Automatic testing device for wireless transmitting chip

Abstract

The utility model discloses an automatic testing device for a wireless transmitting chip, which comprises a testing PCB (printed circuit board), a testing table is embedded and fixed on the surface of the testing PCB, a chip body is arranged inside the testing table, a clamping seat is fixedly arranged on the surface of the chip body, the clamping seat comprises stress sheets fixed on two sides of the clamping seat, an opening is arranged in the middle of the clamping seat, and the stress sheets are fixed on the stress sheets. Meanwhile, a clamping piece is fixedly installed at the bottom of the clamping seat, a supporting piece is fixedly installed at the bottom of the clamping piece, and a jig is fixedly arranged in the test board. According to the automatic testing device for the wireless transmitting chip, two groups of stress sheets are held by hands, a chip body installed in a testing groove is taken down in a horizontal mode, the chip body can be rapidly taken out from the interior of a testing table, and in the taking-out process, the situation that pins are bent and broken is avoided; and the situation that the subsequent welding or packaging quality of the chip is influenced by the deformation of the pin, and even the chip cannot work normally possibly is avoided.

Description

TECHNICAL FIELD

[0001] The utility model relates to chip testing device field, concretely to a wireless transmitting chip automation testing device. BACKGROUND

[0002] The wireless transmitting chip is an integrated circuit chip, and the main function is to convert the electric signal into the wireless signal and transmits, it is the key component in the wireless communication system, can realize data, voice, image etc.

[0003] When using the IC testing fixture to carry out the automation detection to the wireless transmitting chip, according to the packaging form, pin number and pitch of the wireless transmitting chip, select the appropriate IC testing fixture, such as the chip of QFN package needs to select the QFN testing fixture matched with it, install the selected testing fixture in the corresponding position of the automation testing equipment, and ensure the stable connection.

[0004] Device connection and debugging: the automation testing equipment with the installed fixture is connected with power supply, signal source, spectrum analyzer, oscilloscope and other test instruments, then the equipment and instrument are started, initialization setting and debugging are carried out, ensure that the communication between each device is normal, and the test parameter setting is accurate.

[0005] When the wireless transmitting chip is placed in the testing fixture, the wireless transmitting chip tested in the testing fixture is thin, and the pin of the thin chip is usually also thin when taking out from the testing fixture, in the taking-out process, the pin may be bent or broken due to the friction or collision with the internal structure of the fixture, the pin deformation may affect the subsequent welding or packaging quality of the chip, and even may directly cause the chip to work abnormally. UTILITY MODEL CONTENTS

[0006] The utility model aims at providing a wireless transmitting chip automation testing device to solve the defects mentioned in the background art.

[0007] To achieve the above object, a wireless transmitting chip automation testing device is provided, which comprises a test PCB, a test table is embedded and fixed on the surface of the test PCB, a chip body is arranged in the test table, a clamping seat is fixed on the surface of the chip body, the clamping seat comprises stress pieces fixed on both sides thereof, an opening is formed in the middle of the clamping seat, a clamping piece is fixedly installed on the bottom of the clamping seat, a supporting piece is fixedly installed on the bottom of the clamping piece, a fixture is fixedly arranged in the test table, and a test groove is formed in the fixture.

[0008] Preferably, the test slot is matched with the size of the chip body, and the chip body is clamped in the test slot, and the two sides of the test slot are provided with accommodating openings.

[0009] Preferably, the bottom of the two groups of accommodating openings is provided with an insertion port, and the bottom of the clamping seat is fixedly provided with a card, and the card and the support piece fixedly arranged at the bottom are combined together to form an L shape.

[0010] Preferably, the card is matched with the size of the accommodating opening, and the card is clamped downward in the accommodating opening, and the support piece is installed in the insertion port.

[0011] Preferably, the inner wall of the card is fixedly bonded with a rubber pad, and the chip positioning area is formed between the two groups of cards, and the chip body is clamped in the chip positioning area.

[0012] Preferably, the tail end of the clamping seat is fixedly provided with two groups of limiting stops, and the limiting stop is provided in an L shape.

[0013] Preferably, the surface of the test table is provided with accommodating grooves on both sides, and the accommodating grooves are matched with the size of the stress piece, and the stress piece is clamped in the accommodating groove by downward movement.

[0014] Compared with the prior art, the beneficial effects of the utility model are: the chip body installed in the test slot can be quickly taken out in the test table by holding the two groups of stress pieces in a horizontal manner, and the pin bending and breaking does not occur in the taking-out process; the pin deformation does not affect the subsequent welding or packaging quality of the chip, and even can directly lead to the situation that the chip cannot work normally. BRIEF DESCRIPTION OF DRAWINGS

[0015] Figure 1 It is a front view of the structure of the utility model;

[0016] Figure 2 It is a bottom view; Figure 1

[0017] Figure 3 It is a clamping seat schematic diagram;

[0018] Figure 4 It is a test PCB and test table schematic diagram;

[0019] Figure 5 It is a test table structure schematic diagram;

[0020] Figure 6 It is a sectional view. Figure 1

[0021] ​​The figure label: 1, test PCB; 2, test table; 21, containing groove; 22, fixture; 23, test slot; 24, containing mouth; 25, plug interface; 3, chip body; 4, card holder; 41, stress sheet; 42, opening; 43, card; 44, support sheet; 45, rubber pad; 46, limit stop. DETAILED DESCRIPTION

[0022] Please refer to Figures 1-6 The utility model provides a kind of automatic test device of wireless transmitting chip, including test PCB1, test PCB1 surface inlay fixed with test table 2, and the inside of test table 2 is provided with chip body 3, while the surface of chip body 3 is fixedly provided with card holder 4, card holder 4 includes the stress sheet 41 fixed in its both sides, and the middle part of card holder 4 is equipped with opening 42, while the bottom of card holder 4 is fixedly installed with card 43, and the bottom of card 43 is fixedly installed with support sheet 44, the inside of test table 2 is fixedly provided with fixture 22, and the inside of fixture 22 is equipped with test slot 23.

