Sample preparation tool for shear test

By setting multiple layers of adhesive film on the sample preparation fixture to support the adhesive, the problem of difficult cleaning after the adhesive has cured is solved, and the convenience and efficiency of adhesive cleaning are improved.

CN223769881UActive Publication Date: 2026-01-06HUBEI HUAHANG NEW MATERIALS CO LTD
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Patent Information

Application Number
CN202520280282.9
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-02-20
Publication Date
2026-01-06
Estimated Expiration
2035-02-20

AI Technical Summary

Technical Problem

In the existing sample preparation tooling, adhesive tends to fall onto the lower module and solidify during the sample preparation process, making cleaning difficult and increasing the labor intensity of the staff.

Method used

Design a shear test sample preparation fixture, including a mold base, a substrate fixing mechanism, adhesive film and lifting drive component. By setting multiple layers of adhesive film on the mold base for bonding, the adhesive film is located below the overlap area of ​​the upper and lower substrates to catch the fallen adhesive and can be easily removed and cleaned after sample preparation.

Benefits of technology

It effectively reduces the labor intensity of adhesive cleaning and improves the convenience and efficiency of the sample preparation process.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model provides a shear test sample preparation tool, and relates to the technical field of sample preparation tools, the shear test sample preparation tool comprises: a die holder, the die holder is provided with an upper die cavity for accommodating an upper substrate and a lower die cavity for accommodating a lower substrate; the substrate fixing mechanism is arranged on the die holder and is used for fixing the upper substrate and the lower substrate on the die holder; and the adhesive films are arranged on the die holder and located below the lap joint area of the upper substrate and the lower substrate, the number of the adhesive films is multiple, and the multiple adhesive films are bonded in a stacked mode. According to the shear test sample preparation tool, the adhesive films are arranged on the die holder and located below the lap joint area of the upper substrate and the lower substrate, the multiple adhesive films are stacked and bonded, when adhesive shear strength sample preparation is carried out, the adhesive film on the uppermost layer can bear falling adhesive, and after sample preparation is finished, the adhesive film on the uppermost layer can be taken away from the adhesive film on the lower substrate. And the adhesive film on the uppermost layer is torn off from the adhesive film on the lower layer, so that the falling adhesive can be conveniently cleaned, and the labor intensity of workers is effectively reduced.
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Description

Technical Field

[0001] This application relates to the technical field of sample preparation tooling, and in particular to a shear test sample preparation tooling. Background Technology

[0002] In the field of materials science, especially in the field of adhesive materials such as coatings and adhesives, shear strength is a key indicator reflecting the bonding ability of adhesives. By testing, we can understand the ability of adhesives to resist failure when subjected to forces parallel to the bonding surface, and thus determine whether they can meet the strength requirements of practical applications.

[0003] An adhesive shear strength test fixture is a device used to prepare test specimens for adhesive shear strength testing. This fixture ensures the dimensional accuracy of the specimen, the uniformity of the adhesive layer thickness, and the accuracy of the overlap position, thereby improving the accuracy and reliability of the test results. For example, utility model patent CN220473141U discloses a sample preparation fixture for a silicone shear test of photovoltaic modules. This fixture includes an upper module and a lower module, with the upper module being taller than the lower module. The upper surface of the upper module has spacing lines, with adjacent spacing lines used to place a first substrate. The lower module has multiple spacers, with grooves formed between adjacent spacers, where a second substrate is placed.

[0004] When preparing samples using the aforementioned tooling, the second substrate is placed in the groove, and adhesive is injected onto its upper surface, with the adhesive level with or slightly above the surface of the upper module. Next, the first substrate is placed within the spacing lines of the upper module, ensuring that the portion of the first substrate overlapping the second substrate in the vertical direction is in contact with the adhesive. This allows the adhesive to fill the overlapping area between the first and second substrates. After the adhesive cures and the sample is demolded, the adhesive shear strength test can be performed. However, in actual sample preparation, during the injection or overlapping process, a small amount of adhesive inevitably falls onto the lower module. Once this adhesive cures, cleaning it is quite troublesome, thus increasing the workload for the workers. Utility Model Content

[0005] The purpose of this application is to provide a shear test sample preparation fixture to solve the problem that when sample preparation fixtures in related technologies are used, a small amount of adhesive inevitably falls onto the lower module. After this adhesive hardens, it is difficult to clean and increases the labor intensity of the workers.

