Food thermometer and thermometer probe assembly
By setting a limiting structure inside the rotating shaft of the food thermometer to form a wire passage, the swing of the probe wire is restricted, which solves the problem of probe wire being cut and worn, and extends the service life of the food thermometer.
Patent Information
- Application Number
- CN202423318252.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-31
- Publication Date
- 2026-01-27
- Estimated Expiration
- 2034-12-31
AI Technical Summary
The probe wires of food thermometers are easily cut and worn by the sharp edges at the opening of the temperature probe tube, resulting in a reduced lifespan.
A limiting structure is set inside the rotating shaft to form a wire passage channel. The probe wire passes through this channel to limit its swing amplitude and avoid contact with the edge of the wire passage opening. The limiting structure includes a non-detachment stop structure and a locking entry design to prevent the probe wire from coming out.
This effectively prevents the probe wire from being cut and worn by the wire tube opening during rotation, thus extending the service life of the food thermometer.
Smart Images
Figure CN223841326U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of temperature measuring device technology, specifically to a food thermometer and a thermometer probe assembly. Background Technology
[0002] Thermometers have a wide range of applications, and food thermometers can be used in cooking appliances to measure the temperature of food during cooking. The probe assembly of a food thermometer includes a rotating shaft, a temperature-sensing probe tube, and a probe wire. The probe wire passes through the open end of the temperature-sensing probe tube. During the rotation of the shaft, the probe wire moves within the shaft and comes into contact with the edge of the opening of the temperature-sensing probe tube. With the increase of the number of rotations, the sharp edge of the opening of the temperature-sensing probe tube will cut and wear down the probe wire, thereby damaging the probe wire, causing the entire device to malfunction, and reducing the lifespan of the food thermometer. Utility Model Content
[0003] This application provides a thermometer probe assembly to improve the technical problem of short lifespan of current food thermometers caused by the probe wire being easily cut and worn by the sharp edge at the opening of the temperature measuring probe tube.
[0004] In addition, the purpose of this application is to provide a food thermometer using the above-described thermometer probe assembly.
[0005] In a first aspect, one embodiment provides a thermometer probe assembly, comprising:
[0006] A probe for temperature measurement, the probe comprising a probe tube;
[0007] A rotating shaft is connected to one end of the probe; the rotating shaft has a wiring space, and one end of the probe tube is an open wire tube that is exposed in the wiring space.
[0008] A probe wire, which extends through the wire-passing tube opening into the probe tube;
[0009] And a limiting structure, the limiting structure being fixed in the wiring space; the limiting structure and the rotating shaft forming a wiring channel, or the limiting structure forming a wiring channel;
[0010] The probe wire passes through the wire passage, which limits the swing amplitude of the probe wire at the wire passage opening.
[0011] Furthermore, in one embodiment, both ends of the wire passage have wire passage openings in the extension direction, and the side of the wire passage also has a locking inlet for the probe wire to be inserted; the locking inlet communicates with the wire passage openings at both ends of the wire passage.
[0012] In a further embodiment, the limiting structure has a guide slope at the card inlet, the guide slope being used to guide the probe wire toward the card inlet when the probe wire is inserted.
[0013] In a further embodiment, the limiting structure includes a stop structure that engages with the probe wire to prevent the probe wire from dislodging from the card inlet.
[0014] In a further embodiment, the anti-detachment stop structure includes an anti-detachment stop post fixed in the wiring space, wherein the extension direction of the anti-detachment stop post is perpendicular or approximately perpendicular to the extension direction of the wiring channel.
[0015] In a further embodiment, the anti-detachment stop structure and the wire passage are arranged in the extension direction of the probe wire, and in the extension direction of the probe wire, the wire passage is located between the anti-detachment stop structure and the wire passage opening; in the extension direction of the wire passage, there is an installation interval between the anti-detachment stop structure and the limiting structure for the probe wire to pass through when the probe wire is installed.
[0016] In a further embodiment, the wiring space is a wiring groove located within the rotating shaft, and the limiting structure and the groove wall of the wiring groove form the wiring passage; the limiting structure includes a first wire-clamping block and a second wire-clamping block, the first wire-clamping block is fixed on the bottom wall of the wiring groove, the second wire-clamping block is connected to one side of the first wire-clamping block, the wiring passage is located between the second wire-clamping block and the bottom wall of the groove, the clamping inlet is located between the second wire-clamping block and the side wall of the wiring groove, and a wiring groove is formed between the first wire-clamping block and the anti-detachment blocking structure.