[0023] Working principle: first, chip body 3 is clamped in the bottom of card holder 4, and card 43 is arranged on the both sides of the bottom of card holder 4, and chip positioning area is formed between the two groups of card 43, while chip body 3 is clamped in the inside of chip positioning area, when holding stress sheet 41, two groups of stress sheet 41 are clamped in the containing groove 21 inside the surface of test table 2, at this time, card 43 is clamped in the inside of containing mouth 24, while support sheet 44 is installed in the inside of plug interface 25, and the sealing cover outside test table 2 is closed, so that test PCB1 and test table 2 can be used to detect chip body 3;

[0024] When it is needed to take out the tested chip body 3, the sealing cover is opened, and the two groups of stress sheet 41 are held, and the chip body 3 installed in the inside of test slot 23 is taken out in horizontal mode, so that the chip body 3 can be quickly taken out in the inside of test table 2, and the pins will not be bent or broken during the taking-out process; the deformation of the pins will not affect the subsequent welding or packaging quality of the chip, and even can directly cause the chip to work abnormally;

[0025] The setting of containing mouth 24 and plug interface 25 can accommodate card 43 and support sheet 44, so that the bottom surface of chip body 3 can be closely attached to the inside surface of test slot 23, and the pins at the bottom of chip body 3 can be inserted into test table 2 for testing work.

[0026] As a preferred embodiment, the size of test slot 23 is matched with that of chip body 3, and chip body 3 is clamped in the inside of test slot 23, and containing mouth 24 is arranged on the both sides of test slot 23.

[0027] The bottom of the two groups of accommodating openings 24 is provided with an inserting opening 25, and the bottom of the clamping seat 4 is fixedly provided with a clamping card 43, and the clamping card 43 and the support sheet 44 fixedly arranged at the bottom thereof are combined together to form an "L" shape.

[0028] As a preferable embodiment, the clamping card 43 is matched with the size of the accommodating opening 24, and the clamping card 43 is downwardly clamped in the interior of the accommodating opening 24, and the bottom of the support sheet 44 is mounted in the interior of the inserting opening 25.

[0029] The inner wall of the clamping card 43 is fixedly bonded with a rubber pad 45, and the chip positioning area is formed between the two groups of clamping cards 43, and the chip body 3 is clamped in the interior of the chip positioning area.

[0030] As a preferable embodiment, the tail end of the clamping seat 4 is fixedly provided with two groups of limiting stops 46, and the limiting stops 46 are provided in an "L" shape.

[0031] The surface of the test bench 2 is provided with an accommodating groove 21 at both sides, and the accommodating groove 21 is matched with the size of the stress sheet 41, and the stress sheet 41 is downwardly clamped in the interior of the accommodating groove 21.

Claims

1. A wireless transmit chip automated test apparatus comprising a test PCB (1), characterized in that: The surface of the test PCB (1) is inlaid and fixed with a test platform (2), and the inside of the test platform (2) is provided with a chip body (3), and the surface of the chip body (3) is fixedly provided with a clamping seat (4), the clamping seat (4) includes stress pieces (41) fixed on both sides thereof, and the middle of the clamping seat (4) is provided with an opening (42), and the bottom of the clamping seat (4) is fixedly installed with a card (43), and the bottom of the card (43) is fixedly installed with a supporting piece (44), and the inside of the test platform (2) is fixedly provided with a jig (22), and the inside of the jig (22) is provided with a test slot (23).

2. The automatic test apparatus for wireless transmit chips of claim 1, wherein: The test slot (23) is matched with the size of the chip body (3), and the chip body (3) is clamped in the test slot (23), and the two sides of the test slot (23) are provided with containing openings (24).

3. The automatic test equipment for wireless transmit chip according to claim 2, wherein: The bottom of the two containing openings (24) is provided with a plug-in port (25), and the bottom of the clamping seat (4) is fixedly provided with a card (43), and the card (43) and the supporting piece (44) fixedly arranged on the bottom thereof are combined together to form an "L" shape.

4. The automatic test apparatus for wireless transmit chips of any of claims 2-3, wherein: The card (43) is matched with the size of the containing opening (24), and the card (43) is clamped downward in the containing opening (24), and the supporting piece (44) is installed in the plug-in port (25).

5. The automatic test apparatus for wireless transmit chips of claim 4, wherein: The inner wall of the card (43) is bonded and fixed with a rubber pad (45), and the chip positioning area is formed between the two cards (43), and the chip body (3) is clamped in the chip positioning area.

6. The automatic test equipment for wireless transmit chip according to claim 1, wherein: The tail end of the clamping seat (4) is fixedly provided with two limiting stops (46), and the limiting stop (46) is provided in an "L" shape.

7. The automatic test equipment for wireless transmit chip according to claim 1, wherein: The surface of the test platform (2) is provided with containing grooves (21) on both sides, and the containing grooves (21) are matched with the size of the stress pieces (41), and the stress pieces (41) are clamped downward in the containing grooves (21).

Images