Detection device for rapidly testing film layer transmittance of optical elements with different incident angles

Abstract

The utility model relates to the technical field of optical element film transmittance detection devices, in particular to a detection device for quickly testing film transmittance of optical elements with different incident angles, which comprises a connecting base and a mounting rack, a central hole is arranged on the upper surface of the connecting base, and jacks are symmetrically arranged on two sides of the central hole on the upper surface of the connecting base. And positioning pins are arranged in the inserting holes, locking holes are symmetrically formed in the circumferential side face of the connecting base, locking rods are arranged in the locking holes, and a stepped groove is formed in the surface of the mounting frame. According to the detection device for rapidly testing the film layer transmittance of the optical elements with different incident angles, through a precise rotation matching structure of the rotating shaft and the central hole and in combination with a lockable rotating mechanism, the continuous and rapid adjustment and testing of the large-range incident angles can be realized after the optical elements are clamped at one time. The cumbersome process that tools with different angles need to be replaced or elements need to be repeatedly disassembled in a traditional method is thoroughly avoided.

Description

TECHNICAL FIELD

[0001] The utility model relates to optical element film layer transmittance detection device technical field, especially in quick test different incident angle optical element film layer transmittance detection device. BACKGROUND

[0002] In optical element, due to the reflection of element surface, light energy loss is caused, in order to reduce the reflection loss of element surface, the transparent medium film is often plated on the surface of optical element, that is, the antireflection film.

[0003] With the higher requirement of optical system detection, the spectral region of optical system is wider (near infrared, infrared band), and the incident angle is as large as possible. Therefore, the antireflection film of the single optical element in the optical system requires higher transmittance in the use band, and the incident angle index of the film layer is large (0°~70°). In order to detect the large incident angle transmittance index of the film layer, the transmittance index of other incident angles is usually converted into 0° incident transmittance index through theoretical calculation, so as to indirectly judge whether the transmittance meets the index requirement of the film coating, or the single different angle measuring tool is used for testing at each angle, which leads to low test efficiency, non-intuitive detection result and other problems. Therefore, we propose a kind of quick test different incident angle optical element film layer transmittance detection device. UTILITY MODEL CONTENT

[0004] The main purpose of the utility model is to provide a kind of quick test different incident angle optical element film layer transmittance detection device, which can effectively solve the problems in the background art.

[0005] To achieve the above purpose, the technical scheme adopted by the utility model is as follows:

[0006] A kind of quick test different incident angle optical element film layer transmittance detection device, including connecting base and mounting bracket, the center hole is set in the upper surface of the connecting base, the plug hole is set in the upper surface of the connecting base and is symmetrical on the both sides of the center hole, the positioning pin is arranged in the plug hole, the locking hole is set in the symmetrical side surface of the connecting base, the locking rod is arranged in the locking hole, the step groove is set in the surface of the mounting bracket, the installation groove is set in the inner wall of the step groove, the rotating rod is arranged on the bottom surface of the mounting bracket, the rotating shaft is sleeved on the side surface of the rotating rod, the upper cover is arranged on the upper surface of the mounting bracket, the positioning block is symmetrically arranged on the bottom surface of the upper cover, the positioning groove is set in the opposite surface of the mounting bracket.

[0007] Preferably, the rotating rod is fixedly connected with the inner wall of the rotating shaft, the rotating shaft is in shape and size adapted to the central hole, and the rotating shaft is arranged in the central hole and rotationally matched with the central hole.

[0008] Preferably, the locking hole is threadedly matched with the locking rod, and one end of the locking rod is tightly attached to the peripheral side surface of the rotating shaft. By adopting the above technical scheme, when the mounting frame is adjusted to the target incident angle, the locking rod is rotated to tightly attach one end of the locking rod to the peripheral side surface of the rotating shaft, and the rotating shaft is fixed by friction force; when the angle needs to be adjusted, the locking rod is reversely rotated to loosen, and any component does not need to be disassembled for operation, the threadedly matched locking force can be accurately controlled, displacement of the rotating shaft in the test caused by too loose locking force and damage of components caused by too tight locking force are avoided, and the incident angle is ensured to be stable in the test process.

[0009] Preferably, the mounting groove and the stepped groove are both in a "U" structure, the positioning block is in shape and size adapted to the positioning groove, and the positioning block is clamped and matched with the positioning groove.