[0017] In a further embodiment, the wiring space is a wiring groove located within the rotating shaft, and the limiting structure and the groove wall of the wiring groove form the wiring passage.
[0018] In another embodiment, the probe wire makes at least one turn around the axis of the rotating shaft in the wiring space.
[0019] In a second aspect, one embodiment provides a food thermometer, including a housing and a thermometer probe assembly, the thermometer probe assembly comprising:
[0020] A probe for temperature measurement, the probe comprising a probe tube;
[0021] A rotating shaft is rotatably mounted on the housing; the rotating shaft is connected to one end of the probe; the rotating shaft has a wiring space, and one end of the probe tube is an exposed wire passage opening in the wiring space;
[0022] A probe wire, which extends through the wire-passing tube opening into the probe tube;
[0023] And a limiting structure, the limiting structure being fixed in the wiring space; the limiting structure and the rotating shaft forming a wiring channel, or the limiting structure forming a wiring channel;
[0024] The probe wire passes through the wire passage, which limits the swing amplitude of the probe wire at the wire passage opening to prevent the probe wire from being cut by the wire passage opening.
[0025] Furthermore, in one embodiment, both ends of the wire passage have wire passage openings in the extension direction, and the side of the wire passage also has a locking inlet for the probe wire to be inserted; the locking inlet communicates with the wire passage openings at both ends of the wire passage.
[0026] In a further embodiment, the limiting structure has a guide slope at the card inlet, the guide slope being used to guide the probe wire toward the card inlet when the probe wire is inserted.
[0027] In a further embodiment, the limiting structure includes a stop structure that engages with the probe wire to prevent the probe wire from dislodging from the card inlet.
[0028] In a further embodiment, the anti-detachment stop structure includes an anti-detachment stop post fixed in the wiring space, wherein the extension direction of the anti-detachment stop post is perpendicular or approximately perpendicular to the extension direction of the wiring channel.
[0029] In a further embodiment, the anti-detachment stop structure and the wire passage are arranged in the extension direction of the probe wire, and in the extension direction of the probe wire, the wire passage is located between the anti-detachment stop structure and the wire passage opening; in the extension direction of the wire passage, there is an installation interval between the anti-detachment stop structure and the limiting structure for the probe wire to pass through when the probe wire is installed.
[0030] In a further embodiment, the wiring space is a wiring groove located within the rotating shaft, and the limiting structure and the groove wall of the wiring groove form the wiring passage; the limiting structure includes a first wire-clamping block and a second wire-clamping block, the first wire-clamping block is fixed on the bottom wall of the wiring groove, the second wire-clamping block is connected to one side of the first wire-clamping block, the wiring passage is located between the second wire-clamping block and the bottom wall of the groove, the clamping inlet is located between the second wire-clamping block and the side wall of the wiring groove, and a wiring groove is formed between the first wire-clamping block and the anti-detachment blocking structure.
[0031] In a further embodiment, the wiring space is a wiring groove located within the rotating shaft, and the limiting structure and the groove wall of the wiring groove form the wiring passage.
[0032] In another embodiment, the probe wire makes at least one turn around the axis of the rotating shaft in the wiring space.
[0033] According to the thermometer probe assembly of the above embodiment, since the limiting structure is fixed in the wiring space inside the rotating shaft and forms at least a part of the wiring channel, the probe wire passes through the wiring channel. During the rotation of the rotating shaft, the limiting structure rotates synchronously with the rotating shaft. The part of the probe wire passing through the wiring channel rotates synchronously with the rotating shaft under the constraint of the wiring channel. Under the restriction of the wiring channel, the swing amplitude of the probe wire is limited and it is not easy to be cut and worn by the edge at the opening of the wiring tube. This improves the technical problem of low lifespan caused by the probe wire being easily cut and worn by the edge at the opening of the temperature measuring probe tube in current food thermometers. Attached Figure Description
[0034] Figure 1 This is a front view of a food thermometer in one embodiment;
[0035] Figure 2 This is a top view of a food thermometer in one embodiment;
[0036] Figure 3 This is a schematic diagram of the internal structure of a food thermometer in one embodiment;
[0037] Figure 4 This is a schematic diagram of a partial structure inside a food thermometer in one embodiment;
[0038] Figure 5 This is a schematic diagram of the structure of a thermometer probe assembly in one embodiment;
[0039] Figure 6 This is another structural schematic diagram of the thermometer probe assembly in one embodiment.
