Radiation test tool and system

Abstract

The utility model discloses a radiation test tool and system, and the tool comprises a shielding structure body and a circuit board with a communication interface. The shielding structure body is provided with a shielding cavity, and the circuit board is arranged in the shielding cavity. And the shielding structure body is also provided with a connecting port communicated with the shielding cavity. The shielding cavity is used for containing an optical module, the optical module is provided with an optical fiber interface and an electric signal interface electrically connected with the communication interface, the shielding cavity is used for containing the optical module, and the optical fiber interface penetrates through the connecting port so that at least part of the optical fiber interface can be located outside the shielding cavity. According to the scheme of the embodiment of the invention, the repeatability and traceability of the electromagnetic radiation test of the optical module can be improved.

Description

Technical Field

[0001] This application relates to the field of computing equipment technology, and in particular to a radiation testing fixture and system. Background Technology

[0002] Electromagnetic compatibility (EMC) testing of optical modules refers to a series of tests performed on the modules to ensure their reliability and anti-interference capabilities when operating in an electromagnetic environment, and that their electromagnetic interference to the environment is within permissible limits. Currently, the repeatability and traceability of EMC testing for customer-side optical modules are poor. Utility Model Content

[0003] The purpose of this application is to provide a radiation testing fixture and system to improve the repeatability and traceability of electromagnetic radiation testing of optical modules.

[0004] Firstly, this application provides a radiation testing fixture, comprising:

[0005] A shielding structure; the shielding structure has a shielding cavity and a connection port communicating with the shielding cavity, the shielding cavity being used to accommodate an optical module; and,

[0006] The circuit board is located inside the shielded cavity and has a communication interface.

[0007] The optical module has an optical fiber interface and an electrical signal interface that is electrically connected to the communication interface. The shielding cavity is used to house the optical module, and the connection port is used for the optical fiber interface to pass through the connection port so that the optical fiber interface is at least partially located outside the shielding cavity.

[0008] With the above technical solution, the circuit board is located inside the shielding cavity of the shielding structure. The shielding structure also has a connection port communicating with the shielding cavity. Therefore, the optical fiber interface of the optical module can be located in the connection port, allowing the optical fiber interface to be exposed through the connection port of the shielding structure. With the optical fiber interface exposed, a signal generator located outside the shielding cavity can be electrically connected to the optical fiber interface via optical fiber to provide optical signals to the optical module. Since the electrical signal interface of the optical module is electrically connected to the communication interface of the circuit board, after the optical module converts the optical signal into an electrical signal, the electrical signal can be transmitted to the circuit board through the electrical signal interface of the optical module and the communication interface of the circuit board. Then, it returns to the communication interface of the circuit board through the loop within the circuit board, and then enters the optical module again through the communication interface of the circuit board and the electrical signal interface of the optical module, thereby simulating the signal processing process.

[0009] During the radiation test, the electrical signal interface and circuit board of the optical module are located inside the shielded cavity. The optical fiber interface can be placed at the connection port for radiation emission testing, so that the shielding structure has sufficient attenuation of the radiation interference of the electrical signal interface and circuit board of the optical module, thus not affecting the radiation emission of the optical fiber interface of the optical module. Therefore, the radiation test fixture disclosed in this application can simulate the radiation interference of the whole system in a shielded scenario, thereby ensuring that the radiation emission test of the radiation test fixture has good repeatability.

[0010] Furthermore, when the radiation testing fixture disclosed in this application performs radiated emission testing on optical modules, the shielding structure eliminates radiated interference from the electrical signal interface of the optical module and the circuit board, ensuring that the measured radiated emission is from the fiber optic interface exposed at the connection port. Therefore, the location of the radiated emission tested by the radiation testing fixture is easy to pinpoint. Simultaneously, the optical module does not need to be installed in a complete system environment; simply connecting the signal interface of the optical module to the communication interface of the circuit board is sufficient. Therefore, this radiation testing fixture is suitable for pluggable optical modules, and the type of optical module can be easily located based on the connection port size of the shielding structure. It is evident that the radiation testing fixture disclosed in this application provides high traceability in terms of both radiation location and optical module type when performing radiation testing on optical modules.

[0011] In one possible implementation, the shielding structure includes a shielding shell and a radiation suppression structure disposed inside the shielding shell. The connection port is located on the shielding shell, and the internal region of the shielding shell forms a shielding cavity. This makes the internal space of the shielding shell constitute a shielding cavity. In some examples, the radiation suppression structure can be disposed on the inner wall of the shielding shell. In other examples, the radiation suppression structure can be disposed at a seam location inside the shielding shell. This can enhance the shielding capability of the shielding shell, thereby improving the accuracy of radiated emission testing of the fiber optic interface.

[0012] In one possible implementation, the aforementioned shielding shell includes a sealing plate and a housing with an opening. The connection port is located on the sealing plate, which is detachably positioned in the opening area of ​​the housing. The sealing plate and the housing together form a shielding cavity. When the fiber optic interface size of the optical module does not match the size of the connection port, the sealing plate can be removed from the housing, and a new sealing plate can be installed in the opening area of ​​the housing, ensuring that the size of the connection port on the sealing plate matches the size of the fiber optic interface. This allows for changing the type of optical module compatible with the radiation testing fixture.

[0013] In one possible implementation, the aforementioned radiation testing fixture further includes a first elastic shielding member disposed on the inner wall of the connection port. The first elastic shielding member has an annular opening for the fiber optic interface to pass through. Thus, the fiber optic interface size of the optical module to which the radiation testing fixture is adapted can be adaptively changed by the first elastic shielding member, thereby making the radiation testing fixture suitable for radiated emission testing of optical modules with various fiber optic interface sizes.