[0010] Preferably, a plurality of scales are arranged around the upper surface of the connecting base, and horizontal lines are equidistantly arranged on the upper surface of the connecting base. By adopting the above technical scheme, 360-degree scales are uniformly arranged around the upper surface of the connecting base, the minimum scale value is 30', and the scales are marked radially outward from the central hole; the horizontal lines on the upper surface of the connecting base need to be completely aligned with the X direction of the test light of the spectrometer, serving as a reference line for the incident angle adjustment, and the precise scale of 30' can directly read the incident angle, without indirectly judging the angle by theoretical calculation, solving the problem of "non-intuitive angle conversion" in the prior art, and making the test result clearer.

[0011] Preferably, the connecting base, the upper cover and the mounting frame are blackened to prevent stray light from being generated in the test cabin. By adopting the above technical scheme, the surfaces of the connecting base, the upper cover and the mounting frame are blackened to cover all surfaces that can be contacted by the test light, especially the areas close to the optical element such as the stepped groove and the mounting groove of the mounting frame, so that no reflective surface is exposed in the test cabin of the spectrometer, the blackening treatment can greatly reduce the reflected light of the structure surface, avoid the interference of the stray light reflected in the test cabin on the test light, and solve the problem of "stray light leading to distortion of transmittance data" in the prior art.

[0012] Compared with the prior art, the present application has the following beneficial effects:

[0013] 1. Through the precise rotational fit between the rotating shaft and the central hole, combined with a lockable rotating mechanism, optical components can be continuously and rapidly adjusted and tested over a wide range of incident angles after a single mounting. This completely avoids the cumbersome process of changing different angle fixtures or repeatedly disassembling components in traditional methods, integrating the originally discrete and intermittent testing process into a highly efficient continuous operation, significantly improving inspection efficiency, and is especially suitable for rapid quality inspection and spectral analysis of batch optical components.

[0014] 2. The 360° precision scale and horizontal baseline on the upper surface of the connecting base make the adjustment and reading of the incident angle direct and visible. Users can directly align the edge of the mounting bracket with the scale line of the desired angle, and the minimum scale value of 30′ ensures the accuracy of the angle setting. This solves the problems of error and lack of intuitiveness introduced by the traditional reliance on theoretical conversion to indirectly judge the angle, making the testing process more controllable and the results more reliable.

[0015] 3. The concentric rotating structure ensures that the test point of the optical element is always located on the focal plane of the spectrometer and the optical axis is aligned, guaranteeing the accuracy of the test optical path from a mechanical design perspective. The threaded locking mechanism can firmly lock the rotating shaft through friction after the angle is adjusted to the correct position, effectively preventing angle drift caused by slight vibrations or disturbances during spectrometer scanning, thereby ensuring the repeatability and accuracy of the test data.

[0016] 4. By comprehensively blackening all key structural components such as the connecting base, mounting bracket, and top cover, non-test stray light within the test chamber is absorbed to the maximum extent. This design significantly reduces background noise and effectively solves the problem of transmittance test data distortion caused by interference from the device's own reflected light, making the measurement results, especially for high-transmittance films, more realistic and accurate. Attached Figure Description

[0017] Figure 1 This is a schematic diagram of the overall structure of a device for quickly testing the transmittance of optical element films at different incident angles according to the present invention.

[0018] Figure 2 This is an exploded view of a device for quickly testing the transmittance of optical element films at different incident angles, according to the present invention.

[0019] Figure 3 This is a front view of a device for quickly testing the transmittance of optical element films at different incident angles, according to the present invention.

[0020] Figure 4 In this utility model Figure 3 Cross-sectional view of section AA.

[0021] In the figure: 1, connecting base; 101, center hole; 11, insertion hole; 110, positioning pin; 12, locking hole; 120, locking rod; 13, scale; 14, horizontal line; 2, mounting frame; 20, mounting groove; 201, rotating rod; 202, rotating shaft; 203, positioning groove; 204, upper cover; 205, positioning block; 206, stepped groove. DETAILED DESCRIPTION

[0022] In order to make the technical means, creative features, purposes and effects of the utility model easy to understand, the utility model is further described below in combination with specific embodiments.

[0023] In the description of the utility model, it should be pointed out that the directions or position relationships indicated by the terms "upper", "lower", "inner", "outer", "front end", "rear end", "two ends", "one end" and "the other end" are based on the directions or position relationships shown in the drawings, and are only for the convenience of describing the utility model and simplifying the description, and therefore cannot be understood as limiting the utility model. In addition, the terms "first" and "second" are only for the purpose of description, and cannot be understood as indicating or implying relative importance.

