Aging test fixture mechanism

Abstract

The utility model is applicable to the field of light emitting diodes, and discloses an aging test fixture mechanism, which comprises a fixture plate, a vertical mounting plate, an upper probe module and a lower probe module, a test station is arranged on the fixture plate, two sides of the test station are respectively provided with a positioning stop dog, the vertical mounting plate is mounted at the bottom of the fixture plate, and the upper probe module is mounted on the vertical mounting plate. The upper probe module comprises a first testing elastic piece assembly and a first driving assembly, the first testing elastic piece assembly is located above the testing station, the first driving assembly is installed on the vertical installation plate and connected with the first testing elastic piece assembly, and the lower probe module comprises a second testing elastic piece assembly and a second driving assembly which are installed on the vertical installation plate and connected with the second testing elastic piece assembly. The first testing elastic piece assembly is located below the testing station, the second testing elastic piece assembly is located below the testing station, the second driving assembly is installed on the vertical installation plate and connected with the second testing elastic piece assembly, the first testing elastic piece assembly and the second testing elastic piece assembly are used for replacing a telescopic probe, and it can be ensured that the first testing elastic piece assembly and the second testing elastic piece assembly make good contact with an LED board to be tested.

Description

TECHNICAL FIELD

[0001] The utility model relates to the field of light emitting diode, especially a kind of aging test fixture mechanism. BACKGROUND

[0002] The aging test of LED device is crucial to ensure product quality, which not only reveals potential defects, but also provides important data for predicting the life of LED. However, the current LED aging test machine has some problems in the testing method, especially the use of telescopic probe, which affects the accuracy and reliability of the test to some extent. The telescopic probe usually has a spring inside to realize the telescopic function of the probe. However, over time, the spring may be aged due to fatigue, corrosion or wear, causing the probe to jam or fail to fully reset when telescoping. The jammed probe may not form a stable electrical connection with the test points on the LED board being tested, affecting the accuracy of the test results. SUMMARY

[0003] The utility model aims at providing a kind of aging test fixture mechanism, which aims to solve the technical problem of unstable test caused by the use of telescopic probe in the existing LED aging test machine.

[0004] To achieve the above-mentioned purpose, the utility model provides the following scheme:

[0005] An aging test fixture mechanism, comprising a fixture plate, a vertical mounting plate, an upper probe module and a lower probe module, the fixture plate is provided with a test station, the two sides of the test station are respectively provided with a positioning stopper, the inner side of the positioning stopper is provided with a positioning groove, the vertical mounting plate is installed at the bottom of the fixture plate, the upper probe module comprises a first test wafer component and a first drive assembly, the first test wafer component is located above the test station, the first drive assembly is installed on the vertical mounting plate and connected with the first test wafer component, the first drive assembly is used to drive the first test wafer component to move towards or away from the test station, the lower probe module comprises a second test wafer component and a second drive assembly, the second test wafer component is located below the test station, the second drive assembly is installed on the vertical mounting plate and connected with the second test wafer component, the second drive assembly is used to drive the second test wafer component to move towards or away from the test station.

[0006] Preferably, the fixture plate is provided with two test stations, the upper probe module and the lower probe module are respectively provided with two, two upper probe modules are respectively arranged above two test stations, and two lower probe modules are respectively arranged below two test stations.

[0007] Preferably, the clamp plate is provided with a through hole in the area of the test station, and a vacuum suction nozzle is arranged in the through hole.

[0008] Preferably, the aging test clamp mechanism further comprises a photoelectric sensor, and the clamp plate is provided with a mounting groove in the area of the test station, and the photoelectric sensor is connected with the clamp plate and located in the mounting groove.

[0009] Preferably, the first test spring piece assembly comprises a first pressing cover, a first insulating gasket, a first spring piece and a first mounting seat, the first pressing cover, the first insulating gasket and the first spring piece are sequentially mounted on the first mounting seat from top to bottom, and the first mounting seat is connected with the first driving assembly.

[0010] Preferably, the first spring piece comprises a spring piece body and elastic heads arranged at both ends of the spring piece body, and the elastic heads are arranged in a V shape.

[0011] Preferably, a plurality of first spring pieces are arranged, a plurality of first clamping grooves are longitudinally arranged in the first mounting seat, a second clamping groove is transversely arranged, the second clamping groove is communicated with the plurality of first clamping grooves, a plurality of positioning protrusions are arranged on the second clamping groove, the plurality of positioning protrusions are arranged on both sides of each first clamping groove in pairs, clamping openings matched with the positioning protrusions are respectively arranged on both sides of the spring piece body, the spring piece body is arranged in the first clamping groove, and the positioning protrusions are arranged in the clamping openings.

