Automatic chip testing device

Abstract

The utility model discloses an automatic chip testing device comprising a main body unit which comprises a detector host, the upper side surface of the detector host is provided with an operation panel, the upper side surface of the detector host is provided with a feed opening, and the upper side surface of the feed opening is provided with a testing seat. According to the utility model, the motor is started through the operation panel to drive the worm to rotate, the worm gear in meshed connection with the worm drives the rotating rod to rotate in the fixed block, the turning plate fixedly connected with the rotating rod turns over downwards, and the chip body is driven to turn over to the surface of the tester, so that the chip body is attached to the tester and the test is started; according to the chip body testing device, automatic side looking and unloading of the chip body can be achieved, after the chip body is loaded in place, the turning plate and the testing base are controlled to be closed for testing, then the testing efficiency of the chip body is improved, and the labor cost is reduced.

Description

TECHNICAL FIELD

[0001] The utility model relates to the technical field of chip processing especially relates to an automatic chip testing device. BACKGROUND

[0002] Chip, also known as integrated circuit, is a kind of micro electronic device or component, it integrates the function of many electronic circuits on a small semiconductor material, and each chip is tested strictly before leaving factory to meet design specification and customer requirement.

[0003] The existing side view method is usually that test personnel repeatedly plugs and unplugs the circuit board interface of chip, needs test personnel to replace chip constantly, not only test efficiency is low, leads to the labor intensity of test personnel to improve, and also needs to cultivate a large number of professional test personnel, and manpower cost is high. UTILITARY MODEL CONTENT

[0004] This part is to outline some aspects of the embodiments of the utility model and briefly introduce some preferred embodiments. Some simplifications or omissions may be made in this part and the abstract of the specification and the utility model name to avoid obscuring the purpose of this part, the abstract of the specification and the utility model name, and such simplifications or omissions cannot be used to limit the scope of the utility model.

[0005] In view of the above problems existing in the prior art, the utility model is provided.

[0006] Therefore, the utility model aims at providing an automatic chip testing device, which aims at solving the problem of "the existing side view method is usually that test personnel repeatedly plugs and unplugs the circuit board interface of chip, needs test personnel to replace chip constantly, not only test efficiency is low, leads to the labor intensity of test personnel to improve, and also needs to cultivate a large number of professional test personnel, and manpower cost is high".

[0007] To solve the above technical problems, the utility model provides the following technical scheme:

[0008] An automatic chip testing device, comprising:

[0009] The main unit includes a detector host, the upper surface of the detector host is provided with an operation panel, the upper surface of the detector host is provided with a discharging port, and the upper surface of the discharging port is provided with a test seat, the test seat is fixedly connected with the detector host, the upper surface of the test seat is provided with a tester, and the surface of the test seat is provided with a feeding port.

[0010] The turnover unit comprises two groups of fixed blocks fixedly connected with a detector host, rotating rods rotatably connected inside the two groups of fixed blocks, and a turnover plate fixedly connected between the rotating rods, two groups of limiting strips fixedly connected on one side surface of the turnover plate, and a chip body movably connected between the limiting strips, a sliding groove formed in the inside of the turnover plate, a sliding block slidably connected on the inner wall surface of the sliding groove, a discharging groove formed on the upper side surface of the sliding block, and the inner wall surface of the discharging groove movably connected with the chip body, and a driving assembly arranged at one end of the rotating rod.

[0011] As a preferred scheme of the automatic chip testing device, the driving assembly comprises a motor fixedly connected with the detector host, a worm fixedly connected at the output end of the motor, two groups of support plates rotatably connected on the surface of the worm and fixedly connected with the detector host, a worm wheel meshingly connected on the upper side surface of the worm and fixedly connected with one group of rotating rods.

[0012] As a preferred scheme of the automatic chip testing device, the upper side surface of the sliding block is fixedly connected with a positioning strip and a positioning plate, one side surface of the positioning strip is movably connected with the limiting strip, and one side surface of the positioning plate is movably connected with the turnover plate.

[0013] As a preferred scheme of the automatic chip testing device, the upper side surface of the positioning plate is fixedly connected with an import plate, the upper side surface of the import plate is designed to be inclined, and the outer side surface of the import plate is movably connected with the inner wall surfaces of the two groups of limiting strips.

