Auxiliary sliding table system for NFC card swiping test

Abstract

The utility model discloses an auxiliary sliding table system for NFC card swiping test, which comprises a base, a sliding table assembly, a control circuit board, a card frame assembly and a test board, the control circuit board is connected with the sliding table assembly and the test board, the test board is connected with a test card in a near field communication mode, the sliding table bears the test card, and the card frame assembly is connected with the test card. And the distance between the test card and the test board is changed. The moving range of the sliding table is larger than the distance between the limit card swiping distance and the problem distance. The limit card swiping distance is the distance between the test card and the test board corresponding to the threshold value, and the problem distance is the distance that the distance between the test card and the test board does not reach the limit card swiping distance but the data packet accuracy is lower than the threshold value. The sliding table is provided with a clamping groove used for fixing a test card, and the card frame assembly stores the test card. By utilizing the NFC card testing system, semi-automatic card swiping testing and full-automatic card swiping testing aiming at NFC card testing are realized, and the purpose of verifying the stability and compatibility of the NFC card is achieved.

Description

Technical Field

[0001] This utility model relates to an auxiliary slide system for NFC card swiping testing, belonging to the field of communication testing technology. Background Technology

[0002] Near Field Communication (NFC) is a short-range, high-frequency wireless communication technology that allows devices using NFC (such as mobile phones and smart bracelets) to exchange data when they are close to each other. NFC technology integrates a contactless reader, contactless card, and peer-to-peer communication functions onto a single chip, enabling applications such as mobile payments and electronic ticketing via mobile terminals.

[0003] Currently, the application of NFC technology is becoming increasingly widespread, and the number of smart cards supporting NFC (NFC cards for short) is also increasing. To ensure the stability and compatibility of NFC cards, extensive card-swiping testing is required. However, the card-swiping testing process is very tedious and involves a large amount of repetitive work, requiring technicians to expend a significant amount of time and effort.

[0004] Chinese invention patent ZL 202210573340.8 discloses a testing device for radio frequency (RF) chips. This invention utilizes probes to test the chips. The first tray of the testing device has probes and at least two pressure sensors on its first surface opposite to a second tray. The second tray has chip slots for placing the RF chip on its second surface opposite to the first tray. The pins of the RF chip are opposite to the probes, and the pressure sensors are used to measure the pressure between the probes and the pins.

[0005] However, there is a general lack of semi-automated testing systems specifically designed for testing NFC cards in the current technology. Summary of the Invention

[0006] The primary technical problem this invention aims to solve is to provide an auxiliary slide system for NFC card swiping testing.

[0007] To achieve the above technical objectives, the present invention adopts the following technical solution:

[0008] An auxiliary slide system for NFC card swiping testing includes a base, a slide assembly, a control circuit board, a card holder assembly, and a test board. The control circuit board is connected to the slide assembly and the test board.

[0009] The test board is connected to the test card via near-field communication; the slide assembly includes a stepper motor feedback module, a slide, and a range limiting module; the slide carries the test card and changes the distance between the test card and the test board.

[0010] The sliding range of the slide is greater than the distance between the limit swiping distance and the problem distance; wherein, the limit swiping distance is the distance between the test card and the test board corresponding to the threshold; the problem distance is the distance between the test card and the test board where the distance has not reached the limit swiping distance but the data packet accuracy is lower than the threshold.

[0011] The slide has a slot for fixing the test card;

[0012] The card holder assembly is positioned opposite the card slot to store one or more test cards to be tested, which can then be retrieved from the card slot.

[0013] Preferably, the auxiliary slide system further includes a robotic arm;

[0014] The robotic arm is mounted on the base and is used to remove test cards from the card slot or place test cards into the card slot.

[0015] Preferably, the auxiliary slide system further includes a first telescopic mechanism and a second telescopic mechanism; wherein...

[0016] The upper end of the slide assembly is connected to the telescopic end of the first telescopic mechanism, and the lower end is connected to the telescopic end of the second telescopic mechanism; the first telescopic mechanism and the second telescopic mechanism can change the spatial position of the slide.

[0017] Preferably, the card holder assembly includes a card holder and a plurality of alternative plates; the card holder is the supporting structure of the card holder assembly, is arranged vertically, and contacts and connects to the base; one end of each alternative plate contacts and connects to the card holder, and the other end extends naturally.