[0040] The following is a list of feature names corresponding to the reference numerals in the attached figures: 1. Housing; 11. First Housing; 12. Second Housing; 2. Shaft; 21. Wiring Space; 210. Wiring Groove; 211. Groove Bottom Wall; 212. Groove Side Wall; 22. Shaft Plate; 3. Probe; 31. Probe Tube; 311. Wiring Through-Tube Port; 4. Probe Wire; 5. Limiting Structure; 51. Guide Slope; 52. First Wiring Block; 53. Second Wiring Block; 6. Wiring Channel; 61. Entrance; 7. Circuit Board; 8. Anti-detachment Stop Structure; 81. Anti-detachment Stop Post; 9. Installation Spacing.
[0041] Explanation of reference numerals in parentheses in the accompanying drawings: The feature referred to by the reference numerals in parentheses in the accompanying drawings is the feature represented by both the number inside the parentheses and the number outside the parentheses. Detailed Implementation
[0042] The present application will now be described in further detail with reference to the accompanying drawings and specific embodiments. Similar elements in different embodiments are referred to by related similar element reference numerals. In the following embodiments, many details are described to facilitate a better understanding of the present application. However, those skilled in the art will readily recognize that some features may be omitted in different situations, or may be replaced by other elements, materials, or methods. In some cases, certain operations related to the present application are not shown or described in the specification. This is to avoid obscuring the core parts of the present application with excessive description. For those skilled in the art, detailed description of these related operations is not necessary; they can fully understand the related operations based on the description in the specification and general technical knowledge in the art.
[0043] Furthermore, the features, operations, or characteristics described in the specification can be combined in any suitable manner to form various embodiments. At the same time, the steps or actions in the method description can be rearranged or adjusted in a manner obvious to those skilled in the art. Therefore, the various orders in the specification and drawings are only for the clear description of a particular embodiment and do not imply a necessary order, unless otherwise stated that a particular order must be followed.
[0044] The serial numbers assigned to components in this document, such as "first" and "second," are used only to distinguish the described objects and have no sequential or technical meaning. The terms "connection" and "linkage" used in this application, unless otherwise specified, include both direct and indirect connections (linkages).
[0045] In one embodiment, please refer to Figure 1 and Figure 2 The food thermometer includes a housing 1 and a thermometer probe assembly. The food thermometer is used in cooking appliances to measure the temperature of food during cooking. The thermometer probe assembly includes a rotating shaft 2. The rotating shaft 2 is rotatably mounted on the housing 1. In one embodiment, the housing 1 includes a first shell 11 and a second shell 12, with the rotating shaft 2 clamped between the first shell 11 and the second shell 12.
[0046] In one embodiment, please refer to Figures 3 to 6The thermometer probe assembly includes a probe 3 for temperature measurement, a probe wire 4, and a limiting structure 5. The probe 3 includes a probe tube 31, and the probe wire 4 extends into the probe tube 31. A rotating shaft 2 is connected to one end of the probe 3, and the rotating shaft 2 has a wiring space 21. One end of the probe tube 31 is open as a wire passage port 311 exposed in the wiring space 21, and the probe wire 4 extends into the probe tube 31 through the wire passage port 311.
[0047] The limiting structure 5 is fixed in the wiring space 21. The limiting structure 5 and the rotating shaft 2 form a wiring channel 6, or the limiting structure 5 forms a wiring channel 6. The probe wire 4 passes through the wiring channel 6. The wiring channel 6 is used to limit the swing amplitude of the probe wire 4 as it passes through the wiring port 311, so as to prevent the probe wire 4 from being cut by the wiring port 311.