[0006] The shear test sample preparation tooling provided in this application adopts the following technical solution:

[0007] A shear test sample preparation fixture, comprising:

[0008] A mold base, wherein the mold base is provided with an upper mold groove for accommodating an upper substrate and a lower mold groove for accommodating a lower substrate;

[0009] A substrate fixing mechanism is provided on the mold base and is used to fix the upper substrate and the lower substrate on the mold base;

[0010] An adhesive film is disposed on the mold base and located below the overlap area of ​​the upper and lower substrates. The adhesive film consists of multiple sheets, which are stacked and bonded together.

[0011] Optionally, it also includes an adjusting shim and a shim fixing member. The adjusting shim is disposed in the upper mold groove and has multiple layers. The shim fixing member is used to fix the adjusting shim in the upper mold groove.

[0012] Optionally, the substrate fixing mechanism includes a guide rail, a pressure strip, and a guide rail fixing component. The guide rail is vertically movable on the mold base, the pressure strip is slidably disposed on the guide rail, the pressure strip is used to press down on the upper substrate and the lower substrate, and the guide rail fixing component is used to fix the guide rail on the mold base.

[0013] Optionally, the ends of the multiple adhesive films are provided with tabs, and the tabs on adjacent layers of adhesive films are staggered.

[0014] Optionally, it also includes a lifting drive, a lifting platform, and a tray. The lifting drive is disposed on the mold base and connected to the lifting platform. The tray is detachably connected to the lifting platform, and the adhesive film is disposed on the tray.

[0015] Optionally, the lifting platform is provided with a connecting hole, and the support plate is provided with connecting columns arranged in a ring. The connecting columns are inserted into the connecting hole, and the connecting columns are provided with claws to prevent the connecting columns from disengaging from the connecting hole.

[0016] Optionally, the lifting drive includes a threaded cylinder and a worm gear. A lifting screw and a guide post are fixedly mounted on the lifting platform. The guide post slides through the mold base. The threaded cylinder is rotatably mounted on the mold base and screwed to the lifting screw. A worm wheel is provided around the periphery of the threaded cylinder. The worm gear is rotatably mounted on the mold base and meshes with the worm wheel.

[0017] Optionally, it also includes a limiting plate and a telescopic drive component. The telescopic drive component is disposed on the mold base, and the limiting plate is connected to the telescopic drive component. The telescopic drive component is used to drive the limiting plate to telescopically move relative to the adhesive film. The bottom surface of the limiting plate is flush with the bottom surface of the lower mold groove.

[0018] In summary, this application includes at least the following beneficial technical effects: The shear test sample preparation fixture of this application has an adhesive film set on the mold base, and the adhesive film is located below the overlap area of ​​the upper and lower substrates. The adhesive film is provided in multiple layers and is laminated together. When preparing the adhesive shear strength sample, the top layer of adhesive film can catch the falling adhesive. After the sample preparation is completed, the top layer of adhesive film can be peeled off from the bottom layer of adhesive film, which facilitates the cleaning of the fallen adhesive and effectively reduces the labor intensity of the workers. Attached Figure Description

[0019] Figure 1 This is a schematic diagram of the shear test sample preparation tool in the embodiments of this application;

[0020] Figure 2 This is a cross-sectional view of the shear test sample preparation tool in the embodiments of this application from a first perspective;

[0021] Figure 3 This is a cross-sectional view of the shear test sample preparation tool in the embodiments of this application from a second perspective;

[0022] Figure 4 for Figure 3 A magnified view of part B in the middle section;

[0023] Figure 5 This is a schematic diagram of the structure of the adhesive film and the tray in the embodiments of this application;

[0024] Figure 6 for Figure 5 A magnified view of part C in the middle;

[0025] Figure 7 for Figure 2 A magnified view of part A in the middle;

[0026] Figure 8 This is a schematic diagram of the limiting plate in an embodiment of this application.