[0024] In the description of the utility model, it should be pointed out that unless otherwise specified and limited, the terms "mounting", "provided with" and "connected" should be understood broadly, for example, "connected" can be fixedly connected, or can be detachably connected, or integrally connected; can be mechanically connected, or can be electrically connected; can be directly connected, or can be indirectly connected through an intermediate medium; can be the communication between two elements. For ordinary skilled persons in the art, the specific meaning of the above terms in the utility model can be understood according to the specific circumstances.

[0025] Please refer to Figures 1-4 The utility model provides a technical scheme:

[0026] A kind of fast test different incident angle optical element film layer transmittance detection device, including connecting base 1 and mounting frame 2, center hole 101 is set on the upper surface of connecting base 1, insertion hole 11 is set on the upper surface of connecting base 1 and located at the two sides of center hole 101 symmetrically, positioning pin 110 is arranged in insertion hole 11, locking hole 12 is set on the side surface of connecting base 1 symmetrically, locking rod 120 is arranged in locking hole 12, stepped groove 206 is set on the surface of mounting frame 2, installation groove 20 is set on the inner wall of one side of stepped groove 206, rotating rod 201 is arranged on the bottom surface of mounting frame 2, rotating shaft 202 is sleeved on the side surface of rotating rod 201, upper cover 204 is arranged on the upper surface of mounting frame 2, positioning block 205 is symmetrically arranged on the bottom surface of upper cover 204, positioning groove 203 is set on the opposite two surfaces of mounting frame 2.

[0027] In this embodiment, the rotating rod 201 is fixedly connected with the inner wall of the rotating shaft 202, the rotating shaft 202 is in shape and size adapted to the center hole 101, the rotating shaft 202 is arranged in the center hole 101 and rotationally matched with the center hole 101, the locking hole 12 is threadedly matched with the locking rod 120, one end of the locking rod 120 is closely attached to the circumferential surface of the rotating shaft 202, the mounting groove 20 and the stepped groove 206 are both in “U” structure, the positioning block 205 is in shape and size adapted to the positioning groove 203, the positioning block 205 is clamped and matched with the positioning groove 203, a plurality of scales 13 are arranged around the upper surface of the connecting base 1, the horizontal lines 14 are equidistantly arranged on the upper surface of the connecting base 1, the connecting base 1, the upper cover 204 and the mounting frame 2 are all blackened to prevent stray light from being generated in the test cabin. Through the above scheme: first, the positioning pin 110 is fixedly installed on the spectrometer body, then the element is placed in the “U” shaped mounting groove 20 and the stepped groove 206 of the mounting frame 2, and then the upper cover 204 is covered, the positioning block 205 at the bottom of the upper cover 204 is clamped and matched with the positioning groove 203 of the mounting frame 2, the element is longitudinally compressed, and it is ensured that the element is not loose and deviated during the test, the rotating rod 201 at the bottom of the mounting frame 2 is fixedly connected with the rotating shaft 202, the rotating shaft 202 is precisely rotationally matched with the center hole 101 of the connecting base 1, the center of the rotating shaft 202 coincides with the focal plane of the spectrometer test space, the optical axis of the spectrometer coincides with the central axis of the connecting base 1, the locking rod 120 around the connecting base 1 is threadedly matched with the locking hole 12, when the mounting frame 2 is rotated to the target incident angle, the locking rod 120 is twisted to make one end thereof closely attached to the circumferential surface of the rotating shaft 202, the rotating shaft 202 is fixed by friction force, and it is ensured that the incident angle is kept stable during the test; when the angle needs to be adjusted, the locking rod 120 is untwisted in the reverse direction, and any component does not need to be disassembled. The 360° scale 13 is arranged on the upper surface of the connecting base 1, the minimum value is 30', the scale 13 is marked by the center hole 101 and radiated outward, and the incident angle after the mounting frame 2 is rotated can be directly read without needing to indirectly judge the angle by theoretical calculation.

