Three-temperature test fixture with adjustable magnetic field

Abstract

The utility model discloses a three-temperature test fixture with an adjustable magnetic field, which comprises a test base, a test seat fixedly arranged at the upper end of the test base, a test groove arranged at the upper end of the test seat, a placement seat fixedly arranged on the inner side of the test groove, a placement groove arranged at the upper end of the placement seat, and a vacuum cover base fixedly arranged at the upper end of the test seat. A vacuum cover mounting seat is arranged above the vacuum cover base, a first vacuum cover glass sheet and a second vacuum cover glass sheet are embedded between the upper end of the vacuum cover base and the lower end of the vacuum cover mounting seat, an air blowing seat is arranged at the lower end of the vacuum cover mounting seat, and the lower end of the air blowing seat is located in the second vacuum cover glass sheet. The air blowing seat is provided with a first air blowing hole, the upper end of the air blowing seat is also provided with an air blowing head, two sides of the test seat are also provided with test magnetic fields, the structure is reasonable, the magnetic field test environment and the temperature test environment can be changed, and the test efficiency is high.

Description

TECHNICAL FIELD

[0001] The utility model relates to test fixture technical field, especially a three temperature test fixture with adjustable magnetic field. BACKGROUND

[0002] With the continuous development of chip industry, the performance and function of chip gradually tend to limit, especially in recent years, the development of domestic chip industry, chip design, manufacturing, testing and other technologies have been improved to varying degrees, which provides a good development space for the localization of chip industry chain attached equipment. It is well known that when the chip is completed after packaging process, it needs to enter the test process section for testing and verification to prevent defective products from flowing to the market.

[0003] The existing chip needs test fixture to simulate the function and use environment of the chip during production and processing. The existing test fixture can only test the chip at a single temperature, which limits the test results, and the magnetic field environment cannot be changed, thus reducing the efficiency of chip testing. In view of the above problems, the following solution is proposed. UTILITY MODEL CONTENT

[0004] The utility model aims at providing a three temperature test fixture with adjustable magnetic field, which has the advantages of changeable magnetic field test environment and temperature test environment, and high test efficiency.

[0005] The above technical purpose of the utility model is realized by the following technical scheme:

[0006] A three temperature test fixture with adjustable magnetic field, comprising a test base, a test seat is fixedly arranged at the upper end of the test base, a test groove is arranged at the upper end of the test seat, a placing seat is fixedly arranged at the inner side of the test groove, a placing groove is arranged at the upper end of the placing seat, a vacuum cover base is fixedly arranged at the upper end of the test seat, a vacuum cover mounting seat is arranged above the vacuum cover base, and the vacuum cover base and the vacuum cover mounting seat are detachably connected, a first positioning groove and a second positioning groove are arranged at the upper end of the vacuum cover base and the lower end of the vacuum cover mounting seat respectively, a first vacuum cover glass sheet and a second vacuum cover glass sheet are embedded in the two first positioning grooves and the second positioning grooves respectively, a blowing seat is arranged at the lower end of the vacuum cover mounting seat, and the lower end of the blowing seat is located in the second vacuum cover glass sheet, a first blowing hole is formed in the blowing seat, a blowing head is further arranged at the upper end of the blowing seat, and the blowing head is in communication with the first blowing hole, and a test magnetic field is further arranged at the two sides of the test seat.

[0007] As preferred, the test magnetic field comprises a first coil and a second coil, the upper end of the test base is fixed with two mounting racks, and the first coil and the second coil are respectively mounted between the two mounting racks and the test seat, one end of the first coil and the second coil is respectively provided with a fixed iron core, the other end of the two fixed iron cores is provided through the test seat and is respectively located at the two ends of the placing seat.

[0008] As preferred, the vacuum cover mounting seat is provided with a plurality of fixing screws, the lower end of the plurality of fixing screws is respectively provided through the vacuum cover base, and the vacuum cover mounting seat and the vacuum cover base are fixedly connected through the plurality of fixing screws.

[0009] As preferred, the lower end of the test base is provided with a second air blowing hole, the second air blowing hole is along to the test seat, and is communicated with the test groove.

[0010] As preferred, the test seat is provided with a third air blowing hole on one side, and the third air blowing hole is communicated with the test groove.