[0027] Explanation of reference numerals in the attached figures:

[0028] 10. Mold base; 11. Upper mold groove; 12. Lower mold groove; 13. First stud; 14. Second stud; 15. Guide groove; 16. Through groove;

[0029] 20. Substrate fixing mechanism; 21. Guide rail; 211. Sliding sleeve; 22. Pressure strip; 221. Sliding block; 23. Second nut;

[0030] 30. Adhesive film; 31. Raised sheet; 40. Adjusting shim;

[0031] 50. First nut; 60. Lifting drive component; 61. Threaded cylinder; 611. Worm gear; 62. Worm;

[0032] 70. Lifting platform; 71. Connecting hole; 72. Lifting screw; 73. Guide column;

[0033] 80. Pallet; 81. Connecting post; 811. Clamping claw;

[0034] 90. Limiting plate; 91. Slide table; 92. Screw sleeve; 100. Telescopic drive screw. Detailed Implementation

[0035] The following is in conjunction with the appendix Figure 1 -Appendix Figure 8 This application will be described in further detail below.

[0036] This application discloses a shear test sample preparation tool.

[0037] A shear test sample preparation fixture includes a mold base 10, a substrate fixing mechanism 20, an adhesive film 30, an adjusting shim 40, a shim fixing component, a lifting drive component 60, a lifting platform 70, a support plate 80, a limiting plate 90, and a telescopic drive component.

[0038] Reference Figure 1 and Figure 2 The mold base 10 is provided with an upper mold groove 11 for accommodating the upper substrate and a lower mold groove 12 for accommodating the lower substrate. An adjusting shim 40 is provided in the upper mold groove 11. The adjusting shim 40 has multiple layers. The shim fixing member is used to fix the adjusting shim 40 in the upper mold groove 11.

[0039] In an optional embodiment, the specific structure of the gasket fixing member and its specific connection relationship with the mold base 10 are as follows: the gasket fixing member is a first nut 50, the mold base 10 is provided with a first stud 13, the adjusting shim 40 is provided with a through hole, the first stud 13 passes through the through hole, the first nut 50 is screwed to the first stud 13 and abuts against the uppermost adjusting shim 40.

[0040] When preparing adhesive shear strength samples, the upper substrate is placed on the adjusting shim 40. By increasing or decreasing the number of layers of the adjusting shim 40, the height of the upper substrate placed in the upper mold groove 11 can be adjusted, thereby adjusting the vertical spacing between the upper substrate and the lower substrate, and thus adjusting the adhesive thickness in the overlapping area to meet the sample preparation needs of different bonding thicknesses.

[0041] Reference Figure 1 and Figure 2 The substrate fixing mechanism 20 is disposed on the mold base 10 and is used to fix the upper substrate and the lower substrate to the mold base 10. In an optional embodiment, the specific structure of the substrate fixing mechanism 20 and its specific connection relationship with the mold base 10, the upper substrate and the lower substrate are as follows:

[0042] The substrate fixing mechanism 20 includes a guide rail 21, a pressure strip 22, and a guide rail fixing component. The guide rail 21 is vertically movable on the mold base 10. The guide rail fixing component is used to fix the guide rail 21 on the mold base 10. The guide rail fixing component can be a second nut 23. More specifically, the mold base 10 is provided with a second stud 14, and the guide rail 21 is provided with a sliding sleeve 211. The guide rail 21 is sleeved on the second stud 14 through the sliding sleeve 211. The second nut 23 is screwed to the second stud 14 and can abut against the upper end face of the sliding sleeve 211.

[0043] The pressure strip 22 is provided with a slider 221. The pressure strip 22 is slidably mounted on the guide rail 21 via the slider 221. The pressure strip 22 is used to press down on the upper substrate and the lower substrate, thereby fixing the upper substrate and the lower substrate on the mold base 10. The upper substrate and the lower substrate are respectively pressed and fixed by two pressure strips 22.

[0044] Reference Figures 3 to 6 The adhesive film 30 is placed on the mold base 10 and located below the overlap area of ​​the upper and lower substrates. Multiple adhesive films 30 are stacked and bonded together. During adhesive shear strength testing, the top layer of adhesive film 30 can catch any falling adhesive. After testing, the top layer of adhesive film 30 is peeled off from the bottom layers, facilitating the cleanup of fallen adhesive and effectively reducing the workload of workers. To facilitate the removal of the adhesive film 30, protrusions 31 are provided at the ends of the multiple adhesive films 30. When removing the adhesive film 30, workers only need to pinch the protrusions 31 to tear it off. The protrusions 31 on adjacent layers of adhesive film 30 are staggered, making it easy for workers to grasp the protrusions 31 by hand.