[0018] The alternative plates are arranged horizontally and are parallel to the slots; multiple alternative plates are parallel to each other and arranged vertically with spacing that meets design requirements.

[0019] Preferably, the card holder assembly includes a card holder, a backup plate, and an automatic card dispenser. The automatic card dispenser is located above the backup plate and fixed above the card holder, and is used to place test cards into the backup plate. The backup plate is parallel to the card slot.

[0020] Preferably, the auxiliary slide system is powered by a 220V AC power supply and a 24V adapter.

[0021] The control circuit board includes an MCU main control module, a power conversion module, a slide drive module, a display module, an operation module, and a serial communication module; wherein, the 24V adapter is connected to the power conversion module, the slide drive module, and the slide assembly to supply power to them.

[0022] Preferably, the power conversion module is connected to the slide drive module, the range limiting module, the MCU main control module, the stepper motor feedback module, the serial communication module, the display module, and the operation module.

[0023] Preferably, the slide drive module is connected to the slide, and the slide is connected to the stepper motor feedback module; wherein, the slide drive module is used to convert the control signal transmitted from the MCU main control module into a stepper motor control signal, thereby controlling the movement of the slide.

[0024] Preferably, the range limiting module is connected to the MCU main control module and is used to limit the movement range of the slide table during the test; wherein, when the slide table reaches the position of the limit switch, the range limiting module sends an interrupt signal to the MCU main control module, and the MCU main control module stops the movement of the slide table after receiving the interrupt signal, thereby controlling the range of the slide table.

[0025] Preferably, the stepper motor feedback module is connected to the MCU main control module; wherein, the stepper motor feedback module uses an encoder to feed back the speed and number of steps of the stepper motor to achieve closed-loop control.

[0026] Compared with the prior art, this utility model has the following technical features: (1) It realizes automatic card swiping test for NFC card testing, so as to verify the stability and compatibility of NFC card; (2) Since it is an automatic test, the step distance can be adjusted to be very small and repeated multiple times, thereby improving the test accuracy and precision; (3) With the automatic card dispensing design, multiple cards can be tested in batches without human intervention, thus significantly improving work efficiency, reducing manual labor intensity, and saving human resources. Attached Figure Description

[0027] Figure 1 This is a schematic diagram of the auxiliary slide system for NFC card swiping testing in the first embodiment of the present invention;

[0028] Figure 2 for Figure 1 The circuit structure block diagram of the auxiliary slide system used for NFC card swiping testing is shown in the figure.

[0029] Figure 3 for Figure 1 The flowchart of the card swiping test for the auxiliary slide system used for NFC card swiping test is shown in the figure.

[0030] Figure 4 This is a schematic diagram of the overall structure of the auxiliary slide system for NFC card swiping testing in the second embodiment of the present invention.

[0031] Figure 5 for Figure 4 The diagram shows the structure of the card holder removal assembly of the auxiliary slide system used for NFC card swiping testing.

[0032] Figure 6 for Figure 4 The diagram shows the card holder assembly structure of the auxiliary slide system used for NFC card swiping testing. Detailed Implementation

[0033] The technical content of this utility model will be described in detail below with reference to the accompanying drawings and specific embodiments.

[0034] First Embodiment

[0035] like Figure 1 As shown, the first embodiment of this utility model discloses an auxiliary slide system for NFC card swiping testing, including a slide assembly 10 and a control circuit board 20. The control circuit board 20 is connected to the slide assembly 10 and a PCD (Proximity Coupling Device) test board 30 via multiple sets of wires. The PCD test board 30 is connected to the test card 100 via near-field communication. The slide 40 is used to support the test card 100, thereby changing the distance between the test card 100 and the PCD test board 30. Furthermore, this auxiliary slide system for NFC card swiping testing is powered by a 220V AC power supply and a 24V adapter.

[0036] Furthermore, such as Figure 2 As shown, the control circuit board 20 includes an MCU main control module, a power conversion module, a slide drive module, a display module, an operation module, and a serial communication module. The slide assembly 10 includes a stepper motor feedback module, a slide, and a range limiting module. The movement range of the slide is greater than the distance between the limit swiping distance and the problem distance. Here, the limit swiping distance is the distance between the test card and the PCD test board corresponding to a threshold; the problem distance is the distance between the test card and the PCD test board where the distance has not reached the limit swiping distance but the data packet accuracy is lower than a preset threshold.