[0048] In the thermometer probe assembly of this application, since the limiting structure 5 is fixed in the wiring space 21, the probe wire 4 passes through the wire passage 6 of the limiting structure 5. When the rotating shaft 2 rotates, the limiting structure 5 rotates synchronously with the rotating shaft 2, and the portion of the probe wire 4 passing through the wire passage 6 rotates synchronously with the rotating shaft 2 under the constraint of the wire passage 6. Under the constraint of the wire passage 6, the swing amplitude of the probe wire 4 is limited, and it is not easily cut and worn by the wire passage opening 311. This improves the technical problem of low lifespan caused by the probe wire 4 being easily cut and worn by the sharp edge of the opening of the temperature measuring probe tube 31 in current food thermometers.
[0049] It should be noted that the probe wire 4 described in this application extends into the probe tube 31 through the wire passage 311. This is only used to illustrate that the probe tube 31 passes through the wire passage 311. During installation, the probe wire 4 can be inserted into the probe tube 31 through the wire passage 311, or it can be inserted into the probe tube 31 from the end of the probe tube 31 outside the rotating shaft 2, and then enter the rotating shaft 2 through the wire passage 311.
[0050] In one embodiment, please refer to Figure 3 and Figure 4 After the probe wire 4 passes through the wire passage 6, the portion of the probe wire 4 at the wire passage opening 311 is close to or at the center of the wire passage opening 311. This makes the portion of the probe wire 4 at the wire passage opening 311 less likely to be scratched by the sharp edge of the wire passage opening 311.
[0051] In one embodiment, please refer to Figure 3 and Figure 4 The food thermometer includes a circuit board 7 housed in a housing 1, and a probe line 4 connected to the circuit board 7. The probe line 4 can transmit temperature measurement data to the circuit board 7 for further processing.
[0052] Regarding probe line 4, in one embodiment, please refer to... Figure 3 and Figure 4A thermocouple is installed in the probe tube 31 to measure temperature, and the probe wire 4 is a thermocouple wire. In some other embodiments, a temperature sensor other than a thermocouple can be installed in the probe tube 31, in which case the probe wire 4 is located on the sensor connection line to which the temperature sensor is connected.
[0053] In one embodiment, the probe tube 31 is a metal tube. In some other embodiments, the probe tube 31 may also be a ceramic tube or a high-temperature resistant plastic tube.
[0054] To facilitate the insertion of probe wire 4, in one embodiment, please refer to... Figure 3 and Figure 4 The cable passage 6 has cable passage openings at both ends in its extension direction, and the side of the cable passage 6 also has a locking inlet 61 for the probe wire 4 to be inserted. The locking inlet 61 is connected to the cable passage openings at both ends of the cable passage 6. In this way, the probe wire 4 can be inserted from the side of the cable passage 6. Compared with passing one end of the probe wire 4 through the cable passage 6, inserting it through the locking inlet 61 is more efficient and convenient for installation.
[0055] In one embodiment, for further insertion of probe wire 4, please refer to... Figure 4 and Figure 6 The limiting structure 5 has a guide slope 51 located at the insertion point 61. The guide slope 51 is used to guide the probe wire 4 towards the insertion point 61 when the probe wire 4 is inserted. The guide slope 51 can guide the probe wire 4 towards the insertion point 61, which makes the operation more convenient.
[0056] In some other embodiments, in addition to inserting the wire channel 6 by snapping it in, the probe wire 4 can also pass through one end of the wire channel 6 and exit through the other end. In this case, the wire channel 6 may not have a snap-in entrance 61. For example, the wire channel 6 can be a closed round hole, a closed square hole, a closed irregular hole, or other closed holes of any shape.
[0057] To prevent the probe wire 4 from detaching from the card inlet 61, in one embodiment, please refer to... Figure 4 and Figure 6 The thermometer probe assembly includes a stop structure 8, which is located in the wiring space 21. The stop structure 8 cooperates with the probe wire 4 to prevent the probe wire 4 from coming out of the card inlet 61.
[0058] Specifically, in one embodiment, the anti-detachment blocking structure 8 includes an anti-detachment blocking post 81 fixed in the wiring space 21. The extending direction of the anti-detachment blocking post 81 is perpendicular or approximately perpendicular to the extending direction of the wiring channel 6. It should be noted that the approximately perpendicularity described in this application means that the angle between the anti-detachment blocking post 81 and the extending direction of the wiring channel 6 is between 75 degrees and 105 degrees. In some other embodiments, in addition to the anti-detachment blocking post 81, other feasible anti-detachment blocking structures 8 can also be used, such as blocking blocks, blocking plates, etc.