[0014] In one possible implementation, the aforementioned radiation testing fixture further includes a first bracket and an adapter element located within the shielded cavity, the adapter element being mounted on the first bracket. The first bracket supports the optical module. Thus, the optical module can be electrically connected to the circuit board via the adapter element. Supported by the first bracket, the optical module can be stably mounted within the shielded structure, thereby ensuring the stability of the optical module.

[0015] The first bracket, with one end near the connector, is mounted on the connector. A second elastic shield is provided at the part of the first bracket that contacts the connector. The optical module is used to electrically connect to the circuit board via an adapter. Thus, when the first bracket is mounted on the connector, the second elastic shield effectively improves the shielding performance of the shielding structure in the area of ​​the connector, thereby further improving the accuracy of the optical fiber interface radiation emission test of the optical module.

[0016] In one possible implementation, the distance between the geometric center of the aforementioned connection port and the bottom of the shielding structure is equal to a preset distance. By controlling the distance between the geometric center of the connection port and the bottom of the shielding structure, it can be ensured that the height of the optical module meets relevant testing standards.

[0017] The radiation testing fixture also includes a second bracket housed within a shielded cavity, with the circuit board positioned on the support surface of the second bracket. Thus, when the optical module is positioned at a relatively high height, the second bracket can raise the height of the circuit board, allowing it to be electrically connected to the optical module supported by the first bracket via an adapter element, thereby ensuring that the height of the optical module meets relevant testing standards.

[0018] Furthermore, the circuit board is located between the support surface of the second bracket and the surface of the first bracket near the second bracket, and the adapter element is located on the side of the first bracket near the second bracket. Thus, when the circuit board is located between the support surface of the second bracket and the surface of the first bracket near the second bracket, the communication interface of the circuit board can be easily electrically connected to the electrical signal interface of the optical module through the signal interface of the adapter element.

[0019] In one possible implementation, the aforementioned radiation testing fixture further includes a shielded sealing element that mates with the connection port. This shielded sealing element is used to seal the connection port to test the shielding effect of the shielding structure. In this way, it is possible to determine whether the shielding effect of the shielding structure meets the requirements.

[0020] In one possible implementation, the radiation testing fixture further includes a shielding plate disposed within a shielded cavity. The shielding plate divides the internal space of the shielded cavity into a testing space and an auxiliary space, with the circuit board and optical module both located in the testing space.

[0021] The aforementioned radiation testing fixture also includes a heat dissipation component located in the auxiliary space and a power module electrically connected to the circuit board and the heat dissipation component, respectively.

[0022] When the shielding plate divides the internal space of the shielding cavity into a test space and an auxiliary space, the test space and the auxiliary space are adjacent. Therefore, when the radiation testing fixture performs radiation interference testing on the optical module, the power module can not only supply power to the circuit board, optical module and heat dissipation components, but also ensure that the heat dissipated by the optical module and circuit board during the test is dissipated through the heat dissipation components in the auxiliary space, thereby ensuring that the operating temperature of the optical module and circuit board is normal.

[0023] In one possible implementation, the shielding structure also includes a waveguide port communicating with the test space and a heat dissipation port communicating with the auxiliary space. The waveguide port, heat dissipation port, and connection port are located on different sides of the shielding structure. The waveguide port can control the temperature of the test space through convection, and the heat dissipation port can dissipate the heat dissipation components. This implementation can reduce the impact of the power module and heat dissipation components on radiated emissions during operation.

[0024] In one possible implementation, the aforementioned radiation testing fixture further includes a power switch, a power input interface, and a power connector, all of which are located on the outer surface of the shielding structure. Furthermore, the power switch and power input interface are electrically connected to the power connector, which in turn is electrically connected to the power module. This allows for convenient connection of the power cable to the power input interface and activation of the power switch, enabling the commencement of radiated emission testing of the optical module.

[0025] The power input interface and the connector are located on different outer surfaces of the shielding structure, as are the power switch and the connector. This minimizes the radiated interference from the power switch and power input interface that could affect the test, thus reducing radiated interference from the power switch and power input interface to the optical module's fiber optic interface.

[0026] Secondly, this application also provides a radiation testing system, including radiation testing fixtures of the first aspect or any possible implementation thereof.

[0027] In one possible implementation, the aforementioned radiation testing system further includes a support structure and a receiving antenna, with the radiation testing fixture mounted on the support surface of the support structure. The height difference between the geometric center of the connection port of the shielding structure component included in the radiation testing fixture and the receiving end of the receiving antenna is less than a predetermined difference. In this case, the radiated emissions of the optical module tested by the radiation testing fixture meet the relevant testing standards.

[0028] The beneficial effects of any possible implementation of the second aspect of this application are the same as those of the first aspect or any possible implementation of the first aspect. Attached Figure Description

[0029] Further details, features, and advantages of this application are claimed in the following description of exemplary embodiments in conjunction with the accompanying drawings, in which:

[0030] Figure 1 A schematic diagram of the structure of the radiation testing system disclosed in an embodiment of this application is shown;

[0031] Figure 2 This paper shows a schematic diagram of the arrangement of the signal generator and radiation testing fixture according to an embodiment of this application in an actual testing scenario;

[0032] Figure 3 A schematic diagram of the structure of the radiation testing fixture according to an embodiment of this application is shown;

[0033] Figure 4 This invention provides a schematic diagram of the internal structure of a radiation testing fixture according to an embodiment of the present application.