[0037] A 24V adapter converts the input 220V AC power into 24V DC power and supplies it to the power conversion module, the slide drive module, and the slide. The power conversion module converts the input 24V DC power into 5V DC power and supplies it to the components in the control circuit board 20. Specifically, the 24V adapter is connected to the power conversion module, the slide drive module, and the slide, supplying them with power. The power conversion module is connected to the slide drive module, the range limiting module, the MCU main control module, the stepper motor feedback module, the serial communication module, the display module, and the operation module. The slide drive module is connected to the slide, and the slide is connected to the stepper motor feedback module. The range limiting module is connected to the MCU main control module 1500, and the MCU main control module 1500 is connected to the slide drive module and the display module. The stepper motor feedback module is connected to the MCU main control module. The operation module is connected to the MCU main control module to issue signals such as test start or end.

[0038] The slide drive module converts the 5V control signal transmitted from the MCU main control module 1500 into a 24V stepper motor control signal via a driver chip, thereby controlling the movement of the slide 40. Specifically, the slide drive module sends signals to control the movement or stop of the slide 40. Furthermore, the serial communication module is bidirectionally connected to the MCU main control module; the serial communication module can send signals to the MCU main control module, and the MCU main control module can also send signals to the serial communication module. The control signals of the MCU main control module 1500 are sent by the serial communication module 1700 or the operation module 1900. The range limiting module 1400 limits the movement range of the slide during testing. This is achieved by limiters installed on the slide rails of the slide. When the slide reaches the position of the limiter, the range limiting module 1400 sends an interrupt signal to the MCU main control module 1500. Upon receiving the interrupt signal, the MCU main control module 1500 stops the movement of the slide, thus controlling the range of the slide.

[0039] The MCU main control module 1500 enables interaction and control between various modules through programming. The stepper motor feedback module 1600 uses an encoder to provide feedback on the stepper motor's speed and step count, achieving closed-loop control. Using a stepper motor allows for more precise movement of the slide, and the slide has a slot for NFC test cards, ensuring the card's position remains fixed within the slot, preventing changes in card placement from affecting test results. The serial communication module 1700 facilitates communication between the host computer and the MCU main control module 1500, enabling the MCU main control module 1500 to receive commands from the host computer to control the slide's movement, and simultaneously allowing the host computer to receive test data from the MCU main control module 1500 for analysis and judgment.

[0040] The display module can use an LCD screen or a digital tube. An LCD screen allows editing and displaying the slide distance and various set parameters, while a digital tube can only display the slide distance. The operation module 1900 consists of a button circuit for manual control of the slide movement. The MCU main control module 1500 controls the slide according to a pre-set program by judging the high and low levels of the buttons.

[0041] In one embodiment of this invention, the auxiliary slide system for NFC card swiping testing further includes a robotic arm for fully automated card-changing testing, eliminating the need for manual card replacement. The robotic arm is mounted on a base and can remove or insert test cards from the card slot.

[0042] like Figure 3 As shown, the auxiliary slide system for NFC card swiping testing described above implements the card swiping test process, which includes at least the following steps:

[0043] S1: Place test card 100 on slide 40.

[0044] S2: The host computer sends a start test command to the MCU main control module 1500. After receiving the command, the MCU main control module 1500 starts to control the stepper motor to work, thereby controlling the slide to move up and down and thus changing the test distance of the test card 100 to reach the preset distance.

[0045] Specifically, the host computer (PC) sends a start test command to the MCU main control module 1500 via the serial communication module 1700. The MCU main control module 1500 then outputs control signals to the slide drive module. The slide drive module converts the 5V control signal from the MCU main control module 1500 into a 24V stepper motor control signal and transmits it to the stepper motor. Upon receiving the signal, the stepper motor starts running, thereby controlling the slide to move up and down to reach the preset initial distance.

[0046] S3: When the test card is at the preset distance, the PCD test board will feed back the detected signal data to the MCU main control module.