[0012] Preferably, the first driving assembly comprises a first lifting block and a first lifting driving member, the first test spring piece assembly further comprises a first support strip, the first support strip is arranged at the bottom of the first mounting seat, the first support strip is connected with the first lifting block, the first lifting driving member is arranged on the vertical mounting plate, the first lifting driving member is connected with the first lifting block, and the first lifting driving member is used for driving the first lifting block to move up and down.

[0013] Preferably, the second test spring piece assembly comprises a second pressing cover, a second insulating gasket, a second spring piece and a second mounting seat, the second pressing cover, the second insulating gasket and the second spring piece are sequentially arranged on the second mounting seat from bottom to top.

[0014] Preferably, the second driving assembly comprises a second lifting block and a second lifting driving piece, the second test spring sheet assembly further comprises a second support strip, the second support strip is arranged at the bottom of the second mounting seat, the second support strip is connected with the second lifting block, the second support strip is located at the inner side of the first support strip and above the first lifting block, the second lifting block is located between the first lifting block and the vertical mounting plate, the second lifting driving piece is installed on the vertical mounting plate, and the second lifting driving piece is connected with the second lifting block and used for driving the second lifting block to make lifting movement

[0015] The aging test fixture mechanism provided by the utility model comprises a fixture plate, a vertical mounting plate, an upper probe module and a lower probe module, the upper probe module comprises a first test spring sheet assembly and a first driving assembly, the lower probe module comprises a second test spring sheet assembly and a second driving assembly, the first test spring sheet assembly and the second test spring sheet assembly are used to replace telescopic probes, the first test spring sheet assembly and the second test spring sheet assembly can be ensured to be in good contact with the LED plate to be tested, and thus accurate test results can be obtained. BRIEF DESCRIPTION OF DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the embodiments of the utility model or the prior art, the following will briefly introduce the drawings needed to be used in the embodiment or the prior art description, and obviously, the drawings in the following description are only some embodiments of the utility model, and for those skilled in the art, other drawings can be obtained according to the structures shown in these drawings without creative labor.

[0017] Figure 1 It is the structure schematic view of the aging test fixture mechanism provided by the utility model embodiment;

[0018] Figure 2 It is the rear view of the aging test fixture mechanism provided by the utility model embodiment;

[0019] Figure 3 It is the bottom view of the aging test fixture mechanism provided by the utility model embodiment;

[0020] Figure 4 It is the combined schematic view of the first spring sheet and the first mounting seat provided by the utility model embodiment.

[0021] EXPLANATION OF DRAWINGS:

[0022] 10, clamp plate; 11, test station; 12, through hole; 13, mounting groove; 20, vertical mounting plate; 30, upper probe module; 31, first test spring piece assembly; 311, first gland; 312, first insulating gasket; 313, first spring piece; 3131, spring piece body; 3132, elastic head; 3133, bayonet; 314, first mounting seat; 3141, first clamping groove; 3142, second clamping groove; 3143, positioning protrusion; 315, first support strip; 32, first driving assembly; 321, first lifting block; 322, first lifting driving piece; 323, guide rail seat; 324, guide rail; 40, lower probe module; 41, second test spring piece assembly; 411, second gland; 412, second insulating gasket; 413, second spring piece; 414, second mounting seat; 415, second support strip; 42, second driving assembly; 421, second lifting block; 422, second lifting driving piece; 50, positioning stop block; 51, positioning groove; 60, photoelectric sensor; 70, LED board to be tested. DETAILED DESCRIPTION

[0023] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the present application.

[0024] It should be noted that all directional indications (such as up, down, left, right, front, back, etc.) in the embodiments of the present application are only used to explain the relative positional relationship, movement condition, etc. between components in a certain posture (as shown in the drawings), and if the certain posture changes, the directional indications also change accordingly.

[0025] It should also be noted that when an element is referred to as being "fixed to" or "disposed on" another element, it can be directly on the other element or can have a middle element present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or can have a middle element present.

[0026] In addition, the description of "first", "second" and the like in the present application is only for the purpose of description, and cannot be understood as indicating or implying the relative importance of the technical features or implicitly indicating the number of the technical features indicated. Therefore, the features limited by "first", "second" can be explicitly or implicitly included at least one of the features. In addition, the technical solutions of each embodiment can be combined with each other, but it must be based on the realization of the ordinary skilled in the art, when the combination of technical solutions appears contradictory or unachievable, it should be considered that the combination of technical solutions does not exist, nor in the protection scope required by the present application.

