Controller testing device

Abstract

A controller testing device is characterized in that a base is provided with an accommodating groove used for accommodating a controller, the controller placed in the accommodating groove is provided with a box-shaped wiring terminal, a box opening is arranged upwards, pins arranged in a matrix in the wiring terminal extend from the box bottom to the box opening along the depth direction of a box cavity, and the pins are connected with the wiring terminal. A probe seat opposite to a box opening of the wiring terminal is arranged above the wiring terminal, a probe is arranged on the lower end face of the probe seat, a combination hub is arranged on the lower end face of the probe seat, jacks in one-to-one correspondence with the pins are formed in the lower end face of the combination hub, the jacks upwards penetrate through the combination hub, and the probe is arranged in the jacks. After the combination hub is plugged with the wiring terminal, the hole cavity of the jack is utilized to restrain the probe and the pin, so that the probe is prevented from skewing, and meanwhile, the probe head of the probe is attached to the hole wall of the jack, so that the pin of the wiring terminal and the probe head of the probe are prevented from being staggered, and the probe head of the probe and the pin of the probe can be effectively propped against each other.

Description

TECHNICAL FIELD

[0001] The utility model relates to controller detection, specifically related to a controller testing device. BACKGROUND

[0002] The vehicle-mounted radar is usually composed of a sensor, a controller and a wire harness, wherein the sensor is installed on the front or tail bumper of the vehicle, and the controller is installed on the vehicle body. The sensor transmits and receives ultrasonic waves, and the signals are transmitted to the controller for operation, so that the driver can master the conditions in front of and behind the vehicle, and avoid collision between the vehicle body and obstacles.

[0003] In the production process of the radar controller, after the controller is assembled, the controller needs to be tested for electrical connection to check whether the controller can be normally used. Figure 1 As shown in the figure, the controller A is provided with a wiring terminal A1, and the wiring terminal A1 has a plurality of pins A11. During testing, the probe is used to make the needle head of the probe press against the needle tip of the pin A11 in the wiring terminal A1, so as to perform power-on detection. In the prior art, the probe is generally rod-shaped and has elasticity, and when it presses against the needle tip of the pin A11, it can elastically stretch to ensure that each pin A11 can contact the corresponding probe, and at the same time, it can avoid the situation that the pin is bent due to rigid extrusion of the probe.

[0004] The patent document with the title of "Probe" (document number CN102971842B) discloses a technical solution including an upper plunger, the upper plunger is configured to be electrically connected to a semiconductor device; a lower plunger, the lower plunger is configured to be electrically connected to a tester; an elastic member, the elastic member is disposed between the upper plunger and the lower plunger, and elastically biases the upper plunger and the lower plunger to separate the upper plunger and the lower plunger from each other; a conductive member, the conductive member is disposed in an interior or an exterior of the elastic member and electrically connects the upper plunger and the lower plunger; and a barrel portion, the barrel portion accommodates the upper plunger, the lower plunger, the elastic member, and the conductive member therein.

[0005] The patent document with the title of "Burning device" (document number CN109460242B) discloses a technical solution including a needle disc, a data transmission probe and a power supply probe assembly, the data transmission probe is connected with the needle disc; the power supply probe assembly includes a power supply probe and a reset member, the power supply probe can move, the needle head end of the power supply probe and the needle head end of the data transmission probe are located on the same side of the needle disc, the reset member can provide a restoring force to the power supply probe, so that the distance from the end of the needle head end of the power supply probe to the needle disc can be greater than the distance from the end of the needle head end of the data transmission probe to the needle disc, and the distance from the end of the needle head end of the power supply probe to the needle disc can also be equal to the distance from the end of the needle head end of the data transmission probe to the needle disc.

[0006] The technical solutions disclosed in the above technical schemes all disclose the telescopic structure design of the probe, that is, the sleeve and the rod inside the sleeve can be elastically telescoped under the action of the spring. For the test of the terminal, it is found in actual use that: due to the telescopic requirement of the probe, the structure of the probe itself cannot avoid having a certain matching gap, in addition, the probe is relatively thin and is usually made of copper material, and the pin cannot be guaranteed to be absolutely the same as the core of the probe, and when the pin is pressed for many times, the probe is prone to being bent due to uneven force, so that the needle of the probe is excessively deviated, and then the needle of the probe cannot be in abutment with the pin of the tested piece in the subsequent test. In addition, due to improper transportation or storage, some pins of the tested piece also have a slight skew phenomenon, although it does not affect normal use, but in the case that the probe already has a skew, it is more impossible for the needle of the probe to abut against the pin in the test, on the contrary, the mutual extrusion of the two is easy to aggravate the skew of the probe and the pin. SUMMARY

[0007] The utility model provides a kind of controller testing device, probe is arranged in the jack of socket, utilize the hole wall of jack to the whole probe is constrained, guarantee that probe cannot be bent, simultaneously guide pin, to be accurately abutted with the needle of probe.

