Power MOS tube fault detection assembly

Abstract

The utility model relates to the technical field of detection equipment, in particular to a power MOS (Metal Oxide Semiconductor) tube fault detection assembly, which is characterized in that the input end of a bearing platform is lapped with a linkage frame, the output end of the linkage frame is detachably connected to a cylinder, the output end of the linkage frame is rotatably connected with a rotating wheel, and the rotating wheel is lapped on the input end part of the bearing platform. The air cylinder pushes the fixing frame to move, the linkage frame and the push plate which are connected with the fixing frame can move, the push plate can move towards the position of the conveying belt, the linkage frame pushes the support, the support enables the sliding base to move, and therefore the bearing platform on the sliding base moves towards the interior of the inner groove, and bearing of the MOS tube is achieved. In the process, the MOS tube does not need to be taken down from the conveyor belt by a person, so that the taking and placing efficiency is improved, and detection is facilitated.

Description

Technical Field

[0001] This utility model relates to the field of detection equipment technology, specifically a power MOSFET fault detection component. Background Technology

[0002] According to patent publication number CN221726172U, a MOSFET insulation testing station includes a testing platform, a lower pressure plate, and a testing copper plate. A support plate is fixedly installed on the top of the testing platform, and support legs are fixedly installed on its bottom. Several indicator lights and a control unit are provided on one side of the top of the testing platform. A conveyor belt is provided on the top of the testing platform, and several elastic protrusions are provided around the periphery of the conveyor belt. MOSFET bodies are placed between two of the elastic protrusions on the conveyor belt. A receiving groove is provided inside the testing platform. A driving assembly is provided in the receiving groove to drive the conveyor belt to rotate. A testing assembly is provided on one side of the support plate to test the MOSFET body. The conveyor belt, lower pressure plate, and testing copper plate improve the efficiency of MOSFET insulation testing. A pair of push plates enables automatic MOSFET loading and unloading, further improving the efficiency of MOSFET insulation testing.

[0003] Although the above application uses a conveyor belt to carry the MOSFET for testing, the elastic protrusions on the conveyor belt still affect the picking up and taking down of the MOSFET. Under long hours of labor, workers will gradually become fatigued, and the elastic protrusions will become obstacles when picking up and taking down the MOSFET, affecting the picking up and taking down. Utility Model Content

[0004] The purpose of this invention is to provide a power MOSFET fault detection component to solve the problems mentioned in the background art.

[0005] To achieve the above objectives, this utility model provides the following technical solution: a power MOSFET fault detection component, comprising a detection platform, an elastic protrusion, a conveyor belt, a cylinder, and a controller. A support platform is slidably connected to the detection platform on one side of the conveyor belt, and a push plate is slidably connected to the detection platform on the other side of the conveyor belt. The input end of the push plate is detachably connected to the cylinder. A linkage frame is attached to the input end of the support platform, and the output end of the linkage frame is detachably connected to the cylinder. A rotating wheel is rotatably connected to the output end of the linkage frame, and the rotating wheel is attached to the input end of the support platform.

[0006] Preferably, an inner groove is provided on the testing platform corresponding to the support, and the support is slidably connected inside the inner groove of the testing platform. The width of the inner groove is the same as the width of the support.

[0007] Preferably, a fixed base is detachably connected to the testing platform, a cylinder is detachably connected to the fixed base, and a fixed frame is detachably connected to the output end of the cylinder.

[0008] Preferably, the fixing frame is S-shaped, with a push plate welded to one end and a linkage frame welded to the other end.

[0009] Preferably, a first limiting rod and a second limiting rod are detachably connected to the testing platform. The first limiting rod and the second limiting rod are arranged parallel to each other. A sliding block is slidably connected to the first limiting rod and the second limiting rod. The sliding block is rectangular in shape.

[0010] Preferably, a vertical rod is detachably connected to the slide block, one end of which is detachably connected to the support platform. A support is provided on the slide block, which is located between the first limiting rod and the second limiting rod. A ramp is provided on the support, which connects to the rotating wheel on the linkage frame. A first spring is sleeved on the second limiting rod, which is located between the slide block and the testing table.