[0034] Figure 5 This paper shows another internal structural schematic diagram of the radiation testing fixture according to an embodiment of the present application;

[0035] Figure 6 An exemplary exploded view of a radiation testing fixture according to an embodiment of this application is shown;

[0036] Figure 7 An exemplary front view of the radiation testing fixture according to an embodiment of this application is shown.

[0037] Figure 8 A schematic diagram of the exemplary back structure of a radiation testing fixture according to an embodiment of this application is shown. Detailed Implementation

[0038] Embodiments of this application will now be described in more detail with reference to the accompanying drawings. While some embodiments of this application are shown in the drawings, it should be understood that this application can be implemented in various forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided to provide a more thorough and complete understanding of this application. It should be understood that the drawings and embodiments of this application are for illustrative purposes only and are not intended to limit the scope of protection of this application.

[0039] It should be understood that the steps described in the method embodiments of this application may be performed in different orders and / or in parallel. Furthermore, the method embodiments may include additional steps and / or omit the steps shown. The scope of this application is not limited in this respect.

[0040] The term "comprising" and its variations as used herein are open-ended, meaning "including but not limited to". The term "based on" means "at least partially based on". The term "one embodiment" means "at least one embodiment"; the term "another embodiment" means "at least one additional embodiment"; the term "some embodiments" means "at least some embodiments". Definitions of other terms will be given in the following description. It should be noted that the concepts of "first", "second", etc., mentioned in this application are used only to distinguish different devices, units, or elements, and are not intended to limit the order of functions performed by these devices, units, or elements, or their interdependencies.

[0041] It should be noted that the terms "a" and "a plurality of" used in this application are illustrative rather than restrictive, and those skilled in the art should understand that, unless otherwise expressly indicated in the context, they should be understood as "one or more".

[0042] Electromagnetic compatibility (EMC) testing of optical modules refers to a series of tests performed on optical modules to ensure their reliability and anti-interference capabilities when operating in an electromagnetic environment, and that their electromagnetic interference to the environment is within permissible limits.

[0043] Figure 1 A schematic diagram of the radiation testing system disclosed in an embodiment of this application is shown. Figure 1 As shown, the radiation testing system 100 of this application embodiment may include a radiation testing fixture 101, which can simulate the signal processing process of the whole system where the optical module 102 is located, and realize the radiated emission (RE) test of the optical module.

[0044] like Figure 1As shown, the optical module 102 can be housed within the radiation testing fixture 101. The optical module 102 has an optical fiber interface and an electrical signal interface. The radiation testing fixture 101 can expose the optical fiber interface, so that the optical fiber interface of the optical module 102 can be used to receive optical signals and transmit the optical signals to the inside of the optical module 102. The optical module 102 converts the optical signals into electrical signals and outputs the optical module 102 through the electrical signal interface of the optical module 102.

[0045] like Figure 1 As shown, the electrical signal interface of the optical module 102 can be located within the radiation testing fixture 101, allowing the fixture to suppress radiated emissions from the electrical signal interface of the optical module 102. Furthermore, the fixture can receive the electrical signals transmitted through the electrical signal interface of the optical module 102, simulate the signal processing of the entire system, process the electrical signals, and then retransmit them to the optical module 102 through its electrical signal interface. This way, the optical module 102 does not need to undergo radiated emission testing as a complete system, and can complete the radiated emission of its fiber optic signal interface without interference from the electrical signal interface. This improves the accuracy of the radiated emission test of the optical module 102's fiber optic interface, giving the radiated emission test of the optical module 102 good repeatability and traceability.

[0046] In some alternative methods, Figure 2 This diagram illustrates the arrangement of the signal generator and radiation testing fixture according to an embodiment of this application in an actual testing scenario. Figure 2 As shown, the radiation testing fixture 101 can be arranged in the dark room A, and the signal generator 103 can be arranged in the outer area B of the dark room. Then, the optical signal interface of the signal generator 103 is connected to the optical fiber interface of the optical module 102 exposed by the radiation testing fixture 101 through the optical fiber 104, so that the signal generator 103 acts as an optical signal source to provide optical signals to the optical module 102.

[0047] In some alternative methods, such as Figure 1 As shown, the radiation testing system 100 disclosed in this application embodiment may further include a support structure 105 and a receiving antenna 106. The radiation testing fixture 101 is disposed on the support surface of the support structure 105 to ensure that the height of the optical fiber interface of the optical module 102 exposed by the radiation testing fixture 101 meets the relevant testing standards. In this way, the radiation emission test of the optical fiber interface of the optical module 102 can be completed by using the relevant testing standards.

[0048] Optional, such as Figure 2As shown, the aforementioned support structure 105 and receiving antenna 106 can both be arranged in the anechoic chamber A, while the signal generator 103 that provides optical signals to the optical module 102 is located in the outer area B of the anechoic chamber. It can be connected to the optical fiber interface of the optical module 102 through an optical fiber, thereby providing optical signals to the optical module 102 using the signal generator 103.

[0049] Optional, such as Figure 1 As shown, the aforementioned support structure 105 may include a turntable 1051 and a support platform 1052. The support platform 1052 may be mounted on the turntable 1051, while the radiation testing fixture 101 is mounted on the support platform 1052. During the testing of the optical module using the radiation testing fixture 101, the turntable 1051 drives the support platform 1052 to rotate, causing the radiation testing fixture 101 mounted on the support platform 1052 to rotate with it. In this way, the receiving antenna 106 can receive the radiation emitted by the optical fiber interface of the optical module 102 in different areas.

[0050] Optionally, to reduce interference, such as Figure 1 As shown, an absorbing structure 107, such as various porous materials like sponge or porous foam, can also be provided between the support platform 1052 and the receiving antenna 106 to reduce the presence of adverse interference.