[0028] It needs to be explained that the positioning pin 110 is fixedly installed on the spectrometer body first, then the element is placed in the "U"-shaped installation groove 20 and the stepped groove 206 of the installation rack 2, and then the upper cover 204 is covered, the positioning block 205 at the bottom of the upper cover 204 is clamped and matched with the positioning groove 203 of the installation rack 2, the element is longitudinally compressed, and it is ensured that the element is not loose and deviated during the test process, the rotating rod 201 at the bottom of the installation rack 2 is fixedly connected with the rotating shaft 202, the rotating shaft 202 is precisely rotationally matched with the center hole 101 of the connecting base 1, the center of the rotating shaft 202 coincides with the focal plane of the spectrometer test space, and the optical axis of the spectrometer coincides with the center axis of the connecting base 1, the locking rod 120 on the side of the connecting base 1 is threadedly matched with the locking hole 12, when the installation rack 2 is rotated to the target incident angle, the locking rod 120 is screwed to tightly abut against the side surface of the rotating shaft 202, the rotating shaft 202 is fixed through the friction force, and it is ensured that the incident angle is stable during the test process; when the angle needs to be adjusted, the locking rod 120 is unscrewed in the reverse direction, and any part does not need to be disassembled. The upper surface of the connecting base 1 is provided with a 360° scale 13, the minimum value is 30', and the scale 13 is marked outwardly from the center hole 101, so that the incident angle after the installation rack 2 is rotated can be directly read, and the angle does not need to be indirectly judged through theoretical calculation; through the blackening treatment such as spraying a light-absorbing coating on the connecting base 1, the upper cover 204 and the installation rack 2, the surfaces that can possibly contact the test light rays are covered, especially the areas close to the element such as the stepped groove 206 and the installation groove 20 of the installation rack 2, the treatment can greatly reduce the reflected light of the structure surface, avoid the interference of stray light reflected in the test cabin on the test light rays, and ensure the authenticity of the film layer transmittance data.

[0029] The basic principle and main features of the utility model and the advantages of the utility model are shown and described. It should be understood by those skilled in the industry that the utility model is not limited by the above-mentioned embodiments, and the above-mentioned embodiments and the description in the specification only illustrate the principle of the utility model, various changes and improvements of the utility model can be made without departing from the spirit and scope of the utility model, and these changes and improvements all fall within the scope of the utility model claimed. The protection scope of the utility model is defined by the appended claims and their equivalents.

Claims

1. A device for rapid testing of the transmittance of a film layer of an optical element at different angles of incidence, comprising a connecting base (1) and a mounting frame (2), characterized in that: The connecting base (1) upper surface is provided with a center hole (101), the connecting base (1) upper surface is provided with a jack (11) on both sides of the center hole (101) symmetrically, the jack (11) is provided with a positioning pin (110), the connecting base (1) circumferential surface is provided with a locking hole (12) symmetrically, the locking hole (12) is provided with a locking rod (120), the mounting frame (2) surface is provided with a stepped groove (206), the stepped groove (206) inner wall one side is provided with a mounting groove (20), the mounting frame (2) bottom surface is provided with a rotating rod (201), the rotating rod (201) circumferential surface is provided with a rotating shaft (202), the mounting frame (2) upper surface is provided with an upper cover (204), the upper cover (204) bottom surface is provided with a positioning block (205) symmetrically, the mounting frame (2) opposite two surfaces are provided with a positioning groove (203).

2. The device for quickly testing the transmittance of optical element films at different incident angles according to claim 1, characterized in that: The rotating rod (201) circumferential surface and the rotating shaft (202) inner wall are fixedly connected, the rotating shaft (202) shape and size are adapted to the center hole (101), the rotating shaft (202) is arranged in the center hole (101) and is rotationally connected with the center hole (101).

3. The device for quickly testing the transmittance of optical element films at different incident angles according to claim 1, characterized in that: The locking hole (12) and the locking rod (120) are screw threaded, one end of the locking rod (120) is closely attached to the rotating shaft (202) circumferential surface. 4.The device for testing the transmittance of the film layer of the optical element with different incident angles according to claim 1, wherein: The mounting groove (20) and the stepped groove (206) are all "U" structures, the positioning block (205) shape and size are adapted to the positioning groove (203), the positioning block (205) and the positioning groove (203) are clamped and matched.

5. The device according to claim 1, wherein the device is characterized in that: The connecting base (1) upper surface is provided with a plurality of scales (13) around, the connecting base (1) upper surface is provided with a horizontal line (14) equidistantly. 6.The device for testing the transmittance of the film layer of the optical element with different incident angles according to claim 1, wherein: The connecting base (1), the upper cover (204) and the mounting frame (2) are all blackened, so as to prevent the test cabin from producing astigmatism.

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