[0011] Compared with the prior art, the beneficial effects of this utility model are:

[0012] By creating an inner groove on the testing platform, a support platform can be installed inside. The support platform can reciprocate within the inner groove. A push plate is installed on the testing platform, with the push plate and support platform located on opposite sides of the conveyor belt. When the push plate pushes the MOSFET out of the conveyor belt, the support platform moves into the inner groove to receive the MOSFET. A vertical rod is installed on the support platform, connected to a slide block. The slide block can move on the first and second limit rods of the testing platform. A ramp is installed on the support of the slide block, connecting to the rotating wheel of the linkage frame. The linkage frame is integrated with the push plate via a fixed frame. The fixed frame is mounted on a cylinder, which can push the fixed frame to move. This allows the linkage frame and push plate connected to the fixed frame to move. The push plate can move towards the conveyor belt, which in turn pushes the support, causing the slide block to move. This moves the support platform on the slide block into the inner groove, thus receiving the MOSFET. This process eliminates the need for personnel to remove the MOSFET from the conveyor belt, improving the efficiency of loading and unloading and facilitating testing. Attached Figure Description

[0013] Figure 1 This is a schematic diagram of the overall structure of the present invention. Figure 1 ;

[0014] Figure 2 This is a schematic diagram of the overall structure of the present invention. Figure 2 ;

[0015] Figure 3 This is a schematic diagram of the overall structure of the present invention. Figure 3 ;

[0016] Figure 4 This utility model Figure 3Enlarged structural diagram of region A in the middle;

[0017] In the diagram: 1. Testing table; 2. Conveyor belt; 3. Controller; 4. Fixed seat; 5. Cylinder; 6. Linkage frame; 7. Support platform; 8. Inner groove; 9. Push plate; 10. Fixed frame; 11. Elastic protrusion; 12. Slide seat; 13. Inclined ramp; 14. First limit rod; 15. Rotary wheel; 16. Second limit rod; 17. Support; 18. Vertical rod; 19. First spring. Detailed Implementation

[0018] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0019] Please see Figures 1 to 4 This utility model provides a technical solution: a power MOSFET fault detection component, including a detection platform 1, an elastic protrusion 11, a conveyor belt 2, a cylinder 5, and a controller 3. A support platform 7 is slidably connected to the detection platform 1 on one side of the conveyor belt 2, and a push plate 9 is slidably connected to the detection platform 1 on the other side of the conveyor belt 2. The input end of the push plate 9 is detachably connected to the cylinder 5. A linkage frame 6 is attached to the input end of the support platform 7. The output end of the linkage frame 6 is detachably connected to the cylinder 5. A rotating wheel 15 is rotatably connected to the output end of the linkage frame 6. The rotating wheel 15 is attached to the input end of the support platform 7. The testing table 1 is equipped with a push plate 9, which is located on both sides of the conveyor belt 2 along with the support platform 7. When the push plate 9 pushes the MOS transistor out of the conveyor belt 2, the support platform 7 moves into the inner groove 8 to receive the MOS transistor. The support platform 7 is equipped with a vertical rod 18, which is connected to the slide 12. The slide 12 can move on the first limit rod 14 and the second limit rod 16 of the testing table 1. The support 17 on the slide 12 is equipped with a ramp 13, which connects to the rotating wheel 15 of the linkage frame 6. The linkage frame 6 is integrated with the push plate 9 through the fixed frame 10. The fixed frame 10 is mounted on the cylinder 5, which can push the fixed frame 10 to move. The linkage frame 6 and push plate 9 connected to the fixed frame 10 can then move. The push plate 9 can move towards the conveyor belt 2, and the linkage frame 6 will push the support 17. The support 17 will then move the slide 12, thereby moving the support 7 on the slide 12 into the inner groove 8, thus realizing the reception of the MOS tube. This process eliminates the need for personnel to remove the MOS tube from the conveyor belt 2, thereby improving the efficiency of picking and placing and facilitating testing.

[0020] An inner groove 8 is provided on the detection table 1 corresponding to the support 7. The support 7 is slidably connected inside the inner groove 8 of the detection table 1, and the width of the inner groove 8 is the same as the width of the support 7. By setting the inner groove 8 on the detection table 1, the support 7 can be installed inside the inner groove 8, and the support 7 will be flush with the conveyor belt 2. The MOS tube can be pushed onto the support 7 without being obstructed.