[0047] The detected signal data refers to data related to signal strength or signal quality, such as packet loss rate, card swipe interaction data, number of correctly received packets, and number of incorrectly received packets.

[0048] S4: The host computer determines whether the signal quality has decreased to the threshold based on the signal data. If the threshold has not been reached, it issues an instruction to increase the initial distance by a predetermined (e.g., 1) step distance and proceeds to S5. If the threshold has been reached, it reads the current distance and outputs it to the display module, ending the test.

[0049] The threshold needs to be set based on the aforementioned detected signal data. In one embodiment of this invention, the threshold for signal quality is set as the accuracy rate of transmitting a preset number (e.g., 1000) of data packets between the test board and the test card, for example, 90%, 92%, or 95%.

[0050] The maximum swipe distance is the distance between the test card and the PCD test board corresponding to this threshold. The problem distance is the distance between the test card and the PCD test board that does not reach the maximum swipe distance, but the data packet accuracy is already below the threshold.

[0051] Because the farther the test card is from the PCD test board, the worse the signal quality becomes. Through testing, the maximum card swiping distance for normal near-field communication or the problem distance where communication problems occur can be obtained and recorded.

[0052] Specifically, the rotation of the stepper motor drives the encoder in the stepper motor feedback module 1600 to run, thereby generating a feedback signal. The feedback signal is then transmitted to the MCU main control module 1500 to achieve closed-loop program control, that is, to determine how the slide should continue to move by analyzing the feedback signal data.

[0053] S5: Control the slide to move to change the distance between the test card and the PCD test board, and return to step S3.

[0054] To facilitate understanding, an example of an actual testing process is provided here. For example... Figure 4 As shown, the slide first moves to 5cm and the PCD test board 30 starts card search interaction. The host computer analyzes the feedback data collected by the PCD test board 30 to determine whether the accuracy of transmitting 1000 data packets is above 90%, that is, whether the NFC card recognition accuracy is above the threshold of 90%.

[0055] If the accuracy rate of transmitting 1000 data packets is above the threshold (90%) when the slider is at the preset distance (5cm), raise the slider by 1cm (to 6cm) and continue testing to determine if the accuracy rate of transmitting 1000 data packets is still above 90%. If the accuracy rate of transmitting 1000 data packets is still above 90%, then continue testing by raising the slider by 1cm each time. Assume a total of n (n is a positive integer) times are raised. That is, when the slider is at (5+1*n)cm, the accuracy rate of transmitting 1000 data packets is less than 90%. That is, when the accuracy rate of transmitting 1000 data packets is less than 90%, lower the slider by 0.5cm and continue testing to determine if the accuracy rate of transmitting 1000 data packets is above 90%. If it is greater than 90%, then the maximum swiping distance of the test card is (5+1*n-0.5)cm. If it is less than 90%, then the maximum swiping distance of the test card is (5+1*n-1)cm. For example, if the slide only rises once, i.e., when the slide is at 6cm, the accuracy rate of transmitting 1000 data packets is less than 90%, then the slide is lowered by 0.5cm to continue the test. If the accuracy rate of transmitting 1000 data packets is greater than 90% at this time, the maximum card swiping distance of the test card is 5.5cm. If the accuracy rate of transmitting 1000 data packets is less than 90%, the maximum card swiping distance of the test card is 5cm.

[0056] If the accuracy rate of transmitting 1000 data packets is below 90% when the slider is at 5cm, lower the slider by 1cm (to 4cm) and continue testing to determine if the accuracy rate of transmitting 1000 data packets can reach 90%. If the accuracy rate is still below 90%, continue testing by lowering the slider by 1cm each time. Assume a total of n times, meaning the accuracy rate of transmitting 1000 data packets reaches 90% when the slider is at (5-1*n)cm. If the accuracy rate of transmitting 1000 data packets is greater than 90%, raise the slider by 0.5cm and continue testing to determine if the accuracy rate is still above 90%. If it is greater than 90%, the maximum swiping distance of the test card is (5-1*n+0.5)cm; if it is less than 90%, the maximum swiping distance of the test card is (5-1*n)cm. For example, if the slide only lowers once, i.e., when the slide is at 4cm, and the accuracy rate of transmitting 1000 data packets reaches 90%, then raise the slide by 0.5cm and continue testing. If the accuracy rate of transmitting 1000 data packets is greater than 90% at this time, the maximum swiping distance of the test card is 4.5cm. If the accuracy rate of transmitting 1000 data packets is less than 90%, the maximum swiping distance of the test card is 4cm.