[0027] As shown in Figures 1 to 4 , it is an aging test fixture mechanism of an embodiment of the present application.

[0028] Please refer to Figures 1 to 4 , the aging test fixture mechanism of the embodiment of the present application comprises a fixture plate 10, a vertical mounting plate 20, an upper probe module 30 and a lower probe module 40, the fixture plate 10 is provided with a test station 11, the both sides of the test station 11 are respectively provided with a positioning stopper 50, the inner side of the positioning stopper 50 is provided with a positioning groove 51, the vertical mounting plate 20 is installed at the bottom of the fixture plate 10, the upper probe module 30 comprises a first test spring piece assembly 31 and a first driving assembly 32, the first test spring piece assembly 31 is located above the test station 11, the first driving assembly 32 is installed on the vertical mounting plate 20 and connected with the first test spring piece assembly 31, the first driving assembly 32 is used for driving the first test spring piece assembly 31 to move towards or away from the test station 11, the lower probe module 40 comprises a second test spring piece assembly 41 and a second driving assembly 42, the second test spring piece assembly 41 is located below the test station 11, the second driving assembly 42 is installed on the vertical mounting plate 20 and connected with the second test spring piece assembly 41, the second driving assembly 42 is used for driving the second test spring piece assembly 41 to move towards or away from the test station 11.

[0029] In the embodiment, the fixture plate 10 is provided with two test stations 11, the widths of the two test stations 11 are different, and the two widths of the LED board 70 to be tested can be tested. When the test station 11 is provided with two, the upper probe module 30 and the lower probe module 40 are also provided with two respectively.

[0030] When the aging test is performed on the to-be-tested LED board 70, the to-be-tested LED board 70 is placed on the test station 11 and is placed in the positioning groove 51 of the positioning block 50 to position the to-be-tested PCB, then the first driving assembly 32 drives the first test spring piece assembly 31 to move towards the test station 11 to make the first test spring piece assembly 31 contact the gold fingers of the to-be-tested PCB, at the same time, the second driving assembly 42 drives the second test spring piece assembly 41 to move towards the test station 11 to make the second test spring piece assembly 41 contact the gold fingers of the to-be-tested LED board 70, and the clamping of the to-be-tested LED board 70 is completed to facilitate the subsequent light characteristic test.

[0031] The aging test fixture mechanism of the embodiment of the utility model includes fixture plate 10, vertical mounting plate 20, upper probe module 30 and lower probe module 40, upper probe module 30 includes first test spring piece assembly 31 and first driving assembly 32, lower probe module 40 includes second test spring piece assembly 41 and second driving assembly 42, uses first test spring piece assembly 31 and second test spring piece assembly 41 instead of telescopic probe, can ensure that first test spring piece assembly 31 and second test spring piece assembly 41 contact well with to-be-tested LED board 70, thereby obtaining accurate test result.

[0032] Please refer to Figure 1 As shown in the figure, in the embodiment, the fixture plate 10 is provided with a through hole 12 on the area of the test station 11, a vacuum suction nozzle (not shown in the figure) is arranged in the through hole 12, the vacuum suction nozzle is connected with a vacuum pump through a connecting pipeline, when the vacuum pump is started, negative pressure is formed in the vacuum suction nozzle, thereby generating strong adsorption force. When the to-be-tested LED board 70 is placed on the test station 11 during the test, the vacuum pump is started, negative pressure is formed in the vacuum suction nozzle, thereby generating adsorption force to fix the to-be-tested LED board 70 on the test station 11, after the test is completed, the vacuum pump is turned off, the negative pressure in the vacuum suction nozzle disappears, and the to-be-tested LED board 70 is separated from the fixture plate 10. The to-be-tested LED board 70 can be fixed flexibly by arranging the vacuum suction nozzle.

[0033] Please refer to Figure 1 As shown in the figure, in the embodiment, the aging test fixture mechanism further includes a photoelectric sensor 60, the fixture plate 10 is provided with a mounting groove 13 on the area of the test station 11, the photoelectric sensor 60 is connected with the fixture plate 10 and located in the mounting groove 13, and the aging test can be performed on the to-be-tested LED board 70 after the photoelectric sensor 60 senses the to-be-tested LED board 70. Through the sensing function of the photoelectric sensor 60, whether the to-be-tested LED board 70 is in place can be automatically detected, thereby triggering the start of the aging test, without manual intervention, and the automation degree of the test is improved.