[0011] The beneficial effects of the utility model are:

[0012] 1. The air blowing head, the first air blowing hole, the second air blowing hole and the third air blowing hole can inject air flow into the test groove simultaneously, so that the temperature of the test groove can be controlled by changing the temperature of the air flow, and the temperature in the test groove is uniform, so that the chip can be tested and verified under different temperature environments.

[0013] 2. The test magnetic field can generate a magnetic field to meet the test and verification of the chip under different magnetic field environments, and the first vacuum cover glass sheet and the second vacuum cover glass sheet can prevent the external temperature and air flow from affecting the test result, and further improve the accuracy of the test result. BRIEF DESCRIPTION OF DRAWINGS

[0014] Fig. 1 It is a structural schematic view of an embodiment.

[0015] Fig. 2 It is a sectional view of an embodiment.

[0016] Mark: 1, test base; 2, test seat; 3, test groove; 4, placing seat; 5, placing groove; 6, vacuum cover base; 7, vacuum cover mounting seat; 8, first positioning groove; 9, second positioning groove; 10, first vacuum cover glass sheet; 11, second vacuum cover glass sheet; 12, air blowing seat; 13, first air blowing hole; 14, air blowing head; 15, test magnetic field; 16, first coil; 17, second coil; 18, mounting rack; 19, fixed iron core; 20, fixing screw; 21, second air blowing hole; 22, third air blowing hole. DETAILED DESCRIPTION

[0017] The following description is only a preferred embodiment of the utility model, the protection scope is not only limited to this embodiment, and the technical solutions of the utility model under the idea of belonging to the utility model should belong to the protection scope of the utility model. Same parts are indicated with same reference numerals. It should be noted that the words "front", "back", "left", "right", "up" and "down" used in the following description refer to the direction in the drawing, and the words "bottom" and "top", "inner" and "outer" refer to the direction towards or away from the geometric center of a particular component.

[0018] As shown in Figs. 1-2 A three-temperature test fixture with adjustable magnetic field, comprising a test base 1, a test seat 2 is fixedly arranged at the upper end of the test base 1, a test groove 3 is arranged at the upper end of the test seat 2, a placing seat 4 is fixedly arranged at the inner side of the test groove 3, a placing groove 5 is arranged at the upper end of the placing seat 4, the placing groove 5 can be used to place the chip to be tested, a vacuum cover base 6 is fixedly arranged at the upper end of the test seat 2, a vacuum cover mounting seat 7 is arranged above the vacuum cover base 6, and the vacuum cover base 6 and the vacuum cover mounting seat 7 are detachably connected, a plurality of fixing screws 20 are arranged on the vacuum cover mounting seat 7, the lower ends of the plurality of fixing screws 20 are respectively arranged in the vacuum cover base 6, and the vacuum cover mounting seat 7 and the vacuum cover base 6 are fixedly connected through the plurality of fixing screws 20. The fixing and dismounting between the vacuum cover base 6 and the vacuum cover mounting seat 7 can be realized through the plurality of fixing screws 20.

[0019] The upper end of the vacuum cover base 6 and the lower end of the vacuum cover mounting seat 7 are respectively provided with a first positioning groove 8 and a second positioning groove 9, a first vacuum cover glass sheet 10 and a second vacuum cover glass sheet 11 are respectively embedded in the two first positioning grooves 8 and the second positioning grooves 9, a blowing seat 12 is arranged at the lower end of the vacuum cover mounting seat 7, and the lower end of the blowing seat 12 is located in the second vacuum cover glass sheet 11. The first vacuum cover glass sheet 10 and the second vacuum cover glass sheet 11 can be positioned and installed through the first positioning groove 8 and the second positioning groove 9, and the test results can be prevented from being affected by external temperature and airflow through the first vacuum cover glass sheet 10 and the second vacuum cover glass sheet 11, and the accuracy of the test results can be further improved.