[0014] As a preferred scheme of the automatic chip testing device, one side surface of the sliding block is provided with a mounting groove, a magnetic block is fixedly connected on the inner wall surface of the mounting groove, and one side surface of the magnetic block is movably connected with the upper side surface of the testing seat.

[0015] As a preferred scheme of the automatic chip testing device, the inner wall bottom surface of the discharging port is fixedly connected with a material guiding plate, and the upper side surface of the material guiding plate is designed to be inclined.

[0016] The automatic chip testing device has the following beneficial effects:

[0017] The chip body is inserted on the upper surface of the guide plate, the guide plate can be withdrawn from the limiting strip under the action of the inclined surface, the positioning plate fixedly connected with the guide plate drives the sliding block to slide in the sliding groove, the limiting strip is attached to the limiting strip, and then the chip body is slid downward between the limiting strips, and the lower surface of the chip body is attached to the upper surface of the sliding block, then the motor is started through the operation panel to drive the worm to rotate, the worm wheel engaged with the worm drives the rotating rod to rotate in the fixed block, the flap fixedly connected with the rotating rod is turned downward, the chip body is turned to the surface of the tester, the chip body is attached to the tester and starts to be tested, after the test is completed, the worm is reversely rotated by the motor, the flap is turned upward and reset, and the sliding block slides in the sliding groove under the magnetic force of the magnetic block and the weight, the positioning plate fixedly connected with the sliding block is attached to the flap, the discharge groove formed in the surface of the sliding block is moved to the lower side of the chip body, and then the chip body can slide into the feeding port along the inner wall surface of the discharge groove, then the chip body enters the discharge port, and finally slides out along the guide plate, which is convenient for taking out the chip body, can realize automatic side view and unloading of the chip body, and improves the test efficiency of the chip body and reduces the labor cost. BRIEF DESCRIPTION OF DRAWINGS

[0018] In order to more clearly illustrate the technical scheme of the embodiments of the present application, the following will briefly introduce the drawings needed to be used in the embodiment description. Obviously, the drawings in the following description are only some embodiments of the present application, and those skilled in the art can obtain other drawings according to these drawings without any creative labor. Among them:

[0019] Figure 1 Fig. 1 is a perspective structural schematic view of an automatic chip testing device according to the present application;

[0020] Figure 2 Fig. 2 is a perspective structural side view schematic view of the automatic chip testing device according to the present application; Figure 1

[0021] Figure 3 Fig. 3 is a perspective structural cross-sectional view schematic view of the automatic chip testing device according to the present application; Figure 1

[0022] Figure 4 Fig. 4 is a perspective structural schematic view of the sliding block.

[0023] ​​In the figure: 100, main unit; 101, detector host; 102, operation panel; 103, test seat; 104, tester; 105, discharge port; 106, guide plate; 107, feeding port; 200, turnover unit; 201, fixed block; 202, rotating rod; 203, turning plate; 204, limiting strip; 205, driving assembly; 205a, motor; 205b, worm; 205c, worm gear; 206, chute; 207, sliding block; 208, discharge chute; 209, positioning strip; 210, positioning plate; 211, guide plate; 212, magnetic block; 213, chip body. DETAILED DESCRIPTION

[0024] In order to make the above-mentioned purposes, features and advantages of the present application more apparent and easy to understand, the specific embodiments of the present application will be described in detail below with reference to the accompanying drawings.

[0025] In the following description, many specific details are set forth in order to provide a thorough understanding of the present application. However, the present application can be practiced in a variety of ways beyond the specific details set forth herein without departing from the scope of the present application, and it will be apparent to one skilled in the art that the present application can be practiced with or without these specific details. Therefore, the present application is not limited to the specific embodiments disclosed below.

[0026] Secondly, the "one embodiment" or "embodiment" referred to herein means that the specific features, structures or characteristics can be included in at least one implementation of the present application. "In one embodiment" appearing in different places in the specification does not mean the same embodiment, nor is it an embodiment that is independent of or mutually exclusive of other embodiments.

[0027] Thirdly, the present application is described in detail in conjunction with the schematic diagram, and in the detailed description of the embodiments of the present application, the cross-sectional view of the device structure is partially enlarged without the general proportion for the convenience of description, and the schematic diagram is only an example, which should not limit the scope of protection of the present application herein. In addition, the three-dimensional spatial dimensions of length, width and depth should be included in actual manufacture.