[0057] If no data is received, it could be due to exceeding the card swiping distance limit or a damaged test card. Therefore, if data cannot be received even after repeatedly controlling the slide to change the distance between the test card and the PCD test board, the test card is determined to be damaged, and an alarm is issued.

[0058] If a retest of the problem distance is required, it can be achieved in the following two ways: 1. Manually control the motor to adjust the slide to the problem distance for retesting; 2. Directly use the host computer to send commands to adjust the slide to the problem distance based on the feedback data for testing.

[0059] Specifically, when using the first method, the slide is moved to the problem distance recorded in S3 via the control operation module 1900 (so that the slide distance displayed on the display module 1800 is the problem distance), and the test is performed again. When using the second method, the host computer analyzes the feedback data, finds the problem distance in S3, and directly sends a command to the MCU main control module 1500 to move the slide, thereby controlling the stepper motor to move the slide to the problem distance for retesting.

[0060] Compared with the prior art, the NFC card swiping test method and test auxiliary slide system provided by this utility model have the following technical features: (1) It realizes a semi-automatic card swiping test system and a fully automatic card swiping test system for NFC card testing, so as to verify the stability and compatibility of NFC cards; (2) Since it is an automatic test, the step distance can be adjusted to be very small and repeated multiple times, thereby improving the test accuracy and precision; (3) It can improve work efficiency, reduce manual labor intensity, and save human resources.

[0061] Second Embodiment

[0062] like Figures 4 to 6 As shown, the second embodiment of this utility model discloses an auxiliary slide system for NFC card swiping testing, which also includes a first telescopic mechanism 34, a second telescopic mechanism 35, a card holder assembly 5, and an identification component 6. The card holder assembly 5 is used to hold multiple test cards 100 to be tested. The identification component 6 is connected to the control circuit board 20 and is used to identify the spatial position of the slide 40 and the alternative board 52. The working principle of the identification component 6 includes, but is not limited to, visual recognition, infrared recognition, and laser ranging. The first telescopic mechanism 34 and the second telescopic mechanism 35 have the same structure; this embodiment only uses the first telescopic mechanism 34 as an example for explanation.

[0063] The first telescopic mechanism 34 includes a driver 341 and a telescoping element 342. The driver 341 is the fixed end of the first telescopic mechanism 34 and drives the telescoping element 342 to move axially. The working end of the telescoping element 342 is the telescopic end of the first telescopic mechanism 34. In some embodiments, the first telescopic mechanism 34 is an electric cylinder, the driver 341 is a motor in the electric cylinder, the telescoping element 342 is a lead screw in the electric cylinder, the outer shell of the electric cylinder is the fixed end, and the working end of the lead screw is the telescopic end. In some embodiments, the first telescopic mechanism 34 is a pneumatic cylinder or a hydraulic cylinder.

[0064] The fixed end of the first telescopic mechanism 34 contacts and connects to the upper end of the support structure, and the fixed end of the second telescopic mechanism 35 contacts and connects to the lower end of the support structure. The slide assembly 10 is arranged vertically (either vertically or at a designed angle), with its upper end connected to the telescopic end of the first telescopic mechanism 34 and its lower end connected to the telescopic end of the second telescopic mechanism 35. The first telescopic mechanism 34 and the second telescopic mechanism 35 can move the slide assembly 10 horizontally, changing the spatial position of the slide 40.

[0065] The drivers 341 of the first telescopic mechanism 34 and the second telescopic mechanism 35 are respectively connected to the control circuit board 20, and the motion is controlled by the control circuit board 20.

[0066] The slide table 40 is a plate-shaped bent structure used to support the test card 100 and is equipped with limiting structures to restrict the movement of the test card 100, such as limiting grooves and limiting pins. The slide table 40 can move along the light rod of the slide table assembly 10, and the range of movement is greater than the distance between the limit swiping distance and the problem distance. During the movement, the test card 100 can remain horizontal or tilted at a designed angle on the slide table 40.