[0020] The first blowing hole 13 is arranged on the blowing seat 12, and the blowing head 14 is arranged on the upper end of the blowing seat 12 and is communicated with the first blowing hole 13. The second blowing hole 21 is arranged on the lower end of the test base 1 and is communicated with the test groove 3. The third blowing hole 22 is arranged on one side of the test seat 2 and is communicated with the test groove 3. The blowing head 14, the first blowing hole 13, the second blowing hole 21 and the third blowing hole 22 can inject air flow into the test groove 3 at the same time, so that the temperature of the test groove 3 can be controlled by changing the temperature of the air flow, and the temperature of the test groove 3 can be uniform, so that the chip can be tested and verified under different temperature environments. The temperature range of the test groove 3 can be controlled in the range of -50 degrees to 125 degrees (i.e. low, normal and high temperature test can be realized).

[0021] The test magnetic field 15 is arranged on both sides of the test seat 2. The magnetic field generated by the test magnetic field 15 can meet the test and verification of the chip under different magnetic field environments. The magnetic field generated by the test magnetic field 15 can reach 1200gs. The test magnetic field 15 includes the first coil 16 and the second coil 17. The two mounting frames 18 are fixedly arranged on the upper end of the test base 1. The first coil 16 and the second coil 17 are arranged between the two mounting frames 18 and the test seat 2. The first coil 16 and the second coil 17 are respectively provided with the fixed iron core 19. The other ends of the two fixed iron cores 19 are arranged in the test seat 2 and are respectively arranged at the two ends of the placing seat 4. The first coil 16 and the second coil 17 can generate a magnetic field by being electrified, and the magnetic field can be transmitted to the test groove 3 by the fixed iron core 19, so that the chip can be tested under different magnetic field environments.

[0022] The above specific embodiments further illustrate the technical problems, technical solutions and beneficial effects solved by the utility model. It should be understood that the above description is only a specific embodiment of the utility model and is not used to limit the utility model. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the utility model should be included in the protection scope of the utility model.

Claims

1. A three-temperature test fixture with adjustable magnetic field, characterized in that, The utility model provides a test base (1) is included, the upper end of test base (1) is fixed with test seat (2), the upper end of test seat (2) is provided with test groove (3), the inboard of test groove (3) is fixed with the placement seat (4), the upper end of placement seat (4) is equipped with the placement groove (5), the upper end of test seat (2) is fixed with vacuum cover base (6), the upper of vacuum cover base (6) is equipped with vacuum cover mounting seat (7), and vacuum cover base (6) and vacuum cover mounting seat (7) are detachably connected, the upper end of vacuum cover base (6) and the lower end of vacuum cover mounting seat (7) are provided with first positioning groove (8) and second positioning groove (9) respectively, two first positioning groove (8) and second positioning groove (9) are respectively embedded with first vacuum cover glass sheet (10) and second vacuum cover glass sheet (11), the lower end of vacuum cover mounting seat (7) is provided with blowing seat (12), and the lower end of blowing seat (12) is located in second vacuum cover glass sheet (11), first blowing hole (13) is formed in blowing seat (12), blowing head (14) is also installed on the upper end of blowing seat (12), and blowing head (14) is communicated with first blowing hole (13), both sides of test seat (2) are also provided with test magnetic field (15).

2. The three-temperature test fixture with adjustable magnetic field according to claim 1, wherein, The test magnetic field (15) includes a first coil (16) and a second coil (17), the upper end of the test base (1) is fixed with two mounting racks (18), and the first coil (16) and the second coil (17) are respectively mounted between the two mounting racks (18) and the test seat (2), one end of the first coil (16) and the second coil (17) is respectively provided with a fixed iron core (19), the other end of the two fixed iron cores (19) penetrates the test seat (2) and is located at the two ends of the placement seat (4).

3. The three-temperature test fixture with adjustable magnetic field according to claim 2, characterized in that, A plurality of fixed screws (20) are provided on the vacuum cover mounting seat (7), the lower ends of the plurality of fixed screws (20) penetrate the vacuum cover base (6), and the vacuum cover mounting seat (7) and the vacuum cover base (6) are fixedly connected by the plurality of fixed screws (20).

4. The three-temperature test fixture with adjustable magnetic field according to claim 3, characterized in that, A second blowing hole (21) is formed in the lower end of the test base (1), the second blowing hole (21) penetrates the test seat (2) and the test groove (3).

5. The three-temperature test fixture with adjustable magnetic field according to claim 4, characterized in that, A third blowing hole (22) is formed in one side of the test seat (2), and the third blowing hole (22) penetrates the test groove (3).

Images