[0034] Please refer to Figures 1 to 4As shown, in the embodiment, the first test spring assembly 31 includes a first gland 311, a first insulating gasket 312, a first spring 313, and a first mounting base 314, the first gland 311, the first insulating gasket 312, and the first spring 313 are sequentially mounted on the first mounting base 314 from top to bottom, the first mounting base 314 is connected with the first driving assembly 32, and the modular design facilitates assembly, maintenance, and replacement.

[0035] Optionally, the first spring 313 includes a spring body 3131 and elastic heads 3132 arranged at two ends of the spring body 3131, and the elastic heads 3132 are arranged in a V shape, which can provide better contact pressure and uniformity, ensure that a stable and reliable electrical connection can be established when the heads are pressed on the gold fingers of the LED board 70 during testing, and the V-shaped design can also adapt to slight unevenness on the surface of the gold fingers to some extent, thereby improving the accuracy and reliability of the test.

[0036] Optionally, a plurality of first springs 313 are arranged, a plurality of first clamping grooves 3141 are arranged longitudinally in the first mounting base 314, a second clamping groove 3142 is arranged transversely, the second clamping groove 3142 communicates with the plurality of first clamping grooves 3141, a plurality of positioning protrusions 3143 are arranged on the second clamping groove 3142, the plurality of positioning protrusions 3143 are arranged on both sides of each first clamping groove 3141, respectively, a clamping opening 3133 adapted to the positioning protrusion 3143 is arranged on each side of the spring body 3131, the spring body 3131 is arranged in the first clamping groove 3141, and the positioning protrusion 3143 is arranged in the clamping opening 3133, and the plurality of positioning protrusions 3143 are arranged on both sides of each first clamping groove 3141, which can ensure that each first spring 313 can be accurately positioned in the first clamping groove 3141 during installation.

[0037] Further, the first driving assembly 32 includes a first lifting block 321 and a first lifting driving member 322, the first test spring assembly 31 further includes a first support strip 315, the first support strip 315 is arranged at the bottom of the first mounting base 314, the first support strip 315 is connected with the first lifting block 321, the first lifting driving member 322 is arranged on the vertical mounting plate 20, the first lifting driving member 322 is connected with the first lifting block 321, and is used to drive the first lifting block 321 to move up and down, so as to drive the first mounting base 314 and the first spring 313 on the first mounting base 314 to move towards or away from the test station 11.

[0038] In the embodiment, the first lifting driving member 322 is a pneumatic cylinder.

[0039] In the embodiment, the first support bars 315 are provided in two, and the two first support bars 315 are respectively arranged on the two sides of the first mounting seat 314 and are respectively connected with the two sides of the first lifting block 321. In this way, the connection stability can be improved, and the lifting process is more stable.

[0040] Further, the first driving assembly 32 further comprises a guide rail seat 323 and a guide rail 324. The guide rail seat 323 is arranged on the first lifting block 321, and the guide rail 324 is arranged on the vertical mounting plate 20. By arranging the guide rail seat 323 and the guide rail 324, the lifting operation of the first test wafer component assembly 31 is smoother.

[0041] Please refer to Figures 1 to 4 In the embodiment, the second test wafer component assembly 41 comprises a second gland 411, a second insulating gasket 412, a second wafer 413 and a second mounting seat 414. The second gland 411, the second insulating gasket 412 and the second wafer 413 are sequentially arranged on the second mounting seat 414 from bottom to top. The second mounting seat 414 is connected with the second driving assembly 42. The modular design facilitates assembly, maintenance and replacement.

[0042] Optionally, the structure of the second wafer 413 is the same as that of the first wafer 313, and the mounting mode of the second wafer 413 to the second mounting seat 414 is the same as that of the first wafer 313 to the first mounting seat 314, which will not be described herein. During testing, the elastic head 3132 of the first wafer 313 is pressed on the gold fingers on the front surface of the LED board 70 to be tested, and the elastic head 3132 of the second wafer 413 is pressed on the gold fingers on the back surface of the LED board 70 to be tested.

[0043] Further, the second driving assembly 42 comprises a second lifting block 421 and a second lifting driving member 422. The second test wafer component assembly 41 further comprises a second support bar 415. The second support bar 415 is arranged at the bottom of the second mounting seat 414. The second support bar 415 is connected with the second lifting block 421. The second support bar 415 is located on the inner side of the first support bar 315 and above the first lifting block 321. The second lifting block 421 is located between the first lifting block 321 and the vertical mounting plate 20. The second lifting driving member 422 is arranged on the vertical mounting plate 20. The second lifting driving member 422 is connected with the second lifting block 421 and is used to drive the second lifting block 421 to move up and down, so as to drive the second mounting seat 414 and the second wafer 413 on the second mounting seat 414 to move towards or away from the test station 11. In this way, the overall structure of the aging test fixture mechanism is more compact.