[0051] Figure 3 A schematic diagram of the structure of the radiation testing fixture according to an embodiment of this application is shown. Figure 4 This paper shows a schematic diagram of the internal structure of a radiation testing fixture according to an embodiment of the present application. Figure 5 A schematic diagram of another internal structure of the radiation testing fixture according to an embodiment of this application is shown. Figures 3-5 As shown, the radiation testing fixture 300 of this embodiment includes a shielding structure 301, a circuit board 303, and a connection port 302. Here, the shielding effect of the shielding structure 301 can be greater than or equal to 25dB@10GHz~30GHz. In this case, the shielding capability of the shielding structure 301 can be considered to meet the requirements of radiated emission testing, and such a shielding structure 301 can be considered an ideal shield.

[0052] like Figures 3-5 As shown, the shielding structure 301 has a shielding cavity and a connection port 302 communicating with the shielding cavity. The shielding cavity can be used to accommodate an optical module 200, which has an optical fiber interface and an electrical signal interface. The optical fiber interface is located in the connection port 302.

[0053] like Figure 4 and Figure 5As shown, the radiation testing fixture 300 of this application embodiment may further include a circuit board 303, which is disposed in the shielding cavity. The circuit board 303 has a communication interface, and the electrical signal interface of the optical module 200 can be electrically connected to the communication interface of the circuit board 303.

[0054] Optional, such as Figures 3-5 As shown, both the electrical signal interface type of the optical module 200 and the communication interface type of the circuit board 303 can be Inter-Integrated Circuit (IIC) interfaces, or other applicable interface types. When the interface type is IIC, the communication interface of the circuit board 303 can function through IIC pin headers. For example, the circuit board 303 can be made of a high-heat-resistant laminate, such as a Megtron 6(G) or higher high-speed board, which can support IIC communication on the optical module 200 carrier board.

[0055] Combination Figure 1 , Figures 3-5 It can be seen that when the fiber optic interface is located in the connection port 302, the fiber optic interface can be exposed through the connection port 302 of the shielding structure 301, allowing the fiber optic interface of the optical module 200 to receive optical signals emitted by the signal generator outside the shielding cavity through the optical fiber. Simultaneously, since the electrical signal interface of the optical module 200 is electrically connected to the communication interface of the circuit board 303, after the optical module 200 converts the optical signal into an electrical signal, the electrical signal can be transmitted from the optical module 200's electrical signal interface to the communication interface of the circuit board 303, then back to the communication interface of the circuit board 303 through a loop within the circuit board 303, and finally, using the communication interface of the circuit board 303 and the electrical signal interface of the optical module 200 as a bridge, it enters the optical module 200, thus simulating the signal processing process.

[0056] like Figures 3-5 As shown, during the analog signal processing, the electrical signal interface of the optical module 200 and the circuit board 303 are both located inside the shielding cavity. The optical fiber interface can be located in the connection port 302, so that the shielding structure 301 has sufficient attenuation of the radiation interference (hereinafter referred to as electrical port radiation interference) of the electrical signal interface and the circuit board 303 of the optical module 200, so as not to affect the radiation emission (hereinafter referred to as optical port radiation interference) of the optical fiber interface of the optical module 200. Therefore, the radiation test fixture 300 disclosed in this application embodiment can separate the optical port radiation interference and electrical port radiation interference of the optical module 200, and can simulate the radiation interference of the whole system in the shielding performance scenario, thereby ensuring that the radiation emission test of the radiation test fixture 300 has good repeatability.

[0057] Moreover, such as Figures 3-5 As shown, when the radiation testing fixture 300 disclosed in this application performs radiated emission testing on the optical module 200, the shielding structure 301 eliminates electrical port radiation interference, ensuring that the measured radiated emission is the radiation emission from the fiber optic interface exposed at the connection port 302. Therefore, the location of the radiated emission tested by the radiation testing fixture 300 is easy to pinpoint. Furthermore, the optical module 200 does not need to be installed in a complete system environment for radiated emission testing; simply connecting the signal interface of the optical module 200 to the communication interface of the circuit board 303 is sufficient. Therefore, the radiation testing fixture 300 is suitable for pluggable optical modules 200, and the type of optical module 200 in the radiation testing fixture 300 can be determined based on the size of the connection port 302 of the shielding structure 301. It is evident that the radiation testing fixture 300 disclosed in this application provides high traceability in terms of both radiation location and optical module 200 type when performing radiation testing on the optical module 200.

[0058] It should be noted that the type of pluggable optical module 200 in this application embodiment includes, but is not limited to, the optical module 200 being a customer-side optical module 200, which can be a pluggable optical module 200. For example, the type of the optical module 200 may include one of FP+, SFP28, SFP56, DSFP, QSFP28, QSFP56, QSFP-DD, NGSFP-DD, etc.

[0059] In one possible implementation, in order to test the shielding effect of the test structure, such as Figures 3-5 As shown, the radiation testing fixture 300 disclosed in this application embodiment also includes a shielded sealing component that mates with the connection port 302. Figures 3-5 (Not shown). At this point, a shielding plug can be used to seal the connection port 302, and the shielding effect of the shielding structure 301 can be tested. For example, after the optical module 200 is installed inside the shielding structure 301, the connection port 302 can be sealed with a shielding plug, such as a metal plug or a concrete plug, and then the shielding effect test can be performed according to Appendix E, Internal Radiation Method, E.7, Transmitting Antenna Embedded Method in GB39278Y2020 standard. Tests have shown that the shielding effect of the shielding structure 301 is ≥25dB@10GHz~30GHz, and the shielding structure 301 can effectively shield electrical port radiation interference, meeting the fiber optic interface radiation emission test requirements of the optical module 200.

