and the test reset circuit can be used to connect the communication port module of the electronic device 10.
[0119] Specifically, the test reset circuit is implemented through the above-described various embodiments, and the specific structure can refer to the above-described various embodiments, which will not be described here.
[0120] In this embodiment, by setting the test reset circuit in the communication test device 20, the circuit setting of the communication test device 20 can be adjusted so that the communication test device 20 can be adapted to any electronic device 10, that is, through the test reset circuit setting as described above, the test failure caused by the voltage of the communication test device 20 back-feeding into the electronic device 10 to be tested through the communication signal can be avoided, so that the electronic device 10 can successfully complete the test, thereby ensuring the test correctness and improving the efficiency.
[0121] In one exemplary embodiment, as shown in Figure 1 A communication test system is provided, which comprises:
[0122] The communication test device 20 as described above is used to connect the electronic device 10 and perform communication test on the electronic device 10.
[0123] The test output device 30 is connected to the communication test device 20 and is used to output the communication test result.
[0124] The power supply 40 is connected to the communication test device 20.
[0125] The test output device 30 can be an oscilloscope and can be used to display waveform results. The power supply 40 can be a DC source. As an example, the DC source provides power to the communication test device 20 (EDID), and when the EDID is connected to the electronic device 10 (DUT), the system is in S5 state, and the 3.3V voltage provided by the power supply back-feeds into the DUT through the HDMI high-speed signal channel from the test fixture EDID, which will cause test failure.
[0126] Exemplarily, in the communication test system, through the test reset circuit setting as described above, the test failure caused by the voltage of the communication test device 20 back-feeding into the electronic device 10 to be tested through the communication signal can be avoided, so that the electronic device 10 can successfully complete the test, thereby ensuring the test correctness and improving the efficiency.
[0127] Finally, it should be noted that the terms "first", "second", and the like, herein do not denote any order, quantity, combination, or importance, but rather are used to distinguish one element from another, and are not intended to denote the presence of any such actual relationship or order. Moreover, the terms "include", "have", or any other variant thereof are intended to cover a non-exclusive inclusion, such that processes, articles, or apparatuses that comprise a list of elements are not required to comprise only those elements on the list, but can include other elements not expressly listed, or even other elements that are inherent to such processes, articles, or apparatuses. Without more constraints, an element preceded by "comprising" does not exclude the presence of additional identical elements in the process, article, or apparatus that includes the element.
[0128] The various embodiments described in this specification are presented by way of example, and are not intended to limit the scope of the application. Each embodiment is presented highlighting the differences from the other embodiments, and the embodiments can be combined as desired, and the same or similar parts are cross-referenced.
[0129] The above description of disclosed embodiments provides enough information to enable one of ordinary skill in the art to practice or use the application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein can be applied to other embodiments without departing from the spirit or scope of the application. Accordingly, the application is not to be restricted based on the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims
1. A test reset circuit, characterized by, The application is applied to an electronic device, the electronic device comprises a communication port module, the communication port module has a signal repeater, the signal repeater is used for enhancing the communication signal of the communication port module, the communication port module is used for connecting a communication test device, and the circuit comprises: a first switch module, an input end of the first switch module is used for accessing the communication signal of the electronic device, and an output end of the first switch module is used for grounding; a level input module, a control end of the first switch module is connected to the level input module; wherein, in the state of starting the electronic device, the level input module inputs a low level to the first switch module, so that the first switch module is disconnected; in the state of shutting down the electronic device, the level input module inputs a high level to the first switch module, so that the first switch module is turned on, so that when the electronic device is shut down, the communication test device is used for testing the electronic device.
2. The circuit of claim 1, wherein, The level input module comprises a second switch module; an input end of the second switch module is used for accessing a high level, an output end of the second switch module is used for grounding, and a control end of the second switch module is used for accessing a variable level signal; the control end of the first switch module is connected to the input end of the second switch module, and is also used for accessing the high level; wherein, in the state of starting the electronic device, the variable level signal is a high level, so that the second switch module is turned on, and in the state of shutting down the electronic device, the variable level signal is a low level, so that the second switch module is disconnected.
3. The circuit of claim 2, wherein, The level input module further comprises: a first resistor, one end of the first resistor is connected to the input end of the second switch module, and the other end of the first resistor is used for accessing the high level.
4. The circuit of claim 2, wherein, The level input module further comprises: a second resistor, one end of the second resistor is connected to the control end of the second switch module, and the other end of the second resistor is used for accessing the variable level signal.
5. The circuit of claim 4, wherein, The level input module further comprises: a pull-down resistor, one end of the pull-down resistor is connected to the control end of the second switch module and one end of the second resistor respectively, and the other end of the pull-down resistor is used for grounding.
6. The circuit of any one of claims 2 to 4, wherein, The second switch module is a first MOS tube, the control end of the second switch module is a gate of the first MOS tube, the input end of the second switch module is a drain of the first MOS tube, and the output end of the second switch module is a source of the first MOS tube.
7. The circuit of claim 1, wherein, The first switch module is a second MOS tube, the control end of the first switch module is a gate of the second MOS tube, the input end of the first switch module is a drain of the second MOS tube, and the output end of the first switch module is a source of the second MOS tube.
8. An electronic device, comprising: The electronic device comprises: a communication port module, the communication port module has a signal repeater, the signal repeater is used for enhancing the communication signal of the communication port module; The test reset circuit according to any one of claims 1 to 7 is connected to the communication port module.
9. A communications test apparatus, characterized by, The test device comprises: The test reset circuit according to any one of claims 1 to 7, The test reset circuit is used for connecting a communication port module of an electronic device, and the communication port module has a signal repeater for enhancing communication signals of the communication port module.
10. A communication test system, characterized by, The communication test system comprises: The communication test device according to claim 9 is used for connecting an electronic device and performing communication test on the electronic device. A test output device is connected to the communication test device and used for outputting a communication test result. A power supply is connected to the communication test device.