[0008] In order to realize the above object, the technical scheme adopted is: a kind of controller testing device, base is provided with the accommodation slot for accommodating controller, the terminal of box shape is arranged on the controller placed in accommodation slot and box mouth is arranged upwards, the pin of matrix arrangement in terminal is extended from box bottom to box mouth along its box cavity depth direction, the probe seat opposite to the box mouth of terminal is arranged above terminal, the rod-shaped probe that is telescopic is arranged on the lower end surface of probe seat and is corresponding to pin, probe extends from probe seat to the cavity of terminal along the depth direction of the cavity of terminal, the lower end surface of probe seat is provided with the jack, the lower end surface of jack is provided with the jack hole corresponding to pin and the diameter of jack hole is greater than the diameter of pin, jack hole is through jack upwards and probe is arranged in jack hole, the hole core direction of pin, probe and jack hole is parallel and the needle of probe is arranged in conjunction with the hole wall of jack hole, when the needle of probe and the needle tip of pin are pressed mutually, the jack is inserted in the cavity of terminal, and the drive mechanism drives probe seat to descend.

[0009] Compared with prior art, the technical effect of the utility model is: after the jack is inserted with the terminal, the pin of terminal enters into the jack hole of jack, the hole cavity of jack hole is used to constrain probe and pin, so that the skew of probe itself is avoided, and since the needle of probe is arranged in conjunction with the hole wall of jack hole, the needle of probe and the pin of terminal cannot be mutually dislocated, so that the two can be effectively abutted, to ensure that the test is carried out smoothly. BRIEF DESCRIPTION OF DRAWINGS

[0010] Figure 1 This is a schematic diagram of the controller's appearance;

[0011] Figure 2 A schematic diagram showing the structure of a connector inserted into a terminal block;

[0012] Figure 3 for Figure 2 Enlarged view of part M in the image;

[0013] Figure 4 This is a schematic diagram of the bottom structure of the socket;

[0014] Figure 5 This is a schematic diagram of the probe circuit board and probes;

[0015] Figure 6 This is a three-dimensional schematic diagram of the base and probe mount.

[0016] Figure 7 This is a schematic diagram showing the probe holder in a separated position, avoiding the area above the base.

[0017] Figure 8 for Figure 6 The K-direction view in the middle;

[0018] Figure 9 This is a schematic diagram of the overall appearance of this utility model. Detailed Implementation

[0019] The following is in conjunction with the appendix Figures 1-9 The present invention will be further described in detail below, including related content:

[0020] A controller testing device includes a base 10 with a receiving groove 11 for accommodating a controller A. The controller A, placed within the receiving groove 11, has a box-shaped terminal block A1 with its opening facing upwards. A matrix of pins A11 within the terminal block A1 extends from the bottom to the opening along the depth direction of its cavity. A probe holder 20 is positioned above the terminal block A1, opposite its opening. A rod-shaped, retractable probe 21, corresponding one-to-one with each pin A11, is positioned on the lower surface of the probe holder 20. The probe 21 extends from the probe holder 20 into the cavity of the terminal block A1 along the depth direction of its cavity. A socket 22 is provided on the lower end face of the base 20. A socket 221 corresponding to the pin A11 is provided on the lower end face of the socket 22. The diameter of the socket 221 is larger than the diameter of the pin A11. The socket 221 extends upward through the socket 22 and the probe 21 is arranged in the socket 221. The pin A11, the probe 21 and the core of the socket 221 are parallel, and the tip 211 of the probe 21 is arranged in close contact with the wall of the socket 221. When the driving mechanism drives the probe base 20 to descend, the socket 22 is inserted into the cavity of the terminal A1 when the tip 211 of the probe 21 and the tip of the pin A11 press against each other.

[0021] In the above scheme, when the electrical connection test is performed on the assembled controller A, the controller A is placed in the accommodating groove 11 on the base 10, and the box mouth of the box-shaped terminal A1 on the controller A is arranged upward. The probe holder 20 is driven to move downward by the driving mechanism, so that the socket 22 moves downward synchronously with the probe holder 20 and is inserted into the box cavity of the terminal A1, and the pin A11 in the terminal A1 enters the corresponding insertion hole 221 on the socket 22. The hole cavity of the insertion hole 221 constrains the probe 21 and the pin A11, which ensures that the probe 21 itself will not be skewed, and since the needle head 211 of the probe 21 is arranged in close contact with the hole wall of the insertion hole 221, as long as the pin A11 of the terminal A1 enters the insertion hole 221, the needle tip of the pin A11 and the needle head 211 of the probe 21 will not be misaligned with each other, and the two can effectively abut in the insertion hole, ensuring that the test is carried out smoothly.