[0060] In one possible implementation, such as Figures 3-5As shown in the embodiments of this application, the shielding structure 301 includes a shielding shell and a radiation suppression structure disposed inside the shielding shell. The internal area of ​​the shielding shell is a shielding cavity, and the connection port 302 is disposed on the shielding shell. Since the shielding shell has a radiation suppression structure inside, when the internal space of the shielding shell forms a shielding cavity, the shielding shell can have a good radiation shielding effect on the electrical port radiation interference within the shielding cavity, thereby improving the accuracy of the radiation emission test of the optical fiber interface.

[0061] In practical applications, the material of the aforementioned shielding shell can be any material suitable for radiation emission shielding, such as metal materials, radiation-proof glass materials, radiation-proof concrete materials, or plates with a radiation-proof film layer formed on the surface.

[0062] Taking a radiation suppression structure as an example, this structure can include metal mesh, conductive cloth, shielding springs, etc., but is not limited to these, as long as it ensures good shielding performance. For example, the radiation suppression structure can be placed in a part with seams inside the shielding shell, or it can be arranged on the inner wall of the shielding shell.

[0063] In one possible implementation, such as Figure 3 and Figure 5 As shown, in order to accommodate different types of optical modules 200 for radiation emission testing, the radiation testing fixture 300 also includes a first elastic shield 304 disposed on the inner wall of the connection port 302. The first elastic shield 304 has an annular opening for the optical fiber interface to pass through.

[0064] In practical applications, such as Figure 3 and Figure 5 As shown, the first elastic shield 304 can be an elastic metal structure such as a ring spring or ring spring sheet, or other non-metallic structures with shielding function. After the first elastic shield 304 is disposed on the inner wall of the connection port 302, the optical fiber interface of the optical module 200 is actually disposed in the annular opening of the first elastic shield 304. When the size of the optical fiber interface of the optical module 200 is larger than the annular opening of the first elastic shield 304, the optical fiber interface of the optical module 200 can also be embedded into the annular opening of the first elastic shield 304 by squeezing the first elastic shield 304, thereby exposing the optical fiber interface of the optical module 200 through the annular opening.

[0065] And, as Figure 3 and Figure 5As shown, since the fiber optic interface of the optical module 200 is embedded in the annular opening of the first elastic shield 304 by squeezing the first elastic shield 304, the first elastic shield 304 exerts a certain squeezing effect on the fiber optic interface of the optical module 200. This not only improves the contact tightness between the fiber optic interface of the optical module 200 and the annular opening of the first elastic shield 304, but also prevents the shielding function of the shielding structure 301 from being reduced due to gaps between the fiber optic interface of the optical module 200 and the annular opening of the first elastic shield 304. Therefore, the technical solution disclosed in this application can adaptively change the type of optical module 200 that the radiation testing fixture 300 is adapted to by the shielding structure 301, thereby making the radiation testing fixture 300 suitable for radiated emission testing of various types of optical modules 200.

[0066] In one possible implementation, such as Figures 3-5 As shown, the radiation testing fixture 300 disclosed in this application embodiment may further include a first support 305 and an adapter element 306 located within a shielded cavity, the adapter element 306 being disposed on the first support 305. When the first support 305 is used to support the optical module 200, the optical module 200 can be electrically connected to the circuit board 303 through the adapter element 306. Under the support of the first support 305, the optical module 200 can be stably mounted on the shielded encapsulation structure.

[0067] like Figures 3-5 As shown, the first bracket 305 is positioned on the connection port 302 at one end. For example, the first bracket 305 may extend into the connection port 302 along the direction near it and be installed within the connection port 302. Furthermore, the portion of the first bracket 305 that contacts the connection port 302 may have a second elastic shielding element. Figure 4 and Figure 5 (Not shown), the type of the second elastic shield can be referred to the relevant description of the first elastic shield 304.

[0068] like Figures 3-5 As shown, when the end of the first bracket 305 near the connection port 302 is installed on the connection port 302, the second elastic shield can contact the inner wall of the connection port 302 in a compressed state, thereby ensuring that the end of the first bracket 305 near the connection port 302 is in close contact with the inner wall of the connection port 302, thereby effectively improving the shielding performance of the shielding structure 301 in the area of ​​the connection port 302, and further improving the accuracy of the fiber optic interface radiation emission test of the optical module 200.

[0069] Optional, such as Figures 3-5As shown, when the inner wall of the connection port 302 is provided with the first elastic shield 304, the second elastic shield provided at the end of the first bracket 305 near the connection port 302 can abut against the first elastic shield 304 to further improve the shielding performance of the shielding structure 301 in the area of ​​the connection port 302.

[0070] Optional, such as Figures 3-5 As shown, the second elastic shielding member can be an annular shielding member that is arranged around the first bracket 305 near the connection port 302. This can seal all possible gaps in all directions of the connection port 302, thereby improving the shielding performance of the shielding structure 301 in the area of ​​the connection port 302.

[0071] Optional, such as Figures 3-5 As shown, the first bracket 305 can be an optical cage, which can provide good support for the optical module 200. Furthermore, the opening of the optical cage is located at the end near the connection port 302, and a ring of metal springs is provided around the opening of the optical cage for tight contact with the connection port 302, thereby ensuring the shielding performance of the shielding structure 301 in the area of ​​the connection port 302.

[0072] For example, such as Figure 4 and Figure 5 As shown, the aforementioned adapter element 306 can be a connector installed in an optical cage, having a first pin and a second pin. When the optical module 200 is installed on the optical cage, the electrical signal interface of the optical module 200 can be crimped together with the first pin, and the fiber optic interface of the circuit board 303 can be soldered together with the second pin.