[0021] A mounting base 4 is detachably connected to the testing table 1, and a cylinder 5 is detachably connected to the mounting base 4. A mounting bracket 10 is detachably connected to the output end of the cylinder 5. The mounting base 4 can be used to fix the cylinder 5, so that the cylinder 5 can be stably installed on the testing table 1.

[0022] The fixed frame 10 is S-shaped. A push plate 9 is welded to one end of the fixed frame 10, and a linkage frame 6 is welded to the other end. By setting up the fixed frame 10, the fixed frame 10 can be connected to the push plate 9 and the linkage frame 6. When the fixed frame 10 moves, it can simultaneously drive the push plate 9 and the linkage frame 6 to move. Thus, when the push plate 9 moves to the position of the conveyor belt 2, the linkage frame 6 can push the support 17, and finally realize the movement of the support platform 7 into the inner groove 8.

[0023] The testing table 1 is detachably connected to a first limiting rod 14 and a second limiting rod 16, which are arranged parallel to each other. A slide block 12 is slidably connected to the first limiting rod 14 and the second limiting rod 16, and the slide block 12 is rectangular in shape. The first limiting rod 14 and the second limiting rod 16 can restrict the slide block 12, thus fixing the movement path of the slide block 12.

[0024] A vertical rod 18 is detachably connected to the slide 12, with one end of the rod 18 detachably connected to the support 7. A support 17 is provided on the slide 12, located between the first limiting rod 14 and the second limiting rod 16. A ramp 13 is provided on the support 17, which connects to the rotating wheel 15 on the linkage frame 6. A first spring 19 is sleeved on the second limiting rod 16, located between the slide 12 and the detection table 1. The first spring 19 can push the slide 12 in the opposite direction. After the support 17 is no longer pushed, the slide 12 can be reset by the push of the first spring 19, and the support 7 can also be reset, thus supporting the MOS tube away from the conveyor belt 2, making it convenient for the staff to remove.

[0025] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A power MOSFET fault detection assembly, comprising a detection platform (1), an elastic protrusion (11), a conveyor belt (2), a cylinder (5), and a controller (3), characterized in that: A support platform (7) is slidably connected to the detection platform (1) on one side of the conveyor belt (2), and a push plate (9) is slidably connected to the detection platform (1) on the other side of the conveyor belt (2). The input end of the push plate (9) is detachably connected to the cylinder (5). A linkage frame (6) is attached to the input end of the support platform (7). The output end of the linkage frame (6) is detachably connected to the cylinder (5). A rotating wheel (15) is rotatably connected to the output end of the linkage frame (6). The rotating wheel (15) is attached to the input end of the support platform (7).

2. The power MOSFET fault detection component according to claim 1, characterized in that: The testing platform (1) corresponding to the support (7) has an inner groove (8) and the support (7) is slidably connected to the inner groove (8) of the testing platform (1). The width of the inner groove (8) is the same as the width of the support (7).

3. The power MOSFET fault detection component according to claim 1, characterized in that: A fixed base (4) is detachably connected to the testing platform (1), and a cylinder (5) is detachably connected to the fixed base (4). A fixed frame (10) is detachably connected to the output end of the cylinder (5).

4. The power MOSFET fault detection component according to claim 3, characterized in that: The fixing frame (10) is S-shaped in general. A push plate (9) is welded to one end of the fixing frame (10), and a linkage frame (6) is welded to the other end of the fixing frame (10).

5. A power MOSFET fault detection component according to claim 1, characterized in that: The testing platform (1) is detachably connected to a first limiting rod (14) and a second limiting rod (16). The first limiting rod (14) and the second limiting rod (16) are arranged parallel to each other. A slide block (12) is slidably connected to the first limiting rod (14) and the second limiting rod (16). The slide block (12) is rectangular.

6. The power MOSFET fault detection component according to claim 5, characterized in that: A vertical rod (18) is detachably connected to the slide (12), and one end of the vertical rod (18) is detachably connected to the support (7). A support (17) is provided on the slide (12), and the support (17) is located between the first limiting rod (14) and the second limiting rod (16). A ramp (13) is provided on the support (17), and the ramp (13) connects to the rotating wheel (15) on the linkage frame (6). A first spring (19) is sleeved on the second limiting rod (16), and the first spring (19) is located between the slide (12) and the detection table (1).

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