[0028] Reference Figures 1-4 The present application provides an automatic chip testing device, comprising:

[0029] The main unit 100 comprises a detector host 101, and an operation panel 102 is installed on the upper surface of the detector host 101. A discharge port 105 is formed on the upper surface of the detector host 101, and a test seat 103 is arranged on the upper surface of the discharge port 105. The test seat 103 is fixedly connected with the detector host 101, and a tester 104 is installed on the upper surface of the test seat 103. A feeding port 107 is formed on the surface of the test seat 103, and the feeding port 107 and the discharge port 105 are in communication with each other.

[0030] The turnover unit 200 comprises two groups of fixed blocks 201 fixedly connected with the detector host 101, the inside of the two groups of fixed blocks 201 is rotationally connected with rotating rods 202, and the rotating rods 202 are fixedly connected with a turnover plate 203, one side surface of the turnover plate 203 is fixedly connected with two groups of limiting strips 204, and the limiting strips 204 are movably connected with a chip body 213, the inside of the turnover plate 203 is provided with a sliding groove 206, the inner wall surface of the sliding groove 206 is slidably connected with a sliding block 207, the upper side surface of the sliding block 207 is provided with a discharging groove 208, the inner wall surface of the discharging groove 208 is movably connected with the chip body 213, the discharging groove 208 penetrates to the lower side region of the sliding block 207, one end of the rotating rod 202 is provided with a driving assembly 205, the turnover plate 203 rotates between the fixed blocks 201, so that the turnover plate 203 is attached to the test seat 103, the chip body 213 is attached to the tester 104, and the tester 104 can be tested.

[0031] The driving assembly 205 comprises a motor 205a fixedly connected with the detector host 101, the output end shaft of the motor 205a is fixedly connected with a worm 205b, the surface of the worm 205b is rotationally connected with two groups of supporting plates, the supporting plates are fixedly connected with the detector host 101, the upper side surface of the worm 205b is meshingly connected with a worm gear 205c, and the worm gear 205c is fixedly connected with one group of rotating rods 202, and the worm 205b is driven by the motor 205a to rotate forward and backward, so that the rotating rod 202 can rotate forward and backward.

[0032] Further, the upper side surface of the sliding block 207 is fixedly connected with a positioning strip 209 and a positioning plate 210, one side surface of the positioning strip 209 is movably connected with the limiting strip 204, one side surface of the positioning plate 210 is movably connected with the turnover plate 203, the positioning strip 209 and the positioning plate 210 can limit the sliding of the sliding block 207 and will not be separated from the inside of the sliding groove 206, the positioning strip 209 is attached to the limiting strip 204, the upper side surface of the sliding block 207 can support the chip body 213, when the positioning plate 210 is attached to the turnover plate 203, the discharging groove 208 can be moved to the lower side of the chip body 213, so that the chip body 213 is slid into the feeding port 107 through the discharging groove 208.

[0033] Further, the upper side surface of the positioning plate 210 is fixedly connected with an import plate 211, the upper side surface of the import plate 211 is designed to be inclined, the outer side surface of the import plate 211 is movably connected with the inner wall surfaces of the two groups of limiting strips 204, when the chip body 213 is inserted downward on the upper side surface of the import plate 211, the import plate 211 is caused to exit from the inside of the limiting strip 204 under the action of the inclined surface of the import plate 211, and at the same time, the sliding block 207 is caused to slide in the sliding groove 206, so that the positioning strip 209 is attached to the limiting strip 204

[0034] Further, one side surface of the sliding block 207 is provided with a mounting groove, and an inner wall surface of the mounting groove is fixedly connected with a magnetic block 212, one side surface of the magnetic block 212 is movably connected with the upper side surface of the test seat 103, the test seat 103 is made of metal material, when the flap 203 rotates upward and resets, the sliding block 207 in the sliding groove 206 can slide through the magnetic force and weight of the magnetic block 212, and then the positioning plate 210 is attached to the flap 203.

[0035] Further, the inner wall bottom surface of the discharging port 105 is fixedly connected with a guide plate 106, and the upper side surface of the guide plate 106 is designed to be inclined, so that the chip body 213 sliding into the discharging port 105 slides along the guide plate 106.