[0073] In one possible implementation, such as Figures 3-5 As shown, the radiation testing fixture 300 in this embodiment of the application further includes a second bracket 307, which can be disposed inside the shielding cavity, and the circuit board 303 is disposed on the support surface of the second bracket 307. In this case, the second bracket 307 can play the role of raising the height of the circuit board 303, so that even when the position of the optical module 200 is relatively high, the height of the circuit board 303 can also be raised by the second bracket 307.

[0074] In practical applications, in order to achieve standardized testing, such as Figures 3-5 As shown, the distance between the geometric center of the connection port 302 and the bottom of the shielding structure 301 is equal to a preset distance to ensure that the height of the optical module 200 meets the relevant test standards. For example, when the radiation test system includes a support structure and a receiving antenna, the radiation test fixture 300 is placed on the support surface of the support structure.

[0075] When the distance between the geometric center of the connection port 302 and the bottom of the shielding shell is equal to a preset distance, it can be ensured that the height difference between the geometric center of the connection port 302 of the shielding structure included in the radiation testing fixture 300 and the receiving end of the receiving antenna is less than a preset difference. Furthermore, the circuit board 303 can be electrically connected to the optical module 200 supported by the first bracket 305 via an adapter element through the second bracket 307, thereby ensuring that the height of the optical module 200 meets the requirements for the fiber optic interface position of the optical module 200 in the relevant testing standards.

[0076] For example, in order to meet testing standards, in the technical solution disclosed in the embodiments of this application, the radiation testing fixture 300 is placed... Figure 1 When on the support platform 1052 shown, as Figure 1 and Figure 3 As shown, the distance h from the bottom of the connection port 302 of the shielding structure 301 included in the radiation testing fixture 300 to the surface of the support platform can be equal to 62mm ± 1mm, and the height H1 of the support platform 1052 can be equal to 0.8m. The distance L between the radiation testing fixture 300 and the receiving antenna can be equal to 3m, and the height H2 of the receiving end of the receiving antenna 106 is equal to 1m.

[0077] Optional, such as Figures 3-5 As shown, the circuit board 303 is located between the support surface of the second bracket 307 and the surface of the first bracket 305 near the second bracket 307. At this time, the communication interface of the circuit board 303 can be easily connected to the electrical signal interface of the optical module 200 via the signal interface of the adapter element 306.

[0078] In some alternative embodiments, the second support 307 can be disposed inside the shielding cavity. For example, the second support 307 can be disposed on the side wall of the shielding cavity or at the bottom of the shielding cavity. The height of the support surface of the second support is fixed or adjustable.

[0079] Optionally, the second bracket 307 can be a lifting mechanism. For example, when the second bracket 307 is located at the bottom of the shielding cavity, the lifting mechanism can be a lifting platform, and the circuit board 303 can be located on the lifting platform of the lifting mechanism. As another example, when the second bracket 307 is located on the side wall of the shielding cavity, the side wall of the shielding cavity has a linear moving mechanism whose moving direction is the same as the height direction of the shielding structure. In this case, a lifting mechanism can be provided on the side wall of the shielding cavity, and the second bracket 307 can be located at the drive end of the lifting mechanism.

[0080] For example, the aforementioned lifting mechanism includes various linear motion mechanisms such as a lead screw and nut mechanism and a linear guide rail. Taking the lead screw and nut mechanism as an example, the axial direction of the lead screw in this mechanism can be the same as the height direction of the shielding cavity, such as... Figure 4 and Figure 5 As shown, the second bracket 307 can be mounted on the nut of the lead screw and nut mechanism. By rotating the lead screw to adjust the position of the nut, the nut can drive the second bracket 307 to rise and fall.

[0081] like Figure 4 and Figure 5 As shown, when the connection port 302 is close to the bottom of the shielding cavity, the optical module 200 is also close to the bottom of the shielding cavity. Therefore, the height of the second bracket 307 can be lowered by the lifting mechanism so that the second bracket 307 can be adapted to the position of the optical module 200.

[0082] like Figures 3-5 As shown, when the position of the connection port 302 is far from the bottom of the shielding cavity, the optical module 200 is also far from the bottom of the shielding cavity. Therefore, the height of the second bracket 307 can be increased by the lifting mechanism so that the second bracket 307 can be adapted to the position of the optical module 200.

[0083] As can be seen, in the technical solutions of the embodiments of this application, such as Figures 3-5 As shown, if the height of the fiber optic interface of the optical module 200 in the radiation testing fixture 300 changes, the circuit board 303 can be adapted to optical modules 200 of different heights by cooperating with the lifting mechanism and the second bracket 307. This provides a basis for conducting radiated emission tests using different radiation testing standards.

[0084] In one possible implementation, Figure 6 An exemplary exploded view of a radiation testing fixture according to an embodiment of this application is shown. Figure 6 As shown, the shielding shell of this application embodiment includes a sealing plate 301B and a box body 301A with an opening. The connection port 302 is provided on the sealing plate 301B, and the sealing plate 301B is detachably provided in the area of ​​the opening of the box body 301A, so that the sealing plate 301B and the box body 301A form a shielding cavity.

[0085] like Figure 6 As shown, when the size of the optical fiber interface of the optical module 200 does not match the size of the connection port 302, the sealing plate 301B can be removed from the housing 301A, and a new sealing plate 301B can be set in the area of ​​the opening in the housing 301A, ensuring that the size of the connection port 302 opened by the sealing plate 301B matches the size of the optical fiber interface, thereby changing the type of optical module 200 adapted to the radiation testing fixture 300.