[0022] It should be noted that the telescopic structure of the probe 21 is a conventional setting in the prior art, and there are corresponding standard parts, so the telescopic structure of the probe 21 will not be described in detail in this application. In addition, in this application, the diameter of the insertion hole 221 is larger than the diameter of the pin A11 (as shown in Figure 3 ), and the pin A11 and the insertion hole 221 do not need to form a close plug-in fit, which is also to enable the pin A11 that has some skew but does not affect normal use to be inserted into the insertion hole 221.

[0023] In addition, the plug-in fit gap between the socket 22 and the terminal A1 is large, so when the driving mechanism drives the probe holder 20 to move upward, the controller A in the accommodating groove 11 does not need to be fixed, and the socket 22 can be moved out of the terminal A1 without moving upward synchronously with the controller A. Of course, a pneumatic clamp can also be provided on the base 10 to limit the upward displacement of the controller A and ensure the stability of the posture of the controller A.

[0024] As a preferred scheme, the needle head 211 of the probe 21 is cylindrical and the core is arranged along the rod core direction of the probe 21, and the lower end surface of the needle head 211 is provided with a recessed recess 2111. When the pin A11 of the terminal A1 and the needle head 211 of the probe 21 abut each other in the insertion hole 221, the inner recess surface of the recess 2111 has a guiding effect on the needle tip of the pin A11, which can guide the needle tip of the pin A11 to deviate towards the center of the needle head 211 of the probe 21, which plays a role in straightening the pin A11 to a certain extent, avoiding the pin A11 that originally has some skew from being pressed against the needle head 211 of the probe 21 to exacerbate the skew of the pin A11.

[0025] Further, as shown in Figure 3 and Figure 4As shown, the lower opening of the socket 221 is a tapered flared shape, smaller at the top and larger at the bottom. During the insertion of the socket 22 and the terminal A1, the tip of the pin A11 with a larger degree of misalignment will abut against the tapered surface of the lower end of the socket 221. Then, the socket 22 continues to be pressed into the terminal A1. The tapered surface of the socket 221 guides the pin A11 of the terminal A1, guiding the tip of the pin A11 into the internal cavity of the socket 221, thereby abutting against the tip 211 of the probe 21 inside the socket 221. Simultaneously, this also straightens the more misaligned pin A11. The purpose of this design is to guide the more misaligned pin A11 into the socket 221, enabling the pin A11 and probe 21 to abut against each other for testing. The controller A for the degree of misalignment of the pin A11 inside the terminal A1 can be manually selected beforehand.

[0026] Considering that there will inevitably be gaps between parts during installation (such as the gap between controller A and the wall of the receiving slot 11), a chamfer 222 is provided on the lower edge of the socket 22. Even if there is a slight misalignment between the lower edge of the socket 22 and the opening of the terminal A1, the chamfer 222 can guide the socket 22 into the terminal A1, so that the socket 22 and the terminal A1 can be smoothly connected for normal testing.

[0027] As a preferred option, such as Figure 2 and Figure 5 As shown, a probe circuit board 23 is provided on the probe holder 20. The probe 21, which passes through the probe circuit board 23, has a boss 212 that protrudes outward in the radial direction on its shaft. The upper end face of the boss 212 and the lower plate face of the probe circuit board 23 form an abutting fit. In the prior art, the probe 21 needs to be connected to the probe circuit board 23. The probe 21 is usually placed on the probe circuit board 23. In order to avoid the probe 21 and the pin A11 pressing against each other and causing the probe 21 to slide in the through hole on the probe circuit board 23, the boss 212 can limit the upward displacement of the probe 21 relative to the probe circuit board 23, thereby ensuring the connection stability between the probe 21 and the probe circuit board 23.

[0028] To control the raising and lowering of the probe holder 20 to connect or disconnect the connector 22 from the terminal A1, a telescopic cylinder 30 is arranged on one side of the base 10. The piston rod of the telescopic cylinder 30 is connected to the probe holder 20, and the direction of the rod core is consistent with the depth direction of the cavity of the terminal A1. The extension and retraction of the piston rod of the telescopic cylinder 30 can drive the probe holder 20 and the connector 22 on it to rise and fall.

[0029] Combination Figure 6 and Figure 7As shown, in order to facilitate the controller A placed in the accommodation groove 11 to be put in or taken out, the cylinder body of the telescopic cylinder 30 is connected with a sliding block 40, the sliding block 40 is in sliding fit with the horizontal guide rail 41, and the driving unit drives the sliding block 40 to displace along the guide rail 41 to the pressing position where the socket 22 is opposite to the box opening of the terminal A1 or to the separation position which is mutually avoided with the upper area of the base 10. When the sliding block 40 slides on the guide rail 41, the probe base 20 on the sliding block 40 and the overall structure thereon can be driven to translate synchronously, so that the probe base 20 can be in the separation position which is mutually avoided with the upper area of the base 10. At this time, the upper area of the base 10 is in the state of being completely opened, and the controller A can be taken and placed in the accommodation groove 11 straight up and straight down, and the taking and placing of materials is more convenient.