[0059] To further improve the installation efficiency of probe wire 4, in one embodiment, please refer to... Figure 4 and Figure 6 The anti-detachment stop structure 8 and the wire passage 6 are arranged in the extension direction of the probe wire 4. In the extension direction of the probe wire 4, the wire passage 6 is located between the anti-detachment stop structure 8 and the wire passage opening 311. In the extension direction of the wire passage 6, there is an installation interval 9 between the anti-detachment stop structure 8 and the limiting structure 5 to allow the probe wire 4 to pass through when it is installed. The installation interval 9 allows the probe wire 4 to be inserted and then routed around to the side blocked by the anti-detachment stop structure 8. Compared with the method of deforming the anti-detachment stop structure 8 to install the probe wire 4, the installation interval 9 makes it easier to install the probe wire 4.
[0060] In some other embodiments, the anti-dislodgement structure 8 may also be an elastic baffle set at the card inlet 61 and blocking the card inlet 61, or a stop member movably installed at the card inlet 61. The stop member keeps the card inlet 61 blocked by the elastic member. When the probe wire 4 needs to be installed, the card inlet 61 can be opened.
[0061] In some other embodiments, in addition to using the anti-detachment blocking structure 8, the locking entrance 61 of the limiting structure 5 can also be smaller than the diameter of the probe wire 4. In this case, the limiting structure 5 can be elastically deformed, and the locking entrance 61 can open when the probe wire 4 is locked in, and the size of the locking entrance 61 returns to the normal size.
[0062] In one embodiment, please refer to Figure 3 and Figure 4 The probe wire 4 can move freely in the wire passage 6 along its extension direction. In some other embodiments, a conventional wire clip can be pre-embedded in the rotating shaft 2 to hold and fix the probe wire 4 in place. In this case, the probe wire 4 is fixed in its extension direction and cannot move freely.
[0063] Furthermore, in one embodiment, please refer to Figures 4 to 6The wiring space 21 is a wiring groove 210 located within the rotating shaft 2. The limiting structure 5 and the groove wall of the wiring groove 210 form a wiring channel 6. The wiring groove 210 can accommodate the probe wire 4, facilitating the installation of the probe wire 4. In some other embodiments, the wiring space 21 can also be a hole in the rotating shaft 2, in which case the rotating shaft 2 is a hollow rotating shaft 2.
[0064] In one embodiment, please refer to Figure 4 and Figure 6 The rotating shaft 2 has a rotating shaft hole extending along the axial direction. A rotating shaft plate 22 is fixed in the middle of the rotating shaft hole. The rotating shaft plate 22 divides the rotating shaft hole into two parts, one of which is the wiring groove 210.
[0065] In one embodiment, please refer to Figure 4 and Figure 6 The rotating shaft 2 is integrally injection molded. The probe tube 31 and the rotating shaft 2 are fixed together by injection molding. When molding the rotating shaft 2, the probe tube 31 is pre-installed into the injection mold. After injection molding, the probe tube 31 and the rotating shaft 2 are fixed together. In some other embodiments, the rotating shaft 2 and the probe tube 31 can also be fixed together by any feasible method such as bonding, interference fit, fastener fixation, etc.
[0066] Furthermore, in one embodiment, please refer to Figures 4 to 6 The limiting structure 5 includes a first wire-locking block 52 and a second wire-locking block 53. The first wire-locking block 52 is fixed to the bottom wall 211 of the groove, and the second wire-locking block 53 is connected to one side of the first wire-locking block 52. The wire passage 6 is located between the second wire-locking block 53 and the bottom wall 211 of the groove. The locking inlet 61 is located between the second wire-locking block 53 and the side wall 212 of the wire routing groove 210. A wire passage groove is formed between the first wire-locking block 52 and the anti-detachment blocking structure 8.
[0067] Specifically, in one embodiment, please refer to Figure 4 and Figure 6 The guide slope 51 is positioned on the second wire-clamping block 53. In one embodiment, the side of the first wire-clamping block 52 facing the wire passage 6 is a smooth, convex curved surface, which conforms to the shape of the bent probe wire 4. Both the first wire-clamping block 52 and the second wire-clamping block 53 are integrally injection molded with the rotating shaft 2.