[0044] In the embodiment, the second lifting driving member 422 is a pneumatic cylinder.

[0045] In the embodiment, the second supporting strips 415 are provided in two, and the two second supporting strips 415 are respectively arranged on the two sides of the second mounting seat 414 and are respectively connected with the two sides of the second lifting block 421, so that the connection stability is improved and the lifting process is more stable.

[0046] Similarly, the second driving assembly 42 comprises a guide rail seat 323 and a guide rail 324, and the arrangement mode is consistent with the first driving assembly 32, and details are not repeated here.

[0047] The above is only the preferred embodiment of the present application, and does not limit the patent range of the present application, and any equivalent structural transformation made by the present application specification and the drawings, or direct / indirect application in other related technical fields under the inventive concept of the present application are included in the patent protection range of the present application.

Claims

1. An aging test fixture mechanism characterized by, The utility model provides a test device, including clamp plate, vertical installation plate, upper probe module and lower probe module, be provided with test station on the clamp plate, the both sides of test station are provided with positioning stop respectively, the inboard of positioning stop is provided with positioning groove, vertical installation plate installs at the bottom of clamp plate, upper probe module includes first test wafer component and first drive component, first test waaf component is located the top of test station, first drive component installs on vertical installation plate, and is connected with first test waaf component, first drive component is used for driving first test waaf component to move towards test station or move away from test station, lower probe module includes second test waaf component and second drive component, second test waaf component is located the bottom of test station, second drive component installs on vertical installation plate, and is connected with second test waaf component, and second drive component is used for driving second test waaf component to move towards test station or move away from test station.

2. The burn-in test fixture mechanism of claim 1, wherein, Two test stations are arranged on the clamp plate, and two upper probe modules and two lower probe modules are arranged respectively, two upper probe modules are arranged above two test stations respectively, and two lower probe modules are arranged below two test stations respectively.

3. The burn-in test fixture mechanism of claim 1, wherein, The clamp plate is provided with a through hole in the area of the test station, and a vacuum suction nozzle is arranged in the through hole.

4. The burn-in test fixture mechanism of claim 1, wherein, The clamp plate is provided with a mounting groove in the area of the test station, and the photoelectric sensor is connected with the clamp plate and located in the mounting groove.

5. The burn-in test fixture mechanism of claim 1, wherein, The first test wafer component includes a first gland, a first insulating gasket, a first wafer, and a first mounting seat. The first gland, the first insulating gasket, and the first wafer are sequentially installed on the first mounting seat from top to bottom. The first mounting seat is connected with the first drive component.

6. The burn-in test fixture mechanism of claim 5, wherein, The first wafer includes a wafer body and elastic heads arranged at both ends of the wafer body. The elastic heads are arranged in a V shape.

7. The burn-in test fixture mechanism of claim 6, wherein, The first wafer is provided with a plurality of first clamping grooves arranged longitudinally in the first mounting seat and a second clamping groove arranged transversely. The second clamping groove is in communication with the plurality of first clamping grooves. A plurality of positioning protrusions are arranged on the second clamping groove. The positioning protrusions are arranged on both sides of each first clamping groove. The wafer body is provided with a clamping hole adapted to the positioning protrusion on both sides. The wafer body is installed in the first clamping groove, and the positioning protrusion is located in the clamping hole.

8. The burn-in test fixture mechanism of claim 5, wherein, The first drive component includes a first lifting block and a first lifting drive. The first test wafer component further includes a first support strip arranged at the bottom of the first mounting seat. The first support strip is connected with the first lifting block. The first lifting drive is installed on the vertical installation plate. The first lifting drive is connected with the first lifting block for driving the first lifting block to move up and down.

9. The burn-in test fixture mechanism of claim 8, wherein, The second test spring piece assembly comprises a second gland, a second insulating gasket, a second spring piece and a second mounting base, and the second gland, the second insulating gasket and the second spring piece are sequentially mounted on the second mounting base from bottom to top.

10. The burn-in test fixture mechanism of claim 9, wherein, The second driving assembly comprises a second lifting block and a second lifting driving piece, the second test spring piece assembly further comprises a second support strip, the second support strip is arranged at the bottom of the second mounting base, the second support strip is connected with the second lifting block, the second support strip is located at the inner side of the first support strip and above the first lifting block, the second lifting block is located between the first lifting block and the vertical mounting plate, the second lifting driving piece is mounted on the vertical mounting plate, the second lifting driving piece is connected with the second lifting block and used for driving the second lifting block to make lifting movement.

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