[0045] Reference Figures 2 to 7 A lifting drive component 60 is mounted on the mold base 10 and connected to the lifting platform 70. A support plate 80 is detachably connected to the lifting platform 70, and a film 30 is mounted on the support plate 80. A telescopic drive component is mounted on the mold base 10, and a limiting plate 90 is connected to the telescopic drive component. The telescopic drive component is used to drive the limiting plate 90 to telescopically move relative to the film 30. The bottom surface of the limiting plate 90 is flush with the bottom surface of the lower mold groove 12.

[0046] The lifting platform 70 can be raised and lowered by the lifting drive 60, thereby adjusting the height of the adhesive film 30. When the upper surface of the uppermost adhesive film 30 contacts the bottom surface of the limiting plate 90, the upper surface of the uppermost adhesive film 30 is flush with the bottom surface of the lower mold groove 12. When it is necessary to remove the uppermost adhesive film 30, the limiting plate 90 is moved away from above the adhesive film 30 by the telescopic drive to avoid interfering with the removal operation of the adhesive film 30.

[0047] When all the adhesive film 30 on the tray 80 is used up, the tray 80 can be removed from the lifting platform 70 to replace it with a new adhesive film 30. The tray 80 and the lifting platform 70 can be connected in the following way: the lifting platform 70 is provided with a connecting hole 71, and the tray 80 is provided with a ring of connecting posts 81. The connecting posts 81 are inserted into the connecting hole 71, and the connecting posts 81 are provided with a claw 811 to prevent the connecting posts 81 from disengaging from the connecting hole 71.

[0048] Reference Figures 2 to 8 In an optional embodiment, the specific structure of the lifting drive 60 and its specific connection relationship with the lifting platform 70 are as follows: The lifting drive 60 includes a threaded cylinder 61 and a worm gear 62. The lifting screw 72 and a guide post 73 are fixedly provided on the lifting platform 70. The guide post 73 is slidably disposed on the mold base 10. The threaded cylinder 61 is rotatably disposed on the mold base 10 and screwed to the lifting screw 72. A worm wheel 611 is provided around the periphery of the threaded cylinder 61. The worm gear 62 is rotatably disposed on the mold base 10 and meshes with the worm wheel 611.

[0049] The specific structure of the telescopic drive component and its specific connection relationship with the limiting plate 90 are as follows: The telescopic drive component includes a telescopic drive screw 100, a guide groove 15 and a through groove 16 that communicates with the guide groove 15 on the mold base 10, a slide 91 on the limiting plate 90, the slide 91 being slidably disposed in the guide groove 15, the limiting plate 90 being disposed through the through groove 16, a screw sleeve 92 on the slide 91, and the telescopic drive screw 100 being rotatably disposed on the mold base 10 and screwed to the screw sleeve 92.

[0050] The implementation principle of this shear test sample preparation fixture is as follows: When preparing an adhesive shear strength sample, the lower substrate is placed in the lower mold groove 12, with the overlapping area of ​​the lower substrate located on the adhesive film 30. Then, the second nut 23 is tightened, pressing down on the guide rail 21 to firmly press the pressure strip 22 onto the lower substrate, thus fixing the lower substrate. Next, adhesive is injected into the overlapping area of ​​the lower substrate. Then, the upper substrate is placed on the adjusting shim 40, and the overlapping area of ​​the upper substrate is bonded to the adhesive on the lower substrate. The pressure strip 22 is then used to press and fix the upper substrate. During the sample preparation process, some adhesive falls onto the uppermost adhesive film 30. After the adhesive has cured, the sample is demolded, and the telescopic drive screw 100 is rotated. The telescopic drive screw 100 moves the slide table 91, causing the limiting plate 90 to move away from above the adhesive film 30. Then, the uppermost adhesive film 30 is peeled off by pinching the protrusion 31 to remove the fallen adhesive. When it is necessary to prepare the next batch of samples, the telescopic drive moves the limiting plate 90 above the adhesive film 30. Then, the worm gear 62 is rotated, which drives the worm wheel 611 and the threaded cylinder 61 to rotate. Under the interaction of the threaded cylinder 61 and the lifting screw 72, the lifting table 70 is raised, so that the upper surface of the uppermost adhesive film 30 contacts the bottom surface of the limiting plate 90, making the upper surface of the uppermost adhesive film 30 flush with the bottom surface of the lower mold groove 12.