[0067] like Figure 6As shown, the card holder assembly 5 is arranged opposite to the card slot, including a card holder 51 and multiple alternative plates 52. The card holder 51 is the supporting structure of the card holder assembly 5 and is arranged vertically. The alternative plates 52 are plate-shaped structures used to hold test cards 100. One end of the alternative plate 52 contacts and connects to the card holder 51, and the other end naturally extends as an extension end. The alternative plates 52 are arranged horizontally, with multiple alternative plates 52 parallel to each other and parallel to the card slot, arranged vertically with spacing meeting design requirements. In this embodiment, multiple alternative plates 52 are used, each alternative plate 52 for holding one test card 100 to be tested. As an alternative, one alternative plate 52 can be used in conjunction with an automatic card dispenser (located above the alternative plate and fixed above the card holder). When a test card 100 is tested, it falls into the pickup box below the card holder assembly 5 (below the alternative plate), and then the automatic card dispenser pushes out another test card 100 to the alternative plate 52 for testing. In this way, for example, 100 test cards 100 can be placed at once for automatic testing. This allows for unattended testing of large numbers of test cards, saving testing personnel time. The extension end of the alternative plate 52 is equipped with a limiting structure to restrict the movement of the test cards 100, such as a limiting groove and a limiting pin. Furthermore, the structure of the alternative plate 52 corresponds to the slide table 40, which can remove the test cards 100 from the alternative plate 52 and place them onto the alternative plate 52. For example, the alternative plate 52 and the slide table 40 have corresponding comb-like structures, and the movement trajectory of the comb-like structure of the slide table 40 can pass through a portion of the comb-like structure of the alternative plate 52 to remove or place the test cards 100.

[0068] The slide assembly 10 and the card holder assembly 5 are vertically mounted on the base, with the alternative plate 52 and the slide 40 facing each other. The test plate 30 is positioned between the slide assembly 10 and the card holder assembly 5, without obstructing the movement path of the slide assembly 10. The control circuit board 20 is connected to the slide assembly 10, the limit switch, the first telescopic mechanism 34, the second telescopic mechanism 35, the test plate 30, and the identification component 6.

[0069] When test cards 100 need to be tested, multiple test cards 100 are placed on multiple alternative boards 52, and the host computer sends a test command to the control circuit board 20. The control circuit board 20 controls the first telescopic mechanism 34 and the second telescopic mechanism 35 to move in coordination, and the driver 341 drives the extension of the extension end of the telescopic device 342, so that the slide assembly 10 moves closer to the card holder assembly 5. The control circuit board 20 controls the slide motor 323 to drive the slide screw 324 to rotate, thereby driving the slide 40 to move along the slide guide rod, so as to change the relative position of the slide 40 and the alternative boards 52. For example, the comb structure of the slide 40 passes through the comb structure of the alternative board 52 from bottom to top, so that the test cards 100 carried on the alternative boards 52 are changed to be carried on the slide 40.

[0070] The identification component 6 is used to identify the relative positions of the slide 40, the alternative board 52, and the test card 100 in real time, providing position signals to the control circuit board 20. The identification component 6 can also be omitted, or a positioning module can be used to detect the positional relationship and send position signals.

[0071] The control circuit board 20 controls the coordinated movement of the slide assembly 10, the first telescopic mechanism 34, and the second telescopic mechanism 35, causing the slide 40 and the test card 100 it carries to move closer to or further away from the test board 30, or maintaining the designed spacing between the test card 100 and the test board 30. The test board 30 tests the test card 100 and sends signals to the host computer and the control circuit board 20. Based on the signals from the host computer and the test board 30, the control circuit board 20 controls the test card 100 to move closer to or further away from the test board 30, or maintain the designed spacing between the test card 100 and the test board 30.

[0072] After the test, the control circuit board 20 drives the comb structure of the slide 40 to pass through the comb structure of the alternative board 52 from top to bottom, so that the test card 100 supported on the slide 40 is now supported on the alternative board 52. Then the above operation is repeated to automatically complete the testing of multiple test cards 100.

[0073] In summary, the auxiliary slide system provided by this utility model embodiment can achieve automatic card-swiping testing with high testing accuracy and precision by automatically picking up the test card to be tested, automatically delivering it and adjusting the step size. This can improve work efficiency, reduce manual labor intensity, and save human resources.