[0086] like Figure 5As shown, considering that when the sealing plate 301B is detachably installed in the area where the box 301A is located, there may be a gap between the sealing plate 301B and the box 301A. A radiation suppression structure, such as a metal mesh, can be installed at the joint between the cover and the box 301A to ensure the shielding effect of the shielding structure 301 and improve the accuracy of radiation testing.

[0087] Optional, such as Figure 5 As shown, a folding handle 3011 can be provided on the top of the housing 301A for easy carrying of the radiation testing fixture 300, while a handle 3012 can be provided on the sealing plate 301B for easy opening. This allows the optical module 200 to be easily installed inside the housing 301A.

[0088] In one possible implementation, such as Figure 6 As shown, to meet the needs of heat dissipation and power supply, the radiation testing fixture 300 of this embodiment further includes a shielding plate disposed within a shielding cavity. The shielding plate divides the internal space of the shielding cavity into a test space Q1 and an auxiliary space Q2. At this time, the test space Q1 and the auxiliary space Q2 are adjacent. The shielding plate can be a metal plate or a non-metallic plate with shielding function.

[0089] like Figure 5 and Figure 6 As shown, the radiation testing fixture 300 of this embodiment further includes a heat dissipation component 3061 disposed in the auxiliary space Q2 and a power supply module 3062 electrically connected to the circuit board 303 and the heat dissipation component 3061. Both the circuit board 303 and the optical module 200 are located in the test space Q1. The shielding plate has electromagnetic shielding function, which can isolate the electromagnetic interference of the power supply module 3062 from the influence of the test space Q1. It should be understood that the power supply module 3062 can also supply power to the optical module 200.

[0090] In the technical solutions disclosed in the embodiments of this application, such as Figure 5 and Figure 6 As shown, both the power module 3062 and the heat dissipation component 3061 can be mounted on a shielding plate. The heat dissipation component 3061 can be a phase-change heat dissipation component or a cooling fan. The shielding plate can be a metal plate with good thermal conductivity. The metal plate has both shielding effect, which can reduce the electromagnetic interference of the power module 3062, and good thermal conductivity, which can absorb the heat of the test space Q1 through heat exchange. The heat dissipation component 3061 mounted on the metal plate can quickly dissipate the heat.

[0091] In some alternative methods, Figure 7 A schematic front view of an exemplary radiation testing fixture according to an embodiment of this application is shown. Figure 6 and Figure 7As shown, the shielding structure 301 also has a heat dissipation port 3013 that communicates with the auxiliary space Q2. Taking a cooling fan as an example, during the rotation of the cooling fan, the heat absorbed by the metal plate can be quickly dissipated through the heat dissipation port 3013.

[0092] Optional, such as Figure 6 and Figure 7 As shown, when the heat dissipation vent 3013 and the connection port 302 are located on different sides of the shielding structure 301, the influence of airflow and temperature factors on radiation emission can be reduced. For example, the heat dissipation vent 3013 can be located on the first side 301C of the enclosure 301A (i.e., Figure 6 On the right side of the middle, while the connector 302 is located on... Figure 6 On the sealing plate 301B, the heat dissipation port 3013 and the connection port 302 are located on opposite sides of the shielding structure 301, thereby reducing the radiation emission of the power module 3062 and the heat dissipation component 3061 to the optical fiber interface of the optical module 200 during operation.

[0093] In some alternative methods, considering that the circuit board and optical module are prone to heat dissipation during testing, in order to further control the temperature of the test space, Figure 8 A schematic diagram of the exemplary back structure of a radiation testing fixture according to an embodiment of this application is shown. Figure 7 and Figure 8 As shown, the shielding structure 301 also has a waveguide port 3014 communicating with the test space Q1. When the radiation test fixture 300 performs radiated emission testing on the optical module 200, the heat released by the circuit board 303 and the optical module 200 during the test can be discharged through the waveguide port 3014. The waveguide port 3014 has a good radiation isolation effect. Therefore, by opening the waveguide port 3014 on the enclosure 301A, on the one hand, the temperature of the test space Q1 can be adjusted so that the circuit board 303 and the optical module 200 can perform radiated emission testing normally; on the other hand, the shielding effect of the shielding structure 301 can be guaranteed, and the accuracy of the test results can be improved.

[0094] Optional, such as Figure 7 and Figure 8 As shown, when the shielding structure 301 includes a shielding shell, the waveguide port 3014 can be located on the enclosure 301A. Optionally, to reduce the impact of heat dissipation, the waveguide port 3014 and the connection port 302 are located on different sides of the shielding structure 301. For example, the waveguide port 3014 is located on the second side 301D of the enclosure 301A (i.e., Figure 8 (on the right side), which is connected to the first side of the box 301C (i.e. Figure 7(Right side) opposite. The opening of the enclosure 301A is located on the front of the enclosure 301A, and the connection port 302 is located on the sealing plate 301B on the front of the enclosure 301A. In this way, the waveguide port 3014 and the connection port 302 are located on different sides of the shielding structure 301, which can minimize the impact of the heat output from the waveguide port 3014 on the radiated emission test.

[0095] Optional, such as Figure 7 and Figure 8 As shown, when the enclosure 301A is provided with a waveguide port and a heat dissipation port, the waveguide port and the heat dissipation port can be located on two opposite sides of the enclosure 301A. For example, the waveguide port 3014 is located on the second side 301D of the enclosure 301A (i.e., Figure 7 (on the right side), while the first side 301C of the enclosure is located on the first side 301C of the enclosure (i.e. Figure 8 (on the right side), which can alleviate the problem of concentrated heat dissipation in test space Q1 and auxiliary space Q2 to the greatest extent, so as to improve the heat dissipation efficiency of test space Q1 and auxiliary space Q2.