[0068] To facilitate the movement of the rotating shaft 2, in one embodiment, please refer to... Figure 3 and Figure 4 The probe wire 4 makes at least one turn around the axis of the rotating shaft 2 within the wiring space 21. This makes the portion of the probe wire 4 passing through the wiring channel 6 less prone to wobbling when the rotating shaft 2 rotates. In some other embodiments, the probe wire 4 may also be bent in any other feasible manner within the rotating shaft 2.
[0069] In one embodiment, the limiting structure 5 of this application can directly improve the problem of sharp edge cutting of the probe tube 31 through physical structure without increasing parts and assembly process, thereby improving assembly efficiency, saving costs, and increasing the rotation life of the rotating shaft 2.
[0070] In one embodiment of a thermometer probe assembly, the thermometer probe assembly is as described in any of the above embodiments, and will not be described in detail again.
[0071] The above examples illustrate this application only to aid understanding and are not intended to limit its scope. Those skilled in the art to which this application pertains can make various simple deductions, modifications, or substitutions based on the ideas presented.
Claims
1. A thermometer probe assembly, characterized in that, include: A probe for temperature measurement, the probe comprising a probe tube; A rotating shaft is connected to one end of the probe; the rotating shaft has a wiring space, and one end of the probe tube is an open wire tube that is exposed in the wiring space. A probe wire, which extends through the wire-passing tube opening into the probe tube; And a limiting structure, wherein the limiting structure is fixed in the wiring space; The limiting structure and the rotating shaft form a wire passage, or the limiting structure forms a wire passage. The probe wire passes through the wire passage, which limits the swing amplitude of the probe wire at the wire passage opening.
2. The thermometer probe assembly as described in claim 1, characterized in that, Both ends of the wire passage have wire passage openings, and the side of the wire passage also has a locking inlet for the probe wire to be inserted; the locking inlet communicates with the wire passage openings at both ends of the wire passage.
3. The thermometer probe assembly as described in claim 2, characterized in that, The limiting structure has a guide slope at the card inlet, which guides the probe wire toward the card inlet when the probe wire is inserted.
4. The thermometer probe assembly as described in claim 2, characterized in that, The thermometer probe assembly includes an anti-detachment structure that engages with the probe wire to prevent the probe wire from detaching from the locking inlet.
5. The thermometer probe assembly as described in claim 4, characterized in that, The anti-detachment structure includes an anti-detachment stop post fixed in the wiring space, and the extension direction of the anti-detachment stop post is perpendicular or approximately perpendicular to the extension direction of the wiring channel.
6. The thermometer probe assembly as claimed in claim 4, characterized in that, The anti-detachment stop structure and the wire passage are arranged in the extension direction of the probe wire. In the extension direction of the probe wire, the wire passage is located between the anti-detachment stop structure and the wire passage opening. In the extension direction of the wire passage, there is an installation interval between the anti-detachment stop structure and the limiting structure to allow the probe wire to pass through when it is installed.
7. The thermometer probe assembly as described in claim 6, characterized in that, The wiring space is a wiring groove located within the rotating shaft. The limiting structure and the groove wall of the wiring groove form the wiring passage. The limiting structure includes a first wire-clamping block and a second wire-clamping block. The first wire-clamping block is fixed to the bottom wall of the wiring groove, and the second wire-clamping block is connected to one side of the first wire-clamping block. The wiring passage is located between the second wire-clamping block and the bottom wall of the groove. The clamping inlet is located between the second wire-clamping block and the side wall of the wiring groove. A wiring groove is formed between the first wire-clamping block and the anti-detachment blocking structure.
8. The thermometer probe assembly as described in any one of claims 1-5, characterized in that, The wiring space is a wiring groove located within the rotating shaft, and the limiting structure and the groove wall of the wiring groove form the wiring passage.
9. The thermometer probe assembly as described in any one of claims 1-7, characterized in that, The probe wire makes at least one turn around the axis of the rotating shaft in the wiring space.
10. A food thermometer, characterized in that, It includes a housing and a thermometer probe assembly as described in any one of claims 1-9, wherein the rotating shaft is rotatably mounted on the housing.