[0030] In combination Figure 9 As shown, the controller testing device further comprises a workbench 50, the base 10 is arranged on the table top of the workbench 50, and the table top of the workbench 50 is arranged with a conveying belt 60 for conveying the controller A to the base 10, and the mechanical hand grabbing unit 70 grabs the controller A to be tested placed on the conveying belt 60 to transfer into the accommodation groove 11 or grabs the controller A tested in the accommodation groove 11 to transfer into one of the defective product placement area 80A and the qualified product placement area 80B. During testing, the mechanical hand grabbing unit 70 grabs the controller A to be tested placed on the conveying belt 60 to place into the accommodation groove 11 for testing. As for the controller A tested, it can be taken out from the accommodation groove 11 by the mechanical hand grabbing unit 70, the defective controller A is transferred to the defective product placement area 80A by the mechanical hand grabbing unit 70, and the non-defective controller A is transferred to the qualified product placement area 80B, so as to realize classified storage and facilitate subsequent processing.

Claims

1. A controller testing device, a base (10) is provided with a receiving slot (11) for accommodating a controller (A), the controller (A) placed in the receiving slot (11) is provided with a box-shaped terminal (A1) with its opening facing upward, a plurality of pins (A11) arranged in a matrix in the terminal (A1) extend from the bottom to the opening along the depth direction of the box cavity, a probe seat (20) is arranged above the terminal (A1) opposite to the opening thereof, a plurality of rod-shaped and retractable probes (21) are arranged on the lower end surface of the probe seat (20) opposite to the pins (A11) one by one, the probes (21) extend from the probe seat (20) to the box cavity of the terminal (A1) along the depth direction of the box cavity of the terminal (A1), characterized in that: The lower end surface of the probe seat (20) is provided with a socket (22), and the lower end surface of the socket (22) is provided with a plurality of insertion holes (221) corresponding to the plurality of pins (A11) in one-to-one correspondence, and the diameters of the insertion holes (221) are greater than the diameters of the pins (A11). The insertion holes (221) penetrate the socket (22) upward, and the probes (21) are arranged in the insertion holes (221). The pins (A11), the probes (21) and the hole cores of the insertion holes (221) are parallel, and the needle heads (211) of the probes (21) are arranged in close contact with the hole walls of the insertion holes (221). The driving mechanism drives the probe seat (20) to descend until the needle heads (211) of the probes (21) and the needle tips of the pins (A11) are pressed against each other, and the socket (22) is inserted into the box cavity of the terminal (A1).

2. The controller test device of claim 1, wherein: The needle head (211) of the probe (21) is in a cylindrical shape, and the core of the cylinder is arranged along the rod core direction of the probe (21). The lower end surface of the needle head (211) is provided with a recessed recess (2111).

3. The controller test device of claim 1, wherein: The lower end opening of the insertion hole (221) is in a tapered flared shape with a small upper end and a large lower end.

4. The controller test device of claim 1, wherein: The lower end surface edge of the socket (22) is provided with a chamfer (222).

5. The controller test device of any one of claims 1-4, wherein: The probe seat (20) is provided with a probe circuit board (23), and the rod body of the probe (21) penetrating through the probe circuit board (23) is provided with a boss (212) protruding outward in the radial direction. The upper end surface of the boss (212) is in abutting engagement with the lower surface of the probe circuit board (23).

6. The controller test device of claim 1, wherein: The base (10) is provided with a telescopic air cylinder (30) on one side. The rod end of the piston rod of the telescopic air cylinder (30) is connected to the probe seat (20), and the rod core direction is consistent with the depth direction of the box cavity of the terminal (A1).

7. The controller test device of claim 6, wherein: The cylinder body of the telescopic air cylinder (30) is connected with a sliding block (40), and the sliding block (40) is in sliding guide engagement with a horizontal guide rail (41). The driving unit drives the sliding block (40) to displace along the guide rail (41) to a pressing position where the socket (22) is arranged opposite to the box opening of the terminal (A1), or to a separation position where the socket (22) is arranged to avoid the upper area of the base (10).

8. The controller test device of claim 1, wherein: The controller testing device further comprises a workbench (50), and the base (10) is arranged on the table top of the workbench (50). The table top of the workbench (50) is provided with a conveying belt (60) for conveying the controller (A) to the base (10). The mechanical hand grabbing unit (70) grabs the controller (A) to be tested placed on the conveying belt (60) to transfer it into the accommodation groove (11), or grabs the controller (A) tested in the accommodation groove (11) to transfer it into one of the defective product placement area (80A) and the qualified product placement area (80B).

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