[0074] The auxiliary slide system for NFC card swiping testing provided by this utility model has been described in detail above. Any obvious modifications made to this utility model by those skilled in the art without departing from its essential content will constitute an infringement of the patent rights of this utility model and will incur corresponding legal liability.

Claims

1. An auxiliary slide system for NFC card swiping testing, characterized in that... It includes a base, a slide assembly, a control circuit board, a card holder assembly, and a test board, wherein the control circuit board is connected to the slide assembly and the test board. The test board is connected to the test card via near-field communication; the slide assembly includes a stepper motor feedback module, a slide, and a range limiting module; the slide carries the test card and changes the distance between the test card and the test board. The sliding range of the slide is greater than the distance between the limit swiping distance and the problem distance; wherein, the limit swiping distance is the distance between the test card and the test board corresponding to the threshold; the problem distance is the distance between the test card and the test board where the distance has not reached the limit swiping distance but the data packet accuracy is lower than the threshold. The slide has a slot for fixing the test card; The card holder assembly is positioned opposite the card slot to store one or more test cards to be tested, which can then be retrieved from the card slot.

2. The auxiliary slide system for NFC card swiping testing as described in claim 1, characterized in that... It also includes robotic arms; The robotic arm is mounted on the base and is used to remove test cards from the card slot or place test cards into the card slot.

3. The auxiliary slide system for NFC card swiping testing as described in claim 1, characterized in that... It also includes a first telescopic mechanism and a second telescopic mechanism; wherein, The upper end of the slide assembly is connected to the telescopic end of the first telescopic mechanism, and the lower end is connected to the telescopic end of the second telescopic mechanism; the first telescopic mechanism and the second telescopic mechanism can change the spatial position of the slide.

4. The auxiliary slide system for NFC card swiping testing as described in claim 3, characterized in that: The card holder assembly includes a card holder and multiple alternative plates; the card holder is the supporting structure of the card holder assembly, is arranged vertically, and contacts and connects to the base; one end of each alternative plate contacts and connects to the card holder, and the other end extends naturally. The alternative plates are arranged horizontally and are parallel to the slots; multiple alternative plates are parallel to each other and arranged vertically with spacing that meets design requirements.

5. The auxiliary slide system for NFC card swiping testing as described in claim 4, characterized in that: The card holder assembly includes a card holder, a backup plate, and an automatic card dispenser. The automatic card dispenser is located above the backup plate and fixed above the card holder, and is used to place test cards into the backup plate. The backup plate is parallel to the card slot.

6. The auxiliary slide system for NFC card swiping testing as described in claim 1, characterized in that: The auxiliary slide system is powered by a 220V AC power supply and a 24V adapter. The control circuit board includes an MCU main control module, a power conversion module, a slide drive module, a display module, an operation module, and a serial communication module; wherein, the 24V adapter is connected to the power conversion module, the slide drive module, and the slide assembly to supply power to them.

7. The auxiliary slide system for NFC card swiping testing as described in claim 6, characterized in that: The power conversion module is connected to the slide drive module, range limiting module, MCU main control module, stepper motor feedback module, serial communication module, display module, and operation module.

8. The auxiliary slide system for NFC card swiping testing as described in claim 7, characterized in that: The slide drive module is connected to the slide, and the slide is connected to the stepper motor feedback module; wherein, the slide drive module is used to convert the control signal transmitted from the MCU main control module into a stepper motor control signal, thereby controlling the movement of the slide.

9. The auxiliary slide system for NFC card swiping testing as described in claim 8, characterized in that: The range limiting module is connected to the MCU main control module and is used to limit the movement range of the slide table during the test. When the slide table reaches the position of the limit switch, the range limiting module sends an interrupt signal to the MCU main control module. After receiving the interrupt signal, the MCU main control module stops the movement of the slide table and thus controls the range of the slide table.

10. The auxiliary slide system for NFC card swiping testing as described in claim 9, characterized in that: The stepper motor feedback module is connected to the MCU main control module; wherein, the stepper motor feedback module uses an encoder to feed back the speed and number of steps of the stepper motor in order to realize closed-loop control.

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