[0036] In the use process, the chip body 213 is inserted downward on the upper side surface of the guide plate 211, the guide plate 211 can be withdrawn from the inside of the limiting strip 204 under the action of the inclined surface, the positioning plate 210 fixedly connected with the guide plate 211 drives the sliding block 207 to slide in the sliding groove 206, the positioning strip 209 is attached to the limiting strip 204, and then the chip body 213 slides downward between the limiting strips 204, and the lower side surface of the chip body 213 is attached to the upper side surface of the sliding block 207, then the motor 205a is started through the operation panel 102 to drive the worm 205b to rotate, the worm gear 205c engaged with the worm 205b drives the rotating rod 202 to rotate in the fixed block 201, the flap 203 fixedly connected with the rotating rod 202 is flipped downward, drives the chip body 213 to flip to the surface of the tester 104, and the chip body 213 is attached to the tester 104 and starts testing, after the testing is completed, the worm 205b is reversely rotated through the motor 205a, the flap 203 is flipped upward and resets, and the sliding block 207 slides in the sliding groove 206 under the action of the magnetic force and weight of the magnetic block 212, the positioning plate 210 fixedly connected with the sliding block 207 is attached to the flap 203, the discharging groove 208 provided on the surface of the sliding block 207 is moved to the lower side of the chip body 213, and then the chip body 213 can slide along the inner wall surface of the discharging groove 208 and enter the discharging port 105, and finally slides out along the guide plate 106, so as to facilitate the taking out of the chip body 213.

[0037] It should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, not to limit it, although the present application has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solutions of the present application can be modified or replaced equivalently without departing from the spirit and scope of the technical solutions of the present application, which should be covered in the scope of the claims of the present application.

Claims

1. An automated chip testing apparatus, characterized by: Include: The main unit (100) includes a detector host (101), the upper surface of the detector host (101) is provided with an operation panel (102), the upper surface of the detector host (101) is provided with a discharging port (105), and the upper surface of the discharging port (105) is provided with a test seat (103), the test seat (103) is fixedly connected with the detector host (101), and the upper surface of the test seat (103) is provided with a tester (104), and the surface of the test seat (103) is provided with a feeding port (107); The turnover unit (200) includes two groups of fixed blocks (201) fixedly connected with the detector host (101), the inner portions of the two groups of fixed blocks (201) are rotatably connected with rotating rods (202), and the rotating rods (202) are fixedly connected with a turnover plate (203) between them, one side surface of the turnover plate (203) is fixedly connected with two groups of limiting strips (204), and a chip body (213) is movably connected between the limiting strips (204), a sliding groove (206) is formed in the inner portion of the turnover plate (203), and a sliding block (207) is slidably connected to the inner wall surface of the sliding groove (206), a discharging groove (208) is formed in the upper surface of the sliding block (207), and the inner wall surface of the discharging groove (208) is movably connected with the chip body (213), and one end of the rotating rod (202) is provided with a driving assembly (205).

2. The automated chip testing apparatus of claim 1, wherein: The driving assembly (205) includes a motor (205a) fixedly connected with the detector host (101), and the output end of the motor (205a) is fixedly connected with a worm (205b), the surface of the worm (205b) is rotatably connected with two groups of supporting plates, and the supporting plates are fixedly connected with the detector host (101), the upper surface of the worm (205b) is meshingly connected with a worm gear (205c), and the worm gear (205c) is fixedly connected with one group of rotating rods (202).

3. The automated chip testing apparatus of claim 2, wherein: The upper surface of the sliding block (207) is fixedly connected with a positioning strip (209) and a positioning plate (210), one side surface of the positioning strip (209) is movably connected with the limiting strip (204), and one side surface of the positioning plate (210) is movably connected with the turnover plate (203).

4. The automated chip testing apparatus of claim 3, wherein: The upper surface of the positioning plate (210) is fixedly connected with a guide plate (211), and the upper surface of the guide plate (211) is designed to be inclined, and the outer surface of the guide plate (211) is movably connected with the inner wall surfaces of the two groups of limiting strips (204).

5. The automated chip testing apparatus of claim 4, wherein: One side surface of the sliding block (207) is provided with a mounting groove, and the inner wall surface of the mounting groove is fixedly connected with a magnetic block (212), and one side surface of the magnetic block (212) is movably connected with the upper surface of the test seat (103).

6. The automated chip testing apparatus of claim 1, wherein: The inner wall bottom surface of the discharging port (105) is fixedly connected with a guide plate (106), and the upper surface of the guide plate (106) is designed to be inclined.

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