[0096] In some alternative methods, such as Figure 8 As shown, the radiation testing fixture 300 disclosed in this application embodiment also includes a power switch 3071, a power input interface 3072, and a power connector. Figure 6 (Not shown). Of course, it may also include grounding screws such as 3073, but it is not limited to these.

[0097] like Figure 3 and Figure 8 As shown, the power switch 3071 and power input interface 3072 are located on the outer surface of the shielding structure 301, and the power connector is also located on the outer surface of the shielding structure 301. Both the power switch 3071 and power input interface 3072 are electrically connected to the power connector, which in turn is electrically connected to the power module 3062. At this point, it is relatively easy to connect the power cable to the power input interface 3072 and turn on the power switch 3071 to begin the radiated emission test of the optical module.

[0098] like Figure 3 , Figures 6-8 As shown, considering that the power switch 3071 and the power input interface 3072 are prone to radiated interference, the power switch 3071 and the connection port 302 can be located on different sides of the shielding structure 301, and the power input interface 3072 and the connection port 302 can be located on different sides of the shielding structure 301. Alternatively, the power switch 3071 and the power input interface 3072 can be located on the same side of the shielding structure 301, or on different sides of the connection port 302.

[0099] For example, such as Figure 3 , Figures 6-8As shown, the power switch 3071 and the power input interface 3072 can be located on the back 301E of the enclosure 301A, while the opening of the enclosure 301A is located on the front of the enclosure 301A, and the connection port 302 is located on the sealing plate 301B on the front of the enclosure 301A, thereby reducing the radiation interference of the power switch 3071 and the power input interface 3072 to the optical fiber interface of the optical module 200.

[0100] In summary, the radiation testing system disclosed in this application can perform radiation emission testing on individual optical modules, and it can achieve standardized testing with good repeatability and traceability.

[0101] Although this application has been described in conjunction with specific features and embodiments, it is obvious that various modifications and combinations can be made thereto without departing from the spirit and scope of this application. Accordingly, this specification and drawings are merely exemplary illustrations of this application as defined by the appended claims, and are considered to cover any and all modifications, variations, combinations, or equivalents within the scope of this application. Clearly, those skilled in the art can make various alterations and modifications to this application without departing from the spirit and scope of this application. Thus, if such modifications and modifications of this application fall within the scope of the claims of this application and their equivalents, this application is also intended to include such modifications and modifications.

Claims

1. A radiation test fixture, characterized by, The radiation test tool comprises a shielding structure, a circuit board, and an optical module. The shielding structure comprises a shielding cavity for accommodating the optical module and a connecting port in communication with the shielding cavity. The circuit board is arranged in the shielding cavity and comprises a communication interface. The optical module comprises an optical fiber interface and an electrical signal interface in electrical connection with the communication interface. The shielding structure comprises a shielding shell and a radiation suppression structure arranged in the shielding shell. The connecting port is arranged on the shielding shell.

2. The radiation testing fixture of claim 1, wherein, The shielding shell comprises a sealing plate and a box with an opening.

3. The radiation testing fixture of claim 2, wherein, The connecting port is arranged on the sealing plate.

4. The radiation testing fixture of claim 1, wherein, The sealing plate is detachably arranged at the opening of the box.

5. The radiation testing fixture of claim 1, wherein, The radiation test tool further comprises a first elastic shielding member arranged on the inner wall of the connecting port. The first elastic shielding member has an annular opening for the optical fiber interface.

6. The radiation testing fixture of claim 5, wherein, The radiation test tool further comprises a first support arranged in the shielding cavity and an adapter element arranged on the first support. The first support is arranged on the connecting port.

7. The radiation testing fixture of claim 5, wherein, The first support is in contact with the connecting port.

8. The radiation testing fixture of any one of claims 1-7, wherein, The optical module is electrically connected with the circuit board through the adapter element. The distance between the geometric center of the connecting port and the bottom of the shielding structure is equal to a preset distance.

9. The radiation testing fixture of claim 8, wherein, The radiation test tool further comprises a second support arranged in the shielding cavity. The circuit board is arranged on the support surface of the second support. The circuit board is located between the support surface of the second support and the surface of the first support close to the second support. The adapter element is located on the side of the first support close to the second support. The radiation test tool further comprises a shielding plug matched with the connecting port. The shielding plug is used to plug the connecting port to test the shielding effect of the shielding structure. The radiation test tool further comprises a shielding plate arranged in the shielding cavity. The shielding plate divides the internal space of the shielding cavity into a test space and an auxiliary space. The circuit board and the optical module are located in the test space. The radiation test tool further comprises a heat dissipation component arranged in the auxiliary space and a power supply module electrically connected with the circuit board and the heat dissipation component respectively. The shielding structure further comprises a waveguide port in communication with the test space and a heat dissipation port in communication with the auxiliary space. The waveguide port, the heat dissipation port, and the connecting port are located at different sides of the shielding structure. The radiation test tool further comprises a power switch, a power input interface, and a power connector. The power switch, the power input interface, and the power connector are arranged on the outer surface of the shielding structure. The power switch and the power input interface are electrically connected with the power connector, the power connector is electrically connected with the power module, the power input interface and the connecting port are located on different outer surfaces of the shielding structure, and the power switch and the connecting port are located on different outer surfaces of the shielding structure.

10. A radiation testing system characterized by, The radiation test tooling according to any one of claims 1-9.

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