[0051] The embodiments described in this specific implementation are preferred embodiments of this application and are not intended to limit the scope of protection of this application. Identical components are represented by the same reference numerals. Therefore, all equivalent changes made to the structure, shape, and principle of this application should be covered within the scope of protection of this application.

Claims

1. A shear test specimen preparation fixture, characterized by, The utility model relates to a kind of laminating machine, including: Die holder (10), the upper die groove (11) for accommodating upper substrate and the lower die groove (12) for accommodating lower substrate are provided on the die holder (10); Substrate fixing mechanism (20), the substrate fixing mechanism (20) is provided on the die holder (10), and upper substrate and lower substrate are fixed on the die holder (10); Adhesive film (30), the adhesive film (30) is provided on the die holder (10), and is located below the overlap area of upper substrate and lower substrate, the adhesive film (30) is provided with multiple pieces, and multiple pieces of the adhesive film (30) are laminated and bonded.

2. The shear test sample preparation tooling of claim 1, wherein, It also includes adjusting gasket (40) and gasket fixing part, the adjusting gasket (40) is provided in the upper die groove (11), the adjusting gasket (40) is provided with multiple layers, and the gasket fixing part is used to fix the adjusting gasket (40) in the upper die groove (11).

3. The shear test sample preparation tooling of claim 1, wherein, The substrate fixing mechanism (20) includes guide rail (21), pressing strip (22) and guide rail fixing part, the guide rail (21) is vertically liftable and provided on the die holder (10), the pressing strip (22) is slidably provided on the guide rail (21), and the pressing strip (22) is used to press downwardly upper substrate and lower substrate, and the guide rail fixing part is used to fix the guide rail (21) on the die holder (10).

4. The shear test sample preparation tooling of claim 1, wherein, The end of multiple pieces of the adhesive film (30) is respectively provided with tab (31), and the tabs (31) on adjacent layers of the adhesive film (30) are staggered.

5. The shear test sample preparation tool of claim 1, wherein, It also includes lifting drive part (60), lifting platform (70) and supporting plate (80), the lifting drive part (60) is provided on the die holder (10) and connected with the lifting platform (70), the supporting plate (80) is detachably connected with the lifting platform (70), and the adhesive film (30) is provided on the supporting plate (80).

6. The shear test sample preparation tool of claim 5, wherein, The lifting platform (70) is provided with connecting hole (71), the supporting plate (80) is provided with annularly arranged connecting column (81), the connecting column (81) is inserted with the connecting hole (71), and the connecting column (81) is provided with pawl (811) for limiting the disengagement of the connecting column (81) and the connecting hole (71).

7. The shear test sample preparation tool of claim 5, wherein, The lifting drive part (60) includes threaded cylinder (61) and worm (62), lifting screw (72) and guide column (73) are fixed on the lifting platform (70), the guide column (73) is slidably provided on the die holder (10), the threaded cylinder (61) is rotatably provided on the die holder (10) and is screwed with the lifting screw (72), the periphery of the threaded cylinder (61) is provided with worm gear (611), and the worm (62) is rotatably provided on the die holder (10) and is engaged with the worm gear (611).

8. The shear test sample preparation tool of claim 1, wherein, It also includes limiting plate (90) and telescopic drive part, the telescopic drive part is provided on the die holder (10), the limiting plate (90) is connected with the telescopic drive part, the telescopic drive part is used to drive the telescopic movement of the limiting plate (90) relative to the adhesive film (30), and the bottom surface of the limiting plate (90) is flush with the bottom surface of the lower die groove (12).

Citation Information

Patent Citations

  • Sample preparation tool for shearing experiment of silica gel for photovoltaic module

    CN220473141U